JPH0554882B2 - - Google Patents
Info
- Publication number
- JPH0554882B2 JPH0554882B2 JP24614886A JP24614886A JPH0554882B2 JP H0554882 B2 JPH0554882 B2 JP H0554882B2 JP 24614886 A JP24614886 A JP 24614886A JP 24614886 A JP24614886 A JP 24614886A JP H0554882 B2 JPH0554882 B2 JP H0554882B2
- Authority
- JP
- Japan
- Prior art keywords
- grating
- sample
- measured
- flatness
- pitch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000006243 chemical reaction Methods 0.000 claims description 15
- 238000005259 measurement Methods 0.000 claims description 6
- 238000003384 imaging method Methods 0.000 claims description 4
- 238000001444 catalytic combustion detection Methods 0.000 description 26
- 239000011295 pitch Substances 0.000 description 10
- 238000010586 diagram Methods 0.000 description 6
- 238000005452 bending Methods 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000003973 paint Substances 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000005338 frosted glass Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000011022 opal Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Coating Apparatus (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、表面性状測定装置に係り、特に、塗
膜または塗装面その他の被測定試料面のうねりあ
るいはゆず肌等の平坦度と光沢度とを測定する装
置に関する。[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a surface texture measuring device, and in particular, the flatness and glossiness of a coating film, painted surface, or other sample surface to be measured, such as waviness or orange skin. The present invention relates to a device for measuring.
塗膜または塗装面の平坦度を測定する装置とし
ては、例えば、特開昭56−76004号が知られてい
る。この装置は、光源と、明暗パターンと、結像
レンズと、光電変換素子等とからなり、歪み率か
ら平坦度を測定している。
As an apparatus for measuring the flatness of a paint film or a painted surface, for example, Japanese Patent Application Laid-open No. 76004/1983 is known. This device consists of a light source, a bright/dark pattern, an imaging lens, a photoelectric conversion element, etc., and measures the flatness based on the distortion rate.
一方、被測定試料面の光沢度に関しては、JIS
Z8741に準拠した測定装置が、各社から市販され
ている。 On the other hand, regarding the glossiness of the sample surface to be measured, JIS
Measurement devices compliant with Z8741 are commercially available from various companies.
被測定試料面の平坦度と光沢度とを測定しよう
とするとき、従来は、それぞれ単独の平坦度測定
装置と光沢度測定装置とを揃える必要があり、測
定時間が長くかかつていた。
Conventionally, when attempting to measure the flatness and glossiness of a surface of a sample to be measured, it has been necessary to prepare a separate flatness measuring device and a glossiness measuring device, respectively, resulting in a long measurement time.
また、被測定試料面の同じ位置での平坦度と光
沢度とを定量評価することは、試料をそれぞれの
測定装置に装着する条件が変わるため、困難であ
つた。 Furthermore, it has been difficult to quantitatively evaluate the flatness and glossiness at the same position on the surface of a sample to be measured because the conditions for mounting the sample on each measuring device vary.
本発明の目的は、1回の試料装着で平坦度と光
沢度とを同時に測定可能な表面性状測定装置を提
供することである。 An object of the present invention is to provide a surface texture measuring device that can simultaneously measure flatness and gloss by mounting a sample once.
本発明は、上記目的を達成するために、光源
と、光源に近接して設置され明暗が交互に多数繰
り返される格子と、格子を透過した光を被測定試
料面に反射させた後に格子の実像を結像させるレ
ンズと、レンズによる格子像の結像面に設置され
格子像の光強度分布を光電変換する光電交換ユニ
ツトと、光電変換ユニツトからの変換信号に基づ
き格子像のピツチPiを検出し、ピツチPiの標準偏
差σ
を求め、被測定試料面の平坦度として出力するピ
ツチ信号処理回路と、光電変換ユニツトからの変
換信号に基づき格子像の明部の電圧VBiと暗部の
電圧VDiとからコントラストC
C=1/n×o
〓i=1
VBi−VDi/VBi+VDi
を求め、前記被測定試料面の光沢度に換算するコ
ントラスト信号処理回路と、平坦度および光沢度
を表示する表示ユニツトとからなる表面性状測定
装置を提案するものである。
In order to achieve the above object, the present invention includes a light source, a grating that is placed close to the light source and repeats brightness and darkness repeatedly, and a real image of the grating after the light transmitted through the grating is reflected onto the surface of a sample to be measured. a photoelectric exchange unit installed on the imaging plane of the grating image by the lens and photoelectrically converting the light intensity distribution of the grating image, and detecting the pitch Pi of the grating image based on the conversion signal from the photoelectric conversion unit. , standard deviation σ of pitch Pi The pitch signal processing circuit outputs the flatness of the sample surface to be measured, and the contrast C is calculated from the bright part voltage VBi and the dark part voltage VDi of the grating image based on the conversion signal from the photoelectric conversion unit. × o 〓 We proposed a surface texture measuring device consisting of a contrast signal processing circuit that calculates i=1 VBi−VDi/VBi+VDi and converts it into the glossiness of the sample surface to be measured, and a display unit that displays the flatness and glossiness. It is something to do.
