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JPH0583880B2 - - Google Patents
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JPH0583880B2 - - Google Patents

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Publication number
JPH0583880B2
JPH0583880B2 JP9832886A JP9832886A JPH0583880B2 JP H0583880 B2 JPH0583880 B2 JP H0583880B2 JP 9832886 A JP9832886 A JP 9832886A JP 9832886 A JP9832886 A JP 9832886A JP H0583880 B2 JPH0583880 B2 JP H0583880B2
Authority
JP
Japan
Prior art keywords
sample
rays
anticathode
ray
spectroscopic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP9832886A
Other languages
Japanese (ja)
Other versions
JPS62255900A (en
Inventor
Tadashi Uko
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Corp
Original Assignee
Rigaku Industrial Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Industrial Corp filed Critical Rigaku Industrial Corp
Priority to JP9832886A priority Critical patent/JPS62255900A/en
Publication of JPS62255900A publication Critical patent/JPS62255900A/en
Publication of JPH0583880B2 publication Critical patent/JPH0583880B2/ja
Granted legal-status Critical Current

Links

Description

【発明の詳細な説明】 本発明はX線で励起されて発生する光電子のエ
ネルギ分析を行うことによつて、光電子を発生し
た試料の物性を解析するX線光電子分光装置にお
ける試料励起用X線源の構成に関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION The present invention uses X-rays for sample excitation in an X-ray photoelectron spectrometer that analyzes the physical properties of a sample that generates photoelectrons by analyzing the energy of photoelectrons generated when excited by X-rays. It concerns the composition of the source.

X線光電子分光は試料表面20Å程度の範囲にお
ける化合結合状態の観測あるいは元素組成の分析
等に有用であるが、このためにはエネルギ分解能
の高い単色化されたX線を試料に照射しなければ
ならない。そのX線として一般にMg−Ka線
(1253、6eV)、Al−Ka線(1486、6eV)などが
多く用いられ、また後者の分光結晶としては水晶
の1010面(格子定数2d=8.51Å)が用いられてい
る。すなわちこのようなモノクロメータを用いて
試料に照射するX線を単色化することにより、エ
ネルギ分解能を向上することができると共に制動
ふく射によるバツクグラウンドおよびKa3,4など
のサテライト光を除去してS−N比の改善を計る
ことができる。またマグネシウムターゲツトのX
線管とアルミニウムターゲツトのX線管とをもち
いて、これらで得られる光電子スペクトルを比較
することにより、光電子スペクトルとオージエ
(Auger)電子スペクトルとの弁所を行うことも
できる。しかしターゲツトの交換と同時に発生X
線の分光系をも変更しなければならないから、従
来はこれらの交換に極めて煩雑な操作を必要とし
た。従つて本発明はX線光電子分光装置におい
て、複数種の対陰極から発生したX線をそれぞれ
対応する分光系で単色化してX線光電子分光装置
の試料に照射し得ると共にその切換操作を極めて
容易迅速に行うことのできる試料励起用X線源を
提供するものである。
X-ray photoelectron spectroscopy is useful for observing chemical bond states within a range of about 20 Å from the surface of a sample or for analyzing elemental composition, but for this purpose, the sample must be irradiated with monochromatic X-rays with high energy resolution. It won't happen. Generally, Mg-Ka rays (1253, 6eV) and Al-Ka rays (1486, 6eV) are often used as the X-rays, and the 1010 plane of quartz (lattice constant 2d = 8.51Å) is used as the latter spectroscopic crystal. It is used. In other words, by making the X-rays irradiated onto the sample monochromatic using such a monochromator, the energy resolution can be improved, and the background due to bremsstrahlung and satellite light such as Ka 3,4 can be removed to improve S - It is possible to measure the improvement of the N ratio. Also, magnesium target
By comparing the photoelectron spectra obtained using a ray tube and an X-ray tube with an aluminum target, it is also possible to compare the photoelectron spectra and the Auger electron spectra. However, it occurs at the same time as the target is exchanged.
Conventionally, these exchanges required extremely complicated operations because the line spectroscopic system also had to be changed. Therefore, in an X-ray photoelectron spectrometer, the present invention makes it possible to monochromate X-rays generated from multiple types of anticathodes and irradiate the sample of the X-ray photoelectron spectrometer by monochromating the X-rays generated from a plurality of types of anticathodes using the corresponding spectroscopic systems, and the switching operation is extremely easy. An object of the present invention is to provide an X-ray source for sample excitation that can be performed quickly.

