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JPH0658730B2 - Element for thin film magnetic head and method for manufacturing thin film magnetic head - Google Patents
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JPH0658730B2 - Element for thin film magnetic head and method for manufacturing thin film magnetic head - Google Patents

Element for thin film magnetic head and method for manufacturing thin film magnetic head

Info

Publication number
JPH0658730B2
JPH0658730B2 JP60061258A JP6125885A JPH0658730B2 JP H0658730 B2 JPH0658730 B2 JP H0658730B2 JP 60061258 A JP60061258 A JP 60061258A JP 6125885 A JP6125885 A JP 6125885A JP H0658730 B2 JPH0658730 B2 JP H0658730B2
Authority
JP
Japan
Prior art keywords
magnetic
groove
magnetic head
film
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60061258A
Other languages
Japanese (ja)
Other versions
JPS61220113A (en
Inventor
秀治 折原
憲男 柴田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Victor Company of Japan Ltd
Original Assignee
Victor Company of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Victor Company of Japan Ltd filed Critical Victor Company of Japan Ltd
Priority to JP60061258A priority Critical patent/JPH0658730B2/en
Publication of JPS61220113A publication Critical patent/JPS61220113A/en
Publication of JPH0658730B2 publication Critical patent/JPH0658730B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/31Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3109Details
    • G11B5/313Disposition of layers
    • G11B5/3133Disposition of layers including layers not usually being a part of the electromagnetic transducer structure and providing additional features, e.g. for improving heat radiation, reduction of power dissipation, adaptations for measurement or indication of gap depth or other properties of the structure
    • G11B5/314Disposition of layers including layers not usually being a part of the electromagnetic transducer structure and providing additional features, e.g. for improving heat radiation, reduction of power dissipation, adaptations for measurement or indication of gap depth or other properties of the structure where the layers are extra layers normally not provided in the transducing structure, e.g. optical layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11BINFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127Structure or manufacture of heads, e.g. inductive
    • G11B5/31Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3163Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers
    • G11B5/3166Testing or indicating in relation thereto, e.g. before the fabrication is completed

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Magnetic Heads (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は薄膜磁気ヘッド用素体及び薄膜磁気ヘッドの製
造方法に係り、特に高い寿命寸法精度で先端の研磨加工
を行ない得る薄膜磁気ヘッド用素体及び薄膜磁気ヘッド
の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an element body for a thin film magnetic head and a method for manufacturing a thin film magnetic head, and more particularly to an element body for a thin film magnetic head capable of polishing a tip with a high life dimension accuracy. And a method of manufacturing a thin film magnetic head.

従来の技術 薄膜磁気ヘッドには種々の構造のものがあり、その一種
としては磁性体基板の一部に溝部を機械加工により形成
し、この溝部にガラス、セラミック等の非磁性絶縁体を
充填した上で、この非磁性絶縁体に膜状コイル及び膜状
コアを順次膜成形してなる薄膜磁気ヘッドがある。
BACKGROUND ART There are various types of thin-film magnetic heads, one of which is one in which a groove is formed by machining on a part of a magnetic substrate, and the groove is filled with a non-magnetic insulator such as glass or ceramic. In the above, there is a thin film magnetic head formed by sequentially forming a film coil and a film core on the non-magnetic insulator.

上記構成の薄膜磁気ヘッドは製品コストの低減を計るた
め一枚の磁性体基板上に一度に多数の磁気ヘッドチップ
が形成される。よって非磁性絶縁体の充填される溝部も
機械加工により複数本一括的に形成される。この複数本
の溝部が形成された磁性体基板には非磁性絶縁体の充填
工程、所定パターン形状に膜状にコイル及び膜状コアが
形成される工程等が実施され、多数の磁気ヘッドチップ
が同時に形成される。この多数の磁気ヘッドチップが形
成された磁性体基板は各磁気ヘッドチップ毎に切り離さ
れ保護基板を接着した上で磁気ヘッドの先端面を研磨加
工する。この研磨加工の際、寿命寸法(溝部の磁気ヘッ
ドとなる方向の縁部と磁気ヘッド先端面との距離)を精
度良く出す必要があるため磁気ヘッドの先端面近傍位置
に寿命寸法を測定するマーク又は素子の配設しこれを見
ながら磁気ヘッド先端面の研磨加工を行なっている。こ
の寿命寸法を測定するマーク及び素子は膜状コイルの形
成時にホトリソグラフィを用いて形成していた。
In the thin film magnetic head having the above structure, a large number of magnetic head chips are formed at one time on one magnetic substrate in order to reduce the product cost. Therefore, a plurality of grooves filled with the non-magnetic insulator are collectively formed by machining. The magnetic substrate on which the plurality of grooves are formed is subjected to a nonmagnetic insulator filling step, a step of forming a coil and a film core in a film shape in a predetermined pattern shape, etc. Formed at the same time. The magnetic substrate on which a large number of magnetic head chips are formed is separated for each magnetic head chip, a protective substrate is adhered, and the tip end surface of the magnetic head is polished. At the time of this polishing process, it is necessary to accurately measure the life size (the distance between the edge of the groove in the direction of the magnetic head and the front face of the magnetic head), so a mark for measuring the life size near the front face of the magnetic head. Alternatively, the element is arranged and the magnetic head front end surface is polished while observing the element. The marks and elements for measuring the life size were formed by using photolithography when forming the film coil.