本発明においては、装着した被測定試料面の同
一部位の光電変換信号から、明暗のピツチとコン
トラストとを摘出し、ピツチに基づき平坦度を求
め、コントラストを光沢度に換算するので、1回
の測定で同一部位の平坦度と光沢度を測定でき
る。
In the present invention, the bright and dark pitch and contrast are extracted from the photoelectric conversion signals of the same part of the mounted sample surface, the flatness is determined based on the pitch, and the contrast is converted into glossiness. The flatness and glossiness of the same area can be measured.
第1図は、本発明による表面性状測定装置の一
実施例の構成を示すブロツク図である。図におい
て、1は光源ホルダで、タングステンランプまた
はハロゲンランプ等の光源2を保持している。投
光ホルダ3には、2枚1組のコンデンサレンズ4
と、すりガラスまたはオパールガラス等の拡散板
5と、明暗が交互に多数繰り返される格子6とが
内蔵されている。格子6は、第2図に示すよう
に、ガラス基板100にクロム蒸着またはアルミ
蒸着したW1=0.1mmの暗格子101と、蒸着して
いないW2=0.1mmの明格子102とが、同一ピツ
チで約10mmの長さに亙つて交互に繰り返されてい
る格子である。レンズホルダ7にマウントされた
投影レンズ8は、光路折曲げミラー9,10,1
1および試料面13を介して、リニア形CCD1
5上に格子像を結像させるレンズである。リニア
形CCD15は、CCDホルダ14にマウントされ、
格子像の結像面に位置し、格子像を光電変換す
る。12は試料を所定位置に固定する試料吸着用
永久磁石である。
FIG. 1 is a block diagram showing the configuration of an embodiment of a surface texture measuring device according to the present invention. In the figure, a light source holder 1 holds a light source 2 such as a tungsten lamp or a halogen lamp. A set of two condenser lenses 4 is attached to the light projection holder 3.
, a diffuser plate 5 made of frosted glass or opal glass, and a grid 6 in which light and dark are alternately repeated. As shown in FIG. 2, the grating 6 has a dark grating 101 of W1 = 0.1 mm, which is chromium-deposited or aluminum-deposited on a glass substrate 100, and a bright grating 102 of W2 = 0.1 mm, which is not vapor-deposited, at the same pitch. It is a grid that is repeated alternately over a length of approximately 10 mm. The projection lens 8 mounted on the lens holder 7 includes optical path bending mirrors 9, 10, 1
1 and the sample surface 13, the linear CCD 1
This is a lens that forms a grating image on 5. The linear CCD 15 is mounted on the CCD holder 14,
It is located at the imaging plane of the lattice image and photoelectrically converts the lattice image. Reference numeral 12 denotes a permanent magnet for sample attraction that fixes the sample in a predetermined position.
