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JPH06104768B2 - Light-transmissive epoxy resin composition and optical semiconductor device - Google Patents
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JPH06104768B2 - Light-transmissive epoxy resin composition and optical semiconductor device - Google Patents

Light-transmissive epoxy resin composition and optical semiconductor device

Info

Publication number
JPH06104768B2
JPH06104768B2 JP2060669A JP6066990A JPH06104768B2 JP H06104768 B2 JPH06104768 B2 JP H06104768B2 JP 2060669 A JP2060669 A JP 2060669A JP 6066990 A JP6066990 A JP 6066990A JP H06104768 B2 JPH06104768 B2 JP H06104768B2
Authority
JP
Japan
Prior art keywords
epoxy resin
silica
light
resin composition
titania glass
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2060669A
Other languages
Japanese (ja)
Other versions
JPH03259948A (en
Inventor
利夫 塩原
浩二 二ッ森
一弘 新井
政俊 滝田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shin Etsu Chemical Co Ltd
Original Assignee
Shin Etsu Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Etsu Chemical Co Ltd filed Critical Shin Etsu Chemical Co Ltd
Priority to JP2060669A priority Critical patent/JPH06104768B2/en
Priority to DE69104859T priority patent/DE69104859T2/en
Priority to EP91300992A priority patent/EP0441622B1/en
Priority to US07/651,438 priority patent/US5175199A/en
Priority to KR1019910003854A priority patent/KR950005312B1/en
Publication of JPH03259948A publication Critical patent/JPH03259948A/en
Publication of JPH06104768B2 publication Critical patent/JPH06104768B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/18Oxygen-containing compounds, e.g. metal carbonyls
    • C08K3/20Oxides; Hydroxides
    • C08K3/22Oxides; Hydroxides of metals
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/40Encapsulations, e.g. protective coatings characterised by their materials
    • H10W74/47Encapsulations, e.g. protective coatings characterised by their materials comprising organic materials, e.g. plastics or resins
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/18Oxygen-containing compounds, e.g. metal carbonyls
    • C08K3/20Oxides; Hydroxides
    • C08K3/22Oxides; Hydroxides of metals
    • C08K2003/2237Oxides; Hydroxides of metals of titanium
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K2201/00Specific properties of additives
    • C08K2201/002Physical properties
    • C08K2201/003Additives being defined by their diameter
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2201/00Properties
    • C08L2201/10Transparent films; Clear coatings; Transparent materials
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L2203/00Applications
    • C08L2203/20Applications use in electrical or conductive gadgets
    • C08L2203/206Applications use in electrical or conductive gadgets use in coating or encapsulating of electronic parts

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Formation Of Insulating Films (AREA)
  • Epoxy Resins (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、高い透明性を有すると共に、線膨張係数の小
さな硬化物を与え、光半導体装置封止に好適に用いられ
る光透過性エポキシ樹脂組成物及び該組成物に硬化物で
封止された光半導体装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention provides a cured product having high transparency and a small linear expansion coefficient, which is suitable for use in encapsulating an optical semiconductor device. The present invention relates to a composition and an optical semiconductor device sealed with a cured product of the composition.

〔従来の技術及び発明が解決しようとする課題〕[Problems to be Solved by Prior Art and Invention]

従来より、半導体装置等の精密な電子部品を保護するた
め、これらをエポキシ樹脂で封止することが行なわれて
いる。
Conventionally, in order to protect precision electronic components such as semiconductor devices, these have been sealed with an epoxy resin.

この用途に用いられるエポキシ樹脂には、低収縮率、低
膨張性、耐熱性、耐湿性等の高度な特性が要求され、こ
れらの特性のなかで、低収縮率、低膨張性は半導体装置
を封入する際の樹脂のクラックや素子の破壊を防止する
上で重要であり、主にエポキシ樹脂に無機質充填剤を配
合することにより、これらの低収縮率、低膨張性の改良
が図られている。
Epoxy resins used for this purpose are required to have high properties such as low shrinkage, low expansion, heat resistance, and moisture resistance. Among these properties, low shrinkage and low expansion are semiconductor devices. It is important to prevent resin cracks and element destruction during encapsulation, and by mainly incorporating an inorganic filler into the epoxy resin, improvement of these low shrinkage ratio and low expansion is aimed at. .

しかし、発光、受光素子等の光半導体装置を透明なエポ
キシ樹脂で封止する場合、その透明性を損わないように
するため、通常充填剤を配合しないので、その硬化物は
収縮率、膨張係数がいずれも大きく、大型発光素子を封
入する際に樹脂のクラックや素子の破壊が生じるといっ
た問題がある。これに対し、充填剤をエポキシ樹脂に配
合した透明エポキシ樹脂組成物も提案されているが、従
来の組成物では樹脂のクラックや素子の破壊を有効に防
止しようとすると透明性が悪くなって素子の光機能性を
損ない、一方透明性を保持しようとすると樹脂のクラッ
クや素子の破壊を有効に防止できないものである。
However, when encapsulating optical semiconductor devices such as light-emitting and light-receiving elements with a transparent epoxy resin, in order not to impair their transparency, a filler is not usually added. All the coefficients are large, and there is a problem that resin is cracked or the element is broken when a large-sized light emitting element is sealed. On the other hand, a transparent epoxy resin composition in which a filler is mixed with an epoxy resin has also been proposed, but in the conventional composition, when trying to effectively prevent cracking of the resin or destruction of the element, the transparency becomes poor and the element becomes However, if it is attempted to maintain the transparency, the cracking of the resin and the destruction of the device cannot be effectively prevented.

このため、透明性と低応力性とを兼備するエポキシ樹脂
組成物の開発が要望されている。
Therefore, development of an epoxy resin composition having both transparency and low stress has been desired.

