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JPH0648233B2 - Yield elongation detector - Google Patents
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JPH0648233B2 - Yield elongation detector - Google Patents

Yield elongation detector

Info

Publication number
JPH0648233B2
JPH0648233B2 JP59205865A JP20586584A JPH0648233B2 JP H0648233 B2 JPH0648233 B2 JP H0648233B2 JP 59205865 A JP59205865 A JP 59205865A JP 20586584 A JP20586584 A JP 20586584A JP H0648233 B2 JPH0648233 B2 JP H0648233B2
Authority
JP
Japan
Prior art keywords
elongation
load
time
point
value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP59205865A
Other languages
Japanese (ja)
Other versions
JPS6183936A (en
Inventor
英雄 増瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59205865A priority Critical patent/JPH0648233B2/en
Publication of JPS6183936A publication Critical patent/JPS6183936A/en
Publication of JPH0648233B2 publication Critical patent/JPH0648233B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/08Investigating strength properties of solid materials by application of mechanical stress by applying steady tensile or compressive forces

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は引張試験において得られる応力−ひずみ曲線の
降伏伸び値を自動的に検出する降伏伸び検出装置に関す
る。
The present invention relates to a yield elongation detecting device for automatically detecting a yield elongation value of a stress-strain curve obtained in a tensile test.

(ロ)従来技術 降伏伸び値を検出する場合、始点の検出は従来から比較
的簡単に検出できるが、終点の検出は材料により種々の
カーブになりパターン認識が難しく、このため従来降伏
伸び値を自動的に検出する有効な方法はなく、誤差も大
きかった。このため応力−ひずみ曲線より人間がチャー
トより読み取っていた。
(B) Conventional technology When detecting the yield elongation value, it is relatively easy to detect the starting point from the conventional method, but the end point is detected in various curves depending on the material and pattern recognition is difficult. There was no effective method to detect automatically, and the error was large. For this reason, the human being read the chart from the stress-strain curve.

(ハ)目的 本発明は上記従来技術の欠点を解消し、降伏伸び値を自
動的に検出できる降伏伸び検出装置の提供を目的とす
る。
(C) Purpose The present invention solves the above-mentioned drawbacks of the prior art, and an object of the present invention is to provide a yield elongation detection device capable of automatically detecting a yield elongation value.

(ニ)構成 本発明は、試片に加わる荷重を検出する荷重検出器と、
試片に生じる伸びを検出する伸び検出器と、これらの検
出器からの荷重信号と伸びに対応する時間信号とを一対
にして引張試験の開始から同期して順次格納してゆくバ
ッファ装置と、前記格納された荷重値を微分する微分装
置と、荷重の微分値と時間とから降伏伸びの終点を演算
する演算装置とを有し、該演算装置は荷重の一次微分値
−時間曲線を逆にさかのぼる方向に微分値の変化を演算
し、微分値に一定以上の落差を生じる変曲点があるとき
はそのときの時間に対応する伸びを、また微分値に一定
以上の落差を生じないときは微分値が初めて負になると
きの時間に対応する伸びを降伏伸びの終点として算出す
ることを特徴とする降伏伸び検出装置である。
(D) Configuration The present invention includes a load detector that detects a load applied to a test piece,
An elongation detector that detects elongation occurring in the test piece, a buffer device that sequentially stores the load signal from these detectors and a time signal corresponding to the elongation in pairs in synchronization with each other from the start of the tensile test, It has a differentiating device for differentiating the stored load value and a computing device for computing the end point of the yield elongation from the differential value of the load and time, and the computing device reverses the primary differential value of the load-time curve. Calculate the change of the differential value in the backward direction, and if there is an inflection point that causes the differential value to drop more than a certain amount, increase the time corresponding to that time, and if the differential value does not drop more than a certain amount, The yield elongation detecting device is characterized in that the elongation corresponding to the time when the differential value becomes negative for the first time is calculated as the end point of the yield elongation.

