JPH0614025B2 - Ultrasonic wave metal appraisal device - Google Patents
Ultrasonic wave metal appraisal deviceInfo
- Publication number
- JPH0614025B2 JPH0614025B2 JP58126876A JP12687683A JPH0614025B2 JP H0614025 B2 JPH0614025 B2 JP H0614025B2 JP 58126876 A JP58126876 A JP 58126876A JP 12687683 A JP12687683 A JP 12687683A JP H0614025 B2 JPH0614025 B2 JP H0614025B2
- Authority
- JP
- Japan
- Prior art keywords
- ultrasonic
- thickness
- transducer
- measured
- thickness gauge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 229910052751 metal Inorganic materials 0.000 title claims description 20
- 239000002184 metal Substances 0.000 title claims description 20
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 16
- 238000006073 displacement reaction Methods 0.000 claims description 15
- 238000005259 measurement Methods 0.000 description 22
- 239000000126 substance Substances 0.000 description 19
- 230000005484 gravity Effects 0.000 description 6
- 150000002739 metals Chemical class 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000007822 coupling agent Substances 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 230000001066 destructive effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000004451 qualitative analysis Methods 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B17/00—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
- G01B17/02—Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/04—Analysing solids
- G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02854—Length, thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/0289—Internal structure, e.g. defects, grain size, texture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
【発明の詳細な説明】 本発明は、金属の種類を鑑定する場合におけるデジタル
厚み計と超音波厚み計を併用した超音波による金属鑑定
装置に関するものである。Description: TECHNICAL FIELD The present invention relates to an ultrasonic metal identifying apparatus that uses a digital thickness gauge and an ultrasonic thickness gauge in combination to identify the type of metal.
現在分析機器の長足の進歩により、物質定量、定性分析
が可能となったが、完全に非破壊で、かつ容易に金属の
種類を決定できる機器は存在しなかった。At present, the long progress of analytical instruments has enabled quantitative and qualitative analysis of substances, but there was no instrument that was completely nondestructive and capable of easily determining the type of metal.
非破壊分析器としてあげることができる蛍光、Ｘ線分析
器は、物質表面近傍の物質しか定量することができず、
物質全体を定量することは不可能である。The fluorescence and X-ray analyzers that can be mentioned as non-destructive analyzers can only quantify substances near the surface of the substance,
It is not possible to quantify the whole substance.
従来周知であり、現在もなおさかんに使用されているも
のに、比重による測定方法がある。これは秤量機器の発
達により、物質のかなりの純度まで比重により決定する
ことが可能となった。しかし検査すべき物質と同一比重
を持つ物質、同一の比重となるよう調合された二種以上
の物質の混合、又は検査すべき物質と同一比重となるよ
う、或る物質に異質の物質が点在した場合等に対し、こ
の比重により区分することは不可能である。A measurement method based on specific gravity is one that is well known in the art and is still widely used today. It has been made possible by the development of weighing equipment to determine the considerable purity of a substance by its specific gravity. However, a substance that has the same specific gravity as that of the substance to be inspected, a mixture of two or more substances that have been prepared to have the same specific gravity, or a substance that is different from the substance that has the same specific gravity as the substance to be inspected It is impossible to classify by this specific gravity, when it exists.
又近年異種金属間の熱起電力を測定して、物質の純度を
知ろうという方法も考えられた。つまり試験器の金属と
被試験金属を接触させ、試験器の金属を加熱することに
よって、二種金属間の起電力を測定するものであるが、
これまた蛍光、Ｘ線分析器と同様表面のみであり、内部
を知ることはできない。In recent years, a method of measuring the thermoelectromotive force between dissimilar metals to know the purity of the substance has been considered. That is, by contacting the metal of the tester and the metal under test and heating the metal of the tester, the electromotive force between the two kinds of metals is measured.
Also, like the fluorescence and X-ray analyzers, only the surface is available, and the inside cannot be known.