リニア形CCD15に生じたアナログ信号は、
ハイパスフイルタ16とアンプ17を介して、
A/Dコンバータ18に入力される。A/Dコン
バータ18は、アンプ17の出力信号を、CCD
制御回路20からのAD/D変換スタート信号に
応じて、逐次アナログ/デイジタル変換し、メモ
リ回路19に格子像の光電変換波形を記憶させ
る。20は、リニア形CCD15を駆動するCCD
制御回路、21は本測定装置全体を制御する中央
処理装置(CPU)、22はCPU21で演算処理さ
れた平坦度と光沢度の結果を表示する表示器、2
3は測定スイツチである。 The analog signal generated in the linear CCD15 is
Via the high pass filter 16 and amplifier 17,
The signal is input to the A/D converter 18. The A/D converter 18 converts the output signal of the amplifier 17 into a CCD
In response to an AD/D conversion start signal from the control circuit 20, analog/digital conversion is performed successively, and the photoelectric conversion waveform of the grating image is stored in the memory circuit 19. 20 is a CCD that drives the linear CCD 15
a control circuit; 21 is a central processing unit (CPU) that controls the entire measuring device; 22 is a display that displays the results of flatness and gloss calculated by the CPU 21;
3 is a measurement switch.
以上のように構成した本発明表面性状測定装置
の動作を次に説明する。ここでは、投影レンズ8
の焦点距離を50mm、格子6から投影レンズ8まで
の距離を60mm、投影レンズ8からリニア形CCD
15までの距離を300mmとし、投影倍率を5倍と
仮定する。 The operation of the surface texture measuring device of the present invention constructed as described above will be explained next. Here, the projection lens 8
The focal length of is 50mm, the distance from grating 6 to projection lens 8 is 60mm, and from projection lens 8 to linear CCD
Assume that the distance to No. 15 is 300 mm and the projection magnification is 5x.
光源2からの光線は、2枚のコンデンサレンズ
により集光される。集光された光束は、拡散板5
により均一な強度分布となり、格子6を照明す
る。そこで、投影レンズ8は、格子6を透過して
きた光を光路折曲げミラー9,10,11および
試料表面13を介して、リニア形CCD15上に
結像させ、格子6の実像を作る。 The light beam from the light source 2 is condensed by two condenser lenses. The condensed luminous flux passes through the diffuser plate 5
This results in a uniform intensity distribution and illuminates the grating 6. Therefore, the projection lens 8 forms a real image of the grating 6 by focusing the light that has passed through the grating 6 on the linear CCD 15 via the optical path bending mirrors 9, 10, 11 and the sample surface 13.
試料が平面鏡の場合、平面鏡を試料吸着用永久
磁石12に保持させると、格子像は、5倍に拡大
投影され、0.5mmピツチの明暗の歪みのない連続
した像がリニア形CCD15上に結像される。
CCD15により光電変換された出力信号は、第
3図のようになり、次段のハイパスフイルタ16
に送られる。ハイパスフイルタ16では、太陽光
や室内の照明光などの外乱光がリニア形CCD1
5に入光したとき、リニア形CCD15の出力信
号に重畳した低周波信号を除去する。ハイパスフ
イルタ16の出力信号はアンプ17で増幅され、
A/Dコンバータ18に入力される。A/Dコン
バータ18では、リニア形CCD15により光電
変換された格子像の信号が、CCD制御回路20
で作成されたタイミング信号に同期して、アナロ
グ量からデイジタル量に逐次変換される。変換さ
れたデイジタル値はメモリ回路19に記憶され
る。本実施例の場合は、2048の分解能を有してい
るリニア形CCDを用い、12ビツトのA/Dコン
バータ18でデイジタル変換し、メモリ回路19
に2048×12ビツトのデータを記憶できるようにし
てある。 When the sample is a plane mirror, when the plane mirror is held by the sample adsorption permanent magnet 12, the grating image is enlarged and projected five times, and a continuous image of brightness and darkness with a pitch of 0.5 mm without distortion is formed on the linear CCD 15. be done.
The output signal photoelectrically converted by the CCD 15 is as shown in Fig. 3, and is sent to the next stage high-pass filter 16.
sent to. The high-pass filter 16 filters ambient light such as sunlight and indoor lighting into the linear CCD 1.
5, the low frequency signal superimposed on the output signal of the linear CCD 15 is removed. The output signal of the high-pass filter 16 is amplified by the amplifier 17,
The signal is input to the A/D converter 18. In the A/D converter 18, the signal of the grating image photoelectrically converted by the linear CCD 15 is sent to the CCD control circuit 20.
