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JPH0625659B2 - Attitude sensor - Google Patents
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JPH0625659B2 - Attitude sensor - Google Patents

Attitude sensor

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Publication number
JPH0625659B2
JPH0625659B2 JP63116975A JP11697588A JPH0625659B2 JP H0625659 B2 JPH0625659 B2 JP H0625659B2 JP 63116975 A JP63116975 A JP 63116975A JP 11697588 A JP11697588 A JP 11697588A JP H0625659 B2 JPH0625659 B2 JP H0625659B2
Authority
JP
Japan
Prior art keywords
light receiving
light
attitude
receiving element
lens
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63116975A
Other languages
Japanese (ja)
Other versions
JPH01287408A (en
Inventor
一造 中野
義一 伊藤
湧一 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ENU TEI TEI ADOBANSU TEKUNOROJI KK
Original Assignee
ENU TEI TEI ADOBANSU TEKUNOROJI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ENU TEI TEI ADOBANSU TEKUNOROJI KK filed Critical ENU TEI TEI ADOBANSU TEKUNOROJI KK
Priority to JP63116975A priority Critical patent/JPH0625659B2/en
Publication of JPH01287408A publication Critical patent/JPH01287408A/en
Publication of JPH0625659B2 publication Critical patent/JPH0625659B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Welding Or Cutting Using Electron Beams (AREA)
  • Laser Beam Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) レーザビーム、イオンビーム等の高エネルギビームを用
い、材料の切断、溶接等の加工作業を行うには、第8図
に示すように、例えばレーザビームガン等の加工機ヘッ
ドの軸Zを被加工物表面Jに垂直に保つとともに、該加
工機ヘッドの先端と被加工物表面Jとの間隙dを一定に
保つことが必要である。本発明の姿勢センサは、該加工
機ヘッドに装備して加工機ヘッドの被加工物表面Jに対
する姿勢(傾斜および間隙)を自動検出し、正規の姿勢
に自動制御させるための制御情報を発生するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) To perform processing operations such as cutting and welding of materials using a high energy beam such as a laser beam and an ion beam, as shown in FIG. It is necessary to keep the axis Z of the processing machine head such as a laser beam gun perpendicular to the workpiece surface J and to keep the gap d between the tip of the processing machine head and the workpiece surface J constant. The attitude sensor of the present invention is mounted on the processing machine head to automatically detect the attitude (inclination and gap) of the processing machine head with respect to the workpiece surface J, and generate control information for automatically controlling to a regular attitude. It is a thing.

(従来の技術) 代表的なレーザ加工機の加工機ヘッド(以下レーザガン
と呼ぶ)Gの姿勢検出に用いられている従来の技術を第
8図を用いて説明する。従来のレーザガンでは、レーザ
ガンGの先端部に板状電極Cを装着し、板状電極Cと被
加工物表面Jとの間に静電容量を形成させ、板状電極C
と被加工物表面Jとの間の間隙dの変化による静電容量
の変化を、電圧または発振周波数等の電気的変化量とし
て検出する。この方法では、間隙dの平均値は求められ
るが、レーザガンGの中心軸であるZ軸と被加工物表面
Jとの傾きは不明である。
(Prior Art) A conventional technology used for detecting the attitude of a processing machine head (hereinafter referred to as a laser gun) G of a typical laser processing machine will be described with reference to FIG. In the conventional laser gun, a plate-shaped electrode C is attached to the tip of the laser gun G to form an electrostatic capacitance between the plate-shaped electrode C and the surface J of the workpiece, and the plate-shaped electrode C is formed.
The change in the capacitance due to the change in the gap d between the workpiece and the surface J of the workpiece is detected as the amount of electrical change such as the voltage or the oscillation frequency. With this method, the average value of the gap d can be obtained, but the inclination between the Z axis, which is the central axis of the laser gun G, and the workpiece surface J is unknown.

(発明が解決しようとしている問題点) 本発明が解決しようとする問題点は (1) レーザガンGの姿勢を自動検出できる姿勢検出器を
実現すること。例えば、第8図において、レーザガンG
の中心軸Zを被加工物表面Jに対しどのような角度で取
付けるか(多くの場合垂直である)、ならびに間隙dが
加工上きわらてている規定値に適合しているかどうかを
検出することである。
(Problems to be Solved by the Invention) Problems to be solved by the present invention are (1) to realize an attitude detector capable of automatically detecting the attitude of the laser gun G. For example, in FIG. 8, laser gun G
At which angle the central axis Z of the object is attached to the surface J of the work piece (often perpendicular to the surface), and whether the gap d conforms to the specified value that is prevailing during processing. That is.

