JPH0627769B2 - Measuring equipment for electronic devices - Google Patents

Description

Detailed Description of the Invention [Industrial applications]

The present invention relates to an electronic device capable of preventing deformation or damage of an electronic device itself or a measuring terminal for measuring an electrical property of the electronic device, and further capable of accurately measuring an electrical property.

[Prior art]

As a measuring device of this kind of electronic device, for example, one shown in FIG. 8 is known. This measuring device is positioned so as to sandwich both the left and right sides of a conveyor belt guide 1 and a belt 2 which is guided by the conveyor belt 2 and travels in a direction orthogonal to the plane of the drawing, and is vertically reciprocally driven by a suitable driving device. , 3, and the measurement terminal support pairs 3, 3 having their base ends supported, bent in a substantially L-shape, and the tips contact the upper surfaces of the left and right electrodes of the electronic device 4 conveyed onto the conveyor belt. Needle-shaped measuring terminal 5,
5 and 5. When the measuring terminal support pairs 3 and 3 move up and down,
In accordance with this, the measuring terminals 5 and 5 also move up and down. The measuring terminals 5 and 5 move up and stand by until the electronic device 4 to be measured is sent to a predetermined position.
When the sheet is fed to the predetermined position on the belt 2, the sheet moves downward by a predetermined amount, and its ends contact the upper surfaces of both electrodes of the electronic device 4 to perform measurement. As for the positioning of the electronic device 4, the position of the electronic device 4 in the longitudinal direction of the belt is detected to stop the belt 2, or the stopper is intermittently advanced on the belt in synchronization with the moving speed of the belt 2. It is carried out, for example.

[Problems to be Solved by the Invention]

By the way, in the above-mentioned conventional measuring device, since it is necessary that the needle-shaped measuring terminals 5 and 5 come into contact with the upper surfaces of both electrodes of the electronic device 4 with a certain pressing force, the vertical movement stroke is It is set to be larger than the difference in height between the upper surface of the device 4 and the tips of the terminals 5 and 5 when moved upward. Therefore, the measuring terminals 5 and 5 are moved downward so that the tip ends of the electronic device 4
When in contact with the top, the terminals 5,5 flex somewhat elastically, so that at that time the ends of the terminals 5,5 slide inwardly over both electrodes of the electronic device 4. As described above, in the conventional example, the measuring terminals 5 and 5 themselves are elastically deformed, so that even if the solder thicknesses on the upper surfaces of both electrodes of the electronic device 4 are different, the terminals can be pressed by an appropriate pressing force. 4 of the electronic device 4 and the terminals 5,
It will prevent the damage of 5, but the measurement terminals 5, 5
When a rather large external force is applied, permanent strain easily occurs, and normal measurement after that becomes impossible. In addition, in some cases, the tips of the terminals 5 and 5 slip on the electrodes of the electronic device in a scratched manner, which causes a problem that the product quality is deteriorated. In addition, the measurement terminal supporting body 3 is moved up and down so that the measurement terminals 5 and 5 come into contact with the upper surface electrode of the electronic device 4 with an appropriate pressing force corresponding to the expected height difference of the upper surface electrode of the electronic device 4. It is difficult to adjust, and due to this adjustment error, permanent strain of the measuring terminals 5 and 5 is likely to occur. Further, since the electrodes normally formed on the upper surfaces of both ends of the electronic device 4 are formed in extremely small regions in the width direction, when the terminals 5 and 5 are moved downward, the tips of the electrodes are dislocated from the electrodes and the electrodes of the electronic device 4 are removed. There is also a problem that it slips inward and normal measurement cannot be performed. Further, in this conventional example, since the measurement is performed by bringing the terminals 5 and 5 into contact with the upper surface electrodes of the electronic device 4 mounted on the belt 2, the electronic device 4 during measurement does not move on the belt. It is premised that they remain on the surface of the belt 2. Therefore, there is a possibility that a leak may occur between the electrodes via the belt 2 due to dirt or moisture on the belt 2, which also makes it impossible to perform accurate measurement. The present invention has been made in consideration of the above circumstances, and the problems of the above-mentioned conventional example due to the fact that the measuring terminal having a relatively small rigidity moves up and down to measure the electronic device. It is designed so that even if the solder thickness of the electrodes on both sides is different, accurate measurement of these electronic devices can be continued for a long time without causing damage to the measuring terminals and electronic devices. It is an object of the present invention to provide a measuring device having the above characteristics.

