JPH0573182B2 - - Google Patents

Description

[Detailed Description of the Invention] [Objective of the Invention] (Industrial Application Field) The present invention relates to a mounted circuit board (hereinafter referred to as "mounted circuit board") as an object to be inspected, which is assembled by mounting various electronic components on a flat circuit board. The present invention relates to a circuit board testing device that performs a final continuity test on a circuit board (simply referred to as a circuit board), and particularly relates to a double-sided circuit board testing device that tests a test object with various electronic components mounted on both sides of a circuit board.

(Prior Art) This type of circuit board inspection device that has already been proposed uses the tips of a number of contact probe pins to come into contact with the inspection points of a circuit board, which is an object to be inspected and has various electronic components mounted on only one side. A continuity test is being carried out.

That is, the above-mentioned circuit board inspection device elastically plants a large number of contact probe pins on a probe pin board, and causes these contact probe pins to protrude from each electronic component mounted on one side of the circuit board. The conductor portion is moved up and down from above or below to press into contact with the conductor portion located on the other surface of the circuit board, thereby testing electrical continuity.

In this way, the circuit board used as the object to be tested has various electronic components attached to only one side and the test circuit surface is formed on the other side of the circuit board. The measurement test is carried out by contacting the circuit board from the side.

However, in order to miniaturize the various electronic components used in recent circuit boards, they are forced to be arranged at high density, and as a result, they are mounted on both sides of the circuit board. It is desired that the continuity of these double-sided circuit boards be tested simultaneously from above and below the double-sided circuit board, and moreover, in one process.

In order to solve this problem, the present applicant proposed in Japanese Patent Application Laid-Open No. 61-223666 that a circuit board holding frame that removably supports a double-sided circuit board is installed inside a device frame having a plurality of guide supports. It is installed so that it can be moved up and down along the circuit board holding frame.
An upper probe pin board having downward contact probe pins is fixed and supported on the device frame;
A lower probe pin board mounting frame that holds a lower probe pin board having upward contact probe pins is attached to a lower position of the circuit board holding frame so as to be movable up and down along the guide column. By pushing upwardly, the circuit board holding frame is also pushed up, thereby causing the circuit board to be contacted above and below by the probe pins of the upper probe pin board and the probe pins of the lower probe pin board. We proposed a double-sided circuit board inspection system that inspects both sides simultaneously.

(Problem to be Solved by the Invention) By the way, in this double-sided circuit board inspection device, the lower probe pin board mounting frame is pushed upward each time each board to be inspected, and the pushing-up operation Therefore, an action is required to also push up the circuit board holding frame located above it. However, because the circuit board holding frame is formed separately from the lower probe pin board mounting frame and is supported by the guide column so that it can be moved up and down independently, the vertical dimension increases and the circuit board holding frame becomes larger than the guide column. It is relatively heavy and requires a strong force to push up the circuit board holding frame in addition to the lower probe pin board mounting frame. Since it has to be manufactured, the cost also increases.

The present invention was made to solve these problems, and its purpose is to place the circuit board holding frame directly on the upper surface of the frame body to which the lower probe pin board is mounted, thereby making it possible to create an independent circuit board holding frame. Eliminates the need for a circuit board holding frame, reduces overall vertical dimensions,
Simplify the structure and reduce push-up force during inspection.
Moreover, the aim is to reduce manufacturing costs.

[Structure of the invention]

(Means for Solving the Problems) The double-sided circuit board inspection device of the present invention has a frame body of the inspection device configured by installing a plurality of guide columns on a support base and attaching a top plate to the upper part of the guide columns. A horizontal upper probe pin board having downward contact probe pins is attached to the lower side of the top plate so as to be freely removable outside the frame. A lifting platform is provided that can be moved up and down in the vertical direction, and a lifting drive mechanism is provided to raise and lower the lifting table relative to the upper probe pin board. A lower contact probe pin board is mounted horizontally on the slide frame, and upwardly facing contact probe pins are mounted on the lower probe pin board. A frame-shaped circuit board mounting stand is resiliently supported above the lower probe pin board so as to surround the upper end of the contact probe pin, and the circuit board mounting stand has a surface on its upper surface that supports the double-sided circuit board to be inspected. The lower surface of the circuit board supported on the circuit board mounting table is normally slightly separated from the upper end of the lower contact probe pin, and when the lifting platform is raised, the upper surface of the circuit board is first
The lower surface of the circuit board is brought into contact with the contact probe pins of the upper probe pin board, and then the lower surface of the circuit board is pressed down so as to approach the lower probe pin board. It is characterized in that it comes into contact with the contact probe pin of.

