JPH058154B2 - - Google Patents
Info
- Publication number
- JPH058154B2 JPH058154B2 JP11925387A JP11925387A JPH058154B2 JP H058154 B2 JPH058154 B2 JP H058154B2 JP 11925387 A JP11925387 A JP 11925387A JP 11925387 A JP11925387 A JP 11925387A JP H058154 B2 JPH058154 B2 JP H058154B2
- Authority
- JP
- Japan
- Prior art keywords
- growth
- substrate
- solution
- temperature
- epitaxial growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 claims description 30
- 238000000034 method Methods 0.000 claims description 11
- 239000007791 liquid phase Substances 0.000 claims description 5
- 238000003860 storage Methods 0.000 description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は液相エピタキシヤル成長方法、特にデ
イツピング法に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a liquid phase epitaxial growth method, particularly a dipping method.
[従来の技術]
液相エピタキシヤル法のうち、量産性のある方
法としてはGaPのエピタキシヤル成長において広
く用いられているデイツピング法が一般的であ
る。この方法は第2図に示すようにエピタキシヤ
ル成長炉内で基板1を縦に配列し、成長用溶液2
を、基板1をセツトした基板ホルダー3に上部よ
り落下するか(第3図参照)、又は下部より押し
上げる(第4図参照)等の方法により基板1と成
長用溶液2を接触させ成長を行うものである。[Prior Art] Among the liquid phase epitaxial methods, the dipping method, which is widely used in the epitaxial growth of GaP, is generally used as a method that is suitable for mass production. In this method, as shown in Fig. 2, the substrates 1 are arranged vertically in an epitaxial growth furnace, and a growth solution 2 is placed in the epitaxial growth furnace.
Growth is performed by bringing the substrate 1 into contact with the growth solution 2 by dropping the substrate 1 onto the substrate holder 3 on which the substrate 1 is set from above (see Figure 3) or pushing it up from the bottom (see Figure 4). It is something.
[発明が解決しようとする問題点]
しかしながら、従来技術では第2図に示したよ
うに、基板ホルダー3内に基板1を2枚ずつ対面
させた形でセツトし、炉内温度を均一にして成長
させているため、成長用溶液2が双方の基板1に
同じ膜厚で成長してしまい、その結果十分に厚く
成長しないという問題があつた。[Problems to be Solved by the Invention] However, in the prior art, as shown in FIG. 2, two substrates 1 are set in the substrate holder 3 so as to face each other, and the temperature inside the furnace is made uniform. Due to this, the growth solution 2 grows to the same thickness on both substrates 1, resulting in a problem that the film does not grow sufficiently thick.
本発明はかかる事情に鑑みてなされたものであ
つて、その目的とするところは前記した従来技術
の欠点を解消し、多数枚の基板に対して膜厚の厚
いエピタキシヤル層の成長を可能にする方法を提
供するとこにある。 The present invention has been made in view of the above circumstances, and its purpose is to eliminate the drawbacks of the prior art described above and to enable the growth of thick epitaxial layers on a large number of substrates. We are here to provide you with a method to do so.
[問題点を解決するための手段]
本発明の要旨は、エピタキシヤル成長炉内で基
板を縦に配列し、成長用溶液と基板を接触させて
成長を行う方法において、成長用溶液側の温度よ
りも基板側の温度が低い温度勾配を設けることを
特徴とする液相エピタキシヤル成長方法にある。[Means for Solving the Problems] The gist of the present invention is to provide a method in which growth is performed by vertically arranging substrates in an epitaxial growth furnace and bringing the substrates into contact with a growth solution, in which the temperature on the growth solution side is The liquid phase epitaxial growth method is characterized by providing a temperature gradient in which the temperature on the substrate side is lower than that on the substrate side.
[作用]
成長用溶液に基板側が温度が低い温度勾配を設
けたことにより、成長用溶液中の溶媒が基板上に
移送され、成長に有効に利用される。[Function] By providing the growth solution with a temperature gradient where the temperature is lower on the substrate side, the solvent in the growth solution is transferred onto the substrate and is effectively used for growth.
[実施例]
以下本発明の一実施例を図面に基づいて説明す
る。第1図は本発明の成長方法を示す説明図であ
つて、成長前に成長用溶液2を入れておく溶液ホ
ルダー4及び基板1を縦にセツトするための基板
ホルダー3と、成長終了後に成長用溶液2を受け
るための溶液収容部5と成長用溶液2と基板ホル
ダー3とを分離するためのシヤツター7と、基板
ホルダー3から成長用溶液2を分離するためのシ
ヤツター6とから構成されている。尚、本発明に
おいて、多数枚成長を行う場合は、夫々の基板1
の成長面を同一方向を向かせて配列することが望
ましい。[Example] An example of the present invention will be described below based on the drawings. FIG. 1 is an explanatory diagram showing the growth method of the present invention, and shows a solution holder 4 in which a growth solution 2 is placed before growth, a substrate holder 3 for vertically setting a substrate 1, and a growth method shown in FIG. It consists of a solution storage part 5 for receiving the growth solution 2, a shutter 7 for separating the growth solution 2 and the substrate holder 3, and a shutter 6 for separating the growth solution 2 from the substrate holder 3. There is. In the present invention, when growing a large number of substrates, each substrate 1
It is desirable to arrange the growth surfaces of the two in the same direction.