[Means for solving the problem]

In order to solve the above problems, the present invention takes the following technical means. That is, a base frame, a pair of measurement terminal supports supported so as to be able to approach and separate from each other with respect to the base frame, and an electronic device mounted on a conveyor belt running between the pair of measurement terminal supports. In a measuring device of an electronic device comprising a measuring terminal supported by the measuring terminal support so that the tip end faces the side surface of each electrode, each measuring terminal, with respect to the measuring terminal support The end of the elastic member is supported so that it can be elastically retracted.

【Example】

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. FIG. 1 is a front view of an embodiment of the present invention, FIG. 2 is a plan view,
FIG. 3 is a side view, and FIGS. 4 to 6 are front views showing the respective operating states in order. In addition, the example shown in the figure shows an example configured so that the resistance value of each unit chip of a so-called multiple chip resistor, which is formed by connecting unit chip resistors in multiples, is simultaneously and separately measured. This measuring device has a base frame 11 and a pair of sliders 12 supported at both left and right ends of the base frame 11 so as to be slidable in the left-right direction. A guide frame 17 of the conveyor belt 13 is arranged between the sliders 12, and the guide frame 17 is conveyed in a guide groove 18 formed on the upper surface of the guide frame 17 so as to be flush with the upper surface of the guide frame 17. The belt 13 is inserted. A measurement terminal support 15 is elastically supported on each of the sliders 12, as will be described later.
The multiple chip resistors 1 mounted on the conveyor belt 13
Each of the plurality of measurement terminals 16 is supported so as to face each of the four electrodes. In this case, the multiple chip resistor 14 has electrodes 14a and 14b of each chip arranged on both sides as shown in FIG. 7 and is conveyed in the longitudinal direction thereof, so that the number of unit resistors corresponding to the number of unit resistors is increased. The measuring terminal 16 is insulated from the other terminal supporting body 15 and the other measuring terminal 16 by the above supporting body 15.
Supported in parallel. The conveyor belt 13 has a guide groove 1 formed in the center of the upper surface of a guide frame 17 arranged on the upper surface of the base frame 11.
8 is inserted so as to be flush with the upper surface of the guide groove 17. The slider 1 is provided on both sides of the guide frame 17.
Each guide piece 19 for slidingly guiding 2 in the width direction of the guide frame 17 (left-right direction in FIGS. 1 and 4 to 6) is provided, and the slider 12 is slidable on each guide piece 19. Mated. That is, as shown in FIG. 3, the groove 1 in the width direction of the guide frame 17 is formed on the upper surface of each guide piece 19.
9a is formed, and the concave groove 1 is formed on the lower surface of the slider 12.
A protrusion 12a that is slidably inserted into 9a is formed. A terminal support 15 is elastically supported on the slider 12. That is, the front and rear frame portions 15a of the terminal support 15
A pair of left and right elevating guide holes (not shown) penetrating in the up and down direction are formed in each of the sliders, and guide bolts 19b inserted in the elevating guide holes so as to be slidable up and down are provided in these sliders 12.
The required number of disc springs 19 inserted between the terminal support 15 and the
c through the center hole (not shown) of c
2 is screwed to the front and rear ends. Tip of the terminal support 15 (end on the side of the conveyor belt 13)
Is provided with a terminal support shaft 15b made of an insulating material that penetrates the front and rear frame portions 15a. The upper ends of the tips of the respective measurement terminals 16 that are superposed in an insulating manner in the front-rear direction are attached to the terminal support shaft 15b. It is supported so that it can swing independently of 16. An insulating plate may be inserted between the measurement terminals 16 overlapping in the front-rear direction, if necessary, or an insulating space may be simply provided without using the insulating plate. The intermediate portion of the measurement terminal 16 is placed on the bottom frame portion 15c of the terminal support 15 and has an insulating support member 1 whose movement in the front-rear direction is restricted by the front-rear frame portion 15a.
It is mounted on 5d. The receiving frame portion 15e is fixed to the upper surface of the base end portion of the terminal support body 15, and the upper surface of the proximal end portion of the measuring terminal 16 is received by the lower surface of the elastic member 20 fixed to the lower surface of the receiving frame portion 15e. The lower end of the tip of the measuring terminal 16 is positioned higher than the upper surfaces of the guide frame 17 and the conveyor belt 13 by about 0.5 mm, for example. A bell crank 22 is pivotally supported at lower portions on both right and left sides of the base frame 11 via a fulcrum pin 21 so as to be swingable around a longitudinal axis. U-shaped engaging grooves 22a and 22b are formed at both ends of each bell crank 22. On the other hand, an elevating frame 23 is provided at one side of each bell crank 22 so as to be able to ascend and descend with respect to the base frame 11, and an engaging groove 22 a of one of the bell cranks 22 is engaged with the upper part of the elevating frame 23. The drive pin 24 is fixed. A driven pin 25 is provided on one side of the slider 12, and the driven pin 25 is engaged with the other engaging groove 22b of the bell crank 22. The elevating frame 23 is a drive device (not shown) such as a motor via a slider crank mechanism (not shown).