すなわち本発明はX線を発生させる励起用電子
線の入射部に複数種の対陰極を交換して任意のも
のを設置し得るようにすると共にその各対陰極に
よつて発生した特性X線をそれぞれ単色化して試
料に入射させるための複数種の湾曲分光結晶を設
けたものである。なおこの複数種の分光結晶は、
それぞれを一定位置に固設することも、また移動
して交換することもできるが、何れにしても上記
交換はこれを真空容器の外部から容易迅速に行い
うるようにする。従つて本発明のX線源を具備し
たX線光電子分光装置は任意の試料について極め
て容易迅速に単色化されたエネルギ分解能の高い
X線を試料に照射すると共に制動ふく射によるバ
ツクグラウンドまたはサテライト光等を除去し、
あるいはオージエ電子スペクトルを弁別し得る等
の作用効果がある。
That is, the present invention makes it possible to install any anticathode by replacing a plurality of types of anticathodes at the entrance part of the excitation electron beam that generates X-rays, and to emit the characteristic X-rays generated by each of the anticathodes. A plurality of types of curved spectroscopic crystals are provided to make each monochromatic light incident on the sample. These multiple types of spectroscopic crystals are
Each can be fixed in place or moved and replaced, but in either case the above replacement can be easily and quickly carried out from outside the vacuum vessel. Therefore, the X-ray photoelectron spectrometer equipped with the X-ray source of the present invention can very easily and quickly irradiate any sample with monochromated X-rays with high energy resolution, and also emit background or satellite light due to bremsstrahlung radiation. remove the
Alternatively, there are effects such as being able to discriminate Auger electron spectra.

第1図は本発明実施例の断面図で、図示してな
いが高真空排気ポンプに連結された真空気密筺体
1の内部に熱電子放射フイラメント2とこれを囲
むウエーネルト電極3を設けて、それらを上記筺
体に固定した碍子4により外部へ導くと共に上記
フイラメントから放出された電子線eを挟んでそ
の両側に紙面と直角な直流磁束を発生する磁極5
を設けてある。従つて電子線eは図のように円弧
状に走行するが、この電子線が入射するように短
い円筒状の回転対陰極6を配置し、その軸7を軸
受8で支持して筺体1の外部に引出してある。対
陰極6は、その本体を例えば銅で作つて、上半分
にアルミニウムの蒸着、スパツタリングあるいは
溶着等を施すことにより銅の対陰極6aとアルミ
ニウムの対陰極6bとを形成してある。また筺体
の外部に引出された軸には伸縮自在なベローズ9
を嵌合して、その両端を筺体1と電動機10の支
持板11とに結着し、筺体1に植設した複数本の
ねじ12を上記支持板に嵌合してその筺体側にナ
ツト13を螺合すると共に上記支持板11には軸
7の貫通部に真空シール14を設けてある。従つ
て図の状態では電子線eが対陰極6aに入射する
が、複数個のナツト13を適宜の連動機構で同時
に回転すると対陰極6が鎖線の位置に移動して、
上記電子線eが対陰極6bに入射するようにな
る。
FIG. 1 is a sectional view of an embodiment of the present invention, in which a thermionic emitting filament 2 and a Wehnelt electrode 3 surrounding it are provided inside a vacuum-tight casing 1 connected to a high-vacuum pump (not shown). is guided to the outside by an insulator 4 fixed to the housing, and magnetic poles 5 generate DC magnetic flux perpendicular to the plane of the paper on both sides of the electron beam e emitted from the filament.
is provided. Therefore, the electron beam e travels in an arc shape as shown in the figure, but a short cylindrical rotating anode cathode 6 is arranged so that the electron beam is incident thereon, and its shaft 7 is supported by a bearing 8 to support the housing 1. It is pulled out outside. The main body of the anticathode 6 is made of copper, for example, and aluminum is deposited, sputtered, or welded on the upper half to form a copper anticathode 6a and an aluminum anticathode 6b. In addition, a telescopic bellows 9 is attached to the shaft pulled out to the outside of the housing.
and connect both ends to the housing 1 and the support plate 11 of the electric motor 10, fit the plurality of screws 12 installed in the housing 1 into the support plate, and tighten the nuts 13 on the housing side. are screwed together, and a vacuum seal 14 is provided in the support plate 11 at the portion through which the shaft 7 passes. Therefore, in the state shown in the figure, the electron beam e is incident on the anticathode 6a, but when a plurality of nuts 13 are simultaneously rotated by an appropriate interlocking mechanism, the anticathode 6 moves to the position shown by the chain line.
The electron beam e becomes incident on the anticathode 6b.

