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JPH0654762B2 - Method for producing P-type carbon-doped amorphous silicon film - Google Patents
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JPH0654762B2 - Method for producing P-type carbon-doped amorphous silicon film - Google Patents

Method for producing P-type carbon-doped amorphous silicon film

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Publication number
JPH0654762B2
JPH0654762B2 JP62281883A JP28188387A JPH0654762B2 JP H0654762 B2 JPH0654762 B2 JP H0654762B2 JP 62281883 A JP62281883 A JP 62281883A JP 28188387 A JP28188387 A JP 28188387A JP H0654762 B2 JPH0654762 B2 JP H0654762B2
Authority
JP
Japan
Prior art keywords
film
gas
amorphous silicon
type
sic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62281883A
Other languages
Japanese (ja)
Other versions
JPH01123414A (en
Inventor
明彦 浅野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP62281883A priority Critical patent/JPH0654762B2/en
Publication of JPH01123414A publication Critical patent/JPH01123414A/en
Publication of JPH0654762B2 publication Critical patent/JPH0654762B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Photovoltaic Devices (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、非晶質シリコンよりバンドギャップの広いこ
とから用いられる炭素添加非晶質シリコン膜のp形膜の
生成方法に関する。
TECHNICAL FIELD The present invention relates to a method for producing a p-type film of a carbon-doped amorphous silicon film used because it has a wider bandgap than amorphous silicon.

〔従来の技術〕[Conventional technology]

p形の炭素添加水素化非晶質シリコン(以下a−SiC:
Hと記す)薄膜は、p−i−n形非晶質シリコン太陽電
池の窓層(光入射側の層)の材料として用いられ、非晶
質シリコン太陽電池の光電変換効率向上に、大きく寄与
してきた。第2図は、太和田らが、雑誌「ジャーナル・
オブ・アプライド・フィジックス」(Journal of Applie
d Physics)第53巻、5273〜5281頁(1982年)に発表し
た、p層にa−SiC:Hを用いた、非晶質シリコン太陽
電池の特性を示す。この太陽電池の構造は、第3図に示
されるようにガラス基板31上に、酸化錫(SnO2)薄膜32、
p形のa−SiC:H層33、i質の水素化非晶質シリコン
(以下a−Si:Hと記す)層34,n形のa−Si:H層35
およびアルミニウム電極36を積層した構造になってい
る。酸化錫薄膜32は、真空蒸着法または熱CVD法で形
成され、アルミ電極36は真空蒸着法またはスパッタリン
グ法により形成される。a−Si:H層は、モノシランガ
スを、グロー放電により分解する、いわゆるプラズマC
VD法により形成される。この時の基板温度は、250℃
程度である。なお、n形a−Si:H層形成時には、フォ
スフィンガス(PH3)を、モノシランガスに対する流量比
で、1%程度混合する。また、p形a−SiC:H層形成
時には、メタンガス(CH4)およびジボランガス(B2H6)を
混合する。
P-type carbon-doped hydrogenated amorphous silicon (hereinafter a-SiC:
The thin film (referred to as H) is used as a material for the window layer (layer on the light incident side) of the p-i-n type amorphous silicon solar cell, and contributes greatly to improving the photoelectric conversion efficiency of the amorphous silicon solar cell. I've been Figure 2 shows Tawada et al.
Of Applied Physics (Journal of Applie
The characteristics of an amorphous silicon solar cell using a-SiC: H for a p-layer, which was published in d Physics) 53, 5273-5281 (1982), are shown. As shown in FIG. 3, the structure of this solar cell is such that a tin oxide (SnO 2 ) thin film 32,
A p-type a-SiC: H layer 33, an i-type hydrogenated amorphous silicon (hereinafter referred to as a-Si: H) layer 34, and an n-type a-Si: H layer 35.
And an aluminum electrode 36 are laminated. The tin oxide thin film 32 is formed by a vacuum evaporation method or a thermal CVD method, and the aluminum electrode 36 is formed by a vacuum evaporation method or a sputtering method. The a-Si: H layer is a so-called plasma C that decomposes monosilane gas by glow discharge.
It is formed by the VD method. The substrate temperature at this time is 250 ° C.
It is a degree. When forming the n-type a-Si: H layer, phosphine gas (PH 3 ) is mixed at a flow rate ratio of about 1% with respect to the monosilane gas. Further, at the time of forming the p-type a-SiC: H layer, methane gas (CH 4 ) and diborane gas (B 2 H 6 ) are mixed.

