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JPH057662B2 - - Google Patents
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JPH057662B2 - - Google Patents

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Publication number
JPH057662B2
JPH057662B2 JP62007850A JP785087A JPH057662B2 JP H057662 B2 JPH057662 B2 JP H057662B2 JP 62007850 A JP62007850 A JP 62007850A JP 785087 A JP785087 A JP 785087A JP H057662 B2 JPH057662 B2 JP H057662B2
Authority
JP
Japan
Prior art keywords
insulation
capacitance
rate
insulation deterioration
constant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62007850A
Other languages
Japanese (ja)
Other versions
JPS63175776A (en
Inventor
Hiroto Okitsu
Shigeo Ishida
Osamu Pponda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
Nippon Kokan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Kokan Ltd filed Critical Nippon Kokan Ltd
Priority to JP785087A priority Critical patent/JPS63175776A/en
Publication of JPS63175776A publication Critical patent/JPS63175776A/en
Publication of JPH057662B2 publication Critical patent/JPH057662B2/ja
Granted legal-status Critical Current

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  • Testing Relating To Insulation (AREA)

Description

【発明の詳細な説明】 (産業上と利用分野) 本発明は、高炉の主ブロアーのほか、各機械設
備、各電気装置等の駆動源となる高圧電気機器の
絶縁状態を診断する方法および装置に係わり、特
に絶縁診断のグレードアツプを図る電気機器の絶
縁診断方法およびその診断装置に関する。
Detailed Description of the Invention (Industrial and Field of Application) The present invention provides a method and apparatus for diagnosing the insulation state of high-voltage electrical equipment that serves as a drive source for the main blower of a blast furnace, as well as various mechanical equipment and electrical devices. In particular, the present invention relates to an insulation diagnostic method for electrical equipment and a diagnostic device for improving insulation diagnostics.

(従来の技術) 一般に、生産ラインに係わる高圧電気機器が絶
縁劣化等の巻線故障により機能停止した場合、上
記生産ラインは長期にわたつて運転停止となり、
多大な損害を被る恐れがある。従つて、寿命期に
差しかかつた絶縁劣化の進んだ高圧電気機器の場
合には早期に新しい機器と交換することが望まし
いが、機器の交換には膨大な費用がかかる。ここ
に、絶縁劣化度について適切、かつ、高精度に診
断し、その絶縁劣化度に応じた最適な処置例えば
ワニス処理、巻替あるいは新品との交換等を行な
い、経済性を高めることが必要になつてくる。
(Prior art) Generally, when high-voltage electrical equipment related to a production line stops functioning due to winding failure such as deterioration of insulation, the production line will be out of operation for a long period of time.
There is a risk of significant damage. Therefore, in the case of high-voltage electrical equipment with advanced insulation deterioration that is nearing the end of its lifespan, it is desirable to replace it with a new equipment as soon as possible, but replacing the equipment costs an enormous amount of money. Therefore, it is necessary to appropriately and accurately diagnose the degree of insulation deterioration and take optimal measures according to the degree of insulation deterioration, such as varnishing, rewinding, or replacing with a new one, to improve economic efficiency. I'm getting old.

そこで、従来、かかる観点から幾つかの診断手
段、つまり直流試験法、誘電正接試験法、交流電
流試験法およびコロナ試験法等が採用され、高圧
電気機器の吸湿劣化またはボイド劣化等から絶縁
劣化度を診断している。
Therefore, conventionally, several diagnostic methods have been adopted from this point of view, such as the DC test method, dielectric loss tangent test method, AC current test method, and corona test method. is being diagnosed.

前記直流試験法は、直流高電圧試験器によつて
測定された絶縁抵抗値から成極指数PI:{PI=
(直流通電開始時から10分後の絶縁抵抗値)/
(直流通電開始時から1分後の絶縁抵抗値)}を求
め、この成極指数PIに基づいて吸湿劣化のみを
診断するもので、吸湿劣化が生じると成極指数
PIは小さくなる。
The DC test method calculates the polarization index PI: {PI=
(Insulation resistance value 10 minutes after starting DC current) /
(Insulation resistance value 1 minute after the start of DC current flow)} is determined, and only moisture absorption deterioration is diagnosed based on this polarization index PI.If moisture absorption deterioration occurs, the polarization index
PI becomes smaller.

