JPH06100477B2 - Magnetoresistive element - Google Patents
Magnetoresistive elementInfo
- Publication number
- JPH06100477B2 JPH06100477B2 JP59266876A JP26687684A JPH06100477B2 JP H06100477 B2 JPH06100477 B2 JP H06100477B2 JP 59266876 A JP59266876 A JP 59266876A JP 26687684 A JP26687684 A JP 26687684A JP H06100477 B2 JPH06100477 B2 JP H06100477B2
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- Prior art keywords
- magnetic
- magnetic thin
- thin film
- films
- magnetoresistive element
- Prior art date
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Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、例えばモータのように、周辺磁界が所定長ご
とに同じ変化を繰り返す対象物の静止位置や移動状態を
測定する磁気センサ用の磁気抵抗素子に関する。Description: TECHNICAL FIELD The present invention relates to a magnetic sensor for measuring a stationary position or a moving state of an object such as a motor in which a peripheral magnetic field repeats the same change every predetermined length. The present invention relates to a magnetoresistive element.
(従来の技術) 強磁性体の磁気抵抗効果を利用した磁気抵抗素子があ
る。第20図、第21図はこのような従来の磁気抵抗素子の
概略を示す。第20図、第21図において、非磁性体基板に
強磁性体膜で「コ」字状のパターンに形成された磁気抵
抗素子1は、周期λで着磁された記録媒体2の磁気信号
記録面に対向させて配置され、記録媒体2の周辺磁界を
検出するようになっている。磁気抵抗素子1は互いに平
行に配置された二つの検出体A、Bを有してなり、二つ
の検出体A、Bの各一端が接続されて互いに直列に接続
され、反対側の端部は検出信号の出力端子となってい
る。このような磁気抵抗素子1は「コ」の字状に折り返
すことにより高インピーダンスになって消費電力が少な
くなり、また、出力端子が片側に集まるから配線しやす
いという利点がある。(Prior Art) There is a magnetoresistive element that utilizes the magnetoresistive effect of a ferromagnetic material. 20 and 21 schematically show such a conventional magnetoresistive element. 20 and 21, a magnetoresistive element 1 formed by a ferromagnetic film on a non-magnetic substrate in a "U" -shaped pattern is used for recording a magnetic signal on a recording medium 2 magnetized at a period λ. It is arranged so as to face the surface and detects the magnetic field around the recording medium 2. The magnetoresistive element 1 has two detectors A and B arranged in parallel with each other, one end of each of the two detectors A and B is connected and connected in series, and the opposite ends are It serves as an output terminal for the detection signal. Such a magnetoresistive element 1 has the advantages that it is turned into a U-shape and has a high impedance to reduce power consumption, and that the output terminals are gathered on one side, so that wiring is easy.
第20図の例では検出体A、Bが記録媒体2の着磁周期λ
に比較して小さい間隔aで配置されており、第21図の例
では検出体A、Bが記録媒体2の着磁周期λに対してλ
/2の間隔で配置されている。In the example of FIG. 20, the detection bodies A and B are the magnetization period λ of the recording medium 2.
21. In the example of FIG. 21, the detectors A and B are arranged at a smaller interval a than the magnetizing period λ of the recording medium 2.
They are arranged at an interval of / 2.
(発明が解決しようとする問題点) 第20図の従来例によれば、第22図に示されているよう
に、検出体A、Bが間隔aだけずれることにより、検出
体Aの抵抗変化RAと検出体Bの抵抗変化RBは互いに
4πa/λの位相差を生ずる。いま、検出体A、Bの抵抗
変化RA、RBを次式のようにおく。(Problems to be Solved by the Invention) According to the conventional example of FIG. 20, as shown in FIG. 22, the resistance change of the detection body A is caused by the deviations of the detection bodies A and B by the distance a. The resistance change R B between R A and the detection body B causes a phase difference of 4πa / λ with each other. Now, the resistance changes R A and R B of the detection bodies A and B are set as in the following equation.
ここで、Roは抵抗変化の直流分、RΔは抵抗変化の交流
分の振幅、xは記録媒体の長手方向への磁気抵抗素子1
の相対移動距離である。 Here, Ro is the direct current component of the resistance change, RΔ is the amplitude of the alternating current component of the resistance change, and x is the magnetoresistive element 1 in the longitudinal direction of the recording medium.
Is the relative movement distance of.
磁気抵抗素子1全体の抵抗Rは、検出体A、Bの抵抗R
A、RBの和であるから、 となる。上の式の第2項に係数cos(2πa/λ)は、抵
抗変化の振幅が検出体A、Bの間隔aにより変化するこ
とを示している。この項は0≦a≦λ/4の範囲で単調減
少である。即ち、上記範囲内では、aが小さければ小さ
い程、同じRo、RΔでも大きな抵抗変化が得られること
になる。The resistance R of the entire magnetoresistive element 1 is the resistance R of the detection bodies A and B.
Since it is the sum of A and R B , Becomes The coefficient cos (2πa / λ) in the second term of the above equation indicates that the amplitude of the resistance change changes depending on the distance a between the detection bodies A and B. This term is monotonically decreasing in the range of 0 ≦ a ≦ λ / 4. That is, within the above range, the smaller a is, the larger the resistance change can be obtained even with the same Ro and RΔ.