このような太陽電池に、ガラス基板側から光37を入射す
ると、p−i−n接合の光起電力効果によりp側の酸化
錫電極32正、n側のアルミ電極36に負の電位を生じる。
第2図には、100mW/cm2強度の太陽光照射下での発電特
性が示されている。黒丸で示されているのは出力電流密
度と出力電圧の積、つまり太陽電池1cm2あたりの出力
電力が最大となる点であり、この点での出力電力を一般
的に太陽電池の出力と呼び、その入射光量に対する割合
を変換効率と呼んでいる。
When light 37 enters such a solar cell from the glass substrate side, a positive potential is generated on the p-side tin oxide electrode 32 positive and on the n-side aluminum electrode 36 due to the photovoltaic effect of the pin junction. .
Fig. 2 shows the power generation characteristics under sunlight irradiation with 100 mW / cm 2 intensity. The black circles indicate the product of output current density and output voltage, that is, the point where the output power per 1 cm 2 of solar cell is the maximum, and the output power at this point is generally called the output of the solar cell. , The ratio to the amount of incident light is called conversion efficiency.

このような非晶質太陽電池では、光電変換作用はi層に
しかないためp層の光透過率を高くし、できるだけ多く
の光がi層まで到達できるようにすることが出力を増加
させる上で重要である。そのためには、p層の光学吸収
係数を低くしなければならない。p層の光学吸収係数α
は、電子ボルトを単位として表わしたバンドギャップE
gを用いて、次式より計算される(但し、E<Egの場
合)。
In such an amorphous solar cell, since the photoelectric conversion action is limited to the i layer, it is necessary to increase the light transmittance of the p layer so that as much light as possible reaches the i layer in order to increase the output. is important. For that purpose, the optical absorption coefficient of the p layer must be lowered. Optical absorption coefficient of p layer α
Is the band gap E expressed in electron volts.
It is calculated from the following equation using g (provided that E <Eg).

α=B(E−Eg)/E ここで、Bは定数、Eは光エネルギーを電子ボルトを
単位として示す。上式より、吸収係数を低くするために
は、Egを大きくすればよいことがわかる。前出の雑誌
の中で、太和田らは、p層としてバンドギャップがa−
Si:Hより大きなa−SiC:Hを使用することによっ
て、非晶質太陽電池の変換効率が5〜6%から8%程度
まで向上することを報告している。
α = B 2 (E−Eg) 2 / E Here, B 2 is a constant, and E is light energy in electron volts. From the above equation, it is understood that Eg should be increased in order to lower the absorption coefficient. In the above-mentioned magazine, Tawada et al.
It has been reported that by using a-SiC: H larger than Si: H, the conversion efficiency of an amorphous solar cell is improved from 5 to 6% to about 8%.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

第4図は、前出の雑誌の中で報告されているp形a−Si
C:H膜の光伝導度のバンドギャップ依存性をプロット
し直したものである。前述のように、バンドギャップが
高い程p層の光透過率は高くなるが、同時に光照射下で
の電気伝導度(光伝導度)が図のように低くなり、太陽
電池の直列抵抗成分が増加する。例えばp層の厚さが10
-6cm(10nm)の場合には、光伝導度10-6S/cmは、面積1
cm2の太陽電池に、1Ωの直列抵抗値の増加をもたら
す。このように、従来のp形a−SiC:H膜の生成方法
には、10-6S/cm以上の光伝導度が必要な場合に、バン
ドギャップが2.0電子ボルト以上に高められないという
欠点があった。
Figure 4 shows the p-type a-Si reported in the aforementioned magazine.
The band gap dependence of the photoconductivity of the C: H film is plotted again. As described above, the higher the band gap, the higher the light transmittance of the p-layer, but at the same time, the electrical conductivity under light irradiation (photoconductivity) becomes lower as shown in the figure, and the series resistance component of the solar cell is reduced. To increase. For example, the p-layer thickness is 10
At -6 cm (10 nm), the photoconductivity of 10 -6 S / cm is 1 area.
This gives a 1 Ω series resistance increase for a cm 2 solar cell. As described above, the conventional p-type a-SiC: H film formation method has a drawback that the band gap cannot be increased to 2.0 eV or more when the photoconductivity of 10 -6 S / cm or more is required. was there.

