JPH067589B2 - MSM or MIS type element using phthalocyanine derivative thin film as semiconductor layer and method for manufacturing the same - Google Patents
MSM or MIS type element using phthalocyanine derivative thin film as semiconductor layer and method for manufacturing the sameInfo
- Publication number
- JPH067589B2 JPH067589B2 JP60047295A JP4729585A JPH067589B2 JP H067589 B2 JPH067589 B2 JP H067589B2 JP 60047295 A JP60047295 A JP 60047295A JP 4729585 A JP4729585 A JP 4729585A JP H067589 B2 JPH067589 B2 JP H067589B2
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor layer
- phthalocyanine derivative
- work function
- conductive material
- msm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/66—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
- H10D64/68—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator
- H10D64/691—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator comprising metallic compounds, e.g. metal oxides or metal silicates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/20—Organic diodes
- H10K10/23—Schottky diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/30—Coordination compounds
- H10K85/311—Phthalocyanine
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N99/00—Subject matter not provided for in other groups of this subclass
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/549—Organic PV cells
Landscapes
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
- Thin Film Transistor (AREA)
- Photovoltaic Devices (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、仕事関数の大きい導電性材料層、半導体層お
よび仕事関数の小さい導電性材料層をこの順に積層して
なるMSM型素子、仕事関数の大きい導電性材料層、半
導体層、絶縁層および仕事関数の小さい導電性材料層を
この順に積層してなるMIS型素子、ならびにその製造
方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to an MSM type element comprising a conductive material layer having a large work function, a semiconductor layer, and a conductive material layer having a small work function, which are laminated in this order, The present invention relates to a MIS-type element in which a conductive material layer having a large function, a semiconductor layer, an insulating layer, and a conductive material layer having a small work function are laminated in this order, and a manufacturing method thereof.
仕事関数の大きい金属(MA)と仕事関数の小さい金属
(MB)の間にポリ(アセチレン)、ポリ(ジアセチレ
ン)、ポリ(ピロール)、ポリ(チエニレン)等の有機
半導体(S)の薄層をはさんで成るMSM型、あるいは
さらにSとMB間に絶縁体(I)の薄層を組み入れたM
IS型の素子は多数考案されている〔“フイズィックス
・オブ・セミコンダクタ・デバイス”第2版、S.M.スツ
ェ、ジョン・ウィリィ・アンド・サン、ニューヨーク(1
981):“Physics of Semiconductor Devices”2nd E
d.,S.M.Sze,John Wiley & Sons,N.Y.(1981)、“合成金
属(化学増刊87)”白川ほか、化学同人(1980)
R.C.ウェスト、N.J.アストル編“CRCハンド
ブック・オブ・ケミストリィ・アンド・フィズィックス
CRCプレス、クリーブランド(1979)、第59
版、E−81:R.C.West,N.J.Astle Ed.,“CRC Handbo
ok of Chemistry and Physics”CRC Press,Cleaveland
(1979),59th Ed.,E-81,M.オザキ他、アプライド・フ
イズィックス・レターズ:M.Ozaki 他、Appl.Phys.L
ett 35 3 (1979)〕。しかし、これらは一
般に、S層の構造及び素子作成法に起因する不確定要素
が著しく、いずれも実用化されるに到っていない。例え
ば、これらS層は、通常MA基板上での気相重合、固相
重合あるいは電解酸化重合等により作成されるが、重合
時の伸縮あるいは電解質イオンの流出入等の理由により
その微細構造はフィブリルや山/谷の多いへき解状を成
しており、一般に多孔質であると言える。従って、S層
厚が大きくなければ、蒸着やスパッタリング等でMB層
を固定する際に、MB粒子がその微細孔へもぐり込み、
MAとMBが直接導通して素子としての機能を失いやす
い。また、これら有機半導体は、化学ドーピング、電気
化学ドーピング等の処理を施した時は、例えばポリ(ア
セチレン)/ヨウ素ドープで約102S/cm、ポリ(ピ
ロール)/ヨウ素ドープで約102S/cm、のごとく、
高導電性を与えるが、脱ドープ状態では導電性が極めて
低い。しかもドーピング処理を施したS層をMA、MB
と組み合わせると、ドーピング剤により、MA/S及び
MB/S、特にMB/S界面で腐食が進行し、経時安定
性が著しく乏しくなる。それがため、一般にこれらS層
は導電性の低い脱ドープ状態で用いられるが、既述した
MB粒子のもぐり込みを防ぐためS層を厚くする素子内
抵抗が著しく高くなり、実用に供せるほどの電流を通じ
ることができない。さらに、上述のS層は既述したごと
く膜表面の凹凸が激しい。従って、MSM型素子では、
ショットキー接合を形成する重要なS/MB界面に不純
物準位を生じやすく、結果的に素子の整流比、ダイオー
ド特性等を著しく損う。例えばポリ(アセチレン)に関
するダイオードパラメータはたかだか1.9でしか無
く、他もほぼ同様の値であり、理想状態の1.0からは
ほど遠いと言える。なお、MIS型素子では、I層厚
を、トンネル効果が期待できる位(約20Å)薄くする
必要があるので、S層表面の凹凸が激しければI層が著
しく乱れ、上述したMSM型と同様の理由で素子の特性
