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JPH0566352B2 - - Google Patents
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JPH0566352B2 - - Google Patents

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Publication number
JPH0566352B2
JPH0566352B2 JP60146791A JP14679185A JPH0566352B2 JP H0566352 B2 JPH0566352 B2 JP H0566352B2 JP 60146791 A JP60146791 A JP 60146791A JP 14679185 A JP14679185 A JP 14679185A JP H0566352 B2 JPH0566352 B2 JP H0566352B2
Authority
JP
Japan
Prior art keywords
solution
growth
temperature
distribution
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP60146791A
Other languages
Japanese (ja)
Other versions
JPS627697A (en
Inventor
Tsunehiro Unno
Mineo Wajima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Cable Ltd
Original Assignee
Hitachi Cable Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Cable Ltd filed Critical Hitachi Cable Ltd
Priority to JP14679185A priority Critical patent/JPS627697A/en
Publication of JPS627697A publication Critical patent/JPS627697A/en
Publication of JPH0566352B2 publication Critical patent/JPH0566352B2/ja
Granted legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明はスライドボートを用いた多層の液相エ
ピタキシヤル成長法に係り、特に薄い層と厚い層
とを積層順序に関係なく基板上に制御よく成長さ
せる方法に関するもので、薄い層と厚い層との多
層構造を有するSBD(シヨツトキーバリアダイオ
ード)やLD(レーザーダイオード)の製造工程な
どに適用すればその製作が非常に容易となる。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a multilayer liquid phase epitaxial growth method using a slide boat, and in particular, to a method for controlling thin and thick layers on a substrate regardless of the stacking order. This method relates to a method for achieving good growth, and if applied to the manufacturing process of SBDs (shotkey barrier diodes) and LDs (laser diodes), which have a multilayer structure of thin and thick layers, it will be extremely easy to manufacture them.

[従来の技術] 化合物半導体のエピタキシヤルウエハは通常多
層構造をしているが、その多層構造を得るための
手段として液相エピタキシヤル成長法の1つであ
るスライドボート法が一般的に用いられている。
[Prior Art] Compound semiconductor epitaxial wafers usually have a multilayer structure, and the slide boat method, which is one of the liquid phase epitaxial growth methods, is generally used to obtain the multilayer structure. ing.

このスライドボート法は第4図に示す如く、基
板10をスライダ11ごとスライドさせて、溶液
収容部12に形成した成長溶液溜め13a,13
bの成長溶液14a,14bと順次接触させるよ
うに構成した装置を炉内に挿入して用いる。
In this slide boat method, as shown in FIG.
A device configured to be brought into sequential contact with the growth solutions 14a and 14b of b is inserted into the furnace and used.

作業順序としては、先ず第4図の状態で炉内を
成長温度まで昇温する。次に第5図に示すよう
に、時間hで徐冷降温を始め、時間iで基板10
をスライドさせて第1の成長用溶液14aの下に
移動し、第1層目の成長を開始する。第1層目の
成長を終了する時間jで再び基板10をスライド
させ第2の成長用溶液14bの下に移動し第2層
目の成長を開始する。そして時間Rになつたら基
板10をスライドさせて成長を終了する。
The work order is as follows: First, the temperature inside the furnace is raised to the growth temperature in the state shown in FIG. Next, as shown in FIG. 5, slow cooling starts at time h, and at time i, the substrate 10
is moved under the first growth solution 14a to start growing the first layer. At time j when the growth of the first layer is finished, the substrate 10 is again slid and moved under the second growth solution 14b, and the growth of the second layer is started. Then, at time R, the substrate 10 is slid to end the growth.

