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JPH0628040B2 - Software quality automatic evaluation method - Google Patents
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JPH0628040B2 - Software quality automatic evaluation method - Google Patents

Software quality automatic evaluation method

Info

Publication number
JPH0628040B2
JPH0628040B2 JP59279659A JP27965984A JPH0628040B2 JP H0628040 B2 JPH0628040 B2 JP H0628040B2 JP 59279659 A JP59279659 A JP 59279659A JP 27965984 A JP27965984 A JP 27965984A JP H0628040 B2 JPH0628040 B2 JP H0628040B2
Authority
JP
Japan
Prior art keywords
test
quality
software
bugs
evaluation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP59279659A
Other languages
Japanese (ja)
Other versions
JPS61160152A (en
Inventor
弥一郎 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59279659A priority Critical patent/JPH0628040B2/en
Publication of JPS61160152A publication Critical patent/JPS61160152A/en
Publication of JPH0628040B2 publication Critical patent/JPH0628040B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Prevention of errors by analysis, debugging or testing of software
    • G06F11/3668Testing of software
    • G06F11/3696Methods or tools to render software testable

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Debugging And Monitoring (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はソフトウェア(プログラム)の品質評価方法に
係り、特にソフトウェアの品質をテストで摘出されるバ
グ件数の推移により自動的に評価する方法に関する。
Description: TECHNICAL FIELD The present invention relates to a software (program) quality evaluation method, and more particularly to a method for automatically evaluating the quality of software by the transition of the number of bugs extracted by a test. .

〔発明の背景〕[Background of the Invention]

ソフトウェアには、設計技術を駆使しても、人間の不注
意等によりバグがランダムに潜在する。従来、このよう
なソフトウェアの品質評価法としては、例えば電子通信
学会論文誌7415Vol.57−DNo.5に坂田一志氏が
“ソフトウェアの生産管理における予測技法を定式化−
静的な予測および故障率推移モデル−”と題して論じて
いる。他には、例えば情報処理学会第25回(昭和57
年度後期)全国大会において、宮下洋一氏が“ソフトウ
ェアエラーダイナミクス”(1E−1)と題して、ま
た、吉田征氏ほからが“ソフトウェア品質の目標管理”
(1E−8)と題してそれぞれ発表している。しかし、
これらはテストで摘出されるバグの累積状態を成長曲線
にあてはめて残バグ件数を推定したり、あるいは、品質
の目標値管理については、開発段階と提供後のバグ件数
といった大雑把な区別で行うというものであり、ソフト
ウェアの異常品質の早期発見、正確な把握等の面で不十
分である。
Even if design software is fully used, bugs randomly appear in software due to human carelessness. Conventionally, such a software quality evaluation method is described in, for example, the Institute of Electronics and Communication Engineers, Journal 7415 Vol.57-DNo.
Static prediction and failure rate transition model- ". Others are, for example, IPSJ 25th (Showa 57).
Yoichi Miyashita entitled "Software Error Dynamics" (1E-1) at the National Convention in the second half of the fiscal year, and Seika Yoshida "Software Quality Goal Management"
(1E-8), respectively. But,
It is said that the cumulative number of bugs extracted by the test is applied to the growth curve to estimate the number of remaining bugs, or the quality target value is managed by making a rough distinction between the development stage and the number of bugs after provision. However, it is insufficient in terms of early detection and accurate grasp of abnormal quality of software.

〔発明の目的〕[Object of the Invention]

本発明の目的は、ソフトウェアの品質評価を自動的に行
い、異常品質の早期発見、正確な把握等を可能とするソ
フトウェア品質自動評価方法を提供することにある。
An object of the present invention is to provide a software quality automatic evaluation method that automatically evaluates software quality and enables early detection and accurate grasp of abnormal quality.

