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JPH06105170B2 - Appearance inspection machine - Google Patents
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JPH06105170B2 - Appearance inspection machine - Google Patents

Appearance inspection machine

Info

Publication number
JPH06105170B2
JPH06105170B2 JP1306906A JP30690689A JPH06105170B2 JP H06105170 B2 JPH06105170 B2 JP H06105170B2 JP 1306906 A JP1306906 A JP 1306906A JP 30690689 A JP30690689 A JP 30690689A JP H06105170 B2 JPH06105170 B2 JP H06105170B2
Authority
JP
Japan
Prior art keywords
inspected
projector
light
projected
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1306906A
Other languages
Japanese (ja)
Other versions
JPH03167416A (en
Inventor
優一 藤澤
恵司 宮本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP1306906A priority Critical patent/JPH06105170B2/en
Publication of JPH03167416A publication Critical patent/JPH03167416A/en
Publication of JPH06105170B2 publication Critical patent/JPH06105170B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は印刷配線板のような被検査物の表面にできた欠
陥を検出する外観検査機に関するものである。
The present invention relates to a visual inspection machine for detecting defects formed on the surface of an object to be inspected such as a printed wiring board.

[従来の技術] 従来、印刷配線媒のような被検査物の表面にできた欠陥
を検出する外観検出機としては、第2図に示すように被
検査物1の表面に対して斜め上方から投光器2で投光
し、この投光器2で投光された被検査物1の表面を投光
器2の前方に配置されたTVカメラのような撮像手段3を
斜め上方から撮像し、この撮像により得られた濃淡画像
データをA/D変換器4でデジタル変換してフレームメモ
リ5に記憶させ、判定処理部6により該フレームメモリ
5に記憶された濃淡画素の濃度を所定の閾値と比較して
汚れ、凹凸、打痕、疵等の欠陥7を検出するものがあっ
た。例えば、凹凸、打痕、疵等被検査物1の表面に凹凸
を形成する欠陥7の場合、投光器2で投光された光によ
り凹凸の谷に影ができ、濃淡画像として捕えたとき、影
の部分がその他の箇所に比して濃い画像となる。従って
この濃度が閾値より濃いければ欠陥7として検出するこ
とができるのである。
[Prior Art] Conventionally, as an appearance detector for detecting a defect formed on the surface of an object to be inspected such as a printed wiring medium, as shown in FIG. The light is projected by the projector 2, and the surface of the inspection object 1 projected by the projector 2 is imaged obliquely from above by the imaging means 3 such as a TV camera arranged in front of the projector 2 and obtained by this imaging. The grayscale image data is digitally converted by the A / D converter 4 and stored in the frame memory 5, and the determination processing unit 6 compares the grayscale pixel density stored in the frame memory 5 with a predetermined threshold value to stain the Some have detected defects 7 such as irregularities, dents, and flaws. For example, in the case of a defect 7 such as unevenness, a dent, or a flaw that forms unevenness on the surface of the object to be inspected 1, the light projected by the projector 2 creates a shadow in the valley of the unevenness, and when it is captured as a grayscale image, The area of becomes a darker image than the other areas. Therefore, if this density is higher than the threshold value, it can be detected as the defect 7.

[発明が解決しようとする課題〕 ところで従来の外観検査機は上述のように被検査物1に
対して1台の投光器2で投光を行っているため投光方向
が一方向となり、従って打痕のようにへこみによる欠陥
7ではへこみの谷の走る方向が第3図に示すように投光
方向イに対して交差する方向あれば影ができるが、投光
方向ロと平行する方向であれば影ができず、そのため欠
陥7が検出できないという問題があった。
[Problems to be Solved by the Invention] By the way, in the conventional appearance inspection machine, since the one projector 2 projects light onto the object to be inspected 1 as described above, the direction of projection is unidirectional. In the defect 7 due to a dent like a mark, a shadow can be formed if the running direction of the valley of the dent intersects the projection direction a as shown in FIG. 3, but it may be a direction parallel to the projection direction b. If there is no shadow, defect 7 cannot be detected.

本発明は上述の問題点に鑑みて為されたもので、その目
的とするところ打痕のような欠陥であっても確実に検出
することができる外観検査機を提供するにある。
The present invention has been made in view of the above problems, and an object of the present invention is to provide an appearance inspection machine capable of reliably detecting even a defect such as a dent.