更に近年発表された超音波を用いた物質の純度鑑定器が
ある。これは、物質による超音波の伝播速度の違いによ
って、物質の純度を鑑定しようとするものである。即
ち、測定すべき物質の超音波伝播速度をＶとした時、第
１図に示す如く、トランスデューサー１から被測定物２
に伝播された超音波が被測定物２底面より反射され、再
びトランスデューサー１に到達するに要した時間Ｔを実
測すれば被測定物２の厚みＤは、 Ｄ＝1/2×Ｔ×Ｖ で求めることができる。なお、かかる超音波を用いて厚
みを測定する測定装置を「超音波厚み計」と略称する。
ここで、被測定物が異質な物質であた場合、その物質の
超音波伝播速度Ｖ′は、測定すべき物質に固有値として
定まる理論伝播速度Ｖとは異なるのが普通であり、その
ため超音波伝播時間Ｔ′は測定すべき物質の理論伝播時
間Ｔとは自ずから異なってくる。そこで、被測定物の仮
想厚みＤ′は、 Ｄ′＝1/2×Ｔ′×Ｖ で計算され、被測定物の実際の厚みＤと、超音波伝播速
度により上式で求められる仮想厚みＤ′とがくい違って
くることによって、金属の純度を鑑定しようとするもの
である。この場合、第２図に示す如く、もし被測定物２
中に異種金属３や空洞４があれば、超音波はその相から
反射し、やはり実際の厚みとくい違ってくるので、実際
の厚みをＤ、鑑定しようとする金属の超音波伝播速度を
Ｖ、時間をT1，T2，T3とすると、 Ｄ＝1/2×T1×Ｖ Ｄ≠1/2×T2×Ｖ Ｄ≠1/2×T3×Ｖ となり、やはり実際の厚みとくい違ってくることによ
り、同様に鑑定が可能である。Furthermore, there is a material purity analyzer using ultrasonic waves that has been recently announced. This aims to determine the purity of a substance by the difference in the propagation speed of ultrasonic waves depending on the substance. That is, when the ultrasonic wave propagation velocity of the substance to be measured is V, as shown in FIG.
If the time T required for the ultrasonic wave propagated to the ultrasonic wave to be reflected from the bottom surface of the DUT 2 and to reach the transducer 1 again is measured, the thickness D of the DUT 2 is: D = 1/2 × T × V Can be found at. A measuring device for measuring the thickness using such ultrasonic waves is abbreviated as "ultrasonic thickness gauge".
Here, when the object to be measured is a heterogeneous substance, the ultrasonic wave propagation velocity V ′ of the substance is usually different from the theoretical wave propagation velocity V that is determined as an eigenvalue of the substance to be measured. The propagation time T ′ naturally differs from the theoretical propagation time T of the substance to be measured. Therefore, the virtual thickness D'of the object to be measured is calculated by D '= 1/2 × T' × V, and the actual thickness D of the object to be measured and the virtual thickness D obtained from the above equation by the ultrasonic wave propagation velocity. It is intended to determine the purity of a metal by the difference between'and '. In this case, as shown in FIG.
If there are dissimilar metals 3 and cavities 4 inside, ultrasonic waves are reflected from that phase and again differ from the actual thickness. Therefore, the actual thickness is D, and the ultrasonic wave propagation velocity of the metal to be evaluated is V. , And time is T 1 , T 2 , T 3 , D = 1/2 × T 1 × V D ≠ 1/2 × T 2 × V D ≠ 1/2 × T 3 × V, which is the actual thickness. By making a difference, it is possible to make an appraisal as well.
しかし、これらの方法は超音波によってのみ厚みと、実
際の厚みとの比較により鑑定しようとするものであり、
その実際の厚み測定方法は開示されていない。However, these methods are intended to be evaluated by comparing the thickness only by ultrasonic waves and the actual thickness,
The actual thickness measuring method is not disclosed.
もし、被測定物が完全な平行面を持つものであれば、公
知の厚み測定器、例えばノギス、マイクロメータ等の機
械的構成によりスケール（目盛り）の変位量をもって厚
みを測定する測定装置（以下、本明細書においては「変
位量測定厚み計」と略称する。）厚みを測定すれば、あ
とはその厚みと、超音波による厚みを比較すればよいの
であるが、被測定物の表面に凹凸があった場合、ノギ
ス、マイクロメーター等による実際厚みの測定位置と超
音波厚み計の測定位置の相違や、被測定物の表面の凹凸
等により、従来の超音波による方法では、実際の厚み
と、超音波による厚みとを比較する術がない。If the object to be measured has a completely parallel surface, a known thickness measuring device, for example, a measuring device for measuring the thickness with a displacement amount of a scale by a mechanical structure such as a caliper or a micrometer (hereinafter , In this specification, it is abbreviated as "displacement measuring thickness gauge".) After measuring the thickness, the thickness can be compared with the thickness by ultrasonic waves. If there is, the difference between the measurement position of the actual thickness and the measurement position of the ultrasonic thickness gauge with a caliper, micrometer, etc., due to the unevenness of the surface of the object to be measured, etc. , There is no way to compare the thickness with ultrasonic waves.
