JPH0559583B2 - - Google Patents
Info
- Publication number
- JPH0559583B2 JPH0559583B2 JP58017360A JP1736083A JPH0559583B2 JP H0559583 B2 JPH0559583 B2 JP H0559583B2 JP 58017360 A JP58017360 A JP 58017360A JP 1736083 A JP1736083 A JP 1736083A JP H0559583 B2 JPH0559583 B2 JP H0559583B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- package body
- logic
- semiconductor
- semiconductor package
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
Landscapes
- Lead Frames For Integrated Circuits (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Description
【発明の詳細な説明】
本発明はスタツク構造の半導体装置に関し、特
に実装密度と布線特性の向上を図つた半導体装置
に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a semiconductor device with a stacked structure, and more particularly to a semiconductor device with improved packaging density and wiring characteristics.
スタツク構造の半導体装置は、複数個の半導体
装置を上下方向に積層してこれを一体化しかつ相
互に接続したものであるため実装密度を損わずに
記憶容量の増大を図ることができる。しかしなが
ら、従来のこの種の半導体装置はもつぱら記憶用
半導体装置の容量の増大を目的としているため、
これら半導体装置の発熱量が比較的に小さいこと
から特に放熱上の問題は生じていないが、これに
論理用半導体装置を加える場合にはその発熱量が
大きい場合が多いために放熱上の問題が生じ、装
置の実装密度の向上に制限を受けている。 A stacked semiconductor device is a device in which a plurality of semiconductor devices are vertically stacked, integrated, and connected to each other, so that it is possible to increase storage capacity without reducing packaging density. However, since the conventional semiconductor devices of this type are mainly aimed at increasing the capacity of the storage semiconductor device,
Since the amount of heat generated by these semiconductor devices is relatively small, there are no particular heat dissipation problems, but when logic semiconductor devices are added to these devices, the amount of heat generated is often large, so there are problems with heat dissipation. This has limited the ability to increase the packaging density of devices.
また、記憶用半導体装置と論理用半導体装置を
組合わせる場合には、外部配線が必要であり、布
線長さが長くなつて信号伝達速度を劣化させると
いう問題もある。 Furthermore, when a memory semiconductor device and a logic semiconductor device are combined, external wiring is required, which increases the length of the wiring, resulting in a problem of deterioration of signal transmission speed.
したがつて本発明の目的は、記憶用および論理
用の各半導体装置をスタツク構造に構成した半導
体装置における放熱上および信号伝達速度の問題
を解消して実装密度の向上と布線特性の向上を図
つた半導体装置を提供することにある。 Therefore, an object of the present invention is to solve the problems of heat dissipation and signal transmission speed in a semiconductor device in which memory and logic semiconductor devices are configured in a stacked structure, thereby improving the packaging density and wiring characteristics. An object of the present invention is to provide a semiconductor device with improved performance.
この目的を達成するために本発明は、発熱量の
大きな論理用半導体装置を発熱量の小さな記憶用
半導体装置の上に積層してスタツク構造を構成す
るようにしたものである。 In order to achieve this object, the present invention constructs a stacked structure by stacking a logic semiconductor device that generates a large amount of heat on a memory semiconductor device that generates a small amount of heat.
以下、本発明を図示の実施例により説明する。 Hereinafter, the present invention will be explained with reference to illustrated embodiments.