(Function) With this configuration, when the lifting platform is raised, the slide frame and lower probe pin board placed on the upper surface are lifted while supporting the circuit board mounting table on the upper surface, and first The top surface of the circuit board to be tested on the circuit board mounting table contacts the probe pins of the upper probe pin board and stops, and then the lower probe pin board further rises against the elastic force and is placed on the circuit board mounting table. The upper ends of the probe pins of the lower probe pin board come into contact with the lower surface of the supported circuit board to be tested, thereby establishing a conductive state and conducting the test.

(Example) Hereinafter, the present invention will be described with reference to the illustrated example.

In FIG. 1, reference numeral 1 indicates a flat rectangular support base of the circuit board inspection apparatus, and four guide columns 2 are provided at the corners of the support base 1, as is clear from FIG. A top plate 3 is fixed to the upper part of this guide column 2, and a frame 4 of the apparatus is constituted by these.

An upper probe pin board _B1 is supported below and parallel to the top plate 3. The upper probe pin board _B1 is supported by an upper probe pin board mounting frame 6 fixed to the lower surface of the top plate 3 so as to be slidable in the front-rear direction (direction perpendicular to the plane of the paper). In order to make this sliding possible, support stepped strips 7 are fixed to the lower end of the mounting frame 6 to slidably support both side edges of the upper probe pin board _B1 . Details of this part will be described later. The upper probe pin board _B1 is equipped with a number of contact probe pins 5 having downward tips. These probe pins 5 are attached to the upper probe pin board _B1 while passing through it.

A lift platform 8 is provided at the inner lower part of the frame body 4, and cylinder bodies 9 are fixedly installed at the corners of this lift table 8, and these cylinder bodies 9 are slidably attached to each guide column 2. This allows the lifting platform 8 to connect to the guide column 2.
It becomes possible to move up and down while being guided by.

There are guide receivers 1 in the front and back direction on both sides of the lifting platform 8.
0 and 10 are fixed, and bar-shaped guides 11 and 11 are provided so as to be guided in the front and back direction by these guide receivers 10 and 10, and these guides 11 and 11 are provided with slides for supporting the lower probe pin board. It is fixed to the lower surface of the frame 12. Therefore, this slide frame 12
0 and can be slid in the front and rear directions. A lower probe pin board _B2 is attached to the upper surface of the slide frame 12, and a circuit board mounting table 13 is provided thereon. The lower probe pin board B ₂ has a number of contact probe pins ₁₄ with upwardly directed tips.
It is installed with the top and bottom penetrating through it.

The basic configuration explained above will be explained in more detail with reference to FIG.

First, both side edges of the upper probe pin board _B1 are placed on the stepped portion 7a provided inside the strip 7, and are slidable on the stepped portion 7a in the front-rear direction. Upper probe pin board B ₁ on step 7a
The predetermined position is achieved by inserting the lower end of the positioning pin 16, which passes through the mounting frame 6 from above to below, into the hole 17 formed on both sides of the board _B1 . After the positioning pin 16 is inserted into the hole 17, it is prevented from being removed by a set screw 18. The mounting frame 6 and the strip 7 are fixed to the lower surface of the top plate 3 by bolts 19, nuts 20 and set screws 21.

The lower pin board supporting slide frame 12 has a frame shape with an opening 12a inside, and the peripheral portion of the lower probe pin board _B2 is fixed to the upper surface thereof with screws or the like. A vertical bushing 23 is integrally inserted into this pin board B ₂ near its side edge, and inside this bushing 23, there is a vertically extending bush 23 that protrudes downward from the lower surface of the side edge of the circuit board mounting table 13. The slide pin 24 provided is inserted. The slide pin 24 has an enlarged head at its lower end, and is actually a stop that is inserted upward through the bush 23 from below and then passed through the circuit board mounting table 13 from its upper surface downward. It is fixed to the circuit board mounting table 13 with screws 25 .

