JPH06100554B2 - Automatic exposure control method in surface defect detection method for hot metal materials - Google Patents
Automatic exposure control method in surface defect detection method for hot metal materialsInfo
- Publication number
- JPH06100554B2 JPH06100554B2 JP59212586A JP21258684A JPH06100554B2 JP H06100554 B2 JPH06100554 B2 JP H06100554B2 JP 59212586 A JP59212586 A JP 59212586A JP 21258684 A JP21258684 A JP 21258684A JP H06100554 B2 JPH06100554 B2 JP H06100554B2
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- Prior art keywords
- light
- image sensor
- array image
- linear array
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
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- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Immunology (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Description
【発明の詳細な説明】 （産業上の利用分野） 熱間金属材料の表面欠陥検出において、熱間金属自体か
ら発する熱輻射による輻射光を探傷カメラのリニアアレ
ーイメージセンサーで撮像し、かつ熱間金属の表面を特
定の波長を有する外部照明器で照射し、この反射光も探
傷カメラのリニアアレーイメージセンサーで撮像する際
に各リニアアレーイメージセンサーの受光感度が常に一
定の水準を保つように、受光量の調整範囲を大幅に向上
させるのに有効な手順の開発成果、つまり熱間金属材料
の表面欠陥検出における露光制御方法について以下この
明細書で述べる。DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) In surface defect detection of hot metal materials, radiant light due to heat radiation emitted from the hot metal itself is imaged by a linear array image sensor of a flaw detection camera, and Irradiate the surface of the metal with an external illuminator having a specific wavelength, and when this reflected light is also imaged by the linear array image sensor of the flaw detection camera, the light receiving sensitivity of each linear array image sensor always maintains a constant level, The results of the development of a procedure effective for greatly improving the adjustment range of the amount of received light, that is, the exposure control method for detecting the surface defects of the hot metal material will be described below in this specification.
熱間金属材料、例えば連続鋳造によるような熱間の鋳造
鋼片につき、その熱輻射による輻射光を探傷カメラのリ
ニアアレーイメージセンサーで撮像するとき鋳造鋼片の
熱輻射が鋳造鋼片のすべての位置において均一であるこ
とが要求され、それというのは熱輻射が均一でないと、
探傷カメラのリニアアレーイメージセンサーの受光感度
と常時適合が保証され得ないからである。For hot metal materials, for example, hot cast steel slabs produced by continuous casting, when the radiant light from the radiant heat is imaged by the linear array image sensor of the flaw detection camera It is required to be uniform in position, because if the heat radiation is not uniform,
This is because it is not possible to guarantee that the linear array image sensor of the flaw detection camera is always compatible with the light receiving sensitivity.
一方において熱間金属材料例えば熱間の鋳造鋼片に特定
の波長を有する外部照明器で鋼片表面を照射し、この反
射光を探傷カメラのリニアアレーイメージセンサーで撮
像するときは、鋳造鋼片の表面の性状の如何によって照
射光の反射率が変化することとなるのでやはり適合を成
就し難い。On the other hand, when a hot metal material such as a hot cast steel piece is irradiated on the surface of the steel piece with an external illuminator having a specific wavelength and the reflected light is imaged by a linear array image sensor of a flaw detection camera, the cast steel piece is Since the reflectance of the irradiation light changes depending on the surface properties of the, it is difficult to meet the requirements.
（従来の技術） 上記の点につき従来の方法によると、探傷カメラのリニ
アアレーイメージセンサーの露光感度によって撮像レン
ズの絞り調整を行うことはできるが絞り調整の調整範囲
は探傷カメラのレンズの絞り値より換算すると約2.25倍
程度しかない（絞り値MAX1.8相当）ところに問題を残
し、また、リニアアレーイメージセンサーの露光により
光電変換した電気信号に対して自動利得制御回路（AG
C）により信号利得を補正することもできるが信号利得
補正による調整範囲は探傷カメラによる鋼片の従来のバ
ックグランドノイズ成分より換算すると約15倍程度（信
号レベルＰ−Ｐ−1.5V.バックノイズ0.1V）にとどまり
依然不適合である。(Prior Art) According to the conventional method with respect to the above point, it is possible to adjust the aperture of the imaging lens by the exposure sensitivity of the linear array image sensor of the flaw detection camera, but the adjustment range of the aperture adjustment is the aperture value of the lens of the flaw detection camera. If converted more, there is only a problem of about 2.25 times (equivalent to aperture value MAX1.8), and there is a problem. Also, the automatic gain control circuit (AG
C) can be used to correct the signal gain, but the adjustment range for signal gain correction is about 15 times (signal level P-P-1.5V. Back noise) when converted from the conventional background noise component of the steel piece by the flaw detection camera. 0.1V), but still incompatible.
