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JPH0566009B2 - - Google Patents
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JPH0566009B2 - - Google Patents

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Publication number
JPH0566009B2
JPH0566009B2 JP63301540A JP30154088A JPH0566009B2 JP H0566009 B2 JPH0566009 B2 JP H0566009B2 JP 63301540 A JP63301540 A JP 63301540A JP 30154088 A JP30154088 A JP 30154088A JP H0566009 B2 JPH0566009 B2 JP H0566009B2
Authority
JP
Japan
Prior art keywords
opening
closing member
closing
cam plate
knife edge
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63301540A
Other languages
Japanese (ja)
Other versions
JPH02148712A (en
Inventor
Susumu Mizuno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP63301540A priority Critical patent/JPH02148712A/en
Publication of JPH02148712A publication Critical patent/JPH02148712A/en
Publication of JPH0566009B2 publication Critical patent/JPH0566009B2/ja
Granted legal-status Critical Current

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  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Jigs For Machine Tools (AREA)
  • Machine Tool Units (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は積層セラミツクチツプコンデンサ等、
チツプ状電子部品の電気容量等の特性測定に用い
られる測定ユニツトに関し、特にチツプ状電子部
品をインデツクステーブル上に保持し、その間欠
回転移動の途中で各種電気特性の自動測定を行う
のに適した特性測定用ユニツトに関する。
[Detailed Description of the Invention] (Industrial Application Field) The present invention relates to multilayer ceramic chip capacitors, etc.
Regarding measurement units used to measure characteristics such as electric capacitance of chip-shaped electronic components, it is particularly suitable for holding chip-shaped electronic components on an index table and automatically measuring various electrical characteristics during intermittent rotational movement. This invention relates to a unit for measuring characteristics.

(従来技術) 従来、この種のチツプコンデンサの容量測定方
式としては、いわゆる片側接触方式と、対向接触
方式とがある。第7図は片側接触方式の場合であ
つて、載置台5上に横置されたチツプコンデンサ
1の両端に外部電極2,2′の上側面あるいは上
側のコーナ部に、上方から丸棒ないし角棒状の測
定用電極端子(接触子)3の平坦な端面を接触さ
せて容量測定を行う。これに対して第8図a,b
は対向接触方式の例であつて、互いに端面どおし
が向き合うように測定用接触子3を配置し、その
間にチツプコンデンサ1の両端をはさみ付けて容
量測定を行う。対向接触方式では、第8図aのよ
うに両側の接触子3を可動にしたものと、第8図
bのように一方の接触子3′を固定し、この固定
側接触子3′の端面にチツプコンデンサ1を当て
て位置決めし、他方の可動側接触子3を直線ガイ
ド4で案内しつつ往復直線動作させるか、あるい
は第8図cのように可動側接触子3をアーム状に
形成してその基部3aを支点ピン6で軸支し、そ
のまわりに揺動動作させる構造としている。なお
両側の接触子を可動形とした場合は両側とも第8
図aの如く直線ガイド4による直線動作のみであ
つて揺動方式はとられていない。
(Prior Art) Conventionally, capacitance measurement methods for this type of chip capacitor include a so-called one-side contact method and a so-called opposite contact method. FIG. 7 shows the case of the one-side contact method, in which round or square rods or square rods are attached from above to the upper surfaces or upper corners of the external electrodes 2, 2' at both ends of the chip capacitor 1 placed horizontally on the mounting table 5. Capacitance is measured by bringing the flat end surface of a rod-shaped measurement electrode terminal (contactor) 3 into contact. In contrast, Fig. 8 a, b
is an example of the facing contact method, in which the measuring contacts 3 are arranged so that their end faces face each other, and both ends of the chip capacitor 1 are sandwiched between them to measure the capacitance. In the facing contact method, the contactors 3 on both sides are movable as shown in Fig. 8a, and one contactor 3' is fixed as shown in Fig. 8b, and the end surface of the fixed contactor 3' is The chip capacitor 1 is applied to and positioned, and the other movable side contact 3 is guided by a linear guide 4 and moved in a reciprocating straight line, or the movable side contact 3 is formed into an arm shape as shown in Fig. 8c. The base portion 3a of the lever is pivotally supported by a fulcrum pin 6, and the structure is such that the base portion 3a is oscillated around the fulcrum pin 6. If the contacts on both sides are movable, the 8th
As shown in Figure a, only linear movement is performed by the linear guide 4, and no swinging method is used.