発明が解決しようとする問題点 しかるに上記従来の薄膜磁気ヘッド用素体及び薄膜磁気
ヘッドの製造方法では、寿命寸法を測定するマーク及び
素子はホトリソグラフィ等の光学的手段を用いて所定位
置に非常に精度良く(約1μm以下の誤差)形成するこ
とができるが、寿命寸法の基準となる位置は磁性体基板
に設けられた溝部の磁気ヘッド先端となる方向の側縁部
であり、溝部は機械加工されるためその精度は光学的手
段によるパターン形成精度と比較してかなり劣る(約5
〜10μmの誤差)。従って光学的手段にて精度良く位
置決めがされたマーク又は素子を見ながら磁気ヘッドの
先端面研磨を行なっても、寿命寸法の基準となる溝部の
側縁部の位置に大なる誤差が生じているため寿命寸法の
精度は機械加工によ精度の低い溝部の加工精度に順ずる
ため、精度良く寿命寸法を決めることができず、従って
各磁気ヘッドの寿命寸法にはバラツキが生じ歩留まり良
く薄膜磁気ヘッドを製造することができないという問題
点があった。
DISCLOSURE OF THE INVENTION Problems to be Solved by the Invention However, in the above-described conventional thin film magnetic head element body and method of manufacturing a thin film magnetic head, the marks and elements for measuring the life size are extremely positioned at predetermined positions by using optical means such as photolithography. Can be formed accurately (with an error of about 1 μm or less), but the reference position of the life size is the side edge of the groove provided on the magnetic substrate in the direction of the tip of the magnetic head. Since it is processed, its accuracy is considerably inferior to that of pattern formation by optical means (about 5
Error of -10 μm). Therefore, even if the tip surface of the magnetic head is polished while observing the marks or elements accurately positioned by the optical means, a large error occurs in the position of the side edge portion of the groove portion which becomes the reference of the life size. Therefore, the accuracy of the life size follows the machining accuracy of the groove, which is low in precision due to machining, so the life size cannot be determined accurately, and therefore the life size of each magnetic head varies and the yield is good. However, there is a problem in that it cannot be manufactured.

そこで、本発明は薄膜磁気ヘッド用素体及び薄膜磁気ヘ
ッドの製造方法において、寿命寸法を所定値に精密に加
工でき、しかも製造工程を簡略化出来るようにし、それ
により、正確な寿命寸法を有する且つ製造歩留りの良好
で製品コストの安価な薄膜磁気ヘットが得られる薄膜磁
気ヘッド用素体及び薄膜磁気ヘッドの製造方法を提供す
る事を目的とする。
Therefore, in the present invention, in the thin film magnetic head element body and the method for manufacturing the thin film magnetic head, the life size can be precisely processed to a predetermined value, and the manufacturing process can be simplified, thereby providing an accurate life size. Another object of the present invention is to provide an element body for a thin film magnetic head and a method for manufacturing the thin film magnetic head, which can obtain a thin film magnetic head having a good production yield and a low product cost.

問題点を解決するための手段 上記問題点を解決するために本発明では、磁性体の一部
に溝部を形成し、前記溝部に非磁性絶縁体を充填し、前
記非磁性絶縁体に膜状コイル及び膜状コアを順次成形し
てなり、研磨加工が行なわれることにより薄膜磁気ヘッ
ドとされる薄膜磁気ヘッド用素体において、 前記非磁性絶縁体が充填されている前記溝部と磁気ヘッ
ド先端となる方向の前記磁性体との境界部分に前記非磁
性絶縁体と前記磁性体にまたがってホトリソグラフィ等
の光学的手段により形成され、内部に非磁性体又は導電
材が充填され、その媒体対向面端部が寿命寸法零を規定
する基準溝と、 前記基準溝から所定距離離間して、前記光学的手段によ
り前記基準溝の形成と同時に形成され前記基準溝までの
距離を示す指標とを具備してなる。
Means for Solving the Problems In order to solve the above problems, in the present invention, a groove is formed in a part of a magnetic body, the groove is filled with a non-magnetic insulator, and the non-magnetic insulator is formed into a film shape. A thin-film magnetic head element formed by sequentially forming a coil and a film-shaped core and performing a polishing process to form a thin-film magnetic head, wherein the groove portion filled with the non-magnetic insulator and the magnetic head tip Is formed by an optical means such as photolithography over the non-magnetic insulator and the magnetic substance at the boundary portion with the magnetic substance in the direction where the medium facing surface is filled with the non-magnetic substance or the conductive material. An end portion defines a reference groove that defines a life size of zero, and a reference groove that is spaced apart from the reference groove by a predetermined distance and that is formed simultaneously with the formation of the reference groove by the optical means and that indicates a distance to the reference groove. It becomes.

また磁性体の一部を溝部を形成し、前記溝部に非磁性絶
縁体を充填し、前記非磁性絶縁体に膜状コイル及び膜状
コアを順次成形してなる薄膜磁気ヘッドの製造方法にお
いて、 前記非磁性体が充填されている前記溝部と磁気ヘッド先
端方向の前記磁性体との境界部分に前記非磁性絶縁体と
前記磁性体にまたがって設けられ、その媒体対向面端部
が寿命寸法零を規定する基準溝と、前記基準溝から所定
距離離間した位置に設けられ、前記基準溝までの距離を
示す指標とをホトリソグラフィ等の光学的手段により同
時に形成する工程と、 前記基準溝に非磁性体又は導電材を充電する工程と、 前記指標により前記基準溝までの距離を測定しつつ前記
磁気ヘッド先端面の研磨加工を行なう工程とを具備して
なる。
In a method of manufacturing a thin film magnetic head, wherein a groove is formed in a part of a magnetic material, the groove is filled with a non-magnetic insulator, and a film coil and a film core are sequentially formed in the non-magnetic insulator. The nonmagnetic insulator is provided at the boundary between the groove filled with the nonmagnetic substance and the magnetic substance in the direction of the magnetic head tip, and the medium facing surface end portion has a life size of zero. And a step of forming a reference groove that defines a distance from the reference groove at a predetermined distance from the reference groove and forming an index indicating the distance to the reference groove at the same time by an optical means such as photolithography; The method comprises a step of charging a magnetic material or a conductive material, and a step of polishing the tip surface of the magnetic head while measuring the distance to the reference groove by the index.

