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JPH0553872B2 - - Google Patents
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JPH0553872B2 - - Google Patents

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Publication number
JPH0553872B2
JPH0553872B2 JP60243663A JP24366385A JPH0553872B2 JP H0553872 B2 JPH0553872 B2 JP H0553872B2 JP 60243663 A JP60243663 A JP 60243663A JP 24366385 A JP24366385 A JP 24366385A JP H0553872 B2 JPH0553872 B2 JP H0553872B2
Authority
JP
Japan
Prior art keywords
lid
vacuum chamber
aluminum
main body
cvd
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60243663A
Other languages
Japanese (ja)
Other versions
JPS62103380A (en
Inventor
Yutaka Kato
Eizo Isoyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Altemira Co Ltd
Original Assignee
Showa Aluminum Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Aluminum Corp filed Critical Showa Aluminum Corp
Priority to JP24366385A priority Critical patent/JPS62103380A/en
Publication of JPS62103380A publication Critical patent/JPS62103380A/en
Publication of JPH0553872B2 publication Critical patent/JPH0553872B2/ja
Granted legal-status Critical Current

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  • Physical Vapour Deposition (AREA)
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  • ing And Chemical Polishing (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 この発明は、CVD装置およびドライ・エツチ
ング装置における真空チヤンバの製造方法に関す
る。
DETAILED DESCRIPTION OF THE INVENTION FIELD OF INDUSTRIAL APPLICATION This invention relates to a method for manufacturing a vacuum chamber in a CVD device and a dry etching device.

この明細書において、「アルミニウム」という
語には、純アルミニウムのほかにアルミニウム合
金も含むものとする。ただし、「アルミニウム元
素」という場合にはアルミニウム合金は含まな
い。
In this specification, the term "aluminum" includes not only pure aluminum but also aluminum alloys. However, the term "aluminum element" does not include aluminum alloys.

従来技術とその問題点 CVD装置の真空チヤンバ内には、CVD法の実
施時に、反応ガスとしてSiCl4,SiH2Cl2,AlCl3
PCl3,BCl3等の腐食性ガスが導入され、ドラ
イ・エツチング装置の真空チヤンバ内には、ドラ
イ・エツチングの実施時に、エツチング・ガスと
して塩素を含む腐食性ガスが導入されるので、従
来真空チヤンバとしてはステンレス鋼製のものが
用いられていた。ところが、ステンレス鋼製の真
空チヤンバは重量が大きく、しかも熱伝導性が悪
いという問題があつた。熱伝導性が十分でないと
次のような問題がある。すなわち、CVD装置お
よびドライ・エツチング装置の作動時には、まず
真空チヤンバ内面を200〜250℃に加熱することに
よりベーキング処理を施して真空チヤンバの内面
に吸着している水分を除去しているが、熱伝導性
が悪いと、上記ベーキングの時に真空チヤンバ全
体が均一に加熱されるのに時間がかかるのであ
る。
Prior art and its problems During the CVD process, reaction gases such as SiCl 4 , SiH 2 Cl 2 , AlCl 3 ,
Corrosive gases such as PCl 3 and BCl 3 are introduced into the vacuum chamber of dry etching equipment, and corrosive gases containing chlorine are introduced as etching gases into the vacuum chamber of dry etching equipment. The chamber was made of stainless steel. However, vacuum chambers made of stainless steel have the problem of being heavy and having poor thermal conductivity. If thermal conductivity is insufficient, the following problems may occur. In other words, when CVD equipment and dry etching equipment operate, the inner surface of the vacuum chamber is first heated to 200 to 250°C to perform a baking process to remove moisture adsorbed on the inner surface of the vacuum chamber. If the conductivity is poor, it takes time to uniformly heat the entire vacuum chamber during the baking process.