(発明が解決しようとする課題) 対向接触方式によるチツプ部品の特性測定は、
前述の如く一対の接触子を対向させ、その間にチ
ツプ部品を送り込んでいくので、片側接触方式よ
りも測定のばらつきがなく、高精度で微少容量の
測定に適するが、従来の対向接触方式のように測
定用接触子を直線ガイドで拘束して直線動作させ
る構造は揺動機構のものと比べて摺動抵抗が大き
く、大形かつ複雑な構造となり、高速動作の点で
も難しい欠点がある。両側可動形の対向接触方式
で第9図の如く支点ピン6による揺動構造を採用
すると、接触子基部の軸支部の径が大きいために
支点間の距離Lを接近させることができず、接触
子3先端はチツプコンデンサ1の電極面に対して
斜めに揺動して接離することとなり、測定精度、
測定のばらつきの点で採用できない。接触子を第
8図cのように片側固定とし、可動側を揺動形と
した場合も、従来は揺動支点が軸回転支持構造と
なつているので、L形可動接触子3の軸支部と固
定側接触子3′との間隔が大きくなり、チツプコ
ンデンサの端面に垂直に当接せず、測定精度を上
げるのに障害となつていた。また軸回転支持では
揺動のストロークを微少範囲に規制するのが難し
く、軽敏で精緻な動作を行えない欠点があつた。
(Problem to be solved by the invention) Characteristic measurement of chip parts using the opposing contact method is
As mentioned above, since a pair of contacts are opposed and the chip part is fed between them, there is less variation in measurement than the one-sided contact method, and it is suitable for highly accurate and minute capacitance measurements, but unlike the conventional facing contact method, A structure in which the measurement contact is restrained by a linear guide and moved in a straight line has a disadvantage that the sliding resistance is greater than that of a swing mechanism, and the structure is large and complicated, making it difficult to operate at high speed. When a swinging structure using a fulcrum pin 6 as shown in Fig. 9 is adopted in a facing contact system with both sides movable, the distance L between the fulcrums cannot be made close due to the large diameter of the shaft support at the base of the contact. The tip of the capacitor 3 swings diagonally toward and away from the electrode surface of the chip capacitor 1, which improves measurement accuracy and
This method cannot be adopted due to measurement dispersion. Even when the contact is fixed on one side and the movable side is oscillating as shown in FIG. The distance between the contact element 3' and the fixed side contact element 3' becomes large, and the contact element 3' does not contact the end face of the chip capacitor perpendicularly, which is an obstacle to improving measurement accuracy. In addition, with shaft rotation support, it is difficult to control the swing stroke within a minute range, and there is a drawback that nimble and precise movements cannot be performed.

(課題を解決するための手段) 本発明によるチツプ部品の特性測定ユニツト
は、チツプ部品を保持するインデツクステーブル
の上方に配置され該インデツクステーブルに対し
て上下動するように軸支された開閉部材駆動用カ
ム板と、前記駆動用カム板の上下駆動機構と、前
記駆動用カム板と前記インデツクステーブルとの
間に配置されかつ装置本体側に固定された開閉部
材支持板と、前記開閉部材支持板を貫通しかつそ
の中途部分が該支持板にナイフエツジ式に支持さ
れかつ下端に測定用接触子が設けられた一対の開
閉部材と、前記開閉部材のナイフエツジ支点より
下方位置に配置され該開閉部材をその下端が閉成
する方向に付勢している一対のばね手段と、前記
開閉部材駆動用カム板の先端に設けられ前記開閉
部材の上端とテーパ係合するカム板とを有し、前
記開閉部材駆動用カム板の上下駆動機構は、前記
インデツクステーブルの間欠回転動作と連動して
該駆動用カム板を上下動させるように構成され、
前記駆動用カム板の下降動作で前記開閉部材のナ
イフエツジ支点より下側が開成するように構成さ
れている。
(Means for Solving the Problems) A characteristic measuring unit for chip parts according to the present invention is an open/close unit arranged above an index table that holds chip parts and pivoted to move up and down with respect to the index table. a member driving cam plate, a vertical drive mechanism for the driving cam plate, an opening/closing member support plate disposed between the driving cam plate and the index table and fixed to the apparatus main body, and the opening/closing member supporting plate. a pair of opening/closing members which penetrate through a member support plate, have a midway portion supported by the support plate in a knife-edge manner, and are provided with a measuring contact at a lower end; A pair of spring means biasing the opening/closing member in a direction in which its lower end closes, and a cam plate provided at the tip of the opening/closing member driving cam plate and tapered into engagement with the upper end of the opening/closing member. , the vertical drive mechanism for the opening/closing member driving cam plate is configured to move the driving cam plate up and down in conjunction with the intermittent rotational movement of the index table;
The opening/closing member is configured to be opened below the knife edge fulcrum by the downward movement of the drive cam plate.