次に、誘電正接試験法は、印加される交流電圧
と誘電正接tanδとの関係から吸湿劣化およびボイ
ド劣化を診断するもので、吸湿劣化が生じると電
圧印加時にtanδが大きくなり、ボイド劣化が生じ
ると所定の印加電圧にてtanδは小さくなる。
Next, the dielectric loss tangent test method diagnoses moisture absorption deterioration and void deterioration from the relationship between the applied AC voltage and dielectric loss tangent tan δ. When moisture absorption deterioration occurs, tan δ increases when voltage is applied, causing void deterioration. At a predetermined applied voltage, tan δ becomes small.

前記交流試験法は、印加される交流電圧と検出
される電流の大きさとの関係から絶縁性を診断す
るもので、ボイド劣化が生じるとコロナ放電によ
り電流量の上昇曲線の傾きが変化して急増する。
The AC test method diagnoses insulation from the relationship between the applied AC voltage and the magnitude of the detected current.When void deterioration occurs, the slope of the current increase curve changes due to corona discharge, causing a sudden increase. do.

前記コロナ試験法は、印加される交流電圧と最
大放電電荷量Qmaxまたは総電荷量Qoとの関係
から絶縁性を診断するもで、ボイド劣化が生じる
と最大放電電荷量Qmaxはまた総電荷量Qoが大
きくなる。
The corona test method diagnoses the insulation property from the relationship between the applied AC voltage and the maximum discharge charge Qmax or the total charge Qo. When void deterioration occurs, the maximum discharge charge Qmax also becomes the total charge Qo. becomes larger.

(発明が解決しようとする問題点) しかし、以上の4つの試験法は、何れも大がか
りな測定設備を必要とし、かつ、測定に長時間を
必要とする上、費用も膨大なものとなる。しか
も、測定装置としての簡便さに欠け、その診断結
果の信頼性に乏しい等の問題があつた。
(Problems to be Solved by the Invention) However, all of the above four test methods require large-scale measurement equipment, require a long time for measurement, and are extremely expensive. Furthermore, there were problems such as lack of simplicity as a measuring device and poor reliability of the diagnostic results.

本発明は上記実情に鑑みてなされたもので、電
気機器の絶縁劣化度を簡便、かつ、高精度に診断
し得、電気機器の機能停止による生産ラインの長
期運転の停止を未然に回避し得、絶縁劣化度に応
じた適切な保全により経済性を高め得る電気機器
の絶縁診断方法およびその診断装置を提供するこ
とを目的とする。
The present invention has been made in view of the above circumstances, and it is possible to easily and highly accurately diagnose the degree of insulation deterioration of electrical equipment, and to avoid long-term suspension of production line operation due to malfunction of electrical equipment. An object of the present invention is to provide an insulation diagnosis method for electrical equipment and a diagnostic device thereof, which can improve economic efficiency through appropriate maintenance according to the degree of insulation deterioration.

(問題点を解決するための手段) 本発明による電気機器の絶縁診断方法は、電気
機器の漏れ電流をセンサーで検出し、このセンサ
ーの出力信号から高周波ブリツジを持つ絶縁定数
演算回路を用いて静電容量および誘電損失率を求
めた後、その静電容量の増加率とこの静電容量の
増加率、前記誘電損失率から得られる絶縁劣化定
数とを得、これらの静電容量の増加率および絶縁
劣化定数について絶縁劣化度を表す判定基準値と
個別に比較して相関的な診断結果から良否判定を
行い、または過去の絶縁破壊統計データと前記静
電容量の増加率、前記誘電損失率、前記絶縁劣化
定数とに基づいて絶縁破壊危険率を求める方法で
ある。
(Means for Solving the Problems) The insulation diagnosis method for electrical equipment according to the present invention detects the leakage current of the electrical equipment with a sensor, and uses the output signal of this sensor to conduct a static test using an insulation constant calculation circuit having a high frequency bridge. After determining the capacitance and dielectric loss factor, obtain the capacitance increase rate, this capacitance increase rate, and the insulation deterioration constant obtained from the dielectric loss factor, and calculate these capacitance increase rate and The insulation deterioration constant is individually compared with a criterion value representing the degree of insulation deterioration, and a pass/fail judgment is made based on the correlated diagnosis results, or past insulation breakdown statistical data, the increase rate of capacitance, the dielectric loss rate, This is a method of determining the dielectric breakdown risk rate based on the insulation deterioration constant.