また電子線eが対陰極6aまたは6bに入射し
て発生するX線が入射するように2つの湾曲分光
結晶15aと15bとを設けてある。これらは例
えば弗化リチウムおよびTAP(重フタル酸タリウ
ム)をもつてX線の入射面が凹球面状をなすよう
に形成されている。かつ分光結晶15aは真空シ
ール16によつて筺体1に摺動自在に嵌合した支
柱17の先端に取付けられ、また湾曲分光結晶1
5bは分光結晶15aの縁に取付けた支持板18
の先端に取付けられている。更に筺体1の外側に
は支柱17の駆動機構19を設けてあるから、支
柱17を駆動して上記分光結晶15aおよび15
bを実線または鎖線の位置に移動させることがで
きる。すなはち実線で示した状態では分光結晶1
5aの中心が点pに配置されて対陰極6aから発
生した特性X線が、図に細線で示したように一点
sに集束し、かつこの場合分光結晶15bはその
X線の通路外に配置される。また対陰極および分
光結晶をそれぞれ鎖線の位置に移動させると対陰
極6bから発生した特性X線が点qを中心とする
分光結晶15bによつて同一の点sに集束する。
Further, two curved spectroscopic crystals 15a and 15b are provided so that the X-rays generated when the electron beam e is incident on the anticathode 6a or 6b are incident thereon. These are made of, for example, lithium fluoride and TAP (thallium diphthalate) and are formed so that the X-ray incident surface has a concave spherical shape. Further, the spectroscopic crystal 15a is attached to the tip of a column 17 that is slidably fitted into the housing 1 by a vacuum seal 16, and the spectroscopic crystal 15a
5b is a support plate 18 attached to the edge of the spectroscopic crystal 15a.
is attached to the tip of the Further, since a drive mechanism 19 for the support column 17 is provided outside the housing 1, the support column 17 is driven to move the above-mentioned spectroscopic crystals 15a and 15.
b can be moved to the position of the solid line or the dashed line. In other words, in the state shown by the solid line, the spectroscopic crystal 1
The center of 5a is placed at point p, and the characteristic X-rays generated from anticathode 6a are focused at one point s, as shown by the thin line in the figure, and in this case, the spectroscopic crystal 15b is placed outside the path of the X-rays. be done. Further, when the anticathode and the spectroscopic crystal are moved to the positions indicated by the dashed lines, the characteristic X-rays generated from the anticathode 6b are focused on the same point s by the spectroscopic crystal 15b centered on the point q.