(ホ)実施例 第1図は降伏点Aの見られる材料の荷重−伸び曲線図
で、第2図は第1図の荷重−伸び曲線の微分図である。
第3図は実施装置の構成図、第4図は実施装置による操
作のフローチャートである。
(E) Example FIG. 1 is a load-elongation curve diagram of a material having a yield point A, and FIG. 2 is a differential diagram of the load-elongation curve of FIG.
FIG. 3 is a block diagram of the embodying apparatus, and FIG. 4 is a flowchart of the operation by the embodying apparatus.

第1図において降伏伸びはA点からB点までの伸びであ
る。
In FIG. 1, the yield elongation is the elongation from point A to point B.

この場合、A点は明瞭であるので、問題は降伏伸びの終
点であるB点の検出である。本装置においては、第3図
に示すように試片に加わる荷重を検出する荷重検出器
1,試片に生じる伸びを検出する伸び検出器2,例えば
50msec毎のクロック発生装置3,このクロック発生装
置3により得られた荷重信号と伸びに対応する時間信号
とをペアで同期して順次格納してゆくバッファ装置4,
格納した荷重値を微分してその値をメモリする微分装置
5,得られた荷重の微分値と時間とから降伏伸びの終点
を演算する演算装置6,及びプリンタ7を少なくとも有
している。前記演算装置6は荷重の一次微分値と時間の
ペアを時間的に逆にさかのぼる方向にサーチするように
構成されている。前記バッファ装置4と微分装置5によ
るデータの取得は引張試験開始により発生するスタート
指令から降伏現象終了後に生じる硬化領域に十分入った
点Eを検出して発せられるストップ指令があるまで行わ
れる。前記点Eは予め定めておく。
In this case, since point A is clear, the problem is detection of point B, which is the end point of yield elongation. In this device, as shown in FIG. 3, a load detector for detecting the load applied to the sample 1, an elongation detector for detecting the elongation occurring in the sample 2, for example, a clock generator for every 50 msec 3, this clock generator A buffer device 4, which sequentially stores the load signal obtained by the device 3 and the time signal corresponding to the elongation in synchronization in pairs.
It has at least a differentiating device for differentiating the stored load value, a memory for storing the value, a computing device 6 for computing the end point of yield elongation from the obtained differential value of the load and time, and a printer 7. The arithmetic unit 6 is configured to search for a pair of the primary differential value of the load and time in a backward direction going backward. The data acquisition by the buffer device 4 and the differentiator 5 is performed until a stop command is issued from a start command generated by the start of the tensile test to a point E sufficiently detected at a point E in the hardening region generated after the end of the yield phenomenon. The point E is set in advance.

演算装置6による演算は第4図に示すフローチャートに
したがって行われる。まずE点付近の平均の荷重の微分
値を求め、これをaとする(第2図参照)。次にE点
からA点の方に向かって逆に微分値をサーチして微分値
が初めてマイナスになる点Cを求める。次にE点からC
点方向に微分値の変化a−bをサーチする。そして
−b>xであるとき、その時間iに対応する伸び
を降伏伸びの終点とする。ここで、 a:E点付近での平均微分値 b:ある時間iにおける微分値 x: 降伏伸びの終点で予想される微分値の落差Fに対してF
より大きな値から予め定められた最低落下Hまで順次小
さく設定されてゆく変数 である。
The calculation by the calculation device 6 is performed according to the flowchart shown in FIG. First, the differential value of the average load in the vicinity of point E is obtained, and this is designated as a 1 (see FIG. 2). Next, the differential value is searched backward from point E toward point A to find point C where the differential value becomes negative for the first time. Then from point E to C
The change a 1 -b i of the differential value is searched for in the point direction. Then, when a 1 -b i > x, the elongation corresponding to the time i is set as the end point of the yield elongation. Here, a 1 : average differential value near the point E b i : differential value at a certain time i x: F with respect to the differential value difference F expected at the end point of yield elongation
It is a variable that is gradually set from a larger value to a predetermined minimum drop H.

一方、E点からC点に至るまでにa−bの値がH以
上にならない場合にはC点に相当する伸びを降伏伸びの
終点とする。
On the other hand, if the value of a 1 -b i does not exceed H from the point E to the point C, the elongation corresponding to the point C is set as the end point of the yield elongation.