また、他のもう1つの発明である電気機器の絶
縁診断装置は、電気機器の漏れ電流を検出するセ
ンサーと、このセンサーで検出された漏れ電流信
号から静電容量および誘電損失率を求める絶縁定
数演算手段と、この絶縁定数演算手段から出力さ
れた静電容量、誘電損失率から静電容量増加率お
よび絶縁劣化定数を求める絶縁劣化定数演算手段
と、この絶縁劣化定数演算手段によつて求めた静
電容量増加率および絶縁劣化定数について絶縁劣
化度を表す判定基準値と個別に比較して相関的な
診断結果から良否判定を行い、または絶縁破壊統
計データと前記静電容量の増加率、前記誘電損失
率、前記絶縁劣化定数とに基づいて絶縁破壊危険
率を求めることにより、電気機器の絶縁劣化状態
を診断する手段とを備えたものである。
Another invention, an insulation diagnostic device for electrical equipment, includes a sensor that detects leakage current in electrical equipment, and an insulation constant that determines capacitance and dielectric loss rate from the leakage current signal detected by the sensor. an insulation deterioration constant calculation means for calculating a capacitance increase rate and an insulation deterioration constant from the capacitance and dielectric loss factor outputted from the insulation constant calculation means; The rate of capacitance increase and the insulation deterioration constant are individually compared with a criterion value representing the degree of insulation deterioration, and a pass/fail judgment is made based on the correlated diagnostic results, or the statistical data of dielectric breakdown and the rate of increase in capacitance, the rate of increase in capacitance, and the The present invention includes means for diagnosing the insulation deterioration state of an electrical device by determining a dielectric breakdown risk factor based on the dielectric loss factor and the insulation deterioration constant.

(作用) 従つて、本発明方法は以上のような手段とする
ことにより、電気機器の漏れ電流をセンサーで検
出した後、このセンサーの出力から絶縁定数とな
る静電容量、誘電損失率を求める。そして、ここ
で得られた静電容量と当該静電容量の初期値とか
ら静電容量の増加率を求める一方、この静電容量
の増加率および誘電損失率とこれらの各初期値と
を用いて絶縁劣化定数を求める。さらに、これら
静電容量増加率と絶縁劣化定数を、それぞれ判定
基準値と個別に比較して良否を判断し、或いは過
去の絶縁破壊統計データと前記静電容量の増加
率、前記誘電損失率、前記絶縁劣化定数とに基づ
いて絶縁破壊危険率を求めることにある。
(Function) Therefore, by using the above-described means, the method of the present invention detects the leakage current of electrical equipment with a sensor, and then calculates the capacitance and dielectric loss factor, which are insulation constants, from the output of this sensor. . Then, while calculating the capacitance increase rate from the capacitance obtained here and the initial value of the capacitance, using this capacitance increase rate, dielectric loss factor, and each of these initial values, Find the insulation deterioration constant. Furthermore, these capacitance increase rate and insulation deterioration constant are individually compared with judgment reference values to determine pass/fail, or past insulation breakdown statistical data, the capacitance increase rate, the dielectric loss rate, The objective is to obtain a dielectric breakdown risk rate based on the insulation deterioration constant.

