JPH06102589B2 - Single crystal manufacturing method and manufacturing apparatus - Google Patents
Single crystal manufacturing method and manufacturing apparatusInfo
- Publication number
- JPH06102589B2 JPH06102589B2 JP60026742A JP2674285A JPH06102589B2 JP H06102589 B2 JPH06102589 B2 JP H06102589B2 JP 60026742 A JP60026742 A JP 60026742A JP 2674285 A JP2674285 A JP 2674285A JP H06102589 B2 JPH06102589 B2 JP H06102589B2
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- raw material
- material melt
- region
- single crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/30—Mechanisms for rotating or moving either the melt or the crystal
- C30B15/305—Stirring of the melt
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】 〔発明の技術分野〕 本発明は、単結晶の製造技術に係わり、特に磁界を印加
して導電性の原料融液から単結晶を引上げ製造する、液
体封止引上げ法による単結晶の製造方法及び製造装置に
関する。Description: TECHNICAL FIELD OF THE INVENTION The present invention relates to a technique for producing a single crystal, and in particular, a liquid sealing pulling method for pulling and producing a single crystal from a conductive raw material melt by applying a magnetic field. The present invention relates to a method and an apparatus for producing a single crystal.
従来、半導体工業で使用される単結晶基板は、原料融液
から引上げ法(CZ法)により製造されたインゴットを切
出して作成されている。そして、近年の半導体集積回路
の高密度化及び高集積化に伴い、基板となる半導体単結
晶の高均一化が強く要望されている。Conventionally, a single crystal substrate used in the semiconductor industry has been produced by cutting out an ingot produced from a raw material melt by a pulling method (CZ method). With the recent trend toward higher density and higher integration of semiconductor integrated circuits, there is a strong demand for higher uniformity of the semiconductor single crystal serving as the substrate.
しかしながら、液体封止引上げ法によって作成されたII
I−V族化合物単結晶基板は、高密度集積回路を作製す
るのに十分な均一性を有していない。即ち、液体封止引
上げ法ではルツボ内に収容された原料融液内に激しい熱
対流があり、この融液と作成結晶との界面は非常に不安
定になっている。このため、作成結晶から切出した基板
は均一性が低く、従ってこの基板を用いて高密度集積回
路を歩留り良く作製することは困難であった。However, II created by liquid encapsulation pulling method
Group IV compound single crystal substrates do not have sufficient uniformity to make high density integrated circuits. That is, in the liquid sealing pulling method, there is intense thermal convection in the raw material melt contained in the crucible, and the interface between the melt and the prepared crystal is extremely unstable. For this reason, the substrate cut out from the formed crystal has low uniformity, and thus it is difficult to produce a high-density integrated circuit using this substrate with high yield.
一方、上記問題を解決する方法として最近、原料融液に
水平方向の磁界を印加することにより、原料融液の熱対
流を抑制して均一性良い単結晶を製造する方法が注目さ
れている。しかし、この方法では、印加磁界の適正範囲
が狭く、熱対流を効果的に抑えることは極めて困難であ
った。On the other hand, as a method for solving the above-mentioned problems, a method of applying a horizontal magnetic field to the raw material melt to suppress thermal convection of the raw material melt to produce a single crystal with good uniformity has recently attracted attention. However, with this method, the appropriate range of the applied magnetic field is narrow, and it is extremely difficult to effectively suppress thermal convection.
本発明は上記の事情を考慮してなされたもので、その目
的とするところは、原料融液内の熱対流を効果的に抑制
することができ、均一性の高いIII−V族化合物単結晶
を容易に製造することのできる単結晶の製造方法を提供
することにある。The present invention has been made in view of the above circumstances, and an object thereof is to provide a highly uniform III-V group compound single crystal capable of effectively suppressing thermal convection in a raw material melt. Another object of the present invention is to provide a method for producing a single crystal, which enables easy production.
また、本発明の他の目的は、上記方法を実施するための
単結晶の製造装置を提供することにある。Another object of the present invention is to provide an apparatus for producing a single crystal for carrying out the above method.
本発明の骨子は、磁界印加に対する熱振動特性の知見に
基づき、熱振動が十分小さく、且つ磁界印加強度の適正
範囲が十分広い範囲の磁界を印加することにある。The essence of the present invention is to apply a magnetic field in which thermal vibration is sufficiently small and a proper range of magnetic field application strength is sufficiently wide, based on the knowledge of thermal vibration characteristics with respect to magnetic field application.