本発明は上記事情に鑑みなされたもので、高透明性であ
る共に、低収縮率、低膨張係数で、低応力の硬化物を与
える光透過性エポキシ樹脂組成物及び該組成物の硬化物
で封止された光半導体装置を提供することを目的とす
る。
The present invention has been made in view of the above circumstances, and has a high transparency, a low shrinkage ratio, a low expansion coefficient, a light-transmissive epoxy resin composition that gives a cured product with low stress, and a cured product of the composition. It is an object to provide a sealed optical semiconductor device.

〔課題を解決するための手段及び作用〕[Means and Actions for Solving the Problems]

本発明者らは、上記目的を達成するため鋭意検討を重ね
た結果、硬化性エポキシ樹脂と硬化剤とを含む硬化性エ
ポキシ樹脂組成物に下記直線透過率測定方法Aによる90
0nmから600nmの波長範囲での直線透過率が70%以上であ
るシリカ−チタニアガラス粒子を配合することが有効で
あることを知見した。
The inventors of the present invention have conducted extensive studies in order to achieve the above object, and as a result, a curable epoxy resin composition containing a curable epoxy resin and a curing agent was used to measure 90% by the following linear transmittance measurement method A.
It has been found that it is effective to add silica-titania glass particles having a linear transmittance of 70% or more in the wavelength range of 0 nm to 600 nm.

A下記の一般式(1)で示されるビスフェノール型エポ
キシ樹脂又は下記の一般式(2)で示されるノボラック
型エポキシ樹脂とフェニルグリシジルエーテルとを混合
し、シリカ−チタニアガラス粒子との屈折率差が±0.00
2以内になる溶液を調製する。この溶液と平均粒径が5
〜30μmに粉砕されたシリカ−チタニアガラス粒子とを
重量比で1:1に混合し、その混合物について1mmの光路長
で直線透過率を測定する。
A A bisphenol type epoxy resin represented by the following general formula (1) or a novolac type epoxy resin represented by the following general formula (2) is mixed with phenylglycidyl ether to obtain a silica-titania glass particle having a difference in refractive index. ± 0.00
Prepare a solution within 2. This solution has an average particle size of 5
Silica-titania glass particles crushed to -30 μm are mixed in a weight ratio of 1: 1 and the linear transmittance of the mixture is measured with an optical path length of 1 mm.

(但し、nは0〜10の整数である。) (但し、nは0〜10の整数である。) 即ち、上記シリカ−チタニアガラス粒子は光透過率が優
れたものであると共に、エポキシ樹脂との屈折率差を容
易に0.01以下とすることができ、このため光透過性エポ
キシ樹脂組成物にこのシリカ−チタニアガラス粒子を配
合した場合、その硬化物は、例えば0.5mm厚で750nmの光
透過率が80%以上と極めて良好な透明性を有し、しかも
低収縮率、低膨張性で、光半導体装置の封止に使用した
場合、樹脂のクラックや素子の破壊を有効に防止し得る
ことを見い出し、本発明をなすに至ったものである。
(However, n is an integer of 0 to 10.) (However, n is an integer of 0 to 10.) That is, the silica-titania glass particles have excellent light transmittance, and the difference in refractive index from the epoxy resin can easily be 0.01 or less. Therefore, when this silica-titania glass particles are blended with a light-transmissive epoxy resin composition, the cured product has a very good transparency, for example, a light transmittance of 750 nm at a thickness of 0.5 mm of 80% or more. Moreover, it has been found that, when used for encapsulation of an optical semiconductor device, it has a low shrinkage ratio and a low expansion property, and can effectively prevent cracking of the resin and breakage of the element, and thus achieved the present invention. .

従って、本発明は硬化性エポキシ樹脂と硬化剤と上記測
定方法Aによる900nmから600nmの波長範囲での直線透過
率が70%以上であるシリカ−チタニアガラス粒子とを含
有することを特徴とする光透過性エポキシ樹脂組成物及
び該組成物の硬化物で封止された光半導体装置を提供す
る。
Accordingly, the present invention is characterized by containing a curable epoxy resin, a curing agent, and silica-titania glass particles having a linear transmittance of 70% or more in the wavelength range of 900 nm to 600 nm according to the above measuring method A. Provided are a transparent epoxy resin composition and an optical semiconductor device encapsulated with a cured product of the composition.

以下、本発明について更に詳しく説明する。Hereinafter, the present invention will be described in more detail.

本発明の光透過性エポキシ樹脂組成物は、上述したよう
に硬化性エポキシ樹脂と硬化剤とを含む硬化性エポキシ
樹脂組成物と上記シリカ−チタニアガラス粒子とを含有
するものである。
The light transmissive epoxy resin composition of the present invention contains the curable epoxy resin composition containing a curable epoxy resin and a curing agent as described above, and the silica-titania glass particles.

ここで、硬化性エポキシ樹脂組成物は、1分子中に2個
以上のエポキシ基を有するエポキシ樹脂に硬化剤、その
他必要により各種の添加剤を配合したものであるが、1m
m厚の硬化物の750nmでの光透過率が50%以上、特に70%
以上となるような透明性を持つものが好適に使用され
る。本発明においては、このような透明性を持つ硬化性
エポキシ樹脂組成物である限り、エポキシ樹脂、硬化
剤、各種添加剤は特に制限されない。
Here, the curable epoxy resin composition is a mixture of an epoxy resin having two or more epoxy groups in one molecule with a curing agent and other various additives as necessary.
50% or more, especially 70%, light transmittance at 750 nm of cured product of m thickness
Those having transparency as described above are preferably used. In the present invention, the epoxy resin, the curing agent, and various additives are not particularly limited as long as the curable epoxy resin composition has such transparency.

例えば、エポキシ樹脂としては、後述する各種硬化剤に
よって硬化させることが可能であれば良く、分子構造、
分子量等に特に制限はなく、従来から知られている種々
のエポキシ樹脂を使用できる。具体的にはエピクロルヒ
ドリンとビスフェノールをはじめとする各種ノボラック
樹脂から合成されるエポキシ樹脂、脂環式エポキシ樹脂
あるいは塩素や臭素原子等のハロゲン原子を導入したエ
ポキシ樹脂等をあげることができ、これらの1種を単独
で又は2種以上を併用して使用することができる。
For example, as the epoxy resin, it is sufficient if it can be cured by various curing agents described later, and the molecular structure,
The molecular weight and the like are not particularly limited, and various conventionally known epoxy resins can be used. Specific examples thereof include epoxy resins synthesized from various novolak resins such as epichlorohydrin and bisphenol, alicyclic epoxy resins, and epoxy resins having halogen atoms such as chlorine and bromine atoms introduced therein. The seeds may be used alone or in combination of two or more.

