JPH0672769B2 - Photoelectric detection method - Google Patents
Photoelectric detection methodInfo
- Publication number
- JPH0672769B2 JPH0672769B2 JP22836085A JP22836085A JPH0672769B2 JP H0672769 B2 JPH0672769 B2 JP H0672769B2 JP 22836085 A JP22836085 A JP 22836085A JP 22836085 A JP22836085 A JP 22836085A JP H0672769 B2 JPH0672769 B2 JP H0672769B2
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- Japan
- Prior art keywords
- substrates
- light
- ring
- optical array
- change
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Length Measuring Devices By Optical Means (AREA)
- Control Of Position Or Direction (AREA)
Description
【発明の詳細な説明】 〔発明の利用分野〕 本発明は半導体製造装置や工作機械などのテーブルをは
じめ、位置・姿勢精度を必要とする各種物体に用いられ
る位置・姿勢制御装置の変位及び角度測定用の光電検出
方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of Application of the Invention The present invention relates to a displacement and an angle of a position / orientation control device used for various objects requiring position / orientation accuracy, such as a table of a semiconductor manufacturing device or a machine tool. The present invention relates to a photoelectric detection method for measurement.
従来直進する移動体の位置・角度誤差の測定には基点に
レーザの様な直進ビームの光源を定置し、それから進行
方向に平行に照射されたビームをそのまま移動体に設置
された1枚の光電板で受光し、受光点の変化で位置・角
度変化を検知する方法が普通であつた。第11図と第12図
にこの測定方法の原理を示す。第11図と第12図において
20はレーザ光源、21はリニアステージ本体、22はリニア
ステージ本体上に取付けた光電板、23はレーザビームで
ある。第11図においてレーザ光源20から出たビーム23は
光電板22で受光される。ステージ本体21が同図点線の位
置に移動した際にビームの垂直方向に平行偏位を伴えば
その偏位量が光電板22で検出される事になる。同様に、
第12図において、ステージ本体21が移動時に姿勢変化を
伴えば、その傾き角が光電板22で検出される。Conventionally, in order to measure the position / angle error of a moving body that moves straight ahead, a light source of a straight beam such as a laser is fixed at the base point, and then a beam irradiated in parallel to the direction of travel is installed on the moving body as is. A common method is to receive light from a plate and detect changes in position and angle based on changes in the light receiving point. 11 and 12 show the principle of this measuring method. In Figures 11 and 12
Reference numeral 20 is a laser light source, 21 is a linear stage body, 22 is a photoelectric plate mounted on the linear stage body, and 23 is a laser beam. In FIG. 11, the beam 23 emitted from the laser light source 20 is received by the photoelectric plate 22. When the stage main body 21 moves to the position indicated by the dotted line in the figure, if the beam is accompanied by a parallel displacement in the vertical direction, the displacement amount will be detected by the photoelectric plate 22. Similarly,
In FIG. 12, if the posture of the stage main body 21 changes during movement, the tilt angle is detected by the photoelectric plate 22.
この方法ではビームは出射光をそのまま使つているが、
この為光電板はビームが移動しうる範囲全面に光電素子
を張りつめなければならないので経済的・機能的にムダ
が多く、又ビーム位置検出は光を検出した多数の光電素
子すべてから計算により割り立さねばならず複雑であつ
た。In this method, the beam uses the emitted light as it is,
For this reason, the photoelectric plate has to be covered with photoelectric elements over the entire range in which the beam can move, which is economically and functionally wasteful, and beam position detection is divided by calculation from all photoelectric elements that detect light. It must be complicated.
本発明の目的は直進運動を行なう物体の位置と角度を測
定できる簡単な構成の光電検出方法を提供する事にあ
る。An object of the present invention is to provide a photoelectric detection method having a simple structure capable of measuring the position and angle of an object that makes a rectilinear motion.
