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JPH0535688B2 - - Google Patents
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JPH0535688B2 - - Google Patents

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Publication number
JPH0535688B2
JPH0535688B2 JP62180927A JP18092787A JPH0535688B2 JP H0535688 B2 JPH0535688 B2 JP H0535688B2 JP 62180927 A JP62180927 A JP 62180927A JP 18092787 A JP18092787 A JP 18092787A JP H0535688 B2 JPH0535688 B2 JP H0535688B2
Authority
JP
Japan
Prior art keywords
quartz glass
less
light
optical
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62180927A
Other languages
Japanese (ja)
Other versions
JPS6428240A (en
Inventor
Tatsumasa Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Quartz Products Co Ltd
Original Assignee
Shin Etsu Quartz Products Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Quartz Products Co Ltd filed Critical Shin Etsu Quartz Products Co Ltd
Priority to JP62180927A priority Critical patent/JPS6428240A/en
Publication of JPS6428240A publication Critical patent/JPS6428240A/en
Publication of JPH0535688B2 publication Critical patent/JPH0535688B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00Other methods of shaping glass
    • C03B19/14Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1469Means for changing or stabilising the shape or form of the shaped article or deposit
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00Other methods of shaping glass
    • C03B19/14Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1453Thermal after-treatment of the shaped article, e.g. dehydrating, consolidating, sintering
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2203/00Fibre product details, e.g. structure, shape
    • C03B2203/10Internal structure or shape details
    • C03B2203/22Radial profile of refractive index, composition or softening point

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Glass Melting And Manufacturing (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

【発明の詳細な説明】 「産業上の利用分野」 本発明は、例えばレーザステツパ装置に用いる
石英ガラス製レンズ、大出力レーザ発振装置に用
いるミラーやレンズ等の、略400nm以下の好まし
くは略300nm以下の特定光波長領域で使用される
光学用石英ガラス部材に関する。
DETAILED DESCRIPTION OF THE INVENTION "Field of Industrial Application" The present invention is applicable to quartz glass lenses used in laser stepper devices, mirrors and lenses used in high-output laser oscillation devices, etc. with a diameter of approximately 400 nm or less, preferably approximately 300 nm or less. The present invention relates to an optical quartz glass member used in a specific light wavelength range.

「従来の技術」 従来よりLSIの高集積化は年々着実に進み、こ
れに伴ない集積回路パターンを描画するリングラ
フイ装置も、より微細なパターン幅の描画が要求
され、このような微細パターン幅の描画を実現す
るリングラフイ装置として現在、比較的高輝度の
光源が得られる点及び高性能の投影レンズが開発
されている点等から、ステツプアンドリピート方
式の投影型露光装置(ステツパ)が注目されてい
る。
"Conventional technology" The integration of LSIs has been steadily increasing year by year, and with this, the ring graphing equipment that draws integrated circuit patterns is required to draw finer pattern widths. Step-and-repeat projection exposure equipment (stepper) is currently attracting attention as a phosphorography equipment that realizes drawing because it can provide a relatively high-intensity light source and high-performance projection lenses have been developed. There is.

しかしながらかかるステツパを用いたリングラ
フイ系の最大の欠点として露光波長が大きく、回
折により解像力が制限されている事であるが、そ
の解決策には投影レンズの高開口数化と短波長化
が挙げられる。
However, the biggest drawback of the ring graphite system using such a stepper is that the exposure wavelength is large, and the resolution is limited by diffraction, but the solution to this problem is to increase the numerical aperture of the projection lens and shorten the wavelength. .

しかしながら投影レンズの高開口数化を図つた
場合必然的に焦点深度が幾何級数的に浅くなり、
現在用いられているg線波長域(436nm)の紫外
線等を光源として用にいた場合、現在鋭意開発中
である4Mbitt或いは16MbittのDRAM製造に必
要とされる、1μm以下のパターン幅の形成が極め
て困難になる。
However, when increasing the numerical aperture of a projection lens, the depth of focus inevitably becomes shallower geometrically.
If currently used ultraviolet light in the G-line wavelength range (436 nm) is used as a light source, it will be extremely difficult to form a pattern width of 1 μm or less, which is required for the production of 4 Mbitt or 16 Mbitt DRAM, which is currently under development. It becomes difficult.