そこで、ステンレス鋼に比較して重量が小さ
く、熱伝導性が優れ、しかも表面のガス放出係数
の小さなアルミニウム材で真空チヤンバをつくる
ことも考えられているが、アルミニウムはCVD
法やドライ・エツチングの実施時に使用されるガ
スにより腐食させられるという問題があるので、
いまだアルミニウム製の真空チヤンバは実現して
いないのが実情である。
Therefore, it has been considered to make a vacuum chamber using aluminum, which is lighter in weight than stainless steel, has excellent thermal conductivity, and has a small surface gas release coefficient.
There is a problem of corrosion caused by the gases used during etching and dry etching.
The reality is that a vacuum chamber made of aluminum has not yet been realized.

この発明の目的は、上記の問題を解決した
CVD装置およびドライ・エツチング装置におけ
る真空チヤンバの製造方法を提供することにあ
る。
The purpose of this invention is to solve the above problems
An object of the present invention is to provide a method for manufacturing a vacuum chamber in a CVD device and a dry etching device.

問題点を解決するための手段 この発明によるCVD装置およびドライ・エツ
チング装置における真空チヤンバの製造方法は、
アルミニウム製真空チヤンバ用箱状本体および蓋
体をつくつた後、これらの内外両面のうち少なく
とも内面に、イオン注入法によつて、アルミニウ
ム元素と反応しかつCVD法に使用される反応ガ
スおよびドライ・エツチングに使用されるエツチ
ング・ガスに対する耐食性を有する化合物をつく
るイオンを注入して、上記化合物からなる被覆層
を形成することを特徴とするものである。
Means for Solving the Problems A method for manufacturing a vacuum chamber in a CVD device and a dry etching device according to the present invention includes the following steps:
After making the aluminum box-shaped body and lid for the vacuum chamber, at least the inner surfaces of the inside and outside surfaces are filled with a reactive gas and dry gas that reacts with the aluminum element and is used in the CVD method by ion implantation. This method is characterized in that a coating layer made of the above-mentioned compound is formed by implanting ions that create a compound that has corrosion resistance against the etching gas used in etching.

上記において、アルミニウム元素と反応して
CVD法に使用される反応ガスおよびドライ・エ
ツチングに使用されるエツチング・ガスに対する
耐食性を有する化合物をつくるイオンは、数多く
存在するが、その中でたとえば酸素イオン、チツ
素イオン、炭素イオン等が用いられる。これらの
イオンは、容易にガス化されるN2,O2,C等か
ら得られる。上記イオンとアルミニウム元素との
反応によりつくられる化合物はAlN,AlC,Al2
O3等である。また、化合物の被覆層の厚さは0.1
〜1μmの範囲内にあることが好ましい。その理
由は、被覆層の厚さが0.1μm未満であると、被覆
層の上記反応ガスに対する耐食性が十分ではな
く、またイオン注入によつては上記厚さを1μm
を越えて厚くすることはできないからである。上
記被覆層の厚さの制御は、イオン注入時におけ
る、注入深さに関連する加速電圧および注入量に
関連するイオン注入電流等を制御することによつ
て行なう。上記被覆層の厚さを0.1〜1μmとする
には、たとえば加速電圧を50〜500KVに制御し、
イオン注入電流を注入量が1×1018〜1×1019
個/cm2となるように制御する。
In the above, reacting with aluminum element
There are many ions that create compounds that have corrosion resistance against the reactive gases used in CVD methods and the etching gases used in dry etching, among which oxygen ions, nitrogen ions, carbon ions, etc. It will be done. These ions are obtained from easily gasified N 2 , O 2 , C, etc. Compounds created by the reaction of the above ions with aluminum element are AlN, AlC, Al 2
O3 etc. Also, the thickness of the compound coating layer is 0.1
It is preferably within the range of ~1 μm. The reason for this is that if the thickness of the coating layer is less than 0.1 μm, the corrosion resistance of the coating layer against the above-mentioned reaction gas will not be sufficient, and depending on ion implantation, the above-mentioned thickness may be reduced to 1 μm.
This is because it cannot be made thicker than . The thickness of the coating layer is controlled by controlling the accelerating voltage related to the implantation depth, the ion implantation current related to the implantation amount, etc. during ion implantation. In order to make the thickness of the coating layer 0.1 to 1 μm, for example, the accelerating voltage is controlled to 50 to 500 KV,
The ion implantation current is 1×10 18 to 1×10 19
pcs/cm 2 .

