JPH06100449B2 - Coating film inspection device for resistors - Google Patents
Coating film inspection device for resistorsInfo
- Publication number
- JPH06100449B2 JPH06100449B2 JP61037697A JP3769786A JPH06100449B2 JP H06100449 B2 JPH06100449 B2 JP H06100449B2 JP 61037697 A JP61037697 A JP 61037697A JP 3769786 A JP3769786 A JP 3769786A JP H06100449 B2 JPH06100449 B2 JP H06100449B2
- Authority
- JP
- Japan
- Prior art keywords
- resistor
- outer diameter
- image sensor
- coating film
- resistors
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000011248 coating agent Substances 0.000 title claims description 15
- 238000000576 coating method Methods 0.000 title claims description 15
- 238000007689 inspection Methods 0.000 title description 13
- 230000002950 deficient Effects 0.000 description 8
- 230000007547 defect Effects 0.000 description 4
- 238000009413 insulation Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 230000002093 peripheral effect Effects 0.000 description 3
- 239000000758 substrate Substances 0.000 description 2
- 208000003464 asthenopia Diseases 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 229910052573 porcelain Inorganic materials 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Sorting Of Articles (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、胴体の両端にキャップ状の端子を接合して成
る抵抗器における、当該胴体外周に塗布された塗膜の良
否を判別する検査装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial application] The present invention is an inspection for determining the quality of a coating film applied to the outer periphery of a body of a resistor formed by joining cap-shaped terminals to both ends of the body. It relates to the device.
いわゆるリードレス抵抗器1は、第4図に示すように、
絶縁性を有する磁器製の円注状ボビンBの外周面に抵抗
皮膜Cを形成し、ボビンBの両端にキャップ状の端子D,
Dを被嵌固着した後、両端子D,D部分を除く胴体Fにおけ
る抵抗皮膜Cの外周面に、耐絶縁性または非導電性塗料
の塗布による塗膜Eにて被覆することで製作されるが、
前記胴体Fの部分の塗膜Eの塗布形成に際しては、塗膜
が全く形成されない部分や塗膜の厚さが極めて薄い部分
を生じたり、反対に極めて厚い部分が生じる等不均一に
なることがある。The so-called leadless resistor 1, as shown in FIG.
A resistance coating C is formed on the outer peripheral surface of a circular pouring bobbin B made of porcelain having insulating properties, and cap-shaped terminals D, at both ends of the bobbin B,
After the D is fitted and fixed, the outer peripheral surface of the resistive film C in the body F excluding both terminals D, D is coated with a coating E by applying an insulation resistant or non-conductive paint. But,
When the coating film E is formed on the body F, unevenness may occur, such as a part where no coating film is formed or a part where the thickness of the coating film is extremely thin, or a part where the coating film is extremely thick. is there.
従来、このような塗膜の良否(外観)を検査する装置と
して、肉眼による検査では検査者の個人差によるバラツ
キが大きいし、目の疲れによる非能率さがあるので、こ
れを無くすため、実開昭58−167407号公報には、円柱体
の直径を、当該円柱体の中心軸線に沿って3箇所以上で
計測することが第3図に開示されている。しかし、この
計測に際して使用する測定装置は、円柱体の外周面に3
点接触する接触子であり、機械的構造で、一定以上の幅
寸法を有するため、円柱状の抵抗器のように胴体部の直
径及び長さ寸法の小さいものでは、前記の接触子の接触
面が抵抗器の胴体部の長手方向(軸線方向)の複数箇所
に同時に接触してしまい、胴体部の長手方向中央部と端
子に近い箇所との胴体部の直径の差異を検出することが
できないのであった。Conventionally, as a device for inspecting the quality (appearance) of such a coating film, in the inspection with the naked eye, there are large variations due to individual differences of the inspector, and there is inefficiency due to eye fatigue. JP-A-58-167407 discloses that the diameter of a cylindrical body is measured at three or more points along the central axis of the cylindrical body in FIG. However, the measuring device used for this measurement is 3
Since it is a contactor that makes point contact, it has a mechanical structure and a width dimension above a certain level, so if the diameter and length of the body part are small, such as a cylindrical resistor, the contact surface of the contactor Since it simultaneously contacts multiple locations in the longitudinal direction (axial direction) of the body of the resistor, it is not possible to detect the difference in the diameter of the body between the center of the body in the longitudinal direction and the location near the terminals. there were.
