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JPH0658342B2 - Recording method of measured spectrum of double-focusing mass spectrometer - Google Patents
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JPH0658342B2 - Recording method of measured spectrum of double-focusing mass spectrometer - Google Patents

Recording method of measured spectrum of double-focusing mass spectrometer

Info

Publication number
JPH0658342B2
JPH0658342B2 JP59249936A JP24993684A JPH0658342B2 JP H0658342 B2 JPH0658342 B2 JP H0658342B2 JP 59249936 A JP59249936 A JP 59249936A JP 24993684 A JP24993684 A JP 24993684A JP H0658342 B2 JPH0658342 B2 JP H0658342B2
Authority
JP
Japan
Prior art keywords
mass
electric field
ion
magnetic field
double
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59249936A
Other languages
Japanese (ja)
Other versions
JPS61128155A (en
Inventor
武弘 竹田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59249936A priority Critical patent/JPH0658342B2/en
Publication of JPS61128155A publication Critical patent/JPS61128155A/en
Publication of JPH0658342B2 publication Critical patent/JPH0658342B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/022Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Description

【発明の詳細な説明】 イ.産業上の利用分野 本発明は、二重収束型質量分析計における測定スペクト
ルの記録方法に関する。
Detailed Description of the Invention a. BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for recording a measurement spectrum in a double focusing mass spectrometer.

通常、イオン源、電場、磁場、検出器(順配置)または
イオン源、磁場、電場、検出器(逆配置)の順にこれら
を配置してなる二重収束型質量分析計では、電場をイオ
ン加速電圧に応じた一定の値に固定し磁場を走査して、
すなわち磁場をスケールとしてイオン化された試料分子
イオンの質量スペクトルを測定する以外にイオンの開裂
反応を調べることができる。
Normally, in a double-focusing mass spectrometer in which an ion source, an electric field, a magnetic field, and a detector (forward arrangement) or an ion source, a magnetic field, an electric field, and a detector (reverse arrangement) are arranged in this order, the electric field is accelerated by the ions. Fixed to a constant value according to the voltage and scanning the magnetic field,
That is, besides the measurement of the mass spectrum of the ionized sample molecule ions using the magnetic field as a scale, the cleavage reaction of the ions can be investigated.

試料分子のイオン化によって生じたイオンのうち準安定
状態にあって自然に崩壊するイオン或いは外部から導入
した適当な分子との衝突によって活性化されて、更に中
性分子とイオンとに開裂する、このイオンの開裂反応に
おいて、開裂前のもとのイオンを親イオン、開裂によっ
て生じたイオンを娘イオンと呼ぶことにすると、或る質
量の娘イオンがどのような親イオンから生ずるかという
特定質量の娘イオンを生じるすべての親イオンの質量ス
ペクトルは、電場をイオン加速電圧に応じた一定の値に
固定し磁場を走査して測定した試料分子イオンの質量ス
ペクトルと共に試料の分析上重要な情報を与える。
Of the ions generated by the ionization of the sample molecules, the ions are metastable and decay naturally, or are activated by collision with an appropriate molecule introduced from the outside, and are further cleaved into neutral molecules and ions. In the ion cleavage reaction, the original ion before the cleavage is called the parent ion, and the ion generated by the cleavage is called the daughter ion. The mass spectra of all parent ions that give rise to daughter ions give important information for the analysis of the sample along with the mass spectra of sample molecular ions measured by scanning the magnetic field with the electric field fixed at a constant value according to the ion acceleration voltage. .

本発明は、上述した両質量スペクトルの記録方法に関す
る。
The present invention relates to the above-mentioned method for recording both mass spectra.

ロ.従来の技術 イオン源からイオン加速電圧によって所定エネルギーま
で加速されたイオン(親イオン)が電場に入る前に幾つ
かの娘イオンに分解(開裂)した場合、特定の質量mの
娘イオンを生じるすべての親イオンの質量スペクトル
は、二重収束型質量分析計を用い電場と磁場の二乗との
比を一定に保ちながら電場及び磁場を走査する、いわゆ
るリンクドスキャニング法によって測定することができ
る。
B. 2. Description of the Related Art When an ion (parent ion) accelerated to a predetermined energy by an ion accelerating voltage from an ion source is decomposed (split) into several daughter ions before entering an electric field, all the daughter ions having a specific mass m are produced. The parent ion mass spectrum can be measured by a so-called linked scanning method in which the electric field and the magnetic field are scanned using a double-focusing mass spectrometer while keeping the ratio of the electric field to the square of the magnetic field constant.