次に、本発明装置は、以上のような手段とする
ことにより、電気機器の漏れ電流を検出するセン
サーから検出信号を絶縁定数演算手段により静電
容量および誘電損失率などの絶縁定数を求めた
後、この静電容量とその初期値とから静電容量の
増加率を求め、さらに静電容量の増加率および静
電損失率とそれらの初期値とを用いて絶縁劣化定
数を求める。しかる後、この絶縁劣化定数演算手
段によつて求めた静電容量増加率および絶縁劣化
定数について個別に判定基準値を用いて良否判定
を行い、または絶縁破壊統計データと前記静電容
量の増加率、前記誘電損失率、前記絶縁劣化定数
とに基づいて絶縁破壊危険率を求めることによ
り、電気機器の絶縁劣化状態を診断するものであ
る。
Next, by using the above-described means, the device of the present invention calculates insulation constants such as capacitance and dielectric loss factor using the insulation constant calculation means using the detection signal from the sensor that detects the leakage current of the electrical equipment. Thereafter, the rate of increase in capacitance is determined from this capacitance and its initial value, and the insulation deterioration constant is determined using the rate of increase in capacitance, the rate of capacitance loss, and their initial values. Thereafter, the capacitance increase rate and the insulation deterioration constant obtained by this insulation deterioration constant calculation means are individually judged to be good or bad using the determination reference value, or the insulation breakdown statistical data and the capacitance increase rate are evaluated. The insulation deterioration state of the electrical equipment is diagnosed by determining the dielectric breakdown risk factor based on the dielectric loss factor and the insulation deterioration constant.

(実施例) 以下、本発明による電気機器の絶縁診断方法お
よびその診断装置の一実施例について第1図ない
し第3図を参照して説明する。第1図は本発明の
全体構成を概略的に示す図である。この図におい
て11は診断対象となる電気機器の導電部と対地
間との間に所定の電圧を印加する電源部であつ
て、この電源部11から所定の電圧が電気機器に
印加されているときにセンサー12で漏れ電流を
検出する。このセンサー12で検出された漏れ電
流信号Ioは絶縁定数演算手段13に送られる。こ
の絶縁定数演算手段13は、例えば高周波ブリツ
ジとしての逆シエーリングブリツジ等が用いら
れ、前記漏れ電流信号Ioの変化から電気機器の対
地絶縁物の静電容量Cxおよび誘電損失率Txを演
算により求める。この絶縁定数演算手段13で求
めた静電容量Cxおよび誘電損失率Txは絶縁劣化
定数演算手段14に送られる。この絶縁劣化定数
演算手段14には予め諸定数入力回路15から診
断対象電気機器の絶縁構成を反映した固有の演算
定数が入力されている。例えば静電容量および誘
電損失率の初期値C、Tが明らかな場合、それら
の初期値C、Tのほか、定数kが入力され、初期
値C、Tが不明な場合には電気機器の定格電圧、
定格容量、極数および形式等から推定される経験
値が入力されている。
(Embodiment) Hereinafter, an embodiment of the method of diagnosing insulation of electrical equipment and the apparatus for diagnosing the same according to the present invention will be described with reference to FIGS. 1 to 3. FIG. 1 is a diagram schematically showing the overall configuration of the present invention. In this figure, reference numeral 11 denotes a power supply unit that applies a predetermined voltage between the conductive part of the electrical equipment to be diagnosed and ground, and when the predetermined voltage is applied from this power supply unit 11 to the electrical equipment, The sensor 12 detects leakage current. The leakage current signal Io detected by this sensor 12 is sent to insulation constant calculation means 13. This insulation constant calculation means 13 uses, for example, a reverse shearing bridge as a high frequency bridge, and calculates the capacitance Cx and dielectric loss factor Tx of the ground insulator of the electrical equipment from the change in the leakage current signal Io. . The capacitance Cx and dielectric loss factor Tx determined by the insulation constant calculation means 13 are sent to the insulation deterioration constant calculation means 14. Unique calculation constants reflecting the insulation configuration of the electrical equipment to be diagnosed are input in advance to the insulation deterioration constant calculation means 14 from the various constant input circuit 15. For example, if the initial values C and T of the capacitance and dielectric loss factor are known, the constant k is input in addition to those initial values C and T, and if the initial values C and T are unknown, the rating of the electrical equipment is input. Voltage,
Empirical values estimated from rated capacity, number of poles, type, etc. are input.