第1図に本発明の1番目の実施例を示す。第1図におい
て、1は光源であるところのレーザ発振器、4はレーザ
ビームを2本の平行ビームにする平行プリズム、5はレ
ーザビームの断面形状をリング状に変換する光学素子
(アキシコン)、6と7は受光素子基板、6a〜6d及び7a
〜7dはそれぞれ受光素子基板6,7上に配置された光アレ
イセンサ、10はセンサー部を保持するセンサハウジング
である。図には示していないがハウジング10は移動物体
上に、レーザ発振器1と平行プリズム4とアキシコン5
は固定基板上に設置されている。移動体は矢印方向に移
動可能である。FIG. 1 shows a first embodiment of the present invention. In FIG. 1, 1 is a laser oscillator as a light source, 4 is a parallel prism for converting a laser beam into two parallel beams, 5 is an optical element (axicon) for converting the cross-sectional shape of the laser beam into a ring shape, 6 And 7 are light receiving element substrates, 6a to 6d and 7a
Reference numerals 7d to 7d denote optical array sensors arranged on the light receiving element substrates 6 and 7, respectively, and 10 denotes a sensor housing that holds the sensor unit. Although not shown in the figure, the housing 10 includes a laser oscillator 1, a parallel prism 4, and an axicon 5 on a moving object.
Are installed on a fixed substrate. The moving body can move in the direction of the arrow.
上記構成において、レーザ光源1より発振されたレーザ
ビームは、平行プリズム4によつて、2本のレーザビー
ムに分けられ、さらにアキシコン5によつて断面がリン
グ状となつた2本のレーザビームに変換され、センサハ
ウジング10内でそれぞれ受光素子基板6,7上に入射し十
字に並んだ光アレイセンサ、6a〜6d,7a〜7dによつてそ
れぞれの長さ方向リング片位置が検出され、結果的に基
板上のビーム位置が検出される。In the above configuration, the laser beam oscillated by the laser light source 1 is divided into two laser beams by the parallel prism 4, and further divided into two laser beams having a ring-shaped cross section by the axicon 5. The optical array sensors 6a to 6d and 7a to 7d, which have been converted and are incident on the light receiving element substrates 6 and 7 respectively in the sensor housing 10 and arranged in a cross, detect the positions of the respective ring members in the longitudinal direction. The beam position on the substrate is detected.
一般に被測定物体に第2図に示す様な座標を設定し、被
測定物体を同図矢印の方向、即ちx軸方向へ送ると他の
5自由度の運動、即ちy軸、z軸方向の立進運動、x
軸、y軸、z軸のまわりの回軸運動が発生する。第2図
にx軸、y軸、z軸まわりの回転方向をそれぞれωX,
ωY,ωZで表わす。Generally, when the object to be measured has coordinates as shown in FIG. 2 and the object to be measured is sent in the direction of the arrow in the figure, that is, in the x-axis direction, other movements of five degrees of freedom, that is, in the y-axis and z-axis directions are performed. Standing motion, x
Rotational movements about the axes, the y-axis and the z-axis, occur. In FIG. 2, the rotation directions around the x-axis, the y-axis, and the z-axis are ω X ,
Represented by ω Y and ω Z.
第1図の構成に於て被測定物体が上記5自由度の運動を
行つた場合の、受光基板上に入射しているリング状レー
ザ光の位置の変化を第3図に示す。図中破線は運動前の
リング位置、実線は運動後のリング位置を表わしてい
る。図からわかる様にy方向とz方向の変位、ωY方向
とωZ方向の回転それぞれについて受光素子基板6,7に
おけるリング位置の変化パターンが異なる。従つて光ア
レイセンサでリング位置の変化と同時にこの変化パター
ンを検出する事でどの運動成分方向にどれだけ変化した
かを測定する事ができる。FIG. 3 shows changes in the position of the ring-shaped laser light incident on the light receiving substrate when the object to be measured moves in the above five degrees of freedom in the configuration of FIG. In the figure, the broken line represents the ring position before the exercise, and the solid line represents the ring position after the exercise. As can be seen from the figure, the change patterns of the ring positions on the light receiving element substrates 6 and 7 are different for the displacements in the y and z directions and the rotations in the ω Y and ω Z directions. Therefore, by detecting the change pattern at the same time as the change of the ring position with the optical array sensor, it is possible to measure the change in which motion component direction and how much.