二重収束質量分析計において、イオン加速電圧をVa
c、磁場をBとすると、磁場を通過する通常のイオンの
質量Mは比例定数をCとして 通常の質量分析では電場Eoを運動のエネルギーeVa
c(eは電子の電荷)を有するイオンが通過するように
設定する。イオン開裂反応では親イオンも娘イオンも同
じ速度を持つているので、親イオンの質量をM,娘イオ
ンの質量をmとし、イオン加速電圧Vacにおける速度
をvとすると、親イオンの運動のエネルギーKoは 娘イオンの運動のエネルギーKは 故に こゝで質量mの娘イオンを生ずる親イオンの質量スペク
トルを測定する場合を考える。質量mの娘イオンが磁場
に入射するときの運動のエネルギーは上記(2)式で与え
られ、これは質量mのイオンの加速電圧が(m/M)V
acになつたのと等価であるから、このイオンが磁場を
通過できるためには磁場B′は前記(1)式によつて またこのイオンが電場を通過するためには、電場Eはエ
ネルギー(m/M) eVac に対して (3)式は変形して (4)(5)式でVac,Eo及びCは定数であり、mを或る
値に決めると、 となり、E対B′の比を一定に保ちながらE及びBを
走査させることにより質量mの娘イオンを生じる親イオ
ンMの走査を行うことができる。
In the double focusing mass spectrometer, the ion acceleration voltage is Va
c and the magnetic field is B, the mass M of an ordinary ion passing through the magnetic field is C In ordinary mass spectrometry, the electric field Eo is used as the kinetic energy eVa.
It is set so that ions having c (e is the charge of the electron) pass through. Since the parent ion and the daughter ion have the same velocity in the ion cleavage reaction, if the mass of the parent ion is M, the daughter ion mass is m, and the velocity at the ion acceleration voltage Vac is v, the kinetic energy of the parent ion is Ko is The kinetic energy K of the daughter ion is Therefore Consider the case of measuring the mass spectrum of a parent ion which produces a daughter ion of mass m. The kinetic energy when a daughter ion of mass m is incident on the magnetic field is given by the above equation (2), and the acceleration voltage of the ion of mass m is (m / M) V
Since it is equivalent to becoming ac, in order for this ion to pass through the magnetic field, the magnetic field B ′ is And in order for these ions to pass through the electric field, the electric field E is to the energy (m / M) eVac Equation (3) is transformed In equations (4) and (5), Vac, Eo, and C are constants, and if m is set to a certain value, Therefore, by scanning E and B while keeping the ratio of E to B ′ 2 constant, the parent ion M that produces daughter ions of mass m can be scanned.

さて従来は上述したリンクドスキヤンニングの方法によ
つて得られた親イオンの質量スペクトルをそれだけで単
独に記録表示していたので、試料についての総合的な情
報を得るためには別に記録されている通常の質量スペク
トルと突合せて見る必要があつて不便であつた。
By the way, conventionally, the mass spectrum of the parent ion obtained by the above-mentioned linked scanning method was recorded and displayed by itself, so in order to obtain comprehensive information about the sample, it was recorded separately. It was inconvenient because it was necessary to compare it with the usual mass spectrum.

ハ.発明が解決しようとする問題点 二重収束質量分析計における測定結果の上述した従来の
表示方法の実際活用上の不便さを解消しようとするもの
である。
C. Problems to be Solved by the Invention An object of the present invention is to solve the inconvenience in practical use of the above-mentioned conventional display method of the measurement result in the double-convergence mass spectrometer.

ニ.問題点解決のための手段 通常の質量スペクトルの記録と並べて親イオンの質量ス
ペクトルを記録するようにした。
D. Means for Solving Problems The mass spectrum of the parent ion was recorded side by side with the normal mass spectrum recording.

