Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPH0636435B2 - Light emitting diode - Google Patents
[go: Go Back, main page]

JPH0636435B2 - Light emitting diode - Google Patents

Light emitting diode

Info

Publication number
JPH0636435B2
JPH0636435B2 JP15509883A JP15509883A JPH0636435B2 JP H0636435 B2 JPH0636435 B2 JP H0636435B2 JP 15509883 A JP15509883 A JP 15509883A JP 15509883 A JP15509883 A JP 15509883A JP H0636435 B2 JPH0636435 B2 JP H0636435B2
Authority
JP
Japan
Prior art keywords
light emitting
doped
layer
emitting layer
barrier layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP15509883A
Other languages
Japanese (ja)
Other versions
JPS6047475A (en
Inventor
憲彦 鎌田
正勝 岡田
規矩男 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Japan Broadcasting Corp
Original Assignee
Japan Broadcasting Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Japan Broadcasting Corp filed Critical Japan Broadcasting Corp
Priority to JP15509883A priority Critical patent/JPH0636435B2/en
Publication of JPS6047475A publication Critical patent/JPS6047475A/en
Publication of JPH0636435B2 publication Critical patent/JPH0636435B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80Constructional details
    • H10H20/81Bodies
    • H10H20/811Bodies having quantum effect structures or superlattices, e.g. tunnel junctions
    • H10H20/812Bodies having quantum effect structures or superlattices, e.g. tunnel junctions within the light-emitting regions, e.g. having quantum confinement structures

Landscapes

  • Led Devices (AREA)

Description

【発明の詳細な説明】 本発明は、光ファイバ伝送システムなどの光源として用
いられる半導体発光ダイオードに関し、さらに詳述すれ
ば、光出力直線性,発光効率を低下させることなく変調
帯域を広げるよう構成した光通信用ダブルヘテロ接合発
光ダイオードに関する。
The present invention relates to a semiconductor light emitting diode used as a light source for an optical fiber transmission system or the like. More specifically, it is configured to widen a modulation band without degrading linearity of light output and luminous efficiency. And a double heterojunction light emitting diode for optical communication.

従来、光ファイバ伝送用の光源としては半導体レーザダ
イオード(Laser Dilde,以下LDと略す)や、発光ダイ
オード(Light Emitting Diode,以下LEDと略す)が用
いられている。このLEDはLDに比して光出力,変調
帯域の点で劣るが信頼性,経済性に優れ、反射光による
動作不安定性がないという利点を持つ。従って、従来か
ら数MHz〜100MHz程度であった変調帯域が光出力直線
性ないし発光効率を損うことなく1,000MHz以上に改善
されれば、多チャンネル画像信号のアナログ伝送用光源
としてLEDは極めて有望となる。
Conventionally, as a light source for optical fiber transmission, a semiconductor laser diode (Laser Dilde, hereinafter abbreviated as LD) and a light emitting diode (Light Emitting Diode, hereinafter abbreviated as LED) have been used. This LED is inferior to the LD in light output and modulation band, but has the advantages that it is excellent in reliability and economy, and there is no operational instability due to reflected light. Therefore, if the modulation band, which has been about several MHz to 100 MHz in the past, is improved to 1,000 MHz or more without deteriorating the linearity of light output or luminous efficiency, the LED is very promising as a light source for analog transmission of multi-channel image signals. Becomes

LEDの広帯域化は、 (1)高注入による方法 (2)高ドープによる方法 の2つの方法により行うことができる。Broadening of the band of the LED can be performed by two methods: (1) high injection method (2) high doping method.

上述した(1)の方法は、発光層に多数キャリア密度(ド
ープにより供給)以上の過剰少数キャリアを注入するこ
とにより、発光再結合寿命を短縮させるものである。し
かし、この方法は低注入電流領域において変調帯域が狭
く、大信号変調時に非線形歪をもたらす。
The method (1) described above shortens the radiative recombination life by injecting excess minority carriers having a majority carrier density (supplied by doping) or more into the light emitting layer. However, this method has a narrow modulation band in the low injection current region and causes nonlinear distortion during large signal modulation.