即ち本発明は、ルツボ内に収容されたIII−V族半導体
からなる原料融液上に液体カプセル層を形成し、この原
料融液に水平方向の磁界を印加すると共に、この原料融
液に種結晶を接触させ該種結晶を垂直方向に引上げるこ
とにより単結晶を引上げ製造する単結晶の製造方法にお
いて、磁界強度の変化に伴う熱振動特性に関し磁界強度
が増大する方向に、熱振動の大きい第1の領域、熱振動
が小さくなる第2の領域、熱振動が再び大きくなる第3
の領域、熱振動が再び小さくなる第4の領域とすると
き、前記原料融液に印加する磁界の強度を上記第4の領
域となる大きさに設定するようにした方法である。That is, according to the present invention, a liquid capsule layer is formed on a raw material melt made of a III-V semiconductor contained in a crucible, a horizontal magnetic field is applied to the raw material melt, and the raw material melt is seeded. In a method for producing a single crystal by pulling the seed crystal vertically by bringing the crystals into contact with each other and pulling the seed crystal in a vertical direction, thermal vibration is large in the direction in which the magnetic field strength increases with respect to the thermal vibration characteristics accompanying changes in the magnetic field strength. The first region, the second region where the thermal vibration becomes small, the third region where the thermal vibration becomes large again.
When the region (4) and the fourth region in which the thermal vibration is reduced again are set, the strength of the magnetic field applied to the raw material melt is set to the magnitude of the above-mentioned fourth region.
また本発明は、III−V族半導体からなる原料融液及び
その上に形成される液体カプセル層を収容したルツボ
と、このルツボ内の原料融液を加熱するヒータと、上記
原料融液に水平方向の磁界を印加するマグネットとを具
備し、上記原料融液に種結晶を接触させ該種結晶を引上
げることにより単結晶を引上げ製造する単結晶の製造装
置において、前記磁界印加による原料融液の熱振動特性
に関し磁界強度が増大する方向に、熱振動の大きい第1
の領域、熱振動が小さくなる第2の領域、熱振動が再び
大きくなる第3の領域、熱振動が再び小さくなる第4の
領域とするとき、前記マグネットの励磁電流の大きさを
前記原料融液に印加する磁界の強度が上記第4の領域と
なる大きさに設定するようにしたものである。The present invention also relates to a crucible containing a raw material melt composed of a III-V semiconductor and a liquid capsule layer formed thereon, a heater for heating the raw material melt in the crucible, and a horizontal member for the raw material melt. A magnet for applying a magnetic field in a direction, wherein a single crystal is pulled up to produce a single crystal by bringing a seed crystal into contact with the raw material melt and pulling the seed crystal to produce a raw material melt by applying the magnetic field. With respect to the thermal vibration characteristics of the
, The second region where the thermal vibration becomes small, the third region where the thermal vibration becomes large again, and the fourth region where the thermal vibration becomes small again, the magnitude of the exciting current of the magnet is set to The strength of the magnetic field applied to the liquid is set so as to be the above-mentioned fourth region.
本発明によれば、原料融液内の熱振動の小さい安定した
領域でIII−V族化合物単結晶の引上げを行うことがで
きるので、均一性の良い高品質の単結晶を製造すること
ができる。また、第2の領域で引上げを行う方法と異な
り、印加磁界の適正範囲が広いので、磁界の安定性の要
求も厳密でなく、単結晶製造を容易に行うことができ
る。According to the present invention, since the III-V group compound single crystal can be pulled in a stable region in the raw material melt in which thermal vibration is small, it is possible to manufacture a high-quality single crystal with good uniformity. . In addition, unlike the method of pulling in the second region, since the appropriate range of the applied magnetic field is wide, the requirements for the stability of the magnetic field are not strict, and the single crystal can be easily manufactured.
まず、実施例を説明する前に、本発明の基本原理につい
て説明する。First, before describing the embodiments, the basic principle of the present invention will be described.
本発明者等は、印加磁界強度に対する原料融液内の熱振
動の変化を克明に調べた結果、第1図に示す如き特性を
得た。ここで、横軸は時間t、縦軸は融液温度[℃]を
示し、さらに↑は概略磁界強度[Oe]を示す。また、図
中太線に示すのは原料融液を収容したルツボ内の中央部
の温度であり、細線で示すのは周辺部の温度である。な
お、原料融液としてはGaAsを用た。また、温度測定は第
2図に示す如くルツボ21の中央部及び中央部から35[m
m]離れた点に、それぞれ温度センサとしての熱電対24
(24a,24b)を石英管25(25a,25b)でカバーしたものを
カプセル層23の原料融液22内に挿入して行った。The inventors of the present invention have scrutinized the changes in thermal vibrations in the raw material melt with respect to the applied magnetic field strength, and have obtained the characteristics shown in FIG. Here, the horizontal axis represents time t, the vertical axis represents melt temperature [° C.], and ↑ represents approximate magnetic field strength [Oe]. Also, the thick line in the figure indicates the temperature of the central portion inside the crucible containing the raw material melt, and the thin line indicates the temperature of the peripheral portion. GaAs was used as the raw material melt. As shown in Fig. 2, the temperature is measured at the center of the crucible 21 and at 35 [m from the center.
m], the thermocouples 24 as temperature sensors
(24a, 24b) covered with a quartz tube 25 (25a, 25b) was inserted into the raw material melt 22 of the capsule layer 23.