Analog quantities are successively converted into digital quantities in synchronization with the timing signal created by The converted digital value is stored in memory circuit 19. In the case of this embodiment, a linear CCD with a resolution of 2048 is used, digital conversion is performed by a 12-bit A/D converter 18, and the memory circuit 19
It is designed to be able to store 2048 x 12 bits of data.
測定スイツチ23を押すと、CPU21がそれ
を認識し、被測定試料表面13の格子像データを
メモリ回路19に記憶させる。CPU21は、メ
モリ回路19に記憶されたデータを読み込み、第
3図の明部のピーク点B31,B32,B33…
…または暗部のボトム点D31,D32,D33
……を摘出する。次に、ピツチP31,P32に
……を摘出する(本実施例ではボトム点間のアド
レス数からピツチを得ている。)このピツチデー
タから標準偏差σを演算する。 When the measurement switch 23 is pressed, the CPU 21 recognizes this and stores the lattice image data of the surface 13 of the sample to be measured in the memory circuit 19. The CPU 21 reads the data stored in the memory circuit 19, and reads the peak points B31, B32, B33, . . . in the bright portions of FIG.
...or the bottom points D31, D32, D33 of the dark area
Extract... Next, the pitches P31 and P32 are extracted (in this embodiment, the pitches are obtained from the number of addresses between the bottom points). The standard deviation σ is calculated from this pitch data.
演算された標準偏差σを被測定試料面13の平坦
度として表示器22に表示する。 The calculated standard deviation σ is displayed on the display 22 as the flatness of the sample surface 13 to be measured.
一方、摘出されたピーク点およびボトム点の電
圧VB1、VB2,VB3,……およびVD1,VD2,
VD3,……から次式により当該試料面部位のコ
ントラストCを演算する。 On the other hand, the extracted peak point and bottom point voltages VB1, VB2, VB3, ... and VD1, VD2,
From VD3, . . . , calculate the contrast C of the relevant sample surface portion using the following formula.
C=1/no
〓i=1
VBi−VDi/VBi+VDi
演算されたコントラストを光沢度に換算し、前
記平坦度と同様に表示器22に表示する。 C=1/n o 〓 i=1 VBi−VDi/VBi+VDi The calculated contrast is converted into glossiness and displayed on the display 22 in the same way as the flatness.
上記説明では、試料を平面鏡としたが、塗膜面
の場合も同様である。塗膜面での反射によりリニ
ア形CCD15から得られた出力信号を第4図に
示す。この場合は、第3図の平面鏡の例とは異な
り、被測定試料面のうねりまたはゆず肌等によ
り、出力波形が乱れ、ピーク点B41,B42,
B43……およびボトム点D41,D42,D4
3……の位置も区区であるから、ピツチP41,
P42,P43……も不揃いである。 In the above explanation, the sample was a plane mirror, but the same applies to the case of a coating surface. Figure 4 shows the output signal obtained from the linear CCD 15 due to reflection on the coating surface. In this case, unlike the example of the plane mirror in FIG. 3, the output waveform is disturbed by the undulations or orange skin of the surface of the sample to be measured, and the peak points B41, B42, etc.
B43... and bottom points D41, D42, D4
Since the location of 3... is also a ward, Pituchi P41,
P42, P43... are also irregular.
上記実施例は、リニア形CCDを用いる例であ
つたが、これに代えて、リニア形CCDと送り機
構の組合せまたはエリア形CCDを使うこともで
きる。そのときは、CCD制御回路20が、前記
リニア形CCDの配列方向のみならずそれに直角
方向にも走査することになる。 Although the above embodiment uses a linear CCD, a combination of a linear CCD and a feeding mechanism or an area CCD may be used instead. At that time, the CCD control circuit 20 scans not only in the direction in which the linear CCDs are arranged, but also in a direction perpendicular thereto.
CPU21は、上記実施例と同様に、各走査線
上の標準偏差σi及びコントラストCiを演算し、次
にそれらの平均値σ及びCを求め、被測定試料面
の平坦度及び光沢度を表示器22に表示する。 Similarly to the above embodiment, the CPU 21 calculates the standard deviation σi and contrast Ci on each scanning line, then calculates their average values σ and C, and displays the flatness and glossiness of the sample surface to be measured on the display 22. to be displayed.
