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JPH0641109B2 - Polishing tool for disk substrate processing - Google Patents
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JPH0641109B2 - Polishing tool for disk substrate processing - Google Patents

Polishing tool for disk substrate processing

Info

Publication number
JPH0641109B2
JPH0641109B2 JP8524284A JP8524284A JPH0641109B2 JP H0641109 B2 JPH0641109 B2 JP H0641109B2 JP 8524284 A JP8524284 A JP 8524284A JP 8524284 A JP8524284 A JP 8524284A JP H0641109 B2 JPH0641109 B2 JP H0641109B2
Authority
JP
Japan
Prior art keywords
disk substrate
modulus
magnetic disk
young
polishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP8524284A
Other languages
Japanese (ja)
Other versions
JPS60232878A (en
Inventor
眞成 三橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP8524284A priority Critical patent/JPH0641109B2/en
Publication of JPS60232878A publication Critical patent/JPS60232878A/en
Publication of JPH0641109B2 publication Critical patent/JPH0641109B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Polishing Bodies And Polishing Tools (AREA)
  • Manufacturing Of Magnetic Record Carriers (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、例えば磁気ヘッドが微小すきまで安定浮揚可
能な高精度平面磁気ディスク基板を獲得するための研磨
工具に関する。
Description: TECHNICAL FIELD The present invention relates to a polishing tool for obtaining a high-precision flat magnetic disk substrate, for example, in which a magnetic head can be stably levitated to a very small clearance.

(従来技術とその問題点) 一般に、磁気ディスク基板は記録媒体の種類に対応して
アルミニウム合金面またはアルミニウム合金面上に形成
された非磁性ニッケル・リンめっき面あるいはアルミニ
ウム合金面上に形成された陽極酸化面を高精度平面に研
磨加工したものが用いられる。
(Prior Art and Its Problems) Generally, a magnetic disk substrate is formed on an aluminum alloy surface or a non-magnetic nickel-phosphorus-plated surface formed on the aluminum alloy surface or an aluminum alloy surface corresponding to the type of recording medium. The anodized surface is used as a highly precise flat surface.

磁気ディスク装置においては高速回転する磁気ディスク
面上に浮揚する磁気ヘッドの浮揚量が小さければ小さい
ほど高い記録密度と大きな出力が得られる。
In the magnetic disk device, the smaller the floating amount of the magnetic head that floats on the surface of the magnetic disk that rotates at a high speed, the higher the recording density and the larger the output that can be obtained.

このため、通常のコーティング磁気ディスクにおける磁
気ヘッドの浮揚量が0.4〜0.5μであるのに対して、高密
度磁気ディスク(例えば、メッキまたはスパッタ法によ
る薄膜媒体ディスク)では磁気ヘッドの浮揚量は0.2μ
mときわめて微小なすきまで磁気ヘッドを浮揚させてい
る。
Therefore, the levitation amount of a magnetic head in a normal coated magnetic disk is 0.4 to 0.5 μ, whereas the levitation amount of a magnetic head is 0.2 in a high density magnetic disk (for example, a thin film medium disk formed by plating or sputtering). μ
The magnetic head is levitated to a very small gap of m.

このように磁気ヘッドの浮揚量の微小化に伴なって磁気
ディスク基板の平面精度を改善する必要がある。磁気ヘ
ッドはその支持に板バネを用いているので、磁気ディス
ク基板面上の長周期うねりに磁気ヘッドは追随できる。
しかし、磁気ディスク基板面上の短周期(1周期が磁気
ヘッド長さの3倍以下)のうねりに対しては磁気ヘッド
の追随が困難である。このため、磁気ディスク基板面上
の短周期のうねり高さは磁気ヘッド浮揚量の20%以
下、すなわち浮揚量0.2μmの時、短周期のうねり高さ
は0.04μm以下の高精度に加工する必要がある。第1図
は研磨加工前の磁気ディスク基板11のうねり部断面を表
わしたものである。基板11のうねりは長周期うねり12上
に短周期うねり13がのった形となっており、この短周期
うねり13が研磨加工により除去する必要がある。
As described above, it is necessary to improve the plane accuracy of the magnetic disk substrate as the flying height of the magnetic head is reduced. Since the magnetic head uses a leaf spring for supporting the magnetic head, the magnetic head can follow long-period waviness on the surface of the magnetic disk substrate.
However, it is difficult for the magnetic head to follow waviness of a short cycle (one cycle is three times or less the length of the magnetic head) on the surface of the magnetic disk substrate. Therefore, the short-period undulation height on the magnetic disk substrate surface is 20% or less of the magnetic head levitation amount, that is, when the levitation amount is 0.2 μm, the short-period undulation height is 0.04 μm or less. There is. FIG. 1 shows a cross section of the waviness of the magnetic disk substrate 11 before polishing. The waviness of the substrate 11 has a shape in which a short-period waviness 13 is placed on a long-period waviness 12, and this short-period waviness 13 needs to be removed by polishing.