このような透明性の硬化性エポキシ樹脂の市販品として
は、例えばビスフェノール型エポキシ樹脂としてエピコ
ート828、エピコート1001(商品名,油化シェルエポキ
シ社製)、エピコート1055K(商品名,油化シェルエポ
キシ社製)RE310S,RE304S(共に商品名,日本化薬社
製)等を挙げることができる。
Commercially available products of such transparent curable epoxy resin include, for example, bisphenol type epoxy resin such as Epicoat 828, Epicoat 1001 (trade name, made by Yuka Shell Epoxy Co., Ltd.), Epicoat 1055K (trade name, made by Yuka Shell Epoxy Co., Ltd. RE310S, RE304S (both trade names, manufactured by Nippon Kayaku Co., Ltd.) and the like.

なお、上記1分子中に2個以上のエポキシ基を有するエ
ポキシ樹脂のほかに、モノエポキシ化合物を適宜併用す
ることは差支えなく、このモノエポキシ化合物として
は、スチレンオキシド、シクロヘキセンオキシド、プロ
ピレンオキシド、メチルグリシジルエーテル、エチルグ
リシジルエーテル、フェニルグリシジルエーテル、アリ
ルグリシジルエーテル、オクチレンオキシド、ドデセン
オキシドなどが例示される。
In addition to the epoxy resin having two or more epoxy groups in one molecule, a monoepoxy compound may be appropriately used in combination, and examples of the monoepoxy compound include styrene oxide, cyclohexene oxide, propylene oxide and methyl. Examples include glycidyl ether, ethyl glycidyl ether, phenyl glycidyl ether, allyl glycidyl ether, octylene oxide, dodecene oxide and the like.

また、エポキシ樹脂の硬化剤としてはジアミノジフェニ
ルメタン、ジアミノジフェニルスルホン,メタフェニレ
ンジアミン等に代表されるアミン系硬化剤、無水フタル
酸,無水ピロメリット酸,無水ベンゾフェノンテトラカ
ルボン酸等の酸無水物系硬化剤、あるいはフェノールノ
ボラック,クレゾールノボラック等の1分子中に2個以
上の水酸基を有するフェノールノボラック硬化剤等が例
示される。これらの硬化剤の中では、ヘキサヒドロ無水
フタル酸、テトラヒドロ無水フタル酸等の芳香環を含ま
ない酸無水物系硬化剤が最も好ましい。
Further, as a curing agent for epoxy resin, an amine type curing agent represented by diaminodiphenylmethane, diaminodiphenylsulfone, metaphenylenediamine, etc., and an acid anhydride type curing agent such as phthalic anhydride, pyromellitic dianhydride, benzophenone tetracarboxylic acid anhydride, etc. Examples thereof include agents or phenol novolac curing agents having two or more hydroxyl groups in one molecule such as phenol novolac and cresol novolac. Among these curing agents, acid anhydride type curing agents containing no aromatic ring such as hexahydrophthalic anhydride and tetrahydrophthalic anhydride are most preferable.

さらに本発明においては、上記した硬化剤とエポキシ樹
脂との反応を促進させる目的で各種硬化促進剤、例えば
イミダゾールあるいはその誘導体、三級アミン系誘導
体、ホスフィン系誘導体、シクロアミジン誘導体等を併
用することは何ら差支えない。
Further, in the present invention, various curing accelerators, for example, imidazole or a derivative thereof, a tertiary amine derivative, a phosphine derivative, a cycloamidine derivative and the like are used in combination for the purpose of accelerating the reaction between the curing agent and the epoxy resin. Does not matter at all.

なお、これらの硬化剤や硬化促進剤の配合量は常用量と
することができる。
In addition, the compounding amount of these curing agents and curing accelerators can be a usual dose.

本発明の光透過性エポキシ樹脂組成物は、上述した硬化
性エポキシ樹脂組成物に上記高透明性のシリカ−チタニ
アガラス粒子を配合したものである。
The light-transmitting epoxy resin composition of the present invention is the above-mentioned curable epoxy resin composition containing the highly transparent silica-titania glass particles.

ここで、シリカ−チタニアガラス粒子は、下記直線透過
率測定方法Aによる900nmから600nmの波長範囲での直線
透過率が70%以上、好ましくは80%以上のものを使用す
る。
Here, as the silica-titania glass particles, those having a linear transmittance of 70% or more, preferably 80% or more in the wavelength range of 900 nm to 600 nm according to the linear transmittance measuring method A described below are used.

A下記の一般式(1)で示されるビスフェノール型エポ
キシ樹脂又は下記の一般式(2)で示されるノボラック
型エポキシ樹脂とフェニルグリシジルエーテルとを混合
し、シリカ−チタニアガラス粒子との屈折率差が±0.00
2以内になる溶液を調製する。この溶液と平均粒径が5
〜30μmに粉砕されたシリカ−チタニアガラス粒子とを
重量比で1:1に混合し、その混合物について1mmの光路長
で直線透過率を測定する。
A A bisphenol type epoxy resin represented by the following general formula (1) or a novolac type epoxy resin represented by the following general formula (2) is mixed with phenylglycidyl ether to obtain a silica-titania glass particle having a difference in refractive index. ± 0.00
Prepare a solution within 2. This solution has an average particle size of 5
Silica-titania glass particles crushed to -30 μm are mixed in a weight ratio of 1: 1 and the linear transmittance of the mixture is measured with an optical path length of 1 mm.