(2) 上記姿勢検出器はレーザガンGの総重量および外形
寸法をあまり増加することなく装備できること。
(2) The posture detector can be installed without increasing the total weight and external dimensions of the laser gun G.

(問題を解決するための手段および実施例) 本発明の姿勢センサを装備したレーザガンGの実施例を
第1図に示す。本姿勢センサはレーザガンGの中心Zの
まわりに複数個の測定ユニットM1,M2,‥‥,M
配置されている。nは通常3〜4で充分である。
(Means and Embodiments for Solving Problems) An embodiment of a laser gun G equipped with the attitude sensor of the present invention is shown in FIG. In this attitude sensor, a plurality of measuring units M 1 , M 2 , ..., M n are arranged around the center Z of the laser gun G. Usually, 3 to 4 is sufficient for n.

第1図に示すように、レーザガンGの筐体を上下に分割
してB1,B2とし、その間に環状の受光レンズLを設
ける。受光レンズLの光軸はZ軸と一致させてある。
光源は筐体B外周に母線に沿って設けられた光ファイ
バコードIにより導かれ、ファイバ端から出る光を微
小集光レンズLにより細い平行ビームに集光する。こ
のように集光された光ビームは、第2図に示すようにZ
軸に対し90゜−αの角度方向から被加工物表面J上に
入射し、輝点aを生ぜしめる。受光系はaからの乱
反射光をとらえる。受光レンズLで集光された光は筐
体B内に設けた受光素子S上に入射し、光信号から
電気信号に変換され、電気的出力を得る。受光素子S
は、レーザガンGと被加工物表面Jとの距離が規定値に
なっているときの輝度aioの像Bioを含む結像面Sまた
はS′上に配置される。像Bとレンズ中心面との距離
はレンズの結像式 で求められる。S′は第2図に示すように、laiに対
し、常に上記公式が満足される結像面である。受光レン
ズLと輝点aとの距離laiが規定値からずれると、
の位置が変わりaからの反射光が受光素子S
入射する位置が変化する。このa点の位置の変化は、
通常の加工機ヘッドでは入射角αが70゜〜85゜であ
り、laiの変化量もたかだか数mmであるので、1mm程度
に過ぎない。
As shown in FIG. 1, the casing of the laser gun G is vertically divided into B 1 and B 2, and an annular light receiving lens L R is provided between them. The optical axis of the light receiving lens L R coincides with the Z axis.
The light source is guided by an optical fiber code I j provided along the generatrix on the outer periphery of the housing B 1 , and the light emitted from the fiber end is condensed into a thin parallel beam by the minute condenser lens L f . The light beam condensed in this way is Z-shaped as shown in FIG.
It is incident on the surface J of the work piece from an angle direction of 90 ° -α with respect to the axis, and produces bright points a i . The light receiving system captures the diffusely reflected light from a i . The light condensed by the light receiving lens L R is incident on the light receiving element S i provided in the housing B 1 and is converted from an optical signal to an electric signal to obtain an electric output. Light receiving element S i
Are arranged on the image forming surface S or S ′ including the image B io of the brightness a io when the distance between the laser gun G and the surface J of the workpiece is a specified value. The distance b i between the image B i and the center plane of the lens is the imaging formula of the lens. Required by. As shown in FIG. 2, S'is an image forming plane which always satisfies the above formula for l ai . When the distance l ai between the light receiving lens L R and the bright point a i deviates from the specified value,
position which the reflected light is incident to the light receiving element S i from changes a i position of a i is changed. The change in the position of point a i is
In a general processing machine head, the incident angle α is 70 ° to 85 °, and the change amount of l ai is at most several mm, so it is only about 1 mm.

受光レンズLRは測定ユニットM(i=1,2,・・)に共用さ
れており、構造の単純化、価格の低下に役立っている。
The light-receiving lens L R is shared by the measurement units M i (i = 1,2, ...), which is useful for simplifying the structure and reducing the price.