従来から一般的に金属材料の研磨には鋳鉄ラップが用い
られており(例えば精密工作便覧),磁気ディスク基板
の研磨工具としても鋳鉄ラップ(剛体研磨工具)が採用
されてきた。しかし、剛体研磨工具を用いて磁気ディス
ク基板21を研磨加工した場合、第2図に示すように長
周期うねりのピーク部に位置する短周期うねり22は剛
体研磨工具と加圧接触して除去されるが、長周期うねり
の谷部に位置する短周期うねり23は加工量が長周期う
ねり高さ(ピーク部と谷部の差)より小さい時は除去さ
れるず残る欠点がある。このため、鋳鉄ラップのごとき
剛体研磨工具を用いて磁気ディスク基板を研磨する場合
は、加工量を長周期うねり高さ値より大きくする必要が
あるので加工時間が長くなり、生産性が低くなるという
欠点があり、必ずしも十分満足できるものではない。
Conventionally, cast iron wraps have been generally used for polishing metal materials (for example, Precision Machinery Handbook), and cast iron wraps (rigid body polishing tools) have also been used as polishing tools for magnetic disk substrates. However, when the magnetic disk substrate 21 is polished by using a rigid polishing tool, the short-period undulations 22 located at the peaks of the long-period undulations are removed by pressure contact with the rigid polishing tool as shown in FIG. However, the short-period undulations 23 located in the valleys of the long-period undulations have a drawback that they are not removed and remain when the amount of processing is smaller than the height of the long-period undulations (difference between peak and valley). For this reason, when polishing a magnetic disk substrate using a rigid polishing tool such as cast iron wrap, it is necessary to make the processing amount larger than the long cycle waviness height value, resulting in a longer processing time and lower productivity. It has drawbacks and is not always satisfactory.

(発明の目的) 本発明はこのような従来の欠点を除去せしめて、少ない
加工量で効率的にディスク基板の短周期うねりを修正・
除去するための研磨工具を提供することを目的とする。
(Object of the Invention) The present invention eliminates such conventional defects, and efficiently corrects short cycle undulations of a disk substrate with a small processing amount.
An object is to provide an abrasive tool for removal.

(発明の構成) 本発明によれば、工具台上にヤング率の小さい弾性体
(ヤング率E<10g/mm2)を設け、前記弾性体上
に研磨面が平坦であって小片分割され弾性体と材質が異
なるヤング率の大きい硬質研磨体(ヤング率E>10
g/mm2)を設けたことを特徴とするディスク基板加工
用研磨工具が得られる。
(Structure of the Invention) According to the present invention, an elastic body having a small Young's modulus (Young's modulus E <10 3 g / mm 2 ) is provided on the tool base, and the polishing surface is flat on the elastic body and divided into small pieces. And a hard abrasive body with a large Young's modulus that is different from the elastic body (Young's modulus E> 10 4
A polishing tool for processing a disk substrate is obtained which is characterized by having g / mm 2 ).

(本発明の作用・原理) 磁気ディスク基板のうねり部高さがaでうねり部の横
幅がlであるとき、研磨工具を用いて平面研磨した場
合、加工量hとうねり部高さaとの関係は理論的に式
(1)で表わすことができる。
(Operation / Principle of the Present Invention) When the height of the undulation portion of the magnetic disk substrate is a 0 and the lateral width of the undulation portion is 1, when the surface is polished with a polishing tool, the processing amount h and the undulation portion height a are Is a theoretical formula
It can be represented by (1).

ただし、pは平均加工圧力,Eは磁気ディスク基板の
ヤング率,Eは研磨工具のヤング率,νは磁気ディ
スク基板のポアソン比,νは研磨工具のポアソン比で
ある。
Here, p is the average processing pressure, E 1 is the Young's modulus of the magnetic disk substrate, E 2 is the Young's modulus of the polishing tool, ν 1 is the Poisson's ratio of the magnetic disk substrate, and ν 2 is the Poisson's ratio of the polishing tool.