本発明の目的は、上述の問題を解決し、バンドギャップ
が2.1電子ボルト以上でかつ光伝導度が10-3/cm以上の
p形a−SiCH膜の生成方法を提供することにある。
An object of the present invention is to solve the above problems and provide a method for producing a p-type a-SiCH film having a band gap of 2.1 eV or more and a photoconductivity of 10 -3 / cm or more.

〔問題点を解決するための手段〕[Means for solving problems]

上記の目的を達成するために、本発明の方法は、シラン
系ガス,炭化水素ガスおよびジボランガスを成分とする
原料ガスをシラン系ガス流量の100倍以上の水素により
希釈し、この希釈した原料ガスを用いてプラズマCVD
により150℃以下の温度に保持された基板上に成膜する
ものとする。
In order to achieve the above object, the method of the present invention is a silane-based gas, a hydrocarbon gas and a raw material gas containing diborane gas are diluted with hydrogen 100 times or more of the silane-based gas flow rate, the diluted raw material gas Plasma CVD using
Therefore, the film is formed on the substrate held at a temperature of 150 ° C. or less.

〔作用〕[Action]

p形a−SiC:H膜生成時、原料ガス中のシラン系ガス
の水素希釈率を100倍以上とすると、a−SiC:H膜の光
伝導度が1桁以上高くなり、加えて成膜基板の温度を15
0℃以下に保つことによりバンドギャップも広くなる。
When the hydrogen dilution ratio of the silane-based gas in the source gas is 100 times or more when the p-type a-SiC: H film is formed, the photoconductivity of the a-SiC: H film is increased by one digit or more. Board temperature 15
By keeping the temperature below 0 ° C, the bandgap becomes wider.

〔実施例〕〔Example〕

次に、この発明の実施例を述べる。原料ガスとしては、
モノシラン,メタン,ジボランおよび水素を用いた。モ
ノシランの流量は、1.0cc/分、メタンの流量は2.0cc/
分、ジボランの流量は0.03cc/分、水素の流量は200cc
/分である。換言すれば、モノシランガスの水素希釈率
は200倍、モノシランに対するジボランのドーピング量
は3%である。この原料ガスを、第5図に示すような容
積10の真空排気された槽1内にガス導入管2を通じて
導入した。真空排気量は、真空槽1と真空ポンプ3間に
設けたコンダクタンスバルブ4により調整し、真空槽1
での原料ガス圧力が100Paとなるように調整した。真空
槽内には、基板加熱用のヒータブロック5および面積15
0cm2のグロー放電用の円形電極一対61,62が対向配置さ
れている。次に、ヒータブロック5のスイッチを入れ、
電極61上のガラス基板7の温度が100℃となるようにし
た。次いで、円形電極62に高周波電源により、周波数1
3.56MHz,電力2Wの高周波電力を印加し、円形電極6
1,62間でグロー放電を起こし、原料ガスを分解、ガラ
ス基板7上にp形a−SiC:H膜を生成した。生成速度
は、0.05Å/秒であった。
Next, examples of the present invention will be described. As the source gas,
Monosilane, methane, diborane and hydrogen were used. The flow rate of monosilane is 1.0 cc / min, the flow rate of methane is 2.0 cc / min.
Min, diborane flow rate is 0.03cc / min, hydrogen flow rate is 200cc
/ Min. In other words, the hydrogen dilution ratio of monosilane gas is 200 times, and the doping amount of diborane with respect to monosilane is 3%. This raw material gas was introduced into a tank 1 having a volume of 10 as shown in FIG. The vacuum exhaust amount is adjusted by the conductance valve 4 provided between the vacuum chamber 1 and the vacuum pump 3,
The pressure of the raw material gas was adjusted to 100 Pa. Inside the vacuum chamber, the heater block 5 for heating the substrate and the area 15
A pair of circular electrodes 61 and 62 for 0 cm 2 glow discharge are arranged opposite to each other. Next, switch on the heater block 5,
The temperature of the glass substrate 7 on the electrode 61 was set to 100 ° C. Then, the circular electrode 62 is fed with a high frequency power source to generate a frequency 1
Applying high frequency power of 3.56MHz and power of 2W, circular electrode 6
Glow discharge was generated between 1 and 62 to decompose the raw material gas and form a p-type a-SiC: H film on the glass substrate 7. The production rate was 0.05Å / sec.