第1図に示す特性から判るように、磁界強度が小さい領
域では熱振動が大きく、磁界強度が1200[Oe]に近付く
につれて熱振動は小さくなる。磁界強度が1200[Oe]前
後で熱振動は最小となり、磁界強度が1300[Oe]を越え
ると再び熱振動が大きくなる。ここまでの特性は周知で
あり、従って従来は熱振動の最も小さい1200[Oe]前後
の磁界強度の領域で結晶引上げを行っていた。今回、本
発明者等が磁界強度を更に上げてみたところ、磁界強度
が3000[Oe]を越えると再び熱振動が小さくなり、さら
に磁界強度が3500[Oe]を越えると熱振動が極めて小さ
くなることが判明した。そして、この熱振動が小さい領
域が数万[Oe]になっても続くことが判明した。従っ
て、この領域で単結晶の引上げを行えば、均一性の良い
単結晶製造が可能になると推定される。As can be seen from the characteristics shown in FIG. 1, the thermal vibration is large in the region where the magnetic field strength is small, and becomes smaller as the magnetic field strength approaches 1200 [Oe]. The thermal vibration becomes minimum when the magnetic field strength is around 1200 [Oe], and the thermal vibration becomes large again when the magnetic field strength exceeds 1300 [Oe]. The characteristics up to this point are well known. Therefore, conventionally, crystal pulling was performed in the region of magnetic field strength around 1200 [Oe] where the thermal vibration is the smallest. When the inventors of the present invention further increased the magnetic field strength, the thermal vibration becomes small again when the magnetic field strength exceeds 3000 [Oe], and the thermal vibration becomes extremely small when the magnetic field strength exceeds 3500 [Oe]. It has been found. Then, it was found that even if the region where this thermal vibration is small reaches tens of thousands [Oe], it continues. Therefore, if the single crystal is pulled in this region, it is presumed that the single crystal can be manufactured with good uniformity.
ここで、第1図に示す原料融液の中央部の温度特性を熱
振動に関してまとめると、第3図に模式化して示す如く
現わすことができる。これを、熱振動の大小により領域
分けすると次のようになる。即ち、磁界印加から1150
[Oe]程度の磁界強度までの熱振動の大きい第1の領
域、磁界強度が1150〜1250[Oe]程度の熱振動が小さく
なる第2の領域、磁界強度が1250〜3000[Oe]程度の熱
振動が再び大きくなる第3の領域、3000[Oe]の磁界強
度を越える熱振動が再び小さくなる第4の領域とに分け
られる。Here, the temperature characteristics of the central portion of the raw material melt shown in FIG. 1 can be summarized with respect to thermal vibration, and can be expressed as schematically shown in FIG. This is divided into regions according to the magnitude of thermal vibration as follows. That is, 1150
The first region where the thermal vibration is large up to a magnetic field strength of about [Oe], the second region where the magnetic vibration is small about 1150 to 1250 [Oe], the magnetic field strength is about 1250 to 3000 [Oe] It is divided into a third region where the thermal vibration becomes large again and a fourth region where the thermal vibration exceeding the magnetic field strength of 3000 [Oe] becomes small again.
ここで、注目すべき点は、第2の領域では熱振動が確か
に小さいが、その範囲が極めて狭いと云うことである。
これは、第2の領域で単結晶の引上げを行う場合、磁界
強度その他(ルツボ温度や回転数等)成長条件に対する
依存性が高く、再現性に欠けることを意味する。これに
対し、第4の領域では熱振動が小さく且つその範囲が十
分に広い。従って、第4の領域で単結晶の引上げを行う
場合、磁界強度の多少の変動に関係なく、常に熱振動の
小さい状態で単結晶の製造を行うことが可能となる。つ
まり、成長条件依存性が低く、再現性の向上を期待する
ことができるのである。Here, it should be noted that although the thermal vibration is certainly small in the second region, its range is extremely narrow.
This means that when pulling a single crystal in the second region, it is highly dependent on the magnetic field strength and other growth conditions (crucible temperature, rotation speed, etc.) and lacks reproducibility. On the other hand, thermal vibration is small and the range is sufficiently wide in the fourth region. Therefore, when pulling the single crystal in the fourth region, it is possible to always manufacture the single crystal in a state in which thermal vibration is small, irrespective of some variation in magnetic field strength. In other words, the growth condition dependency is low, and improvement in reproducibility can be expected.
