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JPH0670566B2 - Displacement measuring device - Google Patents
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JPH0670566B2 - Displacement measuring device - Google Patents

Displacement measuring device

Info

Publication number
JPH0670566B2
JPH0670566B2 JP9649988A JP9649988A JPH0670566B2 JP H0670566 B2 JPH0670566 B2 JP H0670566B2 JP 9649988 A JP9649988 A JP 9649988A JP 9649988 A JP9649988 A JP 9649988A JP H0670566 B2 JPH0670566 B2 JP H0670566B2
Authority
JP
Japan
Prior art keywords
mirror
moving
displacement
tilt
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP9649988A
Other languages
Japanese (ja)
Other versions
JPH01267407A (en
Inventor
昭宣 小笠原
修治 内藤
秀隆 小南
孝則 山本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP9649988A priority Critical patent/JPH0670566B2/en
Publication of JPH01267407A publication Critical patent/JPH01267407A/en
Publication of JPH0670566B2 publication Critical patent/JPH0670566B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、測定対象の変位を光学的に高精度で広い測定
範囲にわたって測定する変位測定装置に関するものであ
る。
Description: TECHNICAL FIELD The present invention relates to a displacement measuring device that optically measures the displacement of a measurement target with high accuracy over a wide measurement range.

(従来の技術) 測定対象、例えばロール,薄板,パイプなどの変位を測
定することは、形状測定(プロフィル測定)や、寸法測
定あるいは位置検出などを行う上で重要である。
(Prior Art) Measuring the displacement of a measurement target such as a roll, a thin plate, or a pipe is important for shape measurement (profile measurement), dimension measurement, or position detection.

この種の変位を測定する装置としては従来よりレーザー
三角測量方式変位計が有り、広く使用されている。これ
はレーザー光を小さく絞って対象表面に照射し、斜め方
向から反射光を受光レンズで集束して光位置検出素子上
に結像させ、対象の変位に伴なう光像位置の変化を電気
信号に変換するものである。しかしながら、この変位測
定装置では光位置検出素子の分解能と精度に制限が有る
事、測定対象が変位すると対象表面上のレーザー光の径
が大幅に変化する事等により、高精度かつ広い測定範囲
を得る事は極めて困難である。
As a device for measuring this kind of displacement, a laser triangulation type displacement meter has been conventionally used and is widely used. This is to irradiate the target surface with a small laser beam, to focus the reflected light from the oblique direction with the light receiving lens to form an image on the optical position detection element, and to electrically change the optical image position accompanying the displacement of the target. It is converted into a signal. However, in this displacement measuring device, the resolution and accuracy of the optical position detection element are limited, and the diameter of the laser beam on the target surface changes significantly when the measurement target is displaced, etc. It is extremely difficult to obtain.

そこで、斯かる変位測定においては、測定精度を高める
工夫がなされており、例えばレーザー光を測定対象の変
位方向に平行に照射し、レーザー光を絞られた状態で測
定対象表面上に照射せしめるようにした装置がある(特
公昭59−762号)。これによれば測定点が明確になり精
度の向上が図られるが、測定対象が変位することにより
生じる照光側集光レンズと測定対象との距離の変化で、
測定対象表面上のレーザー光の径が変ることは否めな
い。
Therefore, in such displacement measurement, measures are taken to enhance the measurement accuracy. For example, laser light is irradiated in parallel to the displacement direction of the measurement target so that the laser light is irradiated on the measurement target surface in a narrowed state. There is a device (Japanese Patent Publication No. 59-762). According to this, the measurement point becomes clear and the accuracy is improved, but due to the change in the distance between the illumination side condenser lens and the measurement target caused by the displacement of the measurement target,
It cannot be denied that the diameter of the laser beam on the surface to be measured changes.

(発明が解決しようとする問題点) ところで、測定対象、例えばパイプ,ロール等を回転あ
るいは走行させて、プロファイルを測定する場合には、
測定対象自体のプロファイルによらない上下動,振動等
に影響されずに変位を測定しなければならない。
(Problems to be Solved by the Invention) By the way, when a profile is measured by rotating or running an object to be measured, such as a pipe or a roll,
Displacement must be measured without being affected by vertical movement or vibration that does not depend on the profile of the measurement target itself.