が損われる。Metal having a large work function (M A) and poly (acetylene) between small metal (M B) work function, poly (diacetylene), poly (pyrrole), poly etc. (thienylene) organic semiconductor (S) M incorporating a thin layer of insulator (I) MSM type comprising across the thin layer, or even between S and M B
Many IS-type devices have been devised ["Fixics of Semiconductor Devices" Second Edition, SM Suze, John Willie & Sun, New York (1
981): “Physics of Semiconductor Devices” 2nd E
d., SMSze, John Wiley & Sons, NY (1981), “Synthetic Metals (Chemical Special Issue 87)” Shirakawa and others, Kagaku Dojin (1980)
R. C. West, N.W. J. Astor, "CRC Handbook of Chemistry and Physics, CRC Press, Cleveland (1979), 59th.
Edition, E-81: RCWest, NJAstle Ed., "CRC Handbo
ok of Chemistry and Physics ”CRC Press, Cleaveland
(1979), 59th Ed., E-81, M. Ozaki et al., Applied Physics Letters: M. Ozaki et al., Appl. Phys. L
ett 35 3 (1979)]. However, in general, uncertainties due to the structure of the S layer and the method of manufacturing the device are remarkable, and none of them has been put to practical use. For example, these S layer, gas-phase polymerization in the normal M A substrate, but is prepared by solid phase polymerization or electrolytic oxidation polymerization, the microstructure because of inflow and outflow, etc. during polymerization of the telescopic or an electrolyte ion It is in the form of a fibril with many fibrils and peaks / valleys, and is generally porous. Therefore, if the S layer thickness is not large, when fixing the M B layer by vapor deposition, sputtering, etc., the M B particles go into the fine holes,
It is easy for M A and M B to directly conduct and lose the function as an element. These organic semiconductors, chemical doping, when subjected to processing in the electrochemical doping, etc., such as poly (acetylene) / about 10 2 S / cm iodine doped poly (pyrrole) / iodine doped with about 10 2 S / Cm, like
Provides high conductivity, but very low conductivity in the undoped state. Moreover, the S layer subjected to the doping treatment is M A , M B
When combined with, the doping agent, M A / S and M B / S, proceeds particularly corrosion M B / S interface, stability over time is remarkably poor. Because it has generally these S layer is used in low conductivity undoped state, remarkably high element in the resistance to increase the S layer to prevent underrun described above the M B particles, Kyoseru practical It cannot pass as much current. Furthermore, the above-mentioned S layer has severe irregularities on the film surface as described above. Therefore, in the MSM type device,
Impurity levels are likely to occur at the important S / M B interface forming a Schottky junction, and as a result, the rectification ratio of the device, the diode characteristics, etc. are significantly impaired. For example, the diode parameter for poly (acetylene) is at most 1.9, and other values are almost the same, and it can be said that it is far from the ideal state of 1.0. In the MIS type element, since the I layer needs to be thin enough to expect a tunnel effect (about 20Å), if the surface of the S layer is highly uneven, the I layer will be significantly disturbed. Therefore, the characteristics of the device are impaired.
S層の抵抗が大きく、しかも凹凸が激しい場合、換言す
れば局所的な膜厚が一定しない場合は、電流を通じたと
きに最もS層厚の小さい部位で局所的な大電流が流れる
ことになる。従って、このような場合、薄膜の不可逆的
な破壊が起こりやすい欠点がある。When the resistance of the S layer is large and the unevenness is severe, in other words, when the local film thickness is not constant, a local large current flows in a portion having the smallest S layer thickness when a current is passed. . Therefore, in such a case, there is a drawback that irreversible destruction of the thin film is likely to occur.