アキシコンでリング状にしたビームを十字に並べたアレ
イ状センサーで検出しているのでビーム中心位置はリン
グとアレイセンサの4つの交さ部の位置から簡単に計算
でき、又単に出射レーザビームをそのまま光電板等に入
射する場合よりも少ない光電素子数でビーム位置検出が
できる。光アレイセンサの並び方向に略一致するリング
の厚みは充分小さくできるので光アレイセンサによる位
置検出精度を充分上げる事ができる。Since the array-shaped sensor in which the beam made into a ring with an axicon is arranged in a cross is detected, the beam center position can be easily calculated from the positions of the four intersections of the ring and the array sensor, and the output laser beam can be simply used as it is. The beam position can be detected with a smaller number of photoelectric elements than when incident on a photoelectric plate or the like. Since the thickness of the ring that substantially matches the arrangement direction of the optical array sensors can be made sufficiently small, the position detection accuracy of the optical array sensors can be sufficiently improved.
第1図の実施例の構成にするとx軸まわりの回転方向ω
Xの変化は検出しにくく、検出器の位置や回転中心位置
によつては他の運動成分変化のパターンと同様のパター
ンが出る場合も考えうる。第4図に示す2番目の実施例
ではこの問題も解消できる。With the configuration of the embodiment of FIG. 1, the rotation direction ω around the x-axis
It is difficult to detect the change in X , and it may be possible that the same pattern as that of other motion component changes appears depending on the position of the detector and the center of rotation. This problem can be solved in the second embodiment shown in FIG.
第4図において第1図の部材と同じ部材には同じ表示記
号を記載した。2はレーザ光を2方向に分割するビーム
スプリツタ、3はレーザ光の進行方向を折り曲げるビー
ムベンダでビームスプリツタ2とビームベンダ3は2本
の平行レーザ光を作るように配置されている。4′は4
と同じ平行プリズム、5′は5と同じアキシコン、8a〜
8d,9a〜9dはそれぞれ6a〜6d,7a〜7dに対応する光アレイ
センサ、10′は10と同じセンサーハウジングである。ハ
ウジング10,10′は静圧案内型のリニアステージ本体11
に設置されている。12はステージ駆動用リニアモータ、
13,13′は静圧軸受ガイド、14,14′は静圧軸受パツドで
ある。In FIG. 4, the same members as those in FIG. 1 have the same reference symbols. Reference numeral 2 is a beam splitter for splitting the laser light into two directions. Reference numeral 3 is a beam bender for bending the traveling direction of the laser light. The beam splitter 2 and the beam bender 3 are arranged so as to produce two parallel laser lights. 4'is 4
Same parallel prism, 5'is the same axicon as 5, 8a ~
8d and 9a to 9d are optical array sensors corresponding to 6a to 6d and 7a to 7d, respectively, and 10 'is the same sensor housing as 10. Housing 10,10 'is a static pressure guide type linear stage body 11
It is installed in. 12 is a linear motor for driving the stage,
13, 13 'are hydrostatic bearing guides and 14, 14' are hydrostatic bearing pads.