さらに、上記製造方法において、前記基準溝及び前記指
標を形成する工程で、導電材が充填されることにより前
記膜状コイルが形成されるコイル用溝を前記光学手段に
より同時に形成してなる。
Further, in the above manufacturing method, in the step of forming the reference groove and the index, a coil groove in which the film coil is formed by being filled with a conductive material is simultaneously formed by the optical means.

実施例 第1図に本発明になる薄膜磁気ヘッド用素体の一実施例
を示す。同図に示す薄膜磁気ヘッド用素体1は大略、基
板2上に夫々薄膜法により形成されてなる膜状コア3と
膜状コイル4(図中梨地で示す)等より構成される。基
板2はセンダスト(登録商標)、フェライト等の軟磁性
体よりなり薄膜磁気ヘッド1の一方のコアを形成するも
のである。この基板2の所定位置には溝部5が機械加工
により刻設されると共にこの溝部5にはガラス或はセラ
ミック等の非磁性絶縁体6(図中斜線で示す)が溶融充
填されている。また非磁性絶縁体6の上面には後述する
膜状のコイル4のうち膜状コア3の下面に配設される下
部コイル4bが形成されている。この下部コイル4bは
光学的手段(ホトリソグラフィ等)によりパターン形成
されたコイル溝7にAl,Cu等の導電材を充填するこ
とにより形成されている。コイル溝7は非磁性絶縁体6
上に所定ターン数に対応して複数形成されるが、その中
で一番磁気ヘッド先端面8(記録媒体と摺接する面)寄
りのコイル溝は、非磁性絶縁体6と基板2にまたがって
形成された寿命寸法の基準となる基準溝9となってい
る。基準溝9にはコイル溝7と同様に導電材が充填され
ており、且つ基準溝9の非磁性絶縁体6と基板2にまた
がって形成され、その媒体対向面端部は寿命寸法零を規
定する。寿命寸法の基準位置は図中矢印Bで示す側縁と
なる。寿命寸法(薄膜磁気ヘッド1の寿命寸法を図中矢
印Hで示す)は磁気ヘッドの強度、耐久性及び磁気記録
再生特性に大なる影響を及ぼすため高精度に決める必要
がある。特に薄膜磁気ヘッド1においては上記影響は大
であるため、1μm程度の誤差範囲内で寿命寸法を決め
る必要がある。後で詳述する如く、一般に寿命寸法を決
めるため磁気ヘッド先端面8を研磨加工する際、予め磁
気ヘッド先端面8近傍位置に第2図に示すようマーク、
素子をホトリソグラフィ技術等を用いて設けておき、こ
れを見ながら研磨加工を実施する。上記の如く基準溝9
及びマーク、素子は共に光学的手段により、同時に設け
られるため、極めて精度良く位置決めされており、且つ
磁気ヘッド先端面8の研磨加工精度も極めて高いため寿
命寸法は非常に精度良く決定される。
EXAMPLE FIG. 1 shows an example of an element body for a thin film magnetic head according to the present invention. The thin-film magnetic head body 1 shown in the figure is generally composed of a film-shaped core 3 and a film-shaped coil 4 (shown by satin in the figure) formed on a substrate 2 by a thin-film method. The substrate 2 is made of a soft magnetic material such as Sendust (registered trademark) or ferrite and forms one core of the thin film magnetic head 1. A groove 5 is machined at a predetermined position of the substrate 2, and the groove 5 is melt-filled with a non-magnetic insulator 6 (shown by diagonal lines in the figure) such as glass or ceramic. On the upper surface of the non-magnetic insulator 6, a lower coil 4b of the film coil 4 to be described later, which is disposed on the lower surface of the film core 3, is formed. The lower coil 4b is formed by filling the coil groove 7 patterned by optical means (such as photolithography) with a conductive material such as Al or Cu. The coil groove 7 is a non-magnetic insulator 6
A plurality of coils are formed on the upper surface in correspondence with a predetermined number of turns. Among them, the coil groove closest to the magnetic head tip surface 8 (the surface in sliding contact with the recording medium) extends over the non-magnetic insulator 6 and the substrate 2. The reference groove 9 serves as a reference for the formed life dimension. Similar to the coil groove 7, the reference groove 9 is filled with a conductive material and is formed so as to straddle the non-magnetic insulator 6 of the reference groove 9 and the substrate 2. The medium facing surface end of the reference groove 9 defines a life size of zero. To do. The reference position for the life size is the side edge indicated by arrow B in the figure. The life size (the life size of the thin-film magnetic head 1 is indicated by an arrow H in the figure) has a great influence on the strength, durability and magnetic recording / reproducing characteristics of the magnetic head, and therefore must be determined with high accuracy. Especially in the thin-film magnetic head 1, since the above-mentioned influence is great, it is necessary to determine the life size within an error range of about 1 μm. As will be described later in detail, when polishing the magnetic head front end surface 8 in order to determine the life size, in general, a mark as shown in FIG.
The element is provided by using a photolithography technique or the like, and the polishing process is performed while observing the element. Reference groove 9 as described above
Since both the mark and the element are provided at the same time by the optical means, they are positioned with extremely high accuracy, and the polishing accuracy of the magnetic head tip surface 8 is also extremely high, so that the life size is determined with high accuracy.

