Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPH0615436B2 - Liquid phase epitaxial growth system - Google Patents
[go: Go Back, main page]

JPH0615436B2 - Liquid phase epitaxial growth system - Google Patents

Liquid phase epitaxial growth system

Info

Publication number
JPH0615436B2
JPH0615436B2 JP17554386A JP17554386A JPH0615436B2 JP H0615436 B2 JPH0615436 B2 JP H0615436B2 JP 17554386 A JP17554386 A JP 17554386A JP 17554386 A JP17554386 A JP 17554386A JP H0615436 B2 JPH0615436 B2 JP H0615436B2
Authority
JP
Japan
Prior art keywords
temperature
growth chamber
growth
liquid phase
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP17554386A
Other languages
Japanese (ja)
Other versions
JPS6335491A (en
Inventor
悟 轟
功 大部
康利 柏田
昭彦 佐藤
精一 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP17554386A priority Critical patent/JPH0615436B2/en
Publication of JPS6335491A publication Critical patent/JPS6335491A/en
Publication of JPH0615436B2 publication Critical patent/JPH0615436B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は液相エピタキシャル成長装置に係り、とくに良
質の結晶を再現性良く実現するのに好適な液相エピタキ
シャル成長装置に関する。
TECHNICAL FIELD The present invention relates to a liquid phase epitaxial growth apparatus, and more particularly to a liquid phase epitaxial growth apparatus suitable for realizing good quality crystals with good reproducibility.

〔従来の技術〕[Conventional technology]

従来、コンパクトディスク,ビデオディスクなどの光源
として使用される発行ダイオードおよび半導体レーザの
結晶成長には一般に良く知られた液相エピチキシャル成
長装置が使用されている。
Conventionally, a well-known liquid phase epitaxial growth apparatus has been used for crystal growth of an emitting diode and a semiconductor laser used as a light source of a compact disk, a video disk, or the like.

上記従来の液相エピタキシャル成長装置は、たとえば昭
和57年サンエンスフォーラム(株)発行:化合物半導体
ハンドブック、第96頁乃至101頁の「第2節エピタキシ
ャル成長法、2−1液相エピタキシャル成長法」および
特公昭60−19137号に記載されている如く、石英管にて
形成され、所定のガス雰囲気を有する成長室と、この成
長室内の温度をモニターする第2の温度検出器と、前記
成長室の周囲を囲む如くカンタル線などにて形成された
ヒータからなる温度制御部と、この温度制御部を作動さ
せるために前記成長室と前記ヒータとの間に設置された
第1の温度検出器と、前記成長室内に結晶成長用原材料
をチャージする結晶成長用ボートを摺動させる摺動部と
を設け、前記成長室内の温度があらかじめ設定された設
定温度に達するまで前記第2の温度検出器からの出力信
号に基いて温度制御部によりヒータを作動させ、前記成
長室内の温度が前記設定温度に達したのち、前記成長室
内の温度を降下させて温度降下開始時より所定時間経過
したとき、前記成長用ボートを前記摺動部の駆動により
摺動させて前記結晶成長用原材料を結晶成長させるもの
である。
The conventional liquid phase epitaxial growth apparatus described above is disclosed, for example, in "Compound Semiconductor Handbook," published by Sanence Forum Co., Ltd., 1982, "Section 2, Epitaxial Growth Method, 2-1 Liquid Phase Epitaxial Growth Method," on pages 96 to 101, and Japanese Patent Publication. As described in No. 60-19137, a growth chamber formed of a quartz tube and having a predetermined gas atmosphere, a second temperature detector for monitoring the temperature inside the growth chamber, and a surrounding of the growth chamber A temperature control unit formed of a heater formed by a kathal wire so as to surround it, a first temperature detector installed between the growth chamber and the heater for operating the temperature control unit, and the growth unit. A sliding part for sliding a crystal growth boat for charging a raw material for crystal growth is provided in the chamber, and the sliding chamber is provided until the temperature in the growth chamber reaches a preset temperature. The temperature control unit operates the heater based on the output signal from the temperature detector 2 and after the temperature inside the growth chamber reaches the set temperature, the temperature inside the growth chamber is decreased to a predetermined value from the start of the temperature decrease. When the time has elapsed, the growth boat is slid by the drive of the sliding portion to grow the raw material for crystal growth.