〔発明の概要〕[Outline of Invention]

通常、ソフトウェアのテスト(チェック)は何回か繰り
返し行われるが、毎回およそ同数レベルの項目数をラン
ダムに確認すると考えられる。このことから、何回か繰
り返されるテストにおいて摘出されるバグ件数の推移は
減衰型をとるのが正常と考えられる。これは次のように
して説明できる。前提として、 (1)総ステートメント数をMo、初期潜在バグ件数をBo
(Bo<Mo)、第k番目のテストで実行するステートメ
ント数をNk(Nk<Mo)、第k番目のテストを実行す
るときの潜在バグ件数をBk、バグ摘出確率をPkとす
る。
Normally, software testing (checking) is repeated several times, but it is considered that the number of items of approximately the same level is randomly confirmed each time. From this, it is considered normal that the transition of the number of bugs extracted in the test repeated several times is of a decay type. This can be explained as follows. As a premise, (1) the total number of statements is M o , and the number of initial latent bugs is B o
(B o <M o ), the number of statements executed in the k-th test is N k (N k <M o ), the number of potential bugs when executing the k-th test is B k , and the bug extraction probability is Let P k .

(2)第k番目のテストで実行したある任意のステートメ
ントが不良ステートメントである確率PkはBk/Mo
与えられるとする。
(2) It is assumed that the probability P k that an arbitrary statement executed in the k-th test is a bad statement is given by B k / M o .

(3)不良ステートメントはその場で修正され、修正によ
る作込みバグは非常に少ないものとする。
(3) Bad statements will be corrected on the spot, and the number of creation bugs due to the correction will be very small.

いま、N≒Nk(k=1,2,…)と仮定すると、バグ
摘出確率Pk、バグ摘出件数N・Pk、残存バグ件数Bk
は、 で表わされる。k=1,2,3,…のときの(1),(2)お
よび(3)式の推移を表にまとめると第7図のようにな
り、また、バグ摘出確率と残存バグ件数の同様の推移を
グラフで示すと第8図のようになり、テストを重ねるこ
とにより指数的に減少していることが分かる。
Assuming that N≈N k (k = 1, 2, ...), a bug extraction probability P k , a bug extraction number N · P k , and a remaining bug number B k.
Is It is represented by. The changes in equations (1), (2), and (3) when k = 1, 2, 3, ... Are summarized in the table shown in Fig. 7. Also, the bug extraction probability and the number of remaining bugs are the same. Fig. 8 shows the transition of the graph in Fig. 8, and it can be seen that it decreases exponentially with repeated tests.

本発明は、何回か繰り返えされるテストにおいて、摘出
バグ件数の推移が減衰型であればソフトウェアの設計品
質もテスト方法も正常で、それ以外の型は異常という考
えに基づき、減衰の目標件数、目標評価値等を経験値等
から与え、それと実績値との比較及び実績評価値自体の
推移状態により自動的にソフトウェアの品質を評価する
ものである。
The present invention is based on the idea that the software design quality and the test method are normal if the transition of the number of extracted bugs is an attenuation type in the test repeated several times and the other types are abnormal, and the attenuation target The number of cases, the target evaluation value, etc. are given from experience values, etc., and the quality of the software is automatically evaluated by comparing it with the actual value and the transition state of the actual evaluation value itself.

〔発明の実施例〕Example of Invention

第1図は本発明が適用されるシステム構成の全体ブロッ
ク図を示す。第1図において、テスト装置10は本発明
の中心をなすもので、CPU、ROM、RAM等からな
る通常のミニコンピュータなどが用いられ、ソフトウェ
ア(プログラム)の品質評価を自動的に行う機能を有し
ている。テスト装置10でテストするソフトウェアはフ
ロッピィディスク30に格納されている。キーボード2
0はテスト装置10に対する所望の動作指示やデータ等
を入力するのに使用される。また、テスト装置10での
処理結果はディスプレイ装置40あるいはプリンタ装置
50に出力される。
FIG. 1 shows an overall block diagram of a system configuration to which the present invention is applied. In FIG. 1, a test apparatus 10 is the center of the present invention, and an ordinary minicomputer including a CPU, a ROM, a RAM and the like is used and has a function of automatically performing quality evaluation of software (program). is doing. Software to be tested by the test apparatus 10 is stored in the floppy disk 30. Keyboard 2
0 is used to input a desired operation instruction, data, etc. to the test apparatus 10. The processing result of the test device 10 is output to the display device 40 or the printer device 50.