フタロシアニン誘導体は、可視部〜近赤外部にかけて巾
広い極大吸収を有する有機系p−型半導体であり、化学
的にも安定なため電子材料として好適である。しかしな
がら、一般の(金属)フタロシアニンは濃硫酸、熱DM
F等にわずかに溶けるのみであり、薄膜形成は熱蒸着等
に依らざるを得ない。従ってその微細構造は、多結晶状
であり、やはり膜表面の凹凸が激しいため、ショットキ
ー接合等を施したとき、前述と同様の理由により良好な
素子特性が得られない。リチウムフタロシアニンを特殊
な多元系溶剤に溶解し、それをラングミュア・ブロジェ
ット法に適用して気/水界面に薄膜を形成させ、さらに
基板上に移し取って素子化した例はあるが(例えばS.Ba
ker 他、Thin Solid Films,99 53(1983)
など)、薄膜表面の状態に関しては明確でなく、またこ
の方法ではリチウムフタロシアニンが水界面に接触する
際に加水分解されるため、結果的に金属を含まないフタ
ロシアニンの薄膜が得られるのみである。The phthalocyanine derivative is an organic p-type semiconductor having a wide maximum absorption in the visible region to the near infrared region, and is chemically stable, and thus is suitable as an electronic material. However, general (metal) phthalocyanine is concentrated sulfuric acid, heat DM
It only slightly dissolves in F and the like, and the thin film formation must rely on thermal evaporation or the like. Therefore, since the fine structure is polycrystalline and the surface of the film is highly uneven, good element characteristics cannot be obtained when the Schottky junction or the like is performed for the same reason as described above. There is an example of dissolving lithium phthalocyanine in a special multi-component solvent, applying it to the Langmuir-Blodgett method to form a thin film at the air / water interface, and then transferring it to a substrate to form an element (eg S .Ba
ker et al., Thin Solid Films, 99 53 (1983).
Etc.), the state of the thin film surface is not clear, and since lithium phthalocyanine is hydrolyzed when it contacts the water interface in this method, only a thin film of phthalocyanine containing no metal is obtained.
したがって本発明の目的は、従来のMSMまたはMIS
型素子の欠点をもたない、新規なMSMまたはMIS型
素子ならびにその製造方法を提供することである。Therefore, it is an object of the present invention to use conventional MSM or MIS.
It is an object of the present invention to provide a novel MSM or MIS type element and its manufacturing method which do not have the drawbacks of the type element.
本発明者は、半導体層として特定のフタロシアニン誘導
体から成る薄膜を使用することにより上記目的が達成で
きることを見出し本発明を完成するに至った。すなわち
本発明は、仕事関数の大きい導電性材料層、半導体層お
よび仕事関数の小さい導電性材料層をこの順に積層して
なるMSM型素子、または、仕事関数の大きい導電性材
料層、半導体層、絶縁層および仕事関数の小さい導電性
材料層をこの順に積層してなるMIS型素子において、
上記半導体層として下記の式(1)で表されるフタロシア
ニン誘導体薄膜を使用したことを特徴とするMSMまた
はMIS型素子である。The present inventor has completed the present invention by finding that the above object can be achieved by using a thin film made of a specific phthalocyanine derivative as a semiconductor layer. That is, the present invention provides an MSM type element formed by laminating a conductive material layer having a large work function, a semiconductor layer, and a conductive material layer having a small work function in this order, or a conductive material layer having a large work function, a semiconductor layer, In a MIS type element formed by laminating an insulating layer and a conductive material layer having a small work function in this order,
The MSM or MIS type device is characterized in that a phthalocyanine derivative thin film represented by the following formula (1) is used as the semiconductor layer.
但し、Rは炭素数3以上25以下の直鎖ないし枝分れ炭
化水素基、MeはH2またはマグネシウムまたは遷移金
属イオンを示し、−OR基の置換位置は上式のイソイン
ドリン基において5−位または6−位である。 However, R is a linear or branched hydrocarbon group having 3 to 25 carbon atoms, Me is H 2 or magnesium or a transition metal ion, and the substitution position of the —OR group is 5 to the isoindoline group of the above formula. Or 6-position.