上述のような点sにX線光電子分光装置の試料
20を配置するようにしてある。すなはちこの試
料20の側部に試料の交換口21を設けると共に
前述のX線で励起されて試料から放出される電子
線の集束レンズ22をこの試料に対設し、かつ集
束された電子線が入射するように電子線のエネル
ギ分析装置23を配置してある。従つて対陰極6
aから発生した銅の特性X線は弗化リチウムの分
光結晶15aで集束されて試料20の上の点sに
焦点を結ぶ。また対陰極および分光結晶を鎖線の
ように移動させると対陰極6bから発生したマグ
ネシウムの特性X線が前記TAPで形成された分
光結晶15bで集束されて上記点sに焦点を結
ぶ。このように本発明の装置は試料を励起して光
電子を発生させるX線の波長を変化し、かつその
波長に応じて適切な材質のわん曲分光結晶によつ
て試料上にX線の焦点を結ばせることができるも
ので、この切換操作も容易迅速に行いうる。なお
上記実施例はX線の回折角が比較的近い値の結晶
を用いて分光結晶を形成した場合で、上述のよう
にCuおよびMgの各Kα線のほか例えばRhのLα線
とTiのKα線、AgのLα線とTiのKα線、AlのKα
線とCuのKα、RhのLα線またはAgのLα線とTi
のKα線等に適用される。また上記実施例は対陰
極および分光結晶を2段階に切替えているが、こ
れを3段階に切替えることもできる。
The sample 20 of the X-ray photoelectron spectrometer is arranged at the point s as described above. In other words, a sample exchange port 21 is provided on the side of the sample 20, and a focusing lens 22 for the electron beam excited by the X-rays and emitted from the sample is provided opposite to the sample, and the focused electron beam is An electron beam energy analyzer 23 is arranged so that the electron beam is incident. Therefore, anticathode 6
The characteristic X-rays of copper generated from point a are focused by a lithium fluoride spectroscopic crystal 15a and focused on a point s on the sample 20. Further, when the anticathode and spectroscopic crystal are moved as shown by the chain lines, the characteristic X-rays of magnesium generated from the anticathode 6b are focused by the spectroscopic crystal 15b formed by the TAP and focused on the point s. In this way, the device of the present invention changes the wavelength of the X-rays that excite the sample to generate photoelectrons, and focuses the X-rays on the sample using a curved spectroscopic crystal made of an appropriate material according to the wavelength. Since it can be tied together, this switching operation can be performed easily and quickly. Note that the above example is a case in which a spectroscopic crystal is formed using a crystal whose X-ray diffraction angle is relatively close, and as mentioned above, in addition to the Kα rays of Cu and Mg, for example, the Lα ray of Rh and the Kα of Ti line, Lα line of Ag and Kα line of Ti, Kα of Al
line and Kα of Cu, Lα line of Rh or Lα line of Ag and Ti
This applies to Kα rays, etc. Further, in the above embodiment, the anticathode and the spectroscopic crystal are switched in two stages, but they can also be switched in three stages.