[発明が解決しようとする問題点] ところが、上述した従来の方法では、第1層目
の膜厚を厚く成長させ、第2層目のそれを薄く成
長させようとする場合、第1層目の成長時間とな
るiからjまでの時間が勢い長くなるため第2層
目の成長溶液の過冷却度ΔT2が第1層の過冷却度
ΔT1よりはるかに大きくなつてしまう。過冷却度
ΔT2が大きくなると、基板10を第2層目の成長
用溶液14bに接触させた際に、大幅な相の転移
がおこるため成長速度が速く厚い結晶膜が短時間
で成長してしまう。したがつて、結晶膜厚の制御
が非常に難しく、0.1〜0.3μm程度の薄いエピタ
キシヤル層を面内均一性を保ち、且つ、再現性良
く成長させることができなかつた。
[Problems to be Solved by the Invention] However, in the conventional method described above, when trying to grow the first layer thicker and the second layer thinner, the first layer Since the time from i to j, which is the growth time of , becomes longer, the degree of supercooling ΔT 2 of the growth solution of the second layer becomes much larger than the degree of supercooling ΔT 1 of the first layer. When the degree of supercooling ΔT 2 becomes large, a large phase transition occurs when the substrate 10 is brought into contact with the second layer growth solution 14b, so that the growth rate is fast and a thick crystal film grows in a short time. Put it away. Therefore, it is very difficult to control the crystal film thickness, and it has been impossible to grow a thin epitaxial layer of about 0.1 to 0.3 μm while maintaining in-plane uniformity and with good reproducibility.

ところで、徐冷降温しても第2層目の過冷却度
を大きくしないためには、成長用溶液を使う際
に、溶媒と溶質の量を高精度で秤量して基板との
接触時に適正な過冷却度を得る方法がある。即
ち、薄い層を形成する成長用溶液にあつては、徐
冷降温時の第2層目成長開始時間(第5図の時間
j)における温度で、僅かに過冷却になるよう
に、その溶媒に対する溶質の量を秤量しておくの
である。
By the way, in order to avoid increasing the degree of supercooling in the second layer even when the temperature is gradually lowered, when using a growth solution, the amounts of solvent and solute must be weighed with high precision to ensure that the appropriate amount is used when contacting the substrate. There is a way to obtain the degree of supercooling. In other words, in the case of a growth solution that forms a thin layer, the solvent should be adjusted so that the temperature is slightly supercooled at the second layer growth start time (time j in Figure 5) during slow cooling. Weigh the amount of solute relative to the amount of solute.

しかしこの方法では、高精度の秤量が要求され
るため測定が非常に困難であり、しかも温度の絶
対値を正しく制御する必要もあるため再現性良く
実施することが困難であつた。
However, this method requires highly accurate weighing, making measurement very difficult, and also requires accurate control of the absolute value of temperature, making it difficult to implement with good reproducibility.

[発明の目的] 本発明の目的は、上記従来の問題点を除去し
て、高精度の秤量を必要とすることなく、成長用
溶液の過冷却度を正確且つ容易に制御でき、厚い
槽と薄い槽とが積層した多層エピタキシヤル層を
同一基板上に均一性及び再現性良く成長させ得、
しかも積層順序に関係なくこれらの成長を可能と
する液相エピタキシヤル成長法を提供することで
ある。
[Object of the Invention] An object of the present invention is to eliminate the above-mentioned conventional problems, to be able to accurately and easily control the degree of supercooling of a growth solution without requiring high-precision weighing, and to be able to control the degree of supercooling of a growth solution in a thick tank. A multilayer epitaxial layer consisting of thin layers can be grown on the same substrate with good uniformity and reproducibility,
Moreover, it is an object of the present invention to provide a liquid phase epitaxial growth method that enables these growths regardless of the order of lamination.

[発明の概要] 上記目的に沿う本発明は、分配方式を用いるス
ライドボート法において、各成長用溶液を分配溶
液溜めに分配する際に、それぞれ異なつた温度で
分配するようにしたものである。
[Summary of the Invention] The present invention, which achieves the above object, is a slide boat method using a distribution method, in which each growth solution is distributed at different temperatures when distributed to distribution solution reservoirs.

これを実施例に対応する第1図〜第2図に基づ
いて説明する。
This will be explained based on FIGS. 1 and 2, which correspond to embodiments.