On the other hand, a coil spring 26 is interposed between the circuit board mounting table 13 and the lower probe pin board _B2 . The lower end of this spring 26 is inserted into a hole in the pin board B ₂ whose lower part is closed with a screw 27 .
Due to the force of this spring 26, the circuit board mounting table 13
is pushed up to the point where the enlarged head at the lower end of the slide pin 24 contacts the lower edge of the bush 23, leaving a gap between the lower surface of the circuit board mounting table 13 and the upper surface of the pin board _B2 . . In this state, the lower surface of the circuit board to be inspected P placed on the upper surface of the circuit board mounting table 13 of the frame body is connected to the lower probe pin board.
B ₂ faces the tip (upper end) of the probe pin 14 with a slight gap therebetween. Note that 28 indicates an electronic component mounted on the circuit board P.

As mentioned above, the slide frame 12 is the guide receiver 1
Although the slide frame 12 can be slid back and forth while being guided by the slide frames 0 and 10, a mechanism shown in FIG. In the figure, reference numeral 30 denotes a positioning pin, the upper end of which can be inserted into a bush 31 that forms a pin insertion hole that opens on the lower surface of the slide frame 12. Positioning pin 30
is guided in the vertical direction by a pin guide member 32 fixed on the lifting table 8, and is adapted to be displaced upward by a positioning pin operating cylinder C ₁ (see also FIG. 7). When the positioning pin 30 is inserted into the bush 31, the slide frame 12 is positioned on the lifting table 8.

In order to detect when the slide frame 12 has retreated to a predetermined position on the lifting table 8, a first reed switch _S1 is fixed on the lifting table 8, and a detection piece 34 is detected by the reed switch _S1. is fixed to the side end surface of the slide frame 12. On the other hand, in order to detect the limit position at which the slide frame 12 has advanced outward from the elevator platform 8, a second reed switch _S2 is fixed near the front of the elevator platform 8, as shown in FIG. ing. A detection piece 35 is provided as shown in FIG. 5 to receive detection by the second reed switch _S2 .

As shown in the side view of FIG. 4 and FIG. 8, on the lifting platform 8 are shock absorbers D ₁ and D ₂ that collide with a portion of the slide frame 12 at the forward limit position and the backward limit position of the slide frame 12. is provided. The shock absorber D ₂ is subjected to impact, for example, by a portion 36 hanging down from the front end of the slide frame 12 . Shock absorber _D2 is also subject to impact from similar parts.

As shown at the left end of FIG. 1, a motor M for advancing and retracting the slide frame 12 is installed on the lifting platform 8. This motor M has a rotating output shaft 40 as shown in FIGS. 9, 11, and 12,
A transmission belt 43 is stretched between a pulley 41 fixed to the output shaft 40 and another pulley 42. A pinion 45 is fixed to the shaft 44 of the pulley 42. On the other hand, a rack 46 is fixed to the side surface of the slide frame 12, and a pinion 45 is engaged with this rack. Therefore, motor M
By rotating in either direction, slide frame 1
2 performs forward and backward movements relative to the lifting platform 8. At the limit position of this movement, the reed switches S ₁ and S ₂ issue a detection signal to stop the motor M.

An elevating and lowering drive mechanism is provided to raise the lower probe pin board _B2 toward the upper probe pin board _B1 to perform a continuity test. This elevating drive mechanism will be explained below with reference to FIGS. 1, 2, 3, and 4.

As shown in FIGS. 1 and 2, a pneumatic cylinder _C2 serving as a driving source is provided on the right side of the circuit board inspection apparatus when viewed from the front and supported by the lower surface of the top plate 3. As shown in FIGS. As shown in Figure 3, the top plate 3
A bracket 50 is protruded from the rear lower surface, and one end of a pneumatic cylinder _C2 is pivotally connected to the bracket 50 by a pin 51. A piston rod 52 of this cylinder _C2 projects forward, and its tip is pivotally connected to one end of an arm 54 by a pin 53. The other end of this arm 54 is fixed to a rotation shaft 56 supported by a bearing 55 fixed to the lower surface of the top plate 3. Therefore, as the piston rod 52 moves back and forth, the rotation shaft 56 is rotated.