一方短波長化を図る為に400nm以下の紫外線を
用いた場合は、通常の光学ガラスでは、使用波長
が365nm付近より光透過率が急激に低下して吸収
を始め、該吸収された紫外線はレンズ温度を上昇
させ、焦点位置やその他の諸性能を狂わせる。
On the other hand, when using ultraviolet rays of 400 nm or less in order to shorten the wavelength, with ordinary optical glass, the light transmittance rapidly decreases and begins to be absorbed from around 365 nm, and the absorbed ultraviolet rays are absorbed by the lens. It increases the temperature and disrupts the focal position and other performance.

この為350〜300nm以下の紫外線領域でも尚吸
収をおこさない投影レンズ材料として石英ガラス
を選択する必要があるが、かかる石英ガラスを用
いてレンズを製作した場合は、収差補正、特に色
収差補正がきわめて困難になる。
For this reason, it is necessary to select quartz glass as a projection lens material that does not absorb even in the ultraviolet region of 350 to 300 nm or less, but when lenses are manufactured using such quartz glass, aberration correction, especially chromatic aberration correction, is extremely difficult. It becomes difficult.

そこで近年前記石英ガラスレンズを投影レンズ
として用いつつ、色収差補正を不要にする為に、
光源に特定波長域の紫外線が発振可能なレーザ発
振器を組み合わせたスツテパ装置が開発されてい
る。
Therefore, in recent years, in order to use the quartz glass lens as a projection lens and eliminate the need for chromatic aberration correction,
A stepper device has been developed that combines a light source with a laser oscillator that can emit ultraviolet light in a specific wavelength range.

「発明が解決しようとする問題点」 かかるスツテパ装置に用いる光源として現在、
より短波長化を可能にする為に、波長250nm前後
のKrfレーザ、更には波長190nm前後のArFレー
ザ等が注目されているが、このような短波長の遠
紫外線領域の光源を用いた場合、投影レンズに例
えば石英ガラスレンズを用いても尚次のような問
題を有す。
``Problems to be solved by the invention'' At present, as light sources used in such stepper devices,
In order to enable shorter wavelengths, KRF lasers with a wavelength of around 250 nm and ArF lasers with a wavelength of around 190 nm are attracting attention, but when using such short wavelength light sources in the far ultraviolet region, Even if a quartz glass lens, for example, is used as a projection lens, the following problems still occur.

即ち、前記のような短波長域の光源を用いた場
合、例え石英ガラスを用いてレンズを製作したと
しても内部に混入された不純物等の存在により光
透過率が減少し、その光吸収によるレンズ内部温
度の上昇により僅かながら焦点位置が狂い、0.8
〜0.5μm以下の微細パターンの形成が極めて困難
になる。
In other words, when using a light source in the short wavelength range as described above, even if the lens is manufactured using quartz glass, the light transmittance will decrease due to the presence of impurities mixed inside, and the lens will be damaged due to light absorption. Due to the rise in internal temperature, the focus position is slightly distorted, and 0.8
It becomes extremely difficult to form fine patterns of ~0.5 μm or less.

又前記のようなステッパ装置においては一層の
微細パターン化を実現する為に、前記短波長化と
併せて開口数を大にしたり、又コリメートされた
光源をスキヤンミラーにより光軸と直交する方向
に動かし実質的に光源像を拡大したりしている
が、既存の石英ガラスでは、光軸とずれた位置で
光像を結ぼうとすると面内歪が発生し、前記微細
パターンの形成が一層困難となつている。
In addition, in the stepper device described above, in order to realize even finer patterns, the numerical aperture is increased in addition to the shortening of the wavelength, and the collimated light source is moved in a direction perpendicular to the optical axis using a scan mirror. However, with existing quartz glass, when trying to form a light image at a position off the optical axis, in-plane distortion occurs, making it even more difficult to form the fine pattern. It is becoming.

本発明はかかる従来技術に鑑み、前記熱歪や面
内歪が発生する事なく、特に0.8〜0.5μm以下の微
細パターンの形成を可能にしたステツパレンズ用
石英ガラス部材その他の特定光波長領域で使用さ
れる光学用石英ガラス部材を提供する事を目的と
する。
In view of such prior art, the present invention is intended to be used in quartz glass members for stepper lenses and other specific light wavelength regions, which makes it possible to form fine patterns of 0.8 to 0.5 μm or less without causing the above-mentioned thermal distortion or in-plane distortion. The purpose of the present invention is to provide a quartz glass member for optical use.