なお、前記結晶成長において、制御すべき重要な温度は
前記第2の温度検出器でモニタされる前記成長室内の温
度であるが、これはあらかじめ成長室内の温度(第2の
温度検出器の検出温度)と制御用の前記第1の温度検出
器の検出温度との比較表を作成してこれによって前記成
長室内の温度を検出している。
In the crystal growth, the important temperature to be controlled is the temperature in the growth chamber monitored by the second temperature detector. This is the temperature in the growth chamber (detected by the second temperature detector in advance). Temperature) and the temperature detected by the first temperature detector for control are prepared to detect the temperature in the growth chamber.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

前記従来技術においては、成長室内の温度を所定の温度
に設定するために、前記成長室内に設けられた第2の温
度検出器の検出温度に対してあらかじめ対応づけられた
前記成長室外に設けられた第1の温度検出器を用いて温
度制御部を制御するものであるから、比較的短時間に前
記成長室内を所定の温度にすることが可能である。
In the above-mentioned conventional technique, in order to set the temperature inside the growth chamber to a predetermined temperature, the temperature is set outside the growth chamber that is associated in advance with the temperature detected by the second temperature detector provided inside the growth chamber. Since the temperature controller is controlled by using the first temperature detector, it is possible to bring the growth chamber to a predetermined temperature in a relatively short time.

しかるに、その反面、前記成長室内を流れるガス(通常
)の流量の変動、ヒータの劣化などにより前記成長
室内の温度が成長毎に変化しても、その温度を補正する
こきができないため、最大3〜4℃の変動が発生する場
外があった。
However, on the other hand, even if the temperature in the growth chamber changes for each growth due to fluctuations in the flow rate of gas (usually H 2 ) flowing in the growth chamber, deterioration of the heater, etc., the temperature cannot be corrected. There was a field where fluctuations of up to 3-4 ° C occurred.

また、前記成長室内の温度を常に同一温度に維持するた
めには、前記成長室内に設けられた第2の温度検出器の
出力信号を用いて前記温度制御部を作動させることが必
要である。
Further, in order to always maintain the temperature inside the growth chamber at the same temperature, it is necessary to operate the temperature control unit using the output signal of the second temperature detector provided inside the growth chamber.

しかるに前記第2の温度検出器を用いて前記成長室内を
設定温度まで上昇させた場合、該第2の温度検出器と、
前記温度制御部に付属したヒータ(発熱体)との間に
は、前記成長室と、石英もしくはS:Cなどからなる均
熱管と、石綿あるいは間隙とが存在し、これによって形
成される大きな熱時定数を介して前記ヒータの熱が輻
射,伝播されて前記成長室内の温度が上昇するため、前
記成長室内の温度が実際の温度から設定温度に達するま
での昇温過程において、温度制御部の作動開始から前記
成長室内の温度が設定温度に達するまでの大きな時間差
が発生し、安定した同一温度を実現することが不可能で
ないにしろ長時間(5〜6時間)を要する。
However, when the temperature inside the growth chamber is raised to a set temperature by using the second temperature detector, the second temperature detector,
The growth chamber, a soaking tube made of quartz or S: C, and asbestos or a gap exist between the heater (heating element) attached to the temperature control unit, and a large amount of heat generated by the growth chamber. Since the heat of the heater is radiated and propagated through the time constant to raise the temperature in the growth chamber, the temperature control unit controls the temperature in the temperature rising process until the temperature in the growth chamber reaches the set temperature from the actual temperature. There is a large time difference from the start of operation until the temperature in the growth chamber reaches the set temperature, and it takes a long time (5 to 6 hours) if it is impossible to achieve the same stable temperature.