[課題を解決するための手段] 本発明は被検査物の方面に投光する投光器と、該投光器
によって投光された被検査物の表面を投光器の反対の位
置から撮像する撮像手段と、撮像手段で得られた濃淡画
像から被検査物の表面の欠陥を検出できる画像処理手段
とを備えた外観検査機において、被検査物の搬送方向に
対して投光軸が斜めで且つ被検査物の表面に対して斜め
上方から搬送方向前方へ投光する第1の投光器と、第1
の投光器で投光された被検査物の表面を捕らえるライン
センサからなる第1の撮像手段とを複数組、被検査物の
幅方向に配設するとともに、被検査物の搬送方向に対し
て投光軸が斜めで且つ第1の投光器の投光軸に対して交
差するように投光軸が設定されて被検査物の表面に対し
て反搬送方向への投光する第2の投光器と、この第2の
投光器で投光された被検査物の表面を捕らえるラインセ
ンサらなる第2の撮像手段とを複数組、被操作物の幅方
向に配設して、これら投光器と撮像手段とで被検査物の
表面を多方向から投光、撮像するものである。
[Means for Solving the Problems] The present invention relates to a projector for projecting light in the direction of an object to be inspected, an imaging means for imaging the surface of the object to be inspected projected by the projector from a position opposite to the projector, and an imaging device. In an appearance inspection machine equipped with an image processing means capable of detecting a defect on the surface of an object to be inspected from a grayscale image obtained by the means, the projection axis is oblique with respect to the conveyance direction of the object to be inspected, and A first projector for projecting light obliquely above the surface to the front in the transport direction;
A plurality of sets of first imaging means composed of a line sensor for capturing the surface of the inspected object projected by the projector of the above, and arranged in the width direction of the inspected object, and projecting in the conveying direction of the inspected object. A second projector in which the light projection axis is set so that the light axis is oblique and intersects the light projection axis of the first light projector, and the light is projected in a direction opposite to the conveying direction with respect to the surface of the inspection object; A plurality of sets of second image pickup means composed of line sensors for catching the surface of the object to be inspected projected by the second light projector are arranged in the width direction of the operated object. The surface of an object to be inspected is projected and imaged from multiple directions.

[作用] 而してへこみからなる欠陥の谷の方向がどの方向にあっ
ても、いずれかの投光器によって欠陥による影を生じさ
せることができ、この影を生じさせた投光器に対応する
撮像手段で得られた濃淡画像により欠陥を検出すること
ができ、特に被検査物の表面に打痕のようなへこみによ
る欠陥が生じ、そのへこみ谷の方向が第1、第2の投光
器の投光方向の一方に平行しても他の投光方向で影を生
じさせることができ、この影を生じさせた投光器に対応
する撮像手段で影を撮像することができ、結果確実に欠
陥検出が行なえるのである。
[Operation] Even if the direction of the valley of the defect formed by the dent is in any direction, a shadow due to the defect can be generated by any one of the light projectors, and the image pickup means corresponding to the light projector that generated this shadow can be used. Defects can be detected from the obtained gray-scale image, and in particular, defects due to dents such as dents occur on the surface of the object to be inspected, and the direction of the dent valleys is the direction of the light projection of the first and second light projectors. Even if the shadow is parallel to one side, a shadow can be generated in the other projection direction, and the shadow can be captured by the imaging means corresponding to the projector that has generated the shadow, and as a result, defect detection can be performed reliably. is there.