なお、第1図には示さないが、磁界強度が数万[Oe]に
なるに伴い、原料融液の中央部と周辺部との温度差は増
大する傾向にある。この温度差があまり大きくなり過ぎ
ると結晶の転位密度の増殖を招くことになる。本発明者
等の実験によれば、10000[Oe]程度の磁界強度まで
は、結晶の転位密度が十分小さい範囲で単結晶の製造を
行うことが可能であった。また、第3図に示す特性はGa
Asの場合であり、成長条件や製造する単結晶が異なると
(特に原料融液の電気導電度が異なると)、この特性も
異なったものとなる。しかし、第1乃至第4の領域が現
われることには代りなく、従って製造するIII−V族化
合物単結晶が変わってもその時の第4の領域で単結晶の
引上げを行えばよい。Although not shown in FIG. 1, the temperature difference between the central portion and the peripheral portion of the raw material melt tends to increase as the magnetic field strength reaches tens of thousands [Oe]. If this temperature difference becomes too large, the dislocation density of crystals will increase. According to the experiments conducted by the present inventors, it was possible to manufacture a single crystal within a range in which the dislocation density of the crystal was sufficiently small up to a magnetic field strength of about 10,000 [Oe]. The characteristics shown in FIG. 3 are Ga
This is the case of As, and if the growth conditions and the single crystal to be manufactured are different (especially, the electric conductivity of the raw material melt is different), the characteristics are also different. However, the first to fourth regions do not appear, and therefore, even if the manufactured III-V compound single crystal is changed, the single crystal may be pulled up in the fourth region at that time.
以下、本発明の一実施例を図面を参照して製造する。第
4図は同実施例に係わる単結晶製造装置の概略構成を示
す断面図である。Hereinafter, one embodiment of the present invention will be manufactured with reference to the drawings. FIG. 4 is a sectional view showing a schematic structure of a single crystal manufacturing apparatus according to the same embodiment.
図中41はステンレス鋼等からなる高圧容器であり、この
容器41内には、ルツボ42,ルツボ受け43,ヒータ44及び熱
遮蔽体45等がそれぞれ収容され、また容器41の外部には
マグネット51,52が配設されている。ルツボ42は、例え
ばPBNからなるもので、有底円筒状に形成されている。
ルツボ42内には、原料融液61の基となる金属Ga,金属A
s、及び液体カプセル層62の基となる例えばB2O3が収容
されている。そして、容器41の上壁を貫通した結晶引上
げ軸46の下端に取着された種結晶63を原料融液61に接触
させたのち、引上げ軸46を引上げることによって、GaAs
単結晶64が引上げ製造されるものとなっている。In the figure, 41 is a high-pressure container made of stainless steel or the like, and in this container 41, a crucible 42, a crucible receiver 43, a heater 44, a heat shield 45, etc. are housed, and a magnet 51 is provided outside the container 41. , 52 are provided. The crucible 42 is made of PBN, for example, and is formed in a bottomed cylindrical shape.
In the crucible 42, metal Ga and metal A, which are the base of the raw material melt 61,
s and, for example, B 2 O 3 serving as a base of the liquid capsule layer 62 are contained. Then, the seed crystal 63 attached to the lower end of the crystal pulling shaft 46 penetrating the upper wall of the container 41 is brought into contact with the raw material melt 61, and then the pulling shaft 46 is pulled up to form GaAs.
The single crystal 64 is to be pulled up and manufactured.
ルツボ42は、ルツボ受け43によって支持されている。ル
ツボ受け43は、円筒体43a,底板43b及び台座43cを組合わ
せて構成されている。即ち、円筒体43aはルツボ42の外
周面を囲むようにルツボ42に密着して配設され、底板43
bはルツボ42の底部に接するように配設されている。そ
して、台座43cは底板43bを支持するものとなっている。
ここで、ルツボ受け43を構成する円筒体43a,底板43b及
び台座43cは、従来のカーボンとは異なり、AlN(窒化ア
ルミニウム)の焼結成形体から形成されている。即ち、
AlNの圧粉体にバインダーとしてのY2O3を混合し、この
混合物を1800[℃]の温度で焼結して、それぞれ円筒体
43a,底板43b及び台座43cが形成されている。The crucible 42 is supported by a crucible receiver 43. The crucible receiver 43 is configured by combining a cylindrical body 43a, a bottom plate 43b, and a pedestal 43c. That is, the cylindrical body 43a is disposed in close contact with the crucible 42 so as to surround the outer peripheral surface of the crucible 42, and the bottom plate 43a
The b is arranged so as to contact the bottom of the crucible 42. The pedestal 43c supports the bottom plate 43b.