最初にスライドボート装置1の成長用溶液溜め
3a,3b内にそれぞれ溶媒とこれに対して過剰
気味の溶質とを入れる。ここで過剰気味とは、後
述する各所定温度で成長用溶液6a,6bが飽和
溶液になるために十分な量という意味である。
First, a solvent and a slightly excess amount of solute are put into the growth solution reservoirs 3a and 3b of the slide boat device 1, respectively. Here, a slightly excessive amount means an amount sufficient to make the growth solutions 6a and 6b saturated solutions at each predetermined temperature described later.

次に、本装置1を炉内に挿入して昇温して行
き、1の所定温度T1になるとこの温度を保持し、
1の溶媒中に溶質を飽和するまで溶かし(第1図
a)、その後、溶媒から遊離している過剰な溶質
分を除いた飽和成長溶液6bを1の分配用溶液溜
め4b内に移送する(第1図b)。
Next, the device 1 is inserted into the furnace and the temperature is increased, and when the predetermined temperature T 1 is reached, this temperature is maintained.
The solute is dissolved in the solvent of No. 1 until it is saturated (FIG. 1a), and then the saturated growth solution 6b from which the excess solute freed from the solvent is removed is transferred into the distribution solution reservoir 4b of No. 1 ( Figure 1 b).

この移送後、更に昇温して行き、他の1の所定
温度T2になるとこの温度を保持し、他の1の溶
媒中に溶質を飽和するまで溶かした後、溶媒から
遊離している過剰な溶質分を除いた飽和成長溶液
6aを他の1の分配用溶液溜め4a内に移送する
(第2図c)。ここで、この移送された他の1の分
配用溶液は飽和溶液となつているが、既に移送済
みの1の分配溶液は成長用溶液溜め3bの成長用
溶液6bから断たれており、溶媒中に溶解すべく
溶質の供給が得られないため未飽和溶液となる。
After this transfer, the temperature is further increased, and when the predetermined temperature T2 of the other 1 is reached, this temperature is maintained, and after dissolving the solute in the solvent of the other 1 until it is saturated, the excess free from the solvent is The saturated growth solution 6a from which solutes have been removed is transferred into another distribution solution reservoir 4a (FIG. 2c). Here, the other transferred distribution solution 1 has become a saturated solution, but the already transferred distribution solution 1 has been cut off from the growth solution 6b in the growth solution reservoir 3b, and is in the solvent. Since there is no supply of solute to dissolve in the solution, it becomes an unsaturated solution.

このように移送操作を各成長溶液ごとに異なる
温度下で行ない移送操作を終了する(第1図d)。
In this manner, the transfer operation is performed under different temperatures for each growth solution, and the transfer operation is completed (FIG. 1d).

これら移送操作終了後昇温した温度を徐冷降温
して行き他の1の所定温度T2から所定の過冷却
度ΔT1分落ちた温度になると、他の1の分配用溶
液溜め4aの下に基板7をスライドし溶液と接触
させて基板7上にエピタキシヤル層を成長する。
接触時間を長くすると厚い層が形成され、時間が
短いと薄い層が形成される。
After these transfer operations are completed, the raised temperature is slowly cooled and lowered, and when the temperature reaches a predetermined degree of supercooling ΔT 1 minute lower than the predetermined temperature T2 of the other 1 , the lower temperature of the distribution solution reservoir 4a of the other 1 is reached. An epitaxial layer is grown on the substrate 7 by sliding the substrate 7 into contact with the solution.
Longer contact times result in thicker layers, while shorter times result in thinner layers.

所定膜厚が形成されると、再び基板7をスライ
ドして1の分配用溶液溜め4b下に移動し、基板
7上に次層のエピタキシヤル層を成長する。ここ
でも、接触時間の長短により層厚が変わる。
When a predetermined film thickness is formed, the substrate 7 is again slid and moved below the distribution solution reservoir 4b of 1, and the next epitaxial layer is grown on the substrate 7. Here again, the layer thickness changes depending on the length of the contact time.

このように各溶液の下を順次基板をスライドさ
せて各溶液と接触させることにより、多層のエピ
タキシヤル層が同一基板上に成長する。
By sliding the substrate sequentially under and contacting each solution in this manner, multiple epitaxial layers are grown on the same substrate.