従って、抵抗器1の胴体F外周形状が第5図(a)のよ
うに胴体Fの軸線方向に沿う長手中途部の外径が両端の
キャップ状端子D,D部分の外径より大きくなる太鼓状に
脹れた形状になったり、反対に第5図(b)のように胴
体Fの軸線方向に沿う長手中途部の外径が両端のキャッ
プ状端子D,D部分の外径より小さくなったり、その他第
5図(c)に示すように、胴体Fの長手方向に沿って一
方の外径が大きく他方に行くに従って小さくなる等、種
々の不良形状であることを測定することができないので
あった。Therefore, as shown in FIG. 5 (a), the outer peripheral shape of the body F of the resistor 1 is such that the outer diameter of the midway portion along the axial direction of the body F is larger than the outer diameter of the cap-shaped terminals D at both ends. The outer diameter of the midway portion along the axial direction of the body F becomes smaller than the outer diameter of the cap-shaped terminals D at both ends, as shown in FIG. 5 (b). Alternatively, as shown in FIG. 5 (c), it is not possible to measure various defective shapes, such as the outer diameter of one of which is large along the longitudinal direction of the body F and becomes smaller toward the other. there were.
しかも、接触子によって抵抗器の塗膜をこすることにな
るから、当該接触点における塗膜が剥離し、または塗膜
の厚さが検査の作業のために減少する等、この種抵抗器
として致命的な不良が検査によって発生するおそれがあ
った。Moreover, since the coating film of the resistor is scraped by the contactor, the coating film at the contact point is peeled off or the thickness of the coating film is reduced due to the inspection work. A fatal defect could occur during inspection.
この不都合を解消する手段として、特開昭60−76134号
公報には、抵抗器等の円柱状部材をその軸線と直交方向
方向に進行移送させ、その移送中の円柱状部材を光源と
イメージセンサ(ラインセンサ)で挟んで撮像し、円柱
状部材の外観を検査する構成が開示されている。As means for solving this inconvenience, Japanese Patent Laid-Open No. 60-76134 discloses that a cylindrical member such as a resistor is advanced and transferred in a direction orthogonal to its axis, and the cylindrical member being transferred is used as a light source and an image sensor. A configuration is disclosed in which an image is sandwiched between (line sensors) and an image is inspected to inspect the external appearance of the cylindrical member.
この装置によれば、円柱状部材の左右両側の軸状リード
部は左右一対のチェンコンベヤに設けた凹溝付き支持体
に支持されているが、円柱状部材自体が自転するもので
はないため、この構成のままでは、前記光源からの光軸
線と平行な方向の抵抗器等の円柱状部材の直径を測定す
ることができず、別途の手段にて、当該円柱状部材を軸
線回りに回転(自転)させる必要があった。According to this device, the axial lead portions on both the left and right sides of the columnar member are supported by the grooved support provided on the pair of left and right chain conveyors, but the columnar member itself does not rotate. With this configuration, the diameter of the cylindrical member such as the resistor in the direction parallel to the optical axis from the light source cannot be measured, and the cylindrical member is rotated around the axis by a separate means ( It had to be rotated.
本発明は、前記の従来の問題を解決するためになされた
ものであり、光学的な非接触のイメージセンサを用い、
且つ移送手段を工夫することにより、従来では不可能で
あった超小型の抵抗器における胴体の複数箇所の外径
(外観)を正確且つ迅速に検査できる装置を提供するこ
とを目的とするものである。The present invention has been made to solve the above-mentioned conventional problems, and uses an optical non-contact image sensor,
In addition, it is an object of the present invention to provide a device capable of accurately and quickly inspecting the outer diameter (appearance) of a plurality of portions of a body of a microminiature resistor, which has been impossible in the past, by devising a transfer means. is there.
そのため本発明の抵抗器における塗膜の検査装置は、外
周が塗膜された胴体の両端にキャップ状の端子を備えて
成る抵抗器を、胴体及び端子の水平軸線回りに自転しつ
つ前記水平軸線と直角の横方向に進行させる移送手段
と、該移送中の抵抗器を挟んで対峙させて配設する光源
とイメージセンサとから成り、前記移送手段をテーブル
表面に沿って移動するベルトコンベヤであって、該ベル
トコンベヤには適宜間隔にて前記抵抗器が嵌まって自転
し得る係合孔を備えるように構成し、前記イメージセン
サにて前記係合孔内の抵抗器における胴体の水平軸線方
向に適宜隔てて少なくとも3箇所の外径の大小を比較検
出するように構成したものである。Therefore, the device for inspecting a coating film in the resistor of the present invention includes a resistor having cap-shaped terminals at both ends of a body whose outer periphery is coated, while rotating the resistor about the horizontal axis of the body and the terminal while rotating the horizontal axis line. And a light source and an image sensor, which are arranged so as to face each other with the resistor being transferred therebetween, and a belt conveyor that moves the transfer means along the table surface. The belt conveyor is provided with engaging holes at which the resistors are fitted at appropriate intervals so that the resistors can rotate, and the image sensor is arranged so that the horizontal axis direction of the body of the resistors in the resistors is within the engaging holes. The size of the outer diameter is compared and detected at at least three locations with appropriate separation.