式(1)のフタロシアニン誘導体は既述した一般の(金
属)フタロシアニンに特有な化学的安定性、p−型半導
体としての特性、巾広い可視〜近赤外吸収帯、などの諸
性質を備えているばかりでなく、既述の範囲内であれば
いかなる中心金属種のフタロシアニン錯体でも、少なく
ともクロロホルムに可溶である。また、式(1)のフタロ
シアニン誘導体は中心金属種によって、その温度は異な
るが、融点を持っている。従ってこれらの性質を利用
し、キャスト製膜、スピンコーティング、ラングミュア
・ブロジェット、溶融キャスト法などにより、容易に表
面が極めて平滑な半導体層が形成され、既述したような
欠陥の無いヘテロ接合や素子が作成できる。このように
本発明は簡便に特性の秀れたMSMないしMIS型の素
子及びその製造技術を与えるものである。The phthalocyanine derivative of the formula (1) has various properties such as the chemical stability peculiar to the general (metal) phthalocyanine described above, the property as a p-type semiconductor, and a wide visible to near infrared absorption band. Not only that, but any phthalocyanine complex of any central metal species within the range described above is soluble in at least chloroform. Further, the phthalocyanine derivative of the formula (1) has a melting point, although the temperature varies depending on the central metal species. Therefore, by utilizing these properties, a semiconductor layer with an extremely smooth surface can be easily formed by cast film formation, spin coating, Langmuir-Blodgett, melt-casting method, etc. Elements can be created. As described above, the present invention provides a simple MSM or MIS type device having excellent characteristics and a manufacturing technique thereof.
本発明に使用される仕事関数の大きい導電性材料MAと
しては、シート抵抗30Ω/sq.以下の酸化インジウム
スズ、グラファイト、グラッシーカーボン、ヒ素、パラ
ジウム、テルル、レニウム、イリジウム、白金、金、ロ
ジウム、ルテニウム、セレンおよびゲルマニウムがあげ
られる。The conductive material M A having a large work function used in the present invention has a sheet resistance of 30 Ω / sq. The following are indium tin oxide, graphite, glassy carbon, arsenic, palladium, tellurium, rhenium, iridium, platinum, gold, rhodium, ruthenium, selenium and germanium.
また、仕事関数の小さい導電性材料MBとしては、リチ
ウム、ベリリウム、ナトリウム、マグネシウム、アルミ
ニウム、カリウム、カルシウム、スカンジウム、チタ
ン、マンガン、ジルコニウム、ガリウム、イットリウ
ム、ニオブ、カドミウム、インジウム、アンチモン、ラ
ンタニド類、タリウム、鉛があげられる。Further, examples of the conductive material M B having a small work function include lithium, beryllium, sodium, magnesium, aluminum, potassium, calcium, scandium, titanium, manganese, zirconium, gallium, yttrium, niobium, cadmium, indium, antimony, and lanthanides. , Thallium, lead.
本発明に使用される絶縁層としては、炭素数16〜22の
直鎖飽和脂肪酸の金属塩、特に、カドミウム塩、水銀塩
またはアルカリ土類金属塩が好ましい。The insulating layer used in the present invention is preferably a metal salt of a straight chain saturated fatty acid having 16 to 22 carbon atoms, particularly a cadmium salt, a mercury salt or an alkaline earth metal salt.
本発明のMSMまたはMIS型素子は、仕事関数の大き
い導電性材料から成る基板上に、式(1)で表されるフタ
ロシアニン誘導体薄膜から成る半導体層を設け、この半
導体層上に、絶縁層を設けあるいは設けることなく、仕
事関数の小さい導電性材料層を形成することにより製造
することができる。In the MSM or MIS type element of the present invention, a semiconductor layer made of a phthalocyanine derivative thin film represented by the formula (1) is provided on a substrate made of a conductive material having a large work function, and an insulating layer is provided on the semiconductor layer. It can be manufactured by forming a conductive material layer having a low work function with or without providing.
またフタロシアニン誘導体から成る半導体層は、たとえ
ばフタロシアニン誘導体の単分子膜を垂直浸漬法または
水平付着法により基板上に移し取ることにより、あるい
は、フタロシアニン誘導体の揮発性有機溶剤溶液を基板
上に塗布し、溶剤を蒸散させることにより、あるいはま
たフタロシアニン誘導体を基板上に溶融キャストするこ
とにより形成することができる。Further, the semiconductor layer composed of a phthalocyanine derivative, for example, by transferring a monomolecular film of the phthalocyanine derivative onto the substrate by a vertical dipping method or a horizontal deposition method, or by applying a volatile organic solvent solution of the phthalocyanine derivative on the substrate, It can be formed by evaporating the solvent or alternatively by melt casting the phthalocyanine derivative on the substrate.