(実施例) 次に、本発明を図面を参照して実施例につき説
明する。
(Example) Next, the present invention will be described with reference to the drawings.

第1図は本発明の実施例に係る特性測定ユニツ
トの全体的な側面断面図であり、第2図は第1図
におけるA部分の拡大側面図である。また第3図
は本発明の実施例の概略的な全体平面図である。
間欠回転動作するインデツクステーブル10の外
周部に被測定部品のチツプコンデンサが等間隔に
保持されており、このインデツクステーブル10
の中心を貫通して測定ユニツトハウジング11が
該テーブルの上面を覆うように装置基台14側に
固定されている。ハウジング11の中心にボール
スプライン軸12を介して、後述する開閉部材の
駆動用カム板13の円板状基部13aが上下動可
能に軸支されている。開閉部材駆動用カム板13
はその円板状基部13aの外周から第3図に示す
如く複数個放射状に伸長している。装置基台14
の内部には装置駆動用のカム群が配置され、この
装置駆動用カムによりカムフロアおよび伝達リン
ク16、レバー17等を介して開閉部材駆動用カ
ム板13が上下動作されるが、前記カム群はイン
デツクステーブル10の支軸軸18にも連結さ
れ、これによつて開閉部材駆動用カム板13とイ
ンデツクステーブル10とは連動した動作を行う
ようになつている。
FIG. 1 is an overall side sectional view of a characteristic measuring unit according to an embodiment of the present invention, and FIG. 2 is an enlarged side view of portion A in FIG. 1. FIG. 3 is a schematic overall plan view of an embodiment of the present invention.
Chip capacitors, which are parts to be measured, are held at regular intervals on the outer periphery of an index table 10 that rotates intermittently.
A measurement unit housing 11 is fixed to the apparatus base 14 side so as to pass through the center of the table and cover the upper surface of the table. A disk-shaped base portion 13a of a driving cam plate 13 of an opening/closing member, which will be described later, is pivotally supported in the center of the housing 11 via a ball spline shaft 12 so as to be movable up and down. Cam plate 13 for driving the opening/closing member
A plurality of radially extend from the outer periphery of the disc-shaped base 13a as shown in FIG. Device base 14
A group of cams for driving the device is disposed inside the device, and the cam plate 13 for driving the opening/closing member is moved up and down via the cam floor, the transmission link 16, the lever 17, etc. It is also connected to the support shaft 18 of the index table 10, so that the opening/closing member driving cam plate 13 and the index table 10 operate in conjunction with each other.

第1図、第2図を参照すれば、前記開閉部材駆
動用カム板13に対応して、開閉部材支持板19
がユニツトハウジング11に放射状に複数個、か
つインデツクステーブル10の外周のチツプコン
デンサ1の上方位置までのびて取り付けられてい
る。各開閉部材支持板19には一対の同形の開閉
部材20が貫通して支持されている。
Referring to FIGS. 1 and 2, an opening/closing member support plate 19 corresponds to the opening/closing member driving cam plate 13.
A plurality of capacitors are attached to the unit housing 11 radially extending to a position above the chip capacitor 1 on the outer periphery of the index table 10. A pair of opening/closing members 20 having the same shape penetrates and is supported by each opening/closing member support plate 19 .