作 用 この発明の方法で製造された真空チヤンバの箱
状本体および蓋体がアルミニウム製であるから、
従来のステンレス鋼製の真空チヤンバに比べて軽
量になるとともに熱伝導性が向上し、しかもガス
放出係数が小さくなる。また、本体および蓋体を
アルミニウム材からつくるのであるから、ステン
レス鋼材からつくる場合に比較して加工が容易に
なる。さらに、材料費が安価になる。
Effect Since the box-shaped body and lid of the vacuum chamber manufactured by the method of this invention are made of aluminum,
Compared to conventional stainless steel vacuum chambers, it is lighter, has improved thermal conductivity, and has a lower outgassing coefficient. Furthermore, since the main body and the lid are made from aluminum, processing is easier than when they are made from stainless steel. Furthermore, material costs are reduced.

また、本体および蓋体の内外両面のうち少なく
とも内面に、イオン注入法によつて、アルミニウ
ム元素と反応しかつCVD法に使用される反応ガ
スおよびドライ・エツチングに使用されるエツチ
ング・ガスに対する耐食性を有する化合物をつく
るイオンを注入して、上記化合物からなる被覆層
を形成するので、CVD法およびドライ・エツチ
ングに使用するガスに対する耐食性がステンレス
鋼製のものと同等かそれ以上になる。しかも、形
成された被覆層には、その形成時に水分が吸着す
ることはない。
In addition, at least the inner surfaces of both the inner and outer surfaces of the main body and lid are ion-implanted to provide corrosion resistance against reactive gases that react with aluminum elements and are used in CVD methods and etching gases used in dry etching. Since the coating layer made of the above-mentioned compound is formed by implanting ions that make the compound, the corrosion resistance against gases used in CVD and dry etching is equal to or higher than that of stainless steel. Furthermore, moisture is not adsorbed to the formed coating layer during its formation.

実施例 以下、この発明の実施例を比較例とともに示
す。
Examples Examples of the present invention will be shown below along with comparative examples.

実施例 1 まず、アルミニウム材から真空チヤンバ用箱状
本体および蓋体をつくつた。ついで、この本体お
よび蓋体をターゲツトとし、その内面に加速電圧
300KVという条件でチツ素イオンを1×1019個/
cm2注入した。そして、本体および蓋体の内面に厚
さ1μmのAlN層を形成した。そして、上記箱状
本体および蓋体を、150℃のSiCl4ガス雰囲気中に
1000時間放置して本体および蓋体の耐食性を調べ
た。その結果、本体および蓋体の内面には腐食は
発生していなかつた。
Example 1 First, a box-shaped main body and a lid for a vacuum chamber were made from aluminum material. Next, the main body and lid are targeted, and an accelerating voltage is applied to their inner surfaces.
At 300KV, 1×10 19 titanium ions/
Injected cm2 . Then, an AlN layer with a thickness of 1 μm was formed on the inner surfaces of the main body and the lid. Then, the box-shaped body and lid were placed in a SiCl 4 gas atmosphere at 150°C.
The corrosion resistance of the main body and lid was examined after being left for 1000 hours. As a result, no corrosion occurred on the inner surfaces of the main body and the lid.

