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JPH0632343B2 - Semiconductor laser - Google Patents
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JPH0632343B2 - Semiconductor laser - Google Patents

Semiconductor laser

Info

Publication number
JPH0632343B2
JPH0632343B2 JP61283286A JP28328686A JPH0632343B2 JP H0632343 B2 JPH0632343 B2 JP H0632343B2 JP 61283286 A JP61283286 A JP 61283286A JP 28328686 A JP28328686 A JP 28328686A JP H0632343 B2 JPH0632343 B2 JP H0632343B2
Authority
JP
Japan
Prior art keywords
quantum
quantum well
wire
layer
region
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61283286A
Other languages
Japanese (ja)
Other versions
JPS63136591A (en
Inventor
普 岩田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP61283286A priority Critical patent/JPH0632343B2/en
Priority to US07/127,015 priority patent/US4802181A/en
Publication of JPS63136591A publication Critical patent/JPS63136591A/en
Publication of JPH0632343B2 publication Critical patent/JPH0632343B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Semiconductor Lasers (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) この発明は、半導体レーザに関するものである。The present invention relates to a semiconductor laser.

(従来の技術) 従来提案された半導体超格子として第2図に断面図で示
すような量子井戸細線構造が広く知られている。線状の
量子井戸領域21と、これをとり囲む量子障壁領域22とか
ら構成されており、量子井戸領域21に閉じ込められた電
子、または正孔は擬1次元状態となり、高性能な半導体
レーザなどへの応用が考えられる(アプライド・フィジ
ィックス・レターズ[Appl.Phys.Lett.]41,(1982)63
5)。
(Prior Art) As a conventionally proposed semiconductor superlattice, a quantum well thin wire structure shown in a sectional view in FIG. 2 is widely known. It is composed of a linear quantum well region 21 and a quantum barrier region 22 that surrounds the quantum well region 21. Electrons or holes confined in the quantum well region 21 become a quasi one-dimensional state, and a high-performance semiconductor laser, etc. (Applied Physics Letters [Appl.Phys.Lett.] 41 , (1982) 63)
Five).

(発明が解決しようとする問題点) しかしながら、このような量子井戸細線構造では、量子
井戸領域21に電子及び正孔を効率的に注入することがで
きず、電流注入による半導体レーザ発振を行なうことが
できないという欠点を有していた。
(Problems to be Solved by the Invention) However, in such a quantum well thin wire structure, electrons and holes cannot be efficiently injected into the quantum well region 21, and semiconductor laser oscillation is performed by current injection. It had the drawback of not being able to.

本発明の目的は、この問題点を解決した量子井戸細線構
造を有する半導体レーザを提供することにある。
An object of the present invention is to provide a semiconductor laser having a quantum well wire structure which solves this problem.

(問題点を解決するための手段) 前述の問題点を解決するために本発明が提供する手段
は、太さが電子のドブロイ波長程度(数10nm)の半導
体からなる量子井戸細線を少なくとも1つ以上有し、前
記量子井戸細線を囲み、厚さが電子のドブロイ波長程度
である層状の第1量子障壁領域を少なくとも1つ以上有
し、前記第1量子障壁領域の上面および下面に隣接して
少なくとも2つ以上の第2量子障壁層を有し、前記第1
量子障壁領域のポテンシャルエネルギーが前記量子井戸
細線のポテンシャルエネルギーよりも高く、また前記第
2量子障壁層のポテンシャルエネルギーが前記第1量子
障壁層のポテンシャルエネルギーよりも高く、前記量子
井戸細線を主たる発光領域とすることを特徴とする。
(Means for Solving the Problems) In order to solve the above problems, the means provided by the present invention is to provide at least one quantum well thin wire made of a semiconductor whose thickness is about the de Broglie wavelength of an electron (tens of nm). And having at least one layered first quantum barrier region surrounding the quantum well thin line and having a thickness of about the de Broglie wavelength of electrons, adjacent to the upper surface and the lower surface of the first quantum barrier region. A first quantum barrier layer having at least two second quantum barrier layers;
The quantum barrier region has a potential energy higher than that of the quantum well wire, the potential energy of the second quantum barrier layer is higher than that of the first quantum barrier layer, and the quantum well wire mainly emits light. It is characterized by

(作用) 上述の構造の半導体レーザでは、第2障壁層から第1障
壁領域に注入されたキャリアは第2障壁層のポテンシャ
ルによって第1障壁領域内に量子力学的に閉じ込められ
た状態となる。このキャリアはバンド内で緩和してい
き、量子井戸細線へと注入されていく。このため、量子
井戸細線での正孔及び電子の密度を高く保つことがで
き、また量子井戸細線内でキャリアが2次元的に閉じ込
められているから、キャリアの再結合がレーザ発振に有
効に寄与する。したがって、本発明の半導体レーザの発
信閾値電流は非常に小さな値となる。
(Operation) In the semiconductor laser having the above structure, carriers injected from the second barrier layer into the first barrier region are quantum mechanically confined in the first barrier region by the potential of the second barrier layer. This carrier relaxes in the band and is injected into the quantum well thin wire. Therefore, the density of holes and electrons in the quantum well wire can be kept high, and the carriers are two-dimensionally confined in the quantum well wire, so that the recombination of carriers effectively contributes to laser oscillation. To do. Therefore, the emission threshold current of the semiconductor laser of the present invention has a very small value.