従つて、各成長溶液との接触時間を任意に設定
することにより各層厚が任意の多層エピタキシヤ
ル層を成長させることができる。この場合におい
て本工程では、従来のように遊離した溶質がある
限り温度が上昇しても成長用溶液が飽和状態を維
持するものと異なり、成長用溶液溜めから分配用
溶液溜めに所定温度下で飽和した成長用溶液を一
旦移し変え、溶質の供給を断つようにし、所定温
度を超えると成長用溶液が未飽和状態となるよう
にしたことにより、例えば、第1層目の膜厚を厚
く成長させたために第2層目の成長開始温度が低
くなり過ぎても、第2層目の成長用溶液の飽和温
度を低く保てるので、その過冷却度が大きくなる
ことがない。
Therefore, by arbitrarily setting the contact time with each growth solution, a multilayer epitaxial layer having an arbitrary layer thickness can be grown. In this case, in this process, unlike the conventional method in which the growth solution remains saturated even if the temperature rises as long as there is free solute, the growth solution is transferred from the growth solution reservoir to the distribution solution reservoir under a predetermined temperature. By once transferring the saturated growth solution and cutting off the supply of solute, the growth solution becomes unsaturated when the temperature exceeds a predetermined temperature, so that, for example, the first layer can be grown thicker. Even if the growth start temperature of the second layer becomes too low due to this, the saturation temperature of the growth solution for the second layer can be kept low, so that the degree of supercooling will not become large.

また溶媒に対して過剰気味に溶質を入れておけ
ばよいので、従来のように溶媒と溶質の量を高精
度で秤量する必要も、温度の絶対値を正しく制御
する必要もない。
Furthermore, since the solute may be added in excess of the solvent, there is no need to weigh the amounts of the solvent and solute with high precision, nor to accurately control the absolute value of the temperature, as in the conventional method.

本発明は、GaAsを含む−族化合物半導体
及びGaAlAsなどの混晶化合物半導体、更には
−族化合物とその混晶などの液相エピタキシヤ
ル成長に適用できる。
The present invention can be applied to liquid phase epitaxial growth of - group compound semiconductors including GaAs, mixed crystal compound semiconductors such as GaAlAs, and further, - group compounds and their mixed crystals.

[実施例] 本発明の実施例を第1図〜第3図に基づいて説
明すれば以下の通りである。
[Example] An example of the present invention will be described below based on FIGS. 1 to 3.

第1図は本発明方法を実施するためのスライド
ボート装置1を示す。
FIG. 1 shows a slide boat apparatus 1 for carrying out the method of the invention.

2は成長用溶液溜め3a,3bを有する成長用
溶液ホルダであり、分配用溶液溜め4a,4bを
有する分配用溶液ホルダ5上にスライド自在に設
けられ、そのスライド量により各成長用溶液溜め
内の成長用溶液6a,6bを分配用溶液溜め4
a,4bにそれぞれ別個に移送するようになつて
いる。
Reference numeral 2 denotes a growth solution holder having growth solution reservoirs 3a and 3b, which is slidably provided on the distribution solution holder 5 which has distribution solution reservoirs 4a and 4b, and depending on the amount of slide, the growth solution holder is provided with growth solution reservoirs 3a and 3b. The growth solutions 6a and 6b are distributed to the solution reservoir 4.
a and 4b, respectively.

分配用溶液ホルダ5の下部には、基板7を保持
するスライダ8が設けられ、このスライダ8はボ
ート9上にスライド自在に設けられ、そのスライ
ドにより順次基板を分配溶液溜め4a,4b内の
成長用溶液と接触するよう構成されている。
A slider 8 that holds the substrate 7 is provided at the bottom of the distribution solution holder 5, and this slider 8 is slidably provided on a boat 9, and the slide sequentially moves the substrate into the distribution solution reservoirs 4a and 4b. is configured to come into contact with the solution.