実施例 2 イオン注入のさいの注入イオンとして炭素イオ
ンを使用し、加速電圧100KV、イオン注入量1
×1018個/cm2とした他は上記実施例1と同様にし
て本体および蓋体の内面に厚さ0.5μmのAlC層を
形成し、同じく上記実施例1と同様にその内面の
耐食性を調べた。その結果、本体および蓋体の内
面には腐食は認められなかつた。
Example 2 Carbon ions were used as the implanted ions during ion implantation, and the acceleration voltage was 100 KV and the ion implantation amount was 1.
A 0.5 μm thick AlC layer was formed on the inner surfaces of the main body and the lid in the same manner as in Example 1, except that the number of pieces was 18× 10 18 /cm 2 , and the corrosion resistance of the inner surfaces was Examined. As a result, no corrosion was observed on the inner surfaces of the main body and lid.

実施例 3 イオン注入のさいの注入イオンとして酸素イオ
ンを使用し、加速電圧300KV、イオン注入量1
×1019個/cm2とした他は上記実施例1と同様にし
て本体および蓋体の内面に厚さ1μmのAl2O3層を
形成し、同じく上記実施例1と同様にその内面の
耐食性を調べた。その結果、本体および蓋体の内
面には腐食は認められなかつた。
Example 3 Oxygen ions were used as the implanted ions during ion implantation, the acceleration voltage was 300 KV, and the ion implantation amount was 1.
×10 19 pieces/cm 2 except that a 1 μm thick Al 2 O 3 layer was formed on the inner surfaces of the main body and lid in the same manner as in Example 1 above, and Corrosion resistance was investigated. As a result, no corrosion was observed on the inner surfaces of the main body and lid.

比較例 まず、アルミニウム材から真空チヤンバ用箱状
本体および蓋体をつくつた。そして、上記箱状本
体および蓋体を、温度150℃のSiCl4ガス雰囲気中
に1000時間放置して本体および蓋体の耐食性を調
べた。その結果、本体および蓋体の表面は激しく
腐食していた。
Comparative Example First, a box-shaped main body and a lid for a vacuum chamber were made from aluminum material. Then, the box-shaped main body and the lid were left in a SiCl 4 gas atmosphere at a temperature of 150° C. for 1000 hours, and the corrosion resistance of the main body and the lid was examined. As a result, the surfaces of the main body and lid were severely corroded.

発明の効果 この発明によるCVD装置およびドライ・エツ
チング装置における真空チヤンバの製造方法によ
れば、上述のように、従来のステンレス鋼製のも
のと比較して軽量で、熱伝導性が良く、さらにガ
ス放出量が少ない真空チヤンバを製造することが
できる。しかも、本体および蓋体をアルミニウム
材からつくるのであるから、ステンレス鋼材から
つくる場合に比較して加工が容易であるととも
に、材料費が安価になる。特に、製造された真空
チヤンバが熱伝導性に優れているので、従来のも
のに比べてCVD装置およびドライ・エツチング
装置の作動時のベーキング処理時間を短縮するこ
とができる。
Effects of the Invention According to the method of manufacturing a vacuum chamber for a CVD device and a dry etching device according to the present invention, as described above, it is lighter in weight and has better thermal conductivity than the conventional one made of stainless steel. Vacuum chambers with low emissions can be manufactured. Moreover, since the main body and the lid are made from aluminum material, processing is easier and the material cost is lower than when they are made from stainless steel material. In particular, since the manufactured vacuum chamber has excellent thermal conductivity, baking processing time during operation of CVD equipment and dry etching equipment can be reduced compared to conventional vacuum chambers.