前記構成において、レーザ光源1より発振されたレーザ
光はビームスプリツタ2によつて2方向に分割され、透
過光は平行プリズム4を経てアキシコン5に入り断面を
リング状に変換されてセンサハウジング10内の受光素子
基板6,7上に入射し、光アレイセンサ6a〜6d,7a〜7dで検
出される。同様に反射光もビームベンダ3で反射し、平
行プリズム4′、アキシコン5′を経て、光アレイセン
サ8a〜8d,9a〜9dで検出される。In the above configuration, the laser light oscillated from the laser light source 1 is split into two directions by the beam splitter 2, and the transmitted light enters the axicon 5 through the parallel prism 4 and the cross section is converted into a ring shape, so that the sensor housing 10 The light is incident on the light receiving element substrates 6 and 7 inside and is detected by the optical array sensors 6a to 6d and 7a to 7d. Similarly, the reflected light is also reflected by the beam bender 3, passes through the parallel prism 4'and the axicon 5 ', and is detected by the optical array sensors 8a to 8d and 9a to 9d.
センサハウジング10,10′はリニアステージの駆動方向
にむかつて左右対称に位置してステージ本体上に設置さ
れている。この場合の、駆動方向以外の5自由度運動に
伴う基板6,7,8,9上のリングの変化例を第5図に示す。
この図からわかるように、y方向とz方向の変位、x,y,
z軸まわりの回転それぞれの場合で4枚の基板上のリン
グ位置の変化パターンが異なる。従つて変化量と変化パ
ターンと同時検出してどの方向にどれだけ変化したかを
一度に測定可能である。The sensor housings 10 and 10 'are installed on the stage main body so that they are symmetrically located in the driving direction of the linear stage. FIG. 5 shows an example of changes in the rings on the substrates 6, 7, 8 and 9 associated with the movement in five degrees of freedom other than the driving direction in this case.
As you can see from this figure, the displacements in the y and z directions, x, y,
The pattern of changes in the ring positions on the four substrates is different for each rotation around the z-axis. Therefore, it is possible to detect the amount of change and the change pattern at the same time, and measure the direction and amount of change at once.
第6図に3番目の実施例を示す。同図において第1図,
第4図の部材と同じ部材については同じ表示記号を記載
してある。センサハウジング10,10′は直動式磁気軸受
案内の軸受本体11′に設置されている。15は電磁石、13
aはガイドである。FIG. 6 shows a third embodiment. In FIG. 1, FIG.
The same reference symbols are given to the same members as those in FIG. The sensor housings 10 and 10 'are installed in a bearing body 11' of a direct acting magnetic bearing guide. 15 is an electromagnet, 13
a is a guide.
センサハウジング10,10′は軸受本体11′上の上下対称
な位置に設置されており前記5自由度運動に伴なう4つ
の基板上のリング変化は2番目の実施例の時と同様第5
図のようなパターンになる。従つて同様に変化方向変化
量同時測定が可能である。The sensor housings 10 and 10 'are installed at vertically symmetrical positions on the bearing body 11', and the ring changes on the four substrates due to the movement of the five degrees of freedom are the same as those in the second embodiment.
The pattern is as shown. Therefore, the change direction change amount simultaneous measurement can be similarly performed.
第7図に4番目の実施例を示す。同図において第1図,
第4図,第6図の部材と同じ部材については同じ表示記
号を記載してある。7′,9′は透明な部材より成る光電
素子基板、6a′〜6d′と8a′〜8d′はそれぞれ光アレイ
センサ7a′〜7d′,9a′〜9d′と45゜の角度を成すよう
に基板6′,8′上に並べられた光アレイセンサである。FIG. 7 shows a fourth embodiment. In FIG. 1, FIG.
The same reference symbols are given to the same members as the members in FIGS. 4 and 6. 7'and 9'are photoelectric element substrates made of a transparent member, and 6a 'to 6d' and 8a 'to 8d' form an angle of 45 ° with the optical array sensors 7a 'to 7d' and 9a 'to 9d', respectively. The optical array sensors are arranged on the substrates 6'and 8 '.