本発明は上述した事情に鑑みてなされたものであり、変
位量測定厚み計と超音波厚み計を併用して、実際厚みと
超音波による厚みを同時に比較することにより、上述し
た欠点を克服した超音波による金属鑑定装置を提供せん
とするものである。The present invention has been made in view of the above-mentioned circumstances, and overcomes the above-described drawbacks by using a displacement measurement thickness gauge and an ultrasonic thickness gauge together to compare the actual thickness and the ultrasonic thickness at the same time. It is intended to provide a metal identification device using ultrasonic waves.
以下、第３図ないし第７図にもとづいてこの発明の一実
施例を説明する。An embodiment of the present invention will be described below with reference to FIGS.
第３図、第４図は本発明の一実施例の説明図、第５図
は、本発明の一実施例の超音波厚み計の縦断面図、第６
図は同超音波厚み計の取付け状態を示す一部断面した正
面図、第７図(a)は本発明の一実施例の側面図、(b)は同
正面図である。3 and 4 are explanatory views of an embodiment of the present invention, and FIG. 5 is a longitudinal sectional view of an ultrasonic thickness gauge according to an embodiment of the present invention.
FIG. 7 is a partially sectional front view showing a mounting state of the ultrasonic thickness gauge, FIG. 7A is a side view of an embodiment of the present invention, and FIG.
トランスデューサー１と被測定物２表面の密着をよく
し、超音波の透過率が高くなるよう、カップリング剤と
して水を使用し、トランスデューサー１を一定力で被測
定物２に押しつけ、かつ水密とするため下記の如き構造
とする。Water is used as a coupling agent to improve the close contact between the transducer 1 and the surface of the object to be measured 2 and to increase the ultrasonic transmittance, and the transducer 1 is pressed against the object to be measured 2 with a constant force and is water-tight. Therefore, the following structure is adopted.
第３図、第４図は変位量測定厚み計７と超音波厚み計５
を組合せた超音波による金属鑑定装置の説明図である
が、水槽８の底部には超音波厚み計５の、超音波発信素
子と受信素子を兼ねたトランスデューサー１が水槽の底
部を貫通し、水密の状態で上下動するように取付けら
れ、該トランスデューサー１の上方にはその軸線上に、
変位量測定厚み計７のスピンドル１１の軸を一致させて
ゲージヘッド部１０が、第７図に示す如くアーム１３に
より支持されている。上記トランスデューサー１とゲー
ジヘッド部１０とは、出力されたアナログ信号をＡ／Ｄ
変換器を備えたデジタルカウンター６ａ，６ｂを経て、
デジタル信号として図示しないコンピュータと結合され
ている。第５図、第６図に示す如くトランスデューサー
１は略円筒状のホルダー１ａ内に納められて、水槽８の
底部にねぢ止め等にて水密に取付けられて、前述の如く
デジタルカウンター６ｂ（図示せず）を経てコンピュー
ターと結合されている。トランスデューサー１は被測定
物と接触する如く上限で頭部が所定の高さ、水槽８内の
底面８ａから突出するように、面１ｅで規正されると共
に、付勢手段としてのスプリング１ｄにより上方向に押
し付けられ、前記トランスデューサー１の下降限界はス
トッパー１ｂにて調節され、該ストッパーの調節によ
り、トランスデューサー１頭部上面が、水槽８内の底面
８ａから下がらないで、前記上面と底面とが同一平面上
にあるようにセットし、変位量測定厚み計７の零リセッ
トをスピンドルの回転リング１２をトランスデューサー
１に押しつけることによって可能とする。又トランスデ
ューサー１を上下に可動させかつ水密構造とするため、
Ｏリング１ｄが設けてある。実際の装置は、第７図に示
す如くであり、機台１５には、超音波厚み計５を取付け
た水槽８と、変位量測定厚み計７のゲージヘッド部１０
を上下動自在に取付ける、支柱１４が固着され、ゲージ
ヘッド部１０を先端に固定したアーム１３が、上下リン
グ１７を回転することにより上下動する構造になってい
る。１６ａ，１６ｂはゲージヘッド部１０及びアーム１
３を固定する締付つまみである。3 and 4 show displacement amount measuring thickness gauge 7 and ultrasonic thickness gauge 5.