このように、本発明に従えば、抵抗器の胴体の外径を非
接触式の光学系のイメージセンサにて検出するから、被
検査物である抵抗器の胴体の外周に接触するものがな
く、塗膜が検査によって剥離する等の事故が無くなる。
そして、照射する光線の幅も極度に小さくすることがで
きるので、抵抗器の胴体の長さが極端に短くても、任意
の箇所を複数箇所にわたって別々に検出することができ
る。As described above, according to the present invention, since the outer diameter of the body of the resistor is detected by the image sensor of the non-contact optical system, there is nothing that contacts the outer periphery of the body of the resistor as the inspection object. No more accidents such as peeling of the coating film by inspection.
Since the width of the light beam to be applied can also be made extremely small, even if the length of the body of the resistor is extremely short, it is possible to detect an arbitrary point separately over a plurality of points.
また、本発明では、胴体の水平軸線方向(長手方向)の
少なくとも3箇所の外径の大小を比較検出するのである
から、抵抗器の胴体の外径が長手方向に沿って変化する
ことにより、第5図におけるような種々の胴体外形状の
不良を簡単に判別することができる。Further, in the present invention, since the size of the outer diameter of at least three locations in the horizontal axis direction (longitudinal direction) of the body is detected by comparison, by changing the outer diameter of the body of the resistor along the longitudinal direction, It is possible to easily discriminate various defects in the outer shape of the body as shown in FIG.
さらに、移送手段は、テーブル表面に沿って移動するベ
ルトコンベヤであって、該ベルトコンベヤには適宜間隔
にて前記抵抗器が嵌まって自転し得る係合孔を備えよう
に構成されているので、各係合孔に嵌まった抵抗器の下
面はテーブルに接触し、ベルトコンベヤの移動により、
前記係合孔内で抵抗器が位置ずれすることなくその胴体
の水平軸線回りに自転させながら連続して検査できるか
ら、胴体の外側の一周を総て検査でき、一側面のみ欠陥
があっても検出できる。Further, the transfer means is a belt conveyor that moves along the surface of the table, and the belt conveyor is provided with engaging holes that allow the resistors to be fitted at appropriate intervals so as to rotate. , The lower surface of the resistor fitted in each engaging hole contacts the table, and the movement of the belt conveyor causes
Since the resistors can be continuously inspected while rotating around the horizontal axis of the body without being displaced in the engagement hole, the entire outer circumference of the body can be inspected and even if only one side has a defect. Can be detected.
従って、肉眼による検査のバラツキや非能率性をなく
し、超小型の抵抗器の外径や外観の正確な検査を連続的
に且つ迅速に実行できる効果を奏する。Therefore, it is possible to eliminate the variation and inefficiency of the inspection with the naked eye, and to perform the accurate and accurate inspection of the outer diameter and the appearance of the microminiature resistor continuously and quickly.
次に本発明を実施例を説明すると、図における検査装置
2は、テーブル3の上面に矢印(イ)方向に移動する係
合孔4付きのベルトコンベヤ5を上下に挟んで対峙させ
て配設する3対の光源6及びイメージセンサ7とからな
る。An embodiment of the present invention will be described below. In the inspection device 2 shown in the drawing, a belt conveyor 5 having an engaging hole 4 that moves in the direction of the arrow (a) is arranged on the upper surface of a table 3 so as to face each other. It comprises three pairs of light sources 6 and an image sensor 7.
