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JPH0654291B2 - Spectrophotometer - Google Patents
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JPH0654291B2 - Spectrophotometer - Google Patents

Spectrophotometer

Info

Publication number
JPH0654291B2
JPH0654291B2 JP63236774A JP23677488A JPH0654291B2 JP H0654291 B2 JPH0654291 B2 JP H0654291B2 JP 63236774 A JP63236774 A JP 63236774A JP 23677488 A JP23677488 A JP 23677488A JP H0654291 B2 JPH0654291 B2 JP H0654291B2
Authority
JP
Japan
Prior art keywords
sample chamber
spectroscope
sample
adapter
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP63236774A
Other languages
Japanese (ja)
Other versions
JPH0283434A (en
Inventor
修 安藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP63236774A priority Critical patent/JPH0654291B2/en
Publication of JPH0283434A publication Critical patent/JPH0283434A/en
Publication of JPH0654291B2 publication Critical patent/JPH0654291B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は多様な試料について分光的測定を行い得るよう
にした分光光度計に関する。
TECHNICAL FIELD The present invention relates to a spectrophotometer capable of performing spectroscopic measurement on various samples.

(従来の技術) 第1図は本発明の一実施例を示すが分光光度計の一般的
な構成でもある。この図で、Mは分光器で分光器の出射
光束r,sが試料室Cを通って測光部Pに入射するよう
になっている。試料溶液の分光分析の場合、試料セルお
よび対照セルを試料室C内の光束r,sの光路上に置い
て試料の透過率或は吸光度を測光部Pで測定する。分光
光度計は上述した測定を行うのに適するように構成され
ており、固体試料でも、平行平面を持つ小さな試料の透
過率の測定は、溶液試料の場合と同じように測定できる
が、他の測定を行うときは一般に試料室C内に種々のア
ダプタを設置するようになっている。特に大径積分球を
用いる測定とか、大型或は異形の試料の透過率とか反射
率を測定する場合等には第5図に示すように分光器から
の出射光を試料室外に取出すアダプタAを試料室C内に
置き試料室Cの側面に光取出し用の窓を設け、この側面
に積分球I或は大型試料室L等の外付けアダプタを位置
決めして接続するようになっている。
(Prior Art) FIG. 1 shows an embodiment of the present invention, which is also a general configuration of a spectrophotometer. In this figure, M is a spectroscope, and the luminous fluxes r and s of the spectroscope pass through the sample chamber C and enter the photometric section P. In the case of spectroscopic analysis of the sample solution, the sample cell and the control cell are placed on the optical paths of the light fluxes r and s in the sample chamber C, and the transmittance or the absorbance of the sample is measured by the photometric section P. The spectrophotometer is configured to be suitable for performing the above-mentioned measurements, and even solid samples can be measured for transmittance of small samples with parallel planes in the same way as solution samples, but other When performing measurement, various adapters are generally installed in the sample chamber C. Especially when using a large-diameter integrating sphere, or when measuring the transmittance or reflectance of a large or irregularly shaped sample, etc., as shown in FIG. 5, an adapter A for extracting the light emitted from the spectroscope to the outside of the sample chamber is used. A window for taking out light is provided on the side surface of the sample chamber C in the sample chamber C, and an external adapter such as the integrating sphere I or the large sample chamber L is positioned and connected to this side surface.

(発明が解決しようとする課題) 上述した従来の分光光度計では積分球を用いる測定と大
型試料の測定とを交代して行う場合のように試料室外に
接続する外付けアダプタを交換する必要がある場合、外
付けアダプタを一々着け換えねばならないと云う面倒さ
があった。本発明は分光光度計の試料室外に接続する外
付けアダプタを交換する必要がある場合に、アダプタ着
換えの手数をなしにしようとするものである。
(Problems to be Solved by the Invention) In the above-described conventional spectrophotometer, it is necessary to replace the external adapter connected to the outside of the sample chamber as in the case where the measurement using the integrating sphere and the measurement of a large sample are alternately performed. In some cases, there was the trouble of having to change each external adapter. The present invention intends to eliminate the trouble of changing the adapter when the external adapter connected to the outside of the sample chamber of the spectrophotometer needs to be replaced.