第23図は上面の関係を図示したものであり、Aは検出素
子Aの磁気抵抗変化、Bは検出素子Aに対し位置をずら
して設けられた検出素子Bの磁気抵抗変化を示す。この
検出素子A、Bの磁気抵抗変化の和をとったものがR1で
示されている。いま、仮に検出素子Aと検出素子Bとの
間の中央に二つの検出素子Cを垂直方向に重ねて置き、
しかもこれを直列に接続したとすれば、二つの磁気抵抗
素子Cの磁気抵抗変化の位相差は零であるから、この二
つの磁気抵抗素子Cの磁気抵抗変化の和は第23図で示さ
れているようになり、振幅が大きくなることがわかる。FIG. 23 shows the relationship between the upper surfaces, where A is the change in the magnetic resistance of the detection element A, and B is the change in the magnetic resistance of the detection element B that is provided at a position displaced from the detection element A. The sum of the magnetic resistance changes of the detection elements A and B is indicated by R1. Now, assuming that the two detection elements C are vertically overlapped with each other in the center between the detection elements A and B,
Moreover, if they are connected in series, the phase difference of the magnetoresistive change of the two magnetoresistive elements C is zero, so the sum of the magnetoresistive changes of these two magnetoresistive elements C is shown in FIG. It can be seen that the amplitude increases.
しかるに、第20図に従来例では検出素子A、Bが同一平
面にあるため、検出素子A、Bの間隔aを零にすること
は不可能であり、特に、信号記録波長λが小さくなると
係数cos(2πa/λ)は小さくなり、抵抗変化の振幅が
小さくなる。従って、第20図の従来例では、記録波長λ
を小さくして高精度でモータの速度などを検出しようと
する場合には大きな抵抗変化率が得られないという問題
点がある。However, in the conventional example shown in FIG. 20, since the detection elements A and B are on the same plane, it is impossible to make the distance a between the detection elements A and B zero, and in particular, when the signal recording wavelength λ becomes small, the coefficient cos (2πa / λ) becomes small, and the amplitude of resistance change becomes small. Therefore, in the conventional example of FIG. 20, the recording wavelength λ
However, there is a problem in that a large rate of resistance change cannot be obtained when the motor speed is to be detected with high accuracy by reducing the value.
また、第21図の従来例では、検出体A、Bの間隔はλ/2
であり、電気的には二つの検出体A、Bが等価な位置に
ある。従って、係数cos(2πa/λ)は−1となり、最
大の抵抗変化が得られる。しかし、検出体A、Bの間隔
は必然的に大きくなるから、磁気抵抗素子の小型化には
不都合である。Further, in the conventional example of FIG. 21, the distance between the detection bodies A and B is λ / 2.
That is, the two detectors A and B are electrically equivalent to each other. Therefore, the coefficient cos (2πa / λ) becomes -1, and the maximum resistance change is obtained. However, the space between the detectors A and B inevitably becomes large, which is inconvenient for downsizing the magnetoresistive element.
本発明の目的は、小型で高インピーダンスの磁気抵抗素
子を得るために複数の磁性膜を直列に接続するに当た
り、各磁性膜の抵抗変化の位相差を零とすることを可能
にして抵抗変化率の大きい磁気抵抗素子を提供すること
にある。An object of the present invention is to connect a plurality of magnetic films in series in order to obtain a magnetoresistive element having a small size and a high impedance, thereby making it possible to make the phase difference of the resistance change of each magnetic film zero. To provide a large magnetoresistive element.
(問題点を解決するための手段) 本発明の磁気抵抗素子は、磁気抵抗素子を構成する複数
の磁性膜と絶縁膜とを記録媒体との対向面に対し垂直方
向に基板の一方面上で交互に重設すると共に、上記複数
の磁性膜の一部どうしを上記絶縁膜を介在させることな
く重設し直列接続して上記基板上に配設することによ
り、複数の全ての磁性膜が同時に記録媒体の同一位置の
磁気信号を検出し、重設された複数の磁性膜の磁気抵抗
変化の位相差を零としたことを特徴とする。(Means for Solving the Problems) In the magnetoresistive element of the present invention, a plurality of magnetic films constituting the magnetoresistive element and the insulating film are formed on one surface of the substrate in a direction perpendicular to the surface facing the recording medium. By alternately stacking the magnetic films, a part of the magnetic films are stacked without interposing the insulating film and connected in series to be arranged on the substrate, so that all the magnetic films are simultaneously formed. It is characterized in that the magnetic signals at the same position on the recording medium are detected, and the phase difference of the magnetoresistance change of the plurality of magnetic films arranged in layers is set to zero.
(作用) 磁気抵抗素子を構成する磁性膜が記録媒体との対向面に
対し絶縁膜を介して垂直方向に重設されて直列接続され
るため、磁気信号の記録媒体の移動方向に対する各磁性
膜のずれはなく、各磁性膜の抵抗変化の位相差は零とな
り、磁気抵抗の変化が大きくなる。(Operation) Since the magnetic film forming the magnetoresistive element is vertically stacked on the surface facing the recording medium via the insulating film and connected in series, each magnetic film with respect to the moving direction of the recording medium of the magnetic signal. There is no deviation, and the phase difference of the resistance change of each magnetic film becomes zero, and the change of the magnetic resistance becomes large.