第1図は本発明装置の正面図、第2図は一部の
破断斜視図である。図示のように本発明装置は論
理用半導体装置1、記憶用半導体装置2,3の
夫々の側面に外部リード1a,2a,3aを設
け、各外部リード1a,2a,3aはその下端を
パツケージ本体1b,2b,3bの下面よりも下
方に突出している。また、各パツケージ本体1
b,2b,3bの周面ないし上面には各外部リー
ド1a,2a,3aに接続した連設部1c,2
c,3cをメタライズ等により形成している。な
お、この場合、記憶用半導体装置2,3の外部リ
ード数は一般に少ないので第2図に示すように論
理用半導体装置の外部リードに対応する位置に遊
びリード4を設けておく。 FIG. 1 is a front view of the device of the present invention, and FIG. 2 is a partially cutaway perspective view. As shown in the figure, in the device of the present invention, external leads 1a, 2a, 3a are provided on the respective sides of a logic semiconductor device 1 and storage semiconductor devices 2, 3, and each external lead 1a, 2a, 3a has its lower end connected to the package body. It protrudes downward from the lower surfaces of 1b, 2b, and 3b. In addition, each package body 1
Continuous portions 1c, 2 connected to the respective external leads 1a, 2a, 3a are provided on the peripheral surfaces or upper surfaces of b, 2b, 3b.
c and 3c are formed by metallization or the like. In this case, since the number of external leads of the memory semiconductor devices 2 and 3 is generally small, idle leads 4 are provided at positions corresponding to the external leads of the logic semiconductor device, as shown in FIG.
第2図に示すように、パツケージ本体2b,3
bにはそれぞれ、パツケージ本体1bと同様に、
内部に半導体チツプつまりペレツト6が収容さ
れ、チツプの電極と外部リード2a,3aが図示
しないワイヤにより接続されている。 As shown in FIG. 2, the package bodies 2b, 3
Similarly to the package body 1b, each of b has
A semiconductor chip or pellet 6 is housed inside, and electrodes of the chip and external leads 2a, 3a are connected by wires (not shown).
そして、前記各半導体装置1,2,3をスタツ
ク構造として積層する際には、第1図のように発
熱量の大きな論理用半導体装置1を最上位置に設
け、その下側に発熱量の小さな記憶用半導体装置
2,3を配設し、各外部リード1a,2a,3a
や連設部1c,2c,3cを利用して電気的接続
を行なう。この場合、最上の半導体装置1の上面
には放熱フイン5を一体に取着する。 When stacking the semiconductor devices 1, 2, and 3 in a stacked structure, as shown in FIG. Storage semiconductor devices 2 and 3 are arranged, and each external lead 1a, 2a, 3a
Electrical connections are made using the connecting portions 1c, 2c, and 3c. In this case, a heat dissipation fin 5 is integrally attached to the upper surface of the uppermost semiconductor device 1.
したがつて以上の構成によれば、発熱量の大き
な論理用半導体装置1をスタツク構造の最上位置
に設けているので、その放熱性は良好であり、し
かも最上位置であることから放熱フイン5の取着
も容易であり、結局全体としての放熱性を高いも
のにする。これにより、放熱上の問題を解消し、
スタツク構造による実装密度の向上を実現でき
る。 Therefore, according to the above configuration, since the logic semiconductor device 1 which generates a large amount of heat is provided at the top position of the stack structure, its heat dissipation performance is good. It is easy to attach, and the overall heat dissipation is improved. This solves the problem of heat dissipation,
It is possible to improve the packaging density by using the stack structure.
また、記憶用半導体装置2,3には遊びリード
4を設けているので、スタツク構造としたときに
このリードが各半導体装置の内部配線として作用
し、これにより外部配線を不要にして布線特性の
向上を図ることもできる。 In addition, since the storage semiconductor devices 2 and 3 are provided with idle leads 4, these leads act as internal wiring of each semiconductor device when a stacked structure is formed, thereby eliminating the need for external wiring and improving the wiring characteristics. It is also possible to improve the
なお、本発明では第3図に示すように、複数の
記憶用半導体装置2,3を同一平面上に並列に配
設し、その上に論理用半導体装置1を積層するス
タツク構成としてもよい。 In the present invention, as shown in FIG. 3, a plurality of memory semiconductor devices 2 and 3 may be arranged in parallel on the same plane, and a logic semiconductor device 1 may be stacked thereon.