The rotation shaft 56 is supported along the lower surface of the top plate 3, as shown in FIG.
A lever 58 is fixed at a position different from the arm 54. As shown in FIG. 3, the upper end of a substantially vertical bending link 60 is pivotally connected to one end of the lever 58 by a pin 59. The arm of the lever 58 on the side where the pin 59 is located normally projects in a substantially horizontal direction as shown. The lower end of the bending link 60 is connected to a bracket 62 on the lifting platform 8 by a pin 61.
It is pivoted to. The lever 58 and the bending link 60 are connected to the rotation shaft 5 as shown in FIG.
6, respectively, at positions on both sides separated in the axial direction.

The front end of a longitudinally interlocking link 65 is pivotally connected by a pin 64 (FIG. 4) at the other end of the lever 58;
The rear end of this link 65 is pivotally connected to one end of a lever 58E similar to the lever 58 by a pin 66. This lever 58E is pivotally connected to a rotation shaft 56E supported by a bearing 55E, and the other end of the lever 58E is pivotally connected to the upper end of a bending link 60E by a pin 59E. The lower end of this bending link 60E is connected to a pin 61E as in the case of bending link 60.
(Fig. 3), it is pivotally connected to the lifting platform 8. A pair of links 65, a lever 58E, and a bending link 60E are also provided on the left and right sides.

With the above configuration, the cylinder is moved so as to move the piston rod 52 backward in the direction of the arrow in FIG.
When _C2 is actuated, the lever 58 rotates counterclockwise via the arm 54, and the interlocking link 65
Since lever 58E also rotates in the same direction via
The bending links 60, 60E are pulled upward, and the lifting platform 8 is thereby raised. Further, when the piston rod 52 is moved forward, the elevator platform 8 is lowered.

As shown in FIG. 11, an upper connection pin board b ₁ is provided horizontally at the rear end of the upper probe pin board B ₁ . Top connection pin board b ₁
is located at a higher position than the upper probe pin board B ₁ in the illustrated example, and is connected to the top plate 3 by the connecting member 70.
The connecting member 71 connects the upper probe pin board.
Each is fixed to the rear end of B ₁ .

A lower connection pin board _b2 is horizontally fixed to the rear end of the lower probe pin board _B2 . In this example, the lower connection pin board b ₂ is located lower than the lower probe pin board B ₂ and the connecting member 7
It is fixed there by 2. Therefore, the lower connection pin board _b2 is movable back and forth together with the lower probe pin board _B2 .

The upper connection pin board b ₁ has a large number of vertical through holes formed in a certain arrangement, for example, a lattice arrangement, and connection pins 74 are inserted and fixed through at least some, preferably all, of these through holes. has been done. The connecting pin 74 is removably provided.
The base end (upper end) of the contact probe pin 5 inserted into the upper probe pin board B ₁ and the upper end of the connecting pin 74 are connected to a jumper wire 75.
connected by.

Meanwhile, the bottom connecting pin board B ₂ also has a certain arrangement,
For example, a large number of vertical through holes are formed in a lattice arrangement, and at least some of these through holes,
Preferably, the connecting pin 76 is inserted and fixed in the entirety. This connecting pin 76 is also removably provided. The base end (lower end) of the contact probe pin 14 inserted through the lower probe pin board B ₂ and the lower end of the connection pin 76 are connected by a jumper wire 77 .

An intermediate connecting pin board _b3 is located between the upper and lower connecting pin boards _b1 , _b2 . This intermediate connection pin board b ₃ is also formed with vertical through holes arranged in a certain arrangement, for example, in a grid pattern, and connecting pins 78 are formed in at least some (usually all) of these through holes.
is inserted and fixed in a removable manner. Some of these connecting pins 78 are installed so that they are vertically aligned with the connecting pins 74 of the upper connecting pin board b ₁ , and others are installed so that they are vertically aligned with the connecting pins 76 of the lower connecting pin board b ₂ . It is installed so that the position matches the direction. Note that it is desirable that all of the connection pins 74, 76, and 78 are aligned in the vertical direction.

Elevating plates 8 are installed at both ends of the intermediate connection pin board b ₃ .
The lower end of 0 is fixed with a screw 81. The elevating plate 80 penetrates the top plate 3 and protrudes above the top plate,
A cam driven roller 81 is supported there by a shaft 82. Meanwhile, the intermediate connection pin board b ₃ is the first
As shown in FIG. 2, sleeves 83 are fitted into both ends of the guide rod 84, which is fitted into a guide rod 84 projecting downward from the top plate 3 so as to be slidable up and down. A coil spring 85 is interposed between the sleeve 83 and the top plate 3.