上記の成長治具を用い、Ga1-XAlXAs高混晶
(X=0.65)のエピタキシヤル成長を行つた。上
部の溶液ホルダー4にはGa500g、GaAs42g及
びAl3.3gを入れ、基板ホルダー3には寸法50mm
×45mmの基板1を1枚ずつ4箇所にセツトした。
この状態で水平型エピタキシヤル成長炉内にセツ
トし、水素ガス置換後950℃まで昇温した、Ga中
でGaAsとAlが飽和状態まで溶けた時点でシヤツ
ター6を開き、成長用溶液2を基板ホルダー3内
部に落した後、基板ホルダー3の左側に配設した
ヒーター(図示せず)を1℃/minの割合で冷却
し、成長用溶液2中に1℃/cmの温度勾配をつけ
た。その後、全体を0.5℃/minの割合で5時間
にわたつて温度を下げた。次いで、シヤツター7
を開き、成長用溶液2を下部の溶液収容部5に落
した。このようにして成長させたエピキシヤルウ
エハの膜厚を調べてみたところ、約250μに成長
していた。 Using the above growth jig, epitaxial growth of Ga 1-X Al X As highly mixed crystal (X=0.65) was performed. Put 500g of Ga, 42g of GaAs, and 3.3g of Al into the upper solution holder 4, and put the size of 50mm into the substrate holder 3.
One board 1 of ×45 mm was set at four locations.
In this state, it was set in a horizontal epitaxial growth furnace, and the temperature was raised to 950°C after hydrogen gas replacement. When GaAs and Al melted to a saturated state in Ga, the shutter 6 was opened and the growth solution 2 was poured onto the substrate. After dropping it into the holder 3, a heater (not shown) placed on the left side of the substrate holder 3 was cooled at a rate of 1°C/min to create a temperature gradient of 1°C/cm in the growth solution 2. . Thereafter, the temperature of the whole was lowered at a rate of 0.5° C./min over 5 hours. Next, shutter 7
was opened, and the growth solution 2 was dropped into the solution storage section 5 at the bottom. When we examined the film thickness of the epiximal wafer grown in this way, we found that it had grown to approximately 250μ.
[発明の効果]
以上説明したように、従来技術の如く均熱温度
分布で成長させた場合には膜厚があまり厚く成長
しなかつたが、成長用溶液に温度勾配を設けたこ
とにより成長用溶液中の溶媒(例えばAsとAl)
が基板上に移送され成長に有効に利用されるた
め、GaAlAsの十分な膜厚成長が可能となつた。[Effect of the invention] As explained above, when the film was grown using a soaked temperature distribution as in the prior art, the film did not grow very thick, but by providing a temperature gradient in the growth solution, the growth Solvents in solution (e.g. As and Al)
Since the GaAlAs is transferred onto the substrate and used effectively for growth, it has become possible to grow GaAlAs to a sufficient thickness.
第1図は本発明の一実施例を示す説明図、第2
図は従来例を示す説明図、第3〜4図は成長治具
の断面図である。
1:基板、2:成長用溶液、3:基板ホルダ
ー、4:溶液ホルダー、5:溶液収容部、6,
7:シヤツター、8:ピストン、9:水平型エピ
タキシヤル成長炉。
FIG. 1 is an explanatory diagram showing one embodiment of the present invention, and FIG.
The figure is an explanatory view showing a conventional example, and Figures 3 and 4 are cross-sectional views of the growth jig. 1: Substrate, 2: Growth solution, 3: Substrate holder, 4: Solution holder, 5: Solution storage section, 6,
7: Shutter, 8: Piston, 9: Horizontal epitaxial growth furnace.
Claims (1)
し、該基板の成長面に成長用溶液を接触させて液
相エピタキシヤル成長を行う方法において、前記
成長用溶液側よりも前記基板側の温度が低い温度
勾配を形成して成長させることを特徴とする液相
エピタキシヤル成長方法。1. In a method of performing liquid phase epitaxial growth by arranging a substrate vertically in an epitaxial growth furnace and bringing a growth solution into contact with the growth surface of the substrate, the temperature on the substrate side is higher than on the growth solution side. A liquid phase epitaxial growth method characterized by growth by forming a low temperature gradient.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11925387A JPS63285190A (en) | 1987-05-15 | 1987-05-15 | Method for liquid epitaxial growth |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11925387A JPS63285190A (en) | 1987-05-15 | 1987-05-15 | Method for liquid epitaxial growth |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63285190A JPS63285190A (en) | 1988-11-22 |
| JPH058154B2 true JPH058154B2 (en) | 1993-02-01 |
Family
ID=14756750
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11925387A Granted JPS63285190A (en) | 1987-05-15 | 1987-05-15 | Method for liquid epitaxial growth |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63285190A (en) |
-
1987
- 1987-05-15 JP JP11925387A patent/JPS63285190A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63285190A (en) | 1988-11-22 |
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