また、本体および蓋体の内外両面のうち少なく
とも内面に、イオン注入法によつて、アルミニウ
ム元素と反応しかつCVD法に使用される反応ガ
スおよびドライ・エツチングに使用されるエツチ
ング・ガスに対する耐食性を有する化合物をつく
るイオンを注入して、上記化合物からなる被覆層
を形成するので、CVD法およびドライ・エツチ
ングに使用するガスに対する耐食性がステンレス
鋼製のものと同等かそれ以上になる。しかも、形
成された被覆層には、その形成時に水分が吸着す
ることはないので、このような水分を除去する作
業が不要になる。また、形成された被覆層に水分
が吸着していることはないので、製造された真空
雨チヤンバをCVD装置およびドライ・エツチン
グ装置に使用した場合に、従来から行われている
ベーキング処理を施すだけで、アルミニウムがス
テンレス鋼に比べて表面の放出ガス係数が小さい
ことと相俟つて、CVD装置およびドライ・エツ
チング装置の作動時の真空チヤンバ内の真空度の
低下を防止できる。
In addition, at least the inner surfaces of both the inner and outer surfaces of the main body and lid are ion-implanted to provide corrosion resistance against reactive gases that react with aluminum elements and are used in CVD methods and etching gases used in dry etching. Since the coating layer made of the above-mentioned compound is formed by implanting ions that make the compound, the corrosion resistance against gases used in CVD and dry etching is equal to or higher than that of stainless steel. Moreover, since moisture is not adsorbed to the formed coating layer during its formation, such an operation for removing moisture becomes unnecessary. In addition, since no moisture is adsorbed in the formed coating layer, when the manufactured vacuum rain chamber is used in CVD equipment and dry etching equipment, it is only necessary to perform the conventional baking treatment. Coupled with the fact that aluminum has a lower surface gas release coefficient than stainless steel, it is possible to prevent a decrease in the degree of vacuum in the vacuum chamber during the operation of CVD equipment and dry etching equipment.

Claims (1)

【特許請求の範囲】[Claims] 1 アルミニウム製真空チヤンバ用箱状本体およ
び蓋体をつくつた後、これらの内外両面のうち少
なくとも内面に、イオン注入法によつて、アルミ
ニウム元素と反応しかつCVD法に使用される反
応ガスおよびドライ・エツチングに使用されるエ
ツチング・ガスに対する耐食性を有する化合物を
つくるイオンを注入して、上記化合物からなる被
覆層を形成することを特徴とするCVD装置およ
びドライ・エツチング装置における真空チヤンバ
の製造方法。
1 After making an aluminum box-like body and a lid for a vacuum chamber, at least the inner surfaces of these inside and outside surfaces are injected with a reactive gas and a dry gas that react with the aluminum element and are used in the CVD method by ion implantation. - A method for manufacturing a vacuum chamber in a CVD device and a dry etching device, characterized in that a coating layer made of the compound is formed by implanting ions that create a compound that has corrosion resistance against the etching gas used for etching.
JP24366385A 1985-10-29 1985-10-29 Production of vacuum chamber for cvd device and dry etching device Granted JPS62103380A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24366385A JPS62103380A (en) 1985-10-29 1985-10-29 Production of vacuum chamber for cvd device and dry etching device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24366385A JPS62103380A (en) 1985-10-29 1985-10-29 Production of vacuum chamber for cvd device and dry etching device

Publications (2)

Publication Number Publication Date
JPS62103380A JPS62103380A (en) 1987-05-13
JPH0553872B2 true JPH0553872B2 (en) 1993-08-11

Family

ID=17107150

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24366385A Granted JPS62103380A (en) 1985-10-29 1985-10-29 Production of vacuum chamber for cvd device and dry etching device

Country Status (1)

Country Link
JP (1) JPS62103380A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112006002987T5 (en) 2005-11-17 2008-10-02 Kabushiki Kaisha Kobe Seiko Sho Aluminum alloy element with excellent corrosion resistance

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6383964B1 (en) 1998-11-27 2002-05-07 Kyocera Corporation Ceramic member resistant to halogen-plasma corrosion
JP4512603B2 (en) * 2007-02-26 2010-07-28 トーカロ株式会社 Halogen gas resistant semiconductor processing equipment components

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6021382A (en) * 1983-07-15 1985-02-02 Canon Inc Plasma cvd apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112006002987T5 (en) 2005-11-17 2008-10-02 Kabushiki Kaisha Kobe Seiko Sho Aluminum alloy element with excellent corrosion resistance

Also Published As

Publication number Publication date
JPS62103380A (en) 1987-05-13

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