このようにして生成したp形a−SiC:H膜のバンドギ
ャップは2.1電子ボルト、光伝導度は10-5S/cmであ
り、第4図に示された従来技術により生成したものに比
べ、光伝導度が2桁も高くなったことがわかる。第1図
(a)は、このようにして生成したp形a−SiC:H膜のバ
ンドギャップの基板温度依存性を示す。光伝導度は、基
板温度にはほとんど依存せず、10-5S/cm前後であっ
た。第1図(a)から、基板温度が150℃以下であることが
p形a−SiC:H膜のバンドギャップを高める上で重要
なことがわかる。
The p-type a-SiC: H film thus produced has a bandgap of 2.1 eV and a photoconductivity of 10 -5 S / cm, which is higher than that of the conventional device shown in FIG. It can be seen that the photoconductivity was increased by two digits. Fig. 1
(a) shows the substrate temperature dependence of the band gap of the p-type a-SiC: H film thus produced. The photoconductivity was around 10 −5 S / cm, which was almost independent of the substrate temperature. From FIG. 1 (a), it is understood that the substrate temperature of 150 ° C. or lower is important for increasing the band gap of the p-type a-SiC: H film.

第1図(b)は、ガラス基板の温度を100℃で一定とし、モ
ノシランガスの水素希釈率を変えて作成したp形a−Si
C:H膜の光伝導度を示す。この際、モノシラン,メタ
ン,ジボランの流量は、それぞれ1.0cc/分、2.0cc/
分、0.03cc/分で一定とし、水素の流量を25cc/分〜30
0cc/分の範囲で変え、水素希釈率を変化させた。図よ
りわかるように、水素希釈率が100倍までは、水素希釈
率の増加につれて光伝導度は増加する。水素希釈率が10
0倍以上になると、光伝導度は水素希釈率にほとんど依
存しない。なお、バンドギャップは水素希釈率にほとん
ど依存せず、2.1電子ボルトであった。これらの結果よ
り、p形a−SiC:H膜の光伝導度を10-5S/cm以上に
するためには、基板温度が150℃以下であることに加え
て、モノシランガス等のシラン系ガスの水素希釈率が10
0倍以上であることが必要なことがわかる。
Fig. 1 (b) is a p-type a-Si prepared by keeping the temperature of the glass substrate constant at 100 ° C and changing the hydrogen dilution ratio of monosilane gas.
The photoconductivity of the C: H film is shown. At this time, the flow rates of monosilane, methane, and diborane are 1.0 cc / min and 2.0 cc / min, respectively.
Min, 0.03cc / min, and the flow rate of hydrogen is 25cc / min-30
The hydrogen dilution ratio was changed by changing in the range of 0 cc / min. As can be seen from the figure, the photoconductivity increases as the hydrogen dilution rate increases up to 100 times the hydrogen dilution rate. Hydrogen dilution rate is 10
Above 0 times, the photoconductivity hardly depends on the hydrogen dilution rate. The band gap was 2.1 eV, which hardly depended on the hydrogen dilution ratio. From these results, in order to increase the photoconductivity of the p-type a-SiC: H film to 10 −5 S / cm or more, in addition to the substrate temperature of 150 ° C. or less, a silane-based gas such as monosilane gas is used. Hydrogen dilution rate of 10
It turns out that it is necessary to be 0 times or more.