(但し、nは0〜10の整数である。) (但し、nは0〜10の整数である。) このシリカ−チタニアガラス粒子は、硬化性エポキシ樹
脂に配合した場合の光散乱を最小限にするため、硬化性
エポキシ樹脂の硬化物との屈折率差を±0.01以内、好ま
しくは±0.005以内、更に好ましくは±0.002以内とする
ことが望ましい。
(However, n is an integer of 0 to 10.) (However, n is an integer of 0 to 10.) The silica-titania glass particles are refracted with a cured product of the curable epoxy resin in order to minimize light scattering when blended with the curable epoxy resin. It is desirable that the rate difference be within ± 0.01, preferably within ± 0.005, and more preferably within ± 0.002.

本発明に係るシリカ−チタニアガラス粒子を製造する方
法は特願平2−28077号記載の方法に準じて行なうこと
ができる。
The method for producing the silica-titania glass particles according to the present invention can be carried out according to the method described in Japanese Patent Application No. 2-28077.

即ち、まず出発原料として、Si(OCH3)4、Si(OC2H5)4
どのようなシリコンアルコキシドとTi(OC3H7)4、Ti(OC4
H8)4などのようなチタンアルコキシドとを用いる。この
場合、TiO2をSiO2とTiO2との合計に対して10〜18モル%
となるような量でシリコンアルコキシドとチタンアルコ
キシドとを用いることが好ましい。TiO2の含有量が10モ
ル%に達しないと得られるシリカ−チタニアガラス粒子
の屈折率がエポキシ樹脂の充填剤として好ましいとされ
る1.53以上とするこができない場合があり、一方18モル
%を超えると、このようなシリカ−チタニアガラス粒子
の屈折率に等しい透明なエポキシ樹脂を得るのが困難と
なる場合がある。
That is, first, as starting materials, silicon alkoxides such as Si (OCH 3 ) 4 and Si (OC 2 H 5 ) 4 and Ti (OC 3 H 7 ) 4 , Ti (OC 4
A titanium alkoxide such as H 8 ) 4 is used. In this case, TiO 2 is 10 to 18 mol% based on the total of SiO 2 and TiO 2.
It is preferable to use silicon alkoxide and titanium alkoxide in such an amount that If the content of TiO 2 does not reach 10 mol%, the silica-titania glass particles obtained may not have a refractive index of 1.53 or more, which is considered to be preferable as a filler for epoxy resin, while 18 mol% may be used. If it exceeds, it may be difficult to obtain a transparent epoxy resin having the same refractive index as that of the silica-titania glass particles.

これらの原料からゾル、ゲルを得る方法としては、上記
シリコンアルコキシドとチタンアルコキシドとを稀釈用
溶媒としてメタノール、エタノール、プロパノールなど
のようなアルコールに溶解し、これに水を加えて加水分
解させてシリカ−チタニアゾルを作ったのち、このゾル
をゲル化用の容器に移し、密閉状態にしてから恒温乾燥
器中に静置させてゲル化させる方法が好適に採用され
る。この場合、このゲル化温度およびゲル化後の熟成温
度については、これを60℃より低くするとアルコキシド
の加水分解が不完全なものとなる場合があり、後記する
焼結工程で着色の原因となる3価のTiイオンが発生し易
くなるので、このゲル化および熟成の温度は60℃以上と
することが好ましい。なお、熟成は、この加水分解を完
全なものとする点から1時間以上、好ましくは5時間以
上とすることがよい。
As a method for obtaining a sol or gel from these raw materials, the above silicon alkoxide and titanium alkoxide are dissolved in an alcohol such as methanol, ethanol or propanol as a diluent solvent, and water is added to this to hydrolyze the silica. After the titania sol is prepared, the sol is transferred to a container for gelation, sealed, and then allowed to stand in a thermostatic dryer to gel. In this case, regarding the gelation temperature and the aging temperature after gelation, if the temperature is lower than 60 ° C., the hydrolysis of the alkoxide may be incomplete, which causes coloring in the sintering step described later. Since the trivalent Ti ions are easily generated, the gelation and aging temperature is preferably 60 ° C. or higher. The aging is carried out for 1 hour or longer, preferably 5 hours or longer, in order to complete the hydrolysis.

次に、上記ゲル化、熟成の終了した湿式ゲルの乾燥方法
としては特に制限されないが、例えばゲルを熟成するこ
とに用いた密閉容器の蓋を取り、そのまま恒温乾燥器中
に放置して乾燥し、乾燥ゲルを得る方法を採用すること
ができる。
Next, the method of drying the gelled and aged wet gel is not particularly limited. For example, the lid of the closed container used for aging the gel is removed, and the gel is left as it is in a constant temperature oven to dry. The method of obtaining a dry gel can be adopted.

更に、このようにして得られた乾燥ゲルを粉砕した後に
焼結する。
Further, the dry gel thus obtained is crushed and then sintered.

ここで、粉砕方法は特に制限されず、また粒径も適宜選
定され、用途に応じた適当な粉砕方法、粒径を採用し得
るが、平均粒径が1〜100μm、特に5〜30μmとする
ことが好ましい。
Here, the crushing method is not particularly limited, the particle size is appropriately selected, and an appropriate crushing method and particle size can be adopted according to the application, but the average particle size is 1 to 100 μm, particularly 5 to 30 μm It is preferable.