第3図は第6図に示すところの弾性的性質を有する3種
の研磨工具を用いて、磁気ディスク基板(表面Ni-Pメッ
キ面)の短周期うねり(横幅l=15mm,高さa=0.
5μm)を平面研磨したときの加工量とうねり部高さと
の関係を式(1)を用いて計算し(計算結果を実線で示
す)、それを実験値と比較した結果を表わす。第3図か
らわかるように、ヤング率の小さい研磨工具AまたはB
を用いた場合では、平面研磨を行なっても磁気ディスク
基板の短周期うねり部高さは少ししか修正されない。と
ころが、ヤング率の大きい研磨工具Cを用いた時は磁気
ディスク基板短周期うねり部高さは大幅に修正・除去さ
れ、加工量2μmにおいて短周期うねり部高さ0.02μm
が達成される。
FIG. 3 shows short cycle waviness (width 1 = 15 mm, height a 0 ) of a magnetic disk substrate (surface Ni-P plated surface) using three kinds of polishing tools having elastic properties shown in FIG. = 0.
The relationship between the amount of work and the height of the waviness at the time of surface polishing (5 μm) is calculated using the formula (1) (calculation result is shown by a solid line), and the result is compared with the experimental value. As can be seen from FIG. 3, polishing tool A or B having a small Young's modulus
In the case of using, the height of the short-period waviness of the magnetic disk substrate is slightly modified even if the surface is polished. However, when the polishing tool C having a large Young's modulus was used, the height of the short-period waviness on the magnetic disk substrate was significantly corrected and removed, and the height of the short-period waviness was 0.02 μm at the processing amount of 2 μm.
Is achieved.

しかしながら、先に第2図を用いて説明した現象、すな
わち、磁気ディスク基板の長周期うねり部の谷部が研磨
されない現象が、ヤング率の大きい研磨工具Cを用いて
加工量を少なく研磨した時に起きた。
However, the phenomenon described above with reference to FIG. 2, that is, the phenomenon in which the valleys of the long-period waviness of the magnetic disk substrate are not polished, is caused when polishing with a polishing tool C having a large Young's modulus with a small amount of processing. woke up.

次に、本発明によるところの、ヤング率の小さい弾性体
(ヤング率E<103g/mm2)上に研磨面が平坦であって小
片分割され弾性体と材質が異なるヤング率の大きい硬質
研磨体(ヤング率E>104g/mm2)を設けたことを特徴と
する研磨工具の作用・原理について述べる。先に第3図
を用いて述べたように、ヤング率の大きい研磨体(ヤン
グ率E>104g/mm2)を研磨工具として用いた場合、 磁気ディスク基板の短周期うねり部高さは修正される。
このヤング率の大きい研磨体(ヤング率E>104g/mm2
を小片分割してヤング率の小さい弾性体(ヤング率E<
103g/mm2)上に設けることにより、小片分割されたヤン
グ率の大きい研磨体面はヤング率の小さい弾性体の変形
により、磁気ディスク基板の長周期うねりに追随しつ
つ、短周期うねり部を修正・除去することが可能とな
る。これにより、ヤング率の大きい研磨工具を用いた場
合に磁気ディスク基板の長周期うねり部の谷部が研磨さ
れないという従来の問題点が解決される。
Next, according to the present invention, a hard material having a large Young's modulus different in material from the elastic body having a flat polishing surface and being divided into small pieces on an elastic body having a small Young's modulus (Young's modulus E <10 3 g / mm 2 ). The operation and principle of a polishing tool characterized by having a polishing body (Young's modulus E> 10 4 g / mm 2 ) will be described. As described above with reference to FIG. 3, when a polishing body having a large Young's modulus (Young's modulus E> 10 4 g / mm 2 ) is used as a polishing tool, the height of the short cycle waviness of the magnetic disk substrate is Will be fixed.
This polished body with a large Young's modulus (Young's modulus E> 10 4 g / mm 2 )
Is divided into small pieces, and an elastic body with a small Young's modulus (Young's modulus E <
10 3 g / mm 2 ), the surface of the polished body with a large Young's modulus divided into small pieces follows the long-period waviness of the magnetic disk substrate due to the deformation of the elastic body with a small Young's modulus, Can be corrected or removed. This solves the conventional problem that the valley of the long-period waviness of the magnetic disk substrate is not polished when a polishing tool having a large Young's modulus is used.