本発明は、塗膜または塗装面のうねりあるいは
ゆす肌の平坦度および光沢度の測定のみならず、
金属面やプラスチツク等の表面のうねりなどの測
定にも適用でき、その応用範囲は広い。 The present invention not only measures the flatness and gloss of the waviness or shaking surface of a paint film or painted surface, but also measures
It can also be used to measure the waviness of metal surfaces, plastic surfaces, etc., and its range of applications is wide.
〔発明の効果〕
本発明によれば、試料を1回装着するだけで、
被測定試料面の平坦度と光沢度とを同時に測定可
能な表面性状測定装置が得られる。[Effects of the Invention] According to the present invention, by simply mounting the sample once,
A surface texture measuring device capable of simultaneously measuring flatness and gloss of a surface of a sample to be measured is obtained.
したがつて、操作が単純で、測定時間が短く、
自動化した生産ライン等に適用するにも有利であ
る。 Therefore, operation is simple, measurement time is short,
It is also advantageous to apply to automated production lines.
第1図はリニア形CCDを用いた本発明による
表面性状測定装置の一実施例の構成を示すブロツ
ク図、第2図は第1図装置の格子の構成を示す
図、第3図は試料面が平面鏡の場合のリニア形
CCDの出力波形を示す図、第4図は試料面が塗
装面の場合のリニア形CCDの出力波形を示す図
である。
2……光源、4……コンデンサレンズ、5……
拡散板、6……格子、8……投像レンズ、9,1
0,11……折曲げミラー、12……試料吸着用
永久磁石、13……試料、15……リニア形
CCD、16……ハイパスフイルタ、17……ア
ンプ、18……A/Dコンバータ、19……メモ
リ回路、20……CCD制御回路、21……CPU、
22……表示器、23……スイツチ。
Fig. 1 is a block diagram showing the structure of an embodiment of the surface texture measuring device according to the present invention using a linear CCD, Fig. 2 is a diagram showing the structure of the grating of the device shown in Fig. 1, and Fig. 3 is a diagram showing the sample surface. Linear shape when is a plane mirror
A diagram showing the output waveform of the CCD. FIG. 4 is a diagram showing the output waveform of the linear CCD when the sample surface is a painted surface. 2...Light source, 4...Condenser lens, 5...
Diffusion plate, 6... Grid, 8... Projection lens, 9, 1
0, 11...Bending mirror, 12...Permanent magnet for sample attraction, 13...Sample, 15...Linear type
CCD, 16...High pass filter, 17...Amplifier, 18...A/D converter, 19...Memory circuit, 20...CCD control circuit, 21...CPU,
22...display, 23...switch.
Claims (1)
繰り返される格子と、 前記格子を透過した光を被測定試料面に反射さ
せた後に前記格子の実像を結像させるレンズと、 前記レンズによる前記格子像の結像面に設置さ
れ格子像の光強度分布を光電変換する光電変換ユ
ニツトと、 前記光電変換ユニツトからの変換信号に基づき
格子像のピツチPiを検出し、前記ピツチPiの標準
偏差σ を求め、前記被測定試料面の平坦度として出力す
るピツチ信号処理回路と、 前記光電変換ユニツトからの変換信号に基づき
格子像の明部の電圧VBiと暗部の電圧VDiとから
コントラストC C=1/n×o 〓i=1 VBi−VDi/VBi+VDi を求め、前記被測定試料面の光沢度に換算するコ
ントラスト信号処理回路と、 前記平坦度および光沢度を表示する表示ユニツ
トと からなる表面性状測定装置。[Scope of Claims] 1. A light source, a grating that is placed close to the light source and repeats brightness and darkness many times, and a real image of the grating is formed after the light transmitted through the grating is reflected onto a surface of a sample to be measured. a photoelectric conversion unit installed on an imaging plane of the grating image by the lens and photoelectrically converting the light intensity distribution of the grating image; and detecting a pitch Pi of the grating image based on a conversion signal from the photoelectric conversion unit. and the standard deviation σ of the pitch Pi and a pitch signal processing circuit which calculates the flatness of the sample surface to be measured, and calculates the contrast C from the voltage VBi of the bright part and the voltage VDi of the dark part of the grating image based on the conversion signal from the photoelectric conversion unit. /n× o 〓 i=1 A surface texture measurement consisting of a contrast signal processing circuit that calculates VBi−VDi/VBi+VDi and converts it into the glossiness of the sample surface to be measured, and a display unit that displays the flatness and glossiness. Device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24614886A JPS63100310A (en) | 1986-10-16 | 1986-10-16 | Surface texture measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24614886A JPS63100310A (en) | 1986-10-16 | 1986-10-16 | Surface texture measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63100310A JPS63100310A (en) | 1988-05-02 |