一般に、前記上下動や振動はプロファイルの変化よりか
なり大であるから、測定範囲の広い装置が不可欠とな
る。例えばパイプの振動による変化が2mmあるとき、該
パイプの変位測定を1/1000mmの精度で要求された場合
には、光位置検出素子の分解能と精度に制限があり、そ
の測定限界が振動より小さいため測定不能となる。従っ
て斯かる測定を行なうにはオフライン的にならざるを得
ず、測定に長時間を要する。
Generally, the vertical movement and the vibration are much larger than the change of the profile, so that a device having a wide measurement range is indispensable. For example, when the displacement of the pipe is 2 mm and the displacement measurement of the pipe is required with an accuracy of 1/1000 mm, the resolution and accuracy of the optical position detection element are limited, and the measurement limit is smaller than the vibration. Therefore, it becomes impossible to measure. Therefore, in order to perform such a measurement, it is inevitable to go offline, and it takes a long time for the measurement.

また、ロールや薄板、例えばストリップなどの表面粗度
を測定するには、その表面の例えばμmオーダーの微細
な凹凸の程度を測らなければならない。このような場合
には、表面の微細な凹凸に基づく変位を高い精度で測定
する必要があるが、これを光ビームを用いて測定できる
ものは見当らない。
Further, in order to measure the surface roughness of a roll or a thin plate such as a strip, it is necessary to measure the degree of fine irregularities on the surface, for example, of the order of μm. In such a case, it is necessary to measure the displacement based on the fine irregularities on the surface with high accuracy, but there is no one that can measure this using a light beam.

(発明の目的) 本発明は、高精度かつ広い測定範囲を持った光学的変位
測定装置、例えばロール,パイプ,ストリップ等の測定
対象の形状測定,表面粗度測定,寸法測定あるいは位置
検出をそれらが回転あるいは走行中に行える変位検出装
置を提供することを目的とする。
(Object of the Invention) The present invention provides an optical displacement measuring device having a high precision and a wide measuring range, such as shape measurement, surface roughness measurement, dimension measurement or position detection of a measuring object such as a roll, a pipe or a strip. It is an object of the present invention to provide a displacement detection device that can perform rotation or running.

(問題点を解決するための手段) 上記目的を達成するために本発明においては、 光ビームを集束レンズを介して測定対象に照射し、その
反射ビームを光源と異なる光軸方向から受光し変位を測
定する装置において: 集束レンズから測定対象への光軸と反射ビームの受光レ
ンズへの光軸の間に設けた固定傾斜ミラーおよび移動傾
斜対ミラー,反射ビームを受光する受光レンズの結像位
置に設けた光位置検出素子,光位置検出素子からの信号
に基づいて位置信号を出力する位置信号処理装置,位置
信号を入力し移動傾斜対ミラーの移動量を制御する装
置,移動傾斜対ミラーの移動量を検出し、移動量検出信
号を出力する移動量検出装置,および、移動量検出信号
と位置信号を入力し、測定対象の変位を出力する変位演
算装置,を備える。
(Means for Solving the Problems) In order to achieve the above object, in the present invention, a measurement object is irradiated with a light beam through a focusing lens, and the reflected beam is received from an optical axis direction different from that of the light source and displaced. In a device for measuring: fixed tilt mirror and moving tilt pair mirror provided between the optical axis from the focusing lens to the object to be measured and the optical axis to the light receiving lens of the reflected beam, the image forming position of the light receiving lens receiving the reflected beam Of the optical position detecting element provided in the above, the position signal processing device for outputting the position signal based on the signal from the optical position detecting element, the device for inputting the position signal and controlling the moving amount of the moving tilt pair mirror, the moving tilt pair mirror A movement amount detection device that detects the movement amount and outputs a movement amount detection signal, and a displacement calculation device that inputs the movement amount detection signal and the position signal and outputs the displacement of the measurement target.