そこで、絶縁劣化定数演算手段14では絶縁定
数演算手段13からの静電容量Cxおよび誘電損
失率Txおよび諸定数力回路15からの演算定数
を用いて次のような演算式に基づいて絶縁劣化定
数を求める。すなわち、絶縁劣化定数の1つであ
る静電容量の増加率をC0とすると、 C0=Cx/C ……(1) の式により求め、また誘電損失率を用いた絶縁劣
化定数をIdとすると、 Id=√C0 2+(kTx2 ……(2) の式により求める。
Therefore, the insulation deterioration constant calculation means 14 uses the capacitance Cx and dielectric loss factor Tx from the insulation constant calculation means 13 and the calculation constants from the various constant force circuit 15 to calculate the insulation deterioration constant based on the following calculation formula. seek. In other words, if the rate of increase in capacitance, which is one of the insulation deterioration constants, is C 0 , it is calculated by the formula C 0 = Cx/C... (1), and the insulation deterioration constant using the dielectric loss rate is Id. Then, Id=√ C 0 2 + (kT x ) 2 ...calculated using the formula (2).

そして、以上のようにして得られた静電容量増
加率C0、誘電損失率を用いた絶縁劣化定数Idは良
否判定回路16に送られ、ここでそれぞれに絶縁
劣化度を表わす複数の判定基準値と比較され、例
えば良か、注意か、不良か等について判断し、そ
の診断結果をプリンタ、記録装置、CRデイスプ
レイ等の表示部17に表示する。また、静電容量
Cx、誘電損失率Tx、静電容量増加率C0、誘電損
失率を用いた絶縁劣化定数Idはプリンタ、記録装
置、CRTデイスプレイ等の表示部18に表示す
る。これらの表示部17,18は同一の表示手段
を用いて表示させてもよいものである。
Then, the capacitance increase rate C 0 and the insulation deterioration constant Id using the dielectric loss factor obtained as described above are sent to the pass/fail judgment circuit 16, where a plurality of judgment criteria each representing the degree of insulation deterioration are used. It is compared with the value and judged as to whether it is good, cautionary, bad, etc., and the diagnosis result is displayed on a display unit 17 such as a printer, a recording device, a CR display, etc. Also, capacitance
Cx, dielectric loss factor Tx, capacitance increase rate C 0 , and insulation deterioration constant Id using dielectric loss factor are displayed on a display unit 18 of a printer, recording device, CRT display, or the like. These display sections 17 and 18 may be displayed using the same display means.

次に、以上のような実施例の構成を用いて高圧
電動機A〜Dの絶縁劣化状況を診断すると、静電
容量増加率C0に関しては第2図のような結果が
得られ、絶縁劣化定数Idに関しては第3図のよう
な結果が得られた。これらの図から明らかなよう
に、各電動機A〜Dとも経過時間(t)に伴つてC0
Idが上昇し、良領域の診断結果から注意領域、不
良領域と漸増し、最終的には絶縁破壊に至つた。
なお、第2図と第3図とを比較すると、第3図の
良否判定法が第2図のそれよりもバラツキが小さ
いばかりか、これら両者の相関的な診断結果から
良否を高精度に判定できる。
Next, when the insulation deterioration status of high-voltage motors A to D is diagnosed using the configuration of the example described above, the results shown in Figure 2 are obtained regarding the capacitance increase rate C0 , and the insulation deterioration constant Regarding Id, the results shown in Figure 3 were obtained. As is clear from these figures, C 0 ,
Id increased, and the diagnosis result gradually increased from a good area to a caution area to a defective area, and finally led to dielectric breakdown.
Comparing Figure 2 and Figure 3, the pass/fail determination method in Figure 3 not only has less variation than the one in Figure 2, but also allows for highly accurate determination of pass/fail based on the correlated diagnostic results of both. can.