さて上記にような構成における作業順序につい
て説明する。
Now, the work order in the above configuration will be explained.

最初に、スライダ8に基板7をセツトし、第
1、第2の成長用溶液溜め3a,3bに1層目
(厚膜)と2層目(薄膜)の原料となる成長用溶
液6a,6bを入れる。各成長用溶液は溶媒と溶
質とから成り、後述する各成長温度T1,T2下で
飽和溶液となるに十分な量の溶質が溶媒に対して
セツトされる。このようにして第1図aの状態に
セツトされたスライドボート装置1を図示しない
反応炉内に挿入する。
First, the substrate 7 is set on the slider 8, and the growth solutions 6a and 6b, which will be the raw materials for the first layer (thick film) and second layer (thin film), are placed in the first and second growth solution reservoirs 3a and 3b. Put in. Each growth solution consists of a solvent and a solute, and a sufficient amount of solute is set in the solvent to become a saturated solution under each growth temperature T 1 and T 2 described later. The slide boat device 1 thus set in the state shown in FIG. 1a is inserted into a reactor (not shown).

次に、スライドボート装置1を挿入した炉を第
2図に示す如く、第1の成長温度T1まで昇温し、
その温度を時間aからbまで保持する。第1の成
長温度T1において、各成長用溶液、特に2層目
の成長用溶液となる溶媒中に溶質を飽和するまで
溶かす。溶質が過剰気味に入れてあるので非溶解
の遊離溶質が存在することになるが、この遊離溶
質は成長用溶液6bの上層に溜り、下層には遊離
溶質は存在しない。ここで成長用溶液ホルダ2を
スライドして2層目の飽和した成長用溶液6bを
第2の成長用溶液溜め3bから第2の分配用溶液
溜め4bに移送する(第1図b)、この移送は成
長用溶液6bの下層について行なわれるので、第
2の分配用溶液溜め4bには遊離している過剰溶
質分が除かれた飽和溶液に入ることになる。
Next, the temperature of the furnace into which the slide boat device 1 was inserted was raised to the first growth temperature T1 , as shown in FIG.
The temperature is maintained from time a to b. At the first growth temperature T 1 , the solute is dissolved in each growth solution, especially the solvent that will become the second layer growth solution, until it is saturated. Since solute is added in excess, undissolved free solute exists, but this free solute accumulates in the upper layer of the growth solution 6b, and there is no free solute in the lower layer. Here, the growth solution holder 2 is slid to transfer the second layer of saturated growth solution 6b from the second growth solution reservoir 3b to the second distribution solution reservoir 4b (Fig. 1b). Since the lower layer of the growth solution 6b is transferred, the second distribution solution reservoir 4b contains a saturated solution from which free excess solute has been removed.

このように2層目の成長用溶液6bの移送後、
第1図cに示すように、更に成長用溶液ホルダ2
をスライドして、第2の分配用溶液溜め4bと第
2の成長用溶液溜め3bとの連通を断つ一方、第
1の成長用溶液溜め3aと第1の分配用溶液溜め
4aを連通させ、しかる後、炉の温度を第2の成
長温度T2まで昇温し、この温度を時間cからd
まで保持する。第2の成長温度T2に保持するこ
とにより、この温度下で1層目の成長用溶液6a
を飽和溶液とし、遊離溶質のない飽和溶液を第1
の分配用溶液溜め4a内に移送する。このとき、
第2の分配用溶液溜め4b内に閉じ込められた2
層目の成長用溶液6bは新たに溶解すべき溶質の
供給が断たれているため、未飽和状態となる。成
長用溶液ホルダ2を更にスライドして、1層目と
2層目の溶液の移送分配操作を終了する(第1図
d)。
After transferring the second layer growth solution 6b in this way,
As shown in FIG. 1c, there is also a growth solution holder 2.
to cut off the communication between the second distribution solution reservoir 4b and the second growth solution reservoir 3b, while allowing the first growth solution reservoir 3a to communicate with the first distribution solution reservoir 4a, Thereafter, the temperature of the furnace is increased to the second growth temperature T2 , and this temperature is maintained from time c to d.
hold until. By maintaining the second growth temperature T2 , the first layer growth solution 6a is
is the saturated solution, and the saturated solution without free solute is the first
into the distribution solution reservoir 4a. At this time,
2 trapped in the second distribution solution reservoir 4b
The layer growth solution 6b is in an unsaturated state because the supply of the solute to be newly dissolved is cut off. The growth solution holder 2 is further slid to complete the transfer and distribution operation of the solutions for the first and second layers (FIG. 1d).