As shown in FIGS. 10 to 12, a cam 87 that is long in the front-rear direction is provided below the cam driven roller 81 and is supported on the top surface of the top plate 3 so as to be slidable in the longitudinal direction. This cam 87 has a raised portion 87
a (Fig. 11). A rack 88 is provided so as to integrally follow this cam 87 in a line, and is similarly supported on the upper surface of the top plate 3 so as to be slidable in the longitudinal direction. Cam 87 and Rack 8
8 is guided by a track 92 shown in FIG. 12 for sliding displacement. A bearing 89 is installed adjacent to the rack 88, and a rotating shaft 90 is supported between it and a similar bearing 89 on the opposite side (see FIG. 2), and a gear 91 integral with this rotating shaft is shown in FIG. It is also engaged with the rack 88 as shown. A base end of an operating handle 92 for rotating the rotating shaft 90 is fixed to the rotating shaft 90.

As shown in the principle diagram of FIG. 13, the connecting pin 78 inserted into the intermediate connecting pin board _b3 has contact ends 95 at its upper and lower ends that are retractable against a spring 94. Although not shown, the contact end 95 is provided with a means for preventing it from slipping out of the main body 96. On the other hand, a conduction pin 97 is inserted adjacent to each connection pin 78, and the connection pin 78 and the conduction pin 97 are connected in a conductive state as shown by 98, and a wiring 99 is connected from the conduction pin 97 to a testing device (not shown).
is connected. In the illustrated example, the connection pins 78 on the left are for example for contacting the connection pins 76 of the lower connection pin board b ₂ as described below, and the connection pins 78 on the right are for example for the connection of the upper connection pin board b _1. This is for contacting the pin 74 as described later.

Next, the operation of the double-sided circuit board inspection apparatus described above will be explained.

To inspect a double-sided circuit board P as an object to be inspected, as shown in FIG.
10 and move it forward towards you. As a result, the lower probe pin board _B2 on the slide frame 12 and the circuit board mounting table 13 thereon are exposed to the outside of the frame body 4. When the slide frame 12 reaches the forward limit position, the shock of stopping is absorbed by the shock absorber _D1 , and the position detection switch _S2 detects the forward end position of the slide frame and stops the motor M.

Next, on the exposed circuit board mounting table 13, the fifth
The circuit board P to be inspected is placed and attached to a predetermined position in the state shown in the figure. Subsequently, when the motor M is reversed, the slide frame 12 on which the circuit board P is mounted retreats into the frame body 4. Then, the motor M is stopped at the backward limit position by colliding with the shock absorber _D2 , and when the arrival at the backward limit position is detected by the position detection switch _S1 , the motor M is stopped. When the retraction limit position is reached in this way, the positioning pin 30 (Fig. 6) is moved by the operation of cylinder _C1 .
As the slide frame 12 is raised and inserted into the hole in the bush 31, the slide frame 12 is fixed at a predetermined position on the lifting platform 8. This means that the circuit board mounting table 13 on the slide frame 12, and thus the circuit board P, have been set at a predetermined position as shown in FIG.

Next, the cylinder _C2 of the elevating drive mechanism is operated to retract the piston rod 52 in the direction of the arrow in FIG. As a result, the levers 58,5
8E rotates counterclockwise in FIG. 4 and raises the bending links 60 and 60E, so that the lifting platform
rises along the guide column 2. At the limit of this rise, the arm of the lever 58, 58E on the side with the pin 59, 59E pivots from its initial horizontal position to a substantially vertically upwardly pointing position. This elevation allows the lower probe pin board B ₂ and circuit board holder 1 to
3 rises together with the circuit board P. As mentioned above,
When the arm on the side where the pins 59, 59E of the levers 58, 58E are located rotates from a horizontal position to a position facing vertically upward, the lifting platform 8 is raised by the arm via the bending links 60, 60E. The upper circuit board P rises relatively quickly at first, and its rising speed slows down as it approaches the upper probe pin board _B1 .