It is an explanatory view of a metal applicator using ultrasonic waves in which the transducer 1 that serves as both an ultrasonic wave transmitting element and a receiving element of the ultrasonic thickness gauge 5 penetrates the bottom of the water tank at the bottom of the water tank 8. It is attached so as to move up and down in a watertight state, above the transducer 1, on its axis,
The gauge head portion 10 is supported by an arm 13 as shown in FIG. 7 with the axes of the spindle 11 of the displacement measuring thickness gauge 7 aligned. The transducer 1 and the gauge head unit 10 A / D the output analog signal.
After going through the digital counters 6a and 6b equipped with a converter,
The digital signal is coupled to a computer (not shown). As shown in FIGS. 5 and 6, the transducer 1 is housed in a substantially cylindrical holder 1a, and is watertightly attached to the bottom of the water tank 8 with a screw or the like, and the digital counter 6b ( (Not shown) and is connected to a computer. The transducer 1 is regulated by the surface 1e so that the head protrudes from the bottom surface 8a in the water tank 8 at a predetermined height at the upper limit so as to come into contact with the object to be measured, and the transducer 1 is moved upward by a spring 1d as a biasing means. The lower limit of the transducer 1 is adjusted by the stopper 1b, and the upper surface of the head of the transducer 1 is not lowered from the bottom surface 8a in the water tank 8 by the stopper 1b. Are set so as to be on the same plane, and zero resetting of the displacement measuring thickness gauge 7 is possible by pressing the rotating ring 12 of the spindle against the transducer 1. In addition, since the transducer 1 is vertically movable and has a watertight structure,
An O-ring 1d is provided. The actual device is as shown in FIG. 7. The machine base 15 has a water tank 8 to which the ultrasonic thickness gauge 5 is attached, and the gauge head portion 10 of the displacement measuring thickness gauge 7.
The column 13 is attached so that it can be moved up and down, and the arm 13 having the gauge head portion 10 fixed to the tip is moved up and down by rotating the up and down ring 17. 16a and 16b are the gauge head 10 and the arm 1.
It is a tightening knob for fixing 3.
本発明の装置による金属の鑑定は次のようにして行な
う。The metal appraisal by the device of the present invention is performed as follows.
先づ超音波厚み計５の演算定数Ｖを鑑定すべき金属片
（被測定物２）と比較する所定の金属の音波伝播速度
（所定の音速値）に設定する。水槽８に被測定物２の下
面がつかる程度の水を入れ、変位量測定厚み計７のスピ
ンドル先端の回転リング１２を第３図に示す如くトラン
スデューサー１に押しつけ、変位量測定厚み計７の零調
整を行なう。この場合前述の如くトランスデューサー１
の上面は水槽８の底面８ａと同一平面上にあるようにな
る。次に第４図に示す如く、被測定物２を水槽のトラン
スデューサー１上に乗せ、変位量測定厚み計７の回転リ
ング１２を被測定物２の上面に接触させる。変位量測定
厚み計７による厚みDG超音波厚み計による厚みDSを、デ
ジタルカウンター６ａ，６ｂを経てデジタル値でコンピ
ューター（図示せず）に読み込み、両測定による厚み差
ｄ＝DG−DSを表示させ、ｄが規定の数値内にあるかどう
かを判断する。もしくはｄが前以てコンピューターに記
憶させていた厚みの差（規定の数値）内にあるか否かを
コンピューターに判断させる。被測定物２をトランスデ
ューサー１上ですべらせ、前記測定を繰り返す。判断を
コンピューターでする場合、測定サイクル時間は、超音
波厚み計の測定出力の測定サイクル時間に規定される。
実使用器において、超音波厚み計は５ｍｓごとに１０回
測定し、その平均値を５０ｍｓごとに出力させる。超音
波の測定出力が出た時点で、コンピューターは変位量測
定厚み計７の厚みを読みとり、両測定値の差を判断す
る。即ち測定は５０ｍｓごとに行なわれ、トランスデュ
ーサー上を、被測定物をすべらせた場合、ほぼ連続的に
厚み測定をすることとなる。以上の如く測定が終了する
とコンピューターは上記厚み差ｄが規定の数値内にある