下部コイル4b及び基準溝9が形成されてなる基板2上
には例えばSiOよりなる絶縁層10を介して膜状コ
ア3が形成されている。膜状コア3はセンダスト、パ−
マロイ、Co−Zr系アモルファス等の高飽和磁束密度
を有する難磁性体よりなり磁性基板2とギャップ材とな
る絶縁層10を介してギャップ11を形成する。この膜
状コア3は基板2に形成された下部コイル4bの上部に
形成され、所定長さに亘って延在する。また膜状コア3
は飽和磁化を高めるためその厚さ寸法を比較的大(約5
μm)に選定されている。
The film core 3 is formed on the substrate 2 in which the lower coil 4b and the reference groove 9 are formed, with the insulating layer 10 made of, for example, SiO 2 interposed therebetween. Membrane core 3 is sendust,
A gap 11 is formed via a magnetic substrate 2 made of a hard magnetic material having a high saturation magnetic flux density such as Malloy or Co-Zr type amorphous, and an insulating layer 10 serving as a gap material. The film core 3 is formed on the lower coil 4b formed on the substrate 2 and extends over a predetermined length. Also the membranous core 3
Has a relatively large thickness (about 5
μm).

膜状コア3の上面には絶縁層(図示せず)を介して上部
コイル4aがパターン形成されており、下部コイル4b
と共に膜状コイル4を形成し膜状コア3を励磁する。膜
状コア3、膜状コイル4が形成された基板2上には、セ
ラミック等よりなる保護基板(第1図には図示せず)が
着接されており、薄膜磁気ヘッド用素体1の強度を強く
している。
An upper coil 4a is patterned on the upper surface of the film core 3 with an insulating layer (not shown) interposed therebetween, and a lower coil 4b is formed.
At the same time, the film coil 4 is formed to excite the film core 3. A protective substrate (not shown in FIG. 1) made of ceramic or the like is attached on the substrate 2 on which the film core 3 and the film coil 4 are formed. The strength is getting stronger.

本発明になる薄膜磁気ヘッドの製造方法の一実施例を第
3図から第10図を用いて製造手順に従い以下説明す
る。なお、第1図で示した薄膜磁気ヘッド用素体1と同
一構成については同一符号を付して説明する。また以下
説明する製造工程において、磁気ヘッドチップの切断工
程前の各工程は一枚の磁性体基板上の多数個所に一括的
に実施され同時に多数の磁気ヘッドチップを形成する
が、説明の便宜上その内のひとつの磁気ヘッドチップを
拡大して図示し、これを説明することとする。
An embodiment of a method of manufacturing a thin film magnetic head according to the present invention will be described below with reference to FIGS. 3 to 10 according to a manufacturing procedure. The same components as those of the thin film magnetic head element body 1 shown in FIG. 1 are designated by the same reference numerals. Further, in the manufacturing process described below, each step before the cutting step of the magnetic head chip is collectively carried out at a large number of places on one magnetic substrate to form a large number of magnetic head chips at the same time. One of the magnetic head chips is shown in an enlarged manner and will be described.

第3図中、2はセンダストまたはフェライト等の強磁性
材よりなる基板で、基板2上には逆台形状の溝部5が加
工される。この溝部5の加工法は機械加工によるダイヤ
モンドカッティング、化学加工によるケミカルエッチン
グまたは物理加工によるスパッタエッチングなどにより
可能である(一般的には機械加工される)。溝部5に非
磁性かつ無機質の非磁性絶縁体6(図中梨地で示す)、
例えば、鉛ガラスであれば、これも基板2の表面より若
干高くなるように溶融充填する。また、非磁性絶縁体6
はAlまたはSiOを蒸着等で形成してもよ
い。非磁性絶縁体6を充填後、その表面を研磨して第4
図に示す如く基板2と鉛ガラスとの表面を同一面にす
る。この同一面上の非磁性絶縁体6と基板2との境界が
溝部端部16となる。
In FIG. 3, reference numeral 2 denotes a substrate made of a ferromagnetic material such as sendust or ferrite, and an inverted trapezoidal groove 5 is formed on the substrate 2. The groove 5 can be processed by diamond cutting by mechanical processing, chemical etching by chemical processing or sputter etching by physical processing (generally mechanical processing). A non-magnetic and inorganic non-magnetic insulator 6 (indicated by satin in the figure) in the groove portion 5,
For example, in the case of lead glass, this is also melt-filled so as to be slightly higher than the surface of the substrate 2. In addition, the non-magnetic insulator 6
May be formed by vapor deposition of Al 2 O 3 or SiO 2 . After filling the non-magnetic insulator 6, the surface is polished and the fourth
As shown in the figure, the surfaces of the substrate 2 and the lead glass are flush with each other. The boundary between the non-magnetic insulator 6 and the substrate 2 on the same surface serves as the groove end 16.

このように研磨された基板2の上部にホトレジストを均
一に塗布し、ホトマスクで覆い、光照射、現像等の工程
を経て、非磁性絶縁体6を表面に下部コイル4b用のパ
ターン、基準溝9用のパターン及びマーク12用のパタ
ーンを描き、例えばエッチング等によりコイル溝7、基
準溝9及びマーク用溝12aを形成する(第5図に示
す)。第5図に示す如く、この時、基準溝9の位置は、
溝部端部16を基準溝9内に含むように配置される。
A photoresist is evenly applied to the upper portion of the substrate 2 thus polished, covered with a photomask, and subjected to steps such as light irradiation and development, and then the non-magnetic insulator 6 is used as a surface for the pattern for the lower coil 4b and the reference groove 9. A pattern for mark and a pattern for mark 12 are drawn, and the coil groove 7, the reference groove 9 and the mark groove 12a are formed by etching or the like (shown in FIG. 5). At this time, as shown in FIG. 5, the position of the reference groove 9 is
It is arranged so that the groove end 16 is included in the reference groove 9.