第4図は開閉部材20の斜視図であり、第5図
は開閉部材支持板19における開閉部材20のナ
イフエツジ支持機構を示した第2図の矢視Bの拡
大正面図、第6図aは第5図D−D線断面図であ
つて開閉部材20の一方と支持板19とのナイフ
エツジ支持部の構造を示している。第6図bは第
6図aに矢印E方向からみた部分的な上面図であ
る。各開閉部材20にはその上端にカムローラ2
1が軸支され、また下端には薄板状の、かつL形
を成した測定用接触子22が互いに相手方の開閉
部材の接触子と先端どおし向き合うように固着さ
れ、さらにその略中途部分に、より具体的には中
途位置より上方へ寄つた位置の両側部に、横鍔状
の張出部23が形成され、これによつて開閉部材
両側部に凹状部24が形成されている。張出部2
3の下面はナイフエツジ形にテーパが付けられて
いる。
4 is a perspective view of the opening/closing member 20, FIG. 5 is an enlarged front view taken in the direction of arrow B in FIG. 2 showing the knife edge support mechanism of the opening/closing member 20 on the opening/closing member support plate 19, and FIG. FIG. 5 is a sectional view taken along line D-D, showing the structure of a knife edge support portion between one of the opening/closing members 20 and the support plate 19. FIG. 6b is a partial top view of FIG. 6a viewed from the direction of arrow E. FIG. Each opening/closing member 20 has a cam roller 2 at its upper end.
1 is pivotally supported, and a thin plate-shaped and L-shaped measurement contact 22 is fixed to the lower end so that the tips thereof face the contact of the other opening/closing member, and furthermore, a substantially midway portion thereof is fixed. More specifically, lateral brim-shaped projecting portions 23 are formed on both sides of the opening/closing member at positions closer to the upper side, thereby forming recessed portions 24 on both sides of the opening/closing member. Overhang part 2
The lower surface of 3 is tapered in the shape of a knife edge.

開閉部材支持板19は第5図および第6図bに
示すように開閉部材20の支持箇所で垂直に貫通
した孔19aを有し、この貫通孔19aの両側部
に一対の対向した突出部25が設けられ、開閉部
材20が貫通孔19aに挿入された状態で前記突
出部25が開閉部材の凹状部24に挿入され、こ
れによつて開閉部材20の張出部23の下縁即ち
ナイフエツジ部分が前記支持板19の突出部上面
に接触線で支持されている。このようにして支持
板19の突出部上面に開閉部材20のナイフエツ
ジ支点25aが形成され、開閉部材20はこのナ
イフエツジ支点のみで支持され、第2図、第6図
aの矢印F方向に揺動動作、即ちこのナイフエツ
ジ支点25aを中心とした開閉動作を行う。開閉
部材20の開閉動作に支障をきたさないように前
記突出部25の下面25bは第6図aに示すよう
に円弧形に形成され、これによつて開閉部材20
の開閉時に該開閉部材の凹状部24の下面(第4
図、第6図a参照)が突出部25の下面25bに
無理な衝接を起さないようになつている。しかも
開閉部材20の上方への抜け出しは突出部下面2
5bと凹状部24の下面との当接で防止される。
製作上の理由から、実際には突出部25を形成す
る部分はナイフエツジ支点部材として支持部材1
9とは別体に製作され、この小片の部材(第6図
b参照)を支持部材19の貫通孔19aに組み付
けられている。第6図bにおいて開閉部材20は
明瞭化のために破線で示してある。
As shown in FIGS. 5 and 6b, the opening/closing member support plate 19 has a hole 19a that passes vertically through the opening/closing member 20 at its support location, and a pair of opposing protrusions 25 are provided on both sides of the through hole 19a. is provided, and in a state where the opening/closing member 20 is inserted into the through hole 19a, the protruding portion 25 is inserted into the recessed portion 24 of the opening/closing member 20, thereby forming a lower edge, that is, a knife edge portion of the overhanging portion 23 of the opening/closing member 20. is supported on the upper surface of the protrusion of the support plate 19 by a contact line. In this way, the knife edge fulcrum 25a of the opening/closing member 20 is formed on the upper surface of the protrusion of the support plate 19, and the opening/closing member 20 is supported only by this knife edge fulcrum and swings in the direction of the arrow F in FIGS. 2 and 6a. The opening/closing operation is performed centering around this knife edge fulcrum 25a. In order not to interfere with the opening/closing operation of the opening/closing member 20, the lower surface 25b of the protrusion 25 is formed in an arc shape as shown in FIG.
When the opening/closing member is opened/closed, the lower surface (the fourth
(see FIG. 6A) is designed to prevent unreasonable contact with the lower surface 25b of the protrusion 25. Moreover, the opening/closing member 20 can be pulled out upward by the protruding lower surface 2.
This is prevented by the contact between 5b and the lower surface of the concave portion 24.
For manufacturing reasons, the part forming the protrusion 25 is actually the support member 1 as a knife edge fulcrum member.
This small piece (see FIG. 6b) is assembled into the through hole 19a of the support member 19. In FIG. 6b, the opening/closing member 20 is shown in broken lines for clarity.