第2図はX線回折角の差が大きい物質をもつて
各分光結晶を形成した場合の実施例である。すな
わち分光結晶15aと15bとのX線回折角の差
が大きい場合は、このように支柱17を筺体1に
固定することによつても、対陰極6aから発生し
て分光結晶15aで試料20上に焦点を結ぶX線
が分光結晶15bで遮蔽されないから、装置並び
に取扱を簡易化することができる。またこの特性
X線および分光結晶の材質としては、例えばAl
のKα線に対するα−SiO2とMgのKα線に対する
人工格子またはTAP、AlのKα線に対するα−
SiO2とAgのLα線に対するGe、RhのLα線に対す
るGe(反射面111)とCuのKα線に対するLiFまた
はGe(反射面220)等の組み合わせがある。なお
上記AlおよびMgのKα線に対する組み合わせは、
特に高分解能を必要とする場合合に前者が用いら
れ、高感度を必要とする場合に後者が用いられ
る。また人工格子はTAPに比較して結晶性が悪
いために分解能は向上しないが、高感度を得るこ
とができると共に真空中でも極めて安定である。
FIG. 2 shows an example in which each spectroscopic crystal is formed using a substance having a large difference in X-ray diffraction angle. In other words, when the difference in the X-ray diffraction angles between the spectroscopic crystals 15a and 15b is large, even by fixing the support 17 to the housing 1 in this way, the X-rays emitted from the anticathode 6a can be detected by the spectroscopic crystal 15a onto the sample 20. Since the X-rays focused on are not blocked by the spectroscopic crystal 15b, the apparatus and handling can be simplified. The material of this characteristic X-ray and spectroscopy crystal is, for example, Al.
α- for the Kα line of SiO 2 and Mg, artificial lattice or TAP for the Kα line, α- for the Kα line of Al
There are combinations such as Ge for the Lα line of SiO 2 and Ag, Ge for the Lα line of Rh (reflecting surface 111), and LiF or Ge (reflecting surface 220) for the Kα line of Cu. The above combination of Al and Mg for Kα rays is as follows:
The former is used when particularly high resolution is required, and the latter is used when high sensitivity is required. Furthermore, since the artificial lattice has poor crystallinity compared to TAP, the resolution does not improve, but it can provide high sensitivity and is extremely stable even in vacuum.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明実施例の縦断面図、第2図は本
発明の他の実施例における一部の縦断面図であ
る。なお図において、1は真空気密筺体、6はX
線を発生させる対陰極、15a,15bは湾曲分
光結晶、20は試料、22は集束レンズ、23は
エネルギ分析装置である。
FIG. 1 is a longitudinal cross-sectional view of an embodiment of the present invention, and FIG. 2 is a longitudinal cross-sectional view of a portion of another embodiment of the present invention. In the figure, 1 is a vacuum-tight housing, 6 is X
15a and 15b are curved spectroscopic crystals, 20 is a sample, 22 is a focusing lens, and 23 is an energy analyzer.

Claims (1)

【特許請求の範囲】[Claims] 1 材質の異なる複数種のX線発生対陰極を励起
電子線の入射部に交換可能なように設置すると共
に上記複数種の対陰極の何れから発生した特性X
線も試料上に集束してその試料から光電子を発生
させるようにそれぞれ材質の異なる複数個の湾曲
分光結晶を前記X線発生対陰極と上記試料との間
に配置したことを特徴とするX線光電子分光装置
の試料励起用X線源。
1. A plurality of types of X-ray generating anticathodes made of different materials are replaceably installed at the entrance part of the excited electron beam, and characteristics
An X-ray characterized in that a plurality of curved spectroscopic crystals each made of a different material are arranged between the X-ray generation anticathode and the sample so that the rays are also focused on the sample and photoelectrons are generated from the sample. X-ray source for sample excitation in photoelectron spectrometer.
JP9832886A 1986-04-30 1986-04-30 X-ray source for exciting sample of x-ray photoelectron spectroscope Granted JPS62255900A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9832886A JPS62255900A (en) 1986-04-30 1986-04-30 X-ray source for exciting sample of x-ray photoelectron spectroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9832886A JPS62255900A (en) 1986-04-30 1986-04-30 X-ray source for exciting sample of x-ray photoelectron spectroscope

Publications (2)

Publication Number Publication Date
JPS62255900A JPS62255900A (en) 1987-11-07
JPH0583880B2 true JPH0583880B2 (en) 1993-11-29

Family

ID=14216837

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9832886A Granted JPS62255900A (en) 1986-04-30 1986-04-30 X-ray source for exciting sample of x-ray photoelectron spectroscope

Country Status (1)

Country Link
JP (1) JPS62255900A (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2500685Y2 (en) * 1989-01-27 1996-06-12 株式会社島津製作所 X-ray irradiation type analyzer
JPH0750594B2 (en) * 1989-02-20 1995-05-31 浜松ホトニクス株式会社 Target for X-ray generation tube and X-ray generation tube
JPH0589809A (en) * 1992-03-04 1993-04-09 Rigaku Corp Rotary anticathode x-ray generating device

Also Published As

Publication number Publication date
JPS62255900A (en) 1987-11-07

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