本発明の目的は、前記従来技術の問題点を解決し、成長
相膜厚の変動の少ない良質の結晶を再現性良く成長可能
とする液相エピタキシャル成長装置を提供することにあ
る。
An object of the present invention is to provide a liquid phase epitaxial growth apparatus which solves the above-mentioned problems of the prior art and enables high quality crystals with small fluctuations in the thickness of the growth phase to be grown with good reproducibility.

〔問題点を解決するための手段〕[Means for solving problems]

前記の目的は、所定の雰囲気に調整し得る成長室と、こ
の成長室外に設けられた加熱手段と前記成長室の外壁と
前記加熱手段間に設けられた前記成長室内の第1温度検
出手段と、前記成長室内に設けられた前記成長室内の第
2温定検出手段と、前記成長室内外間を搬入、搬出し得
る結晶成長用ボートと、前記第1温度検出手段からの信
号により所定の設定温度に制御する温度制御手段と、前
記成長室内温度が所望の設定温度付近に達したら、検出
手段を前記第1温度検出手段から前記第2検出手段に切
り換える温度切換手段とからなる液相エピタキシャル成
長装置。
The above-mentioned purpose is a growth chamber capable of adjusting to a predetermined atmosphere, a heating means provided outside the growth chamber, and a first temperature detecting means in the growth chamber provided between the outer wall of the growth chamber and the heating means. A second temperature detecting means inside the growth chamber provided in the growth chamber, a crystal growth boat capable of carrying in and out between the inside and outside of the growth chamber, and a predetermined set temperature according to a signal from the first temperature detecting means. And a temperature switching means for switching the detection means from the first temperature detection means to the second detection means when the temperature in the growth chamber reaches a desired set temperature.

〔作用〕[Action]

本発明は、成長室内の温度が設定温度に達するまでの比
較的広い温度範囲の温度制御を、あらかじめ前記成長室
内に設置された第2温度検出器による検出温度と関連付
けた第1温度検出器からの出力信号に基いて温度制御器
が発熱体を制御させるので、短時間で前記成長室内の温
度を設定温度まで到達させることができる。
The present invention relates to a first temperature detector that correlates temperature control in a relatively wide temperature range until the temperature in the growth chamber reaches a set temperature with a temperature detected by a second temperature detector installed in the growth chamber in advance. Since the temperature controller controls the heating element based on the output signal of, the temperature inside the growth chamber can reach the set temperature in a short time.

ついで、設定温度に達した前記成長室内の温度を所定時
間保持させたのち、結晶成長に必要な温度に降下させる
比較的狭い温度範囲の検出を前記成長室内の第2温度検
出器にて検出するとともにこの第2温度検出器からの出
力信号に基いて温度制御器が発熱体を制御させ、かつ摺
動部が結晶成長用ボートを駆動させるので常に同一温度
条件で結晶成長させることができる。
Then, after the temperature inside the growth chamber that has reached the set temperature is maintained for a predetermined time, detection of a relatively narrow temperature range in which the temperature falls to the temperature required for crystal growth is detected by the second temperature detector inside the growth chamber. At the same time, the temperature controller controls the heating element based on the output signal from the second temperature detector, and the sliding portion drives the crystal growth boat, so that the crystal can be always grown under the same temperature condition.

〔実施例〕〔Example〕

以下、本発明の一実施例である液相エピタキシャル成長
装置を示す図面により説明する。
Hereinafter, a liquid phase epitaxial growth apparatus which is an embodiment of the present invention will be described with reference to the drawings.