以下、本発明の一実施例を図面を参照して詳細に説明す
る。
An embodiment of the present invention will be described in detail below with reference to the drawings.

(実施例) 第1図において、1は光源となる半導体レーザー,2は変
調信号発生器,3はレーザー光,4は集束レンズである。集
束レンズ4は、レーザー光3を細いビームにして測定対
象5に照射するものである。6は固定傾斜ミラーであ
り、本実施例では2枚のミラー6aおよび6bの反射面を外
側にして所定角で接合し、集束レンズ4と測定対象5の
間の光軸上に設置している。集束レンズ4からのレーザ
ー光3は固定傾斜ミラー6の上側ミラー6aで反射され、
移動傾斜対ミラー7に入射される。本実施例では、2枚
のミラー7aおよび7bの反射面を内側にして所定角で接合
して移動傾斜対ミラー7を構成し、各反射面と傾斜ミラ
ー6の各反射面とを対向させている。この移動傾斜対ミ
ラー7は矢印A方向に移動自在であり、測定対象5の測
定初期位置あるいは測定基準位置からの変位による集束
レンズ4と測定対象5の間と測定対象5と受光レンズ15
の間の光路長の変化を吸収する。つまり、後述するが、
固定傾斜ミラー6と移動傾斜対ミラー7を設けて、集束
レンズ4,測定対象5および受光レンズ15の間の光路長を
測定対象5の変位に因らずに一定とするところに本実施
例装置の大きな特徴がある。
(Embodiment) In FIG. 1, 1 is a semiconductor laser as a light source, 2 is a modulation signal generator, 3 is a laser beam, and 4 is a focusing lens. The focusing lens 4 serves to irradiate the measurement target 5 with the laser beam 3 as a thin beam. Reference numeral 6 denotes a fixed tilt mirror, and in the present embodiment, two mirrors 6a and 6b are joined to each other at a predetermined angle with their reflecting surfaces facing outward, and are installed on the optical axis between the focusing lens 4 and the measurement object 5. . The laser light 3 from the focusing lens 4 is reflected by the upper mirror 6a of the fixed tilt mirror 6,
It is incident on the moving tilt pair mirror 7. In this embodiment, the reflecting surfaces of the two mirrors 7a and 7b are joined to each other at a predetermined angle to form a moving tilt pair mirror 7, and each reflecting surface and each reflecting surface of the tilting mirror 6 are opposed to each other. There is. This movable tilt pair mirror 7 is movable in the direction of arrow A, and is between the focusing lens 4 and the measurement object 5 and between the measurement object 5 and the light receiving lens 15 due to the displacement of the measurement object 5 from the measurement initial position or the measurement reference position.
Absorbs changes in optical path length between That is, as will be described later,
In this embodiment, a fixed tilt mirror 6 and a moving tilt pair mirror 7 are provided to make the optical path length between the focusing lens 4, the measuring object 5 and the light receiving lens 15 constant regardless of the displacement of the measuring object 5. There is a big feature of.

ところで、固定傾斜ミラー6の上側ミラー6aから移動傾
斜対ミラー7の上側ミラー7aに反射されたレーザー光3
は、さらに上側ミラー7aの反射点8,下側ミラー7bの反射
点9,固定傾斜ミラー6の下側ミラー6bの反射点10でそれ
ぞれ反射されて測定対象5に微小なスポット光として照
射される。
By the way, the laser beam 3 reflected from the upper mirror 6a of the fixed tilt mirror 6 to the upper mirror 7a of the moving tilt pair mirror 7
Are further reflected at the reflection point 8 of the upper mirror 7a, the reflection point 9 of the lower mirror 7b, and the reflection point 10 of the lower mirror 6b of the fixed tilt mirror 6, and irradiate the measurement target 5 as minute spot light. .