When the circuit board P comes into contact with the tips (lower ends) of the contact probe pins 5 of the upper probe pin board _B1 as a result of the rise, the circuit board P stops rising. At this time, contact probe pin 5
The tip of the contact pin 78 resists elasticity and retreats slightly, similar to the case of the contact pin 78 in FIG.

Even if the circuit board P stops rising, the lifting platform 8 continues to rise, and therefore the lower probe pin board
_B2 approaches the circuit board P while being guided by the slide pins 24 while compressing the spring 26 interposed between it and the circuit board mounting table 13, and the upper ends of the contact probe pins 14 come into contact with the lower surface of the circuit board P. At this time as well, the tip of the contact probe pin 14 retreats somewhat against the elasticity as in the case of the contact pin 78. Thus, the circuit board P is contacted by the contact probe pins 5 and 14 from above and below,
A continuity test is performed via a continuity circuit which will be described later.

After the continuity test is completed, the piston rod 52 of the drive cylinder _C2 protrudes, so that the lifting platform 8 is lowered and the circuit board P is released from both contact probe pins 5 and 14. And the fourth
After the state shown in the figure is obtained, the slide frame 12 is sent forward of the frame body 4 by the operation of the motor M, and the circuit board P is exposed.
The inspection is completed by removing it from the

The continuity circuit to the test equipment during the continuity test described above is formed as follows. When the operating handle 92 is held in the position shown in FIG. 11, the cam 87 assumes the position shown in FIG. As a result, the intermediate connection pin board _b3 is raised as shown in the figure via the lifting plate 80, and the upper end of its connection pin 78 comes into contact with the lower end of the connection pin 74 of the upper connection pin board _b1 . Therefore, the contact probe pins 5 of the upper probe pin board B ₁ are connected to the test equipment via the jumper wire 75, the connection pin 74, the connection pin 78, the conductor connection part 98 (FIG. 13), the conductor pin 97, and the wiring 99. Connected to one terminal.

As mentioned above, the drive cylinder of the lifting drive mechanism
When the circuit board P to be inspected is raised by raising the lifting platform 8 by the operation of C ₂ , the tips of the contact probe pins 5 pointing downward finally come into contact with the upper surface of the circuit board P, and then the circuit board P is raised. The tip of the contact probe pin 14 facing upward comes into contact with the bottom surface of the substrate, but at the same time or slightly later, the upper end of the connection pin 76 of the lower connection pin board b ₂ that has been raised together with the lower probe pin board B ₂ comes into contact with the lower surface of the board. contacts the lower end of the connecting pin 78 of the intermediate connecting pin board _b3 . Therefore, at this moment, the contact probe pin 14 of the lower probe pin board _B2 is connected to the jumper wire 77, the connecting pin 76, and the connecting pin 7.
8. Conductor connection part 98 (Fig. 13), conductor pin 97
and is connected to the other terminal of the inspection equipment via wiring 99. Therefore, a closed circuit connecting the electronic device of the circuit board P and the test equipment is formed, and a continuity test is performed.

As mentioned above, the upper, middle and lower connecting pin boards b ₁ , b ₃ , b ₂ have a predetermined array of through holes;
Connecting pins 74, 78, and 76 are removably inserted and fixed into these through holes. At least some of the connecting pins 78 of the intermediate connecting pin board b ₂ are simultaneously connected to the connecting pins 74 of the upper connecting pin board b ₁ and the connecting pins 76 of the lower connecting pin board b ₂ at the upper and lower ends thereof when the circuit is conductive. can be contacted by. Even if this is done, if one of the matching upper and lower connecting pins 74 and 76 is not connected to the contact probe pins 5 and 14 with jumper wires 75 and 77, the connection to the contact probe pin will be made. No problem occurs because only the pins participate in conduction. On the other hand, the connection pins 74 and 76 of the upper and lower connection pin boards b ₁ and b ₂ may be inserted and arranged so that their positions do not face each other in the vertical direction. In this case,
In the continuity test state, the first group of connecting pins 78 of the middle connecting pin board b ₃ are connected to the upper connecting pin board b ₁
A second group of connecting pins 78 is contacted only by connecting pins 76 of the lower connecting pin board _b2 . In any of the above cases, the first and second groups of connection pins 78 may be the same.

After the continuity test is completed, the elevator platform 8 is lowered to lower the lower probe pin board B ₂ , and the lower connection pin board B ₂ is also lowered accordingly, resulting in the state shown in FIG. Leave.