レーザ発振器1より出射したビームはビームスプリツタ
2で2本に分けられ、透過光はそのまま、反射光はビー
ムベンダ3で透過光に平行されて、アキシコン5,5′を
通過し、断面をリング状に変換されてそれぞれ基板
7′,9′に入射する。入射ビームリングのうち、光アレ
イセンサ7a′〜7d′,9a′〜9d′に当たつた部分は遮ら
れるが、その他の部分は透明な基板7′,9′を通過し、
それぞれ基板6′,8′に入射する。The beam emitted from the laser oscillator 1 is split into two beams by the beam splitter 2, the transmitted light is unchanged, the reflected light is parallel to the transmitted light by the beam bender 3, passes through the axicon 5, 5 ', and the cross section is ringed. It is converted into a shape and enters the substrates 7'and 9 ', respectively. The part of the incident beam ring which hits the optical array sensors 7a'-7d ', 9a'-9d' is blocked, while the other parts pass through the transparent substrates 7 ', 9',
It is incident on the substrates 6'and 8 ', respectively.
基板6′,8′上の光アレイセンサ6a′〜6d,8a′〜8d′
はそれぞれ光アレイセンサ7a′〜7d′,9a′〜9d′と45
゜ずらして並べてある。基板7′,9′上の光アレイセン
サで影になつたリング部分が考えうるステージ11の運動
の範囲内で光アレイセンサ6a′〜6d′,8a′〜8d′上に
は来ず、常に基板7′,9′を通過したリング部分が検知
されるよう対向する光アレイセンサの間隔は十分とつて
ある。Optical array sensors 6a'-6d, 8a'-8d 'on substrates 6', 8 '
Are optical array sensors 7a 'to 7d', 9a 'to 9d' and 45, respectively.
゜ They are arranged side by side. The ring portions shaded by the optical array sensors on the substrates 7'and 9'do not come on the optical array sensors 6a 'to 6d', 8a 'to 8d' within the range of possible movement of the stage 11 and always The optical array sensors facing each other are sufficiently spaced so that the ring portion passing through the substrates 7'and 9'can be detected.
光電素子を中央のあいた十字状に配列し、かつビームを
リング状にしているのでこのような光分離ができ1本の
ビームを2組の光センサで同時検出する事が可能にな
り、1〜3番目の実施例に比較して構造が簡単かつ小型
になる。又2〜3番目の実施例では1つのハウジング内
に2枚の基板をy方向ないしz方向にずらして設置する
為、ωX方向の回転が行なわれた場合この2枚の基板上
のリングの変化量が互いに異なる値をとり、これに他の
方向の運動が加わつた場合の変化パターンが複雑だつ
た。この4番目の実施例では1つのハウジング内の2枚
の基板はy方向,z方向にずれがなくωX方向の回転が行
なわれた場合も2枚の基板上のリングの変化量は等し
く、他の方向の運動が加わつた場合の変化パターンも複
雑にはならない。4番目の実施例における駆動方向以外
の5自由度運動に伴う基板6′,7′,8′,9′上のリング
の変化例を第8図に示す。基板6′,8′の光アレイセン
サの位置は異なるがリングの変化パターンは第5図と変
わらない。Since the photoelectric elements are arranged in a cross shape having a center and the beams are formed in a ring shape, such light separation can be performed, and one beam can be simultaneously detected by two sets of optical sensors. The structure is simple and small as compared with the third embodiment. Further, in the second to third embodiments, since two substrates are installed in one housing while being displaced in the y direction or the z direction, when rotation in the ω X direction is performed, the rings on the two substrates are moved. The amount of change takes different values, and the change pattern is complicated when motions in other directions are added. In the fourth embodiment, the two substrates in one housing have the same displacement in the y direction and the z direction, and even if the two substrates are rotated in the ω X direction, the change amounts of the rings on the two substrates are equal. The change pattern when a motion in another direction is added is not complicated. FIG. 8 shows an example of changes in the rings on the substrates 6 ', 7', 8 ', 9'according to the movement of five degrees of freedom other than the driving direction in the fourth embodiment. Although the positions of the optical array sensors on the substrates 6'and 8'are different, the change pattern of the ring is the same as in FIG.