受光素子Sは直線状の細長い形をなし、光が入射する
と電気出力を生じ、その出力から光の入射位置を知るこ
とができるような素子である。例えば、市販されている
PSD(ホトセンシングデバイス)、シリコンホトダイ
オードアレー等あるいは複数条の光ファイバーの一端を
直線上に密に並べて配置して受光部とし、受光した信号
光を光ファイバで中継してレーザガンの外部へ導入し、
他端に受光用ホトダイオード列を設けたものを用いても
よい。
The light receiving element S i is an element that has a linear elongated shape, generates an electrical output when light is incident, and can know the incident position of the light from the output. For example, a commercially available PSD (photosensing device), a silicon photodiode array, or the like, or one end of a plurality of optical fibers is closely arranged on a straight line to form a light receiving portion, and the received signal light is relayed by an optical fiber to a laser gun. Outside the
You may use what provided the photodiode array for light reception in the other end.

次に1つの測定ユニットMにつき光学的測定原理を第
2図〜第4図を用いて説明する。
Next, the optical measurement principle of one measurement unit M i will be described with reference to FIGS. 2 to 4.

第1図の構造では、下の筐体Bは輝点aの乱反射光
が受光レンズLの反対側の部分に入射するのを遮り、
また、受光素子Sとして一次元PSDのような細い線
状のものを用いるので、測定ユニットMにおける輝点
からの乱反射光が受光素子Sに入射する様子は、
近似的には、受光素子Sと受光レンズLの光軸Zを
含む面内の現象として取扱ってもよい。さらに、受光素
子Sの取付け方向は、測定すべき物体に面して取付け
られればよいが、精度を上げるには、第2図に示したよ
うに、Z軸に対する入射角が 90゜−α度のとき、 tanβ=M・tanα ただし、Mはレンズの倍率(M=f/(lao-f))を満
足するよう受光素子SをZ軸に対し 90゜−βを傾けて組み込む。
In the structure of FIG. 1, the lower housing B 2 blocks the diffused reflection light of the bright point a i from entering the portion on the opposite side of the light receiving lens L R ,
Furthermore, since used as a thin linear such as one-dimensional PSD as the light receiving element S i, how the irregular reflection light from bright points a i in the measurement unit M i is incident on the light receiving element S i is
Approximately, it may be treated as a phenomenon in a plane including the optical axis Z of the light receiving element S i and the light receiving lens L R. Further, the light receiving element S i may be mounted so as to face the object to be measured, but in order to improve the accuracy, as shown in FIG. 2, the incident angle with respect to the Z axis is 90 ° −α. Tanβ = M · tanα where M is a light receiving element S i which is inclined by 90 ° -β with respect to the Z axis so that M satisfies the magnification of the lens (M = f / ( lao- f)).

環状受光レンズLの内縁の半径をr,外縁の半径を
,Z軸と輝点aとの距離をr,受光レンズL
の中心面と輝点aとの距離をlaiとすると、r,l
aiの変化にともなう受光素子S上の輝点反射光の変化
の様子は次のようである。
The radius of the inner edge of the annular light receiving lens L R is r i , the radius of the outer edge thereof is r 2 , the distance between the Z axis and the bright point a i is r L , and the light receiving lens L R
Let l ai be the distance between the center plane of the and the bright point a i , then r L , l
The manner in which the bright spot reflected light on the light receiving element S i changes with the change in ai is as follows.

第3図および第4図において、aioは受光レンズL
らの規定位置にある輝点、ai1は規定位置より遠方にあ
る輝点、ai2は規定位置よりも近くにある輝点を示し、
それらの像をBi0,Bi1,Bi2 で示す。laij (j=
0,1,2)はそれぞれ受光レンズLの中心面と輝点aij
(j=0,1,2)との距離である。
In FIGS. 3 and 4, a io is a bright spot at a specified position from the light receiving lens L R , a i1 is a bright spot far from the specified position, and a i2 is a bright spot near the specified position. Shows,
These images are shown by B i0 , B i1 , and B i2 . l aij (j =
0, 1, 2) are the center plane of the light receiving lens L R and the bright point a ij, respectively.
(J = 0,1,2).

は加工点近傍にあることが望ましいが、ここでは実
用範囲と考えられるr<r<rにおいて、センサ
から物体までの距離が変化したときの結像点の動きを説
明する。
It is desirable that r L be near the processing point, but here, the movement of the image forming point when the distance from the sensor to the object changes in r 1 <r L <r 2 which is considered to be a practical range will be described.