測定対象5では、乱射したレーザー光の一部が固定傾斜
ミラー6の下側ミラー6bの反射点11,移動傾斜対ミラー
7の下側ミラー7bの反射点12,上側ミラー7aの反射点13,
固定傾斜ミラー6の上側ミラー6aの反射点14でそれぞれ
反射されて受光レンズ15に導びかれる。
In the measurement target 5, a part of the scattered laser light is a reflection point 11 of the lower mirror 6b of the fixed tilt mirror 6, a reflection point 12 of the lower mirror 7b of the moving tilt pair mirror 7, a reflection point 13 of the upper mirror 7a,
The light is reflected at the reflection points 14 of the upper mirror 6a of the fixed tilt mirror 6 and guided to the light receiving lens 15.

16は光位置検出素子である。Reference numeral 16 is an optical position detecting element.

17は測定対象5が第1図に実線で示した基準位置にある
時の光位置検出素子16上の受光光点位置、18は測定対象
5が第1図に破線で示した位置に変位した時の受光光点
位置である。
17 is the position of the received light spot on the optical position detecting element 16 when the measuring object 5 is at the reference position shown by the solid line in FIG. 1, and 18 is the measuring object 5 displaced to the position shown by the broken line in FIG. It is the position of the received light point at the time.

20はリニアモータを含む移動装置であり、移動傾斜対ミ
ラー7を矢印A方向に往復駆動する。
Reference numeral 20 denotes a moving device including a linear motor, which reciprocally drives the moving tilt pair mirror 7 in the arrow A direction.

21は移動量検出装置であり、移動傾斜対ミラー7の移動
量を検出する。
Reference numeral 21 denotes a movement amount detection device, which detects the movement amount of the movement inclination of the mirror 7.

22は位置信号処理装置であり、光位置検出素子16からの
出力信号と変調信号発生器2のタイミング信号とから光
位置検出素子16上の光点位置に対応した位置信号を出力
する。
A position signal processing device 22 outputs a position signal corresponding to the light spot position on the optical position detecting element 16 from the output signal from the optical position detecting element 16 and the timing signal of the modulation signal generator 2.

23は移動制御装置であり、位置信号処理装置22からの位
置信号が入力され、移動装置20に移動指令信号を出力す
る(移動制御装置23に移動量検出装置21からの移動量信
号をさらに入力して移動指令を行なってもよい)。
23 is a movement control device, which receives a position signal from the position signal processing device 22 and outputs a movement command signal to the movement device 20 (the movement amount signal from the movement amount detection device 21 is further input to the movement control device 23). You may issue a move command).

24は変位演算装置であり、位置信号処理装置22からの位
置信号と移動量検出装置21からの移動量信号から測定対
象5の変位量を演算し出力するものである。
A displacement calculator 24 calculates and outputs the displacement amount of the measuring object 5 from the position signal from the position signal processing device 22 and the movement amount signal from the movement amount detection device 21.

次に実施例装置の動作説明する。半導体レーザー1のレ
ーザー光3は集束レンズ4を通った後、固定傾斜ミラー
6及び移動傾斜対ミラー7で反射されて、測定対象5の
表面に微小スポット光として照射される。この時、固定
傾斜ミラー6と移動傾斜対ミラー7による反射の様子を
第2図と第1図を参照して詳述する。
Next, the operation of the embodiment apparatus will be described. After passing through the focusing lens 4, the laser light 3 of the semiconductor laser 1 is reflected by the fixed tilt mirror 6 and the moving tilt pair mirror 7, and is irradiated onto the surface of the measurement target 5 as a minute spot light. At this time, the state of reflection by the fixed tilt mirror 6 and the moving tilt pair mirror 7 will be described in detail with reference to FIGS. 2 and 1.