「問題点を解決する為の手段」 本発明はかかる技術的課題を達成する為に、略
400nm以下、好ましくは300nm以下のレーザ光源
等の特定波長域で使用される光学用石英ガラス部
材において、 合成石英ガラスを出発母材として用い、三座標
方向のいずれの方向からも脈理が認められず、且
つ254nmの波長を有する低圧水銀ランプの照射に
より蛍光を実質的に発生せず、更に少なくとも光
が透過する区域において屈折率差△nが5×10-6
以下の均質性を有する事を特徴とする光学用石英
ガラス部材を提案する。
“Means for Solving the Problems” In order to achieve the technical problems, the present invention
In optical quartz glass members used in specific wavelength ranges such as laser light sources of 400 nm or less, preferably 300 nm or less, synthetic quartz glass is used as the starting material, and striae are not observed from any of the three coordinate directions. Furthermore, substantially no fluorescence is generated by irradiation with a low-pressure mercury lamp having a wavelength of 254 nm, and the refractive index difference △n is 5×10 -6 at least in the area through which light is transmitted.
We propose an optical quartz glass member characterized by the following homogeneity.

そしてこの様なガラス部材は、高純度の珪素化
合物を酸水素炎中で加水分解、溶融して得た合成
石英ガラス母材について脈理除去処理を行なつた
後、加熱処理を行なうことにより得る事が出来
る。
Such a glass member is obtained by performing striae removal treatment on a synthetic quartz glass base material obtained by hydrolyzing and melting a high-purity silicon compound in an oxyhydrogen flame, and then subjecting it to heat treatment. I can do things.

ここで脈理とは、水晶や合成石英ガラスを溶融
成長一固化する際に発生する屈折率分布の異なる
成長縞を指し、かかる脈理は例えば、干渉計及び
歪検査器にて容易に観察する事が出来る。
Here, striae refers to growth fringes with different refractive index distributions that occur when crystal or synthetic quartz glass is melted, grown, and solidified, and such striae can be easily observed using, for example, an interferometer or a strain tester. I can do things.

又蛍光が発生する事がないとは、暗室内で低圧
水銀ランプを少なくとも10分程度照射した場合、
目視にて蛍光の発生が認められない事をいう。
In addition, no fluorescence occurs when irradiated with a low-pressure mercury lamp for at least 10 minutes in a dark room.
This means that no fluorescence is visually observed.

「発明の効果」 本発明は、低圧水銀ランプの照射により蛍光が
発生しない程度に光透過率を高度に確保した為
に、その特定波長域における使用光源の光吸収に
おける内部温度の上昇を微小に押える事が出来る
とともに、たとえ僅かに内部温度が上昇しても、
三座標方向のいずれの方向からも脈理が除去され
ている為に、熱歪が生じる恐れが少なく、これに
より焦点位置やその他の諸性能が規定制度範囲内
に維持出来る。
"Effects of the Invention" The present invention has achieved a high level of light transmittance to the extent that no fluorescence is generated when irradiated with a low-pressure mercury lamp, thereby minimizing the increase in internal temperature caused by the light absorption of the light source used in the specific wavelength range. In addition to being able to hold it down, even if the internal temperature rises slightly,
Since striae are removed from any of the three coordinate directions, there is less risk of thermal distortion, and as a result, the focal point position and other various performances can be maintained within specified tolerances.

又本発明よれば、少なくとも光が入射される区
域において屈折率差△nが5×10-6以下の均質性
を有する為に、コリメートされた光源をスキヤン
ミラーにより光軸と直交する方向に動かし実質的
に光源像を拡大して光像を結ぼうとしても面内歪
が発生する恐れがない。
Further, according to the present invention, in order to have a homogeneity of refractive index difference Δn of 5×10 -6 or less at least in the area where the light is incident, the collimated light source is moved in a direction perpendicular to the optical axis by a scan mirror. There is no risk of in-plane distortion occurring even when attempting to form a light image by substantially enlarging the light source image.

更に、ステツパ用投影レンズは一般に曲面状の
凸又は凹レンズで形成される為に、三座標方向の
いずれかの方向に脈理が存在すると、脈理部分と
他の部分で屈折率や密度が異なる為に、精密研磨
時に微小な波打ち現象が生じ、表面平滑度や肉厚
の均一性の面で問題が生じ、やはり屈折率のバラ
ツキその他の諸性能に影響する。しかしながら本
発明は三座標方向のいずれの方向からも脈理が除
去されている為に、前記問題点が解消される。
Furthermore, projection lenses for steppers are generally formed with curved convex or concave lenses, so if striae exists in any of the three coordinate directions, the refractive index and density will differ between the striae and other parts. Therefore, a minute wave phenomenon occurs during precision polishing, causing problems in terms of surface smoothness and uniformity of wall thickness, which also affects variations in refractive index and other various performances. However, in the present invention, since striae are removed from any of the three coordinate directions, the above problem is solved.