(実施例) 第1図乃至第6図は本発明の一実施例を示す。第1図乃
至第6図において、ガラス等によって形成された非磁性
の基板3の表面には磁気抵抗効果を有する強磁性薄膜4
が形成されている。この磁性薄膜4は基板3の長手方向
の中心線に略沿うようにしてその大部分が直線状に形成
されると共に端子となるべき部分4aが一側方に曲げられ
た形に形成されている。その上には、第2図に示されて
いるように、磁性薄膜4の上記端子部4aとその反対側の
端部4bとを除いて絶縁膜5が形成されている。絶縁膜5
の上にはさらに磁気抵抗効果を有する強磁性薄膜6が形
成されている。この磁性薄膜6は、第3図に示されてい
るように、基板3の長手方向の中心線に略沿うようにし
てその大部分が直線状に形成され、この直線状の部分が
絶縁膜5を介して磁性薄膜4の直線状の部分と重なり合
っている。磁性薄膜6は、上記磁性薄膜4の端子部4aと
同じ側の端部が端子となるべき部分6aとして磁性薄膜4
の端子部4aの曲がりとは逆向きに曲げられた形に形成さ
れ、また、磁性薄膜6の他端部6bは絶縁膜5の端部から
はみ出して磁性薄膜4の端部4bと直接重なり合ってい
る。従って、磁性薄膜4と磁性薄膜6は互いに同り磁気
抵抗特性をもつように形成されると共に、直列に接続さ
れて線IV−IVに沿って折り返された形に形成されてい
る。磁性薄膜6の上にはさらに、同磁性薄膜6及び磁性
薄膜4の各端子部6a、4aを除く他の部分を覆うようにし
て保護膜7が形成されている。(Embodiment) FIGS. 1 to 6 show an embodiment of the present invention. 1 to 6, a ferromagnetic thin film 4 having a magnetoresistive effect is formed on the surface of a non-magnetic substrate 3 made of glass or the like.
Are formed. Most of this magnetic thin film 4 is formed substantially linearly along the center line of the substrate 3 in the longitudinal direction, and a part 4a to be a terminal is formed to be bent to one side. . As shown in FIG. 2, an insulating film 5 is formed thereon, except for the terminal portion 4a of the magnetic thin film 4 and the end portion 4b on the opposite side thereof. Insulation film 5
A ferromagnetic thin film 6 having a magnetoresistive effect is further formed thereon. As shown in FIG. 3, most of the magnetic thin film 6 is formed in a linear shape substantially along the center line of the substrate 3 in the longitudinal direction, and the linear portion is formed in the insulating film 5. It overlaps with the linear portion of the magnetic thin film 4 via the. The magnetic thin film 6 has the end portion on the same side as the terminal portion 4a of the magnetic thin film 4 as a portion 6a to be a terminal.
Is formed in a shape that is bent in the direction opposite to the bending of the terminal portion 4a, and the other end portion 6b of the magnetic thin film 6 protrudes from the end portion of the insulating film 5 and directly overlaps with the end portion 4b of the magnetic thin film 4. There is. Therefore, the magnetic thin film 4 and the magnetic thin film 6 are formed so as to have the same magnetoresistive characteristics, and are connected in series and formed to be folded along the line IV-IV. A protective film 7 is further formed on the magnetic thin film 6 so as to cover the magnetic thin film 6 and the other portions of the magnetic thin film 4 excluding the respective terminal portions 6a, 4a.
こうして、二つの磁性薄膜4と磁性薄膜6は基板3の面
に対して垂直方向に重ねられかつ直列に接続されて磁気
抵抗素子8が構成される。In this way, the two magnetic thin films 4 and 6 are stacked in the direction perpendicular to the surface of the substrate 3 and connected in series to form the magnetoresistive element 8.
この磁気抵抗素子8は、第7図に示されているように、
移動方向に周期的に着磁されて繰り返し磁気信号が記録
された記録媒体9の磁気信号記録面に対向して配置され
る。記録媒体9の移動面に対し磁気抵抗素子8はその直
線部分が直交する向きに配置される。磁気抵抗素子8を
構成する磁性薄膜4と磁性薄膜6は記録媒体9との対向
面に対して垂方向に重なり合っているため、上記複数の
磁性薄膜4,6が同時に記録媒体9の同一位置の磁気信号
を検出すると共に、記録媒体9の移動方向に対する二つ
の磁性薄膜4、6の相互間隔は零となり、二つの磁性薄
膜4,6の抵抗変化の位相差は零となる。即ち前記式
(3)におけるaは零であり、第8図にR2で示されてい
るように磁気抵抗素子8の抵抗変化分の振幅は2RΔとな
る。第8図でR1はaが零でないとき、即ち、例えば前記
第20図の従来例のように検出体としての磁性薄膜が互い
にずれている場合の抵抗変化を示している。第8図から
も明らかなように上記実施例によれば、抵抗変化の振幅
が大きくなるという効果がある。This magnetoresistive element 8 is, as shown in FIG.