そして、これらの移送分配操作を終了後所定の
温度勾配で第2の成長温度T2を徐冷降温する。
分配用溶液溜め4a内の成長用溶液6a温度が第
2の成長温度T2よりも幾分降下してΔT1だけ過
冷却状態となる時間eで、スライダ8をスライド
させ1層目の成長用溶液6aと基板7を接触させ
る。時間eからfの長い間、この接触を保つて比
較的厚い第1層目のエピタキシヤル層を基板7上
に成長させる。
After these transfer and distribution operations are completed, the second growth temperature T2 is slowly cooled down with a predetermined temperature gradient.
At the time e when the temperature of the growth solution 6a in the distribution solution reservoir 4a falls somewhat below the second growth temperature T2 and reaches a supercooled state by ΔT1 , slide the slider 8 to start the growth of the first layer. The solution 6a and the substrate 7 are brought into contact. This contact is maintained for a long period of time from e to f to grow a relatively thick first epitaxial layer on the substrate 7.

所定厚さのエピタキシヤル層の成長が終了する
時間fになると、再びスライダ8をスライドさせ
今度は2層目の成長用溶液6bと基板7を接触さ
せる。この時間fでは、2層目の成長用溶液温度
は、第2の成長温度T2から見ればこれよりも
ΔT3だけ落ちた非常に低い温度となつているが、
第1の成長温度T1から見れば、僅かな大きさの
過冷却度ΔT2分だけ落ちているに過ぎない。
When the time f when the growth of the epitaxial layer of a predetermined thickness is completed, the slider 8 is slid again to bring the second layer growth solution 6b into contact with the substrate 7. At this time f, the temperature of the solution for growing the second layer is a very low temperature, which is ΔT 3 lower than the second growth temperature T 2 .
When viewed from the first growth temperature T1 , the degree of supercooling is only ΔT2 , which is a small amount.

すなわち、第2の分配溶液溜め4b内に閉じ込
められた2層目の成長用溶液6bは、閉じ込めら
れているがゆえに第1の成長温度T1で飽和し、
これよりも高いと未飽和となり、またこれよりも
低いと過飽和となるので、第1の成長温度T1
りも高い第2の成長温度T2からΔT3という大き
な温度降下があつても、その過冷却度ΔT2(=T1
−T3)は僅かである。したがつて、基板7を時
間fで接触させても成長速度が遅く、薄いエピタ
キシヤル層の成長が可能となる。時間fからgの
短い間、この接触時間を保つて、きわめて薄い第
2層目のエピタキシヤル層を基板7上に成長させ
る。
That is, the second layer growth solution 6b confined within the second distributed solution reservoir 4b is saturated at the first growth temperature T1 because it is confined.
If it is higher than this, it will be unsaturated, and if it is lower than this, it will be supersaturated, so even if there is a large temperature drop of ΔT 3 from the second growth temperature T 2 which is higher than the first growth temperature T 1 , the Supercooling degree ΔT 2 (=T 1
−T 3 ) is small. Therefore, even if the substrate 7 is contacted for a time f, the growth rate is slow and a thin epitaxial layer can be grown. This contact time is maintained for a short period f to g to grow a very thin second epitaxial layer on the substrate 7.