Here, unlike the conventional carbon, the cylindrical body 43a, the bottom plate 43b, and the pedestal 43c that form the crucible receiver 43 are formed from a sintered compact of AlN (aluminum nitride). That is,
Y 2 O 3 as a binder is mixed with AlN green compact, and the mixture is sintered at a temperature of 1800 [° C] to form a cylindrical body.
43a, a bottom plate 43b and a pedestal 43c are formed.
ルツボ受け43の台座43cには、容器41の底壁を貫通した
回転軸47が取着されている。そして、この回転軸47を図
示しない回転機構によって回転することにより、ルツボ
42が回転するものとなっている。A rotation shaft 47 that penetrates the bottom wall of the container 41 is attached to the pedestal 43c of the crucible receiver 43. Then, by rotating the rotating shaft 47 by a rotating mechanism (not shown), the crucible is
42 is supposed to rotate.
ルツボ42の外周部には、ルツボ42と離間して、カーボン
等からなる円筒状のヒータ44がルツボ42と同軸的に配設
されている。このヒータ44はルツボ42内の原料及びカプ
セル材を加熱溶融して、前記原料融液61及びその上の液
体カプセル層62を形成するものである。また、ヒータ44
の外側には、熱遮蔽体45が配置されている。この熱遮蔽
体45は、サイドリング45a,トッププレート45b及びボト
ムプレート45cからなるものである。サイドリング45aは
ヒータ44よりも径及び高さの大きな円筒状に形成された
もので、ヒータ44と同軸的に配設されている。トッププ
レート45bは中央部に前記ルツボ42が挿通する開孔を有
する円板状に形成され、サイドリング45aの上部に配設
されている。ボトムプレート45cは、トッププレート45b
と同様な形状を有するもので、サイドリング45aの下部
に配設されている。そして、熱遮蔽体45を構成するサイ
ドリング45a,トッププレート45b及びボトムプレート45c
は、前記ルツボ受け43と同様にAlNの焼結成形体から形
成されている。A cylindrical heater 44 made of carbon or the like is disposed coaxially with the crucible 42 on the outer peripheral portion of the crucible 42 so as to be separated from the crucible 42. The heater 44 heats and melts the raw material and the capsule material in the crucible 42 to form the raw material melt 61 and the liquid capsule layer 62 thereon. Also, the heater 44
A heat shield 45 is arranged outside the. The heat shield 45 is composed of a side ring 45a, a top plate 45b and a bottom plate 45c. The side ring 45a is formed in a cylindrical shape having a diameter and height larger than that of the heater 44, and is arranged coaxially with the heater 44. The top plate 45b is formed in a disc shape having an opening at the center thereof through which the crucible 42 is inserted, and is arranged above the side ring 45a. The bottom plate 45c is the top plate 45b
It has the same shape as that of and is disposed below the side ring 45a. Then, the side ring 45a, the top plate 45b, and the bottom plate 45c that form the heat shield 45.
Like the crucible receiver 43, is formed of an AlN sintered compact.
また、前記マグネット51,52は超電導マグネットからな
り強磁場を生成するもので、前記容器41を挟みルツボ42
の位置で水平方向に対向配置されている。そして、これ
らのマグネット51,52により、ルツボ42内の原料融液61
に水平方向の磁界が印加されるものとなっている。Further, the magnets 51, 52 are made of superconducting magnets and generate a strong magnetic field.
Are arranged to face each other in the horizontal direction. Then, by these magnets 51, 52, the raw material melt 61 in the crucible 42 is
A magnetic field in the horizontal direction is applied to.
次に、上記装置を用いたGaAs単結晶の製造方法について
説明する。Next, a method of manufacturing a GaAs single crystal using the above device will be described.
まず、前記ルツボ42内にGaAs原料としてGaとAsとの比が
モル比で1:1となるように3[kg]チャージし、さらにB
2O3カプセル材をチャージした。次いで、容器41内にAr
ガスを導入し、容器41内を加圧状態(70気圧)にした。
ヒータ44により、ルツボ42を加熱しルツボ42内の原料及
びカプセル材を加熱溶融して、原料融液61上に液体カプ
セル層62が位置するようにした。その後、容器41内を20
気圧にして、前記マグネット51,52により水平方向に磁
界を印加して原料融液61中の磁界強度が3500[Oe]程度
となるようにした。つまり、原料融液の熱振動が小さい
前記第4の領域になるようにした。First, the crucible 42 was charged with 3 [kg] as a GaAs raw material so that the ratio of Ga to As was 1: 1 in molar ratio, and further B
2 O 3 capsule material was charged. Then Ar in the container 41
Gas was introduced to bring the inside of the container 41 into a pressurized state (70 atm).