The recording medium 9 is arranged so as to face the magnetic signal recording surface of the recording medium 9 which is periodically magnetized in the moving direction and repeatedly recorded with magnetic signals. The magnetoresistive element 8 is arranged such that its linear portion is orthogonal to the moving surface of the recording medium 9. Since the magnetic thin films 4 and 6 forming the magnetoresistive element 8 overlap each other in the vertical direction with respect to the surface facing the recording medium 9, the plurality of magnetic thin films 4 and 6 are at the same position on the recording medium 9 at the same time. When a magnetic signal is detected, the mutual distance between the two magnetic thin films 4 and 6 with respect to the moving direction of the recording medium 9 becomes zero, and the phase difference in resistance change between the two magnetic thin films 4 and 6 becomes zero. That is, a in the formula (3) is zero, and the amplitude of the resistance change of the magnetoresistive element 8 is 2RΔ, as indicated by R2 in FIG. In FIG. 8, R1 shows the resistance change when a is not zero, that is, when the magnetic thin films as the detectors are displaced from each other as in the conventional example of FIG. As is clear from FIG. 8, according to the above-mentioned embodiment, there is an effect that the amplitude of resistance change becomes large.
次に、第9図乃至第12図の実施例について説明する。第
9図乃至第12図において、ガラス等の基板10の表面には
磁気抵抗効果を有する強磁性薄膜11が形成されている。
磁性薄膜11は基板10の長手方向の中心線に沿うようにし
て直線状に形成されると共に、一端部が幅広に形成され
て端子部11aとなっている。その上には端子部11aとその
反対側の端部11bとを除い絶縁膜12が形成されている。
絶縁膜12の上にはさらに磁気抵抗効果を有する強磁性薄
膜13が形成されている。磁性薄膜13は第10図にも示され
ているように、基板10の長手方向の中心線に沿うように
して直線状に形成され、絶縁膜12を介して磁性薄膜11と
重なり合っている。磁性薄膜13は、磁性薄膜11の端子部
11aと同じ方の端部が幅広に形成されて端子部部13aとな
っており、この端子部13aは絶縁膜12を挟んで磁性薄膜1
1の端子部11aの一部と重なり合っている。一方、磁性薄
膜13の他端部13bの絶縁膜12の端部からはみ出し、磁性
薄膜11の端子部11aと直接重なり合っている。従って、
磁性薄膜11と磁性薄膜13は基板10の面に対し垂直方向に
重設されると共に直列に接続されることになる。磁性薄
膜13の上にはさらに保護膜14が形成されている。保護膜
14は磁性薄膜11、13の各端子部11a、13aを除く他の部分
を覆うようにして形成されている。Next, the embodiment shown in FIGS. 9 to 12 will be described. In FIGS. 9 to 12, a ferromagnetic thin film 11 having a magnetoresistive effect is formed on the surface of a substrate 10 such as glass.
The magnetic thin film 11 is linearly formed along the center line of the substrate 10 in the longitudinal direction, and one end of the magnetic thin film 11 is formed to be a terminal portion 11a. An insulating film 12 is formed thereon except for the terminal portion 11a and the opposite end portion 11b.
A ferromagnetic thin film 13 having a magnetoresistive effect is further formed on the insulating film 12. As shown in FIG. 10, the magnetic thin film 13 is linearly formed along the longitudinal center line of the substrate 10 and overlaps with the magnetic thin film 11 via the insulating film 12. The magnetic thin film 13 is a terminal portion of the magnetic thin film 11.
The end portion on the same side as 11a is formed wide to form a terminal portion 13a, and the terminal portion 13a sandwiches the insulating film 12 and the magnetic thin film 1a.
It overlaps with a part of the terminal portion 11a of 1. On the other hand, the other end 13b of the magnetic thin film 13 protrudes from the end of the insulating film 12 and directly overlaps with the terminal 11a of the magnetic thin film 11. Therefore,
The magnetic thin film 11 and the magnetic thin film 13 are vertically stacked on the surface of the substrate 10 and are connected in series. A protective film 14 is further formed on the magnetic thin film 13. Protective film
Reference numeral 14 is formed so as to cover other portions of the magnetic thin films 11 and 13 excluding the terminal portions 11a and 13a.
この実施例は、前記第1図乃至第6図の実施例と基本的
には同じであるが、下層の磁性薄膜11の端子部11aを上
層の磁性薄膜13の端子部13aよりも長く伸ばすことによ
り、各磁性薄膜11、13及び絶縁膜12の形状を簡単にした
ものである。磁性薄膜11と磁性薄膜13の磁気検出部分は
同じ磁気抵抗特性をもつ。This embodiment is basically the same as the embodiment of FIGS. 1 to 6 except that the terminal portion 11a of the lower magnetic thin film 11 is made longer than the terminal portion 13a of the upper magnetic thin film 13. Thus, the shapes of the magnetic thin films 11 and 13 and the insulating film 12 are simplified. The magnetic detecting portions of the magnetic thin film 11 and the magnetic thin film 13 have the same magnetoresistive characteristics.