絶縁層は、たとえば、直鎖脂肪酸金属塩の単分子膜を垂
直浸漬法または水平付着法により基板上に移し取ること
により形成することができる。The insulating layer can be formed, for example, by transferring a monomolecular film of a linear fatty acid metal salt onto a substrate by a vertical dipping method or a horizontal attachment method.
本発明に使用するフタロシアニン誘導体は、たとえば、
式(2)に示す4−ニトロフタロニトリルとR−OH(R
は既述の通り)の反応 により相当する4−アルコキシフタロニトリルを得て、
さらに脱水メタノール中ナトリムウメトキサイドを触媒
としてアンモニアガスと反応させてジイミノイソインド
リン中間体(式(3))を経て、マグネシウムまたは遷移
金属の塩の存在下または無存在下に2−ジメチルアミノ
エタノール中で沸点還流下に閉環縮合することにより得
られる。The phthalocyanine derivative used in the present invention is, for example,
4-nitrophthalonitrile represented by the formula (2) and R-OH (R
Is as described above) To obtain the corresponding 4-alkoxyphthalonitrile,
Furthermore, it is reacted with ammonia gas using sodium trimethoxide in dehydrated methanol as a catalyst to form a diiminoisoindoline intermediate (formula (3)), and then 2-dimethylamino in the presence or absence of a salt of magnesium or a transition metal. It is obtained by ring-closing condensation in ethanol under reflux of boiling point.
本発明のMSMまたはMIS型素子は、こうして得られ
たフタロシアニン誘導体を、前述のとおり、仕事関数の
大きい導電性基板上に、揮発性の溶剤溶液よりキャスト
製膜または、スピンコーティングするか、あるいは、そ
の溶液を水面上に滴下して溶剤を蒸散させて得られる単
分子膜を垂直浸漬法ないし水平付着法により既述の基板
上にくり返し移し取るかあるいは溶融キャストによりフ
タロシアニン誘導体の膜厚20Å〜1μmの半導体層を
形成させ、そのまま、あるいは炭素数16〜22の直鎖
飽和脂肪酸のカドミウム塩ないし水銀塩ないしアルカリ
土類金属塩の単分子層を上述と同様に垂直浸漬法ないし
水平付着法で移し取った後に、仕事関数の小さい導電性
材料を蒸着、スパッタ等で被覆することにより製造され
る。 As described above, the MSM or MIS type device of the present invention is obtained by casting or spin-coating the thus obtained phthalocyanine derivative on a conductive substrate having a large work function from a volatile solvent solution. The monomolecular film obtained by dripping the solution on the water surface and evaporating the solvent is repeatedly transferred onto the above-mentioned substrate by the vertical dipping method or the horizontal attachment method, or the film thickness of the phthalocyanine derivative is 20 Å ~ 1 μm by melt casting. And the monomolecular layer of a straight chain saturated fatty acid having 16 to 22 carbon atoms, such as a cadmium salt, a mercury salt or an alkaline earth metal salt, is transferred by the vertical dipping method or the horizontal deposition method as described above. After being taken, it is manufactured by coating a conductive material having a small work function by vapor deposition, sputtering or the like.