第1図において、1は成長室にして、石英にて形成さ
れ、内部を水等もしくは不活性雰囲気をなしている。2
は温度制御部にして、前記成長室1の周囲を囲んでその
内部を加熱制御するカンタル線などの発熱抵抗体を後述
の第1温度検出器3および第2温度検出器4の出力信号
によって作動させる如くしている。なお、前記温度制御
部2と前記第1温度検出器3および前記第2温度検出器
4との間には第2図の温度切換部7を設けている。前記
第1温度検出器3は、前記成長室1の外部に設置され前
記成長室1内が設定温度に達するまでの温度を検出し、
この検出温度をあらかじめ作成した前記第2温度検出器
4による検出温度との換算表により換算する如くしてい
る。前記第2温度検出器4は、前記成長室1内に設置さ
れた前記成長室1内の温度を直接検出する如くしてい
る。5は摺動部にして前記第2温度検出器4からの出力
信号により結晶成長用ポート6を前記成長室1内外に搬
出入させる如くしている。前記結晶成長用ボート6はた
とえばアルミニウム,ガリウム,およびヒ素などの化合
物半導体などからなる成長用原材料(図示せず)を載置
している。
In FIG. 1, reference numeral 1 designates a growth chamber, which is made of quartz and has an inside filled with water or an inert atmosphere. Two
Is a temperature control unit, and a heating resistor such as a Kanthal wire that surrounds the periphery of the growth chamber 1 and controls heating of the growth chamber 1 is operated by output signals of a first temperature detector 3 and a second temperature detector 4 described later. I'm trying to do it. A temperature switching unit 7 of FIG. 2 is provided between the temperature control unit 2 and the first temperature detector 3 and the second temperature detector 4. The first temperature detector 3 is installed outside the growth chamber 1 and detects a temperature until the inside of the growth chamber 1 reaches a set temperature,
The detected temperature is converted in accordance with a conversion table of the temperature detected by the second temperature detector 4 created in advance. The second temperature detector 4 is adapted to directly detect the temperature in the growth chamber 1 installed in the growth chamber 1. Reference numeral 5 is a sliding portion so that the crystal growth port 6 can be carried in and out of the growth chamber 1 in response to an output signal from the second temperature detector 4. The crystal growth boat 6 carries a growth raw material (not shown) made of a compound semiconductor such as aluminum, gallium, and arsenic.

本発明による液相エピタキシャル成長装置は前記の如く
構成されているから、つぎにその作動について説明す
る。
Since the liquid phase epitaxial growth apparatus according to the present invention is configured as described above, its operation will be described below.

成長室1内が成長用原材料を均一に溶融させるのに十分
な設定温度に達するまでは第1温度検出器3にて前記成
長室1内の温度を検出するとともにこの第1温度検出器
3からの出力信号に基いて温度制御部2が温度制御して
前記成長室1内の温度を上昇させる。
The temperature inside the growth chamber 1 is detected by the first temperature detector 3 and the temperature inside the growth chamber 1 is detected by the first temperature detector 3 until the temperature inside the growth chamber 1 reaches a set temperature sufficient to uniformly melt the raw material for growth. The temperature control unit 2 controls the temperature based on the output signal of 1 to raise the temperature in the growth chamber 1.

この場合、前記第1温度検出器3からの出力信号による
昇温特性よりも前記成長室1内の温度の昇温特性は、前
記成長室1と温度制御2との間に介在する熱時定数分だ
け遅れて発生するが、前記成長室1内の温度と第1温度
検出器3との関係をあらかじめ比較表などで設定してお
くことにより短時間(約30分)に所定の温度に到達させ
ることができる。
In this case, the temperature rising characteristic of the temperature in the growth chamber 1 is more than the temperature rising characteristic of the output signal from the first temperature detector 3, and the thermal time constant interposed between the growth chamber 1 and the temperature control 2 is higher. It occurs after a minute, but it reaches the specified temperature in a short time (about 30 minutes) by setting the relationship between the temperature in the growth chamber 1 and the first temperature detector 3 in advance in a comparison table. Can be made.

しかるのち、前記成長室1内の温度が設定温度まで上昇
すると、前記第1温度検出器3から第2温度検出器4に
切換えて該第2温度検出器4からの出力信号に基いて温
度制御部2が温度制御して、前記成長室1内を設定温度
に所定時間だけ保持させる。
Then, when the temperature in the growth chamber 1 rises to a set temperature, the first temperature detector 3 is switched to the second temperature detector 4 to control the temperature based on the output signal from the second temperature detector 4. The section 2 controls the temperature to keep the inside of the growth chamber 1 at the set temperature for a predetermined time.