最後に粉砕した乾燥ゲルを焼結ガラス化するが、この焼
結温度を1050〜1250℃の範囲て行なうことが好ましい。
焼結温度が1050℃未満では粒子が完全に均一に緻密化せ
ず、従ってこのシリカ−チタニアガラス粒子の透過率を
測定した場合、粒子内部に入射した光は、シリカ−チタ
ニアガラス構成粒子とその構成粒子間隙の空孔との間の
屈折率差により散乱されるため、その結果として低い透
過率値しか得ることができない場合がある。また、焼結
温度が1250℃よりも高い温度では、TiO2の結晶相の1つ
であるAnatase相の析出が起こるため、この温度範囲で
も同様に光透過性に優れるシリカ−チタニアガラス粒子
は得られない場合がある。
Finally, the crushed dry gel is sinter-vitrified, but it is preferable that the sinter temperature is in the range of 1050-1250 ° C.
When the sintering temperature is less than 1050 ° C., the particles are not completely and uniformly densified, and therefore, when the transmittance of the silica-titania glass particles is measured, the light incident on the inside of the particles is the silica-titania glass constituent particles and its particles. Because of the scattering due to the difference in refractive index between the pores of the constituent particles, it may be possible to obtain a low transmittance value as a result. At a sintering temperature higher than 1250 ° C, precipitation of the Anatase phase, which is one of the crystalline phases of TiO 2 , occurs, so silica-titania glass particles with excellent light transmittance are obtained even in this temperature range. It may not be possible.

なお、この焼結方法は、上記温度範囲内であればよく、
特に制限されないが、電気炉等の一定温度に保つ焼結炉
を使用し、炉中に空気、酸素ガスまたは酸素と空気との
混合ガスを送入して炉内を酸化性雰囲気とすることが着
色の原因となる3価のTiイオン発生を防止する上で好ま
しい。また、所定の温度に達するまでの昇温速度は通常
10〜500℃/時とすることが好ましい。なお、焼結時間
は上記温度範囲で通常10〜300分である。
Incidentally, this sintering method may be within the above temperature range,
Although not particularly limited, it is possible to use a sintering furnace, such as an electric furnace, which maintains a constant temperature, and introduce air, oxygen gas, or a mixed gas of oxygen and air into the furnace to create an oxidizing atmosphere in the furnace. It is preferable in preventing the generation of trivalent Ti ions which causes coloring. In addition, the rate of temperature increase until reaching the specified temperature is usually
It is preferably 10 to 500 ° C./hour. The sintering time is usually 10 to 300 minutes in the above temperature range.

かくして得られたシリカ−チタニアガラス粒子は、光透
過率が高く、しかも上述したTiO2含量を変えることで容
易に屈折率をエポキシ樹脂と等しくすることができるの
で、エポキシ樹脂に配合した場合、上述した測定方法A
による900nmから600nmの波長範囲での直線透過率が70%
以上と極めて透明性に優れたものである。
The silica-titania glass particles thus obtained have a high light transmittance, and moreover, the refractive index can be easily made equal to that of the epoxy resin by changing the above-mentioned TiO 2 content. Measurement method A
70% linear transmittance in the wavelength range of 900nm to 600nm
As described above, it is extremely excellent in transparency.

なお、このシリカ−チタニアガラス粒子の表面を予じめ
カーボンファンクショナルシランなどで処理をすること
も有効である。
It is also effective to preliminarily treat the surfaces of the silica-titania glass particles with carbon functional silane or the like.

本発明に係るシリカ−チタニアガラス粒子の配合量は上
記硬化性エポキシ樹脂組成物100重量部に対し10〜600重
量部、特に50〜300重量部とすることが好ましい。10重
量部未満の配合量では低収縮率、低膨張性付与効果が十
分現われない場合があり、一方600重量部を超えて配合
すると、組成物の粘度が高くなりすぎてしまう場合があ
る。
The blending amount of the silica-titania glass particles according to the present invention is preferably 10 to 600 parts by weight, and particularly preferably 50 to 300 parts by weight, based on 100 parts by weight of the curable epoxy resin composition. If the amount is less than 10 parts by weight, the effect of imparting low shrinkage and low expansion may not be sufficiently exhibited, while if the amount is more than 600 parts by weight, the viscosity of the composition may be too high.

本発明の光透過性エポキシ樹脂組成物は、上述した硬化
性エポキシ樹脂組成物とシリカ−チタニアガラス粒子の
所定量を各種のミキサー、ニーダー、ロール、エクスト
ルーダーなどの混合装置を用いて均一に混練りすること
によって得ることができるが、これに加えて、更に透明
性を損わない範囲で必要に応じ各種の低応力剤、離型
剤、可視光カット剤、酸化防止剤、難燃剤、カーボンフ
ァンクショナルシランなどを適宜量配合することができ
る。これらの成分の配合順序に制限はないが、硬化性エ
ポキシ樹脂組成物の一部又は全部が固形であるときは、
必要とする全成分又はその一部と予じめ加熱溶融してか
ら混合することが効果的であり、あるいは溶媒中に溶解
してから均一に混合し、次いで溶剤をストリップする方
法も採用し得る。
The light-transmissive epoxy resin composition of the present invention is a uniform mixture of the above-mentioned curable epoxy resin composition and a predetermined amount of silica-titania glass particles using a mixing device such as various mixers, kneaders, rolls and extruders. It can be obtained by kneading, but in addition to this, various low-stress agents, release agents, visible light-cutting agents, antioxidants, flame retardants, and carbon, if necessary, within a range that does not impair transparency. An appropriate amount of functional silane or the like can be added. There is no limitation on the mixing order of these components, but when a part or all of the curable epoxy resin composition is solid,
It is effective to preliminarily heat-melt and mix with all or a part of the required components, or a method of dissolving in a solvent and then uniformly mixing, and then stripping the solvent can also be adopted. .

このようにして得られる方法の光透過性エポキシ樹脂組
成物は、透明性と低応力性を併せ持つ画期的なもので、
光半導体装置の封止に好適である。この場合、従来より
採用されている成形法、例えばトランスファ成形、イン
ジェクション成形、注型法などを採用して、LEDなどの
光半導体装置の封止を行なうことができる。なお、成形
温度は120〜180℃、ポストキュアーは120〜180℃で2〜
12時間行なうことが好ましい。
The light-transmitting epoxy resin composition of the method thus obtained is an epoch-making one having both transparency and low stress,
It is suitable for sealing optical semiconductor devices. In this case, conventionally used molding methods such as transfer molding, injection molding, and casting method can be used to seal the optical semiconductor device such as the LED. The molding temperature is 120-180 ℃, and the post cure is 120-180 ℃.
12 hours is preferable.