レーザー光3は、固定傾斜ミラー6で直角に折曲げられ
た後、移動傾斜対ミラー7で折返され、再び固定傾斜ミ
ラー6で直角に折曲げられて測定対象5表面に照射され
る。測定対象5で乱反射したレーザー光の一部は固定傾
斜ミラー6及び移動傾斜対ミラー7で反射され、受光レ
ンズ15により、その結像位置に置かれた光位置検出素子
16上に微小スポット光として結像される。この場合、測
定対象5及び移動傾斜対ミラー7が第2図に実線で示し
た基準位置にある時に、光位置検出素子16上の微小スポ
ット光が光位置検出素子16の中央の受光点17に来るよう
に調整しておく。今、測定対象5が基準位置から第2図
の破線で示す位置に変位すると、光位置検出素子16上の
スポット光の照射位置は受光点17から受光点18に変位す
るとともにその光径も大きくなる。この変位の位置信号
が光位置検出素子16の中央に近づき、かつ、その光径を
小さくし測定精度を高めるべく移動制御装置23で移動装
置20を付勢して移動傾斜対7ミラーを駆動する。移動傾
斜対ミラー7をこの様に移動させると、第2図において
移動傾斜対ミラー7が例えば破線の位置に移動し、レー
ザー光及び受光系の光路が、反射点25,26,27,28から反
射点25,29,30,28に変位し、測定対象5の基準位置から
の変位を吸収して反射点25から見た光路長を一定に保
つ。
The laser light 3 is bent at a right angle by the fixed tilt mirror 6, is then returned by the moving tilt pair mirror 7, is bent again at a right angle by the fixed tilt mirror 6, and is irradiated onto the surface of the measurement target 5. A part of the laser light diffusely reflected by the measurement target 5 is reflected by the fixed tilt mirror 6 and the moving tilt pair mirror 7, and the light position detecting element placed at the image forming position by the light receiving lens 15.
An image is formed on the 16 as a small spot light. In this case, when the measurement target 5 and the movable tilt pair mirror 7 are at the reference position shown by the solid line in FIG. 2, the minute spot light on the optical position detecting element 16 is incident on the light receiving point 17 at the center of the optical position detecting element 16. Adjust it to come. Now, when the measurement object 5 is displaced from the reference position to the position shown by the broken line in FIG. 2, the irradiation position of the spot light on the optical position detection element 16 is displaced from the light receiving point 17 to the light receiving point 18 and its light diameter is also large. Become. The position signal of this displacement approaches the center of the optical position detection element 16, and the movement control device 23 urges the movement device 20 to drive the moving tilt pair 7 mirror in order to reduce the light diameter and improve the measurement accuracy. . When the moving tilt-pair mirror 7 is moved in this way, the moving tilt-pair mirror 7 moves to, for example, the position of the broken line in FIG. 2, and the optical paths of the laser light and the light receiving system are changed from the reflection points 25, 26, 27, 28. It is displaced to the reflection points 25, 29, 30, 28 and absorbs the displacement of the measurement target 5 from the reference position to keep the optical path length seen from the reflection point 25 constant.

従って、レーザー光の焦点及び受光系の焦点位置は変化
せず光学的な検出精度が低下しないため、移動傾斜対ミ
ラー7の移動量を移動量検出装置21で検出し、測定対象
5の変位量を高精度に測定する事ができる。この時、測
定対象5の変位測定範囲は光位置検出素子16の検出範囲
に制限される事が無く、移動傾斜対ミラー7の移動範囲
の2倍となり、測定範囲が大幅に拡大された事になる。
更に、移動傾斜対ミラー7は光位置検出素子16上の受光
位置がその中央位置17になるまで移動させる必要は無
く、スポット光位置が光位置検出素子16の検出範囲内に
有れば良く、位置信号と移動傾斜対ミラー7の移動量信
号から変位演算装置24で測定対象の変位信号31を演算す
る事ができる。
Therefore, the focus of the laser light and the focus position of the light receiving system do not change and the optical detection accuracy does not decrease. Therefore, the movement amount of the mirror 7 is detected by the movement amount detection device 21, and the displacement amount of the measurement target 5 is detected. Can be measured with high accuracy. At this time, the displacement measuring range of the measuring object 5 is not limited to the detecting range of the optical position detecting element 16, and is twice the moving range of the moving tilt-to-mirror 7 and the measuring range is greatly expanded. Become.
Further, it is not necessary to move the movable tilt pair mirror 7 until the light receiving position on the light position detecting element 16 reaches the center position 17, and it is sufficient if the spot light position is within the detection range of the light position detecting element 16, The displacement calculation device 24 can calculate the displacement signal 31 of the measurement object from the position signal and the movement amount signal of the movement inclination pair mirror 7.