熱輻射による輻射光の変化は、鉄の分光放射輝度は、波
長１μｍを基準として試算した場合次表のように約800
倍程度（600〜1200℃）の変化となる。The change in radiant light due to thermal radiation is such that the spectral radiance of iron is approximately 800
The change is about double (600-1200 ℃).
以上のように熱輻射の変化量が大きいことにより、レン
ズ絞り及び自動利得制御による調整で熱輻射受光感度上
の適合を図ることは明らかに不可能である。 Since the amount of change in thermal radiation is large as described above, it is apparently impossible to achieve adjustment in terms of thermal radiation receiving sensitivity by adjusting the lens diaphragm and automatic gain control.
（発明が解決しようとする問題点） 一般に鋳造鋼片の温度分布は例えば鋳造鋼片の幅方向に
対して中央部分は約1000℃、端部では750℃の如く温度
勾配をもっている。(Problems to be Solved by the Invention) Generally, the temperature distribution of a cast steel slab has a temperature gradient such as about 1000 ° C. at the center and 750 ° C. at the end with respect to the width direction of the cast steel slab.
同様に鋳造鋼片の長手方向においても鋳造条件によって
時々刻々温度変化を伴っている。Similarly, in the longitudinal direction of the cast steel slab, the temperature changes with time depending on the casting conditions.
熱輻射を感知する探傷カメラのリニアアレーイメージセ
ンサーの露光感度は、特に鋼片の長手方向の温度変化に
よって著しく熱輻射が増減して、大幅な感度変化がもた
らされるのは不可避である。Regarding the exposure sensitivity of the linear array image sensor of the flaw detection camera that detects thermal radiation, it is inevitable that the thermal radiation is remarkably increased / decreased due to the temperature change in the longitudinal direction of the steel slab, resulting in a large sensitivity change.
すなわち温度の高い部分においては、露光感度が飽和と
なり一方温度の低い部分においては露光感度不足となっ
て探傷信号としては出力され得ない状態となるからで、
この点従来技術によって対処することができない理由は
すでにのべた。That is, the exposure sensitivity becomes saturated in the high temperature portion, while the exposure sensitivity becomes insufficient in the low temperature portion, so that it cannot be output as a flaw detection signal.
In this regard, the reason why the conventional techniques cannot deal with the problems has already been mentioned.
一方、鋳造鋼片の表面反射率に影響を与える要因につい
ては主として鋳造鋼片の表面に発生するスケールで、も
ちろんスケールの発生が多いと反射率が低下し、従って
外部照明による反射光を利用する探傷カメラのリニアア
レーイメージセンサーの露光感度は反射率が変動するた
め大幅な感度変化を生じる。On the other hand, the factors that affect the surface reflectance of the cast steel slab are mainly scales that occur on the surface of the cast steel slab, and of course the scale decreases when the scale is large, so the light reflected by external lighting is used. The exposure sensitivity of the linear array image sensor of the flaw detection camera changes significantly because the reflectance changes.
すなわちスケール発生がないか又はスケールはく離を生
じた部分では反射率が高く従って露光感度が飽和とな
り、スケール発生が多いか又はスケール層の厚い部分に
おいては露光感度不足となり探傷信号として使用できな
くなる。That is, the reflectance is high at the portion where no scale is generated or the scale is peeled off, and the exposure sensitivity is saturated, and the exposure sensitivity is insufficient at the portion where the scale is large or the scale layer is thick and cannot be used as a flaw detection signal.