第3図はr<r<rの場合である。基準のワーク
面A上の輝点aioは像面S上のBioに結像している。ワ
ーク面がAからA′の位置に遠のくと、第3図(a)に示
すように輝点はai1に移り、受光した像はBi1に結像す
るから、S上では多少ボケて広がりをもつ像B′i1が形
成される。この場合、像位置はBi0からB′i1にS面上
で右へ移動する。S面は受光素子列が並んだものと考え
てよいから受光した素子位置を、その出力信号(B′i1
の平均値)から知れば、ワーク面までの距離の変化量が
求まる。次に、ワーク面がAからA″の位置へ近づいた
場合、第3図(b)に示すように、結像位置はS面上を左
へ動き、その移動量が距離変化量と対応する。
FIG. 3 shows the case where r 1 <r L <r 2 . The bright point a io on the reference work surface A is imaged on B io on the image surface S. When the work surface moves away from A to A ', the bright spot moves to a i1 and the received image is formed on B i1 as shown in FIG. An image B'i1 with is formed. In this case, the image position moves from B i0 to B ′ i1 to the right on the S surface. Since it can be considered that the light receiving element rows are arranged on the S surface, the position of the light receiving element is determined by the output signal (B ′ i1
If it is known from the average value of, the change amount of the distance to the work surface can be obtained. Next, when the work surface approaches the position from A to A ″, the imaging position moves left on the S surface as shown in FIG. 3 (b), and the movement amount corresponds to the distance change amount. .

第4図はai0がr=rに生ずる場合の例である。ワ
ーク面が基準面AからA′へ遠のいたとき(第4図
(a))、像Bi0はS面上を右へ動いてB′i1へ移り、反
対にAからA″へ近づいたとき(第4図(b))、像Bi0
はS面上を左へ動いてB′i2となり、それぞれがワーク
面との距離の変化を表すことは第3図と同じである。
FIG. 4 shows an example in which a i0 occurs at r L = r 1 . When the work surface is far from the reference surface A to A '(Fig. 4
(a)), the image B i0 moves to the right on the S surface and moves to B ′ i1 . Conversely, when the image approaches from A to A ″ (FIG. 4 (b)), the image B i0
Moves to the left on the S surface to become B'i2 , and each represents the change in the distance from the work surface, as in FIG.

第3図、第4図において、結像面SをS′のように、第
2図で説明したai0,ai1,およびai2の結像点Bi0
i1,Bi2を結ぶ線上に、受光素子Sを設けるとすれ
ば、Bi1,Bi2はレンズ寸法rおよびrの影響を受
けないから、S面上で見る場合の像のボケがなく、距離
の検出精度を著しく向上させることができる。
In FIGS. 3 and 4, the image forming plane S is represented by S ′, and the image forming points B i0 , a i0 , a i1 and a i2 described in FIG.
The line connecting B i1, B i2, if provided light receiving element S i, B i1, since B i2 is not affected by the lens size r 1 and r 2, image blur when viewing on S plane Therefore, the accuracy of distance detection can be significantly improved.

測定ユニットの受光特性例として、光源に光出力1mw程
度のレーザを使用し、光ビームを斜めに物体に入射した
場合の実験結果を示す。α=80゜,la0=80mm、レン
ズ倍率M=1/6で、受光素子にPSDを用い、金属面を
測定した。受光特性は第6図に示すように、ワーク面ま
での距離の変化量Zに対し、直線性の良い出力電圧がえ
られた。
As an example of the light receiving characteristic of the measurement unit, an experimental result when a laser with a light output of about 1 mw is used as a light source and a light beam is obliquely incident on an object is shown. A metal surface was measured using a PSD as a light receiving element with α = 80 °, la0 = 80 mm, and lens magnification M = 1/6. As for the light receiving characteristic, as shown in FIG. 6, an output voltage with good linearity was obtained with respect to the variation amount Z of the distance to the work surface.