Connected to. In addition, between the left and right fixed terminals 16 on both sides, a suction means 27 including a vacuum chuck or the like is opened at a predetermined height on the conveyor belt 13 toward the chip resistor 14 on the conveyor belt 13.
Is provided. In addition, a normal belt chip resistor is selected on the chip resistor feed side of the measuring device to carry out the belt 2.
A sorting device 29 for moving to an 8 tatami mat and a defective product discharge hole 30 for dropping a defective product are provided. In the above structure, when the elevating frame 23 is moved to the predetermined elevated position by the driving device, the distance between the two measuring terminals 16 becomes wider than the width of the chip resistor 14 as shown in FIG. The carrying belt 13 can carry the chip resistor 14 in and out of both terminals. Actually, as shown in FIG. 2, the chip resistor 14 is continuously placed on the conveyor belt 13 and carried in between both terminals 16, and is carried in first by the chip resistor 14 carried in next. The chip resistor 14 that is being pushed out is ejected. Then, the non-defective chip resistor 14 is moved onto the carry-out belt 28 by the sorting device 29, and is supplied to the subsequent production line by the carry-out belt 28. The defective chip resistor 14 is left on the guide frame 17 and is pushed by the succeeding chip resistor 14 so that the defective product discharge hole 3
When it reaches 0, it is dropped from the defective product discharge hole 30 below the guide frame 17 and removed from the production line. When a new chip resistor 14 is carried in between both measurement electrodes 16, first, the suction means 27 is activated to lift the chip resistor 14 from the guide frame 17 to a predetermined height as shown in FIG. . Subsequently, as shown in FIG. 6, the elevating frame 23 is lowered to a predetermined lowering position by the driving device, both sliders 12 are moved toward the guide frame 17 via the bell crank 22, and both measuring terminals 16 are moved. The chip resistor 14 is sandwiched between the lower ends of the tips. Then, a measurement current is passed through the chip resistor 14 via both measurement terminals 16 and the resistance value is measured. The operation of the suction means 27 is based on both measurement terminals 1.
After the chip resistor 14 is sandwiched between the 6 and 6, it may be released at any time. However, in order to stabilize the position where the chip resistor 14 is dropped onto the conveyor belt 13, it is better to cancel the operation of the suction means 27 after the measurement is completed and both measurement terminals 16 are opened by the operation opposite to the above. preferable. Now, when sandwiching the chip resistor 14 between the both measurement terminals 16 as described above, it is necessary to consider that there is a small variation in the width dimension of the chip resistor 14 due to, for example, excess or deficiency of adhesion of electrode members. I won't. However, in the above embodiment, since the measuring terminal 16 is supported by the terminal support 15 as described above, the measuring terminal 16 and the chip resistor 14 are not deformed or damaged, and the measuring terminal 1
6 and the electrodes 14a and 14b of the chip resistor 14 can be kept in good contact with each other. That is, if the closest distance of the measurement terminal 16 is set in accordance with the minimum value of the width dimension of the chip resistor 14 carried in by the conveyor belt 13,
After the lower end of the tip of the measuring terminal 16 comes into contact with the chip resistor 14 having a width dimension larger than this, the measuring terminal 16 slides around the terminal supporting shaft 15b, and the slider 12 and the terminal supporting body 15 become excessively large. While the movement is absorbed, the elasticity of the elastic member 20 causes the measuring terminal 16 to be pressed stably against the electrode of the chip resistor 14 at an appropriate pressure. Therefore, even if there are small variations in the width dimension of the chip resistor 14, an excessive force does not act on the chip resistor 14 and the measurement terminal 16, and the chip resistor 14 and the measurement terminal 16 are prevented from being deformed or damaged. The contact pressure between the measurement terminal 16 and the electrode of the chip resistor 14 is properly held by the elastic member 20, and a good contact state can be secured. Of course, in this case, the measuring terminals 16 are independent of each other and the terminal supporting shaft 1
Since it is possible to oscillate about 5b, even if there are variations in the width dimension of each chip of one multiple chip resistor, the amount of deformation of the elastic member 20 is made different for each chip and the measurement terminal 16 is made to have a chip resistance. The electrodes of the container 14 can be brought into contact with each other with an appropriate contact pressure. In this example, the height of the measuring terminal 16 can be changed according to the vertical height of the electronic device 14 to be measured. That is, the vertical height of the terminal support body 15 is changed by changing the number of the disc springs 19c interposed between the slider 12 and the terminal support body 15 or by adjusting the screwing amount of the guide bolt 19b. Can be adjusted. Further, in this example, since the chip resistor 14 is lifted from the belt by the suction means 27 before the measurement,
Measurement errors caused by dirt on the belt are completely avoided. Of course, the scope of the present invention is not limited to the embodiments described above. For example, the embodiment is an example of a device for measuring resistance of a multiple chip resistor, but any electronic device having electrodes formed on both sides and capable of being carried by a carrying belt, such as an ordinary chip resistor. The present invention can be applied to an apparatus for measuring the characteristics of In addition, in the embodiment, the measurement terminal support body is made to approach and separate by the slider, but it may be made to approach and separate by a pair of swing arms, for example.