次に第13図乃至第17図の実施例について説明する。この
実施例は、磁気抵抗素子を高インピーダンスにするため
に磁性薄膜が3層になるように重設されている。第13図
乃至第17図において、基板15の表面にはまず磁性薄膜16
が基板15の長手方向の中心線に沿うようにして直線状に
形成され、その一端部は幅広に形成されて端子部16aと
なっている。磁性薄膜16の上には、第14図に示されてい
るように、端子部16aの一部とその反対側の端部16bとを
除いて絶縁膜17が形成されている。絶縁膜17の上には磁
性薄膜18が基板15の長手方向の中心線に沿いかつ絶縁膜
17を挟んで磁性薄膜16と重設するようにして直線状に形
成されている。磁性薄膜18は、磁性薄膜16の端子部16a
側の端部18bが絶縁膜17によって磁性薄膜16から隔離さ
れているが、反対側の端部18aは絶縁膜17の端部からは
み出し、磁性薄膜16の端部16bに直接重なり合ってい
る。磁性薄膜18の上には、第15図にも示されているよう
に絶縁膜19が形成されている。絶縁膜19は磁性薄膜18の
一端部18bを除いて磁性薄膜18の他の部分を総て覆うよ
うに形成されている。絶縁膜19の上にはさらに磁性薄膜
20が基板15の長手方向の中心線に沿いかつ絶縁膜19を挟
んで磁性薄膜18と重設されて直線状に形成されている。
磁性薄膜20は、磁性薄膜16の端子部16a形成側に対し反
対側の端部が幅広に形成されて端子部20aとなってお
り、また、端子部20a形成側に対し反対側の端部20bは絶
縁膜19の端部からはみ出して磁性薄膜18の端部18bに直
接重設されている。このようにして三つの磁性薄膜16、
18、20がそれぞれ絶縁膜17、19で隔離されて基板15の面
に対し垂直方向に3層状に重設されると共に、磁性薄膜
16、18の各端部16b、18a、磁性薄膜18、20の各端部18
b、20bがそれぞれ直接重設されて各磁性薄膜16、18、20
が直列に接続されている。磁性薄膜20の上からは、第16
図、第17図に示されているように、磁性薄膜16の端子部
16aと磁性薄膜20の端子部20aを除いて他の総てが保護膜
21で覆われているが、第13図では図面の錯綜を避けるた
めに保護膜21は描かれていない。各磁性薄膜16、18、20
の磁気検出部分は同じ磁気特性をもつ。Next, the embodiment shown in FIGS. 13 to 17 will be described. In this embodiment, the magnetic thin films are stacked in three layers in order to make the magnetoresistive element have a high impedance. 13 to 17, the magnetic thin film 16 is first formed on the surface of the substrate 15.
Is linearly formed along the center line of the substrate 15 in the longitudinal direction, and one end thereof is formed wide to form the terminal portion 16a. As shown in FIG. 14, an insulating film 17 is formed on the magnetic thin film 16 except for a part of the terminal portion 16a and the end portion 16b on the opposite side. A magnetic thin film 18 is formed on the insulating film 17 along the longitudinal center line of the substrate 15 and
It is linearly formed so as to overlap with the magnetic thin film 16 with the 17 interposed therebetween. The magnetic thin film 18 is the terminal portion 16a of the magnetic thin film 16.
The side end 18b is isolated from the magnetic thin film 16 by the insulating film 17, but the opposite end 18a protrudes from the end of the insulating film 17 and directly overlaps the end 16b of the magnetic thin film 16. An insulating film 19 is formed on the magnetic thin film 18 as shown in FIG. The insulating film 19 is formed so as to cover all the other parts of the magnetic thin film 18 except the one end 18b of the magnetic thin film 18. A magnetic thin film is further formed on the insulating film 19.
Reference numeral 20 is linearly formed along the longitudinal center line of the substrate 15 and overlapped with the magnetic thin film 18 with the insulating film 19 interposed therebetween.
The magnetic thin film 20 has a terminal portion 20a formed by widening the end portion on the opposite side of the magnetic thin film 16 to the terminal portion 16a forming side, and also the end portion 20b on the opposite side to the terminal portion 20a forming side. Is protruded from the end of the insulating film 19 and directly overlapped with the end 18b of the magnetic thin film 18. In this way three magnetic thin films 16,
18 and 20 are separated from each other by insulating films 17 and 19, respectively, and are stacked in three layers in a direction perpendicular to the surface of the substrate 15, and a magnetic thin film.
Ends 16b and 18a of 16 and 18 and ends 18 of magnetic thin films 18 and 20
b and 20b are directly overlapped with each other to form magnetic thin films 16, 18, 20
Are connected in series. From the top of the magnetic thin film 20,
As shown in FIG. 17 and FIG. 17, the terminal portion of the magnetic thin film 16
16a and the terminal portion 20a of the magnetic thin film 20 are all protective films except for
Although it is covered with 21, the protective film 21 is not shown in FIG. 13 in order to avoid complication of the drawing. Each magnetic thin film 16, 18, 20
Has the same magnetic characteristics.
上記実施例に係る磁気抵抗素子も、繰り返し磁気信号が
記録された媒体の移動面に対向させて配置される。各磁
性薄膜16、18、20は上記記録媒体との対向面に対し垂直
方向に重設されることになり、上記複数の磁性薄膜16,1
8,20が同時に上記記録媒体の同一位置の磁気信号を検出
するため、各磁性薄膜16、18、20は記録媒体の移動方向
に対する位置ずれが零で各磁性薄膜16,18,20の抵抗変化
の位相差は零となり、よって抵抗変化の振幅が大きくな
るという利点がある。しかも三つの磁性薄膜16、18、20
が直列に接続されているため、インピーダンスが高くな
るという特徴もある。The magnetoresistive element according to the above embodiment is also arranged so as to face the moving surface of the medium on which the magnetic signal is repeatedly recorded. The magnetic thin films 16, 18 and 20 are stacked vertically in the direction perpendicular to the surface facing the recording medium.