(実施例) 次に図面を参照して本発明の実施例について説明する。(Example) Next, the Example of this invention is described with reference to drawings.

第1図は本発明の一実施例を示す断面図である。本実施
例はn形GaAsからなる半導体基板10上にn形GaA
sからなるバッファー層11、n形Al0.7 Ga0.3 As
からなるn形クラッド層(厚さ1μm)12、Al0.4
0.6 Asからなる第2量子障壁層(厚さ0.1μm)13
a,13b,Al0.25Ga0.75Asからなる第1量子障壁
層(厚さ30nm)14、GaAsからなる量子井戸線(厚
さ10nm,幅30nm)15、p形Al0.7 Ga0.3 Asか
らなるp形クラッド層(厚さ1μm)16、p形GaAs
からなるキャップ層17、及びp電極18、n電極19を形成
した構造となっている。
FIG. 1 is a sectional view showing an embodiment of the present invention. In this embodiment, an n-type GaAs is formed on a semiconductor substrate 10 made of n-type GaAs.
s buffer layer 11, n-type Al 0.7 Ga 0.3 As
N-type clad layer (thickness 1 μm) 12 consisting of Al 0.4 G
a 0.6 As second quantum barrier layer (thickness 0.1 μm) 13
a, 13b, first quantum barrier layer (thickness 30 nm) 14 made of Al 0.25 Ga 0.75 As, quantum well line made of GaAs (thickness 10 nm, width 30 nm) 15, p-type made of p-type Al 0.7 Ga 0.3 As Clad layer (thickness 1 μm) 16, p-type GaAs
It has a structure in which a cap layer 17 made of, and a p electrode 18 and an n electrode 19 are formed.

半導体結晶成長は、分子線結晶成長法により行なった。
半導体装置10上に、バッファー層11,n形クラッド層1
2,第2量子障壁層13a,第1量子障壁領域14を形成
し、この半導体層構造上に厚さ10nmのGaAs層を結
晶成長し、次に電子ビーム3光法及びイオンビームエッ
チング法により、GaAs層をストライプ状にエッチン
グシ、量子井戸線15を形成した。再び分子線結晶成長法
により、第1量子障壁領域14,第2量子障壁層13b,p
形クラッド層16,キャップ層17を結晶成長し、最後にp
電極18及びn電極19を形成した。
The semiconductor crystal growth was performed by the molecular beam crystal growth method.
On the semiconductor device 10, a buffer layer 11 and an n-type clad layer 1
2. A second quantum barrier layer 13a and a first quantum barrier region 14 are formed, a GaAs layer having a thickness of 10 nm is crystal-grown on this semiconductor layer structure, and then, an electron beam 3 optical method and an ion beam etching method are used. The GaAs layer was etched into stripes to form quantum well lines 15. Again by the molecular beam crystal growth method, the first quantum barrier region 14, the second quantum barrier layer 13b, p
-Shaped clad layer 16 and cap layer 17 are crystal-grown, and finally p
The electrode 18 and the n-electrode 19 were formed.

p電極18,n電極19からそれぞれ注入された正孔及び電
子は、第2量子障壁層13a,13bから第1量子障壁領域
14に注入され、第1量子障壁領域14内に閉じ込められる
が、量子井戸細線15のポテンシャルエネルギーが低いか
ら、量子井戸細線15に流れ込む。量子井戸細線15では正
孔及び電子とも2次元的に閉じこめられ、擬1次元状態
となっているから、それぞれの状態密度は狭いエネルギ
ー領域に集中しており、その再結合スペクトルは非常に
狭い。そこで、第1図の構造では、全てのキャリアがレ
ーザ発振に有効に寄与し、発振閾値電流の非常に小さな
半導体レーザが得られる。
The holes and electrons injected from the p-electrode 18 and the n-electrode 19, respectively, are transferred from the second quantum barrier layers 13a and 13b to the first quantum barrier region.
The quantum well wire 15 is injected into the quantum well wire 14 and is confined in the first quantum barrier region 14. However, since the quantum well wire 15 has a low potential energy, it flows into the quantum well wire 15. In the quantum well wire 15, both holes and electrons are two-dimensionally confined and in a quasi-one-dimensional state, so each density of states is concentrated in a narrow energy region, and its recombination spectrum is very narrow. Therefore, in the structure of FIG. 1, all carriers effectively contribute to laser oscillation, and a semiconductor laser having an extremely small oscillation threshold current can be obtained.

