JPH0571890B2 - - Google Patents
Info
- Publication number
- JPH0571890B2 JPH0571890B2 JP63062357A JP6235788A JPH0571890B2 JP H0571890 B2 JPH0571890 B2 JP H0571890B2 JP 63062357 A JP63062357 A JP 63062357A JP 6235788 A JP6235788 A JP 6235788A JP H0571890 B2 JPH0571890 B2 JP H0571890B2
- Authority
- JP
- Japan
- Prior art keywords
- detection element
- temperature
- electronic cooling
- output
- cooling element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
Description
【発明の詳細な説明】
［産業上の利用分野］
この発明は、被測定対象からの放射エネルギー
を検出して温度等を測定する光学的測定装置に関
するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an optical measuring device that measures temperature and the like by detecting radiant energy from an object to be measured.
［従来の技術］
従来、放射エネルギーを検出する検出素子の感
度を上げるために、素子を冷却する方法がとられ
ている。[Prior Art] Conventionally, in order to increase the sensitivity of a detection element that detects radiant energy, a method of cooling the element has been used.
たとえば、第４図で示すように、検出素子１を
基台３上のペルチエ素子等の電子冷却素子２の冷
却面に設けて同一パツケージ内に封入し、さらに
サーミスタ等の温度検出素子４で素子冷却面の温
度を測定し、その出力etが設定値esと一致するよ
う電子冷却素子２を制御し、検出素子１の温度を
一定としている。 For example, as shown in FIG. 4, a detection element 1 is provided on the cooling surface of an electronic cooling element 2 such as a Peltier element on a base 3 and sealed in the same package, and a temperature detection element 4 such as a thermistor is further mounted on the cooling surface of an electronic cooling element 2 such as a Peltier element. The temperature of the cooling surface is measured, and the electronic cooling element 2 is controlled so that its output et matches the set value es, thereby keeping the temperature of the detection element 1 constant.
［この発明が解決しようとする課題］
温度検出素子４は、電子冷却素子２の冷却面の
検出素子１の近くに設けるのが望ましいのである
が入射光の影響を受けて誤差を招きやすい。この
除光のための手段を設けると装置が複雑なものと
なる。従つて、通常第４図のように電子冷却素子
２の側面に温度検出素子４を設けるのであるが、
検出素子１の温度と温度差があり、得に周温が変
化した場合、追いつかず誤差が大きくなる問題点
がある。[Problems to be Solved by the Invention] Although it is desirable to provide the temperature detection element 4 near the detection element 1 on the cooling surface of the electronic cooling element 2, it is susceptible to the influence of incident light and tends to cause errors. Providing this means for removing light would complicate the device. Therefore, normally a temperature detection element 4 is provided on the side surface of the electronic cooling element 2 as shown in FIG.
There is a temperature difference with the temperature of the detection element 1, and there is a problem that, especially when the ambient temperature changes, it cannot catch up and the error becomes large.
この発明の目的は、以上の点に鑑み、素子自身
の暗抵抗の温度特性を利用して、電子冷却素子を
制御し、安定な温度制御を可能とした光学的測定
装置を提供することである。 In view of the above points, it is an object of the present invention to provide an optical measuring device that controls a thermoelectric cooling element by utilizing the temperature characteristics of the dark resistance of the element itself, and enables stable temperature control. .
［課題を解決するための手段］
この発明は、検出素子自体の出力に基き、制御
手段により電子冷却素子を制御し、検出素子温度
を一定とした光学的測定装置である。[Means for Solving the Problems] The present invention is an optical measuring device in which the temperature of the detection element is kept constant by controlling the electronic cooling element by means of a control means based on the output of the detection element itself.
［実施例］
第１図は、この発明の一実施例を示す構成説明
図で、第４図と同一符号は同等の構成要素を示
す。[Embodiment] FIG. 1 is a configuration explanatory diagram showing an embodiment of the present invention, and the same reference numerals as in FIG. 4 indicate the same components.
図において、チヨツパ６のチヨツピングされた
断続光は、PbS、PbSe等の検出素子１に入射し、
この抵抗Riの検出素子１と抵抗Pbの負荷抵抗１
０は、直列接続され、±Vbの電源でハーフブリツ
ジを構成し、その中点の電圧Vaが演算増幅器A1
を用いたバツフア回路７に入力しインピーダンス
変換される。バツフア回路７の第２図ａの直流の
出力は、制御手段５で設定値esと比較され、検出
素子１を冷却する電子冷却素子２に流れる電流を
制御し、検出素子１の出力Vaを設定値esに一致
させ、検出素子１の温度を一定とする。 In the figure, the chopped intermittent light from the chopper 6 enters the detection element 1 made of PbS, PbSe, etc.