[実施例] 第1図は本発明の一実施例の撮像手段3,3′と投光器2,
2′との配置状態を示しており、この実施例では撮像手
段3,3′としてラインセンサを用い、被検査物1の矢印
Aで示す搬送方向に対して投光軸が斜めで且つ被検査物
1の表面に対して斜め上方から搬送方向前方へ投光する
投光器2と、この投光器2で投光された被検査物1の表
面を捕える撮像手段3とを複数組、被検査物1の幅方向
に配設し、また上記被検査物1の搬送方向に対して投光
軸が斜めで且つ上記投光器2の投光軸に対して交差する
ように投光軸が設定されて被検査物1の表面に対して斜
め上方から反搬送方向へ投光する投光器2′とこの投光
器2′で投光された被検査物1の表面を捕える撮像手段
3′とを複数組、被検査物1の幅方向に配設してある。
[Embodiment] FIG. 1 shows an image pickup means 3, 3'and a projector 2, according to an embodiment of the present invention.
2 ', the line sensor is used as the image pickup means 3, 3'in this embodiment, and the projection axis is oblique with respect to the conveyance direction of the inspection object 1 shown by the arrow A and the inspection object is inspected. A plurality of sets of a projector 2 for projecting light obliquely upward from the surface of the object 1 to the front in the transport direction and an image pickup means 3 for capturing the surface of the object 1 to be inspected projected by the projector 2 are provided. The object to be inspected is arranged in the width direction, and the light projecting axis is set so that the light projecting axis is oblique to the conveying direction of the object to be inspected 1 and intersects the light projecting axis of the light projector 2. A plurality of sets of a projector 2 ′ that projects light in an anti-conveyance direction from obliquely above the surface of 1 and an imaging means 3 ′ that captures the surface of the inspected object 1 projected by this projector 2 ′, the inspected object 1 Are arranged in the width direction of.

而して被検査物1の表面に打痕のようなへこみによる欠
陥が生じ、そのへこみの谷の方向が投光器2又は2′の
投光方向の一方に平行しても他の投光方向で影を生じさ
せることができ、この影を生じさせた投光器2又は2′
に対応する撮像手段3又は3′で影を撮像することがで
きて確実に欠陥検出が行えるのである。
Thus, a defect due to a dent such as a dent occurs on the surface of the object 1 to be inspected, and even if the direction of the valley of the dent is parallel to one of the light projecting directions of the projector 2 or 2 ', the other projecting direction does not occur. A shadow can be produced, and the projector 2 or 2'that has produced this shadow
The shadow can be picked up by the image pickup means 3 or 3'corresponding to the above, and the defect can be surely detected.

尚欠陥判別は第2図の構成と同様な構成で行うため、そ
の構成及び動作の説明は省略する。
Since the defect determination is performed with the same configuration as that of FIG. 2, the description of the configuration and operation will be omitted.