第2図にテスト装置10での本発明にかかわる処理フロ
ーを示す。テスト装置10は、フロッピィディスク30
に格納されている被テストプログラムを読み出してテス
トし、バグを摘出する(ステップ101)。テスト装置
10のRAM内に用意されたテーブルには、プログラム
毎の各テスト工程単位の摘出バグ目標件数がキーボード
20よりあらかじめ読み込まれており、テストの結果、
該テーブル内に実際に摘出されたバグ件数(実績件数)
があらたに読み込まれる。
FIG. 2 shows a processing flow of the present invention in the test apparatus 10. The test device 10 includes a floppy disk 30.
The program under test stored in is read and tested, and the bug is extracted (step 101). In the table prepared in the RAM of the test apparatus 10, the target bug extraction number of each test process unit of each program is pre-read from the keyboard 20, and the test result is
Number of bugs actually extracted in the table (actual number)
Newly read.

次に、このRAMのテーブル内に読み込まれたプログラ
ム毎/テスト工程単位の摘出バグデータ(目標件数、実
績件数)から評価処理を行うプログラムのデータを抽出
し、目標および実績のそれぞれのデータをテスト工程毎
に出力形式および計算可能形式に変換する(ステップ1
02)。
Next, the program data to be evaluated is extracted from the extracted bug data (target number, actual number) for each program / test process read in the table of this RAM, and each data of the target and the actual result is tested. Convert to output format and computable format for each process (Step 1
02).

次に、各テスト工程での摘出バグの目標件数と実績件数
を比較して不良摘出予実績評価基準に基づき評価を行う
(ステップ103)。第3図は不良摘出予実績評価基準
の一例を示したもので、「○」は良、「△」はやゝ良、
「×」は不良を示す。なお、a=不良摘出実績/目標値
×100で表わす。
Next, the target number of picked-up bugs and the actual number of picked-up bugs in each test process are compared, and evaluation is performed based on the defective pick-up preliminary result evaluation standard (step 103). Fig. 3 shows an example of the evaluation criteria of defective extraction prediction results. "○" is good, "△" is good.
“X” indicates a defect. It should be noted that a = defective extraction result / target value × 100.

次に、各テスト工程単位に、当該工程までの各テスト工
程の不良摘出実績と品質推移評価算出係数との積を加算
し、当該工程の品質推移評価値を算出する(ステップ1
04)。品質推移評価算出係数は、評価工程毎にその係
数の重付けが変わるものとする。第4図は該品質推移評
価算出係数の一例を示す。
Next, the product of the defect extraction record of each test process up to the process and the quality transition evaluation calculation coefficient is added to each test process unit to calculate the quality transition evaluation value of the process (step 1).
04). The weighting of the quality transition evaluation calculation coefficient is changed for each evaluation process. FIG. 4 shows an example of the quality transition evaluation calculation coefficient.

次に、ステップ104で算出した評価値を一つ前のテス
ト工程の推移評価値と比較して、品質推移評価基準に基
づき評価を行う(ステップ105)。第4図で示したよ
うに、品質推移評価値はテスト工程毎のバグ摘出件数の
減少率が大きい程良い(低い)値になるように算出して
いる。第5図は品質推移評価基準の一例を示したもので
ある。なお、e=当該工程の評価値/一つ前の工程の評
価値×100で表わす。
Next, the evaluation value calculated in step 104 is compared with the transition evaluation value of the immediately preceding test process, and evaluation is performed based on the quality transition evaluation standard (step 105). As shown in FIG. 4, the quality transition evaluation value is calculated such that the larger the reduction rate of the number of extracted bugs in each test process is, the better (lower) value is. FIG. 5 shows an example of quality transition evaluation criteria. Note that e = evaluation value of the process / evaluation value of the immediately preceding process × 100.

次に、評価結果を例えばグラフの形でディスプレイ装置
40に表示し(ステップ106)、また、そのリストを
ハードコピーとして必要な場合は(ステップ107)、
プリンタ装置50を使用してハードコピーを出力する
(ステップ108)。
Next, the evaluation result is displayed on the display device 40, for example, in the form of a graph (step 106), and if the list is required as a hard copy (step 107),
A hard copy is output using the printer device 50 (step 108).