(課題を解決するための手段) 分光器と分光器出射光が通過する試料室と試料室通過光
が入射せしめられる測光部とを有する分光光度計におい
て、上記試料室の前面と後面(試料室において、分光器
とも測光部とも接していない対向二側壁)とに夫々、上
記分光器出射光を導出する窓を設けると共に、着脱自在
に外付けアダプタを取付け可能と、上記試料室内に上記
分光器出射光を試料室前面或は後面の外付けアダプタに
向けて反射せしめる光路切換え手段を挿脱可能に設け
た。
(Means for Solving the Problem) In a spectrophotometer having a spectroscope, a sample chamber through which light emitted from the spectroscope passes, and a photometric unit into which the light passing through the sample chamber is incident, a front surface and a rear surface of the sample chamber (sample chamber In (2 opposite side walls that are not in contact with the spectroscope or the photometric section), a window for guiding the emitted light of the spectroscope is provided, respectively, and an external adapter can be detachably attached to the spectroscope in the sample chamber. An optical path switching means for reflecting the emitted light toward an external adapter on the front surface or the rear surface of the sample chamber is provided so that it can be inserted and removed.

(作用) 試料室は通常は溶液試料とか小型試料の測定に用いられ
るが、試料室の前後両面に夫々外付けアダプタを着脱可
能に設けたので、二種の外付けアダプタを同時に試料室
に接続しておくことができ、外付けアダプタを一々着脱
交換することなしに任意に使い分けることができるよう
になる。
(Function) The sample chamber is usually used for measuring solution samples or small samples, but since external adapters are detachably installed on both the front and back sides of the sample chamber, two types of external adapters can be connected to the sample chamber at the same time. The external adapter can be used as desired without having to remove and replace the external adapter one by one.

(実施例) 第1図に本発明の一実施例の全体を示す。Mは分光器で
対照光束rと試料光束sの2光束を出射する。Cは分光
器Mの外側に固設された試料室で、対照光束r,試料光
束sが通過するようになっている。Pは測光部で試料室
Cの側面に取付けられており、二光束r,sが入射せし
められる。以上の構成は従来の分光光度計と同じであ
る。本発明では試料室Cの前面fと後面bとに夫々第2
図に示すように対照光束および試料光束を取出す二つの
窓W1,W2と外付けアダプタの位置決め手段であるピ
ンp1,p2と、外付けアダプタを固定するためのねじ
孔T1,T2が設けられており、試料室Cの前後両面に
夫々外付けアダプタを取付けることができるようになっ
ている。外付けアダプタを用いない用法の場合、試料室
Cの前後両面にはねじ孔T1,T2を利用して窓ふさぎ
の板が取付けられる。
(Embodiment) FIG. 1 shows the whole embodiment of the present invention. M is a spectroscope that emits two light beams, a reference light beam r and a sample light beam s. Reference numeral C denotes a sample chamber fixed outside the spectroscope M, through which the reference light beam r and the sample light beam s pass. P is a photometric unit attached to the side surface of the sample chamber C, and two light fluxes r and s are incident thereon. The above configuration is the same as the conventional spectrophotometer. In the present invention, the front surface f and the rear surface b of the sample chamber C are respectively provided with the second
As shown in the figure, two windows W1 and W2 for extracting the reference light beam and the sample light beam, pins p1 and p2 which are positioning means of the external adapter, and screw holes T1 and T2 for fixing the external adapter are provided. The external adapters can be attached to the front and rear surfaces of the sample chamber C, respectively. In the case of using without using an external adapter, window blocking plates are attached to the front and rear surfaces of the sample chamber C by utilizing screw holes T1 and T2.

第3図は上述分光光度計に2種類の外付けアダプタを取
付けた状態を示す。Iは積分球でLは大型試料室であ
る。試料室C内には分光器Mから出射した対照光束rと
試料光束sとを大型試料室Lに導く二つの鏡m1,m2
を備えたアダプタA1が設置されている。qはアダプタ
A1を試料室C内で位置決めするための位置決めピン、
Bは同アダプタを試料室内に固定するためのねじであ
る。A2は対照光束r、試料光束sを積分球Iに導くた
め試料室C内にセットするアダプタで、積分球Iを使用
するときA1と交換する。
FIG. 3 shows the spectrophotometer with two types of external adapters attached. I is an integrating sphere and L is a large sample chamber. In the sample chamber C, two mirrors m1 and m2 for guiding the reference beam r and the sample beam s emitted from the spectroscope M to the large sample chamber L.
An adapter A1 equipped with is installed. q is a positioning pin for positioning the adapter A1 in the sample chamber C,
B is a screw for fixing the same adapter in the sample chamber. A2 is an adapter which is set in the sample chamber C for guiding the control light beam r and the sample light beam s to the integrating sphere I, and is replaced with A1 when the integrating sphere I is used.