テーブル3には、抵抗器1がその左右両端のキャップ状
端子D,Dの下面を支持する進行方向長手の凹溝8が凹み
形成され、一方、ベルトコンベヤ5には、前記凹溝8の
上方に略一致して抵抗器1が全体として嵌挿し得る係合
孔4が穿設される。該係合孔4の略中央部には、光源6
からの照射光線が向上きに貫通できるように大形部4aに
形成されており、従って、ベルトコンベヤ5の進行につ
れて、その各係合孔4に嵌挿された抵抗器1は端子D,D
の軸線回りに自転しながら、矢印(イ)方向に移送され
る。The table 3 is formed with a concave groove 8 having a longitudinal direction in which the resistor 1 supports the lower surfaces of the cap-shaped terminals D, D at both left and right ends thereof. On the other hand, the belt conveyor 5 has a concave groove 8 above the concave groove 8. An engaging hole 4 into which the resistor 1 as a whole can be fitted is formed substantially in conformity with. A light source 6 is provided at a substantially central portion of the engaging hole 4.
Is formed in the large-sized portion 4a so that the irradiation light from the can be improvedly penetrated. Therefore, as the belt conveyor 5 advances, the resistors 1 fitted in the respective engagement holes 4 are connected to the terminals D, D.
While being rotated around the axis of, it is transferred in the direction of arrow (a).
前記3対の光源6a,6b,6cとイメージセンサ7a,7b,7cとの
対は、抵抗器1の胴体Fの長手方向に適宜間隔寸法
(h)だけ隔てた所定の(I)ライン,(II)ライン,
(III)ラインの箇所の外径を各自検出できるように配
置されている。The pair of the three pairs of light sources 6a, 6b, 6c and the image sensors 7a, 7b, 7c is a predetermined (I) line, which is separated by an appropriate interval dimension (h) in the longitudinal direction of the body F of the resistor 1, ( II) line,
(III) The line is arranged so that the outside diameter of the line can be detected by each person.
前記各光源6a,6b,6cは可視光線または赤外線等の照射光
線を発する発光ダイオード等を用い、テーブル3の凹溝
8の底部にベルトコンベヤ5の進行方向に適宜間隔にて
設けられる。Each of the light sources 6a, 6b, 6c uses a light emitting diode or the like that emits an irradiation light such as visible light or infrared light, and is provided at the bottom of the groove 8 of the table 3 at appropriate intervals in the traveling direction of the belt conveyor 5.
他方、前記各光源の箇所に対応して対峙配設される各イ
メージセンサ7a,7b,7cは、ホトダイオードを前記各ライ
ンに沿って14μm等の微小間隔で多数配設した多数の画
素を備えるようにして組立てられた1次元CCD(Charge
Coupled Device)等からなり、光源とイメージセン
サとの間の抵抗器1の胴体Fにより遮られた光線位置の
変化を電気的に検出することにより、当該胴体Fのの外
径を非接触式に測定できるように構成したもので、各イ
メージセンサ7a,7b,7cはリンクユニット9を介してコン
トローラ10に接続されている。On the other hand, each of the image sensors 7a, 7b, 7c arranged facing each other corresponding to each of the light sources has a large number of pixels in which a large number of photodiodes are arranged along each line at a minute interval of 14 μm or the like. One-dimensional CCD (Charge
Coupled Device) and the like, and by electrically detecting a change in the position of the light beam blocked by the body F of the resistor 1 between the light source and the image sensor, the outer diameter of the body F is made non-contact type. Each image sensor 7a, 7b, 7c is connected to a controller 10 via a link unit 9 so that it can be measured.
なお、符号11は前記検査装置2の後方のベルトコンベヤ
5上方位置に配設された真空吸着装置で、前記検査装置
2により不良と判定された抵抗器1を吸着除去するもの
である。Reference numeral 11 is a vacuum suction device disposed behind the inspection device 2 and above the belt conveyor 5 for sucking and removing the resistor 1 which is determined to be defective by the inspection device 2.
この構成において、第1図及び第2図に示すように、ベ
ルトコンベヤ5の各係合孔に嵌まって自転しながら移送
される各抵抗器1の胴体Fは、その左端の(I)ライン
の箇所の光源6aとイメージセンサ7aの対にて外径が検出
され、(II)ラインにおける外径は光源6bとイメージセ
ンサ7bの対にて検出され、(III)ラインにおける外径
は光源6cとイメージセンサ7cとの対にて各々検出される
ことになる。In this configuration, as shown in FIGS. 1 and 2, the body F of each resistor 1 fitted in each engagement hole of the belt conveyor 5 and transported while rotating is the (I) line at the left end thereof. The outer diameter is detected by the pair of the light source 6a and the image sensor 7a at the point, the outer diameter at the line (II) is detected by the pair of the light source 6b and the image sensor 7b, and the outer diameter at the line (III) is the light source 6c. And the image sensor 7c.