第6図に本発明による処理の具体例を示す。これはプロ
グラムのステップ数が25k、テストは5工程の例であ
る。
FIG. 6 shows a specific example of the processing according to the present invention. This is an example in which the number of steps of the program is 25k and the test is 5 steps.

経験値により摘出バグ件数の目標値はkステップ当り1
2件(絶対件数で301件)を与え、減衰型を考慮して
テスト工程の配分は、1工程目が163件、2工程目が
80件、3工程目が40件、4工程目が13件、5工程
目は5件と設定されている。実績は、1工程目が87
件、2工程目が60件、3工程目が34件と減衰してお
り(4工程と5工程は0)設計品質・テスト方法とも正
常と考えられるが、予実績評価としては1工程目、2工
程目、3工程目はいずれも「△」(第3図参照)となっ
ている。又、減衰係数の目標値は経験値と期待値を加味
して摘出バグ件数が後工程で半減する割合を設定してお
り(第4図参照)、実績評価値は摘出バグ件数と減数係
数の積で表わす。評価工程が2工程目の場合は評価値が
87×0、5(1工程目)と60×1(2工程目)の和
となり、推移評価は「×」(第5図参照)となってい
る。評価工程が3工程目の場合は評価値が87×0、2
5(1工程目)と60×0、5(2工程目)と34×1
(3工程目)の和となり、推移評価は「○」となり、前
述の予実績評価を考慮しても、3工程時点では設計品質
・テスト方法ともにほゞ正常と判定できる。
The target value for the number of extracted bugs is 1 per k step based on experience value
Given 2 cases (301 absolute cases), the test process allocation is 163 cases for the first step, 80 cases for the second step, 40 cases for the third step, and 13 cases for the fourth step. The number of cases and fifth process is set to five. Actually, the first process is 87
There are 60 cases in the 2nd step, 34 cases in the 3rd step (0 in 4th step and 5th step), and both design quality and test method are considered to be normal. The second step and the third step are all “Δ” (see FIG. 3). In addition, the target value of the damping coefficient is set to a rate at which the number of extracted bugs is halved in the subsequent process, taking into account the experience value and the expected value (see Fig. 4). The actual evaluation value is the number of extracted bugs and the reduction coefficient. Express as product. When the evaluation step is the second step, the evaluation value is the sum of 87 × 0, 5 (first step) and 60 × 1 (second step), and the transition evaluation is “x” (see FIG. 5). There is. When the evaluation step is the third step, the evaluation value is 87 × 0, 2
5 (1st process) and 60x0, 5 (2nd process) and 34x1
It becomes the sum of (3rd process) and the transition evaluation becomes “◯”, and it is possible to determine that both the design quality and the test method are almost normal at the time of the 3rd process, even considering the above-mentioned preliminary performance evaluation.

第6図の例によれば、1工程目では予実績評価が「△」
なので、担当設計は摘出バグ内容とテスト(チェック)
方法を検討し、その結果に基いて2工程でのバグ摘出方
針をたて、テスト項目・工数・時間等の追加を行い、1
工程での摘出不足を補う努力をする。2工程目でも予実
績評価が「△」なので同様の検討を行うが、さらに推移
評価が「×」なので、設計品質が悪いモジュールについ
ても見直しを行い、品質向上に努力する。このようにし
て設計品質・テスト方法の評価が自動的に分り易く表示
され、早期テスト工程でのバグ摘出促進に効果がある。
According to the example of FIG. 6, the preliminary performance evaluation is “△” in the first process.
Therefore, the responsible design is the extracted bug content and test (check)
We examined the method, and based on the result, set a bug extraction policy in two steps, added test items, man-hours, time, etc.
Make an effort to compensate for the lack of extraction in the process. Even in the second process, the preliminary performance evaluation is "△", so the same examination is performed, but since the transition evaluation is "x", the module with poor design quality is also reviewed and efforts are made to improve quality. In this way, the evaluation of the design quality / testing method is automatically displayed in an easy-to-understand manner, which is effective in promoting the bug extraction in the early testing process.