第2図に明示する如く、開閉部材支持板19に
一対のブラケツト26が固着され、前記ナイフエ
ツジ支点よりも下方位置で該ブラケツト26と開
閉部材20との間に、該開閉部材20を閉成方向
へ押圧する圧縮コイルばね27が装着されてい
る。また前記ナイフエツジ支点の上方位置で前記
ブラケツト26に、開閉部材20と当接して下端
閉成量ないし閉成限界位置を規制するストツパ用
調整ねじ28が螺着されている。29はL形薄板
接触子22のリード端子である。
As clearly shown in FIG. 2, a pair of brackets 26 are fixed to the opening/closing member support plate 19, and between the brackets 26 and the opening/closing member 20 at a position below the knife edge fulcrum, the opening/closing member 20 is moved in the closing direction. A compression coil spring 27 is attached to press the spring. Further, a stopper adjusting screw 28 is screwed onto the bracket 26 at a position above the knife edge fulcrum and is in contact with the opening/closing member 20 to regulate the amount of closing of the lower end or the closing limit position. 29 is a lead terminal of the L-shaped thin plate contactor 22.

放射状にのびた開閉部材駆動用カム板13の
各々の外端部は下方へ向つてフオーク状に分岐さ
れ、その内側の面が先細テーパ状のカム面30と
なつている。この駆動用カム板13が下降したと
き、この一対のカム面30が開閉部材20の上端
のカムローラ21に当接して該カムローラが内側
へ押し込まれ、圧縮ばね27のばね力に抗して開
閉部材20がナイフエツジ支点を中心に回動し、
下端のL形接触子22が開成する。なお駆動用カ
ム板13の一対の対向カム面30およびカムロー
ラ21、開閉部材20、圧縮ばね27その他下端
のL形接触子22等は両開閉部材間の垂直中心線
Cに対して対称形に配置され、接触子22の先端
はインデツクステーブル10の外周部に保持され
たチツプコンデンサ1をその両端方向からはさみ
付けるように配置されている。L形接触子の構造
については例えば実願昭63−65576号に特性測定
用電極として詳述されたものが有効に採用され
る。前述したように開閉部材駆動用カム板13は
ユニツトハウジング11の中心から複数個放射状
に所定の測定ステーシヨン位置へ伸長しており、
これに対応してその下方に、上述した開閉部材2
0、ブラケツト26、圧縮ばね27、調整ねじ2
8等が一対づつ組となつて開閉部材支持板19に
保持されている。駆動用カム板13の放射状伸長
部および前記支持板19はボルト等によつてそれ
ぞれその円板状の基部13a,19aに対して着
脱可能に取り付けられる(第1図)。
The outer end of each of the radially extending opening/closing member driving cam plates 13 branches downward into a fork shape, and the inner surface thereof forms a tapered cam surface 30. When the driving cam plate 13 is lowered, the pair of cam surfaces 30 abut against the cam roller 21 at the upper end of the opening/closing member 20, and the cam roller is pushed inward, resisting the spring force of the compression spring 27 and pushing the opening/closing member 20 rotates around the knife edge fulcrum,
The L-shaped contact 22 at the lower end is opened. Note that the pair of opposing cam surfaces 30 of the drive cam plate 13, the cam roller 21, the opening/closing member 20, the compression spring 27, and the L-shaped contact 22 at the lower end are arranged symmetrically with respect to the vertical center line C between the opening/closing members. The tips of the contacts 22 are arranged so as to sandwich the chip capacitor 1 held on the outer periphery of the index table 10 from both ends thereof. Regarding the structure of the L-shaped contact, for example, the structure described in detail as an electrode for measuring characteristics in Utility Model Application No. 63-65576 can be effectively adopted. As mentioned above, a plurality of cam plates 13 for driving the opening/closing member extend radially from the center of the unit housing 11 to a predetermined measurement station position.
Correspondingly, below the opening/closing member 2 described above,
0, bracket 26, compression spring 27, adjustment screw 2
8 etc. are held in pairs on the opening/closing member support plate 19. The radially extending portion of the driving cam plate 13 and the support plate 19 are removably attached to the disk-shaped base portions 13a and 19a, respectively, by bolts or the like (FIG. 1).