Since each of the magnetic thin films 16, 18 and 20 simultaneously detects the magnetic signal at the same position on the recording medium, the magnetic thin films 16, 18 and 20 have zero displacement with respect to the moving direction of the recording medium and the resistance change of each magnetic thin film 16, 18, 20. Has an advantage that the amplitude of the resistance change becomes large. Moreover, three magnetic thin films 16, 18, 20
Since they are connected in series, the impedance is also high.
次に第18図、第19図の実施例について説明する。この実
施例は、90゜の位相差をもつ抵抗変化をそれぞれ重設さ
れた二つの磁性薄膜でなる検出体を用いて検出するよう
にしたものである。第18図、第19図において、基板22上
には磁気抵抗素子を構成する四つの磁性薄膜23、24、2
5、26が互いに平行に、かつ、互いにλ/8の間隔をおい
て形成されている。上記磁性薄膜23からは端子部23a
が、磁性薄膜24、26からは共通端子部24aが、磁性薄膜2
5からは端子部25aが引き出され、これらの端子部は基板
22の一側縁部に配列した形に形成されている。上記各磁
性薄膜23、24、25、26の上には上記端子部23a、24a、25
aを除いて絶縁膜32が形成されている。なお、第19図に
示されているように、絶縁膜32には、各磁性薄膜23、2
4、25、26の先端部に対向する部分が開放されて上記各
磁性薄膜の幅よりも大きい幅の窓孔32a、32b、32c、32d
が形成され、さらに、上記端子部23a、25a、寄りの部分
が開放されて窓孔32e、32fが形成されている。絶縁膜32
の上からは上記各磁性薄膜23、24、25、26に垂直方向に
重設されて磁気抵抗素子を構成する四つの磁性薄膜27、
28、29、30が形成されている。磁性薄膜27、29からは共
通端子27aが、磁性薄膜28からは端子28aが、磁性薄膜30
からは端子30aがそれぞれ引き出され、端子27aは前記端
子25aの側方に並設され、端子28aは絶縁膜32の窓孔32e
を通して端子23aに直接接続され、端子30aは絶縁膜32の
窓孔32fを通して端子25aに直接接続されている。また、
各磁性薄膜27、28、29、30の先端部は絶縁膜32の各窓孔
32a、22b、32c、32dを通してそれぞれ磁性薄膜23、24、
25、26の先端部に直接接続されている。従って、互いに
重設されている磁性薄膜23、27は端子23a、27a間で直列
接続され、互いに重設されている磁性薄膜24、28は端子
24a、23a間で直列接続され、互いに重設されている磁性
薄膜25、29は端子27a、25a間で直列接続され、互いに重
設されている磁性薄膜26、30は端子24a、25a間で直列接
続されていることになる。各端子23a、24a、25a、27aを
除いて他の部分は保護膜で覆われるが、保護膜は図示さ
れていない。各磁性薄膜は、記録媒体の磁気信号記録面
に対向するように、かつ、長手方向を上記記録媒体の移
動方向に直交させて配設される。従って、互いに重設さ
れ直列接続された磁性薄膜の抵抗変化の位相差は零とな
る。Next, the embodiment shown in FIGS. 18 and 19 will be described. In this embodiment, a resistance change having a phase difference of 90 ° is detected by using a detection body composed of two magnetic thin films that are provided in an overlapping manner. In FIG. 18 and FIG. 19, four magnetic thin films 23, 24, 2 constituting a magnetoresistive element are formed on the substrate 22.
5, 26 are formed in parallel with each other and at a distance of λ / 8 from each other. Terminal portion 23a from the magnetic thin film 23
However, from the magnetic thin films 24 and 26, the common terminal portion 24a is
The terminal parts 25a are pulled out from 5, and these terminal parts are
It is formed in a shape arranged on one side edge of 22. Above the respective magnetic thin films 23, 24, 25, 26, the terminal portions 23a, 24a, 25
The insulating film 32 is formed except for a. As shown in FIG. 19, the insulating film 32 includes magnetic thin films 23, 2
The window holes 32a, 32b, 32c, 32d having a width larger than the width of each of the magnetic thin films described above are open at the portions facing the tips of 4, 25, 26.
And the window portions 32e and 32f are formed by opening the terminal portions 23a and 25a and the portions near them. Insulation film 32
From above, four magnetic thin films 27, which are vertically stacked on each of the magnetic thin films 23, 24, 25, and 26 to form a magnetoresistive element,
28, 29 and 30 are formed. A common terminal 27a is formed from the magnetic thin films 27 and 29, a terminal 28a is formed from the magnetic thin film 28, and a magnetic thin film 30 is formed.
Terminals 30a are respectively drawn from the terminals, terminals 27a are arranged side by side on the terminals 25a, and terminals 28a are windows 32e of the insulating film 32.