The heater 44 heats the crucible 42 to heat and melt the raw material and the capsule material in the crucible 42 so that the liquid capsule layer 62 is located on the raw material melt 61. Then, the inside of the container 41 is
At atmospheric pressure, a magnetic field was applied in the horizontal direction by the magnets 51 and 52 so that the magnetic field strength in the raw material melt 61 was about 3500 [Oe]. In other words, the fourth region where the thermal vibration of the raw material melt is small is set.
この状態で原料融液61を種付け最適条件温度に調整した
のち、種結晶63を液体カプセル層62を通してGaAs原料融
液61に接触させた。種結晶63と原料融液61とを十分馴染
ませたところで、引上げ速度9[mm/hr]、引上げ回転1
0[rpm]、ルツボ回転15[rpm]等の引上げ条件の下で
直径3インチ、2.7[kg]のGaAs種結晶を引上げ製造し
た。In this state, the raw material melt 61 was seeded and adjusted to the optimum condition temperature, and then the seed crystal 63 was brought into contact with the GaAs raw material melt 61 through the liquid capsule layer 62. When the seed crystal 63 and the raw material melt 61 are sufficiently mixed, the pulling speed is 9 [mm / hr] and the pulling rotation is 1
A GaAs seed crystal having a diameter of 3 inches and 2.7 [kg] was pulled and manufactured under pulling conditions such as 0 [rpm] and crucible rotation 15 [rpm].
かくして製造されたGaAs単結晶からウェハを切出し、15
H2SO4:1H2O2:1H2Oの混酸で成長縞の観察を行ったところ
第5図(a)(b)に示す如き結果が得られた。なお、
第5図(a)は本実施例により作成したウェハの表面状
態を顕微鏡写真、同図(b)は磁界を印加しないで作成
した場合の顕微鏡写真である。第5図から明らかなよう
に、磁界を印加しない従来方法に比べ、磁界を印加した
本実施例方法による単結晶は非常に均一であることが判
る。また、本実施例により作成した単結晶を用い、微少
なFETを作成しその特性を評価したところ、しきい値の
分散δVth=20〜30[mV]と良好な結果が得られた。A wafer was cut from the GaAs single crystal thus manufactured, and 15
When growth fringes were observed with a mixed acid of H 2 SO 4 : 1H 2 O 2 : 1H 2 O, the results shown in FIGS. 5 (a) and 5 (b) were obtained. In addition,
FIG. 5 (a) is a microscope photograph of the surface condition of the wafer prepared in this example, and FIG. 5 (b) is a microscope photograph of the wafer prepared without applying a magnetic field. As is clear from FIG. 5, the single crystal according to the method of this example in which a magnetic field is applied is extremely uniform as compared with the conventional method in which a magnetic field is not applied. Further, when a minute FET was formed using the single crystal prepared in this example and its characteristics were evaluated, a favorable result was obtained with a threshold dispersion ΔVth = 20 to 30 [mV].
このように本実施例によれば、前記第3図に示す原料融
液の熱振動の小さい第4の領域に相当する水平方向の磁
界を印加してGaAs単結晶を引上げることにより、均一性
の高い良質のGaAs単結晶を製造することができる。ま
た、第2の領域で引上げる場合と異なり、成長条件(特
に磁界強度)に対する依存性が低く、再現性も十分大き
いものであった。As described above, according to the present embodiment, the GaAs single crystal is pulled up by applying a horizontal magnetic field corresponding to the fourth region where the thermal vibration of the raw material melt shown in FIG. It is possible to manufacture a high-quality and high-quality GaAs single crystal. Further, unlike the case of pulling up in the second region, the dependence on growth conditions (especially magnetic field strength) was low, and reproducibility was sufficiently large.
また、本実施例ではルツボ受け43及び熱遮蔽体45をAlN
で形成しているので、これらをカーボンで形成した従来
のものに比して、酸化生成物による原料融液の汚染が少
なくなり、結晶の品質が向上する。さらに、気孔質で吸
着性のあるカーボン製品の減少により、雰囲気中の酸素
や水蒸気等の含有が少なくなり、その他の使用装置、例
えばヒータの長寿命化及び発熱特性の安定化をはかり得
る等の利点もある。In this embodiment, the crucible receiver 43 and the heat shield 45 are made of AlN.
Since it is formed by the method described above, the contamination of the raw material melt by the oxidation product is reduced, and the quality of the crystal is improved, as compared with the conventional one formed of carbon. Furthermore, due to the reduction of porous and adsorptive carbon products, the content of oxygen, water vapor, etc. in the atmosphere is reduced, and it is possible to extend the life and stabilize the heat generation characteristics of other devices used, such as heaters. There are also advantages.