大型試料室Lにおいて、Slが試料である。大型試料室
内に配置された鏡m3,m4,m5によって対照光束は
同室内の積分球Ilに直接導かれ、試料光束は試料Sl
を透過して積分球Ilに入射するうよに光路が導かれ
る。Iwoは積分球Ilの光出射窓で、この窓の外側下
部に受光素子Plが置かれており、Plから信号ケーブ
ルKlが出ており、その先端の接続プラグが測光部Pに
設けられている信号コネクタCpに挿入され、受光素子
Plが測光部P内の測光回路に接続される。積分球Iに
おいてS、が試料で、Srが標準白板になっている。I
wo′は積分球Iの光出射窓でその下に受光素子Piが
取付けてあり、Piから延びている信号ケーブルKiの
先端接続プラグを測光部PのコネクタCpに挿入するこ
とで受光素子Piが測光部内の測光回路に接続される。
In the large sample chamber L, Sl is a sample. The reference light flux is directly guided to the integrating sphere Il in the large sample chamber by the mirrors m3, m4 and m5, and the sample light beam is the sample Sl.
The optical path is guided so as to pass through and enter the integrating sphere Il. Iwo is a light emission window of the integrating sphere Il, a light receiving element Pl is placed on the lower outside of this window, a signal cable Kl is extended from Pl, and a connection plug at the tip thereof is provided in the photometric section P. The light receiving element Pl is inserted into the signal connector Cp and is connected to the photometric circuit in the photometric section P. In the integrating sphere I, S is a sample and Sr is a standard white plate. I
wo 'is a light emitting window of the integrating sphere I, and a light receiving element Pi is attached below the window, and the tip of the signal cable Ki extending from Pi is inserted into the connector Cp of the photometric section P to thereby detect the light receiving element Pi. It is connected to the photometry circuit in the photometry unit.

上述実施例では大型試料室Lを使うか積分球Iを使うか
で試料室C内のアダプタをA1かA2の何れかに入れ換
えなければならない。第4図の実施例は試料室C内で分
光器Mから出射する二光束r,sの間隔とそれらを直角
に折曲して外付けアダプタに出射させたときの出射2光
束の間隔を等しくし、アダプタ上の二つの鏡m1,m2
を一つの正八角形の一つの対向辺に沿って互いに平行に
固定し、試料室C内で45゜回転させるだけで、2光束
を試料室の前側外付けアダプタに導いたり、後側外付け
アダプタに導いたりできるようにしたものである。
In the above embodiment, the adapter in the sample chamber C must be replaced with either A1 or A2 depending on whether the large sample chamber L or the integrating sphere I is used. In the embodiment of FIG. 4, the interval between the two light beams r and s emitted from the spectroscope M in the sample chamber C and the interval between the two light beams emitted when they are bent at a right angle and emitted to the external adapter are made equal. The two mirrors m1 and m2 on the adapter
Are fixed parallel to each other along one opposing side of one regular octagon, and are rotated 45 ° in the sample chamber C to guide two light beams to the front external adapter of the sample chamber or the rear external adapter. It is something that can be led to.