When the operating handle 92 is rotated upward in FIG. 11, the rack 88 slides to the right in the figure via the gear 91, and the cam 87 also slides to the right, so that the cam driven roller 81 descends from the protrusion 87a of the cam, the elevating plate 80 is allowed to descend, and by the force of the spring 85, the intermediate connecting pin board _b3 is lowered together with the elevating plate 80, and its connecting pin 78 is lowered to the upper connecting pin board _b1. is released from contact with the connecting pin 74. Therefore, when you want to replace the upper probe pin board _B1 with another one, use the positioning pin 16.
After unlocking the lock according to (Fig. 5), the same board B ₁
If it is pulled forward along the step 7a of the strip 7, the rear upper connecting pin board _b1 will also be pulled out together.
At this time, the jumper wire 75 is also pulled out. Then, the new upper probe pin board and the attached upper connection pin board are pushed in as a unit along the step 7a and locked with the positioning pins 16.

The set of the lower probe pin board _B2 and the attached lower connection pin board _B2 can also be replaced after the slide frame 12 is advanced by the motor M and taken out. In this case as well, the lower probe pin board B ₂ , lower connection pin board B ₂ and jumper wire 77 can be replaced as a unit.

In either case, there is no need to route long cords as in the case of conventional devices, and there are no problems such as cord breakage or peeling of solder, and the handling of the pin board is simplified. After replacing the upper and lower pin boards in this way, it is only necessary to adjust the connection of the connecting pin 78 of the intermediate connecting pin board b ₃ to the continuity testing equipment according to the arrangement of the connecting pins that participate in the continuity. .

The continuity pin 97 (FIG. 13) can be connected from the probe pin of the upper and lower probe pin boards B ₁ , B ₂ to the connection pin of the upper and lower connection pin board b ₁ , b ₂ by applying the terminal of the tester to it. This is convenient in that it makes it possible to test the conduction state through the connection pins of the intermediate connection pin board _b3 to the conduction pins 97.

As mentioned above, the upper, lower and intermediate connecting pin boards b ₁ , b ₂ , b ₃ typically have connecting pins inserted through their through holes. This is preferable for maintaining the overall balance of the connection pin boards b ₁ , b ₂ , b ₃ , especially the overall balance of the connection pin boards b ₂ , b ₃ that move up and down.

Activate the drive cylinder _C2 as described above to raise the platform 8 via the piston rod 52, levers 58, 58E and bending links 60, 60E,
The lowering mechanism is preferable in the following respects.

First, as mentioned above, the arms connected to the bending links 60, 60E of the levers 58, 58E are rotated from the horizontal position shown in Figures 3 and 4 to the vertically upward position by the action of the cylinder _C2 . At first, the vertically upward motion component is large, but the upward motion component gradually decreases. Therefore, the circuit board P quickly rises at first, and the contact probe pin 5 of the upper probe pin board _B1
At the moment of contact with the lower end of the plane, the rate of rise decreases considerably. This also applies to the lower probe pin board _B2 . Therefore, even if the operating speed of cylinder C ₂ is increased to shorten the continuity test cycle, the contact between the circuit board and the contact probe pins of probe pin boards B ₁ and B ₂ will be soft contact with less impact. On the other hand, even if a situation occurs in which the pressure in the drive cylinder disappears after the lifting platform 8 has finished rising,
Lever 5 connected to bending links 60, 60E
Since the arms of 8 and 58E are pointing directly upward, no moment is applied to lower the lever, and the platform 8 becomes locked and does not fall. In addition, since the bent links 60 and 60E have a bent shape,
It does not interfere with the shafts 56, 56E when rising.

〔Effect of the invention〕

In the present invention, the circuit board mounting table is elastically placed directly on the lower probe pin board without providing a holding frame independently supported on the guide column to hold the double-sided circuit board to be inspected. This simplifies the structure, reduces the vertical dimensions of the device, lowers costs, requires less push-up force during inspection, and allows contact probe pins to be placed at inspection points on both sides of a double-sided circuit board. Continuity testing can be performed by contacting them at the same time.