Is directly connected to the terminal 23a through the through hole 32f of the insulating film 32 and the terminal 30a is directly connected to the terminal 25a through the window hole 32f of the insulating film 32. Also,
The tip of each magnetic thin film 27, 28, 29, 30 is a window hole of the insulating film 32.
32a, 22b, 32c, 32d through the magnetic thin film 23, 24,
It is directly connected to the tips of 25 and 26. Therefore, the magnetic thin films 23 and 27 that are superposed on each other are connected in series between the terminals 23a and 27a, and the magnetic thin films 24 and 28 that are superposed on each other are the terminals.
Magnetic thin films 25 and 29 that are connected in series between 24a and 23a and are stacked on top of each other are connected in series between terminals 27a and 25a, and magnetic thin films 26 and 30 that are stacked on top of each other are connected in series between terminals 24a and 25a. It is connected. Except for the terminals 23a, 24a, 25a, and 27a, other portions are covered with a protective film, but the protective film is not shown. Each magnetic thin film is arranged so as to face the magnetic signal recording surface of the recording medium, and its longitudinal direction is orthogonal to the moving direction of the recording medium. Therefore, the phase difference of the resistance change of the magnetic thin films that are stacked and connected in series is zero.
この実施例の場合も複数の磁性膜が重設されるため、互
いに重設された磁性膜の抵抗変化の振幅が大きくなると
いう利点がある。Also in the case of this embodiment, since a plurality of magnetic films are superposed, there is an advantage that the amplitude of resistance change of the magnetic films superposed on each other becomes large.
(発明の効果) 本発明によれば、複数の磁性膜を絶縁膜を介して重設し
かつ直列接続して基板上に配設することにより、複数の
全ての磁性膜が同時に記録媒体の同一位置の磁気信号を
検出し、重設された複数の磁性膜の磁気抵抗変化の位相
差を零としたから、検出体としての磁性膜の抵抗変化の
振幅が大きく、大きな出力を得ることができる。また、
複数の磁性膜の一部どうしを、絶縁膜を介在させること
なく重設し直列接続して基板上に配設したため、磁性膜
どうしが基板上で直接接続されることになり、これによ
って、磁性膜どうしの接続手段を素子の外部に新たに設
ける必要がなく、かつ、上記接続手段を基板上に新たに
設ける必要もないから、素子全体を小さくすることがで
きるという効果があるし、上記接続手段の電気抵抗が直
列に付加されることもないから、正確な磁気抵抗効果を
得ることができるという効果がある。さらに、複数の磁
性膜を、記録媒体との対向面に対し垂直方向に、かつ、
記録媒体に極めて近接させた状態で形成することができ
るため、各磁性膜に印加される磁気信号の大きさを大き
く、かつ、ほぼ等しくすることができ、高インピーダン
スで抵抗変化率の大きい磁気抵抗素子を得ることができ
る。(Effect of the Invention) According to the present invention, by arranging a plurality of magnetic films in a stacked manner via an insulating film and connecting them in series and arranging them on the substrate, all of the plurality of magnetic films can be the same in the recording medium Since the magnetic signal at the position is detected and the phase difference of the magnetic resistance change of the plurality of magnetic films arranged in layers is set to zero, the amplitude of the resistance change of the magnetic film as the detector is large and a large output can be obtained. . Also,
The magnetic films are directly connected on the substrate because some of the magnetic films are stacked on each other in series without interposing an insulating film and connected in series, so that the magnetic films are directly connected on the substrate. Since it is not necessary to newly provide a connecting means between the films outside the element, and it is not necessary to newly provide the connecting means on the substrate, there is an effect that the entire element can be made small, and Since the electric resistance of the means is not added in series, there is an effect that an accurate magnetoresistive effect can be obtained. Further, a plurality of magnetic films are provided in a direction perpendicular to the surface facing the recording medium, and
Since the magnetic resistance can be formed in a state of being extremely close to the recording medium, the magnitude of the magnetic signal applied to each magnetic film can be made large and almost equal, and the magnetic resistance has a high impedance and a large resistance change rate. An element can be obtained.
第1図は本発明の一実施例を示す斜面図、第2図は同上
実施例の製造過程の一態様を示す斜面図、第3図は同じ
く製造過程の他の態様を示す斜面図、第4図は第1図中
の線IV−IVに沿う断面図、第5図は第1図中の線V−V
に沿う断面図、第6図は第1図中の線VI−VIに沿う断面
図、第7図は上記実施例の使用態様の例を示す正面図、
第8図は上記実施例に係る磁気抵抗素子によって得られ
る抵抗変化の特性を従来例と比較して示す特性線図、第
9図は本発明の別の実施例を示す斜面図、第10図は同上
実施例の製造過程の一態様を示す斜面図、第11図は第9
図中の線XI−XIに沿う断面図、第12図は第9図中の線XI
I−XIIに沿う断面図、第13図は本発明のさらに別の実施
例を示す斜面図、第14図は同上実施例の製造過程の一態
様を示す斜面図、第15図は同じく製造過程の他の態様を
示す斜面図、第16図は第13図中の線XVI−XVIに沿う断面
図、第17図は第13図中の線XVII−XVIIに沿う断面図、第
18図は本発明のさらに別の実施例を示す斜面図、第19図
は同上実施例の製造過程の一態様を示す斜面図、第20図
は従来の磁気抵抗素子の一例を概略的に示す正面図、第
21図は従来の磁気抵抗素子の別の例を概略的に示す正面
図、第22図は従来の磁気抵抗素子によって得られる抵抗
変化特性を示す特性線図、第23図は本発明の着想を説明
するために従来の磁気抵抗素子と比較して本発明の磁気
抵抗素子の抵抗変化特性を示す特性線図である。 3、10、15、22……基板、 4、6、11、13、16、18、20、23、24、25、26、27、2
8、29、30……磁性膜、 5、12、17、19、32……絶縁膜、 9……記録媒体。FIG. 1 is a perspective view showing an embodiment of the present invention, FIG. 2 is a perspective view showing one aspect of the manufacturing process of the above embodiment, and FIG. 3 is a perspective view showing another aspect of the manufacturing process. FIG. 4 is a sectional view taken along line IV-IV in FIG. 1, and FIG. 5 is line VV in FIG.