[発明の効果] 本発明は被検査物の表面に投光する投光器と、該投光器
によって投光された被検査物の表面を投光器の反対の位
置から撮像する撮像手段と、撮像手段で得られた濃淡画
像から被検査物の表面の欠陥を検出する画像処理手段と
を備えた外観検査機において、被検査物の搬送方向に対
して投光軸が斜めで且つ被検査物の表面に対して斜め上
方から搬送方向前方へ投光する第1の投光器と、第1の
投光器で投光された被検査物の表面を捕らえるラインセ
ンサからなる第1の撮像手段とを複数組、被検査物の幅
方向に配設するとともに、被検査物の搬送方向に対して
投光軸が斜めで且つ第1の投光器の投光軸に対して交差
するように投光軸が設定されて被検査物の表面に対して
反搬送方向への投光する第2の投光器と、この第2の投
光器で投光された被検査物の表面を捕らえるラインセン
サからなる第2の撮像手段とを複数組、被操作物の幅方
向に配設して、これら投光機と撮像カメラとで被検査物
の表面を多方向から投光、撮像するものであるから、へ
こみからなる欠陥の谷の方向がどの方向にあっても、い
ずれかの投光器によって影を生じさせることができ、結
果この影を生じさせた投光器に対応する撮像手段で得ら
れた濃淡画像により欠陥を検出することができ、今まで
検出不可能であった方向性をもった欠陥も検出すること
ができるという効果がある。
EFFECTS OF THE INVENTION The present invention can be obtained by a projector that projects light onto the surface of an object to be inspected, an imaging unit that images the surface of the object to be inspected projected by the projector from a position opposite to the projector, and an imaging unit. In an appearance inspection machine equipped with an image processing means for detecting defects on the surface of the object to be inspected from the grayscale image, the projection axis is oblique to the conveying direction of the object to be inspected and A plurality of sets of a first projector for projecting light obliquely from above to the front in the conveying direction and a plurality of first imaging means composed of a line sensor for capturing the surface of the object to be inspected projected by the first projector are provided. In addition to being arranged in the width direction, the projection axis is set so that the projection axis is oblique to the conveyance direction of the inspection object and intersects the projection axis of the first projector. A second projector for projecting light in a direction opposite to the surface and a second projector A plurality of sets of second imaging means composed of a line sensor for catching the surface of the object to be inspected, which are projected by the vessel, are arranged in the width direction of the operated object, and the object to be inspected by the projector and the imaging camera. Since the surface of an object is projected and imaged from multiple directions, a shadow can be generated by either projector regardless of the direction of the valley of the defect formed by the dent, and as a result, this shadow is generated. There is an effect that a defect can be detected by a grayscale image obtained by an image pickup unit corresponding to the generated light projector, and a directional defect that has been impossible to detect can be detected.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例の撮像手段と投光器との配置
状態説明図、第2図は従来例の構成図、第3図は同上の
説明図である。 1は被検査物、2,2′は投光器、3,3′は撮像手段であ
る。
FIG. 1 is an explanatory view of an arrangement state of an image pickup means and a light projector according to an embodiment of the present invention, FIG. 2 is a configuration diagram of a conventional example, and FIG. 3 is an explanatory view of the same. Reference numeral 1 is an object to be inspected, 2, 2'is a projector, and 3, 3'is an image pickup means.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】被検査物の表面に投光する投光器と、該投
光器によって投光された被検査物の表面を投光器の反対
の位置から撮像する撮像手段と、撮像手段で得られた濃
淡画像から被検査物の表面の欠陥を検出する画像処理手
段とを備えた外観検査機において、被検査物の搬送方向
に対して投光軸が斜めで且つ被検査物の表面に対して斜
め上方から搬送方向前方へ投光する第1の投光器と、第
1の投光器で投光された被検査物の表面を捕らえるライ
ンセンサからなる第1の撮像手段とを複数組、被検査物
の幅方向に配設するとともに、被検査物の搬送方向に対
して投光軸が斜めで且つ第1の投光器の投光軸に対して
交差するように投光軸が設定されて被検査物の表面に対
して反搬送方向へ投光する第2の投光器と、この第2の
投光器で投光された被検査物の表面を捕らえるラインセ
ンサからなる第2の撮像手段とを複数組、被検査物の幅
方向に配設したことを特徴とする外観検査機。
1. A light projector for projecting light onto the surface of an object to be inspected, image pickup means for picking up an image of the surface of the object to be inspected projected by the light projector from a position opposite to the light projector, and a grayscale image obtained by the image pickup means. In an appearance inspection machine equipped with an image processing means for detecting defects on the surface of the object to be inspected, the projection axis is oblique with respect to the conveying direction of the object to be inspected, and obliquely above the surface of the object to be inspected. A plurality of sets of a first light projector that projects light forward in the transport direction and a first imaging unit that includes a line sensor that captures the surface of the object to be inspected projected by the first light projector are arranged in the width direction of the object to be inspected. With respect to the surface of the object to be inspected, the light emitting axis is set so as to be oblique with respect to the transport direction of the object to be inspected and intersect the light emitting axis of the first light projector. And a second projector for projecting light in the direction opposite to the transport direction, and the light projected by the second projector. The second plurality of sets of the imaging means comprising a line sensor for capturing the surface of the object to be inspected, the visual inspection device, characterized in that arranged in the width direction of the object to be inspected.
JP1306906A 1989-11-27 1989-11-27 Appearance inspection machine Expired - Lifetime JPH06105170B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1306906A JPH06105170B2 (en) 1989-11-27 1989-11-27 Appearance inspection machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1306906A JPH06105170B2 (en) 1989-11-27 1989-11-27 Appearance inspection machine

Publications (2)

Publication Number Publication Date
JPH03167416A JPH03167416A (en) 1991-07-19
JPH06105170B2 true JPH06105170B2 (en) 1994-12-21

Family

ID=17962694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1306906A Expired - Lifetime JPH06105170B2 (en) 1989-11-27 1989-11-27 Appearance inspection machine

Country Status (1)

Country Link
JP (1) JPH06105170B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103604379A (en) * 2013-10-29 2014-02-26 中国船舶重工集团公司第七二五研究所 Fixing device for round-bar stretching sample with gap and measurement method for diameter at gap

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH061180B2 (en) * 1985-04-01 1994-01-05 株式会社ミユ−チユアル Optical inspection method for article surface

Also Published As

Publication number Publication date
JPH03167416A (en) 1991-07-19

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