[Brief explanation of the drawing]

FIG. 1 is a front view of the double-sided circuit board inspection apparatus of the present invention, FIG. 2 is a plan view of the same, FIG. 3 is a right side view of FIG. 1, and FIG. 4 is a partially cutaway view of the same. Similar drawings, FIG. 5 is a partially vertical front view of the right half of FIG. 1, FIG. 6 is a detailed sectional view of a portion of FIG. 5, and FIG.
The figure is a cross-sectional view of the positioning pin operation cylinder shown in FIG. 6, FIG. 8 is a plan view showing one side of the lifting table of the inspection device of the present invention, and FIG. 9 is a side view of the inspection device of the present invention. 10 is a partially cutaway plan view of
- An X-ray sectional view, FIG. 11 is a partially sectional side view showing the rear structure of the inspection device of the present invention, FIG. 12 is a partially sectional rear view, and FIG. 13 is an intermediate connection pin board and its connection pins. FIG. 1... Support base, 2... Guide post, 5... Contact probe pin, 3... Top plate, 6... Pin board mounting frame, B ₁ ... Upper probe pin board,
B ₂ ...Lower probe pin board, 7...Support stepped strip, 8...Elevating platform, 9...Cylinder, 10...Guide receiver, 11...Guide, 12...Slide for supporting lower pin board Frame, 13... Circuit board mounting stand, 14... Contact probe pin, P... Circuit board, 16... Positioning pin, 23... Bush, 24... Slide pin, 26... Coil spring, 28... Electronic Part, 30...Positioning pin,
C ₁ ... Locating pin operation cylinder, D ₁ , D ₂ ...
Shock absorber, S ₁ , S ₂ ... Switch for detecting slide frame position, M ... Motor for advancing and retracting slide frame, C ₂ ... Drive cylinder of lifting drive mechanism, M
...motor for advancing and retracting the slide frame, 41, 42
...Pulley, 43...Belt, 45...Pinion, 46...Rack, 50...Bracket, 52
...Piston rod, 54...Arm, 56,5
6E... Rotating shaft, 58, 58E... Lever, 6
0,60E...Flexible link, 65...Interlocking link, b ₁ ... Upper connection pin board, b ₂ ... Lower connection pin board, b ₃ ... Intermediate connection pin board, 74,
76, 78... Connection pin, 75, 77... Jumper wire, 80... Lifting plate, 81... Cam driven roller, 83... Sleeve, 84... Guide rod,
85... Spring, 87... Cam, 87a... Cam protrusion, 88... Rack, 90... Rotating shaft, 92
...Operation handle, 97...Conduction pin.

Claims (1)

[Claims] 1. A frame body of an inspection device is provided, which is constructed by installing a plurality of guide columns on a support base and attaching a top plate to the upper part of the guide columns, and the bottom of the top plate has a downwardly facing plate. A horizontal upper probe pin board having contact probe pins is removably attached to the outside of the frame, while an elevator is provided in the lower space of the frame so as to be movable up and down along the guide column. An elevating drive mechanism is provided to raise and lower the elevating platform relative to the upper probe pin board, and on the elevating platform,
A slide frame is slidably supported between a position on the lifting platform and a position protruding outside the frame body, a lower contact probe pin board is horizontally mounted on the slide frame, and a lower contact probe pin board is mounted horizontally on the slide frame, and a lower contact probe pin board is mounted horizontally on the slide frame. A frame-shaped circuit board mounting stand is elastically supported above the lower probe pin board so as to surround the upper ends of these contact probe pins, and the circuit board mounting stand is attached to the upper surface of the lower probe pin board. having a surface supporting a double-sided circuit board to be inspected;
The bottom surface of the circuit board supported on the circuit board mounting table should normally be slightly away from the top of the lower contact probe pins, and when the lifting platform is raised, the top surface of the circuit board should first touch the contact probe pins of the upper probe pin board. The lower surface of the circuit board contacts the contact probe pins of the lower probe pin board by pressing down the circuit board mounting base that is in contact and then being pushed closer to the lower probe pin board. A double-sided circuit board inspection device characterized by: 2. The double-sided circuit board inspection apparatus according to claim 1, wherein the elevating drive mechanism includes a link mechanism that connects the top plate and the elevating table, and a rotation drive mechanism that rotates one link of the link mechanism. 3. The double-sided circuit board inspection apparatus according to claim 1, wherein the slide frame has a rack on a side surface, and a drive pinion is engaged with the rack to drive the rack.