なお、本発明は上述した実施例に限定されるものではな
い。例えば、前記印加磁界の強度は3500[Oe]に限るも
のではなく、前記第4の領域に相当する磁界強度の範囲
であればよい。また、成長する単結晶はGaAsに限るもの
ではなく、InP,GaP,GaSb等のIII−V族半導体でよい。
但し、成長する単結晶の種類により、前記第4の領域の
範囲の磁界強度は変化するので、単結晶の種類によって
磁界強度を変える必要がある。また磁界を印加するため
のマグネットは超電導マグネットに限るものではなく、
前記第4の領域に相当する磁界を印加できるものであれ
ばよい。その他、本発明の要旨を逸脱しない範囲で、種
々変形して実施することができる。The present invention is not limited to the above embodiment. For example, the strength of the applied magnetic field is not limited to 3500 [Oe], but may be within the range of the magnetic field strength corresponding to the fourth region. The growing single crystal is not limited to GaAs but may be a III-V group semiconductor such as InP, GaP, GaSb.
However, since the magnetic field strength in the range of the fourth region changes depending on the type of single crystal grown, it is necessary to change the magnetic field strength depending on the type of single crystal. Also, the magnet for applying the magnetic field is not limited to the superconducting magnet,
Any magnetic field that can apply a magnetic field corresponding to the fourth region may be used. In addition, various modifications can be made without departing from the scope of the present invention.
第1図乃至第3図はそれぞれ本発明の基本原理を説明す
るためのもので第1図は磁界強度に対する原料融液の温
度変化を示す特性図、第2図は上記特性を得るための温
度センサの配置例を示す模式図、第3図は磁界強度に対
する熱振動特性を示す模式図、第4図は本発明の一実施
例に係わる単結晶製造装置の概略構成を示す断面図、第
5図(a)(b)は上記実施例による効果を説明するた
めのもので金属組織の表面状態を示す顕微鏡写真であ
る。 41…高圧容器、42…ルツボ、43…ルツボ受け、44…ヒー
タ、45…熱遮蔽体、46…引上げ軸、47…回転軸、51,52
…超電導マグネット、61…原料融液、62…液体カプセル
層、63…種結晶、64…引上げ単結晶。1 to 3 are each for explaining the basic principle of the present invention. FIG. 1 is a characteristic diagram showing a temperature change of a raw material melt with respect to a magnetic field strength, and FIG. 2 is a temperature for obtaining the above characteristic. FIG. 3 is a schematic diagram showing an example of arrangement of sensors, FIG. 3 is a schematic diagram showing thermal vibration characteristics with respect to magnetic field strength, and FIG. 4 is a sectional view showing a schematic configuration of a single crystal manufacturing apparatus according to an embodiment of the present invention. (A) and (b) are for explaining the effect of the above-mentioned embodiment and are micrographs showing the surface condition of the metal structure. 41 ... High-pressure container, 42 ... Crucible, 43 ... Crucible receiver, 44 ... Heater, 45 ... Heat shield, 46 ... Pulling shaft, 47 ... Rotating shaft, 51, 52
… Superconducting magnet, 61… Raw material melt, 62… Liquid capsule layer, 63… Seed crystal, 64… Pulled single crystal.
フロントページの続き (72)発明者 鷲塚 章一 神奈川県川崎市幸区小向東芝町1番地 株 式会社東芝総合研究所内 (72)発明者 渡辺 正幸 神奈川県川崎市幸区小向東芝町1番地 株 式会社東芝総合研究所内 (72)発明者 児島 正勝 神奈川県川崎市幸区堀川町72番地 株式会 社東芝堀川町工場内 (56)参考文献 特開 昭59−121183(JP,A) 特開 昭58−120592(JP,A) 特公 昭58−50951(JP,B2)Front page continuation (72) Inventor Shoichi Washizuka, 1 Komukai Toshiba-cho, Sachi-ku, Kawasaki-shi, Kanagawa Inside Toshiba Research Institute Co., Ltd. Incorporated company Toshiba Research Institute (72) Inventor Masakatsu Kojima 72 Horikawa-cho, Sachi-ku, Kawasaki-shi, Kanagawa Stock company Toshiba Horikawa-cho factory (56) Reference JP-A-59-121183 (JP, A) JP Sho 58-120592 (JP, A) Japanese Patent Sho 58-50951 (JP, B2)
Claims (4)
らなる原料融液上に液体カプセル層を形成し、原料融液
に水平方向の磁界を印加すると共に、この原料融液に種
結晶を接触させ該種結晶を垂直方向に引上げることによ
り単結晶を引上げ製造する単結晶の製造方法において、 磁界強度の変化に伴う熱振動特性に関し磁界強度が増大
する方向に、熱振動の大きい第1の領域、熱振動が小さ
くなる第2の領域、熱振動が再び大きくなる第3の領
域、熱振動が再び小さくなる第4の領域とするとき、前
記原料融液に印加する磁界の強度を上記第4の領域とな
る大きさに設定したことを特徴とする単結晶の製造方
法。1. A liquid capsule layer is formed on a raw material melt made of a III-V semiconductor contained in a crucible, a horizontal magnetic field is applied to the raw material melt, and a seed crystal is added to the raw material melt. In a method for producing a single crystal by pulling the seed crystal in a vertical direction by bringing the seed crystal into contact with a single crystal, in the direction of increasing the magnetic field strength with respect to the thermal vibration characteristics associated with the change in the magnetic field strength, In the first region, the second region where the thermal vibration is reduced, the third region where the thermal vibration is increased again, and the fourth region where the thermal vibration is reduced again, the strength of the magnetic field applied to the raw material melt is set. A method for producing a single crystal, characterized in that the size is set to be the fourth region.