〔発明の効果〕〔The invention's effect〕

以上説明したように、本発明の光透過性エポキシ樹脂組
成物は、透明性の良好なシリカ−チタニアガラス粒子を
配合したことにより、その硬化物は透明性が良好である
と共に、低収縮率、低膨張率で低応力性であるため、光
半導体装置の封止用として好適に用いられるものであ
り、かかる光透過性エポキシ樹脂組成物で封止された光
半導体装置は光機能性を有効に発揮すると共に、信頼性
に優れたものである。
As described above, the light-transmissive epoxy resin composition of the present invention contains the silica-titania glass particles having good transparency, so that the cured product has good transparency and a low shrinkage ratio. Since it has a low expansion coefficient and low stress, it is preferably used for encapsulation of an optical semiconductor device, and an optical semiconductor device encapsulated with such a light-transmissive epoxy resin composition has effective optical functionality. It has excellent reliability as well as performance.

以下、実施例及び比較例を示し、本発明を具体的に説明
するが、本発明は下記の実施例に制限されるものではな
い。
Hereinafter, the present invention will be specifically described by showing Examples and Comparative Examples, but the present invention is not limited to the following Examples.

まず、実施例、比較例で用いたシリカ−チタニアガラス
粒子を次のように製造した。
First, the silica-titania glass particles used in Examples and Comparative Examples were manufactured as follows.

〔製造例〕[Production example]

シリカ−チタニアガラス粒子A 正珪酸エチル(多摩化学工業製)2083.3gとエタノール
(和光純薬,特級)672.6gとの溶液に30℃で0.2規定塩
酸水溶液180mlを添加し、1時間撹拌した。そこにチタ
ンテトライソプロポキシド(和光純薬,一級)505.7gを
徐々に添加したのち、さらに1時間撹拌した。その後、
純水668.1gを添加し、さらに10分間撹拌した。得られた
TiO2−SiO2ゾルをポリプロピレン製容器に入れ、90℃で
密閉したところ、ゾルは約30分後にゲル化した。ゲルを
そのまま90℃密閉下で12時間熟成した。その後、容器の
蓋を除き、70℃の乾燥器で4日間乾燥して乾燥ゲル体を
得た。
Silica-titania glass particles A To a solution of 2083.3 g of ethyl orthosilicate (manufactured by Tama Chemical Industry Co., Ltd.) and 672.6 g of ethanol (Wako Pure Chemical Industries, special grade), 180 ml of 0.2 N hydrochloric acid aqueous solution was added at 30 ° C., and the mixture was stirred for 1 hour. 505.7 g of titanium tetraisopropoxide (Wako Pure Chemical, first grade) was gradually added thereto, and the mixture was further stirred for 1 hour. afterwards,
668.1 g of pure water was added, and the mixture was further stirred for 10 minutes. Got
When the TiO 2 —SiO 2 sol was placed in a polypropylene container and sealed at 90 ° C., the sol gelled after about 30 minutes. The gel was aged as it was for 12 hours under the sealed at 90 ° C. Then, the lid of the container was removed and the product was dried in a dryer at 70 ° C. for 4 days to obtain a dry gel body.

この乾燥ゲル体のうち250gを容量2lのアルミナ製ボール
ミルで1時間粉砕した。この粉砕後の乾燥ゲル体を箱型
電気炉に入れ、乾燥空気1.4m3/hの条件で1100℃まで13
時間で昇温し、30分間,1100℃に保持し、平均粒径23.9
μmのTiO2−SiO2粒子(焼結ガラス)を得た。
250 g of this dried gel body was crushed for 1 hour with a ball mill made of alumina having a volume of 2 liters. Put the dried gel body after crushing in a box-type electric furnace and dry it up to 1100 ° C under the condition of 1.4 m 3 / h of dry air.
The temperature is raised for 1 hour and kept at 1100 ℃ for 30 minutes, and the average particle size is 23.9
μm TiO 2 —SiO 2 particles (sintered glass) were obtained.

このTiO2−SiO2焼結ガラスの屈折率(np)を液浸法によ
り測定したところ、1.561であった。
When the refractive index (n p ) of this TiO 2 —SiO 2 sintered glass was measured by the liquid immersion method, it was 1.561.

シリカ−チタニアガラス粒子B 実施例で得られた乾燥ゲルを箱型電気炉に入れ、乾燥空
気1.4m3/hの条件で1000℃まで13時間で昇温し、30分間,
1000℃に保持し、無色透明なTiO2−SiO2焼結ガラス740g
を得た。
Silica-titania glass particles B The dry gel obtained in the example was placed in a box-type electric furnace and heated to 1000 ° C. for 13 hours under the condition of dry air of 1.4 m 3 / h, and for 30 minutes.
740g of colorless and transparent TiO 2 -SiO 2 sintered glass kept at 1000 ℃
Got

この焼結ガラスを実施例と同様に粉砕して平均粒径18.7
μmのTiO2−SiO2ガラス粒子を得た。
This sintered glass was crushed in the same manner as in Example to have an average particle size of 18.7.
μm TiO 2 —SiO 2 glass particles were obtained.

これらのTiO2−SiO2ガラス粒子について、次の方法で透
過率と粒度分布を測定した。結果を第1表に示す。
The transmittance and particle size distribution of these TiO 2 —SiO 2 glass particles were measured by the following methods. The results are shown in Table 1.