鋳造鋼片の発生するスケールの成長状況は種々の要因に
よって一様ではなく、鋳造鋼片の鋳込長手方向について
は殊にこのような傾向が著しい。The state of scale growth of cast steel slabs is not uniform due to various factors, and this tendency is particularly remarkable in the casting longitudinal direction of the cast steel slabs.
以上のように、鋳造鋼片の熱輻射及び該鋼片表面におけ
る反射光が共に変動する状態で使用されるような探傷カ
メラのリニアアレーイメージセンサーの露光感度は、輻
射光、反射光の双方とも常に不安定で、探傷精度に重大
な問題を生じていたのである。As described above, the exposure sensitivity of the linear array image sensor of the flaw detection camera, which is used in a state in which both the heat radiation of the cast steel slab and the reflected light on the surface of the steel slab are varied, the radiant light and the reflected light are both It was always unstable and caused serious problems in flaw detection accuracy.
そこで探傷カメラの熱輻射による輻射光感知用のリニア
アレーイメージセンサー及び外部照明光による反射光感
知用のリニアアレーイメージセンサーについては、各々
毎に露光感度を常に一定に保つ手だてを講じて上に述べ
た変動要因による感度水準の変動を除外し探傷精度を保
持及び向上させることがこの発明の目的である。Therefore, regarding the linear array image sensor for detecting the radiant light due to the thermal radiation of the flaw detection camera and the linear array image sensor for detecting the reflected light by the external illumination light, the above-mentioned measures are taken to keep the exposure sensitivity constant. It is an object of the present invention to maintain and improve the flaw detection accuracy by eliminating the fluctuation of the sensitivity level due to the fluctuation factors.
（問題点を解決するための手段） この発明は、熱間金属自体が発する輻射光と、外部照明
による反射光とを同一位置で同時に撮像する探傷カメラ
を用いる熱間金属材料の表面欠陥検出方法において、前
記探傷カメラに使用する輻射光用と反射光用の各リニア
アレーイメージセンサーの撮像感度の差異を均一化する
露光制御にあたり、 輻射光を受光するリニアアレーイメージセンサーの受光
量の平均光量を求めこれを輻射光目標光量と比較し、 一方反射光を受光するリニアアレーイメージセンサーの
受光量の平均光量を求めこれを反射光目標光量と比較
し、 前記輻射光と輻射光目標光量の偏差及び前記反射光と反
射光目標光量の偏差にもとづいて、各別に前記各リニア
アレーイメージセンサーの光電変換スタートパルスの間
隔を変えることによって受光時間を制御し、常にリニア
アレーイメージセンサーの露光感度水準を一定に保持す
ること、を特徴とする熱間金属材料の表面欠陥検出方法
における自動露光制御方法である。(Means for Solving Problems) The present invention relates to a method for detecting a surface defect of a hot metal material using a flaw detection camera that simultaneously picks up radiation light emitted by the hot metal itself and light reflected by external illumination at the same position. In the exposure control to equalize the difference in the imaging sensitivity of each linear array image sensor for radiant light and reflected light used in the flaw detection camera, the average light amount of the received light of the linear array image sensor that receives the radiant light is set. Obtained and compare this with the radiant light target light amount, meanwhile determine the average light amount of the received light amount of the linear array image sensor that receives the reflected light and compare it with the reflected light target light amount, the deviation of the radiant light and the radiant light target light amount and Changing the interval of the photoelectric conversion start pulse of each of the linear array image sensors separately based on the difference between the reflected light and the target amount of reflected light. Therefore, it is an automatic exposure control method in a surface defect detection method for a hot metal material, characterized in that the light receiving time is controlled and the exposure sensitivity level of the linear array image sensor is always kept constant.
ここに探傷精度を保持若しくは向上させるには、リニア
アレーイメージセンサーの感度水準が常に適当水準にあ
ることが必要で、水準が高すぎて飽和しても、水準が低
くすぎても目的に適わないことはすでに明らかにしたと
おりである。In order to maintain or improve the flaw detection accuracy, it is necessary that the sensitivity level of the linear array image sensor is always at an appropriate level. If the level is too high and saturated, or if the level is too low, it is not suitable for the purpose. This is as we have already clarified.