式(1)のフタロシアニン誘導体は、Rが炭素数2以下で
は不溶性であり、炭素数26以上では合成が困難であ
る。そして既述の範囲内である限り、中心金属種のいか
んにかかわらず、少くともクロロホルムに可溶である。
特にRが炭素数8以上の場合は、DMF、DMSO、ヘ
キサメチルホスホリックトリアミド、炭素数4以下のア
ルコール類を除く一般の低誘電率有機溶剤に全て可溶と
なり、石油エーテルにすら溶解する。この可溶性を利用
すれば、例えばクロロホルム溶液よりキャスト製膜ない
しスピンコーティングにより、容易にフタロシアニン誘
導体の半導体層が形成できる。製膜用溶剤としては、沸
点が約60〜80℃の範囲内にあるものが好ましく、例
えばクロロホルム、THF、ベンゼン、二塩化エタンな
どがあげられる。これらの中で、クロロホルムが最も好
適である。キャスト製膜においては、そのフタロシアニ
ン誘導体の10mg/ml以上の濃度か、あるいは溶解度
がこれ以下のときは飽和した有機溶剤溶液とし、0℃〜
30℃の範囲内で既述の基板上に展開し、その有機溶剤
の飽和蒸気圧の1/2の蒸気圧下から始め、しだいに空中
の溶剤蒸気量を低下して徐々に溶剤を蒸散し、最終的に
は真空乾燥を行う。この過程は極めてゆるやかに行うの
が好ましく、例えばR=n−プロピル、Me=銅、10
mg/mlのクロロホルム溶液1mlを表面積100cm2
の酸化インジウムスズネサガラス(以下「ITO」と略
す。)上に展開した場合は、20℃にて真空乾燥に到る
までに約3日間を要する。この過程を高温で迅速に行う
と多孔性膜となり、不適当である。この手法で形成され
る半導体層薄膜は比較的厚く、数百Å〜1μmの範囲で
ある。スピンコーティングにおいては、式(1)のフタロ
シアニン誘導体を1mg/ml〜0.5mg/ml程度のク
ロロホルム溶液とし、回転させた基板の中心に滴下し、
溶剤を蒸散せしめると薄膜が形成される。基板回転速
度、展開温度はフタロシアニン誘導体の種類、滴下量、
基板の面積に依存するが、例えばR=n−プロピル、M
e=銅、1mg/mlのクロロホルム溶液500μを表
面積100cm2のITO表面に展開する場合は、基板温
度30℃、基板回転速度2000rpm程度が好ましい。
この手法で形成される半導体層薄膜は、約50〜数百Å
の範囲である。The phthalocyanine derivative of the formula (1) is insoluble when R has 2 or less carbon atoms and difficult to synthesize when R has 26 or more carbon atoms. And as long as it is within the range described above, it is soluble in at least chloroform regardless of the central metal species.
In particular, when R has 8 or more carbon atoms, it becomes all soluble in general low dielectric constant organic solvents except DMF, DMSO, hexamethylphosphoric triamide, and alcohols having 4 or less carbon atoms, and even soluble in petroleum ether. . By utilizing this solubility, a semiconductor layer of a phthalocyanine derivative can be easily formed by casting a film from a chloroform solution or spin coating. The film-forming solvent preferably has a boiling point in the range of about 60 to 80 ° C., and examples thereof include chloroform, THF, benzene, ethane dichloride and the like. Of these, chloroform is most preferred. In the cast film formation, when the concentration of the phthalocyanine derivative is 10 mg / ml or more, or when the solubility is less than this, a saturated organic solvent solution is prepared,
It spreads on the above-mentioned substrate within the range of 30 ° C, starts from the vapor pressure of 1/2 of the saturated vapor pressure of the organic solvent, gradually reduces the amount of solvent vapor in the air, and gradually evaporates the solvent, Finally, vacuum drying is performed. This process is preferably performed very gently, eg R = n-propyl, Me = copper, 10
1 ml of a mg / ml chloroform solution has a surface area of 100 cm 2.
When it is spread on indium tin oxide glass (hereinafter abbreviated as “ITO”), it takes about 3 days to reach vacuum drying at 20 ° C. If this process is carried out rapidly at a high temperature, a porous film is formed, which is unsuitable. The semiconductor layer thin film formed by this method is relatively thick and has a thickness of several hundred Å to 1 μm. In the spin coating, the phthalocyanine derivative of the formula (1) is made into a chloroform solution of about 1 mg / ml to 0.5 mg / ml and dropped on the center of the rotated substrate,
When the solvent is evaporated, a thin film is formed. The substrate rotation speed and the development temperature depend on the type of phthalocyanine derivative, the dropping amount,
Depending on the area of the substrate, for example, R = n-propyl, M
When 500 μ of a 1 mg / ml chloroform solution of e = copper is spread on the ITO surface having a surface area of 100 cm 2 , the substrate temperature is preferably 30 ° C. and the substrate rotation speed is about 2000 rpm.
The semiconductor layer thin film formed by this method is about 50 to several hundred Å
Is the range.
式(1)のフタロシアニン誘導体の1.0mg/m〜0.