ホ.実施例 図は本発明の一実施例を示す。この図で横軸の目盛は質
量であり、縦軸はイオンの検出強度を示す。下の横軸ラ
イン上に上向きに延びるスペクトル記録は通常の質量ス
ペクトルを示し、上の横軸ラインから下向きに延びるス
ペクトル記録が親イオンの質量スペクトルである。前記
(4), (5)式に従つてB′/E=一定の関係に保ちなが
らB及びEを走査してリンクスキヤンニングを行うと、
E=Eo, において質量mの親イオンそのものが検出され、他の親
イオンは全てmより質量が大きいから、親イオンの質量
スペクトルで最小質量のピークは指定した質量の娘イオ
ンを表わし、第1図でmがこの娘イオンである。両スペ
クトルの記録で質量目盛の位置を一致させておくと、両
スペクトルのピークが重なつて判り難くなるので、この
実施例では娘イオンスペクトル記録の質量目盛を少し左
へずらせて両スペクトルのピークが重ならぬようにして
ある。
E. Embodiment FIG. Shows an embodiment of the present invention. In this figure, the scale on the horizontal axis indicates mass, and the vertical axis indicates the detected intensity of ions. The spectral record extending upward on the lower horizontal axis line represents the normal mass spectrum, and the spectral record extending downward from the upper horizontal axis line is the mass spectrum of the parent ion. The above
According to the equations (4) and (5), when scanning B and E while maintaining the relation of B ′ 2 / E = constant and performing link scanning,
E = Eo, In FIG. 1, the parent ion of mass m is detected and all the other parent ions have masses larger than m. Therefore, the peak of the minimum mass in the mass spectrum of the parent ion represents the daughter ion of the specified mass. This is the daughter Aeon. If the positions of the mass scales are made to coincide in the recording of both spectra, the peaks of both spectra will be difficult to understand because they overlap, so in this example, the mass scale of the daughter ion spectrum recording is slightly shifted to the left to show the peaks of both spectra. So that they do not overlap.

本発明は上述したようなグラフ表示に限定されないで、
テーブルによる数字表示でもよいことは云うまでもな
い。
The present invention is not limited to the graph display as described above,
It goes without saying that the numbers may be displayed on a table.

ヘ.効 果 本発明によれば一試料に関する二種の質量スペクトルが
並べて表示されているので、二種の質量スペクトルの記
録の整理が楽になり、スペクトル構成の理解が大へん容
易になる。
F. Effect According to the present invention, since two kinds of mass spectra for one sample are displayed side by side, the records of the two kinds of mass spectra can be organized easily, and the understanding of the spectrum structure is greatly facilitated.

【図面の簡単な説明】[Brief description of drawings]

図は本発明による測定結果記録の一例を示すものであ
る。
The figure shows an example of measurement result recording according to the present invention.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】イオン源、電場又は磁場、磁場又は電場、
検出器の順にこれらを配置してなる二重収束型質量分析
計において、電場対磁場の二乗との比を一定に保ちなが
ら電場及び磁場を走査して、イオン源からイオン加速電
圧によって所定エネルギーまで加速されたイオンが電場
に入る前に開裂反応により分解生成して特定の質量の娘
イオンを生じるすべての親イオンのスペクトルを測定
し、同じ試料について電場をイオン加速電圧に応じた一
定の値に固定し磁場を走査して質量スペクトルを測定
し、これら両スペクトルを同じ質量目盛によって並べて
記録することを特徴とする二重収束型質量分析計の測定
スペクトル記録方法。
1. An ion source, an electric field or a magnetic field, a magnetic field or an electric field,
In a double-focusing mass spectrometer that arranges these in the order of detectors, the electric field and the magnetic field are scanned while keeping the ratio of the electric field to the square of the magnetic field constant, and from the ion source to the predetermined energy by the ion acceleration voltage. Before the accelerated ions enter the electric field, the spectra of all parent ions that are decomposed and produced by the cleavage reaction to generate daughter ions of a specific mass are measured, and the electric field is set to a constant value according to the ion acceleration voltage for the same sample. A method for recording a measurement spectrum of a double-convergence mass spectrometer, which comprises fixing and scanning a magnetic field to measure a mass spectrum, and recording both of these spectra side by side with the same mass scale.
JP59249936A 1984-11-26 1984-11-26 Recording method of measured spectrum of double-focusing mass spectrometer Expired - Lifetime JPH0658342B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59249936A JPH0658342B2 (en) 1984-11-26 1984-11-26 Recording method of measured spectrum of double-focusing mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59249936A JPH0658342B2 (en) 1984-11-26 1984-11-26 Recording method of measured spectrum of double-focusing mass spectrometer

Publications (2)

Publication Number Publication Date
JPS61128155A JPS61128155A (en) 1986-06-16
JPH0658342B2 true JPH0658342B2 (en) 1994-08-03

Family

ID=17200372

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59249936A Expired - Lifetime JPH0658342B2 (en) 1984-11-26 1984-11-26 Recording method of measured spectrum of double-focusing mass spectrometer

Country Status (1)

Country Link
JP (1) JPH0658342B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7022980B2 (en) * 2004-02-02 2006-04-04 Agilent Technologies, Inc. Spectral axis transform

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5075486A (en) * 1973-11-05 1975-06-20

Also Published As

Publication number Publication date
JPS61128155A (en) 1986-06-16

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