上記測定ユニットMをレーザガンGの中心軸Zのまわ
りに一定角づつずらして、例えば90゜づつずらして4
個(M,M,M,M)配置すれば、4個の輝点
(i=1〜4)と受光レンズLとの距離が、測定
値la0からどのようにずれているかを知ることができる
ので、レーザガンGの姿勢を矯正できる。この場合、レ
ーザガンGの姿勢は、4個のユニットの距離データを一
致させるよう姿勢制御を行えば、レーザガンGのZ軸が
被加工物表面Jに垂直を保ち、また、4個のユニットの
距離laiの基準値を適宜設定し、測定値との演算によ
り、レーザガンGのZ軸を被加工物表面Jに対して一定
の傾斜を保たせることができる。
The measuring unit M i is shifted around the central axis Z of the laser gun G by a constant angle, for example, by 90 °.
If the number (M 1 , M 2 , M 3 , M 4 ) is arranged, how the distance between the four bright points a i (i = 1 to 4) and the light receiving lens LR is calculated from the measured value la0. Since it is possible to know whether there is a deviation, the posture of the laser gun G can be corrected. In this case, if the attitude of the laser gun G is controlled so that the distance data of the four units are matched, the Z axis of the laser gun G is kept perpendicular to the workpiece surface J, and the distance of the four units is The Z axis of the laser gun G can be kept at a constant inclination with respect to the workpiece surface J by appropriately setting the reference value of l ai and performing calculation with the measured value.

次に雑音の検出について説明する。レーザ加工機では、
CO等加工レーザビームの加工点における反射、散
乱、工場内の各種光源等の雑音光による測定妨害、超音
波加工機や洗浄機などからの誘導、輻射等の妨害が無数
に存在する。しかし、これらの周波数域はたかだか10〜
30 KHzであるので、測定に使用する信号光ビームを30 K
Hz以上の高周波で変調しておけば、受光素子の電気出力
側で帯域フィルタまたは高域フィルタを用いて、雑音成
分を除去し、その測定妨害を除くことができる。
Next, noise detection will be described. With a laser machine,
There are countless interferences such as reflection and scattering at a processing point of a processing laser beam such as CO 2, measurement interference due to noise light from various light sources in a factory, induction from an ultrasonic processing machine or a washing machine, and radiation. However, these frequency ranges are at most 10 ~
Since it is 30 KHz, the signal light beam used for measurement is 30 KHz.
If modulated at a high frequency of Hz or higher, a noise component can be removed and its measurement interference can be removed by using a bandpass filter or a highpass filter on the electric output side of the light receiving element.

本発明による姿勢検出システムを第7図により説明す
る。
The attitude detection system according to the present invention will be described with reference to FIG.

OPSは高周波変調された信号光発生器で、光ファイバ
(i=1,2,・・)を導路としてレーザガンGへ送る。
レーザガンGのセンサ組込みは前に説明した通りである
が、光ビームの発光端部は中心から径の半径方向に余弦
的な屈折率分布をもつ円筒レンズ等を使用すれば、光フ
ァィバコード径と合わせて1〜2mmの径で構成できるか
ら、レーザガンG外周上母線方向に溝を堀り、ファイバ
とも一体に埋込むことができる。その構造は第8図に示
した通りである。
The OPS is a high-frequency modulated signal light generator, which sends the signal to the laser gun G through the optical fiber I i (i = 1, 2, ...).
Assembling the sensor of the laser gun G is as described above, but if the light emitting end of the light beam uses a cylindrical lens having a cosine refractive index distribution in the radial direction of the diameter from the center, it can be matched with the optical fiber code diameter. Since it can be configured to have a diameter of 1 to 2 mm, it is possible to form a groove in the generatrix direction on the outer circumference of the laser gun G and embed it together with the fiber. Its structure is as shown in FIG.

DET(i=1,2,・・)は受光系の信号検出回路であ
る。
DET i (i = 1, 2, ...) Is a signal detection circuit of the light receiving system.

受光素子Sで光から電気出力Vに変換された信号は
増幅後、フィルタで雑音成分を徐去し、デジタル信号と
して出力される。出力データ、すなわち輝点aが受光
素子S上で正規の位置に対して遠近何れの側にあるか
を示す符号と距離の変化量等の情報は、RS-232C 等のイ
ンタフェースを介して、センサ・コンピュータSPC へ送
られる。センサ・コンピュータSPC では、4つの測定デ
ータの計算処理をリアルタイムで行い、姿勢制御データ
を加工機のコントローラMCPへ渡す。この情報によ
り、加工機のコントローラMCPは前記姿勢制御のため
の駆動動力を発生し、レーザガンGの姿勢を正しく矯正
する。
After signal converted from light into electrical output V i by the light receiving element S i is amplified to Josa noise component by the filter, is output as a digital signal. The output data, that is, the sign indicating whether the bright point a i is on the light receiving element S i on the far side or the near side with respect to the normal position, and the information such as the change amount of the distance are transmitted via an interface such as RS-232C. , Sent to the sensor computer SPC. The sensor computer SPC calculates the four measurement data in real time and transfers the attitude control data to the controller MCP of the processing machine. Based on this information, the controller MCP of the processing machine generates drive power for the posture control, and corrects the posture of the laser gun G correctly.