また、(2)の方法は注入キャリア密度以上の多数キャリ
アを予めドープにより発光層に入れておくもので、変調
帯域は注入電流に依存せず低歪特性を得ることができ
る。しかし、ドープ量を増すと結晶中に結晶欠陥が増
え、この結晶欠陥が非発光再結合中心となるので、発光
効率が低下するという欠点を持つ。
Further, in the method (2), majority carriers having an injection carrier density or higher are previously doped into the light emitting layer, and the modulation band does not depend on the injection current, and low distortion characteristics can be obtained. However, when the doping amount is increased, crystal defects increase in the crystal, and these crystal defects serve as non-radiative recombination centers, so that there is a drawback that the luminous efficiency decreases.

このように、多チャンネルアナログ伝送に必要な光出
力,直線性を維持しつつ、しかも広帯域化を達成するこ
とは、従来の方法では困難であった。
As described above, it has been difficult with the conventional method to achieve a wide band while maintaining the optical output and linearity required for multi-channel analog transmission.

そこで、本発明の目的は、光出力直線性,発光効率を低
下させることなく、広い変調帯域特性を備えた発光ダイ
オードを提供することにある。
Therefore, an object of the present invention is to provide a light emitting diode having a wide modulation band characteristic without deteriorating the linearity of light output and the light emission efficiency.

かかる目的を達成するために、本発明ではダブルヘテロ
接合を有する発光ダイオードにおいて、発光層と障壁層
とを交互に複数層設けて活性層を構成し、発光層の厚さ
を電子の量子力学的広がりと同程度とし、かつ障壁層に
はドープ原子を高ドープするとともに、ドープキャリア
に対して発光層のポテンシャルを障壁層のポテンシャル
よりも低くなるように発光層と障壁層の禁止帯域を互に
異ならしめて量子井戸構造とすることにより、ドープキ
ャリアを発光層に蓄積させ、ドープ原子に起因する非発
光再結合中心とドープキャリアとを空間的に分離するよ
う構成する。
In order to achieve such an object, in the present invention, in a light-emitting diode having a double heterojunction, a plurality of light-emitting layers and barrier layers are alternately provided to form an active layer, and the thickness of the light-emitting layer is determined by electron quantum mechanical The width is almost the same as that of the diffusion, and the barrier layer is highly doped with doped atoms, and the forbidden band of the light emitting layer and the barrier layer are mutually isolated so that the potential of the light emitting layer is lower than the potential of the barrier layer with respect to the doped carriers. By making the quantum well structure different from each other, the doped carriers are accumulated in the light emitting layer, and the non-radiative recombination centers caused by the doped atoms are spatially separated from the doped carriers.

以下に、図面を参照して本発明を詳細に説明する。Hereinafter, the present invention will be described in detail with reference to the drawings.

第1図は、従来のLDまたはLEDのダブルヘテロ接合
構造を示す。ここで、(ア)はn型クラッド層,(イ)
は活性層,(ウ)はp型クラッド層,(エ)はドープ原
子(室温にてイオン化),(オ)はドープキャリア(ド
ープ原子のイオン化により発生)である。すなわち、活
性層(イ)はnおよびp型クラッド層((ア)および
(ウ))に挟まれており、ドープ原子(エ)およびドー
プ原子から供給されたドープキャリア(オ)は共に活性
層にある。この場合、活性層が発光層として動作する
が、ドープ原子に起因する非発光再結合中心が発光層内
に発生するため、ドープおよび注入キャリアがこれに捕
獲され、発光効率が低下する。なお、活性層の厚さは0.
1〜0.2μm程度であり、p型としてある。
FIG. 1 shows a conventional LD or LED double heterojunction structure. Here, (a) is an n-type clad layer, (a)
Is an active layer, (c) is a p-type cladding layer, (d) is a doped atom (ionized at room temperature), and (e) is a doped carrier (generated by ionization of the doped atom). That is, the active layer (a) is sandwiched between n-type and p-type clad layers ((a) and (c)), and the doped atoms (d) and the doped carriers (e) supplied from the doped atoms are both active layers. It is in. In this case, the active layer acts as a light emitting layer, but since non-radiative recombination centers due to the doped atoms are generated in the light emitting layer, the doped and injected carriers are trapped in the light emitting layer, and the luminous efficiency is reduced. The thickness of the active layer is 0.
It is about 1 to 0.2 μm and is of p-type.

第2図は本発明に係るダブルヘテロ接合構造の一実施例
を示すエネルギーバンド図である。
FIG. 2 is an energy band diagram showing an embodiment of the double heterojunction structure according to the present invention.

第3図は第2図の一部領域Aを詳細に拡大して示したも
のである。
FIG. 3 is an enlarged view showing a partial area A of FIG. 2 in detail.

ここで、(エ)はドープ原子,(カ)は量子井戸型発光
層(非ドープ),(キ)は障壁層の非ドープ領域,
(ク)は障壁層の高ドープ領域,(ケ)はドープ原子の
イオン化により発生し、量子井戸型発光層(カ)に蓄積
されたドープキャリアを示す。
Here, (d) is a doped atom, (f) is a quantum well type light emitting layer (undoped), (ki) is an undoped region of a barrier layer,
(H) indicates a highly doped region of the barrier layer, and (H) indicates a doped carrier generated by ionization of the doped atoms and accumulated in the quantum well type light emitting layer (F).

発光層の厚さを電子の量子力学的広がり(〜100Å)程
度に薄くすると、電子は層厚方向には自由に運動するこ
とができず、エネルギーは量子化された離散的準位をと
るようになる。このような薄い発光層またはその配列を
量子井戸構造または多重量子井戸構造と呼ぶ。発光層
(カ)にはドープ原子をドープせず、障壁層(ク)のみ
に高いドープを行う(変調ドープ法)と、ドープ原子か
ら供給されるドープキャリア(ケ)は障壁層よりポテン
シャルの低い発光層に蓄積されるのでドープ原子に起因
する非発光再結合中心とドープキャリアとを空間的に分
離することができる。従って、ドープおよび注入キャリ
アは非発光再結合中心に捕獲されることがなく、効率の
よい発光動作をすることができる。
When the thickness of the light emitting layer is reduced to the quantum mechanical extent of electrons (~ 100Å), the electrons cannot move freely in the layer thickness direction, and the energy seems to have quantized discrete levels. become. Such a thin light emitting layer or an array thereof is called a quantum well structure or a multiple quantum well structure. When the light emitting layer (f) is not doped with dope atoms and only the barrier layer (h) is highly doped (modulation doping method), the doped carriers (ke) supplied from the doped atoms have a lower potential than the barrier layer. Since they are accumulated in the light emitting layer, the non-radiative recombination center caused by the doped atoms and the doped carrier can be spatially separated. Therefore, the doped and injected carriers are not captured by the non-radiative recombination centers, and efficient light emission operation can be performed.

なお、第1図に示した活性層(イ)にドープ原子をドー
プした場合には、n型クラッド層(ア)と活性層(イ)
の境界は空乏層となっており、ドープキャリアは空乏層
を通ってn型クラッド層に移動することはできず、また
ドープキャリアに対するポテンシャルはp型クラッド層
(ウ)の方が高いので、活性層(イ)とp型クラッド層
(ウ)との間のヘテロ接合面を通ってドープキャリアは
移動することができない。
When the active layer (a) shown in FIG. 1 is doped with dope atoms, the n-type cladding layer (a) and the active layer (a) are
Is a depletion layer, the doped carriers cannot move to the n-type clad layer through the depletion layer, and the potential for the doped carrier is higher in the p-type clad layer (c). Doped carriers cannot move through the heterojunction surface between the layer (a) and the p-type cladding layer (c).

さらに、第3図に示すように高ドープ障壁層(ク)の発
光層との境界部分にドープ原子をドープしない非ドープ
領域(キ)を設ける。このように非ドープ領域(キ)を
入れるのは、高ドープによって障壁層(ク)内に結晶欠
陥が生じ、これに起因する非発光再結合中心が発光層
(カ)の界面に達するのを防止するためであり、その厚
さは100Å程度またはそれ以下が望ましい。
Further, as shown in FIG. 3, an undoped region (K) in which the doped atoms are not doped is provided at the boundary between the highly doped barrier layer (K) and the light emitting layer. The inclusion of the undoped region (K) in this way prevents crystal defects in the barrier layer (K) due to high doping, and the non-radiative recombination centers caused by this to reach the interface of the light emitting layer (F). This is to prevent this, and its thickness is preferably around 100Å or less.

これまでドープ原子がアクセプタの場合について述べた
が、ドープ原子がドナーの場合についても本発明を同様
に適用できることは明らかである。
Although the case where the doped atom is the acceptor has been described so far, it is obvious that the present invention can be similarly applied to the case where the doped atom is the donor.

第4図は、上述の如く、ドープ原子としてドナーを用い
た場合の量子井戸構造エネルギーバンド図を示す。ここ
で、図示した各々の記号(カ),(キ),(ク)…は第
3図で述べたとおりである。
FIG. 4 shows a quantum well structure energy band diagram when a donor is used as a doped atom as described above. Here, the respective symbols (f), (ki), (h), ... Shown are as described in FIG.

次に、障壁層については、(1)その厚さを電子波動関数
の拡がりよりも十分厚くとることにより、各発光層間の
結合をなくすようにしてもよいし、あるいは逆に、(2)
障壁層の厚さを薄くして発光層間に結合をもたせるよう
にしてもよい。この場合の構造を超格子構造と呼ぶ。
Next, for the barrier layer, (1) the thickness may be made sufficiently thicker than the spread of the electron wave function to eliminate the coupling between the light emitting layers, or conversely, (2)
The thickness of the barrier layer may be reduced so as to have a bond between the light emitting layers. The structure in this case is called a superlattice structure.

以上述べたことから明らかなように、本発明は上述した
(2)の方法、すなわち、高ドープにより変調帯域を拡げ
ようとするものである。
As is apparent from the above, the present invention has been described above.
The method (2), that is, the one in which the modulation band is widened by high doping is attempted.

すなわち、本発明を実施することによりドープ原子に起
因する非発光再結合中心とドープキャリアとを空間的に
分離することができる。このようにすると、発光層には
高密度のドープキャリアだけが存在するので、よりよい
直線性(低歪特性)および広帯域特性が得られる。一
方、非発光再結合を通して発光効率の低下をもたらすド
ープ原子は障壁層にあるので、発光層での発光効率を低
下させることがない。また、発光はドープ原子によって
内部吸収を受けることなく効果的に外部へ到達する。従
って、従来は高ドープの欠点であった発光効率の低下が
ドープ原子およびそれに起因する非発光再結合中心とド
ープキャリアとの空間的分離によって解消し、発光効率
を低下させることなく広帯域化を図ることができる。
That is, by carrying out the present invention, it is possible to spatially separate the non-radiative recombination center caused by the doped atoms and the doped carrier. In this case, since only high-density doped carriers are present in the light emitting layer, better linearity (low distortion characteristic) and wider band characteristic can be obtained. On the other hand, since the doped atoms that cause a decrease in light emission efficiency through non-radiative recombination are in the barrier layer, the light emission efficiency in the light emitting layer is not reduced. Further, the emitted light effectively reaches the outside without being internally absorbed by the doped atoms. Therefore, the decrease in emission efficiency, which has been a drawback of high doping in the past, is solved by the spatial separation of the doped carrier and the non-radiative recombination center caused by it and the doped carrier, and a broad band is achieved without reducing the emission efficiency. be able to.

次に、第5図および第6図を用いて、障壁層の厚さを変
えた場合の効果について述べる。第5図において、破線
(コ)は通常自由電子の状態密度,(サ)は量子井戸内
電子の状態密度を示す。また、第6図において、(シ)
は超格子構造で形成されたキャリアの副バンドを示す。
Next, the effect of changing the thickness of the barrier layer will be described with reference to FIGS. 5 and 6. In FIG. 5, the broken line (U) indicates the density of states of free electrons, and (S) indicates the density of electrons of electrons in the quantum well. Moreover, in FIG.
Indicates a subband of carriers formed in a superlattice structure.

既述のように障壁層の厚さを電子波動関数の拡がりより
も十分厚くした場合、キャリアの状態密度は第5図
(サ)の如く、ステップ状になる。その結果、発光スペ
クトル幅は狭くなる。これは、光ファイバの分散による
帯域制限を緩和するという付随的利点をもたらす。
As described above, when the thickness of the barrier layer is made sufficiently thicker than the spread of the electron wave function, the density of states of carriers becomes stepwise as shown in FIG. As a result, the emission spectrum width becomes narrow. This has the attendant benefit of easing bandwidth limitations due to optical fiber dispersion.

これとは逆に、障壁層を薄くして発光層間に結合をもた
せた場合には、結合により第6図(シ)のような副バン
ドが形成されるので、発光スペクトル幅は第5図の場合
ほど狭くならないが、キャリアは副バンド内を動くこと
ができるので、少数キャリアの注入効率が改善される。
On the contrary, when the barrier layer is thinned to have a bond between the light emitting layers, a sub band as shown in FIG. 6C is formed by the bonding, and thus the emission spectrum width is as shown in FIG. Although not as narrow as in the case, carriers can move within the sub-band, thus improving the injection efficiency of minority carriers.

次にGaAs/AlGaAs多重量子井戸構造を例とし
て本発明と従来例との比較を示す。半絶縁性GaAs(1
00)基板上に厚さ0.47μmのGaAsバッファ層および
厚さ0.10μmのAl0.22Ga0.78As層を順次形成し、そ
の上に厚さ100ÅのGaAs井戸層と厚さ500ÅのAl0.22
Ga0.78As障壁層を10周期積層した多重量子井戸を形
成し、さらに上層に厚さ200ÅのGaAs層を形成し
た。各層の形成はMBE法によった。このような多重量子
井戸構造について、本発明に従って障壁層にのみ選択的
にSiをドープした場合と、従来例と同様に発光層(井戸
層)と障壁層に一様にSiをドープした2種類の試料を
作り、それらのキャリア密度、再結合寿命および発光強
度をシリコンドープ量の関数として測定した。第7図に
その結果を示す。図において、横軸はシリコンのドープ
量をセル温度Tsiの逆数として示してある。図中、S
Dで示す曲線は本発明に従って障壁層にのみSiをドー
プした場合、UDで示す曲線はSiを一様にドープした
場合である。障壁層にも発光層にも一様に不純物をドー
プした場合に比較して、障壁層にのみ不純物をドープし
た場合には、キャリア濃度(Ns)をより大きくするこ
とができ、それに応じて発光再結合寿命(τ)を短くで
き、発光出力の低下の傾向も小さいことを示している。
Next, a comparison between the present invention and the conventional example will be shown by taking a GaAs / AlGaAs multiple quantum well structure as an example. Semi-insulating GaAs (1
00) A GaAs buffer layer having a thickness of 0.47 μm and an Al 0.22 Ga 0.78 As layer having a thickness of 0.10 μm are sequentially formed on a substrate, and a GaAs well layer having a thickness of 100 Å and an Al 0.22 having a thickness of 500 Å are formed thereon.
A multiple quantum well in which Ga 0.78 As barrier layers were laminated for 10 periods was formed, and a GaAs layer having a thickness of 200 Å was further formed on the upper layer. Each layer was formed by the MBE method. Regarding such a multi-quantum well structure, two types of the case where the barrier layer is selectively doped with Si according to the present invention and the case where the light emitting layer (well layer) and the barrier layer are uniformly doped with Si as in the conventional example are provided. Samples were prepared and their carrier density, recombination lifetime and emission intensity were measured as a function of the amount of silicon doping. The results are shown in FIG. In the figure, the horizontal axis represents the doping amount of silicon as the reciprocal of the cell temperature T si . In the figure, S
The curve indicated by D is the case where only the barrier layer is doped with Si according to the present invention, and the curve indicated by UD is the case where Si is uniformly doped. Compared to the case where the barrier layer and the light emitting layer are uniformly doped with impurities, the carrier concentration (Ns) can be further increased when the barrier layer is doped with impurities only, and the light emission is accordingly increased. This shows that the recombination lifetime (τ) can be shortened and the tendency of the decrease in emission output is small.

以上説明したとおり、本発明によれば、量子井戸構造ま
たは超格子構造と変調ドープ法とを組み合わせることに
よりドープ原子およびそれに起因する非発光再結合中心
とドープキャリアとを空間的に分離し、もって発光の低
歪特性および広帯域特性を得ると同時に高発光効率の維
持を図ることができる。さらに、本発明を実施すること
により光ファイバ伝送用の高品質光源や光集積回路内光
源の作製が可能となる。
As described above, according to the present invention, the quantum well structure or the superlattice structure and the modulation doping method are combined to spatially separate the doped atom and the non-radiative recombination center caused by the doped carrier from each other, and It is possible to obtain low distortion characteristics and wide band characteristics of light emission and at the same time maintain high light emission efficiency. Further, by implementing the present invention, it becomes possible to manufacture a high quality light source for optical fiber transmission and a light source in an optical integrated circuit.

【図面の簡単な説明】[Brief description of drawings]

第1図は通常のダブルヘテロ接合構造発光素子における
エネルギーバンド(電流注入時)と、ドープ原子の位置
を示す図、 第2図および第3図は本発明による量子井戸構造発光素
子のエネルギーバンド図、 第4図はドープ原子がドナーである場合の量子井戸構造
エネルギーバンド図、 第5図は量子井戸構造におけるステップ状態密度を示す
線図、 第6図は超格子構造および副バンドの形成を説明するエ
ネルギーバンド図、 第7図は本発明による発光ダイオードのキャリア密度,
再結合寿命および発光強度を従来例と比較して示す特性
図である。 ア…n型クラッド層、 イ…活性層、 ウ…p型クラッド層、 エ…ドープ原子(室温でイオン化)、 オ…ドープキャリア(ドープ原子のイオン化で発生)、 カ…量子井戸型発光層(非ドープ)、 キ…障壁層の非ドープ領域、 ク…障壁層の高ドープ領域、 ケ…ドープ原子のイオン化で発生し、量子井戸型発光層
に蓄積されたドープキャリア、 コ…通常自由電子の状態密度、 サ…量子井戸内電子の状態密度、 シ…超格子構造で形成されたキャリアの副バンド。
FIG. 1 is a diagram showing an energy band (at the time of current injection) and a position of a doped atom in an ordinary double heterojunction structure light emitting device, and FIGS. 2 and 3 are energy band diagrams of a quantum well structure light emitting device according to the present invention. , FIG. 4 is an energy band diagram of a quantum well structure when a doped atom is a donor, FIG. 5 is a diagram showing a step density of states in a quantum well structure, and FIG. 6 is an explanation of formation of a superlattice structure and subbands. FIG. 7 is an energy band diagram showing
It is a characteristic view which shows a recombination lifetime and emission intensity compared with a prior art example. A ... n-type clad layer, a ... active layer, c ... p-type clad layer, d ... doped atom (ionized at room temperature), o ... doped carrier (generated by ionization of doped atom), c ... quantum well type light emitting layer ( Undoped), ki ... undoped region of barrier layer, heavily doped region of barrier layer, doped carrier accumulated in quantum well type light emitting layer by ionization of doped atoms, co ... usually free electrons Density of states, sub-state density of electrons in quantum wells, sub-bands of carriers formed in super-lattice structure.

フロントページの続き (72)発明者 小林 規矩男 東京都世田谷区砧1丁目10番11号 日本放 送協会放送科学基礎研究所内 (56)参考文献 J.Electro chem.so c.SOLID−STATE SCIEN CE AND TECHNOLOGY.F ebruary 1981,P.400〜P.410Continuation of the front page (72) Norio Kobayashi Inventor Norio Nobayashi 1-10-11 Kinuta, Setagaya-ku, Tokyo Inside the Institute of Broadcast Science, Japan Broadcasting Corporation (56) References J. Electro chem. so c. SOLID-STATE SCIEN CE AND TECHNOLOGY. F ebook 1981, P.F. 400-P. 410