従つて本発明により製作されたステツパ用投影
レンズを用いる事により、短波長の遠紫外線領域
における特定波長域光を発振するレーザを光源と
して集積回路パターンを描画した場合、前記投影
レンズ内に発生する熱歪や面歪が除去される為
に、微細集積回路パターンの描画が可能となる。
Therefore, by using the projection lens for a stepper manufactured according to the present invention, when an integrated circuit pattern is drawn using a laser that oscillates light in a specific wavelength range in the short-wavelength deep ultraviolet region as a light source, the light generated within the projection lens. Since thermal strain and surface strain are removed, fine integrated circuit patterns can be drawn.

尚本発明は、前記ステツパ用投影レンズ以外の
主として略300nm以下の特定光波長領域のレーザ
を出力する発振装置の変向ミラーやレンズ部材の
材料としても使用可能である。
The present invention can also be used as a material for a deflection mirror or lens member of an oscillation device that outputs a laser beam in a specific optical wavelength region of about 300 nm or less, other than the stepper projection lens described above.

「実施例」 以下、図面を参照して本発明の好適な実施例を
例示的に詳しく説明する。ただしこの実施例に記
載されている構成部品の寸法、材質、形状、その
相対配置などは特に特定的な記載がない限りは、
この発明の範囲をそれのみに限定する趣旨ではな
く、単なる説明例に過ぎない。
"Embodiments" Hereinafter, preferred embodiments of the present invention will be described in detail by way of example with reference to the drawings. However, the dimensions, materials, shapes, relative positions, etc. of the components described in this example are as follows, unless otherwise specified.
This is not intended to limit the scope of the invention, but is merely an illustrative example.

先ず、本発明に係る光学用石英ガラス部材の製
造手順について第1図に基づいて説明する。
First, the manufacturing procedure of the optical quartz glass member according to the present invention will be explained based on FIG.

金属元素等の不純物元素を含まない高純度の四
塩化珪素を酸水素炎中で、直接火炎法により加水
分解、溶融して石英ガラスインゴツト1を製造し
た後、該インゴツト1を軟化点以上に加熱し冷却
する操作を繰返し行ない、且つ加熱毎に自重によ
る軟化の方向を変えて内部の脈理を除去する。す
なわちこの操作の繰返しによつて石英ガラス塊の
三座標方向の脈理が除去される。
After producing a quartz glass ingot 1 by hydrolyzing and melting high-purity silicon tetrachloride that does not contain impurity elements such as metal elements in an oxyhydrogen flame by a direct flame method, the ingot 1 is heated to a temperature above its softening point. The heating and cooling operations are repeated, and the direction of softening due to its own weight is changed each time it is heated to remove internal striae. That is, by repeating this operation, striae in the three coordinate directions of the quartz glass lump are removed.

次にこのようにして脈理を除去した石英ガラス
塊を1000℃前後の温度で加熱して歪を除去した石
英ガラス塊2を得、これを寸法に応じた大きさに
切断して光学用石英ガラス部材3を製作する。
Next, the quartz glass block from which the striae have been removed in this way is heated at a temperature of around 1000°C to obtain a quartz glass block 2 from which distortion has been removed, and this is cut into a size according to the dimensions of the quartz glass block for optical use. A glass member 3 is manufactured.

この石英ガラス部材3は、暗室内で、、波長
250nmKrFレーザと対応する254nmの波長を有す
る低圧水銀ランプを10分間照射したが蛍光の発生
は目視で認められず、又二光線干渉屈折計を用い
て屈折率差△nを調べたところ2.5×10-6の均質
性を有する事が確認された。
This quartz glass member 3 is
Irradiated with a 250nm KrF laser and a low-pressure mercury lamp with a corresponding wavelength of 254nm for 10 minutes, no fluorescence was visually observed, and when the refractive index difference △n was examined using a two-beam interference refractometer, the result was 2.5×10 It was confirmed that the homogeneity was -6 .

かかる物性を有する石英ガラス部材から製作し
たステツパー用投影レンズを例えば第2図に示す
従来公知のステツパ装置に組み込み描画する事に
より0.5μm以下のパターン幅を有する集積回路パ
ターンを得る事が出来た。
An integrated circuit pattern having a pattern width of 0.5 μm or less could be obtained by incorporating a stepper projection lens made from a quartz glass member having such physical properties into a conventionally known stepper device shown in FIG. 2 and drawing the image.