なお、本実施例ではAlGaAs系混晶を用いたが、こ
れに限らず他の半導体混晶を用いても本発明は実現でき
る。
Although the AlGaAs-based mixed crystal is used in this embodiment, the present invention is not limited to this, and the present invention can be realized by using another semiconductor mixed crystal.

また上述の実施例では単層の量子井戸平面を用いたが、
本発明はこれに限らず多層構造の量子井戸構造としても
実施できる。
In the above-mentioned embodiment, a single layer quantum well plane is used,
The present invention is not limited to this, and can be implemented as a quantum well structure having a multilayer structure.

(発明の効果) このように本発明によれば、量子井戸細線にキャリアを
有効に注入でき、発振閾値が小さい高性能な半導体レー
ザを得ることができる。
(Effects of the Invention) As described above, according to the present invention, it is possible to effectively inject carriers into a quantum well wire and obtain a high-performance semiconductor laser with a small oscillation threshold.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例を示す断面図、第2図は従来
の量子井戸細線を示す断面図である。 10……半導体基板、11……バッファー層、12……n形ク
ラッド層、13a,13b……第2量子障壁層、14……第1
量子障壁領域、15……量子井戸細線、16……p形クラッ
ド層、17……キャップ層、18……p電極、19……n電
極、21……量子井戸領域、22……量子障壁領域。
FIG. 1 is a sectional view showing an embodiment of the present invention, and FIG. 2 is a sectional view showing a conventional quantum well thin wire. 10 ... Semiconductor substrate, 11 ... Buffer layer, 12 ... N-type cladding layer, 13a, 13b ... Second quantum barrier layer, 14 ... First
Quantum barrier region, 15 ... quantum well wire, 16 ... p-type cladding layer, 17 ... cap layer, 18 ... p-electrode, 19 ... n-electrode, 21 ... quantum well region, 22 ... quantum barrier region .

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】太さが電子とドブロイ波長程度の半導体か
らなる量子井戸細線を少なくとも1つ以上有し、前記量
子井戸細線を囲み、厚さが電子のドブロイ波長程度であ
る層状の第1量子障壁領域を少なくとも1つ以上有し、
前記第1量子障壁領域の上面および下面に隣接して少な
くとも2つ以上の第2量子障壁層を有し、前記第1量子
障壁領域のポテンシャルエネルギーが前記量子井戸細線
のポテンシャルエネルギーよりも高く、また前記第2量
子障壁層のポテンシャルエネルギーが前記第1量子障壁
層のポテンシャルエネルギーよりも高く、前記量子井戸
細線を主たる発光領域とすることを特徴とする半導体レ
ーザ。
1. A layered first quantum having at least one quantum well wire made of a semiconductor having a thickness of about an electron and a de Broglie wavelength, surrounding the quantum well wire, and having a thickness of about the de Broglie wavelength of an electron. At least one barrier region,
Adjacent to the upper surface and the lower surface of the first quantum barrier region, at least two second quantum barrier layers are provided, the potential energy of the first quantum barrier region is higher than the potential energy of the quantum well wire, and A semiconductor laser, wherein the potential energy of the second quantum barrier layer is higher than the potential energy of the first quantum barrier layer, and the quantum well thin wire is a main light emitting region.
JP61283286A 1986-11-27 1986-11-27 Semiconductor laser Expired - Lifetime JPH0632343B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP61283286A JPH0632343B2 (en) 1986-11-27 1986-11-27 Semiconductor laser
US07/127,015 US4802181A (en) 1986-11-27 1987-11-27 Semiconductor superlattice light emitting sevice

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61283286A JPH0632343B2 (en) 1986-11-27 1986-11-27 Semiconductor laser

Publications (2)

Publication Number Publication Date
JPS63136591A JPS63136591A (en) 1988-06-08
JPH0632343B2 true JPH0632343B2 (en) 1994-04-27

Family

ID=17663476

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61283286A Expired - Lifetime JPH0632343B2 (en) 1986-11-27 1986-11-27 Semiconductor laser

Country Status (1)

Country Link
JP (1) JPH0632343B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06273A (en) * 1992-06-22 1994-01-11 Brother Ind Ltd Lower thread remaining amount detector for sewing machine
JPH0631079A (en) * 1992-07-15 1994-02-08 Brother Ind Ltd Bobbin thread remaining amount detecting device for sewing machine
US5788171A (en) * 1995-07-12 1998-08-04 Juki Corporation Method and apparatus for detecting residual bobbin thread in a sewing machine

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07118560B2 (en) * 1985-08-12 1995-12-18 株式会社日立製作所 Semiconductor structure and manufacturing method thereof
JPS6289383A (en) * 1985-10-16 1987-04-23 Matsushita Electric Ind Co Ltd semiconductor laser
JPS62140485A (en) * 1985-12-16 1987-06-24 Hitachi Ltd Semiconductor structure and manufacture thereof

Also Published As

Publication number Publication date
JPS63136591A (en) 1988-06-08

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