再び第3図を参照すれば、チツプコンデンサは
チツプフイーダ31から順次インデツクステーブ
ル10の外周部に供給され、該テーブルに保持さ
れてその間欠動作で該テーブルのまわりに位置す
るチツプ検出ステーシヨン、各種特性測定ステー
シヨン、放電ステーシヨン、排出ステーシヨン等
へ間欠動作で移動していく。第3図で符号40の
部分は排出ステーシヨンであり、空気圧でチツプ
コンデンサはテーブル外方へ排出される。なおチ
ツプコンデンサの保持機構については例えば特願
昭63−186267号に開示された特性測定用キヤリア
が有効に採用される。このインデツクステーブル
10の間欠回転動作と連動して、装置駆動用カム
により開閉部材駆動用カム板13がインデツクス
テーブル10、ユニツトハウジング11、および
開閉部材支持板19、したがつて開閉部材20に
対して上下動し、その下降時に開閉部材20が開
いてL形接触子22が移動してきたチツプコンデ
ンサ1に対峙し、上昇時に圧縮ばね27の作用で
接触子22が閉じてチツプコンデンサ1の電極部
に対向接触し(測定)、次の下降時にチツプコン
デンサ1がインデツクステーブルとともに、次の
ステーシヨンへ移動する。このような動作を各測
定ステーシヨンで繰り返しつつチツプコンデンサ
は順次途中の、あるいは最終の排出ステーシヨン
40から排出される。
Referring again to FIG. 3, the chip capacitors are sequentially supplied from the chip feeder 31 to the outer periphery of the index table 10, are held by the table, and are intermittently operated by the chip detection station located around the table and various characteristics. It moves intermittently to the measurement station, discharge station, discharge station, etc. The part 40 in FIG. 3 is a discharge station, and the chip capacitor is discharged to the outside of the table using air pressure. As for the holding mechanism for the chip capacitor, for example, a carrier for measuring characteristics disclosed in Japanese Patent Application No. 186267/1983 can be effectively employed. In conjunction with this intermittent rotation of the index table 10, the device driving cam moves the opening/closing member driving cam plate 13 to the index table 10, unit housing 11, opening/closing member support plate 19, and therefore to the opening/closing member 20. When it moves up and down, the opening/closing member 20 opens and the L-shaped contact 22 faces the moving chip capacitor 1, and when it moves up, the contact 22 closes due to the action of the compression spring 27, and the electrode of the chip capacitor 1 During the next descent, the chip capacitor 1 moves to the next station together with the index table. While repeating this operation at each measurement station, the chip capacitors are sequentially discharged from the intermediate or final discharge station 40.

本発明においては開閉部材がナイフエツジ支持
されて開閉動作するので高速動作が可能である
が、高速動作した場合は慣性モーメントが大きい
と小形のチツプコンデンサに大きな衝撃力がかか
り、コンデンサの外部露出電極がへこみ、外観不
良となつたり、特性の劣性をきたすことになるの
で、慣性モーメントを小さくするため開閉部材に
第4図の如く孔32を穿けてある。なお上述の実
施例はインデツクステーブルによつてチツプ部品
を間欠回転動作で移動させるようにし、インデツ
クステーブルの周囲に測定ユニツトをテーブル中
心から放射状に配列するようにしたが、回転する
インデツクステーブルのかわりに間欠動作で直線
移動する直動テーブルを用い、該直動テーブルに
チツプ部品を保持し、直動テーブルに沿つて所定
間隔で測定ユニツトを配置するようにしてもよ
い。このような形態も本発明に属し、いずれの場
合も開閉部材は、基部で連結した駆動用カム板に
よつてその1つの動きで多数同時に開閉動作さ
れ、駆動系が非常に簡素となる。
In the present invention, the opening/closing member is knife-edge supported for opening/closing operation, so high-speed operation is possible. However, when operating at high speed, if the moment of inertia is large, a large impact force is applied to the small chip capacitor, and the external exposed electrodes of the capacitor are In order to reduce the moment of inertia, a hole 32 is provided in the opening/closing member as shown in FIG. 4 to prevent the opening and closing member from becoming dented, resulting in poor appearance or inferior characteristics. In the above embodiment, the chip components are moved intermittently by the index table, and the measurement units are arranged radially around the index table from the center of the table. Instead, a linear motion table that moves linearly intermittently may be used, the chip component may be held on the translation table, and the measuring units may be arranged at predetermined intervals along the translation table. Such a form also belongs to the present invention, and in either case, the opening/closing member is opened and closed simultaneously by a single movement of a plurality of opening/closing members by a drive cam plate connected at the base, and the drive system becomes extremely simple.