次に、本発明の他の実施例について第4図を参
照して説明する。即ち、この実施例は第1図に示
す良否判定回路16および表示部17に代えて絶
縁破壊危険率を求める破壊確率演算手段21と表
示部22とを設けたものである。つまり、この破
壊確率演算手段21は、過去の絶縁破壊実績デー
タに基づいて、前記絶縁劣化定数演算手段14で
得られた絶縁劣化定数Co,Idおよび絶縁定数演
算手段13で得られた誘電損失率Txと絶縁破壊
累積度数との関係を例えば F(Co)=∫Co pf(C0)dC0 ……(3) F(Tx)=∫Tx pf(Tx)dTx ……(4) F(Id)=∫Id pf(Id)dId ……(5) の式から求めて登録しておき、測定時の絶縁劣化
定数等と比較して絶縁破壊危険率を求めるもので
ある。
Next, another embodiment of the present invention will be described with reference to FIG. That is, in this embodiment, in place of the pass/fail judgment circuit 16 and the display section 17 shown in FIG. 1, a breakdown probability calculation means 21 for determining the dielectric breakdown risk rate and a display section 22 are provided. In other words, this breakdown probability calculation means 21 calculates the insulation deterioration constants Co, Id obtained by the insulation deterioration constant calculation means 14 and the dielectric loss factor obtained by the insulation constant calculation means 13 based on past insulation breakdown performance data. For example, the relationship between Tx and the cumulative frequency of dielectric breakdown is as follows: F(Co)=∫ Co p f(C 0 ) dC 0 ……(3) F(Tx)=∫ Tx p f(Tx) dTx ……(4) F (Id) = ∫ Id p f (Id) dId It is calculated from the formula (5) and registered, and compared with the insulation deterioration constant etc. during measurement to determine the dielectric breakdown risk rate.

因みに、この実施例に基づいて診断した結果を
第5図に示す。この図から明らかなように、C0
=1.5以下の良領域では絶縁破壊確率は10%以下、
C0=1.5〜2.0の注意領域では絶縁破壊確率は10〜
20%、C0=2以上の不良領域では絶縁破壊確率
は20%以上となる。この方法によれば、第1図に
示す判定結果つまり良、注意、不良の3段階より
もつときめ細かく診断することができる。
Incidentally, the results of diagnosis based on this example are shown in FIG. As is clear from this figure, C 0
In the good range of =1.5 or less, the probability of dielectric breakdown is less than 10%,
In the caution region of C 0 = 1.5 to 2.0, the dielectric breakdown probability is 10 to
20%, and in a defective region of C 0 =2 or more, the probability of dielectric breakdown is 20% or more. According to this method, a more detailed diagnosis can be made than the judgment result shown in FIG. 1, that is, the three stages of OK, Caution, and Failure.

なお、本発明は上記実施例に限定されずに種々
変形して実施できる。
Note that the present invention is not limited to the above embodiments, and can be implemented with various modifications.

(発明の効果) 以上説明したように本発明方法によれば、静電
容量の増加率だけでなく、この静電容量の増加
率、前記誘電損失率から得られる絶縁劣化定数に
ついて絶縁劣化度を表す判定基準値とそれぞれ比
較するので、例えば第2図、第3図に示すように
2通りの診断結果が得られ、これら2つの相関的
な診断結果から電気機器の絶縁劣化状態を高精度
に判定できる。
(Effects of the Invention) As explained above, according to the method of the present invention, the degree of insulation deterioration is determined not only by the rate of increase in capacitance but also by the rate of increase in capacitance and the insulation deterioration constant obtained from the dielectric loss factor. Since each comparison is made with the indicated judgment reference value, two types of diagnostic results can be obtained, for example, as shown in Figures 2 and 3. From these two correlated diagnostic results, the insulation deterioration state of electrical equipment can be determined with high accuracy. Can be judged.