このように演算によって得られる降伏伸びの終点(第1
図B点)の伸びから降伏点(第1図A点)の伸びを引算
することにより自動的に降伏伸びを検出することができ
る。
In this way, the yield elongation end point (first
The yield elongation can be automatically detected by subtracting the elongation at the yield point (point A in FIG. 1) from the elongation at the point B in the figure.

(ヘ)効果 本発明は以上の構成よりなり、従来人間が判断していた
降伏伸び値を自動的に検出することが可能となり、人為
的誤差ないし個人差による誤差がなくなり、正確を期す
ることができる。また検出の能率もアップする。
(F) Effect The present invention is configured as described above, and it is possible to automatically detect the yield elongation value that has been conventionally determined by humans, and eliminate errors due to human error or individual differences, and to ensure accuracy. You can Also, the detection efficiency is improved.

【図面の簡単な説明】[Brief description of drawings]

第1図は降伏点の見られる材料の荷重−伸び曲線図で、
第2図は第1図の荷重−伸び曲線の微分図である。第3
図は本発明の実施装置の構成図、第4図は実施装置によ
る操作のフローチャートである。 1……荷重検出器、2……伸び検出器 3……クロック発生装置、4……バッファ装置 5……微分装置、6……演算装置 7……プリンタ
Figure 1 is a load-elongation curve diagram for materials with a yield point.
FIG. 2 is a differential diagram of the load-elongation curve of FIG. Third
FIG. 4 is a block diagram of an embodying apparatus of the present invention, and FIG. 4 is a flowchart of an operation by the embodying apparatus. 1 ... Load detector 2 ... Elongation detector 3 ... Clock generator 4 ... Buffer device 5 ... Differentiator, 6 ... Arithmetic device 7 ... Printer

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】試片に加わる荷重を検出する荷重検出器
と、試片に生じる伸びを検出する伸び検出器と、これら
の検出器からの荷重信号と伸びに対応する時間信号とを
一対にして引張試験の開始から同期して順次格納してゆ
くバッファ装置と、前記格納された荷重値を微分する微
分装置と、荷重の微分値と時間とから降伏伸びの終点を
演算する演算装置とを有し、該演算装置は荷重の一次微
分値−時間曲線を逆にさかのぼる方向に微分値の変化を
演算し、微分値に一定以上の落差を生じる変曲点がある
ときはそのときの時間に対応する伸びを、また微分値に
一定以上の落差を生じないときは微分値が初めて負にな
るときの時間に対応する伸びを降伏伸びの終点として算
出することを特徴とする降伏伸び検出装置。
1. A load detector for detecting a load applied to a test piece, an elongation detector for detecting elongation occurring in the test piece, a load signal from these detectors and a time signal corresponding to the elongation are paired. A buffer device for sequentially storing the tensile test in synchronism with the start of the tensile test, a differentiating device for differentiating the stored load value, and a computing device for computing the end point of the yield elongation from the differential value of the load and the time. The calculation device calculates the change of the differential value in the direction going back to the first derivative value-time curve of the load, and when there is an inflection point that causes a drop of a certain value or more at the time at that time. A yield elongation detecting device, wherein the corresponding elongation, or the elongation corresponding to the time when the differential value becomes negative for the first time, is calculated as the end point of the yield elongation when the differential value does not cause a drop of a certain amount or more.
JP59205865A 1984-10-01 1984-10-01 Yield elongation detector Expired - Fee Related JPH0648233B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59205865A JPH0648233B2 (en) 1984-10-01 1984-10-01 Yield elongation detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59205865A JPH0648233B2 (en) 1984-10-01 1984-10-01 Yield elongation detector

Publications (2)

Publication Number Publication Date
JPS6183936A JPS6183936A (en) 1986-04-28
JPH0648233B2 true JPH0648233B2 (en) 1994-06-22

Family

ID=16513998

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59205865A Expired - Fee Related JPH0648233B2 (en) 1984-10-01 1984-10-01 Yield elongation detector

Country Status (1)

Country Link
JP (1) JPH0648233B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0820345B2 (en) * 1991-09-09 1996-03-04 株式会社島津製作所 Method of detecting break point of specimen

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5243593B2 (en) * 1972-08-15 1977-10-31

Also Published As

Publication number Publication date
JPS6183936A (en) 1986-04-28

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