Detection element 1 of this resistance Ri and load resistance 1 of resistance Pb
0 are connected in series to form a half bridge with ±Vb power supplies, and the voltage Va at the midpoint is the operational amplifier A 1
The signal is input to a buffer circuit 7 using an impedance converter. The DC output of the buffer circuit 7 shown in FIG. The temperature of the detection element 1 is kept constant by matching the value es.
他方、バツフア回路７の出力は、コンデンサＣ
で直流分をカツトして第２図ｂの交流分を取り出
し、測定手段８で、この交流分の出力の大きさか
ら、入射光の温度等を演算、測定する。 On the other hand, the output of the buffer circuit 7 is connected to the capacitor C
The direct current component is cut off and the alternating current component shown in FIG.
つまり、第３図Ｂで示すように、検出素子１
は、光が来ない場合も、数ＭΩ程度の暗抵抗をも
ち、これは温度Ｔにより変化する。そして、光が
来ると、その大きさにより第３図A1，A2，…の
ように変化する。その変化分は数Ω程度で暗抵抗
分と比べ小さいため、この暗抵抗分の電圧にほぼ
対応したバツフア回路７の第２図ａの直流分出力
により、制御手段５で電子冷却素子２を制御し、
その変化分は、第２図ｂのように交流出力として
得られるので、これにより測定手段８で温度等を
測定する。さらに、チヨツパと同期した信号を取
り出し、暗抵抗に比例した直流信号を取り出すこ
とにより、入射光分の誤差をなくすことができ高
精度化が図れる。 In other words, as shown in FIG. 3B, the detection element 1
has a dark resistance of about several MΩ even when no light comes, and this changes depending on the temperature T. When light comes, it changes as shown in Figure 3 A 1 , A 2 , etc. depending on its size. Since the amount of change is about several ohms and is small compared to the dark resistance, the control means 5 controls the electronic cooling element 2 by the DC output of the buffer circuit 7 shown in FIG. death,
The amount of change is obtained as an alternating current output as shown in FIG. Furthermore, by extracting a signal synchronized with the chopper and extracting a DC signal proportional to the dark resistance, errors caused by the incident light can be eliminated and higher precision can be achieved.
［発明の効果］
以上述べたように、この発明は、検出素子自身
の暗抵抗成分を利用して電子冷却素子を制御し、
検出素子の温度を一定としているので、特別な温
度検出素子を設ける必要がなく、高精度に、安定
した検出素子の温度制御が可能となる。[Effects of the Invention] As described above, the present invention utilizes the dark resistance component of the detection element itself to control the electronic cooling element,
Since the temperature of the detection element is kept constant, there is no need to provide a special temperature detection element, and the temperature of the detection element can be controlled stably with high precision.
第１図は、この発明の一実施例を示す構成説明
図、第２図、第３図は、動作説明図、第４図は、
従来例を示す構成説明図である。
１……検出素子、２……電子冷却素子、３……
基板、４……温度検出素子、５……制御手段、６
……チヨツパ、７……バツフア回路、８……測定
手段、Ｃ……コンデンサ。
FIG. 1 is a configuration explanatory diagram showing an embodiment of the present invention, FIGS. 2 and 3 are operation explanatory diagrams, and FIG.
FIG. 2 is a configuration explanatory diagram showing a conventional example. 1...Detection element, 2...Electronic cooling element, 3...
Substrate, 4... Temperature detection element, 5... Control means, 6
...Chiyotsupa, 7...Buffer circuit, 8...Measuring means, C...Capacitor.
Claims (1)
とともに電子冷却素子で冷却される検出素子と、
この検出素子の直流分の出力と設定値とを比較し
て両信号が一致するように出力信号を発生して前
記電子冷却素子を制御し検出素子を一定温度に冷
却する制御手段とを備えた光学的測定装置。1 a detection element that detects incident light interrupted by a chopper and is cooled by an electronic cooling element;
a control means that compares the DC output of the detection element with a set value and generates an output signal so that both signals match, controls the electronic cooling element and cools the detection element to a constant temperature. Optical measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63062357A JPH01235820A (en) | 1988-03-15 | 1988-03-15 | Optically measuring instrument |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63062357A JPH01235820A (en) | 1988-03-15 | 1988-03-15 | Optically measuring instrument |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01235820A JPH01235820A (en) | 1989-09-20 |
| JPH0571890B2 true JPH0571890B2 (en) | 1993-10-08 |
Family
ID=13197783
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63062357A Granted JPH01235820A (en) | 1988-03-15 | 1988-03-15 | Optically measuring instrument |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01235820A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5165796A (en) * | 1990-12-07 | 1992-11-24 | Ag Processing Technologies, Inc. | Bichannel radiation detection apparatus |
| JP5751938B2 (en) * | 2011-06-09 | 2015-07-22 | アズビル株式会社 | Flame sensor |
-
1988
- 1988-03-15 JP JP63062357A patent/JPH01235820A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01235820A (en) | 1989-09-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |