JPH0637708B2 - Chemical polishing method for aluminum or its alloy - Google Patents
Chemical polishing method for aluminum or its alloyInfo
- Publication number
- JPH0637708B2 JPH0637708B2 JP27864486A JP27864486A JPH0637708B2 JP H0637708 B2 JPH0637708 B2 JP H0637708B2 JP 27864486 A JP27864486 A JP 27864486A JP 27864486 A JP27864486 A JP 27864486A JP H0637708 B2 JPH0637708 B2 JP H0637708B2
- Authority
- JP
- Japan
- Prior art keywords
- chemical polishing
- aluminum
- carboxyl group
- sulfide
- acid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
- C23F3/02—Light metals
- C23F3/03—Light metals with acidic solutions
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- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- ing And Chemical Polishing (AREA)
Description
【発明の詳細な説明】 [産業上の利用分野] この発明はアルミニウムまたはその合金の化学研磨方
法、特に脱スマット処理を必要としない化学研磨方法に
関するものである。The present invention relates to a chemical polishing method for aluminum or its alloys, and more particularly to a chemical polishing method that does not require desmutting treatment.
[従来の技術] 近年、工場排水中の燐、窒素分の低減が技術改善の課題
になっており、アルミニウムの化学研磨工業も排水中の
燐、窒素の除去が必要になっている。[Prior Art] In recent years, reduction of phosphorus and nitrogen contents in factory wastewater has been a subject of technical improvement, and the chemical polishing industry for aluminum also needs to remove phosphorus and nitrogen in wastewater.
排水中の燐の除去は比較的容易であるが、窒素は生物学
的処理が一般的であり、処理設備の規模が大きく、操業
に当り管理項目が多く窒素分除去のためのコストが大き
いのが問題である。このため窒素の排水処理を必要とし
ない、つまり窒素源としての硝酸を使用しない化学研磨
工程が必要となっている。Phosphorus in wastewater is relatively easy to remove, but biological treatment of nitrogen is common, the scale of treatment equipment is large, and there are many control items in operation, so the cost for removing nitrogen is large. Is a problem. Therefore, there is a need for a chemical polishing process that does not require wastewater treatment of nitrogen, that is, does not use nitric acid as a nitrogen source.
アルミニウム又はその合金の化学研磨液としては、従来
より燐酸−硝酸系、燐酸−硫酸−硝酸系が広く工業的に
使用されている。これらの化学研磨液は硝酸を含むため
廃液の脱窒素処理が必要であり、この観点からすれば不
適当となる。これら以外に工業的に広く使用されている
アルミニウム又はその合金の化学研磨液として燐酸−硫
酸系があり、この硝酸を含まない化学研磨液を用いる方
法であっても従来は化学研磨工程で硝酸含有量40〜50%
の液で脱スマット処理をする必要があり、排水中の窒素
分を除去することは避けられなかった。とくに化学研磨
工程の前に行なう脱スマット処理は不可欠であり、これ
を省略したい場合、燐酸−硫酸系化学研磨液では、苛性
脱脂処理によってすでに付着しているスマットの影響で
被研磨面にピットが発生したり、過度のエッチングで処
理面の外観が著しく悪くなるという欠点があった。As a chemical polishing liquid for aluminum or its alloys, phosphoric acid-nitric acid system and phosphoric acid-sulfuric acid-nitric acid system have been widely used industrially. Since these chemical polishing liquids contain nitric acid, it is necessary to denitrify the waste liquid, which is unsuitable from this viewpoint. In addition to these, there is phosphoric acid-sulfuric acid system as a chemical polishing liquid for industrially widely used aluminum or its alloys. Quantity 40-50%
It was necessary to perform desmutting treatment with the above solution, and it was unavoidable to remove the nitrogen content in the wastewater. In particular, desmutting treatment performed before the chemical polishing step is indispensable, and if it is desired to omit it, phosphoric acid-sulfuric acid-based chemical polishing liquid will cause pits on the surface to be polished due to the effect of smut that has already adhered due to caustic degreasing treatment. However, there is a drawback that the appearance of the treated surface remarkably deteriorates due to the occurrence of excessive etching.
[発明が解決しようとする問題点] この発明は、従来技術の上記問題点を解消するため、脱
スマット処理を必要としないアルミニウムまたはその合
金の化学研磨方法を提供しようとするものである。[Problems to be Solved by the Invention] In order to solve the above problems of the prior art, the present invention aims to provide a chemical polishing method for aluminum or its alloys that does not require desmutting treatment.
例えば、従来法に続いて陽極酸化工程までを示すと、苛
性脱脂−水洗−脱スマット(40〜50%硝酸)−水洗−化
学研磨−水洗−陽極酸化工程を経過するのに対して、こ
の発明の方法によれば苛性脱脂−水洗−化学研磨−水洗
−陽極酸化工程となり、従来法における苛性脱脂後の工
程から2工程の省略を可能にしようとするものである。For example, the conventional method followed by an anodizing step shows that the steps of caustic degreasing-water washing-desmutting (40 to 50% nitric acid) -water washing-chemical polishing-water washing-anodizing step are performed. According to the method of (1), the steps are caustic degreasing-water washing-chemical polishing-water washing-anodizing step, which makes it possible to omit two steps from the steps after caustic degreasing in the conventional method.
[問題点を解決するための手段] 上記問題点を解決するためのこの発明は、アルミニウム
またはその合金を苛性脱脂処理、水洗後、カルボキシル
基を有するチオフェン誘導体とカルボキシル基を有する
スルフィドまたはジスルフィド化合物をそれぞれ 0.001
〜0.5 wt%、銅またはニッケルイオンを 0.001〜1.0 wt
%含有する燐酸−硫酸系化学研磨液で処理するアルミニ
ウムまたはその合金の化学研磨方法である。[Means for Solving the Problems] In order to solve the above problems, the present invention relates to a method in which aluminum or an alloy thereof is subjected to caustic degreasing treatment, washed with water, and then treated with a thiophene derivative having a carboxyl group and a sulfide or disulfide compound having a carboxyl group. 0.001 each
~ 0.5 wt%, 0.001 ~ 1.0 wt% copper or nickel ion
% Of a phosphoric acid-sulfuric acid-based chemical polishing liquid for chemical treatment of aluminum or its alloy.
上記燐酸−硫酸系化学研磨液は 85%燐酸 50〜80wt% 98%硫酸 20〜50wt% からなるものである。The phosphoric acid-sulfuric acid type chemical polishing liquid is composed of 85% phosphoric acid 50-80 wt% 98% sulfuric acid 20-50 wt%.
上記カルボキシル基を有するチオフェン誘導体とカルボ
キシル基を有するスルフィドまたはジスルフィド化合物
を化学研磨浴に添加することにより、苛性脱脂処理後、
脱スマット処理を行なわない場合でも被研磨面上に発生
するピットの数が著しく減少した。このために脱スマッ
ト処理を必要としないアルミニウムまたはその合金の化
学研磨が可能になった。しかし、これら2種の添加剤を
それぞれ単独で化学研磨液に添加した場合、上記の様な
効果は得られるが弱い。これら2種の添加剤を併用する
事により、相乗的な効果が得られた。After the caustic degreasing treatment by adding the thiophene derivative having a carboxyl group and the sulfide or disulfide compound having a carboxyl group to the chemical polishing bath,
Even without desmutting treatment, the number of pits generated on the surface to be polished was significantly reduced. This has made it possible to chemically polish aluminum or its alloys without the need for desmutting. However, when these two kinds of additives are individually added to the chemical polishing liquid, the above effect is obtained but it is weak. A synergistic effect was obtained by using these two additives together.
本発明の方法において、化学研磨液における上記チオフ
ェン誘導体及びスルフィドまたはジスルフィドの作用機
構について詳細な説明はまだ明らかではないが、苛性脱
脂処理によってすぐに析出しているスマットに対して
は、チオフェン誘導体及びスルフィド又はジスルフィド
分子内のカルボキシル基とチオフェン誘導体及びスルフ
ィドまたはジスルフィド分子内の硫黄が相互的に作用
し、このスマットによる悪影響、例えばピットの発生、
過度のエッチングなどを防止する作用をしていると推定
される。In the method of the present invention, a detailed description of the action mechanism of the thiophene derivative and the sulfide or disulfide in the chemical polishing liquid is not yet clear, but for the smut immediately precipitated by caustic degreasing treatment, the thiophene derivative and The carboxyl group in the sulfide or disulfide molecule interacts with the thiophene derivative and sulfur in the sulfide or disulfide molecule, and adverse effects due to this smut, such as pit generation,
It is presumed that it acts to prevent excessive etching.
また、アルミニウムまたはその合金から化学研磨液中に
溶出する微量金属成分は、スルフィドまたはジスルフィ
ド化合物の分子内のカルボキシル基によって捕捉され、
被研磨面上への再析出が防止される。In addition, trace metal components eluted from aluminum or its alloys into the chemical polishing liquid are captured by the carboxyl group in the molecule of the sulfide or disulfide compound,
Reprecipitation on the surface to be polished is prevented.
本発明ではチオフェン単体又は、カルボキシル基以外の
官能基を有するチオフェン誘導体では、この様な効果は
なく、一方スルフィドまたはジスルフィド化合物以外の
カルボキシル基を有する化合物でもこのような効果が見
られない。また、カルボキシル基以外の官能基を有する
スルフィドまたはジスルフィド化合物でも効果がなく、
これらの化合物を2種類以上任意に併用した場合もまた
効果がない。In the present invention, thiophene alone or a thiophene derivative having a functional group other than a carboxyl group does not have such an effect, while compounds having a carboxyl group other than a sulfide or disulfide compound do not have such an effect. Further, a sulfide or disulfide compound having a functional group other than a carboxyl group has no effect,
Even if two or more kinds of these compounds are arbitrarily used in combination, there is no effect.
したがって、本発明ではカルボキシル基を有するチオフ
ェン誘導体とカルボキシル基を有するスルフィドまたは
ジスルフィドの併用が必須である。Therefore, in the present invention, the combined use of a thiophene derivative having a carboxyl group and a sulfide or disulfide having a carboxyl group is essential.
本発明で用いるチオフェン誘導体は、その分子内にカル
ボキシル基を有するものであり、 で表される。R1は炭素数 0〜3 の脂肪族基である。The thiophene derivative used in the present invention has a carboxyl group in its molecule, It is represented by. R 1 is an aliphatic group having 0 to 3 carbon atoms.
ここで、チオフェン又はチオフェンにカルボキシル基以
外の官能基が付いたもの、たとえば 2−アミノチオフェ
ンなどは沸点が低いため、浴温90〜110 ℃の化学研磨液
の添加剤としては不適当である。Here, thiophene or thiophene having a functional group other than a carboxyl group attached thereto, such as 2-aminothiophene, has a low boiling point and is therefore unsuitable as an additive for a chemical polishing liquid having a bath temperature of 90 to 110 ° C.
本発明で用いられるカルボキシル基を有するチオフェン
誘導体は具体的には下記の化合物が例示される。しか
し、これらの例示物に限定されるものではない。Specific examples of the thiophene derivative having a carboxyl group used in the present invention include the following compounds. However, it is not limited to these examples.
チオフェンカルボン酸 又は チオフェン酢酸 2−チオフェン酪酸 が挙げられる。Thiophenecarboxylic acid Or Thiophene acetic acid 2-thiophenebutyric acid Is mentioned.
一方、スルフィドまたはジスルフィドは分子内にカルボ
キシル基を有するものであるが、カルボキシル基以外の
官能基、例えばヒドロキシル基、アミノ基などが存在し
ていてもよい。しかし、カルボキシル基が存在せず、上
記官能基のみの場合、例えばチオジエチレングリコー
ル、シスタミンでは上記効果は奏さない。On the other hand, the sulfide or disulfide has a carboxyl group in the molecule, but a functional group other than the carboxyl group, such as a hydroxyl group or an amino group, may be present. However, in the case where there is no carboxyl group and only the above functional group, for example, thiodiethylene glycol or cystamine, the above effect is not exhibited.
また、スルフィドまたはジスルフィドのアルキル部分
は、脂肪族基である。具体的には下記の化合物が例示さ
れるが本発明で用いられる化合物がこれらの例示物に限
定されるものではなく、このカルボキシル基のナトリウ
ム、カリウムなどの塩類も含まれる。Also, the alkyl portion of the sulfide or disulfide is an aliphatic group. Specifically, the following compounds are exemplified, but the compounds used in the present invention are not limited to these exemplified compounds, and salts such as sodium and potassium of this carboxyl group are also included.
(1) S(硫黄原子)を挟んで左右対称な構造を有するス
ルフィドまたはジスルフィドであり、一般式(HOOC
−R2)2Sまたは(HOOC−R3−S)2で表わさ
れ、R2、R3が炭素数 1〜4 の脂肪族基又はR2、R
3のHが置換された基であるスルフィド又はジスルフィ
ド、例えば、 チオジグリコール酸 S(−CH2−COOH)2 3,3′−チオジプロピオン酸 S(−CH2−CH2−COOH)2 ジチオジグリコール酸 (−S−CH2−COOH)2 ジチオジプロピオン酸 (−S−CH2−CH2−COOH)2 α,α′−ジチオジプロピオン酸 チオジコハク酸 シスチン (2) 非対称のスルフィドであり、一般式が R4−S − R
5−COOHで表わされ、R4、R5が炭素数 1〜3 の脂肪
族基またはR4、R5のHが置換された基であるスルフ
ィド、例えば、 カルボキシメチルメルカプトコハク酸 メチオニン が挙げられる。(1) A sulfide or disulfide having a bilaterally symmetrical structure with S (sulfur atom) in between, and has the general formula (HOOC
-R 2) represented by the 2 S or (HOOC-R 3 -S) 2 , R 2, R 3 is an aliphatic group, or R 2 having 1 to 4 carbon atoms, R
Sulfide or disulfide in which H of 3 is a substituted group, for example, thiodiglycolic acid S (—CH 2 —COOH) 2 3,3′-thiodipropionic acid S (—CH 2 —CH 2 —COOH) 2 dithioglycolic acid (-S-CH 2 -COOH) 2 dithiodipropionic acid (-S-CH 2 -CH 2 -COOH ) 2 α, α'- dithiodipropionic acid Thiodisuccinic acid Cystine (2) It is an asymmetric sulfide and has a general formula of R 4 -S-R.
A sulfide represented by 5- COOH, wherein R 4 and R 5 are an aliphatic group having 1 to 3 carbon atoms or a group in which H of R 4 and R 5 is substituted, for example, carboxymethylmercaptosuccinic acid Methionine Is mentioned.
燐酸−硫酸系化学研磨浴に対する上記チオフェン誘導体
及びスルフィドまたはジスルフィドの添加量はそれぞれ
0.001〜0.5 wt%である。 0.001wt%未満では効果がな
く、苛性脱脂によって生じたスマットのために、化学研
磨後の処理面にピットが数多く発生し、外観が悪くなっ
た。また、 0.5wt%を越えた量添加しても効果が向上せ
ず、経済的に無駄である。The amounts of the above thiophene derivative and sulfide or disulfide added to the phosphoric acid-sulfuric acid chemical polishing bath are respectively
It is 0.001 to 0.5 wt%. If it is less than 0.001 wt%, it has no effect, and because of the smut generated by caustic degreasing, many pits are generated on the treated surface after chemical polishing, and the appearance deteriorates. Moreover, the effect is not improved even if added in an amount exceeding 0.5 wt%, which is economically wasteful.
上記2種の添加剤と共に添加される銅またはニッケルイ
オンは光沢剤としての効果を奏するもので、具体的な化
合物としては酸化物、無機酸塩、有機酸塩として添加さ
れる。例えば、酸化銅、酸化ニッケル、硫酸銅、硫酸ニ
ッケル、硝酸銅、硝酸ニッケル、酢酸銅、酢酸ニッケル
等が用いられる。Copper or nickel ions added together with the above two kinds of additives have an effect as a brightening agent, and specific compounds are added as oxides, inorganic acid salts and organic acid salts. For example, copper oxide, nickel oxide, copper sulfate, nickel sulfate, copper nitrate, nickel nitrate, copper acetate, nickel acetate, etc. are used.
添加量は、従来例と同じく、銅またはニッケルイオンと
して 0.001〜1.0wt %であり、 0.001wt%未満では効果
がなく、 1.0wt%を越えても効果の向上が期待できない
ばかりでなく、エッチング作用が現われて処理した金属
面が梨地になることもある。As in the conventional example, the amount added is 0.001 to 1.0 wt% as copper or nickel ions. If it is less than 0.001 wt%, there is no effect. Occasionally, the treated metal surface may become satin.
[実施例] 以下、実施例によって本発明を具体的に説明する。な
お、実施例に記載の各成分の量はすべて重量%である。[Examples] Hereinafter, the present invention will be specifically described with reference to Examples. In addition, the amounts of the respective components described in the examples are all% by weight.
実施例1 研磨液の組成 85%燐酸 60% 98%硫酸 39.5% 硫酸ニッケル 0.1% 水 0.4% 上記液に金属アルミニウムを 1%溶解し、 100℃の比重
を 1.700とした基本浴に、各種チオフェン誘導体とスル
フィドまたはジスルフィドそれぞれ0.05%を添加したも
のであり、比較例は添加剤が1種類の場合、 0.1%添加
し、2種類の場合は、それぞれ0.05%とした。Example 1 Composition of Polishing Solution 85% Phosphoric Acid 60% 98% Sulfuric Acid 39.5% Nickel Sulfate 0.1% Water 0.4% Metallic aluminum 1% was dissolved in the above solution, and various thiophene derivatives were added to a basic bath having a specific gravity of 1.700 at 100 ° C. And 0.05% each of sulfide and disulfide. In Comparative Examples, 0.1% was added when one kind of additive was used, and 0.05% was added when two kinds of additives were used.
化学研磨は、浴温度 100℃、浸漬時間30秒とし、苛性脱
脂後の脱スマット処理を行なわないでAA1100アルミニウ
ムまたは5052アルミニウムを化学研磨した結果を第1表
に示す。The chemical polishing was carried out at a bath temperature of 100 ° C. for an immersion time of 30 seconds, and the results of chemical polishing of AA1100 aluminum or 5052 aluminum without desmutting treatment after caustic degreasing are shown in Table 1.
上記結果からカルボキシル基を含有する本発明のチオフ
ェン誘導体とスルフィドまたはジスルフィドを燐酸−硫
酸系化学研磨浴に添加することにより一般的な脱スマッ
ト処理を要する化学研磨の処理面の状態と同等又はそれ
以上になることが判る。又、カルボキシル基を有するチ
オフェン誘導体、カルボキシル基を有するスルフィド又
はジスルフィドのいずれか一方のみの添加では、僅かの
効果しか認められず、カルボキシル基を有するチオフェ
ン誘導体とカルボキシル基以外の官能基を有するスルフ
ィド又はジスルフィドを併用した場合も相乗効果の無い
ことが判る。 From the above results, the thiophene derivative of the present invention containing a carboxyl group and a sulfide or disulfide are added to a phosphoric acid-sulfuric acid-based chemical polishing bath to obtain a surface equivalent to or more than the state of the surface for chemical polishing which requires general desmutting treatment. It turns out that Further, a thiophene derivative having a carboxyl group, the addition of only one of the sulfide or disulfide having a carboxyl group, only a small effect is observed, thiophene derivative having a carboxyl group and a sulfide having a functional group other than the carboxyl group or It can be seen that there is no synergistic effect even when disulfide is used together.
実施例2 チオフェン誘導体及びスルフィドまたはジスルフィドの
適当な添加量を決定するために、上記実施例1に示した
基本浴にチオフェン酢酸とチオジプロピオン酸の添加量
をそれぞれ変えて例1と同じ処理条件でAA1100アルミニ
ウムを化学研磨し、その処理面の状態を第1表の表示法
で下記第2表に示す。Example 2 In order to determine an appropriate addition amount of a thiophene derivative and a sulfide or a disulfide, the same treatment conditions as in Example 1 were used except that the addition amounts of thiophene acetic acid and thiodipropionic acid were changed to the basic bath shown in Example 1 above. The AA1100 aluminum is chemically polished by the above, and the state of the treated surface is shown in the following Table 2 by the notation method of Table 1.
上記結果から明らかなように、添加量 0.001%で少し効
果があるが、2種類の添加剤の内、どちらかが0.05%の
場合、一方の添加剤は 0.005%を越えて添加されても効
果の向上を期待できないことが判る。 As is clear from the above results, the addition amount of 0.001% has some effect, but when one of the two types of additives is 0.05%, the effect is obtained even if one of the additives exceeds 0.005%. It turns out that the improvement of the can not be expected.
実施例3 実施例1の基本浴に 2−チオフェンカルボン酸とチオジ
グリコール酸をそれぞれ0.05%添加した本発明の化学研
磨浴と従来の化学研磨浴をAA1100アルミニウムを試料と
して、実施例1と同じ条件で化学研磨して比較した。Example 3 The same chemical polishing bath of the present invention prepared by adding 0.05% of 2-thiophenecarboxylic acid and thiodiglycolic acid to the basic bath of Example 1 and the conventional chemical polishing bath using AA1100 aluminum as the sample were the same as those of Example 1. Chemical polishing was performed under the conditions and comparison was made.
その結果を第3表に示す。The results are shown in Table 3.
上記結果から明らかなように、本発明の化学研磨液は脱
スマット処理をしない場合でも、脱スマット処理をした
場合と同程度の優れた処理面が得られることが判る。 As is clear from the above results, it can be seen that the chemical polishing liquid of the present invention can obtain a treated surface that is as excellent as that obtained by the desmutting treatment, even without the desmutting treatment.
[発明の効果] 以上説明したように、本発明の方法によればアルミニウ
ムまたはその合金を化学研磨するに当り、苛性脱脂処理
の後、脱スマット処理をしないでも優れた化学研磨面を
得ることができる。[Effects of the Invention] As described above, according to the method of the present invention, in chemically polishing aluminum or its alloy, after performing caustic degreasing treatment, an excellent chemically polished surface can be obtained without desmutting treatment. it can.
Claims (1)
理、水洗後、カルボキシル基を有するチオフェン誘導体
とカルボキシル基を有するスルフィドまたはジスルフィ
ド化合物をそれぞれ0.001〜0.5wt%、銅またはニッケル
イオンを0.001〜1.0wt%含有する燐酸−硫酸系化学研磨
液で処理することを特徴とするアルミニウムまたはその
合金の化学研磨方法。1. Aluminum or its alloy is subjected to caustic degreasing treatment and washed with water, and then 0.001 to 0.5 wt% of a thiophene derivative having a carboxyl group and a sulfide or disulfide compound having a carboxyl group, and 0.001 to 1.0 wt% of a copper or nickel ion. A method of chemically polishing aluminum or an alloy thereof, which comprises treating with a phosphoric acid-sulfuric acid-based chemical polishing liquid contained.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27864486A JPH0637708B2 (en) | 1986-11-25 | 1986-11-25 | Chemical polishing method for aluminum or its alloy |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27864486A JPH0637708B2 (en) | 1986-11-25 | 1986-11-25 | Chemical polishing method for aluminum or its alloy |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63134675A JPS63134675A (en) | 1988-06-07 |
| JPH0637708B2 true JPH0637708B2 (en) | 1994-05-18 |
Family
ID=17600149
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27864486A Expired - Lifetime JPH0637708B2 (en) | 1986-11-25 | 1986-11-25 | Chemical polishing method for aluminum or its alloy |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0637708B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100389228C (en) * | 2005-05-27 | 2008-05-21 | 佛山市顺德区汉达精密电子科技有限公司 | a polishing compound |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102677064A (en) * | 2011-03-09 | 2012-09-19 | 汉达精密电子(昆山)有限公司 | Additive for two-acid polishing of aluminum alloy |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5534866B2 (en) | 2010-03-02 | 2014-07-02 | 東芝燃料電池システム株式会社 | HYDROGEN GENERATOR AND ITS START-UP METHOD, FUEL CELL SYSTEM AND ITS START-UP METHOD |
-
1986
- 1986-11-25 JP JP27864486A patent/JPH0637708B2/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5534866B2 (en) | 2010-03-02 | 2014-07-02 | 東芝燃料電池システム株式会社 | HYDROGEN GENERATOR AND ITS START-UP METHOD, FUEL CELL SYSTEM AND ITS START-UP METHOD |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100389228C (en) * | 2005-05-27 | 2008-05-21 | 佛山市顺德区汉达精密电子科技有限公司 | a polishing compound |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63134675A (en) | 1988-06-07 |
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