尚、図中10はレーザ光を発振するKrFエキシ
マレーザ、11は変向ミラー、12は照明光学
系、13は10倍レチクル、14は本発明品に係る
投影レンズ、15は石英窓、16はSi基板であ
る。
In the figure, 10 is a KrF excimer laser that oscillates a laser beam, 11 is a deflection mirror, 12 is an illumination optical system, 13 is a 10x reticle, 14 is a projection lens according to the present invention, 15 is a quartz window, and 16 is a It is a Si substrate.

従つてかかる実施例によれば本発明の効果を円
滑に達成する事が出来る。
Therefore, according to this embodiment, the effects of the present invention can be smoothly achieved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例に係る光学用石英ガラ
ス部材の製造手順を示す概略図、第2図はかかる
光学用石英ガラス部材を用いて製作された投影レ
ンズを組込んだステツパ装置を示す概略図であ
る。
Fig. 1 is a schematic diagram showing the manufacturing procedure of an optical quartz glass member according to an embodiment of the present invention, and Fig. 2 shows a stepper device incorporating a projection lens manufactured using such an optical quartz glass member. It is a schematic diagram.

Claims (1)

【特許請求の範囲】 1 略400nm以下の特定波長域で使用される光学
用石英ガラス部材において、 高純度の珪素化合物を酸水素炎中で加水分解、
溶融して得た合成石英ガラスを出発母材として用
い、三座標方向のいずれの方向からも脈理が認め
られず、且つ254nmの波長を有する低圧水銀ラン
プの照射により蛍光を実質的に発生せず、更に少
なくとも光が透過する区域において屈折率差△n
が5×10-6以下の均質性を有する事を特徴とする
光学用石英ガラス部材。
[Claims] 1. In an optical quartz glass member used in a specific wavelength range of approximately 400 nm or less, a high purity silicon compound is hydrolyzed in an oxyhydrogen flame,
Synthetic quartz glass obtained by melting was used as the starting material, no striae was observed from any of the three coordinate directions, and no fluorescence was substantially generated when irradiated with a low-pressure mercury lamp having a wavelength of 254 nm. Furthermore, there is a refractive index difference Δn at least in the area through which light is transmitted.
A quartz glass member for optical use, characterized by having a homogeneity of 5×10 -6 or less.
JP62180927A 1987-07-22 1987-07-22 Optical quartz glass member Granted JPS6428240A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62180927A JPS6428240A (en) 1987-07-22 1987-07-22 Optical quartz glass member

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62180927A JPS6428240A (en) 1987-07-22 1987-07-22 Optical quartz glass member

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP6180500A Division JP2639514B2 (en) 1994-07-11 1994-07-11 Laser lithography equipment

Publications (2)

Publication Number Publication Date
JPS6428240A JPS6428240A (en) 1989-01-30
JPH0535688B2 true JPH0535688B2 (en) 1993-05-27

Family

ID=16091712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62180927A Granted JPS6428240A (en) 1987-07-22 1987-07-22 Optical quartz glass member

Country Status (1)

Country Link
JP (1) JPS6428240A (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0653593B2 (en) * 1989-06-09 1994-07-20 信越石英株式会社 Synthetic silica glass optical body and method for producing the same
US5699183A (en) * 1993-02-10 1997-12-16 Nikon Corporation Silica glass member for UV-lithography, method for silica glass production, and method for silica glass member production
JP2004269287A (en) * 2003-03-06 2004-09-30 Shinetsu Quartz Prod Co Ltd Optical synthetic quartz glass member and method of manufacturing the same
EP1471038A3 (en) * 2003-04-26 2005-11-23 Schott Ag Process for producing glass articles of doped silica glass
KR20070108178A (en) 2005-02-18 2007-11-08 아사히 가라스 가부시키가이샤 Manufacturing method of synthetic quartz glass, jig for manufacturing synthetic quartz glass and synthetic quartz glass for optical member

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6039535A (en) * 1983-08-12 1985-03-01 Toshiba Ceramics Co Ltd Screening method of quartz glass
JPS6134668A (en) * 1984-07-27 1986-02-18 Casio Comput Co Ltd Kana-kanji conversion processing method
JPS6145824A (en) * 1984-08-01 1986-03-05 Nippon Kiki Kogyo Kk Load handling apparatus

Also Published As

Publication number Publication date
JPS6428240A (en) 1989-01-30

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