また、前記実施例では固定傾斜ミラー6と移動傾斜対ミ
ラー7は2枚のミラーを鋭角に組合せて構成している
が、これに限らず、第3図に示すように固定傾斜ミラー
6は上側ミラー6aと下側ミラー6bに分け、移動傾斜対ミ
ラー7も上側ミラー7aと下側ミラー7bに分けたものでも
同様な効果が得られる。
Further, in the above-described embodiment, the fixed tilt mirror 6 and the moving tilt pair mirror 7 are configured by combining two mirrors at an acute angle, but the invention is not limited to this, and the fixed tilt mirror 6 is placed on the upper side as shown in FIG. The same effect can be obtained by dividing the mirror 6a into the lower mirror 6b and the moving tilt pair mirror 7 into the upper mirror 7a and the lower mirror 7b.

さらに第4図に示すように、固定傾斜ミラー6は上側ミ
ラー6aだけとしてもよく、要するに固定傾斜ミラー6と
移動傾斜対ミラー7の組合せ反射により、測定対象5の
変位による光路長の変化を吸収し一定とする組合せであ
ればよい。
Further, as shown in FIG. 4, the fixed tilt mirror 6 may be only the upper mirror 6a. In short, the combined reflection of the fixed tilt mirror 6 and the moving tilt pair mirror 7 absorbs the change in the optical path length due to the displacement of the measurement object 5. However, the combination may be fixed.

また、実施例で用いた半導体レーザーに限らず、LEDな
ど他の光源を使用する変形や、移動装置に公知の駆動機
構を用いる変形があるがここでの説明は省略する。
Further, not limited to the semiconductor laser used in the embodiment, there are modifications that use other light sources such as LEDs and modifications that use a known drive mechanism for the moving device, but description thereof is omitted here.

なお光源を変調して外乱光の影響を除去したり、パルス
変調によって高速で変位する対象の測定も可能である。
It is also possible to modulate the light source to remove the influence of ambient light, or to measure an object that is displaced at high speed by pulse modulation.

(発明の効果) 以上の様な構成及び作動により、本発明によれば、測定
対象の変位を高精度かつ広い範囲で測定する事が可能と
なり、例えばロール,パイプ,ストリップあるいはネジ
部のプロファイル測定,表面粗度測定、また、ストリッ
プなどの薄ものの板厚測定がオンラインで行なえる。
(Advantages of the Invention) With the above-described configuration and operation, according to the present invention, it is possible to measure the displacement of the measuring object with high accuracy and in a wide range. For example, profile measurement of rolls, pipes, strips, or screw portions is possible.・ Surface roughness measurement and plate thickness measurement of thin materials such as strips can be done online.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の第1実施例を示すブロック図である。 第2図は本発明の第1実施例の動作を説明するための説
明図である。 第3図は本発明の第2実施例における固定傾斜ミラーと
移動傾斜対ミラーの構成を示す側面図である。 第4図は本発明の第3実施例における固定傾斜ミラーと
移動傾斜対ミラーの構成図を示す側面図である。 1:半導体レーザー、2:変調信号発生器 3:レーザー光(光ビーム) 4:集束レンズ、5:測定対象 6:固定傾斜ミラー、7:移動傾斜対ミラー 15:受光レンズ 16:検出素子(光位置検出素子) 20:移動装置、21:移動量検出装置 22:位置信号処理装置 23:移動量制御装置(移動量を制御する装置) 24:変位演算装置、31:変位信号
FIG. 1 is a block diagram showing a first embodiment of the present invention. FIG. 2 is an explanatory diagram for explaining the operation of the first embodiment of the present invention. FIG. 3 is a side view showing the configurations of a fixed tilt mirror and a moving tilt pair mirror in the second embodiment of the present invention. FIG. 4 is a side view showing a configuration diagram of a fixed tilt mirror and a moving tilt pair mirror in the third embodiment of the present invention. 1: Semiconductor laser, 2: Modulation signal generator 3: Laser light (light beam) 4: Focusing lens, 5: Target of measurement 6: Fixed tilt mirror, 7: Moving tilt pair mirror 15: Light receiving lens 16: Detection element (light Position detecting element) 20: Moving device, 21: Moving amount detecting device 22: Position signal processing device 23: Moving amount control device (device for controlling moving amount) 24: Displacement calculation device, 31: Displacement signal