6 is a sectional view taken along line VI-VI in FIG. 1, FIG. 7 is a front view showing an example of a mode of use of the above embodiment,
FIG. 8 is a characteristic diagram showing the characteristic of resistance change obtained by the magnetoresistive element according to the above-mentioned embodiment in comparison with the conventional example, and FIG. 9 is a perspective view showing another embodiment of the present invention, FIG. Fig. 11 is a perspective view showing one embodiment of the manufacturing process of the above embodiment,
A sectional view taken along the line XI-XI in the figure, and FIG. 12 is a line XI in FIG.
A sectional view taken along line I-XII, FIG. 13 is a perspective view showing still another embodiment of the present invention, FIG. 14 is a perspective view showing one embodiment of the manufacturing process of the same embodiment, and FIG. 15 is the same manufacturing process. 16 is a sectional view taken along line XVI-XVI in FIG. 13, FIG. 17 is a sectional view taken along line XVII-XVII in FIG. 13,
FIG. 18 is a perspective view showing still another embodiment of the present invention, FIG. 19 is a perspective view showing one embodiment of the manufacturing process of the same embodiment, and FIG. 20 is a schematic view showing one example of a conventional magnetoresistive element. Front view, No.
FIG. 21 is a front view schematically showing another example of the conventional magnetoresistive element, FIG. 22 is a characteristic diagram showing resistance change characteristics obtained by the conventional magnetoresistive element, and FIG. 23 is an idea of the present invention. It is a characteristic diagram which shows the resistance change characteristic of the magnetoresistive element of this invention compared with the conventional magnetoresistive element for description. 3, 10, 15, 22 ... Substrate, 4, 6, 11, 13, 16, 18, 20, 23, 24, 25, 26, 27, 2
8, 29, 30 ... Magnetic film, 5, 12, 17, 19, 32 ... Insulating film, 9 ... Recording medium.
Claims (1)
記録媒体に記録された繰り返し磁気信号を検出する磁気
抵抗素子において、上記磁気抵抗素子を構成する複数の
磁性膜と絶縁膜とを上記記録媒体との対向面に対し垂直
方向に基板の一方面上で交互に重設すると共に、上記複
数の磁性膜の一部どうしを上記絶縁膜を介在させせるこ
となく重設し直列接続して上記基板上に配設することに
より、上記複数の全ての磁性膜が同時に上記記録媒体の
同一位置の磁気信号を検出し、重設された複数の磁性膜
の磁気抵抗変化の位相差を零としたことを特徴とする磁
気抵抗素子。1. A magnetoresistive element for detecting repetitive magnetic signals recorded on a recording medium by arranging them so as to face the recording medium, wherein a plurality of magnetic films and insulating films constituting the magnetoresistive element are recorded. The magnetic layers are alternately stacked on one surface of the substrate in a direction perpendicular to the surface facing the medium, and a part of the plurality of magnetic films are stacked without interposing the insulating film and connected in series to each other. By arranging on the substrate, all of the plurality of magnetic films simultaneously detect magnetic signals at the same position of the recording medium, and the phase difference of the magnetoresistance change of the plurality of magnetic films superposed is made zero. A magnetoresistive element characterized by the above.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59266876A JPH06100477B2 (en) | 1984-12-18 | 1984-12-18 | Magnetoresistive element |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59266876A JPH06100477B2 (en) | 1984-12-18 | 1984-12-18 | Magnetoresistive element |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61144508A JPS61144508A (en) | 1986-07-02 |
| JPH06100477B2 true JPH06100477B2 (en) | 1994-12-12 |
Family
ID=17436876
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59266876A Expired - Lifetime JPH06100477B2 (en) | 1984-12-18 | 1984-12-18 | Magnetoresistive element |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06100477B2 (en) |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS572891U (en) * | 1980-06-04 | 1982-01-08 | ||
| JPS59147213A (en) * | 1983-02-14 | 1984-08-23 | Hitachi Ltd | magnetic rotation sensor |
| JPS59204709A (en) * | 1983-05-10 | 1984-11-20 | Copal Co Ltd | Displacement detector and manufacture thereof |
-
1984
- 1984-12-18 JP JP59266876A patent/JPH06100477B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61144508A (en) | 1986-07-02 |
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