上記の如く、基準溝9とマーク用溝12aは共に光学的
手段により同時に形成されるため高精度に位置決めされ
て形成される。よって基準溝9とマーク用溝12aの離
間距離も所定寸法に高精度(1μm以下の誤差)に決め
られる。後述する如く、寿命寸法を決定するための磁気
ヘッド先端面8の研磨加工は、マーク12を見ながら行
なわれるが、寿命寸法の基準となる基準溝9及び研磨加
工の目安となるマーク12用溝12aが共に光学的手段
により同時に形成されるため、高精度の寿命寸法を決め
ることできる。またマーク溝12aの内、一番小なるマ
ーク溝12a-1の磁気ヘッド先端面8方向の端縁(図中
矢印Cで示す)と基準溝9の磁気ヘッド先端面8方向の
側縁(図中矢印Bで示す)の離間距離は、所定寿命寸法
と等しくなるよう選定されている。なお他のマーク溝1
2a-2,12a-3は夫々所定寸法にて形成されている。
As described above, both the reference groove 9 and the mark groove 12a are formed at the same time by the optical means, so that they are positioned with high precision. Therefore, the separation distance between the reference groove 9 and the mark groove 12a is also determined to a predetermined dimension with high accuracy (error of 1 μm or less). As will be described later, the polishing process of the magnetic head tip surface 8 for determining the life size is performed while observing the mark 12, but the reference groove 9 that serves as a reference for the life size and the groove for the mark 12 that serves as a guide for the polishing process. Since both 12a are formed at the same time by optical means, the life size can be determined with high accuracy. Further, among the mark grooves 12a, the edge of the smallest mark groove 12a -1 in the direction of the magnetic head tip surface 8 (indicated by arrow C in the figure) and the side edge of the reference groove 9 in the direction of the magnetic head tip surface 8 (see the figure) The separation distance (indicated by the middle arrow B) is selected to be equal to the predetermined life size. Still other mark groove 1
2a -2 and 12a -3 are formed with predetermined dimensions.

基準溝9は非磁性絶縁体6が充填されている溝部5と磁
気ヘッド先端面8となる方向の磁性体基板2との境界部
分に、第6図に示す如く非磁性絶縁体6と磁性体基板2
にまたがるよう位置決めされて形成される。よって基準
溝9のエッチングは異なる材質である非磁性絶縁体6と
磁性体基板2を同時にエッチングする必要があるため、
基準溝9のみ反応性イオンエッチングにて加工しても良
い。なお第6図は第5図のA−A線に沿う断面図であ
り、コイル溝7の深さはdである。またコイル溝7は溝
部5に対して長手方向に設けられており、このコイル溝
7のそれぞれの数は薄膜磁気ヘッド1の膜状コイル4の
巻数を決定するものである。
The reference groove 9 is formed at the boundary between the groove portion 5 filled with the non-magnetic insulator 6 and the magnetic substrate 2 in the direction of the magnetic head tip surface 8 as shown in FIG. Board 2
Is formed so as to extend over the Therefore, the etching of the reference groove 9 needs to simultaneously etch the non-magnetic insulator 6 and the magnetic substrate 2 which are different materials,
Only the reference groove 9 may be processed by reactive ion etching. 6 is a sectional view taken along the line AA of FIG. 5, and the depth of the coil groove 7 is d. The coil groove 7 is provided in the longitudinal direction with respect to the groove portion 5, and the number of each of the coil grooves 7 determines the number of turns of the film coil 4 of the thin film magnetic head 1.

コイル溝7、基準溝9及びマーク12を設けるための溝
の加工後、基板2上にA1、またはCu等の非磁性導電
性金属をスパッタリングまたは蒸着等で堆積させる。そ
の厚さはコイル溝7の深さdより大きく堆積させた後、
表面を研磨して鏡面仕上げをすることによりコイル溝7
の深さを最初の深さdより若干小さいd′にし、基板2
上の表面を平坦にし、第8図に示す如く下部コイル4b
を形成する。この際、マーク12用の12a-1,12a
-2,12a-3にも非磁性導電性金属が充填されマーク1
2が形成される(同図には第2図(A)に示すマークが
形成されている)。
After processing the coil groove 7, the reference groove 9 and the groove for providing the mark 12, a non-magnetic conductive metal such as A1 or Cu is deposited on the substrate 2 by sputtering or vapor deposition. After its thickness is deposited larger than the depth d of the coil groove 7,
Coil groove 7 by polishing the surface to give a mirror finish
To a depth d'which is slightly smaller than the initial depth d.
The upper surface is made flat, and the lower coil 4b as shown in FIG.
To form. At this time, 12a -1 , 12a for the mark 12
-2 and 12a -3 are also filled with non-magnetic conductive metal and mark 1
2 is formed (the mark shown in FIG. 2 (A) is formed in the figure).

そして、その上部から磁気ヘッドのギャップを形成する
為に所定の厚さ非磁性の絶縁層(図示せず)をスパッタ
リングまたは蒸着等で形成し、更に下部コイル4bの上
部に磁気コア用にセンダストまたはフェライト等の強磁
性材を公知の方法によりパターン形成し膜状コア3を形
成する(第8部参照)。膜状コア3の幅Lは下部コイ
ル4bの長さLより小さく設定する。そして、膜状コ
ア3の表面に絶縁材(図示せず)を配設し、更に上部コ
イル4aを公知の方法で配設する。上部コイル4aは下
部コイル4bとで膜状コア3を巻回する様に配設されて
おり、上部コイル4aは螺旋状に下部コイル4bと接続
されて膜状コイル4を形成している。なお、上記各工程
は一枚の磁性体基板上に一括的に実施される。従って磁
性体基板上には膜状コア3、膜状コイル4等が夫々形成
された多数の磁気ヘッドチップが形成されている。この
多数の磁気ヘッドチップをダイシングソー等を用いて切
り離し第9図に示す個々の磁気ヘッドチップ13を得
る。
Then, a non-magnetic insulating layer (not shown) having a predetermined thickness is formed from the upper portion of the magnetic head by sputtering, vapor deposition, or the like, and sendust or a magnetic layer for the magnetic core is formed on the lower coil 4b. A ferromagnetic material such as ferrite is patterned by a known method to form the film core 3 (see Part 8). The width L 1 of the film core 3 is set smaller than the length L 2 of the lower coil 4b. Then, an insulating material (not shown) is arranged on the surface of the film core 3, and the upper coil 4a is further arranged by a known method. The upper coil 4a is arranged so as to wind the film core 3 together with the lower coil 4b, and the upper coil 4a is spirally connected to the lower coil 4b to form the film coil 4. The above steps are collectively performed on one magnetic substrate. Therefore, a large number of magnetic head chips each having the film core 3 and the film coil 4 are formed on the magnetic substrate. The large number of magnetic head chips are separated by using a dicing saw or the like to obtain individual magnetic head chips 13 shown in FIG.