5mg/ml程度のクロロホルム溶液を、典型的には、4
00〜500μlを2500cm2の水面上に滴下し、溶
媒を蒸散させた後、気水界面に設置されたしきり板を移
動し、表面圧5〜30dyn/cmとして得られるフタロシア
ニン誘導体の単分子層膜を、水面に垂直に設置された既
述の基板を適当量水面下に没するまで引き下げた後空中
に引き上げる操作をくり返し行う(この手法を垂直浸漬
法と略記する)か、水面と平行に設置された既述の基板
を上述の単層膜に接するまで下げた後、引き上げる操作
をくり返し行う(この手法を水平付着法と略記する)こ
とにより、累積膜状の半導体層が形成される。このとき
の基板の上下速度が充分遅ければ、膜の累積状態およ
び、膜の平面方向の配向性が極めて秀れた半導体層が得
られる。しかし操作性能を考え合わせれば、上下速度は
0.5mm/min以下であればさしつかえなく、本発明の
実施例においては0.5〜0.2mm/minの範囲であ
る。式(1)のフタロシアニン誘導体の気/水界面での存
在状態は模式的に添付図面で表現される。これを基板に
移し取ったときに基板表面に向って親水基であるエーテ
ル酸素とフタロシアニン環が位置するX膜、逆に疎水基
であるR基が位置するZ膜、その状況が各単層ごとにX
型、Z型の両者の配置をくり返して成るY膜の三種が考
えられる。垂直浸漬法で累積数が約5以下ではX膜ない
しZ膜が形成されやすく累積数の増加とともにY膜とな
る。但し、累積数が小さいときX型、Z型のいずれにな
るかは、基板の性質及びMeとR基の種類に大きく依存
する。1.0 mg / m of the phthalocyanine derivative of the formula (1) to 0.
Chloroform solution of about 5 mg / ml, typically 4
A monolayer film of a phthalocyanine derivative obtained by adding 0 to 500 μl onto a water surface of 2500 cm 2 to evaporate the solvent, and then moving a sill plate installed at the air-water interface to obtain a surface pressure of 5 to 30 dyn / cm. Repeat the operation of pulling down the above-mentioned substrate installed vertically to the water surface until it is submerged in an appropriate amount and then lifting it into the air (this method is abbreviated as vertical immersion method), or installed parallel to the water surface. The accumulated film-like semiconductor layer is formed by lowering the above described substrate until it comes into contact with the above-mentioned monolayer film, and then repeating the pulling operation (this method is abbreviated as horizontal attachment method). If the vertical velocity of the substrate at this time is sufficiently low, a semiconductor layer having an extremely excellent accumulated state of the film and orientation in the plane direction of the film can be obtained. However, considering the operation performance, the vertical speed may be 0.5 mm / min or less, and is in the range of 0.5 to 0.2 mm / min in the embodiment of the present invention. The state of existence of the phthalocyanine derivative of formula (1) at the air / water interface is schematically represented in the accompanying drawings. When this is transferred to the substrate, the X film on which the ether oxygen, which is a hydrophilic group, and the phthalocyanine ring are located, and the Z film, on the contrary, where the R group, which is a hydrophobic group, is located toward the substrate surface. To X
Three types of Y films, which are formed by repeating the arrangement of both the Z-type and the Z-type, are conceivable. If the cumulative number is about 5 or less in the vertical dipping method, an X film or a Z film is easily formed, and the Y film is formed as the cumulative number increases. However, which of the X-type and the Z-type when the cumulative number is small largely depends on the properties of the substrate and the types of Me and R groups.
また累積数増加に伴うX型ないしZ型からY型への移行
が、どの位の累積数から起こるかということも、基板の
性質及びMeとR基の種類に大きく依存する。The cumulative number of transitions from the X-type or Z-type to the Y-type due to the increase in the cumulative number also largely depends on the nature of the substrate and the types of Me and R groups.
なお、水平付着法では、原理的にZ膜のみが形成され
る。In the horizontal deposition method, only the Z film is formed in principle.