（作用） 従来の表面欠陥検出装置においては、探傷カメラの出力
信号が前掲の理由によって変動するため欠陥部のS/Nも
出力信号の変動によって左右されS/Nが十分に得られて
いない状態の時に欠陥部が探傷カメラの視野部を通過す
ると欠陥を見逃すことがあったのに反してこの発明の自
動露光制御によると、探傷カメラの出力信号は、偏差演
算−フィードバックによる露光時間制御を行っているか
ら、常に一定の出力信号水準にあり従ってS/Nも常に良
好な状態に保つことができるわけである。(Function) In the conventional surface defect detection device, since the output signal of the flaw detection camera fluctuates due to the reasons described above, the S / N of the defective portion is also affected by the fluctuation of the output signal and the S / N is not sufficiently obtained. When the defective portion passed the field of view of the flaw detection camera at that time, the defect was sometimes missed. On the contrary, according to the automatic exposure control of the present invention, the output signal of the flaw detection camera performs the exposure time control by the deviation calculation-feedback. Therefore, the output signal level is always constant, so that the S / N can always be kept in a good state.
（実施例） さて第１図に探傷カメラの光学構成を示し、図中１は輻
射光用リニアアレーイメージセンサー、２は反射光用リ
ニアアレーイメージセンサーであり、３は熱間の鋳造鋼
片、４はレンズ、５はレンズ絞り調整装置であり、６が
イメージセンサー駆動増幅回路である。(Embodiment) Now, FIG. 1 shows an optical configuration of a flaw detection camera. In FIG. 1, 1 is a linear array image sensor for radiant light, 2 is a linear array image sensor for reflected light, 3 is a hot cast steel slab, Reference numeral 4 is a lens, 5 is a lens diaphragm adjusting device, and 6 is an image sensor drive amplification circuit.
各リニアアレーイメージセンサー1,2の光電変換信号に
より鋳造鋼片３の表面像から欠陥を検出するとき、欠陥
信号のS/Nが重大な抽出要件となる。When a defect is detected from the surface image of the cast steel slab 3 by the photoelectric conversion signals of the linear array image sensors 1 and 2, the S / N of the defect signal is an important extraction requirement.
欠陥信号のS/Nは、リニアアレーイメージセンサーの感
度水準と密接な関係にあり、第２図に示す如く感度水準
がバックグランドレベルで0.5〜1Vの間にない場合に
は、S/Nは指数関数的に悪くなる。The S / N of the defect signal is closely related to the sensitivity level of the linear array image sensor. If the sensitivity level is not within the background level of 0.5 to 1V as shown in Fig. 2, the S / N is Exponentially worse.
探傷カメラは同一光学系の中に配置した輻射光用リニア
アレーイメージセンサーと熱輻射とは非干渉な波長を含
む外部照明による反射光用リニアアレーイメージセンサ
ーとで構成し鋳造鋼片の表面像の同一点を同時に撮像す
る構成であるから、熱輻射の輻射光及び外部照明の反射
光それぞれの諸条件に対応しておのおのの露光感度を適
正水準に保つよう制御しなければならない。The flaw detection camera is composed of a linear array image sensor for radiant light arranged in the same optical system and a linear array image sensor for reflected light by external illumination including a wavelength that does not interfere with thermal radiation. Since the same point is imaged at the same time, it is necessary to control the exposure sensitivity to an appropriate level in accordance with various conditions of the radiant light of thermal radiation and the reflected light of external illumination.
また光学系は、輻射光と、反射光について同一光学系と
する必要上から、レンズ絞り制御については相互の感度
水準の条件差異から制限されることになる。Further, since the optical system needs to use the same optical system for the radiated light and the reflected light, the lens diaphragm control is limited due to the mutual difference in sensitivity level conditions.
以上のような関係構成より、それぞれの感度水準を一定
に保つ露光制御方法は、それぞれリニアアレーイメージ
センサーの露光時間周期を次のように制御することによ
って達成される。With the above-described relational structure, the exposure control method for keeping the respective sensitivity levels constant can be achieved by controlling the exposure time period of each linear array image sensor as follows.