(発明の効果) 以上説明したように本発明によれば、ナイフエ
ツジ支点による揺動動作で開閉部材が開閉するの
で、動作が非常に軽便で高速化され、またその支
点間隔l(第2図)を極少間隔例えば数ミリ程度
まで接近させることができ、これによつて下端の
測定用接触子は直線(水平)に近い動作を行い、
チツプ部品の両端面に対して垂直に接離し、片当
りとか傾斜接触がなく、高精度の測定がなされ
る。従来の直線ガイドあるいは軸回転支持と異な
り摺動部分がなく、しかも必要なステーシヨンに
対応して容易に着脱できる。なお対象となるチツ
プ部品のサイズにより、調整ねじの操作で接触子
(測定子)の閉成位置、開閉量を容易に設定でき
る。接触圧(測定圧)は圧縮ばねのばね力でもた
らされるので一定となり、またばねの取り替えで
この接触圧を容易に変更できるなど、従来のもの
に比し多大の効果がもたらされる。
(Effects of the Invention) As explained above, according to the present invention, the opening/closing member opens and closes by swinging motion using the knife edge fulcrum, so the operation is very easy and fast, and the fulcrum spacing l (Fig. 2) This allows the measurement contact at the bottom to move in a nearly straight line (horizontal).
The chip touches and separates perpendicularly to both end faces of the chip, and there is no uneven contact or slanted contact, allowing for highly accurate measurements. Unlike conventional linear guides or shaft rotation supports, there are no sliding parts, and it can be easily attached and detached depending on the required station. Depending on the size of the target chip part, the closing position and opening/closing amount of the contact (measuring head) can be easily set by operating the adjustment screw. The contact pressure (measured pressure) is provided by the spring force of the compression spring, so it remains constant, and this contact pressure can be easily changed by replacing the spring, which provides many advantages over conventional methods.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例に係る特性測定ユニツ
トの全体的な側面断面図、第2図は第1図のA部
分の拡大側面図、第3図は本発明の実施例の概略
的な全体平面図、第4図は本発明に用いられる開
閉部材の斜視図、第5図は開閉部材のナイフエツ
ジ支持機構の正面図、第6図aは第5図のD−D
線に沿つた断面図、第6図bは第6図aの矢視E
方向からみた上面図、第7図は従来の片側接触方
式によるチツプコンデンサの容量測定状態を示し
た概略図、第8図a,b,cは従来の対向接触方
式による測定用接触子の概略図、第9図は従来の
支点ピンによる軸支構造をもつ対向接触方式の接
触子の概略図である。 1…チツプコンデンサ、10…インデツクステ
ーブル、11…ユニツトハウジング、12…ボー
ルスプライン軸、13…開閉部材駆動用カム板、
19…開閉部材支持板、20…開閉部材、22…
測定用接触子、28…調整ねじ、30…カム面。
FIG. 1 is an overall side sectional view of a characteristic measuring unit according to an embodiment of the present invention, FIG. 2 is an enlarged side view of part A in FIG. 1, and FIG. 3 is a schematic diagram of an embodiment of the present invention. 4 is a perspective view of the opening/closing member used in the present invention, FIG. 5 is a front view of the knife edge support mechanism of the opening/closing member, and FIG. 6a is D-D in FIG. 5.
A cross-sectional view along the line, FIG. 6b is in the direction of arrow E in FIG. 6a.
7 is a schematic diagram showing the state of capacitance measurement of a chip capacitor using the conventional one-side contact method, and FIG. 8 a, b, and c are schematic diagrams of measurement contacts using the conventional opposing contact method. , FIG. 9 is a schematic diagram of a conventional facing contact type contact having a shaft support structure using a fulcrum pin. DESCRIPTION OF SYMBOLS 1... Chip capacitor, 10... Index table, 11... Unit housing, 12... Ball spline shaft, 13... Cam plate for driving opening/closing member,
19... Opening/closing member support plate, 20... Opening/closing member, 22...
Measuring contact, 28...adjustment screw, 30...cam surface.