〔発明の効果〕〔The invention's effect〕

本発明によれば、ソフトウェアについてテスト工程にお
ける摘出バグ件数の推移の型に基き設計品質・テストの
やり方の異常検知ができるので、テスト工程の早期に対
策を講じて低品質出荷・納期遅延の防止に効果がある。
According to the present invention, it is possible to detect abnormalities in the design quality and testing method based on the transition pattern of the number of extracted bugs in the testing process for software, so measures can be taken early in the testing process to prevent low quality shipments and delivery delays. Has an effect on.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明が適用されるテストシステムの全体ブロ
ック図、第2図は本発明の処理フロー例を示す図、第3
図は不良摘出予実績評価基準の一例を示す図、第4図は
評価値算出係数の一例を示す図、第5図は品質の推移評
価基準の一例を示す図、第6図は本発明による具体例を
示す図、第7図及び第8図はバグ摘出推移が減衰型をと
ることを説明する図である。 10…テスト装置、20…キーボード、30…フロッピ
ィディスク、40…ディスプレイ装置、50…プリンタ
装置。
FIG. 1 is an overall block diagram of a test system to which the present invention is applied, FIG. 2 is a diagram showing an example of a processing flow of the present invention, and FIG.
FIG. 4 is a diagram showing an example of a defect extraction preliminary performance evaluation standard, FIG. 4 is a diagram showing an example of an evaluation value calculation coefficient, FIG. 5 is a diagram showing an example of a quality transition evaluation standard, and FIG. 6 is according to the present invention. FIG. 7, FIG. 7 and FIG. 8 which show a concrete example are diagrams for explaining that the bug extraction transition is of a damping type. 10 ... Test device, 20 ... Keyboard, 30 ... Floppy disk, 40 ... Display device, 50 ... Printer device.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】ソフトウェアを複数回繰り返しテストして
ソフトウェアの品質の評価を自動的に行う方法であっ
て、 ソフトウェアの各テスト工程ごとの摘出バグの目標件数
をメモリに格納しておくとともに、 ソフトウェアの各テスト工程でのバグを摘出し、該摘出
バグの実績件数を前記メモリに格納するステップと、 各テスト工程ごとに、前記メモリに格納された摘出バグ
の実積件数と目標件数とを比較して当該テスト工程を評
価するステップと、 各テスト工程単位に、当該テスト工程に至るまでの各テ
スト工程における摘出バグの実積件数を各テスト工程ご
とに重み付けを変えて加算し、当該テスト工程の品質推
移評価値を算出するステップと、 前記当該テスト工程の品質推移評価値と一つ前のテスト
工程の品質推移評価値とを比較して、当該テスト工程で
のソフトウェアの品質を評価するステップとを 有することを特徴とするソフトウェア品質自動評価方
法。
1. A method for automatically evaluating the quality of software by repeatedly testing the software a plurality of times, wherein the target number of extracted bugs for each test step of the software is stored in a memory, and Of extracting the bugs in each test step and storing the actual number of the extracted bugs in the memory, and comparing the actual number of the extracted bugs and the target number stored in the memory for each test step Then, for each test process unit, the actual number of picked-up bugs in each test process up to the test process is added to each test process by changing the weighting for each test process and adding the test process. And a step of calculating the quality transition evaluation value of the test step, and comparing the quality transition evaluation value of the test process with the quality transition evaluation value of the previous test process. Software Quality automatic evaluation method characterized by a step of evaluating the quality of software in the test process.
JP59279659A 1984-12-29 1984-12-29 Software quality automatic evaluation method Expired - Fee Related JPH0628040B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59279659A JPH0628040B2 (en) 1984-12-29 1984-12-29 Software quality automatic evaluation method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59279659A JPH0628040B2 (en) 1984-12-29 1984-12-29 Software quality automatic evaluation method

Publications (2)

Publication Number Publication Date
JPS61160152A JPS61160152A (en) 1986-07-19
JPH0628040B2 true JPH0628040B2 (en) 1994-04-13

Family

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US12236235B2 (en) 2022-04-28 2025-02-25 17Live Japan Inc. System and method for evaluating software development

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