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】ダブルヘテロ接合を有する発光ダイオード
において、 発光層と障壁層とを交互に複数層設けて活性層を構成
し、 前記発光層の厚さを電子の量子力学的広がりと同程度と
し、かつ前記障壁層にはドープ原子を高ドープするとと
もに、ドープキャリアに対して前記発光層のポテンシャ
ルを前記障壁層のポテンシャルよりも低くなるように前
記発光層および前記障壁層の禁止帯域を互に異ならしめ
て量子井戸構造とすることにより、前記ドープキャリア
を前記発光層に蓄積させ、 前記ドープ原子に起因する非発光再結合中心と前記ドー
プキャリアとを空間的に分離するよう構成したことを特
徴とする発光ダイオード。
1. In a light emitting diode having a double heterojunction, an active layer is formed by alternately providing a plurality of light emitting layers and barrier layers, and the thickness of the light emitting layer is made approximately the same as the quantum mechanical spread of electrons. In addition, the barrier layer is heavily doped with doped atoms, and the band gaps of the light emitting layer and the barrier layer are mutually isolated so that the potential of the light emitting layer is lower than the potential of the barrier layer with respect to doped carriers. By making the quantum well structure different from each other, the doped carriers are accumulated in the light emitting layer, and the non-radiative recombination centers caused by the doped atoms are spatially separated from the doped carriers. Light emitting diode.
【請求項2】前記活性層を超格子構造としたことを特徴
とする特許請求の範囲第1項記載の発光ダイオード。
2. The light emitting diode according to claim 1, wherein the active layer has a superlattice structure.
【請求項3】前記障壁層の発光層との境界部分に、ドー
プ原子に起因する非発光再結合中心の発光層への拡散防
止用非ドープ領域を設けたことを特徴とする特許請求の
範囲第1項または第2項に記載の発光ダイオード。
3. A non-doped region for preventing diffusion of a non-radiative recombination center caused by a doped atom into the light emitting layer, is provided at a boundary portion of the barrier layer with the light emitting layer. The light emitting diode according to item 1 or 2.
JP15509883A 1983-08-26 1983-08-26 Light emitting diode Expired - Lifetime JPH0636435B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15509883A JPH0636435B2 (en) 1983-08-26 1983-08-26 Light emitting diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15509883A JPH0636435B2 (en) 1983-08-26 1983-08-26 Light emitting diode

Publications (2)

Publication Number Publication Date
JPS6047475A JPS6047475A (en) 1985-03-14
JPH0636435B2 true JPH0636435B2 (en) 1994-05-11

Family

ID=15598579

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15509883A Expired - Lifetime JPH0636435B2 (en) 1983-08-26 1983-08-26 Light emitting diode

Country Status (1)

Country Link
JP (1) JPH0636435B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0732269B2 (en) * 1985-10-11 1995-04-10 オムロン株式会社 Semiconductor light emitting element
JPS62216278A (en) * 1986-03-17 1987-09-22 Nec Corp Semiconductor light-emitting element

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
J.Electrochem.soc.SOLID−STATESCIENCEANDTECHNOLOGY.February1981,P.400〜P.410

Also Published As

Publication number Publication date
JPS6047475A (en) 1985-03-14

Similar Documents

Publication Publication Date Title
KR100486803B1 (en) Selfluminous display device
US6525335B1 (en) Light emitting semiconductor devices including wafer bonded heterostructures
JP4505147B2 (en) Semiconductor structure and processing method using group III nitride quaternary material system with little phase separation
JP2004031770A (en) Nitride semiconductor light emitting device
JPH11307866A (en) Nitride compound semiconductor laser element
US20020041613A1 (en) Semiconductor laser device and opticlal fiber amplifier using the same
JP3399216B2 (en) Semiconductor light emitting device
US6437362B2 (en) Avalanche photodiode
JP4288030B2 (en) Semiconductor structure using group III nitride quaternary material system
JP4825269B2 (en) Method and structure of germanium laser on silicon
JP2006040998A (en) Semiconductor light emitting device, epitaxial wafer for semiconductor light emitting device
JP4836382B2 (en) Light emitting element
JP2004186678A (en) Nitride semiconductor light emitting device
JP2817710B2 (en) Semiconductor laser
JPH09199783A (en) Semiconductor light emitting element
JP2000133884A (en) Quantum well structure light-emitting device
JPH0636435B2 (en) Light emitting diode
JP2661576B2 (en) Semiconductor light emitting device
JPH10242585A (en) Semiconductor light emitting device
JPH09172197A (en) Semiconductor light emitting device
JP3033625B2 (en) Quantized Si optical semiconductor device
JP3470074B2 (en) Optical semiconductor device
JPH07321409A (en) Semiconductor laser device
JP2624588B2 (en) Compound semiconductor laser
US6635502B1 (en) Method of manufacturing semiconductor optical devices