かくして第3図に示すように第1層目が10〜
20μmの厚いエピタキシヤル層を成長させた場合
でも、ΔT2を2〜3℃程度に設定することにより
0.3μmの薄いエピキシヤル層21を均一性と再現
性良く成長させることができる。半導体LDなど
のように、数μm成長させた後に、0.05μmのよ
うな薄い層を成長させる場合に、特に有効であ
る。
Thus, as shown in Figure 3, the first layer is 10~
Even when growing a 20 μm thick epitaxial layer, by setting ΔT 2 to around 2 to 3 degrees Celsius,
A thin epitaxial layer 21 of 0.3 μm can be grown with good uniformity and reproducibility. This is particularly effective when growing a thin layer of 0.05 μm after growing several μm, such as in a semiconductor LD.

このように本実施例によれば、第1層目を厚く
した場合であつても第2層目の溶液の過冷却度を
小さくできるため、第2層目の成長速度が速くな
つたり、厚い結晶膜が短時間で成長してしまつた
りするということも、結晶膜厚の制御が難しいと
いうこともない。また基板との接触液を、遊離溶
質が残存している成長用溶液溜め内の溶液と断つ
ようにしたため、遊離溶質が接触液中に残存しな
いように高精度の秤量をしたり、測定が困難にな
つたりするということも、また温度の絶対値を正
しく制御する必要もない。
In this way, according to this example, even when the first layer is made thicker, the degree of supercooling of the solution in the second layer can be reduced. The crystal film does not grow in a short period of time, nor is it difficult to control the crystal film thickness. In addition, since the solution in contact with the substrate is separated from the solution in the growth solution reservoir in which free solutes remain, it is difficult to weigh and measure with high precision so that free solutes do not remain in the contact solution. There is no need to accurately control the absolute value of the temperature.

なお、上記実施例では、厚い層の上に薄い層を
成長させる場合について述べたが、徐冷降温を2
回繰り返せば、先に薄い層を成長させる場合にも
適用でき、また成長用溶液溜め等も2つに限定さ
れるものではなく、3つ以上の場合にも適用でき
る。
In the above example, a case was described in which a thin layer was grown on a thick layer, but the slow cooling temperature was reduced to 2.
By repeating this process several times, it can be applied even when a thin layer is grown first, and the number of growth solution reservoirs is not limited to two, but can also be applied when there are three or more.

[発明の効果] 以上要するに本発明によれば次のうよな優れた
効果を発揮する。
[Effects of the Invention] In summary, the present invention exhibits the following excellent effects.

(1) 各成長用溶液の移送分配を異なる温度で行な
うようにしたことにより、同一温度で分配する
従来のものと異なつて、飽和状態を維持する温
度が各成長用溶液で別個に設定し得るので、こ
れらの設定温度間の幅を任意に決めれば、厚い
層と薄い層との積層順序に関係なく、成長用溶
液の過冷却度を適切に取ることができる。した
がつて、厚い層と薄い層との積層構造を有する
エピタキシヤル層を均一性と再現性良く成長さ
せることができる。
(1) By transferring and distributing each growth solution at different temperatures, the temperature at which the saturated state is maintained can be set separately for each growth solution, unlike conventional systems that distribute at the same temperature. Therefore, by arbitrarily determining the width between these set temperatures, the degree of supercooling of the growth solution can be appropriately determined regardless of the order in which thick layers and thin layers are stacked. Therefore, an epitaxial layer having a laminated structure of thick and thin layers can be grown with good uniformity and reproducibility.