【The invention's effect】

As described above, according to the present invention, since the measurement terminal is supported by the terminal support through the elastic member, the elastic member absorbs the excessive movement of the terminal support caused by the variation in the width dimension of the electronic device. On the one hand, the deformation and damage of the electronic device and the measuring terminal can be prevented, and on the other hand, the contact pressure between the electrode of the electronic device and the measuring terminal is appropriately maintained, and accurate measurement can be performed. The measurement terminal to be supported by the terminal support can be made of any material having high rigidity.Therefore, during measurement operation, the measurement terminal will be deformed by external force as in the conventional example, and it will be appropriate after that. It is also possible to effectively avoid the problem that it becomes impossible to perform accurate measurement. Furthermore, since the side portions of both electrodes of the electronic device are sandwiched by the pair of measuring terminals, the electronic device to be measured can be held in the space, and therefore, for example, the electronic device can be conveyed at the measuring terminals by the conveyor belt. It is possible to make measurements while floating above. According to this, there is no contamination of the conveyor belt or leakage from the contact portion with the conveyor belt, and it becomes possible to measure the characteristics of the electronic device more accurately.

[Brief description of drawings]

FIG. 1 is a front view of an embodiment of the present invention, FIG. 2 is a plan view,
FIG. 3 is a side view, FIGS. 4 to 6 are front views showing the operating states of one embodiment of the present invention, respectively, and FIG. 7 is a multi-unit as an example of an electronic device to be measured by the device of the present invention. FIG. 8 is a perspective view illustrating a chip resistor, and FIG. 8 is a front view of a conventional example. 11 ... Base frame, 12 ... Slider, 13 ... Conveyor belt, 14 ... Electronic device (chip resistor), 14a, 14
b ... Electrode (of electronic device), 16 ... Measuring terminal, 20 ...
... an elastic member.

Claims (1)

[Claims] 1. A base frame, a pair of measurement terminal supports supported so as to be able to approach and separate from each other with respect to the base frame, and mounted on a conveyor belt running between the pair of measurement terminal supports. In a measuring device of an electronic device, which comprises a measuring terminal supported by the measuring terminal supporting body such that the tip end faces the side surfaces of both electrodes of the electronic device, each measuring terminal is the measuring terminal supporting body. On the other hand, a measuring device for an electronic device, characterized in that its tip is supported via an elastic member so as to be elastically retractable.