透過率の測定方法 平均粒径5〜30μのTiO2−SiO2粒子を、TiO2の含有量か
ら計算される屈折率に±0.002の範囲になるように混合
比を調整したエピコート828(油化シェルエポキシ社製
エポキシ樹脂)とフェニルグリシジルエーテルとの混合
液(屈折率▲n25 D▼=1.5612)に、重量比で1:1になる
ように混合する。十分に粒子を分散させた後、目視で泡
が観察されなくなるまで減圧脱気を行う。この混合物を
1mmの光路長を有するセルに入れ、分光光度計を用いて9
00nmから400nmの波長範囲で透過率スペクトルを測定す
る。この場合、レファランスはブランクである。
The TiO 2 -SiO 2 particles measuring methods mean particle size 5~30μ transmittance, Epikote 828 (Yuka adjusting the mixing ratio to be in the range of ± 0.002 in the refractive index calculated from the content of TiO 2 (Epoxy resin manufactured by Shell Epoxy Co., Ltd.) and phenyl glycidyl ether are mixed in a mixed solution (refractive index (n 25 D ) = 1.5612) at a weight ratio of 1: 1. After sufficiently dispersing the particles, degassing under reduced pressure is performed until no bubbles are visually observed. This mixture
Place it in a cell with an optical path length of 1 mm and use a spectrophotometer to
The transmittance spectrum is measured in the wavelength range of 00 nm to 400 nm. In this case, the reference is blank.

粒度分布の測定方法 試料の分散媒としてヘキサメタリン酸ソーダの0.2重量
%の水溶液を使用し、島津製遠心沈降式粒度分布測定装
置SA−CP3Lにて測定した。
Measurement method of particle size distribution A 0.2% by weight aqueous solution of sodium hexametaphosphate was used as a dispersion medium of the sample, and the particle size distribution was measured by a centrifugal sedimentation type particle size distribution analyzer SA-CP3L manufactured by Shimadzu.

〔実施例1,2、比較例〕 エピコート828 17.5重量部、エピコート1001 50.3重量
部(以上、ビスフェノールA型エポキシ樹脂,商品名,
油化シェルエポキシ社製)、ヘキサヒドロ無水フタル酸
(新日本理化製,商品名,リカシッドHH)32.2重量部、
γ−(グリシジルプロピル)トリメトキシシラン0.5重
量部上で得られたシリカ−チタニアガラス粒子A、Bを
第2表に示した量で配合し、70℃で30分間溶融混合した
後、2−フェニルイミダゾール0.5重量部を加え、70℃
で10分間混合して3種の光透過性エポキシ樹脂組成物を
作製した。なお、シリカ−チタニアガラス粒子を加えな
い以外は同様にして光透過性エポキシ樹脂組成物を作製
した。
[Examples 1 and 2 and Comparative Example] Epicoat 828 17.5 parts by weight, Epicoat 1001 50.3 parts by weight (above, bisphenol A type epoxy resin, trade name,
Yuka Shell Epoxy Co., Ltd.), hexahydrophthalic anhydride (New Nippon Rika, trade name, RIKACID HH) 32.2 parts by weight,
0.5 parts by weight of γ- (glycidylpropyl) trimethoxysilane Silica-titania glass particles A and B obtained above were blended in the amounts shown in Table 2, melt-mixed at 70 ° C. for 30 minutes, and then mixed with 2-phenyl. Add 0.5 parts by weight of imidazole, 70 ℃
Were mixed for 10 minutes to prepare three kinds of light transmissive epoxy resin compositions. A light-transmissive epoxy resin composition was prepared in the same manner except that silica-titania glass particles were not added.

これらの組成物につい、て下記に示す方法でガラス転移
温度、線膨張係数、耐クラック性、光透過率を測定し
た。結果を第2表に併記する。
The glass transition temperature, linear expansion coefficient, crack resistance, and light transmittance of these compositions were measured by the methods described below. The results are also shown in Table 2.

膨張係数、ガラス転移温度 上記光透過性エポキシ樹脂組成物で4mmφ×15mmの試験
片を成形し、これを用いてディラトメーターにより毎分
5℃の速さで昇温したときの値を測定した。
Expansion coefficient, glass transition temperature A test piece of 4 mmφ × 15 mm was molded from the above-mentioned light-transmitting epoxy resin composition, and the value when the temperature was raised at a rate of 5 ° C./min by a dilatometer was measured using the test piece. .

耐クラック性 9.0×4.5×0.5mmの大きさのシリコンチップを14PIN−1C
フレーム(42アロイ)に接着し、これに上記光透過性エ
ポキシ樹脂組成物を150℃×5分の成形条件で成形し、1
50℃で4時間アフターキュアーした後、これに−40℃
(30分間)〜150℃(30分間)の熱サイクルを繰返して
加え、500サイクル後の樹脂クラック発生率を調べた
(n=10)。
Crack resistance 9.0 × 4.5 × 0.5mm size silicon chip 14PIN-1C
It is adhered to a frame (42 alloy), and the above-mentioned light-transmissive epoxy resin composition is molded under the molding conditions of 150 ° C. for 5 minutes.
After after-curing at 50 ℃ for 4 hours, add -40 ℃
A thermal cycle of (30 minutes) to 150 ° C. (30 minutes) was repeatedly added, and the resin crack occurrence rate after 500 cycles was examined (n = 10).

光透過率 1mm厚の成形品を成形し、これの700nmでの光透過率を測
定した。
A light-transmittance molded article having a thickness of 1 mm was molded and the light-transmittance at 700 nm was measured.

第2表の結果より、シリカ−チタニアガラス粒子を配合
しない硬化性エポキシ樹脂組成物(比較例1)の硬化物
は、線膨張係数が大きく、このため耐クラック性が非常
に悪く、また、これに光透過率が30%以下のシリカ−チ
タニア粒子を加えた組成物(比較例2)の硬化物は、線
膨張係数が小さくなり、耐クラック性は改善されるもの
の、その反面光透過率が大きく低下してしまう。これに
対して、光透過率が70%以上のシリカ−チタニア粒子を
配合した本発明の光透過性組成物(実施例1,2)の硬化
物は、エポキシ樹脂の線膨張係数を小さくし、耐クラッ
ク性を大幅に改良できると共に、多量に配合しても、エ
ポキシ樹脂の透明性を損わないことが認められる。
From the results shown in Table 2, the cured product of the curable epoxy resin composition (Comparative Example 1) containing no silica-titania glass particles has a large linear expansion coefficient, and therefore has very poor crack resistance. The cured product of the composition (Comparative Example 2) in which silica-titania particles having a light transmittance of 30% or less was added to the composition had a small linear expansion coefficient and improved crack resistance, but on the other hand, the light transmittance was It will be greatly reduced. On the other hand, the cured product of the light-transmitting composition of the present invention (Examples 1 and 2) having a light transmittance of 70% or more of silica-titania particles reduces the linear expansion coefficient of the epoxy resin, It can be seen that the crack resistance can be greatly improved and that the transparency of the epoxy resin is not impaired even if a large amount is compounded.

フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/312 Z 7352−4M 23/29 23/31 (72)発明者 新井 一弘 群馬県安中市磯部2丁目13番1号 信越化 学工業株式会社シリコーン電子材料技術研 究所内 (72)発明者 滝田 政俊 新潟県中頚城郡頚城村大字西福島28番地の 1 信越化学工業株式会社合成技術研究所 内 (56)参考文献 特開 昭61−91242(JP,A) 特開 昭64−86539(JP,A) 特開 平2−263846(JP,A) 特開 平3−232741(JP,A)Continuation of front page (51) Int.Cl. 5 Identification number Office reference number FI Technical indication location H01L 21/312 Z 7352-4M 23/29 23/31 (72) Inventor Kazuhiro Arai Gunma prefecture Annaka city Isobe 2 1-chome 13-1 Shin-Etsu Chemical Co., Ltd. Silicon Silicon Electronic Materials Research Laboratory (72) Inventor Masatoshi Takita No. 28 Nishifukushima, Chugaku-mura, Nakakubiki-gun, Niigata 1 Shin-Etsu Chemical Co., Ltd. ) Reference JP 61-91242 (JP, A) JP 64-86539 (JP, A) JP 2-263846 (JP, A) JP 3-232741 (JP, A)

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】(イ)硬化性エポキシ樹脂と、 (ロ)硬化剤と、 (ハ)下記直線透過率測定方法Aによる900nmから600nm
の波長範囲での直線透過率が70%以上であるシリカ−チ
タニアガラス粒子と を含有することを特徴とする光透過性エポキシ樹脂組成
物。 A下記の一般式(1)で示されるビスフェノール型エポ
キシ樹脂又は下記の一般式(2)で示されるノボラック
型エポキシ樹脂とフェニルグリシジルエーテルとを混合
し、シリカ−チタニアガラス粒子との屈折率差が±0.00
2以内になる溶液を調製する。この溶液と平均粒径が5
〜30μmに粉砕されたシリカ−チタニアガラス粒子とを
重量比で1:1に混合し、その混合物について1mmの光路長
で直線透過率を測定する。 (但し、nは0〜10の整数である。) (但し、nは0〜10の整数である。)
1. A curable epoxy resin, (b) a curing agent, and (c) 900 nm to 600 nm according to the following linear transmittance measurement method A.
And a silica-titania glass particle having a linear transmittance in the wavelength range of 70% or more. A A bisphenol type epoxy resin represented by the following general formula (1) or a novolac type epoxy resin represented by the following general formula (2) is mixed with phenylglycidyl ether to obtain a silica-titania glass particle having a difference in refractive index. ± 0.00
Prepare a solution within 2. This solution has an average particle size of 5
Silica-titania glass particles crushed to -30 μm are mixed in a weight ratio of 1: 1 and the linear transmittance of the mixture is measured with an optical path length of 1 mm. (However, n is an integer of 0 to 10.) (However, n is an integer of 0 to 10.)
【請求項2】請求項1記載の光透過性エポキシ樹脂組成
物の硬化物で封止された光半導体装置。
2. An optical semiconductor device encapsulated with a cured product of the light-transmissive epoxy resin composition according to claim 1.
JP2060669A 1990-02-07 1990-03-12 Light-transmissive epoxy resin composition and optical semiconductor device Expired - Fee Related JPH06104768B2 (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2060669A JPH06104768B2 (en) 1990-03-12 1990-03-12 Light-transmissive epoxy resin composition and optical semiconductor device
DE69104859T DE69104859T2 (en) 1990-02-07 1991-02-06 Epoxy resin compositions containing highly transparent silica-titanium dioxide glass balls.
EP91300992A EP0441622B1 (en) 1990-02-07 1991-02-06 Epoxy resin compositions containing highly transparent silica-titania glass beads
US07/651,438 US5175199A (en) 1990-02-07 1991-02-07 High transparency silica-titania glass beads, method for making, and light transmission epoxy resin compositions
KR1019910003854A KR950005312B1 (en) 1990-03-12 1991-03-11 Light transmissive epoxy resin composition and optical semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2060669A JPH06104768B2 (en) 1990-03-12 1990-03-12 Light-transmissive epoxy resin composition and optical semiconductor device

Publications (2)

Publication Number Publication Date
JPH03259948A JPH03259948A (en) 1991-11-20
JPH06104768B2 true JPH06104768B2 (en) 1994-12-21

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KR (1) KR950005312B1 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2715792B2 (en) * 1992-02-13 1998-02-18 信越化学工業株式会社 Light transmitting epoxy resin composition and optical semiconductor device
WO2003050188A1 (en) * 2001-12-08 2003-06-19 Atto Co., Ltd Epoxy resin composition and light source cover for illumination
KR20030047726A (en) * 2001-12-08 2003-06-18 주식회사 아토 Epoxy resin composition, and light source cover for illumination prepared therefrom
KR101329695B1 (en) * 2006-12-20 2013-11-14 에스케이케미칼주식회사 Reworkable epoxy resin composition
KR100953667B1 (en) * 2008-02-28 2010-04-20 한국생산기술연구원 Polycarbonate resin composition for plastic substrates and polycarbonate film using the same
CN119161691A (en) * 2024-10-11 2024-12-20 天津市大港绝缘材料厂 Insulating material for high thermal conductivity transformer and preparation method thereof

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JPH03259948A (en) 1991-11-20
KR950005312B1 (en) 1995-05-23
KR910016852A (en) 1991-11-05

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