場合は、被測定物が所定の金属である旨を表示する。First, the calculation constant V of the ultrasonic thickness meter 5 is set to the sound wave propagation velocity (predetermined sound velocity value) of a predetermined metal to be compared with the metal piece (measurement object 2) to be evaluated. Put the degree of water lower surface of the measured object 2 is immersed in a water tank 8, pressing the shift measuring thickness meter 7 spindle tip rotary ring 12 of the transducer 1 as shown in Figure 3, the displacement amount measured thickness meter 7 Perform zero adjustment. In this case, as described above, the transducer 1
The upper surface of the is flush with the bottom surface 8a of the water tank 8. Next, as shown in FIG. 4, the object to be measured 2 is placed on the transducer 1 in the water tank, and the rotating ring 12 of the displacement measuring thickness gauge 7 is brought into contact with the upper surface of the object to be measured 2. Displacement measurement Thickness D G measured by the thickness meter 7 The thickness D S measured by the ultrasonic thickness meter is read into a computer (not shown) as a digital value via the digital counters 6a and 6b, and the thickness difference d = D G −D between the two measurements. Display S and judge whether d is within the specified numerical value. Alternatively, the computer determines whether or not d is within the thickness difference (prescribed numerical value) previously stored in the computer. The DUT 2 is slid on the transducer 1 and the above measurement is repeated. When the judgment is made by a computer, the measurement cycle time is defined by the measurement cycle time of the measurement output of the ultrasonic thickness gauge.
In the actual device, the ultrasonic thickness gauge measures 10 times every 5 ms, and outputs the average value every 50 ms. When the ultrasonic measurement output is output, the computer reads the thickness of the displacement measurement thickness gauge 7 and determines the difference between the two measurement values. That is, the measurement is performed every 50 ms, and when the object to be measured is slid on the transducer, the thickness is measured almost continuously. When the measurement is completed as described above, the computer displays that the object to be measured is a predetermined metal when the thickness difference d is within the specified numerical value.
以上詳細に説明した如く本発明の装置によれば、超音
波厚み計の測定位置と変位量測定厚み計の測定位置が同
一であるため、測定が容易で、かつ測定精度が高い、
超音波厚み計と変位量測定厚み計の測定が同時にでき、
高速で測定比較ができる、水槽の水をカップリング剤
とし、付勢手段により、トランスデューサーを一定力で
被測定物に押しつけているので、被測定物表面とトラン
スデューサーの密着がよく、超音波の透過率を高めるこ
とができる、変位量測定厚み計の零設定が容易であ
る、等の顕著な効果を奏する。According to the apparatus of the present invention as described in detail above, since the measurement position of the ultrasonic thickness gauge and the measurement position of the displacement amount measurement thickness gauge are the same, the measurement is easy, and the measurement accuracy is high.
The ultrasonic thickness gauge and displacement measurement thickness gauge can be measured at the same time.
The water in the water tank is used as a coupling agent for high-speed measurement comparison, and the transducer is pressed against the object to be measured with a constant force by the biasing means, so the surface of the object to be measured and the transducer are in close contact with each other, and the ultrasonic wave is used. It is possible to increase the transmittance of the above, and it is easy to set the displacement amount measuring thickness gauge to zero.