〔発明の効果〕〔The invention's effect〕

本発明によれば、p形a−SiC:H膜の生成時にシラン
系ガスの水素希釈率を100倍以上に高めた上で、基板温
度を150℃以下にしたので、バンドギャップが2.1電子ボ
ルト以上で、かつ光伝導度が10-5S/cm以上のp形a−
SiC:H膜を生成することができる。従ってこの膜を用
いた太陽電池の直列抵抗成分が低下し、出力が向上す
る。また、本発明によれば、生成時の基板温度が低くて
よいため、酸化錫等の透光性電極上に生成する際に、そ
れらの構成元素である錫や酸素のp形a−SiC:H膜へ
の混入が著しく減少するという利点も得られる。
According to the present invention, when the p-type a-SiC: H film is formed, the hydrogen dilution ratio of the silane-based gas is increased 100 times or more, and the substrate temperature is set to 150 ° C. or less, so that the band gap is 2.1 eV. Above, p-type a- with a photoconductivity of 10 -5 S / cm or more
A SiC: H film can be produced. Therefore, the series resistance component of the solar cell using this film is reduced and the output is improved. Further, according to the present invention, since the substrate temperature at the time of formation may be low, the p-type a-SiC of tin or oxygen, which is a constituent element thereof, when forming on a transparent electrode such as tin oxide: There is also an advantage that contamination of the H film is significantly reduced.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の効果を示し、第1図(a)はバンドギャ
ップと基板温度との関係線図、第1図(b)は光伝導度と
シランガスの水素希釈率との関係線図、第2図はp層に
a−SiC:Hを用いた従来の太陽電池の特性線図、第3
図は第2図の特性を示す太陽電池の断面図、第4図はp
形a−SiC:H膜の光伝導度とバンドギャップの関係線
図、第5図は本発明の実施例に用いるプラズマCVD装
置の断面構造図である。 1:真空槽、2:ガス導入管、3:真空ポンプ、61,6
2:電極、7:基板、8:高周波電源。
FIG. 1 shows the effect of the present invention. FIG. 1 (a) is a relationship diagram between band gap and substrate temperature, and FIG. 1 (b) is a relationship diagram between photoconductivity and hydrogen dilution rate of silane gas. FIG. 2 is a characteristic diagram of a conventional solar cell using a-SiC: H for the p layer, FIG.
The figure is a cross-sectional view of a solar cell showing the characteristics of FIG. 2, and FIG.
FIG. 5 is a cross-sectional structural diagram of the plasma CVD apparatus used in the examples of the present invention, wherein the relationship between the photoconductivity and band gap of the a-SiC: H film is shown. 1: vacuum tank, 2: gas introduction pipe, 3: vacuum pump, 61, 6
2: electrode, 7: substrate, 8: high frequency power supply.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】シラン系ガス,炭化水素ガスおよびジボラ
ンを成分とする原料ガスをシラン系ガスの流量の100倍
以上の水素により希釈し、該希釈原料ガスを用いてプラ
ズマCVDにより150℃以下の温度に保持された基板上
に成膜することを特徴とするp形炭素添加非晶質シリコ
ン膜の生成方法。
1. A raw material gas containing a silane-based gas, a hydrocarbon gas and diborane as a component is diluted with hydrogen at a flow rate of 100 times or more that of the silane-based gas, and the diluted raw material gas is subjected to plasma CVD at a temperature of 150 ° C. or lower. A method for producing a p-type carbon-doped amorphous silicon film, which comprises forming the film on a substrate kept at a temperature.
JP62281883A 1987-11-07 1987-11-07 Method for producing P-type carbon-doped amorphous silicon film Expired - Lifetime JPH0654762B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62281883A JPH0654762B2 (en) 1987-11-07 1987-11-07 Method for producing P-type carbon-doped amorphous silicon film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62281883A JPH0654762B2 (en) 1987-11-07 1987-11-07 Method for producing P-type carbon-doped amorphous silicon film

Publications (2)

Publication Number Publication Date
JPH01123414A JPH01123414A (en) 1989-05-16
JPH0654762B2 true JPH0654762B2 (en) 1994-07-20

Family

ID=17645296

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62281883A Expired - Lifetime JPH0654762B2 (en) 1987-11-07 1987-11-07 Method for producing P-type carbon-doped amorphous silicon film

Country Status (1)

Country Link
JP (1) JPH0654762B2 (en)

Also Published As

Publication number Publication date
JPH01123414A (en) 1989-05-16

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