従って、前記リンクユニット9を介してコントローラ10
において各ラインの外径測定の結果を比較することによ
り、(II)ラインにおける外径の測定値がその左右両側
の(I),(III)ラインにおける測定値より大きいと
判断されると、抵抗器1の胴体Fの外径形状が、第5図
(a)のごとく中央部の外径が大きい太鼓状である場合
に相当し、このような形状において、(II)ラインにお
ける外径がキャップ状端子Dの直径より大きいと、集積
回路の基板上に抵抗器1を載置するときの接着不良が起
こり易いから不良品と判断される。また、前記の場合に
おいて、(I),(III)ラインにおける外径の測定値
が基準値に達していないときには、絶縁不良または耐湿
不良の可能性があるとして不良の判断をし、さらに、そ
の両ラインにおける測定値が基準に達していても(II)
ラインとの大小比較によるテーパー角度の算出から端子
Dとの付け根箇所における外径が予測でき、それらが規
定値を越えるまたは不足するときも不良と判断すること
ができる。Therefore, the controller 10 is connected via the link unit 9.
By comparing the results of measuring the outer diameter of each line, it is determined that the measured value of the outer diameter of the (II) line is larger than the measured values of the (I) and (III) lines on the left and right sides thereof. This corresponds to the case where the outer diameter shape of the body F of the container 1 is a drum shape in which the outer diameter of the central portion is large as shown in Fig. 5 (a). In such a shape, the outer diameter at the line (II) is the cap. If the diameter of the terminal D is larger than the diameter of the terminal D, the defective adhesion is likely to occur when the resistor 1 is mounted on the substrate of the integrated circuit. Further, in the above case, when the measured value of the outer diameter in the lines (I) and (III) does not reach the reference value, it is judged that there is a possibility of defective insulation or defective moisture resistance, and Even if the measured values on both lines reach the standard (II)
The outer diameter at the base of the terminal D can be predicted from the calculation of the taper angle based on the size comparison with the line, and when they exceed or fall below the specified value, it can be judged as defective.
同様にして、(II)ラインにおける外径の測定値がその
左右両側の(I),(III)ラインにおける測定値より
小さいと判断されると、抵抗器1の胴体Fの外径形状
が、第5図(b)のごとく中央部の外径がくびれた鼓状
である場合に相当し、その場合に当該中央部の直径が規
定値より小さいと、絶縁不良または耐湿不良の可能性が
あるとして不良の判断をし、さらに左右両側の(I),
(III)ラインの外径が大き過ぎるときには、抵抗器1
の基板上への接着性能が不良になるので、不良と判断す
る。Similarly, if it is determined that the measured value of the outer diameter on the line (II) is smaller than the measured values on the left and right sides of the lines (I) and (III), the outer diameter shape of the body F of the resistor 1 becomes This corresponds to the case where the outer diameter of the central portion has a constricted drum shape as shown in FIG. 5B, and in that case, if the diameter of the central portion is smaller than the specified value, there is a possibility of poor insulation or poor moisture resistance. Is judged as defective, and (I) on both left and right sides,
(III) If the outside diameter of the line is too large, the resistor 1
Since the performance of adhering to the substrate becomes poor, it is judged to be defective.
さらに、ラインの(I),(II),(III)の順に外径
が小さくなれば、第5図の(c)に示す円錐状の可能性
が大きいと判断し、その大小比較から算出されるテーパ
ー角度から胴体Fと端子Dとの付け根箇所の外径を算出
して、規定値の範囲内にあるか否かの判断をすることが
できる。Furthermore, if the outer diameter decreases in the order of (I), (II), and (III) of the line, it is judged that the conical shape shown in (c) of FIG. The outer diameter of the root of the body F and the terminal D can be calculated from the taper angle to determine whether or not it is within the range of the specified value.
いずれにしても、前記と同様に不良と判断するときに
は、後方の真空吸着装置11にて吸着除去すれば良いので
ある。In any case, when it is determined that the defect is the same as described above, the vacuum suction device 11 on the rear side may suction and remove it.