第１図、第２図は被測定物内の超音波伝播と反射の説明
図、第３図、第４図は本発明の一実施例の説明図、第５
図は本発明の一実施例の超音波厚み計の縦断面図、第６
図は同超音波厚計の取付け状態を示す、一部断面した正
面図、第７図(a)は本発明の一実施例の側面図、(b)は同
正面図である。 １…トランスデューサー、１ａ…ホルダー、１ｂ…スト
ッパー、１ｃ…スプリング、１ｄ…Ｏリング、１ｅ…
面、２…被測定物、５…超音波厚み計、７…デジタル厚
み計、８…水槽、８ａ…底面、１１…スピンドル1 and 2 are explanatory views of ultrasonic wave propagation and reflection in an object to be measured, FIGS. 3 and 4 are explanatory views of an embodiment of the present invention, and FIG.
FIG. 6 is a vertical sectional view of an ultrasonic thickness gauge according to an embodiment of the present invention,
FIG. 7 is a partially sectional front view showing a mounting state of the ultrasonic thickness gauge, FIG. 7 (a) is a side view of an embodiment of the present invention, and FIG. 7 (b) is the same front view. 1 ... Transducer, 1a ... Holder, 1b ... Stopper, 1c ... Spring, 1d ... O-ring, 1e ...
Surface, 2 ... Object to be measured, 5 ... Ultrasonic thickness gauge, 7 ... Digital thickness gauge, 8 ... Water tank, 8a ... Bottom surface, 11 ... Spindle
Claims (2)
及び超音波受信素子から成るトランスデューサーを、そ
の上面が水槽底面と同一平面になるようにかつ水密構造
をもって取付け、 変位量測定厚み計に連結され、上下動自在にして先端が
被測定物上面に接触するように支持されたスピンドル軸
を、前記トランスデューサーの軸線上に配置したことを
特徴とする超音波による金属鑑定装置。1. A displacement measuring thickness, which is connected to an ultrasonic thickness gauge, and is provided with a transducer comprising an ultrasonic oscillating element and an ultrasonic receiving element such that its upper surface is flush with the bottom surface of the water tank and has a watertight structure. An ultrasonic metal identification device characterized in that a spindle shaft, which is connected to a measuring instrument and is vertically movable so that its tip comes into contact with the upper surface of the object to be measured, is arranged on the axis of the transducer.
槽底面から露出させる付勢手段を設けたことを特徴とす
る請求項１記載の超音波による金属鑑定装置。2. The ultrasonic wave metal identifying device according to claim 1, wherein the transducer is provided with a biasing means for pressing the transducer upward to expose it from the bottom of the water tank.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58126876A JPH0614025B2 (en) | 1983-07-14 | 1983-07-14 | Ultrasonic wave metal appraisal device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP58126876A JPH0614025B2 (en) | 1983-07-14 | 1983-07-14 | Ultrasonic wave metal appraisal device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6020147A JPS6020147A (en) | 1985-02-01 |
| JPH0614025B2 true JPH0614025B2 (en) | 1994-02-23 |
Family
ID=14946027
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP58126876A Expired - Lifetime JPH0614025B2 (en) | 1983-07-14 | 1983-07-14 | Ultrasonic wave metal appraisal device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0614025B2 (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2656425B1 (en) * | 1989-12-21 | 1992-04-30 | Cerib | NON - DESTRUCTIVE CONTROL METHOD AND DEVICE FOR CONCRETE ELEMENTS. |
| CN107688084B (en) * | 2017-05-26 | 2020-11-24 | 山东瑞谱检测技术有限公司 | Metal detector |
| CN106990218B (en) * | 2017-05-26 | 2018-02-16 | 广东安盾安检排爆装备集团有限公司 | A kind of metal detecting apparatus |
| CN107643340A (en) * | 2017-09-21 | 2018-01-30 | 镇江龙逸电子科技有限公司 | A kind of device of auxiliary ultrasonic defectoscope flaw detection |
| CN111174739A (en) * | 2019-12-25 | 2020-05-19 | 南京理工大学 | A device for measuring the thickness of any point of a free-form surface and its measuring method |
| CN111397553B (en) * | 2020-04-08 | 2022-01-14 | 肖月 | Ultrasonic thickness gauge capable of avoiding influence of dirt and impurities on measurement accuracy |
| CN111398430B (en) * | 2020-04-09 | 2023-08-04 | 山西诚尔信工程检测有限公司 | Device for assisting probe thickness measurement of ultrasonic thickness gauge |
-
1983
- 1983-07-14 JP JP58126876A patent/JPH0614025B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6020147A (en) | 1985-02-01 |
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