磁気ヘッドチップ13上にはセラミック等よりなる保護
基板14(第9図中、一点鎖線で示す)が加圧接着され
る。この保護基板14は強度的に弱い膜状コア3、膜状
コイル4等を保護すると共に薄膜磁気ヘッド1としての
強度を高めるために配設される。
On the magnetic head chip 13, a protective substrate 14 (shown by a chain line in FIG. 9) made of ceramic or the like is pressure-bonded. The protective substrate 14 is provided to protect the film core 3 and the film coil 4 which are weak in strength and to enhance the strength of the thin film magnetic head 1.

続いて保護基板14が接着された磁気ヘッドチップ13
は、その磁気ヘッド先端面8に研磨加工が実施され、所
定形状に研磨されると共に所定寿命寸法が決められる。
上記、一枚の磁性体基板を切り離して個々の磁気ヘッド
チップ13を得る工程において、その切断は機械的切断
手段を用いて行なわれている。よって切断位置決め精度
は悪く、切り離された個々の磁気ヘッドチップ13によ
り基準溝9の側縁(第9図中矢印Bで示す。この位置が
上述の如く寿命寸法の基準となる)と磁気ヘッド先端面
8との離間距離(この離間距離が寿命寸法となる)にも
バラツキが生ずる。このバラツキをなくし所定の寿命寸
法を決定するため、また磁気ヘッド先端面8における磁
気テープとの当りを良好とするために研磨加工が行われ
る。この研磨加工は下部コイル4bの形成工程において
同時に形成されたマーク12を見ながら加工される。マ
ーク12の形成後、マーク12上には膜状コア3、上部
コイル4a、保護基板14等が形成されるため磁気ヘッ
ドチップ13の上部よりマーク12を観察しながらの研
磨加工を行なうことはできない。従って研磨加工に従い
磁気ヘッド先端面8に現われるマーク12を見ながら研
磨加工をする。その手順を第10図を用いて説明する。
なお、第10図に示す各図は磁気ヘッドチップ13の磁
気ヘッド先端面8を見た図である。また各図中の梨地で
示す15は保護基板14を接着するための接着材層であ
る。例えば一枚の磁性体基板を切り離し磁気ヘッドチッ
プ13を得た際、第10図(A)に示す如くその磁気ヘ
ッド先端面8にひとつのマーク12-3が現われていたと
する。上記の如く寿命寸法は3本のマーク12の内、一
番小なるマーク12-1に位置決めされているため、寿命
寸法までまだかなり研磨加工しなければならないことが
このマーク12-3を見ることにより理解される。よって
ある程度の粗削りを実施することも可能で研磨時間を短
縮させることができる。研磨加工を行なっていくと、や
がて2本目のマーク12-2が磁気ヘッド先端面8に現わ
れる(第10図(B)に示す)。このマーク12-2を見
ることにより寿命寸法までは、あと僅かな寸法研磨すれ
ば良いことが理解される。従って研磨速度を落とし微細
研磨を行ない、やがて第10図(C)に示す如く、3本
目のマーク12-1が現われた時点で研磨加工を終了し第
1図に示す薄膜磁気ヘッド1を得る。
Subsequently, the magnetic head chip 13 to which the protective substrate 14 is adhered
The magnetic head tip surface 8 is subjected to polishing to be polished into a predetermined shape and a predetermined life size is determined.
In the step of separating the single magnetic substrate to obtain the individual magnetic head chips 13, the cutting is performed by using a mechanical cutting means. Therefore, the cutting positioning accuracy is poor, and the side edges of the reference groove 9 (indicated by the arrow B in FIG. 9; this position serves as a reference for the life size as described above) and the tip of the magnetic head due to the separated individual magnetic head chips 13. There is also variation in the distance from the surface 8 (this distance becomes the life size). Polishing is performed in order to eliminate this variation and to determine a predetermined life size, and to make the magnetic head tip surface 8 contact the magnetic tape well. This polishing process is performed while observing the marks 12 simultaneously formed in the process of forming the lower coil 4b. After the mark 12 is formed, the film-shaped core 3, the upper coil 4a, the protective substrate 14, etc. are formed on the mark 12, so that the polishing process cannot be performed while observing the mark 12 from above the magnetic head chip 13. . Therefore, according to the polishing process, the polishing process is performed while observing the mark 12 appearing on the front surface 8 of the magnetic head. The procedure will be described with reference to FIG.
The drawings shown in FIG. 10 are views of the magnetic head tip surface 8 of the magnetic head chip 13. Further, reference numeral 15 indicated by a satin in each figure is an adhesive layer for adhering the protective substrate 14. For example, it is assumed that when a magnetic head chip 13 is obtained by cutting off one magnetic substrate, one mark 12 -3 appears on the magnetic head tip surface 8 as shown in FIG. 10 (A). As described above, since the life size is positioned at the smallest mark 12 -1 of the three marks 12, it is necessary to grind the life size to a considerable extent. Understood by. Therefore, it is possible to carry out rough cutting to some extent, and the polishing time can be shortened. As the polishing process is performed, a second mark 12 -2 appears on the magnetic head front end surface 8 (shown in FIG. 10B). By looking at this mark 12 -2 , it is understood that a slight amount of polishing may be performed until the life size. Therefore, the polishing rate is reduced to perform fine polishing, and when the third mark 12 -1 appears as shown in FIG. 10C, the polishing process is terminated and the thin film magnetic head 1 shown in FIG. 1 is obtained.