すなわち鋳造鋼片から発した熱輻射による輻射光用リニ
アアレーイメージセンサー１及び外部照明光の鋳造鋼片
表面での反射光用リニアアレーイメージセンサー各別に
受光量の平均光量を求め、これを目標光量を比較して、
それらの偏差にもとづき前記各リニアアレーイメージセ
ンサーの光電変換スタートパルスの間隔を変える。That is, the average light quantity of the received light quantity is obtained for each of the linear array image sensor 1 for radiant light due to the heat radiation emitted from the cast steel piece and the linear array image sensor for reflected light on the surface of the cast steel piece of external illumination light, and this is calculated as the target light quantity. Compare
The interval of the photoelectric conversion start pulse of each linear array image sensor is changed based on those deviations.
これによってリニアアレーイメージセンサーの露光時間
を制御し、常に感度信号レベルを一定とするようにする
ことができる。As a result, the exposure time of the linear array image sensor can be controlled so that the sensitivity signal level is always constant.
更に詳しくは第３図においてリニアアレーイメージセン
サー1,2からの光電変換した入力信号をL.P.F7、データ
サンプリング制御回路12、平均回路９、ゲイン設定回路
10、露光時間制御回路11、スタートパルス５によってこ
の信号の外挿線を求める。More specifically, referring to FIG. 3, the input signals photoelectrically converted from the linear array image sensors 1 and 2 are LPF7, data sampling control circuit 12, averaging circuit 9, and gain setting circuit.
10, the exposure time control circuit 11 and the start pulse 5 determine the extrapolation line of this signal.
この外挿線から一走査中の表値を、光量データサンプリ
ング制御回路12からの印加パルスで光量サンプリング８
を介してこのデータｎ点を平均回路９で平均し、ゲイン
設定回路10で目標光量との差を算出し偏差量によって必
要な露光時間の変更量を算出する。The table value during one scan from this extrapolation line is used for the light quantity sampling 8 by the applied pulse from the light quantity data sampling control circuit 12.
The n points of the data are averaged by the averaging circuit 9, and the difference from the target light amount is calculated by the gain setting circuit 10, and the necessary exposure time change amount is calculated by the deviation amount.
この演算結果を露光時間制御回路11に入力してリニアア
レーイメージセンサー1,2の光電変換スタートパルス５
の間隔を変えて露光時間を制御する。This calculation result is input to the exposure time control circuit 11 and the photoelectric conversion start pulse 5 of the linear array image sensors 1 and 2 is input.
The exposure time is controlled by changing the interval of.
このようにして探傷カメラの出力信号は、常に一定の信
号レベルをもって出力することができたのである。In this way, the output signal of the flaw detection camera could always be output with a constant signal level.
（発明の効果） 従来信号水準の変動によって不可避に生じていた欠陥部
の見逃しについては、この発明に従い自動露光制御を組
み込むことによって、信号水準を一定に保つことができ
ることのために皆無となり、かくして熱間金属材料表面
の欠陥につき確実な検出が可能になった。(Effects of the Invention) With respect to the missed defect portion which has been inevitably caused by the fluctuation of the signal level in the past, there is no defect because the signal level can be kept constant by incorporating the automatic exposure control according to the present invention. It has become possible to reliably detect defects on the surface of hot metal materials.