第9図に5番目の実施例を示す。同図において第1図,
第4図,第6図,第7図の部材と同じ部材については同
じ表示記号を記載してある。17,19はステージ11の進行
方向に45゜傾向してハウジングに設置されている受光素
子基板、16,18はそれぞれ受光素子基板17,19に入射した
図中のビームが略反射する位置に受光素子基板17,19と4
5゜の角度を成すようハウジングに設置されている受光
素子基板である。FIG. 9 shows a fifth embodiment. In FIG. 1, FIG.
The same symbols are given to the same members as those in FIGS. 4, 6 and 7. 17, 19 are light receiving element substrates installed in the housing with a tendency of 45 ° in the traveling direction of the stage 11, 16 and 18 are received at positions where the beams incident on the light receiving element substrates 17 and 19 in the figure are substantially reflected. Element boards 17, 19 and 4
It is a light receiving element substrate installed in the housing so as to form an angle of 5 °.
基板17,19の表面には基板に密着してハーフミラーが設
置してある。ハーフミラーは入射光が透過時になるべく
屈折しないよう十分厚さを小さくしている。基板17,19
上のハーフミラーにそれぞれ入射したビームは2本に分
けられ透過光はそのまま密着した基板上の光アレイセン
サ17a〜17d,19a〜19dに検知される。一方反射光はハー
フミラーに45゜傾斜した基板16,18にそれぞれ入射し光
アレイセンサ16a〜16d,18a〜18dに受光される。この場
合の駆動方向以外の5自由度運動に伴う基板16,17,18,1
9上のリングの変化例を第10図に示す。第5図と異な
り、ωY方向及びωZ方向回転時に基板17,19上のリン
グの位置は変化しない。しかし、各運動ごとの4板の基
板上のリングの位置の変化パターンはそれぞれ異なるの
で2〜4番目の実施例同様変化方向変化量同時測定が可
能である。またωX方向回転時のパターン複雑化もなく
第4の実施例よりもさらに装置を小型化でき、ステージ
上の小区域のみの変位・角度測定が可能である。Half mirrors are installed on the surfaces of the substrates 17 and 19 in close contact with the substrates. The half mirror has a sufficiently small thickness so that incident light is not refracted as much as possible when transmitted. Boards 17, 19
The beams respectively incident on the upper half mirrors are divided into two beams, and the transmitted light is detected as it is by the optical array sensors 17a to 17d and 19a to 19d on the substrate which are in close contact with each other. On the other hand, the reflected light is incident on the substrates 16 and 18 which are inclined by 45 ° to the half mirrors and is received by the optical array sensors 16a to 16d and 18a to 18d. Substrates 16,17,18,1 associated with movement in five degrees of freedom other than the driving direction in this case
Fig. 10 shows an example of changes in the upper ring. Unlike FIG. 5, the positions of the rings on the substrates 17 and 19 do not change during rotation in the ω Y direction and the ω Z direction. However, since the change patterns of the positions of the rings on the four plates for each movement are different, the change direction change amount simultaneous measurement can be performed as in the second to fourth embodiments. In addition, the device can be made smaller than in the fourth embodiment without complicating the pattern when rotating in the ω X direction, and the displacement and angle can be measured only in a small area on the stage.