| JPH0554882B2 true JPH0554882B2 (en) | 1993-08-13 |
Family
ID=17144200
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24614886A Granted JPS63100310A (en) | 1986-10-16 | 1986-10-16 | Surface texture measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63100310A (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03277913A (en) * | 1990-03-28 | 1991-12-09 | Mitsubishi Motors Corp | Coated surface inspecting apparatus |
| US5078496A (en) * | 1990-08-14 | 1992-01-07 | Autospect, Inc. | Machine vision surface characterization system |
| JP2808890B2 (en) * | 1990-11-30 | 1998-10-08 | 日産自動車株式会社 | Painted surface inspection equipment |
| JPH04316478A (en) * | 1991-04-12 | 1992-11-06 | Nec Corp | Device for observing test specimen of organism, system and method |
| JP2004191070A (en) * | 2002-12-06 | 2004-07-08 | Daihatsu Motor Co Ltd | Coated surface inspection apparatus |
| JP7336380B2 (en) * | 2019-12-27 | 2023-08-31 | 株式会社堀場製作所 | Standard plate, calibration member, gloss meter, and method for manufacturing standard plate |
-
1986
- 1986-10-16 JP JP24614886A patent/JPS63100310A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63100310A (en) | 1988-05-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US8878929B2 (en) | Three dimensional shape measurement apparatus and method | |
| RU95108254A (en) | SYSTEM FOR PROJECTING COLOR VIDEO IMAGES AND RELATED TRANSFORMING OPTICS | |
| KR100292434B1 (en) | Device and method for inspecting lens of camera by using linear ccd | |
| JP3471436B2 (en) | Image quality inspection apparatus and image synthesizing method thereof | |
| JP2001304816A (en) | Travel measuring system and apparatus using granular dot pattern by laser reflected light | |
| JPH0554882B2 (en) | ||
| TW201935058A (en) | Camera module adjustment device and camera module adjustment method | |
| JP2000155013A (en) | Shape measuring instrument | |
| EP0079439B1 (en) | Optical system for oblique viewing | |
| JP2521729B2 (en) | Flatness measuring device | |
| JP3417494B2 (en) | Method and apparatus for inspecting surface undulation of glass substrate | |
| CN210834671U (en) | Addressing scanning rapid fluorescence lifetime microscopic imaging system | |
| DE4210075A1 (en) | Three=dimensional optical monitoring of geometry of mirrored objects - illuminating scene using light sources of known geometry, acquiring reflected light source images and comparing with reference images | |
| JP2542040B2 (en) | Photographic measurement of stationary objects | |
| JP4828737B2 (en) | MTF measuring device | |
| JPH0726834B2 (en) | Optical device for lead shape inspection of electronic parts and lead shape inspection device for electronic parts using the same | |
| JP3575586B2 (en) | Scratch inspection device | |
| JP3114347B2 (en) | One-dimensional CCD imaging device | |
| JPS63109309A (en) | Non-contact flatness measuring device | |
| CN119756225B (en) | Triangular optical measurement system | |
| JP2000155016A (en) | Shape measuring instrument | |
| JPH05288638A (en) | Two-dimensional luminous intensity distribution measuring apparatus for liquid crystal display panel | |
| JPS635235A (en) | Photometric device | |
| JPS63243841A (en) | Surface property measuring instrument | |
| RU99118070A (en) | METHOD FOR MEASURING SPECTRAL CHARACTERISTICS OF REFLECTION OR RADIATION OF AN OBJECT AT ANY POINT OF ITS TELEVISION IMAGE AND A VIDEO SPECTROMETER IMPLEMENTING THIS METHOD IN REAL OR EXPLAINLY. |