(実施例) 以下本発明の実施例について図面を参照して詳細に説明
する。第4図は本発明の一実施例を示す断面図で、工具
台41上にヤング率の小さいポリウレタン(ヤング率E
=2×102g/mm2)42を接着し、さらにポリウレタン4
2上に小片分割されたヤング率の大きい砥石(ヤング率
=4×104g/mm2)43を接着した研磨工具である。前記
研磨工具を用い、磁気ディスク基板(表面Ni-Pメッキ
面)を一例として平均加工圧力250g/mm2,平均相対速度
20m/mmの加工条件で研磨加工した。
(Example) Hereinafter, an example of the present invention will be described in detail with reference to the drawings. FIG. 4 is a sectional view showing an embodiment of the present invention, in which polyurethane having a small Young's modulus (Young's modulus E 2
= 2 × 10 2 g / mm 2 ) 42, and polyurethane 4
It is a polishing tool in which a grindstone with a large Young's modulus (Young's modulus E 2 = 4 × 10 4 g / mm 2 ) 43, which is divided into small pieces, is adhered to the upper part of 2. An average processing pressure of 250 g / mm 2 and an average relative speed, using the above-mentioned polishing tool, using a magnetic disk substrate (surface Ni-P plated surface) as an example.
Polished under the processing conditions of 20 m / mm.

(発明の効果) 本発明の研磨工具を用いて、前記加工条件により磁気デ
ィスク基板(表面Ni-Pメッキ面)ほ研磨加工した結果、
第5図に示すように磁気ディスク基板51の長周期うねり
上の短周期うねり部を効率的に除去できた。磁気ディス
ク基板うねり部の測定結果により、加工前に短周期うね
り部高さ0.3μmあったものが平均加工量で1.5μm研磨
したところ、短周期うねり部高さは0.02μmとなり、高
精度基板が達成されたことを確認した。第5図におい
て、52は加工前の磁気ディスク基板うねりを、53は加工
後の磁気ディスク基板うねりを、そして54は加工量分布
をそれぞれ示しており、磁気ディスク基板の長周期うね
りに追随しつつ、短周期うねり部が修正・除去されてい
る。本実施例によって加工した磁気ディスク面上に磁気
ヘッドを0.2μmの微小すきまで安定浮揚させることが
できた。
(Effect of the invention) As a result of polishing the magnetic disk substrate (surface Ni-P plated surface) under the above processing conditions using the polishing tool of the present invention,
As shown in FIG. 5, the short-period undulations on the long-period undulations of the magnetic disk substrate 51 could be efficiently removed. According to the measurement results of the magnetic disk substrate undulation, the short cycle undulation height of 0.3 μm before processing was polished by 1.5 μm with the average processing amount, and the short cycle undulation height was 0.02 μm. I confirmed that it was achieved. In FIG. 5, reference numeral 52 shows the undulation of the magnetic disk substrate before processing, 53 shows the undulation of the magnetic disk substrate after processing, and 54 shows the distribution of the processing amount, which follow the long-period undulation of the magnetic disk substrate. , The short cycle undulations have been corrected / removed. It was possible to stably levitate the magnetic head on the surface of the magnetic disk processed according to this example to a minute clearance of 0.2 μm.

以上説明したように、ヤング率の小さい弾性体(ヤング
率E<10g/mm2)上に小片分割されたヤング率の
大きい研磨体(ヤング率E>10g/mm2)を設けた
研磨工具を用いて、磁気ディスク基板を加工することに
より、磁気ヘッドが微小すきまで安定浮揚可能な高精度
平面磁気ディスク基板を能率よく獲得できる利点があ
る。
As described above, the elastic body having a small Young's modulus (Young's modulus E <10 3 g / mm 2 ) is provided with the abrasive body having a large Young's modulus (Young's modulus E> 10 4 g / mm 2 ) divided into small pieces. By processing the magnetic disk substrate with the polishing tool, there is an advantage that the magnetic head can efficiently obtain a highly accurate flat magnetic disk substrate capable of stably levitating even a minute clearance.