(発明の効果) 以上説明したように本発明の姿勢センサを内蔵した加工
機ヘッドは小形・軽量・低価格であり、加工機ヘッドの
従来の作業空間を変更することなく、複雑に入りこんだ
凹所等の各種作業にも適用できる。また、本姿勢センサ
を使用することによって作業中の姿勢自動制御が可能に
なったことは、今後自動ならい等作業の自動化の推進に
大きく貢献する。特に、レーザ加工機におけるガンの姿
勢制御に有効である。
(Effects of the Invention) As described above, the processing machine head incorporating the attitude sensor of the present invention is small, lightweight and low in price, and does not change the conventional working space of the processing machine head, and it has a complicated recess. It can also be applied to various types of work such as in the office. In addition, the use of this attitude sensor enables automatic attitude control during work, and will greatly contribute to the promotion of automation of work such as automatic tracing in the future. In particular, it is effective for controlling the attitude of the gun in the laser processing machine.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の姿勢センサを装備したレーザ加工機ヘ
ッドを示す図。 第2図〜第4図は本発明の姿勢センサの光学系を示す
図。 第5図は本発明の検出特定を測定する測定回路。 第6図は本発明の受光系の検出特性を示す図。 第7図は本発明の姿勢検出システムを示す図。 第8図は本発明のレーザ加工機ヘッドの構造を示す図。
FIG. 1 is a diagram showing a laser processing machine head equipped with an attitude sensor of the present invention. 2 to 4 are views showing an optical system of the attitude sensor of the present invention. FIG. 5 is a measuring circuit for measuring the detection characteristic of the present invention. FIG. 6 is a diagram showing the detection characteristics of the light receiving system of the present invention. FIG. 7 is a diagram showing a posture detection system of the present invention. FIG. 8 is a view showing the structure of the laser processing machine head of the present invention.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】1個の環状受光レンズと、該受光レンズの
光軸のまわりに配置され、かつ、該光軸に収束する方向
に放射される細い複数條の信号光ビームを発生する手段
を有し、該信号光ビームが被加工物表面につくるスポッ
トと受光レンズとが所定の距離になった時、該受光レン
ズにより結ばれるスポットの像の結像点に、受光位置を
検知する手段をもった細長い線状受光素子列をそなえ、
姿勢検出の場合、受光素子に入射するスポットからの反
射光の入射区間が、前記の所定距離の場合のスポット結
像点の何れの側にあるかを判別する電気回路をそなえ、
該電気回路の複数個の出力から被加工物表面に対する加
工機ヘッドの姿勢を検出することを特徴とする姿勢セン
サ。
1. An annular light-receiving lens, and means for generating a plurality of thin signal light beams which are arranged around the optical axis of the light-receiving lens and are emitted in a direction converging on the optical axis. And a means for detecting the light receiving position at the image forming point of the image of the spot formed by the light receiving lens when the spot formed by the signal light beam on the surface of the workpiece and the light receiving lens have a predetermined distance. Equipped with a long and narrow linear light receiving element array,
In the case of attitude detection, the incident section of the reflected light from the spot incident on the light receiving element is provided with an electric circuit for discriminating which side of the spot image formation point in the case of the predetermined distance,
An attitude sensor, which detects an attitude of a processing machine head with respect to a surface of a workpiece from a plurality of outputs of the electric circuit.
JP63116975A 1988-05-16 1988-05-16 Attitude sensor Expired - Lifetime JPH0625659B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63116975A JPH0625659B2 (en) 1988-05-16 1988-05-16 Attitude sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63116975A JPH0625659B2 (en) 1988-05-16 1988-05-16 Attitude sensor

Publications (2)

Publication Number Publication Date
JPH01287408A JPH01287408A (en) 1989-11-20
JPH0625659B2 true JPH0625659B2 (en) 1994-04-06

Family

ID=14700391

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63116975A Expired - Lifetime JPH0625659B2 (en) 1988-05-16 1988-05-16 Attitude sensor

Country Status (1)

Country Link
JP (1) JPH0625659B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5330114B2 (en) * 2008-06-13 2013-10-30 株式会社カツラ・オプト・システムズ Displacement tilt sensor

Also Published As

Publication number Publication date
JPH01287408A (en) 1989-11-20

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