なお、前記実施例においては、複数対の光源とイメージ
センサとを、抵抗器の胴体左右両側箇所においてその進
行方向に適宜隔てて配設することにより、複数のイメー
ジセンサの配置の干渉を防止して超小型の抵抗器の胴体
外径の複数箇所を測定できるようにしているが、イメー
ジセンサ等の寸法が許すときには、左右に平行状に配設
しても良い。In the above embodiment, the plurality of pairs of light sources and the image sensor are arranged at the right and left sides of the body of the resistor at appropriate intervals in the traveling direction, thereby preventing the interference of the arrangement of the plurality of image sensors. Although it is possible to measure a plurality of locations of the outer diameter of the body of the microminiature resistor, they may be arranged in parallel to the left and right when the dimensions of the image sensor or the like allow.
さらに、本発明は左右両側の端子D,Dの外側にリード線
が突出しているような抵抗器においても適用できること
はいうまでもない。Further, it goes without saying that the present invention can also be applied to a resistor in which lead wires project outside the terminals D on both the left and right sides.
第1図から第3図までは本発明の実施例装置を示し、第
1図は概略側面図、第2図は第1図のII−II線で示す拡
大断面図、第3図は第2図のIII−III線視平面図、第4
図及び第5図は各々抵抗器の形状を示す説明図である。 1……抵抗器、2……検査装置、3,20……テーブル、22
……接触子、4……係合孔、5……ベルトコンベヤ、6,
6a,6b,6c……光源、7,7a,7b,7c……イメージセンサ、8
……凹溝、9……リンクユニット9、10……コントロー
ラ。1 to 3 show an apparatus according to an embodiment of the present invention, FIG. 1 is a schematic side view, FIG. 2 is an enlarged sectional view taken along line II-II of FIG. 1, and FIG. III-III line top view of the figure, 4th
FIG. 5 and FIG. 5 are explanatory views each showing the shape of the resistor. 1 ... resistor, 2 ... inspection device, 3,20 ... table, 22
...... Contacts, 4 …… Engagement holes, 5 …… Belt conveyors, 6,
6a, 6b, 6c …… Light source, 7,7a, 7b, 7c …… Image sensor, 8
...... Concave groove, 9 ...... Link unit 9, 10 ...... Controller.
Claims (1)
の端子を備えて成る抵抗器を、胴体及び端子の水平軸線
回りに自転しつつ前記水平軸線と直角の横方向に進行さ
せる移送手段と、該移送中の抵抗器を挟んで対峙させて
配設する光源とイメージセンサとから成り、前記移送手
段をテーブル表面に沿って移動するベルトコンベヤであ
って、該ベルトコンベヤには適宜間隔にて前記抵抗器が
嵌まって自転し得る係合孔を備えるように構成し、前記
イメージセンサにて前記係合孔内の抵抗器における胴体
の水平軸線方向に適宜隔てて少なくとも3箇所の外径の
大小を比較検出することを特徴とする抵抗器における塗
膜の検査装置。1. A transfer in which a resistor having cap-shaped terminals at both ends of a body having a coated outer periphery is rotated about a horizontal axis of the body and the terminal while advancing in a lateral direction perpendicular to the horizontal axis. Means, a light source and an image sensor, which are arranged to face each other with the resistor being transferred therebetween, and a belt conveyor for moving the transfer means along the surface of the table. In the image sensor, at least three outer portions are appropriately separated in the horizontal axis direction of the body of the resistor in the engaging hole by the image sensor. An apparatus for inspecting a coating film in a resistor, which is capable of comparing and detecting the size of a diameter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61037697A JPH06100449B2 (en) | 1986-02-21 | 1986-02-21 | Coating film inspection device for resistors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61037697A JPH06100449B2 (en) | 1986-02-21 | 1986-02-21 | Coating film inspection device for resistors |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62194406A JPS62194406A (en) | 1987-08-26 |
| JPH06100449B2 true JPH06100449B2 (en) | 1994-12-12 |
Family
ID=12504735
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61037697A Expired - Lifetime JPH06100449B2 (en) | 1986-02-21 | 1986-02-21 | Coating film inspection device for resistors |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06100449B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002324703A (en) * | 2001-04-26 | 2002-11-08 | Koa Corp | Method of observing surface of electronic component and observing device |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58167407U (en) * | 1982-05-04 | 1983-11-08 | 大日本印刷株式会社 | Cylindrical diameter measuring device |
| JPS6076134A (en) * | 1983-09-30 | 1985-04-30 | Nec Kansai Ltd | Inspecting device for appearance of shaft-shaped member |
-
1986
- 1986-02-21 JP JP61037697A patent/JPH06100449B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62194406A (en) | 1987-08-26 |
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