1〜3番目の実施例において図ではハウジング内の2枚
の基板はz方向にずらしてあるが、y方向にずらす構成
にしてもかまわない。4番目の実施例においてレーザ発
振器側から見て手前の基板上の光アレイセンサと奥の基
板上の光アレイセンサとのずれ方は手前の光アレイセン
サの影が考えうるステージの運動の範囲内で奥の光アレ
イセンサ上に来ないようなものであればどのような形で
もかまわない。5番目の実施例において進行方向に対し
て45゜傾斜しているハーフミラーの反射光を受ける基板
がハウジング側面側や底面側にある構成であつてもよ
い。またハーフミラーをつけずに傾斜基板を全反射ミラ
ーで形成し、反射光を受ける基板の光アレイセンサの並
び方を4番目の実施例のように傾斜基板の光アレイセン
サの並び方とずらす構成にしてもかまわない。基板上の
光電素子の配列は本発明の効果を損なわない範囲で十字
以外にもL字形などあらゆる形が可能である。レーザ発
振器等と受光部を逆に設置してもよい。Although the two substrates in the housing are displaced in the z direction in the drawings in the first to third embodiments, they may be displaced in the y direction. In the fourth embodiment, the deviation between the optical array sensor on the front substrate and the optical array sensor on the rear substrate as seen from the laser oscillator side is within the range of stage motion in which the shadow of the front optical array sensor can be considered. Any shape may be used as long as it does not come on the optical array sensor in the back. In the fifth embodiment, the substrate for receiving the reflected light of the half mirror inclined by 45 ° with respect to the traveling direction may be on the side surface or the bottom surface side of the housing. Further, the inclined substrate is formed by a total reflection mirror without attaching a half mirror, and the arrangement of the optical array sensors on the substrate that receives the reflected light is shifted from the arrangement of the optical array sensors on the inclined substrate as in the fourth embodiment. I don't care. The arrangement of the photoelectric elements on the substrate can be any shape such as an L-shape other than the cross shape as long as the effect of the present invention is not impaired. You may install a laser oscillator etc. and a light-receiving part in reverse.
本発明により直進運動を行なう物体の、進行方向に垂直
な方向の位置と、角度とを測定できる簡単な構成の光電
検出が可能になつた。According to the present invention, it becomes possible to perform photoelectric detection with a simple configuration capable of measuring the position and the angle of the object that makes a rectilinear motion in the direction perpendicular to the traveling direction.
第1図は本発明の1番目の実施例の斜視図、第2図は移
動体の移動方向に対する他の5自由度の方向関係を示す
座標図、第3図は1番目の実施例において前記5自由度
の運動が行なわれた場合の受光素子基板上に入射してい
るリング状レーザ光の位置変化のパターン図、第4図は
本発明の2番目の実施例の斜視図、第5図は2番目の実
施例において前記5自由度の運動が行なわれた場合の受
光素子基板上に入射しているリング状レーザ光の位置変
化のパターン図、第6図は本発明の3番目の実施例の斜
視図、第7図は本発明の4番目の実施例の斜視図、第8
図は4番目の実施例において前記5自由度の運動が行な
われた場合の受光素子基板上に入射しているリング状レ
ーザ光の位置変化のパターン図、第9図は本発明の5番
目の実施例の斜視図、第10図は5番目の実施例において
前記5自由度の運動が行なわれた場合の受光素子基板上
に入射しているリング状レーザ光の位置変化のパターン
図、第11図と第12図は従来の位置・角度検出方法の原理
図である。 図中; 1:レーザ発振器、2:ビームスプリツタ 3:ビームベンダ、4:平行プリズム 5:アキシコン 6,7,8,9,6′,7′,8′,9′:受光素子基板 6a〜6d,7a〜7d,8a〜8d,9a〜9d,6a′〜6d′,7a′〜7d′,
8a′〜8d′,9a′〜9d′:(光アレイセンサ) 10,10′:センサハウジング 11:リニアステージ本体 12:リニアモータ 13,13′:静圧軸受ガイド 13a:磁気軸受ガイド 14,14′:静圧軸受パツド、15:電磁石 16,17,18,19:受光素子基板 16a〜16d,17a〜17d,18a〜18d,19a〜19d:光アレイセンサ 20:レーザ発振器 21:リニアステージ本体、22:光電板 23:レーザビーム である。FIG. 1 is a perspective view of a first embodiment of the present invention, FIG. 2 is a coordinate diagram showing a directional relationship of other 5 degrees of freedom with respect to a moving direction of a moving body, and FIG. 3 is the same as the first embodiment. FIG. 5 is a pattern diagram of the position change of the ring-shaped laser light incident on the light receiving element substrate when the movement of five degrees of freedom is performed, FIG. 4 is a perspective view of the second embodiment of the present invention, and FIG. Is a pattern diagram of the position change of the ring-shaped laser light incident on the light receiving element substrate when the movement of 5 degrees of freedom is performed in the second embodiment, and FIG. 6 is the third embodiment of the present invention. FIG. 7 is a perspective view of an example, FIG. 7 is a perspective view of a fourth embodiment of the present invention, and FIG.