(2) 飽和後溶媒から遊離している過剰溶質分を除
いた飽和成長溶液を分配用溶液溜め内に移送す
るようにしたことにより、従来のような溶媒、
溶質の高精度の秤量を必要とせず、溶媒に対し
て過剰気味の溶質を入れるという大雑把な秤量
でよいので、作業がきわめて容易となる。
(2) By transferring the saturated growth solution, which removes the excess solute released from the solvent after saturation, into the distribution solution reservoir, it is possible to
It is not necessary to weigh the solute with high accuracy, and only a rough weighing of the solute in excess of the solvent is sufficient, making the work extremely easy.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の工程図、第2図は
第1図の工程における炉の昇温、徐冷降温と時間
との関係の一例を示す線図、第3図は本発明によ
り得られる基板上のエピタキシヤル成長層の膜厚
を説明する概略説明図、第4図は従来例の液相エ
ピタキシヤル成長装置の断面図、第5図は同じく
炉温度と時間との関係を示す線図である。 図中、3a,3bは成長用溶液溜め、4a,4
bは分配用溶液溜め、6a,6bは成長用溶液、
7は基板である。
Fig. 1 is a process diagram of an embodiment of the present invention, Fig. 2 is a diagram showing an example of the relationship between temperature rise of the furnace, gradual cooling temperature fall, and time in the process of Fig. 1, and Fig. 3 is a diagram of the present invention. 4 is a cross-sectional view of a conventional liquid phase epitaxial growth apparatus, and FIG. 5 similarly shows the relationship between furnace temperature and time. FIG. In the figure, 3a, 3b are growth solution reservoirs, 4a, 4
b is a distribution solution reservoir, 6a and 6b are growth solutions,
7 is a substrate.

Claims (1)

【特許請求の範囲】[Claims] 1 成長用溶液ホルダの複数の成長用溶液溜にそ
れぞれ収容された各飽和溶液の一部を分配用溶液
ホルダの各分配溶液溜に分配し、これら分配され
た各溶液に基板を順次接触させて基板上に多層の
エピタキシヤル成長層を積層する液相エピタキシ
ヤル成長法において、上記複数の成長用溶液溜に
それぞれ溶媒と過剰気味の溶質とを入れた後、炉
内の昇温を開始し、その昇温途中において、各成
長用溶液溜内の溶液ごとに異なる各所定温度にな
る度に所定時間そのままの炉内温度に保持して、
その温度下で、対応する成長用溶液溜内の溶液か
ら遊離している過剰溶質分を除いた飽和溶液を分
配溶液溜に分配する操作を行い、全ての分配操作
が終了した後炉内を徐冷降温し、各分配操作時の
温度から所定の温度分落ちた温度になるごとに、
各分配溶液溜の下に基板を移動させて順次各溶液
に接触させることを特徴とする液相エピタキシヤ
ル成長法。
1. Distributing a portion of each saturated solution contained in each of the plurality of growth solution reservoirs of the growth solution holder to each distribution solution reservoir of the distribution solution holder, and sequentially bringing the substrate into contact with each of these distributed solutions. In a liquid phase epitaxial growth method in which multiple epitaxial growth layers are laminated on a substrate, after each of the plurality of growth solution reservoirs is filled with a solvent and an excessive amount of solute, the temperature in the furnace is started to increase, During the temperature rise, each time the solution in each growth solution reservoir reaches a different predetermined temperature, the furnace temperature is maintained at the same temperature for a predetermined period of time.
At that temperature, the saturated solution obtained by removing the excess solute released from the solution in the corresponding growth solution reservoir is distributed to the distribution solution reservoir, and after all the distribution operations are completed, the inside of the furnace is gradually reduced. Each time the temperature drops by a predetermined amount from the temperature at each distribution operation,
A liquid phase epitaxial growth method characterized by moving a substrate under each distribution solution reservoir and sequentially bringing it into contact with each solution.
JP14679185A 1985-07-05 1985-07-05 Liquid phase epitaxial growth method Granted JPS627697A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14679185A JPS627697A (en) 1985-07-05 1985-07-05 Liquid phase epitaxial growth method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14679185A JPS627697A (en) 1985-07-05 1985-07-05 Liquid phase epitaxial growth method

Publications (2)

Publication Number Publication Date
JPS627697A JPS627697A (en) 1987-01-14
JPH0566352B2 true JPH0566352B2 (en) 1993-09-21

Family

ID=15415616

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14679185A Granted JPS627697A (en) 1985-07-05 1985-07-05 Liquid phase epitaxial growth method

Country Status (1)

Country Link
JP (1) JPS627697A (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589794B2 (en) * 1979-05-16 1983-02-22 富士通株式会社 Semiconductor liquid phase multilayer thin film growth method and growth equipment

Also Published As

Publication number Publication date
JPS627697A (en) 1987-01-14

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