上述の如く、マーク12のマーク溝12a及び寿命寸法
の基準となる基準溝9は共に光学的手段により同時に高
精度に位置決めされ、よって寿命寸法となる基準溝9の
側縁Bとマーク溝12a-1の端縁Cの離間距離も高精度
にて所定寸法に決められているため、上記研磨工程に精
度良く寿命寸法を決定することができると共に寿命寸法
のバラツキがなくなるため薄膜磁気ヘッド用素体1より
形成される磁気ヘッドの歩留りをも高めることができ
る。また基準溝9の形成を下部コイル4bの形成工程と
同時に行なうことにより製造工程を簡略化することもで
きる。
As described above, the reference groove 9 as a reference mark grooves 12a and life dimensions of the marks 12 are both positioned with high accuracy at the same time by optical means, therefore the side edge of the reference groove 9 which is a life size B and the mark grooves 12a - Since the distance between the edges C of 1 is also determined to a predetermined size with high accuracy, the life size can be determined with high accuracy in the above polishing step, and the life size variation is eliminated, so that the thin film magnetic head element body is manufactured. The yield of the magnetic head formed of 1 can also be improved. Further, the manufacturing process can be simplified by forming the reference groove 9 simultaneously with the forming process of the lower coil 4b.

発明の効果 以上説明したように、特許請求の範囲第1項による本発
明の薄膜磁気ヘッド用素体は、その媒体対向面端部が寿
命寸法零を規定する基準溝及び基準溝から所定距離離間
して位置し、基準溝までの距離を示す指標とを備えた事
により、寿命寸法を所定値に精密に加工出来るようにな
り、正確な寿命寸法を有し、且つ製造歩留まりの良好で
製品コストの安価な薄膜磁気ヘッドを提供する事が出来
る等の特永を有する。
EFFECTS OF THE INVENTION As described above, in the thin film magnetic head element of the present invention according to the first aspect of the invention, the medium facing surface end of the reference groove defines a life dimension of zero, and the reference groove is separated from the reference groove by a predetermined distance. It is possible to precisely process the service life dimension to a specified value by providing an index indicating the distance to the reference groove, which has an accurate service life dimension, good manufacturing yield, and product cost. It has special features such as being able to provide an inexpensive thin film magnetic head.

また、請求項の範囲第2項による本発明の薄膜磁気ヘッ
ドの製造方法は、前記指標により基準溝までの間隔を測
定しつつ前記磁気ヘッド先端面の研磨加工を行う工程と
よりなる事により、寿命寸法を所定値に精密な加工出来
るようにし、それにより、正確な寿命寸法を有する且つ
製造歩留まりの良好で製品コストの安価な薄膜磁気ヘッ
ドを提供する事が出来る等の特長を有する。
Further, the method of manufacturing a thin film magnetic head according to the second aspect of the present invention comprises the step of polishing the magnetic head tip surface while measuring the distance to the reference groove by the index. The life dimension can be precisely machined to a predetermined value, whereby a thin film magnetic head having an accurate life dimension, a good manufacturing yield, and a low product cost can be provided.

また、特許請求の範囲第3項による薄膜磁気ヘッドの製
造方法は、前記基準溝を形成する工程において前記基準
溝と共に前記膜状コイルとなるべきコイル用溝を同時に
形成する事により、製造工程を簡略化出来るようにし、
それにより、製造歩留まりの良好で製品コストの安価な
薄膜磁気ヘッドを提供する事が出来る等の特長を有す
る。
Further, in the method of manufacturing the thin film magnetic head according to the third aspect of the present invention, the manufacturing process is performed by simultaneously forming the coil for forming the film coil together with the reference groove in the step of forming the reference groove. So that it can be simplified,
As a result, it is possible to provide a thin film magnetic head having a good manufacturing yield and a low product cost.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明になる薄膜磁気ヘッド用素体の一実施例
の斜視図、第2図は磁気ヘッド先端面の研磨加工の際、
加工の目安となる種々のマークを示す図、第3図から第
9図は本発明になる薄膜磁気ヘッドの製造方法の一実施
例をその製造手順に従って説明するための斜視図及び断
面図、第10図は磁気ヘッド先端面の研磨加工手順を説
明するための側面図である。 1……薄膜磁気ヘッド用素体、2……基板、3……膜状
コア、4……膜状コイル、4b……下部コイル、5……
溝部、6……非磁性絶縁体、7……コイル溝、8……磁
気ヘッド先端面、9……基準溝、12,12-1,1
-2,12-3……マーク、12a,12a-1,12
-2,12a-3……マーク用溝、13……磁気ヘッドチ
ップ、16……溝部端部。
FIG. 1 is a perspective view of an embodiment of an element body for a thin film magnetic head according to the present invention, and FIG.
FIGS. 3 to 9 are views showing various marks as a guide for processing, and FIG. 3 to FIG. 9 are perspective views and sectional views for explaining an embodiment of a method of manufacturing a thin film magnetic head according to the present invention in accordance with the manufacturing procedure. FIG. 10 is a side view for explaining the procedure for polishing the front end surface of the magnetic head. 1 ... Element for thin film magnetic head, 2 ... Substrate, 3 ... Membrane core, 4 ... Membrane coil, 4b ... Lower coil, 5 ...
Groove part, 6 ... Non-magnetic insulator, 7 ... Coil groove, 8 ... Magnetic head tip surface, 9 ... Reference groove, 12, 12 -1 , 1,
2 -2 , 12 -3 ... mark, 12a, 12a -1 , 12
a -2 , 12a -3 ... mark groove, 13 ... magnetic head chip, 16 ... groove end.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭58−108017(JP,A) 特開 昭57−113411(JP,A) 特開 昭52−28307(JP,A) 特開 昭56−29832(JP,A) 特開 昭58−128014(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (56) Reference JP-A-58-108017 (JP, A) JP-A-57-113411 (JP, A) JP-A-52-28307 (JP, A) JP-A-56- 29832 (JP, A) JP-A-58-128014 (JP, A)