第１図は探傷カメラの光学構成を示すスケルトン図、 第２図はリニアアレーイメージセンサーの平均感度レベ
ルとS/N比との関係を示すグラフであり、 第３図は露光制御回路ブロック図である。Fig. 1 is a skeleton diagram showing the optical configuration of the flaw detection camera, Fig. 2 is a graph showing the relationship between the average sensitivity level of the linear array image sensor and the S / N ratio, and Fig. 3 is an exposure control circuit block diagram. is there.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 花房 秀行 香川県高松市林町1217番地 株式会社ヒユ ーテツク内 (56)参考文献 特開 昭51−46019（ＪＰ，Ａ) 特開 昭58−168943（ＪＰ，Ａ) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Hideyuki Hanabusa, Inventor Hideyuki Hanafusa 1217 Hayashi-cho, Takamatsu City, Kagawa Prefecture (56) References JP-A-51-46019 (JP, A) JP-A-58-168943 (JP-A) JP, A)
Claims (1)
よる反射光とを、同一位置で同時に撮像する探傷カメラ
を用いる熱間金属材料の表面欠陥検出方法において、前
記探傷カメラに使用する輻射光用と反射光用の各リニア
アレーイメージセンサーの撮像感度の差異を均一化する
露光制御にあたり、 輻射光を受光するリニアアレーイメージセンサーの受光
量の平均光量を求めこれを輻射光目標光量と比較し、 一方反射光を受光するリニアアレーイメージセンサーの
受光量の平均光量を求めこれを反射光目標光量と比較
し、 前記輻射光と輻射光目標光量の偏差及び前記反射光と反
射光目標光量の偏差にもとづいて、各別に前記各リニア
アレーイメージセンサーの光電変換スタートパルスの間
隔を変えることによって受光時間を制御し、常にリニア
アレーイメージセンサーの露光感度水準を一定に保持す
ること を特徴とする熱間金属材料の表面欠陥検出方法における
自動露光制御方法。1. A method for detecting a surface defect of a hot metal material using a flaw detection camera that simultaneously picks up radiation light emitted by the hot metal itself and light reflected by external illumination at the same position, and the radiation used for the flaw detection camera. For exposure control to equalize the difference in image sensitivity between the linear array image sensor for light and the reflected light, calculate the average amount of light received by the linear array image sensor that receives radiant light and compare it with the target amount of radiant light. On the other hand, the average light amount of the received light amount of the linear array image sensor that receives the reflected light is obtained and compared with the reflected light target light amount, and the deviation between the radiated light and the radiated light target light amount and the reflected light and the reflected light target light amount The light receiving time is controlled by changing the interval of the photoelectric conversion start pulse of each linear array image sensor based on the deviation, and the light receiving time is controlled constantly. Automatic exposure control method in surface defect detection method of hot metal material, characterized in that for holding the exposure sensitivity levels of A array image sensor constant.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59212586A JPH06100554B2 (en) | 1984-10-12 | 1984-10-12 | Automatic exposure control method in surface defect detection method for hot metal materials |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59212586A JPH06100554B2 (en) | 1984-10-12 | 1984-10-12 | Automatic exposure control method in surface defect detection method for hot metal materials |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6191544A JPS6191544A (en) | 1986-05-09 |
| JPH06100554B2 true JPH06100554B2 (en) | 1994-12-12 |
Family
ID=16625152
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59212586A Expired - Lifetime JPH06100554B2 (en) | 1984-10-12 | 1984-10-12 | Automatic exposure control method in surface defect detection method for hot metal materials |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06100554B2 (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02171608A (en) * | 1988-12-23 | 1990-07-03 | Toyota Central Res & Dev Lab Inc | Distance/angle measuring device |
| JP4603306B2 (en) * | 2004-07-26 | 2010-12-22 | オリンパス株式会社 | Imaging apparatus and imaging method |
| JP5043755B2 (en) * | 2008-06-05 | 2012-10-10 | 住友化学株式会社 | Resin material inspection device and program |
| CN110702723B (en) * | 2018-07-09 | 2022-11-25 | 浙江清华柔性电子技术研究院 | Imaging system and method for high temperature wind tunnel |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5918904B2 (en) * | 1974-10-18 | 1984-05-01 | 株式会社リコー | Image sensor sensitivity adjustment method |
| JPS5315160A (en) * | 1976-07-27 | 1978-02-10 | Nippon Steel Corp | Sensitivity controller of self-scan image sensor in thermal radiating object measuring apparatus |
| JPS58168943A (en) * | 1982-03-30 | 1983-10-05 | Sumitomo Metal Ind Ltd | Method for judging surface condition of high-temperature material |
-
1984
- 1984-10-12 JP JP59212586A patent/JPH06100554B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6191544A (en) | 1986-05-09 |
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