ついで、前記成長室1内の温度が成長用原材料を結晶成
長させるのに必要な温度に達すると、第2温度検出器4
がこれを検出するとともに摺動部5に信号を出力するの
で、摺動部5が結晶成長用ボート6を駆動して前記成長
用原材料1を結晶成長させる。
Then, when the temperature in the growth chamber 1 reaches the temperature required for crystal growth of the raw material for growth, the second temperature detector 4
Detects this and outputs a signal to the sliding portion 5, so that the sliding portion 5 drives the crystal growth boat 6 to grow the raw material 1 for growth of crystals.

したがって、前記成長室1内の温度制御性を損なうこと
なく、高精度で安定した温度に保持させることができ、
かつ前記成長用原材料を結晶成長させるための前記摺動
部5の駆動制御を前記温度制御部2を介して前記成長室
1内に設けた前記第2温度検出器4により行なうので、
常に同一温度条件で前記成長用原材料を結晶成長させる
ことができ、これによってたとえば、半導体レーザの結
晶成長に適用した場合、成長層膜厚の変動の少ない良質
の結晶を再現性良く成長させることができ半導体レーザ
の生産性および歩留りを大幅に向上させることができ
る。
Therefore, it is possible to maintain a stable temperature with high accuracy without impairing the temperature controllability in the growth chamber 1.
Moreover, since the drive control of the sliding portion 5 for crystal growth of the raw material for growth is performed by the second temperature detector 4 provided in the growth chamber 1 via the temperature control portion 2,
The growth raw material can always be crystal-grown under the same temperature condition, and when applied to the crystal growth of a semiconductor laser, for example, it is possible to grow a good-quality crystal with little fluctuation in the growth layer thickness with good reproducibility. Therefore, the productivity and yield of the semiconductor laser can be significantly improved.

〔発明の効果〕〔The invention's effect〕

本発明によれば、成長室内の温度制御性を損なうことな
く、高精度で安定した温度に保持させることができ、か
つ常に同一温度条件で成長用原材料を結晶成長させるこ
とができるので、たとえば半導体レーザの結晶成長に適
用した場合、成長層膜厚の変動の少ない良質の結晶を再
現性良く成長させることができ、半導体レーザの生産性
および歩留りを大幅に向上させることができる。
According to the present invention, it is possible to maintain a highly accurate and stable temperature without impairing the temperature controllability in the growth chamber, and it is possible to always grow crystals of the raw material for growth under the same temperature condition. When applied to laser crystal growth, it is possible to grow a good quality crystal with little fluctuation in the growth layer film thickness with good reproducibility, and to greatly improve the productivity and yield of semiconductor lasers.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の実施例である液相エピタキシャル成長
装置の要部説明図、第2図は本発明の実施例である液相
エピタキシャル成長装置の各要部を示すブロック図であ
る。 1……成長室、2……温度制御部、3……第1温度検出
器、4……第2温度検出器、5……摺動部、6……結晶
成長用ボート、7……温度切換部。
FIG. 1 is an explanatory view of essential parts of a liquid phase epitaxial growth apparatus which is an embodiment of the present invention, and FIG. 2 is a block diagram showing respective essential parts of a liquid phase epitaxial growth apparatus which is an embodiment of the present invention. 1 ... Growth chamber, 2 ... Temperature control part, 3 ... First temperature detector, 4 ... Second temperature detector, 5 ... Sliding part, 6 ... Crystal growth boat, 7 ... Temperature Switching unit.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 佐藤 昭彦 群馬県高崎市西横手町111番地 株式会社 日立製作所高崎工場内 (72)発明者 山田 精一 群馬県高崎市西横手町111番地 株式会社 日立製作所高崎工場内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Akihiko Sato 111 No. Nishiyokote-cho, Takasaki-shi Gunma Hitachi Takasaki factory (72) Inventor Seiichi Yamada 111 No. Nishiyoko-te, Takasaki-shi Gunma Hitachi, Ltd. Factory Takasaki Factory