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】磁性体の一部に溝部を形成し、前記溝部に
非磁性絶縁体を充填し、前記非磁性絶縁体に膜状コイル
及び膜状コアを順次成形してなり、研磨加工が行なわれ
ることにより薄膜磁気ヘッドとされる薄膜磁気ヘッド用
素体において、 前記非磁性絶縁体が充填されている前記溝部と磁気ヘッ
ド先端となる方向の前記磁性体との境界部分に前記非磁
性絶縁体と前記磁性体にまたがってホトリソグラフィ等
の光学的手段により形成され、内部に非磁性体又は導電
材が充填され、その媒体対向面端部が寿命寸法零を規定
する基準溝と、 前記基準溝から所定距離離間して、前記光学的手段によ
り前記基準溝の形成と同時に形成され前記基準溝までの
距離を示す指標とを具備したことを特徴とする薄膜磁気
ヘッド用素体。
1. A groove is formed in a part of a magnetic body, the groove is filled with a non-magnetic insulator, and a film coil and a film core are sequentially formed in the non-magnetic insulator, which is polished. In a thin-film magnetic head element body that is formed into a thin-film magnetic head, the non-magnetic insulating material is formed at a boundary portion between the groove portion filled with the non-magnetic insulating material and the magnetic material in a direction toward the tip of the magnetic head. A reference groove formed over the body and the magnetic body by optical means such as photolithography, filled with a non-magnetic body or a conductive material, and the medium facing surface end portion of which defines a life dimension of zero; An element body for a thin-film magnetic head, comprising: an index which is formed at a predetermined distance from the groove and is formed simultaneously with the formation of the reference groove by the optical means, and which indicates a distance to the reference groove.
【請求項2】磁性体の一部に溝部を形成し、前記溝部に
非磁性絶縁体を充填し、前記非磁性絶縁体に膜状コイル
及び膜状コアを順次成形してなる薄膜磁気ヘッドの製造
方法において、 前記非磁性体が充填されている前記溝部と磁気ヘッド先
端方向の前記磁性体との境界部分に前記非磁性絶縁体と
前記磁性体にまたがって設けられ、その媒体対向面端部
が寿命寸法零を規定する基準溝と、前記基準溝から所定
距離離間した位置に設けられ、前記基準溝までの距離を
示す指標とをホトリソグラフィ等の光学的手段により同
時に形成する工程と、 前記基準溝に非磁性体又は導電材を充填する工程と、 前記指標により前記基準溝までの距離を測定しつつ前記
磁気ヘッド先端面の研磨加工を行なう工程とを具備した
ことを特徴とする薄膜磁気ヘッドの製造方法。
2. A thin film magnetic head having a groove formed in a part of a magnetic material, the groove being filled with a non-magnetic insulator, and a film coil and a film core being sequentially formed in the non-magnetic insulator. In the manufacturing method, the medium facing surface end portion is provided across the non-magnetic insulator and the magnetic body at a boundary portion between the groove filled with the non-magnetic body and the magnetic body in the magnetic head tip direction. And a step of forming a reference groove that defines a life size of zero and a position that is provided at a predetermined distance from the reference groove, and an index that indicates the distance to the reference groove by an optical means such as photolithography at the same time, A thin film magnetic device comprising: a step of filling the reference groove with a non-magnetic material or a conductive material; and a step of polishing the tip end surface of the magnetic head while measuring the distance to the reference groove by the index. Head Production method.
【請求項3】前記基準溝及び前記指標を形成する工程
で、導電材が充填されることにより前記膜状コイルが形
成されるコイル用溝を前記光学手段により同時に形成す
ることを特徴とする特許請求の範囲(2)記載の薄膜磁気
ヘッドの製造方法。
3. A coil groove in which the film coil is formed by filling a conductive material in the step of forming the reference groove and the index is simultaneously formed by the optical means. A method of manufacturing a thin-film magnetic head according to claim (2).
JP60061258A 1985-03-26 1985-03-26 Element for thin film magnetic head and method for manufacturing thin film magnetic head Expired - Lifetime JPH0658730B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60061258A JPH0658730B2 (en) 1985-03-26 1985-03-26 Element for thin film magnetic head and method for manufacturing thin film magnetic head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60061258A JPH0658730B2 (en) 1985-03-26 1985-03-26 Element for thin film magnetic head and method for manufacturing thin film magnetic head

Publications (2)

Publication Number Publication Date
JPS61220113A JPS61220113A (en) 1986-09-30
JPH0658730B2 true JPH0658730B2 (en) 1994-08-03

Family

ID=13166028

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60061258A Expired - Lifetime JPH0658730B2 (en) 1985-03-26 1985-03-26 Element for thin film magnetic head and method for manufacturing thin film magnetic head

Country Status (1)

Country Link
JP (1) JPH0658730B2 (en)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5228307A (en) * 1975-08-28 1977-03-03 Toshiba Corp Thin layer head
JPS5629832A (en) * 1979-08-10 1981-03-25 Nec Corp Manufacture for thin film magnetic head
JPS57113411A (en) * 1980-12-30 1982-07-14 Comput Basic Mach Technol Res Assoc Thin-film head
JPS58108017A (en) * 1981-12-18 1983-06-28 Hitachi Ltd Thin-film magnetic head
JPS58128014A (en) * 1982-01-27 1983-07-30 Hitachi Ltd Thin film magnetic head element

Also Published As

Publication number Publication date
JPS61220113A (en) 1986-09-30

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