なお、実施例では磁気ディスク基板について説明したが
光ディスク等他のディスク基板の研磨においても同様の
効果を示すことはいうまでもない。
It should be noted that the magnetic disk substrate has been described in the embodiment, but it goes without saying that the same effect can be obtained in polishing of another disk substrate such as an optical disk.

【図面の簡単な説明】[Brief description of drawings]

第1図は研磨加工前の磁気ディスク基板のうねりを示す
基板部分断面図、第2図は剛体研磨工具で磁気ディスク
基板を加工した場合の基板部分断面図、第3図は第6図
に示す研磨工具で加工した場合の加工量と基板短周期う
ねり部高さとの関係を示すグラフ、第4図は本発明の研
磨工具の断面図、第5図は本発明の研磨工具により磁気
ディスク基板を加工した場合の基板部分断面図を示す
図、第6図は弾性的性質を有する3種の研磨工具の例を
示す図である。図面中11,21,41,51は磁気ディスク基
板、12は磁気ディスク基板の長周期うねり、13は磁気デ
ィスク基板の短周期うねり、22,23は短周期うねり、41
は工具台、42はヤング率の小さい弾性体、43は小片分割
されたヤング率の大きい研磨体、52は加工前の磁気ディ
スク基板うねり、53は加工後の磁気ディスク基板うね
り、54は加工量分布である。
FIG. 1 is a partial sectional view of the substrate showing the undulations of the magnetic disk substrate before polishing, FIG. 2 is a partial sectional view of the substrate when the magnetic disk substrate is processed by a rigid polishing tool, and FIG. 3 is shown in FIG. Fig. 4 is a graph showing the relationship between the amount of processing when processed with a polishing tool and the height of the short-period waviness of the substrate. Fig. 4 is a sectional view of the polishing tool of the present invention. Fig. 5 shows a magnetic disk substrate with the polishing tool of the present invention. FIG. 6 is a diagram showing a partial cross-sectional view of the substrate when processed, and FIG. 6 is a diagram showing examples of three types of polishing tools having elastic properties. In the drawing, 11, 21, 41 and 51 are magnetic disk substrates, 12 is a long cycle undulation of the magnetic disk substrate, 13 is a short cycle undulation of the magnetic disk substrate, 22 and 23 are short cycle undulations, 41
Is a tool stand, 42 is an elastic body with a small Young's modulus, 43 is a small-piece abrasive body with a large Young's modulus, 52 is a magnetic disk substrate undulation before processing, 53 is a magnetic disk substrate undulation after processing, and 54 is a processing amount. Distribution.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】工具台上にヤング率の小さい弾性体(ヤン
グ率E<10g/mm2)を設け、前記弾性体上に研磨
面が平坦であって小片分割され弾性体と材質が異なるヤ
ング率の大きい硬質研磨体(ヤング率E>10g/mm
2)を設けたことを特徴とするディスク基板加工用研磨
工具。
1. An elastic body having a small Young's modulus (Young's modulus E <10 3 g / mm 2 ) is provided on a tool table, and a polishing surface is flat on the elastic body and the elastic body and the material are divided into small pieces. Hard abrasive with different Young's modulus (Young's modulus E> 10 4 g / mm
2 ) A polishing tool for processing disk substrates, which is provided with.
JP8524284A 1984-04-27 1984-04-27 Polishing tool for disk substrate processing Expired - Lifetime JPH0641109B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8524284A JPH0641109B2 (en) 1984-04-27 1984-04-27 Polishing tool for disk substrate processing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8524284A JPH0641109B2 (en) 1984-04-27 1984-04-27 Polishing tool for disk substrate processing

Publications (2)

Publication Number Publication Date
JPS60232878A JPS60232878A (en) 1985-11-19
JPH0641109B2 true JPH0641109B2 (en) 1994-06-01

Family

ID=13853092

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8524284A Expired - Lifetime JPH0641109B2 (en) 1984-04-27 1984-04-27 Polishing tool for disk substrate processing

Country Status (1)

Country Link
JP (1) JPH0641109B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5692950A (en) * 1996-08-08 1997-12-02 Minnesota Mining And Manufacturing Company Abrasive construction for semiconductor wafer modification
US20060166610A1 (en) * 2002-09-02 2006-07-27 Takakazu Miyahara Optical disk polishing device

Also Published As

Publication number Publication date
JPS60232878A (en) 1985-11-19

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