また、過去の絶縁破壊統計データと静電容量の
増加率、前記誘電損失率、前記絶縁劣化定数とに
基づいて絶縁破壊危険率を求めるようにすれば、
どの程度で破壊するかその破壊確率を容易に把握
できる。従つて、これらの診断結果から生産ライ
ンの長期停止を回避でき、良否判定または絶縁破
壊危険率に応じて適切な保全を行つて経済性を高
めることができる電気機器の絶縁診断方法を提供
できる。
Furthermore, if the dielectric breakdown risk rate is calculated based on past dielectric breakdown statistical data, the capacitance increase rate, the dielectric loss factor, and the insulation deterioration constant,
It is possible to easily grasp the degree of destruction and the probability of destruction. Therefore, it is possible to provide a method for diagnosing the insulation of electrical equipment, which can avoid long-term suspension of the production line based on these diagnostic results, and can improve economic efficiency by performing appropriate maintenance according to pass/fail judgment or dielectric breakdown risk rate.

また、本発明装置によれば、電気機器の絶縁劣
化度を簡単、かつ、高精度に診断できるばかりで
なく、電源電圧として数ボルトから数キロボルト
のどの範囲で測定しても診断可能なデータが得ら
れるので、低電圧、小形の装置を実現でき、これ
によつて安全、かつ、簡便に絶縁劣化度を診断で
きる。このことは、電気機器が絶縁劣化により機
能停止に至る以前に簡便、かつ、高精度で診断結
果が得られるので、生産ラインの長期停止を阻止
でき、絶縁劣化度に応じて適切に処置を講じるこ
とができる。
Furthermore, according to the device of the present invention, not only can the degree of insulation deterioration of electrical equipment be diagnosed easily and with high precision, but also data that can be diagnosed regardless of the range of the power supply voltage from several volts to several kilovolts can be obtained. As a result, a low-voltage, small-sized device can be realized, and the degree of insulation deterioration can be diagnosed safely and easily. This makes it possible to easily and accurately obtain diagnostic results before electrical equipment stops functioning due to insulation deterioration, which prevents long-term production line shutdowns and allows appropriate measures to be taken depending on the degree of insulation deterioration. be able to.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図ないし第3図は本発明に係わる絶縁診断
方法およびその診断装置の一実施例を説明するた
めに示したもので、第1図はその一実施例として
の概略構成図、第2図および第3図はそれぞれ本
実施例による絶縁劣化度の診断結果を説明する
図、第4図および第5図は本発明の他の実施例を
説明するために示したもので、第4図は当該他の
実施例の概略構成図、第5図は当該実施例による
絶縁劣化度の診断結果を説明する図である。 11……電源部、12……センサー、13……
絶縁定数演算手段、14……絶縁劣化定数演算手
段、15……諸定数入力回路、16……良否判定
回路、17,18……表示部、21……破壊確率
演算手段、22……表示部。
1 to 3 are shown to explain an embodiment of the insulation diagnosis method and its diagnostic device according to the present invention, and FIG. 1 is a schematic configuration diagram of the embodiment, and FIG. and FIG. 3 are diagrams for explaining the diagnosis results of the degree of insulation deterioration according to this embodiment, respectively, and FIGS. 4 and 5 are diagrams for explaining other embodiments of the present invention. FIG. 5, which is a schematic configuration diagram of this other embodiment, is a diagram for explaining the diagnosis result of the degree of insulation deterioration according to this embodiment. 11...Power supply section, 12...Sensor, 13...
Insulation constant calculation means, 14...Insulation deterioration constant calculation means, 15...Various constant input circuit, 16...Quality determination circuit, 17, 18...Display section, 21...Destruction probability calculation means, 22...Display section .