Claims (1)

【特許請求の範囲】 1 被測定物を保持する間欠移動テーブルの上方
に配置され該テーブルに対して上下動するように
軸支された開閉部材駆動用カム板と、前記駆動用
カム板の上下駆動機構と、前記駆動用カム板と前
記間欠移動テーブルとの間に配置されかつ装置本
体側に固定された開閉部材支持板と、前記開閉部
材支持板を貫通しかつその中途部分が該支持板に
ナイフエツジ式に支持されかつ下端に測定用接触
子が設けられた一対の開閉部材と、前記開閉部材
のナイフエツジ支点より下方位置に配置され該開
閉部材をその下端が閉成する方向に付勢している
一対のばね手段と、前記開閉部材駆動用カム板の
先端に設けられ前記開閉部材の上端とテーパ係合
するカム部とを有し、前記駆動用カム板の上下駆
動機構は、前記間欠移動テーブルの間欠送り動作
と連動して該駆動用カム板を上下動させるように
構成され、該駆動用カム板の下降動作で前記開閉
部材のナイフエツジ支点より下側が開成すること
を特徴とするチツプコンデンサの特性測定ユニツ
ト。 2 前記ナイフエツジ支点より上方位置で前記開
閉部材支持板に、前記開閉部材の閉成回動量を規
制する調製可能なストツパ部材が設けられること
を特徴とする請求項第1項記載のチツプコンデン
サの特性測定ユニツト。
[Scope of Claims] 1. A cam plate for driving an opening/closing member disposed above an intermittent moving table that holds an object to be measured and pivotally supported to move up and down with respect to the table; a drive mechanism, an opening/closing member support plate disposed between the drive cam plate and the intermittent movement table and fixed to the apparatus main body side, and a part extending through the opening/closing member support plate and having an intermediate portion thereof. a pair of opening/closing members which are supported in a knife edge manner and have a measuring contact at their lower ends; and a pair of opening/closing members disposed below the knife edge fulcrum of the opening/closing members and biasing the opening/closing members in a direction in which the lower ends of the opening/closing members are closed. and a cam portion provided at the tip of the opening/closing member driving cam plate and tapered into engagement with the upper end of the opening/closing member, The chip is configured to move the driving cam plate up and down in conjunction with the intermittent feeding motion of the moving table, and the lower side of the knife edge fulcrum of the opening/closing member is opened by the downward movement of the driving cam plate. Capacitor characteristic measurement unit. 2. Characteristics of the chip capacitor according to claim 1, characterized in that the opening/closing member support plate is provided with an adjustable stopper member for regulating the amount of closing rotation of the opening/closing member at a position above the knife edge fulcrum. measurement unit.
JP63301540A 1988-11-29 1988-11-29 Chip capacitor characteristic measuring device Granted JPH02148712A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63301540A JPH02148712A (en) 1988-11-29 1988-11-29 Chip capacitor characteristic measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63301540A JPH02148712A (en) 1988-11-29 1988-11-29 Chip capacitor characteristic measuring device

Publications (2)

Publication Number Publication Date
JPH02148712A JPH02148712A (en) 1990-06-07
JPH0566009B2 true JPH0566009B2 (en) 1993-09-20

Family

ID=17898167

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63301540A Granted JPH02148712A (en) 1988-11-29 1988-11-29 Chip capacitor characteristic measuring device

Country Status (1)

Country Link
JP (1) JPH02148712A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6602640B2 (en) * 2015-10-27 2019-11-06 日置電機株式会社 Measuring jig
CN112191953A (en) * 2020-09-28 2021-01-08 路富文 Production positioning tool suitable for circular gears of different sizes

Also Published As

Publication number Publication date
JPH02148712A (en) 1990-06-07

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