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】所定の雰囲気に調整し得る成長室と、この
成長室外に設けられた加熱手段と、前記成長室の外壁と
前記加熱手段間に設けられた前記成長室内の第1温度検
出手段と、前記成長室内に設けられた前記成長室内の第
2温定検出手段と、前記成長室内外間を搬入、搬出し得
る結晶成長用ボートと、前記第1温度検出手段からの信
号により所定の設定温度に制御する温度制御手段と、前
記成長室内温度が所望の設定温度付近に達したら、検出
手段を前記第1温度検出手段から前記第2検出手段に切
り換える温度切換手段とからなる液相エピタキシャル成
長装置。
1. A growth chamber capable of adjusting to a predetermined atmosphere, a heating means provided outside the growth chamber, and a first temperature detecting means in the growth chamber provided between the outer wall of the growth chamber and the heating means. A second temperature detecting means inside the growth chamber provided inside the growth chamber, a crystal growth boat that can carry in and out between the inside and outside of the growth chamber, and a predetermined setting based on a signal from the first temperature detecting means. Liquid phase epitaxial growth apparatus comprising temperature control means for controlling the temperature and temperature switching means for switching the detection means from the first temperature detection means to the second detection means when the temperature in the growth chamber reaches a desired set temperature. .
JP17554386A 1986-07-28 1986-07-28 Liquid phase epitaxial growth system Expired - Lifetime JPH0615436B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17554386A JPH0615436B2 (en) 1986-07-28 1986-07-28 Liquid phase epitaxial growth system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17554386A JPH0615436B2 (en) 1986-07-28 1986-07-28 Liquid phase epitaxial growth system

Publications (2)

Publication Number Publication Date
JPS6335491A JPS6335491A (en) 1988-02-16
JPH0615436B2 true JPH0615436B2 (en) 1994-03-02

Family

ID=15997914

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17554386A Expired - Lifetime JPH0615436B2 (en) 1986-07-28 1986-07-28 Liquid phase epitaxial growth system

Country Status (1)

Country Link
JP (1) JPH0615436B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2580480B2 (en) * 1994-01-17 1997-02-12 株式会社メイホウ U-shaped clip assembly
CN103849930B (en) * 2014-01-17 2016-12-07 中国科学院上海技术物理研究所 A kind of temperature control equipment for impregnated mercury cadmium telluride rheotaxial and method

Also Published As

Publication number Publication date
JPS6335491A (en) 1988-02-16

Similar Documents

Publication Publication Date Title
EP0911430B1 (en) Single crystal growth method
JPH04149092A (en) Method and device for controlling growth of cone part
KR950004788B1 (en) Control system of tubular crystal growth apparatus
JPH0615436B2 (en) Liquid phase epitaxial growth system
JP3085568B2 (en) Apparatus and method for producing silicon single crystal
KR20030020474A (en) A control system for Silicon Ingot Growing Apparatus
US3700412A (en) Crystal pulling apparatus having means for maintaining liquid solid crystal interface at a constant temperature
US4866230A (en) Method of and apparatus for controlling floating zone of semiconductor rod
JP2732723B2 (en) Liquid surface temperature control method
JPS6054994A (en) Method for manufacturing compound semiconductor crystal
KR20160143631A (en) Film forming apparatus
JPS59223293A (en) Molecular beam epitaxial growth device
JPS6243959B2 (en)
JP4306009B2 (en) Single crystal ingot manufacturing apparatus and method
JP2936694B2 (en) Single crystal growing method and high frequency work coil
JPH078754B2 (en) Single crystal manufacturing method
JPH07109031B2 (en) Substrate heating device
JPS60132321A (en) Manufacture of semiconductor device
JPS6229394B2 (en)
JP2985360B2 (en) Single crystal manufacturing equipment
JPS602667A (en) Solid raw material sublimation supply equipment
JPS59184796A (en) Preparation of group iii-v compound semiconductor single crystal
JPS6321281A (en) Method for precisely controlling diameter of single crystal
JP2005104767A (en) Semiconductor single crystal manufacturing method and semiconductor single crystal manufacturing apparatus
JPH07201744A (en) Semiconductor thin film vapor phase growth equipment