を3000〜10000[0e]に設定したことを特徴とする特許
請求の範囲第1項記載の単結晶の製造方法。2. The method for producing a single crystal according to claim 1, wherein the single crystal is GaAs and the strength of the magnetic field is set to 3000 to 10000 [0e].
の上に形成される液体カプセル層を収容したルツボと、
このルツボ内の原料融液を加熱するヒータと、上記原料
融液に水平方向の磁界を印加するマグネットとを具備
し、上記原料融液に種結晶を接触させ該種結晶を引上げ
ることにより単結晶を引上げ製造する単結晶の製造装置
において、 前記磁界印加による原料融液の熱振動特性に関し磁界強
度が増大する方向に、熱振動の大きい第1の領域、熱振
動が小さくなる第2の領域、熱振動が再び大きくなる第
3の領域、熱振動が再び小さくなる第4の領域とすると
き、前記マグネットは前記原料融液に印加される磁界の
強度を上記第4の領域となる大きさの磁場を精製するも
のであることを特徴とする単結晶の製造装置。3. A crucible containing a raw material melt composed of a III-V semiconductor and a liquid capsule layer formed thereon,
A heater for heating the raw material melt in the crucible and a magnet for applying a horizontal magnetic field to the raw material melt are provided, and a seed crystal is brought into contact with the raw material melt to pull up the seed crystal. In a single crystal manufacturing apparatus for pulling up and manufacturing a crystal, a first region in which thermal vibration is large and a second region in which thermal vibration is small in a direction in which the magnetic field strength is increased with respect to the thermal vibration characteristics of the raw material melt due to the magnetic field application. When the third region in which the thermal vibration becomes large again and the fourth region in which the thermal vibration becomes small again, the magnet has a magnitude such that the intensity of the magnetic field applied to the raw material melt becomes the fourth region. An apparatus for producing a single crystal, which is for purifying the magnetic field of.
れる磁界の強度が3000〜10000[0e]の大きさとなる磁
場を生成するものであることを特徴とする特許請求の範
囲第3項記載の単結晶の製造方法。4. The magnet according to claim 3, wherein the magnet generates a magnetic field having a magnetic field strength of 3000 to 10000 [0e] applied to the raw material melt. A method for producing the single crystal described.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60026742A JPH06102589B2 (en) | 1985-02-14 | 1985-02-14 | Single crystal manufacturing method and manufacturing apparatus |
| DE8686300926T DE3670513D1 (en) | 1985-02-14 | 1986-02-11 | METHOD FOR PRODUCING A SINGLE CRYSTAL. |
| EP19860300926 EP0194051B1 (en) | 1985-02-14 | 1986-02-11 | Method for manufacturing single crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60026742A JPH06102589B2 (en) | 1985-02-14 | 1985-02-14 | Single crystal manufacturing method and manufacturing apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61186281A JPS61186281A (en) | 1986-08-19 |
| JPH06102589B2 true JPH06102589B2 (en) | 1994-12-14 |
Family
ID=12201752
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60026742A Expired - Lifetime JPH06102589B2 (en) | 1985-02-14 | 1985-02-14 | Single crystal manufacturing method and manufacturing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06102589B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6623969B2 (en) * | 2015-08-26 | 2019-12-25 | 豊田合成株式会社 | Method for producing group III nitride semiconductor single crystal |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5850951A (en) * | 1981-09-22 | 1983-03-25 | セイコーエプソン株式会社 | Bracket for orthodontia |
| JPS58120592A (en) * | 1982-01-11 | 1983-07-18 | Toshiba Corp | Growing device for crystal |
| JPS59121183A (en) * | 1982-12-28 | 1984-07-13 | Fujitsu Ltd | Method for crystal growth |
-
1985
- 1985-02-14 JP JP60026742A patent/JPH06102589B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61186281A (en) | 1986-08-19 |
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