FIG. 9 is a pattern diagram of the position change of the ring-shaped laser light incident on the light receiving element substrate when the movement of 5 degrees of freedom is performed in the fourth embodiment, and FIG. 9 is the fifth embodiment of the present invention. FIG. 11 is a perspective view of the embodiment, and FIG. 10 is a pattern diagram of the position change of the ring-shaped laser light incident on the light receiving element substrate when the movement of the five degrees of freedom is performed in the fifth embodiment. FIG. 12 and FIG. 12 are principle diagrams of the conventional position / angle detection method. In the figure; 1: laser oscillator, 2: beam splitter 3: beam bender, 4: parallel prism 5: axicon 6,7,8,9,6 ', 7', 8 ', 9': light receiving element substrate 6a ~ 6d, 7a to 7d, 8a to 8d, 9a to 9d, 6a 'to 6d', 7a 'to 7d',
8a 'to 8d', 9a 'to 9d': (Optical array sensor) 10, 10 ': Sensor housing 11: Linear stage body 12: Linear motor 13,13': Hydrostatic bearing guide 13a: Magnetic bearing guide 14,14 ′: Hydrostatic bearing pad, 15: Electromagnet 16,17,18,19: Photosensitive element substrate 16a to 16d, 17a to 17d, 18a to 18d, 19a to 19d: Optical array sensor 20: Laser oscillator 21: Linear stage body, 22: Photoelectric plate 23: Laser beam.
Claims (4)
方法において、前記ビームの断面形状をリング状にした
事を特徴とする光電検出方法。1. A method of detecting a beam position with a plurality of light receiving elements, wherein the beam has a ring-shaped cross-section.
べた事を特徴とする特許請求の範囲第1項に記載の光電
検出方法。2. The photoelectric detection method according to claim 1, wherein the light receiving elements are arranged in a cross shape having a central portion.
子群を複数設けた事を特徴とする特許請求の範囲第2項
に記載の光電検出方法。3. The photoelectric detection method according to claim 2, wherein a plurality of light receiving element groups arranged in a cross shape having the central portion are provided.
ームの進行方向から見て概重ならない事を特徴とする特
許請求の範囲第3項に記載の光電検出方法。4. The photoelectric detection method according to claim 3, wherein the light-receiving element arrays of the plurality of light-receiving element groups do not substantially overlap with each other when viewed from the traveling direction of the beam.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22836085A JPH0672769B2 (en) | 1985-10-14 | 1985-10-14 | Photoelectric detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP22836085A JPH0672769B2 (en) | 1985-10-14 | 1985-10-14 | Photoelectric detection method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6287811A JPS6287811A (en) | 1987-04-22 |
| JPH0672769B2 true JPH0672769B2 (en) | 1994-09-14 |
Family
ID=16875235
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP22836085A Expired - Fee Related JPH0672769B2 (en) | 1985-10-14 | 1985-10-14 | Photoelectric detection method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0672769B2 (en) |
-
1985
- 1985-10-14 JP JP22836085A patent/JPH0672769B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6287811A (en) | 1987-04-22 |
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