以上のように本発明の半導体装置によれば、最
上段位置に発熱量が大きい論理用半導体のパツケ
ージ本体を位置させ、その下側に記憶用半導体の
パツケージ本体を配設し、論理用半導体のパツケ
ージの上面に放熱フインを配設したので、放熱上
の問題を解消して実装密度の向上を達成すること
ができる。さらに、パツケージ本体相互を外部リ
ードを利用して電気的に接続するようにしたの
で、これらの接続のための布線長さを短くするこ
とが可能となり、布線特性を向上させることがで
きる。また、遊びリードを設けることにより、布
線特性の向上を図ることもできる。 As described above, according to the semiconductor device of the present invention, the package body of the logic semiconductor which generates a large amount of heat is located at the topmost position, the package body of the memory semiconductor is disposed below it, and the package body of the logic semiconductor is disposed below it. Since heat dissipation fins are provided on the top surface of the package, problems with heat dissipation can be solved and packaging density can be improved. Furthermore, since the package bodies are electrically connected to each other using external leads, the length of wiring for these connections can be shortened, and the wiring characteristics can be improved. Further, by providing loose leads, it is possible to improve the wiring characteristics.
第1図は本発明装置の正面図、第2図は一部の
破断斜視図、第3図は変形例の正面図である。
1……論理用半導体装置、2,3……記憶用半
導体装置、4……遊びリード、5……放熱フイ
ン。
FIG. 1 is a front view of the device of the present invention, FIG. 2 is a partially cutaway perspective view, and FIG. 3 is a front view of a modified example. 1... Logic semiconductor device, 2, 3... Memory semiconductor device, 4... Idle lead, 5... Heat dissipation fin.
Claims (1)
部リードが設けられた発熱量の大きな論理用半導
体のパツケージ本体と、側面から下面よりも下方
に突出させて多数の外部リードが設けられた発熱
量の小さな少なくとも1つの記憶用半導体のパツ
ケージ本体とを有し、 前記論理用半導体のパツケージ本体を最上段に
位置させて該パツケージ本体の下側に前記記憶用
半導体のパツケージ本体を配設し、 上側のパツケージ本体の外部リードと該パツケ
ージ本体の下側に位置する他のパツケージ本体の
外部リードとを電気的に接続し、 最上段側に位置する前記論理用半導体のパツケ
ージ本体の上面に放熱フインを配設したことを特
徴とする半導体装置。 2 下側に位置する記憶用半導体のパツケージ本
体を同一平面上に複数個配設したことを特徴とす
る特許請求の範囲第1項記載の半導体装置。[Scope of Claims] 1. A package body of a logic semiconductor that generates a large amount of heat and has a large number of external leads protruding from the side surface below the bottom surface; at least one storage semiconductor package body with a small heat generation value and provided with a lead, the logic semiconductor package body being positioned at the top stage, and the storage semiconductor package body being placed below the package body. the logic semiconductor package located at the top stage; A semiconductor device characterized in that a heat dissipation fin is provided on the top surface of the main body. 2. The semiconductor device according to claim 1, characterized in that a plurality of lower storage semiconductor package bodies are arranged on the same plane.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58017360A JPS59144161A (en) | 1983-02-07 | 1983-02-07 | Semiconductor device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58017360A JPS59144161A (en) | 1983-02-07 | 1983-02-07 | Semiconductor device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59144161A JPS59144161A (en) | 1984-08-18 |
| JPH0559583B2 true JPH0559583B2 (en) | 1993-08-31 |
Family
ID=11941871
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58017360A Granted JPS59144161A (en) | 1983-02-07 | 1983-02-07 | Semiconductor device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59144161A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5539156B2 (en) * | 2010-10-29 | 2014-07-02 | ルネサスエレクトロニクス株式会社 | Semiconductor integrated circuit device |
| JP2014179484A (en) * | 2013-03-15 | 2014-09-25 | Toshiba Corp | Semiconductor memory device |
-
1983
- 1983-02-07 JP JP58017360A patent/JPS59144161A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59144161A (en) | 1984-08-18 |
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