───────────────────────────────────────────────────── フロントページの続き (72)発明者 小南 秀隆 福岡県北九州市八幡東区枝光1―1―1 新日本製鐵株式會社八幡製鐵所内 (72)発明者 山本 孝則 福岡県北九州市八幡東区枝光1―1―1 新日本製鐵株式會社八幡製鐵所内 (56)参考文献 特開 昭60−95306(JP,A) 特開 昭60−95307(JP,A) 特開 昭57−93208(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Hidetaka Konan Hidetaka Konan 1-1-1 Edamitsu, Yawatahigashi, Kitakyushu, Kitakyushu, Fukuoka Inside the Yawata Works (72), Nippon Steel Corporation (72) Takanori Yamamoto, Yawatahigashi, Kitakyushu, Fukuoka 1-1-1 Kueda Mitsuda 1-1-1 Inside Nippon Steel Co., Ltd. Yawata Works (56) References JP-A-60-95306 (JP, A) JP-A-60-95307 (JP, A) JP-A-57-93208 (JP, A)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】光ビームを集束レンズを介して測定対象に
照射し、その反射ビームを光源と異なる光軸方向から受
光し変位を測定する装置において: 集束レンズから測定対象への光軸と反射ビームの受光レ
ンズへの光軸の間に設けた固定傾斜ミラーおよび移動傾
斜対ミラー; 反射ビームを受光する受光レンズの結像位置に設けた光
位置検出素子; 光位置検出素子からの信号に基づいて位置信号を出力す
る位置信号処理装置; 位置信号を入力し移動傾斜対ミラーの移動量を制御する
装置; 移動傾斜対ミラーの移動量を検出し、移動量検出信号を
出力する移動量検出装置;および、 移動量検出信号と位置信号を入力し、測定対象の変位を
出力する変位演算装置; を備える変位測定装置。
1. A device for irradiating a measurement object with a light beam through a focusing lens, and receiving the reflected beam from an optical axis direction different from that of a light source to measure displacement: an optical axis and reflection from the focusing lens to the measurement object. Fixed tilt mirror and moving tilt pair mirror provided between the optical axes of the beam receiving lens; optical position detecting element provided at the image forming position of the receiving lens receiving the reflected beam; based on a signal from the optical position detecting element Position signal processing device for inputting a position signal to control the moving amount of the moving tilt-to-mirror; moving amount detecting device for detecting the moving amount of the moving tilt-to-mirror and outputting a moving amount detection signal And a displacement calculation device that inputs a movement amount detection signal and a position signal and outputs the displacement of the measurement target;
JP9649988A 1988-04-19 1988-04-19 Displacement measuring device Expired - Lifetime JPH0670566B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9649988A JPH0670566B2 (en) 1988-04-19 1988-04-19 Displacement measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9649988A JPH0670566B2 (en) 1988-04-19 1988-04-19 Displacement measuring device

Publications (2)

Publication Number Publication Date
JPH01267407A JPH01267407A (en) 1989-10-25
JPH0670566B2 true JPH0670566B2 (en) 1994-09-07

Family

ID=14166791

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9649988A Expired - Lifetime JPH0670566B2 (en) 1988-04-19 1988-04-19 Displacement measuring device

Country Status (1)

Country Link
JP (1) JPH0670566B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0919242A (en) * 1995-04-10 1997-01-21 Zebco Division Of Brunswick Corp Balancing rotor for fishing reels for spinning

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0919242A (en) * 1995-04-10 1997-01-21 Zebco Division Of Brunswick Corp Balancing rotor for fishing reels for spinning

Also Published As

Publication number Publication date
JPH01267407A (en) 1989-10-25

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