Claims (1)

【特許請求の範囲】 1 電気機器の漏れ電流をセンサーで検出し、こ
のセンサーの出力信号から高周波ブリツジを持つ
絶縁定数演算回路を用いて静電容量および誘電損
失率を求めた後、この静電容量の増加率とこの静
電容量の増加率、前記誘電損失率から得られる絶
縁劣化定数とを得、これらの静電容量の増加率お
よび絶縁劣化定数について絶縁劣化度を表す判定
基準値と個別に比較して相関的な診断結果から良
否判定を行い、または過去の絶縁破壊統計データ
と前記静電容量の増加率、前記誘電損失率、前記
絶縁劣化定数とに基づいて絶縁破壊危険率を求め
ることを特徴とする電気機器の絶縁診断方法。 2 電気機器の漏れ電流を検出するセンサーと、 このセンサーで検出された漏れ電流信号から静
電容量および誘電損失率を求める絶縁定数演算手
段と、 この絶縁定数演算手段から出力された静電容
量、誘電損失率から静電容量増加率および絶縁劣
化定数を求める絶縁劣化定数演算手段と、 この絶縁劣化定数演算手段によつて求めた静電
容量増加および絶縁劣化定数について絶縁劣化度
を表す判定基準値と個別に比較して相関的な診断
結果から良否判定を行い、または絶縁破壊統計デ
ータと前記静電容量の増加率、前記誘電損失率、
前記絶縁劣化定数とに基づいて絶縁破壊危険率を
求めることにより、電気機器の絶縁劣化状態を診
断する手段と、 を備えたことを特徴とする電気機器の絶縁診断装
置。
[Claims] 1. After detecting the leakage current of an electrical device with a sensor and calculating the capacitance and dielectric loss factor from the output signal of this sensor using an insulation constant calculation circuit with a high frequency bridge, Obtain the rate of increase in capacitance, the rate of increase in capacitance, and the insulation deterioration constant obtained from the dielectric loss factor, and individually calculate the rate of increase in capacitance and the insulation deterioration constant to a criterion value representing the degree of insulation deterioration. A pass/fail judgment is made based on the correlated diagnostic results compared to the above, or a dielectric breakdown risk rate is determined based on past dielectric breakdown statistical data, the capacitance increase rate, the dielectric loss rate, and the insulation deterioration constant. A method for diagnosing insulation of electrical equipment, characterized by: 2. A sensor for detecting leakage current of electrical equipment; an insulation constant calculation means for calculating capacitance and dielectric loss rate from the leakage current signal detected by the sensor; and a capacitance output from the insulation constant calculation means; An insulation deterioration constant calculation means for calculating a capacitance increase rate and an insulation deterioration constant from a dielectric loss factor, and a judgment reference value representing the degree of insulation deterioration for the capacitance increase and insulation deterioration constant calculated by the insulation deterioration constant calculation means. The pass/fail judgment is made based on the correlated diagnostic results by individually comparing the data, or the dielectric breakdown statistical data and the increase rate of the capacitance, the dielectric loss rate,
An insulation diagnostic device for electrical equipment, comprising: means for diagnosing an insulation deterioration state of the electrical equipment by determining a dielectric breakdown risk rate based on the insulation deterioration constant.
JP785087A 1987-01-16 1987-01-16 Insulation diagnosis method and device for electrical equipment Granted JPS63175776A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP785087A JPS63175776A (en) 1987-01-16 1987-01-16 Insulation diagnosis method and device for electrical equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP785087A JPS63175776A (en) 1987-01-16 1987-01-16 Insulation diagnosis method and device for electrical equipment

Publications (2)

Publication Number Publication Date
JPS63175776A JPS63175776A (en) 1988-07-20
JPH057662B2 true JPH057662B2 (en) 1993-01-29

Family

ID=11677098

Family Applications (1)

Application Number Title Priority Date Filing Date
JP785087A Granted JPS63175776A (en) 1987-01-16 1987-01-16 Insulation diagnosis method and device for electrical equipment

Country Status (1)

Country Link
JP (1) JPS63175776A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR19980069423A (en) * 1997-02-28 1998-10-26 이대원 Electrical Equipment Fault Diagnosis Device Using Frequency Characteristics and Its Method
JP4506959B2 (en) * 2004-03-16 2010-07-21 株式会社中条エンジニアリング Insulation monitoring device

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57151872A (en) * 1981-03-14 1982-09-20 Toshiba Corp Device for diagnosing insulation

Also Published As

Publication number Publication date
JPS63175776A (en) 1988-07-20

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