(発明の効果) 本発明は分光光度計の試料室の前後両側に外付けアダプ
タを取付けておくことができるようにしたので、2種の
外付けアダプタを一々着脱交換することなしに、2種の
外付けアダプタを用いる測定を行うことができ、分光光
度計の多様な用法に対する切換え操作が大幅に簡単化さ
れる。
(Effects of the Invention) Since the present invention allows the external adapters to be attached to the front and rear sides of the sample chamber of the spectrophotometer, the two types of external adapters can be attached and detached without replacement. The measurement can be performed by using the external adapter of the spectrophotometer, and the switching operation for various uses of the spectrophotometer is greatly simplified.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例の試料室のみ水平断面を示し
た平面図、第2図は同実施例の試料室の前面および後面
の正面図、第3図は同実施例に2種の外付けアダプタを
取付けた状態の要部水平断面平面図、第4図は光路切換
えアダプタの他の実施例の平面図、第5図は従来例にお
ける外付けアダプタを装着した分光光度計の平面図であ
る。 M……分光器、C……試料室、P……測光部、W1,W
2……試料室前後面の光束透過窓、P1,P2……位置
決めピン、T1,T2……ねじ孔、I……外付けアダプ
タの積分球、L……外付けアダプタの大型試料室、Sl
……大型試料、Si……試料、Il……大型試料室内の
積分球、Pl,Pi……受光素子、Kl,Ki……信号
ケーブル、Cp……信号コネクタ。
FIG. 1 is a plan view showing only a horizontal cross section of a sample chamber according to an embodiment of the present invention, FIG. 2 is a front view of front and rear surfaces of the sample chamber of the embodiment, and FIG. FIG. 4 is a plan view of a horizontal cross-section of an essential part with the external adapter attached, FIG. 4 is a plan view of another embodiment of the optical path switching adapter, and FIG. 5 is a plan view of a spectrophotometer with the external adapter attached in the conventional example. It is a figure. M: spectroscope, C: sample chamber, P: photometric unit, W1, W
2 ... Light flux transmission windows on front and rear surfaces of sample chamber, P1, P2 ... Positioning pins, T1, T2 ... Screw holes, I ... Integrating sphere of external adapter, L ... Large sample chamber of external adapter, Sl
...... Large sample, Si ... Sample, Il ... Integrating sphere in large sample chamber, Pl, Pi ... Light receiving element, Kl, Ki ... Signal cable, Cp ... Signal connector.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】分光器と分光器出射光が通過する試料室と
試料室通過光が入射せしめられる測光部とを有し、上記
試料室の前面と後面とに夫々、分光器出射光を導出する
窓を設けると共に、着脱自在に外付けアダプタを取付け
可能とし、上記試料室内の上記分光器出射光を試料室前
面或は後面の外付けアダプタに導く光路切換え手段を上
記試料室内に挿脱可能に設けたことを特徴とする分光光
度計。
1. A spectroscope, a sample chamber through which the light emitted from the spectroscope passes, and a photometric section into which the light passing through the sample chamber is made incident, and the light emitted from the spectroscope is led to the front surface and the rear surface of the sample chamber, respectively. In addition to providing a window to allow the external adapter to be attached detachably, the optical path switching means that guides the light emitted from the spectroscope in the sample chamber to the external adapter on the front or rear of the sample chamber can be inserted into or removed from the sample chamber. A spectrophotometer, which is provided in.
JP63236774A 1988-09-20 1988-09-20 Spectrophotometer Expired - Lifetime JPH0654291B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63236774A JPH0654291B2 (en) 1988-09-20 1988-09-20 Spectrophotometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63236774A JPH0654291B2 (en) 1988-09-20 1988-09-20 Spectrophotometer

Publications (2)

Publication Number Publication Date
JPH0283434A JPH0283434A (en) 1990-03-23
JPH0654291B2 true JPH0654291B2 (en) 1994-07-20

Family

ID=17005596

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63236774A Expired - Lifetime JPH0654291B2 (en) 1988-09-20 1988-09-20 Spectrophotometer

Country Status (1)

Country Link
JP (1) JPH0654291B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024536994A (en) * 2021-07-09 2024-10-10 アイナ アナリティクス ゲーエムベーハー Measurement chamber extension for spectrophotometric characterization of sterile liquids in polymer containers by NIR or Raman spectroscopy

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH046441A (en) * 1990-04-25 1992-01-10 Rion Co Ltd Particulate meter
JPH0628714U (en) * 1992-09-08 1994-04-15 株式会社島津製作所 Spectrophotometer with external sample chamber
JP4873188B2 (en) * 2008-08-04 2012-02-08 株式会社島津製作所 Spectrophotometer

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5446380U (en) * 1977-09-07 1979-03-30
JPS5927227A (en) * 1982-08-09 1984-02-13 Hitachi Ltd Spectrophotometer
JPS62167240A (en) * 1986-01-17 1987-07-23 宇部興産株式会社 Method for manufacturing cement composition
JPS62167241A (en) * 1986-01-18 1987-07-23 電気化学工業株式会社 Alumina cement for low cement castable
JPH0750026B2 (en) * 1986-12-29 1995-05-31 株式会社島津製作所 Spectrophotometer
JPS63167241A (en) * 1986-12-29 1988-07-11 Shimadzu Corp Spectrophotometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024536994A (en) * 2021-07-09 2024-10-10 アイナ アナリティクス ゲーエムベーハー Measurement chamber extension for spectrophotometric characterization of sterile liquids in polymer containers by NIR or Raman spectroscopy

Also Published As

Publication number Publication date
JPH0283434A (en) 1990-03-23

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