これら垂直浸漬法ないし水平付着法による累積膜状の半
導体層は、原理的には単分子層膜、すなわち分子の厚み
から形成可能であり累積をくり返し行えば、mmオーダー
まで可能である。しかし、後に詳述する素子化、及び既
述の累積方法の操作性能を考え合わせると、1μm位ま
でが妥当である。また、R基のいかんにかかわらず、平
均膜厚20Å以下の場合、基板の表面凹凸によると考え
られるが、MBと組合せてMSM型素子を形成する際、
MAとMBが直接導通して何ら特徴的な機能が現われな
い。また同様に平均膜厚20Å以下では、I及びMBと
組合せたMIS型素子ではI層の大巾な乱れを生じると
考えられ、やはりMIS型素子に特徴的な機能が現れな
い。約20Åの膜厚はR=n−プロピルのとき累積数4
に相当し、R=n−ペンタエイコサニルのときは、累積
数1に相当する。In principle, the cumulative film-like semiconductor layer formed by the vertical dipping method or the horizontal deposition method can be formed from a monomolecular layer film, that is, the thickness of the molecule, and can be up to the mm order if the accumulation is repeated. However, considering the operation performance of the element formation which will be described in detail later and the accumulation method described above, up to about 1 μm is appropriate. Further, regardless of the R groups, if: the average film thickness 20 Å, it is considered to be due to surface irregularities of the substrate, when forming the MSM element in combination with M B,
M A and M B are in direct conduction and no characteristic function appears. The average film thickness of 20Å or less, like in MIS type device in combination with I and M B is believed to result in greatly disturbance of I layer, it does not appear again characteristic function to the MIS type element. The film thickness of about 20Å is 4 when R = n-propyl.
When R = n-pentaeicosanyl, it corresponds to the cumulative number 1.
この垂直浸漬法ないし水平付着法による累積膜状の半導
体層は、構成単位の式(1)で示されるフタロシアニン誘
導体が微視的分子配向状態にあり、かつ表面が平滑であ
るところに特徴がある。従って、ヘテロ接着を形成した
際、界面に不純物準位が生じにくくまた、膜のどの部分
にも平均的に電流が流れるため、破壊電圧が高い、大電
流の通電が可能、整流比およびダイオードパラメーター
に優れる、などの高機能性を発揮できる。The cumulative film-like semiconductor layer formed by the vertical dipping method or the horizontal attachment method is characterized in that the phthalocyanine derivative represented by the formula (1) of the constitutional unit is in a microscopic molecular orientation state and the surface is smooth. . Therefore, when a hetero-adhesion is formed, an impurity level is unlikely to occur at the interface, and a current flows evenly in any part of the film, so that the breakdown voltage is high, a large current can be applied, the rectification ratio and the diode parameter. It can exhibit high functionality such as excellent.
式(1)のフタロシアニン誘導体は、中心金属種により多
少異なるが約400℃付近に融点を有し、窒素、アルゴ
ンなどの不活性雰囲気下では安定な粘度のある液状物と
なる。但し、融点より約50°高い温度で分解が始まる
ので、融点以上、分解点以下の温度範囲で不活性雰囲気
下に操作すれば、既述の基板上に半導体層を溶融キャス
トできる。この場合、スピンコーティングと同様に、融
点以上の液状物を高速回転する基板の中心に滴下しても
良いが、むしろ回転を止めたまま基板の中心に粉末状固
形物を所定量置き、融点以上に加温して液状となったと
きに徐々に回転数を上げて行く手法の方が一定の膜厚と
なりやすい。なお、高速回転基板−液状物滴下の方法を
以下「滴下回転法」、粉末状固形物−溶融−回転の方法
を以下「溶融回転法」と略記し、実施例中においてもこ
の略称を使用する。この両法において、定常状態の基板
回転数は5000〜8000rpm程度が好ましく、この
範囲内のどの値に設定するかは、液状物の滴下量、粉末
状固形物設置量及び基板面積により異なる。基板回転中
は、基板温度は融点以上、分解点以下に設定する必要が
あり、液状の半導体層が展開されたらできるだけゆるや
かに回転を止め、急冷するのが好ましい。但し後述する
ように本発明の素子は式(1)においてRが炭素数12以
上の直鎖アルキル基のフタロシアニン誘導体を半導体層
に用いる場合、エレクトロクロミックディスプレイ素子
としても利用されるがこの目的に限り徐冷を行った方が
ディスコティック液晶の配向状態が良好になり、好まし
い。急冷の場合、典型的には基板裏面にドライアイスよ
り発生したばかりの冷CO2ガスをふきつけて行う。ま
た徐冷の際は外界よりの熱源で基板温度を制御し、1〜
10℃/分程度の降温を行う。なお、急冷の場合、半導
体層の構造はアモルファス状をなし、表面は大まかなう
ねりを除けば極めて平滑であり、MSMないしMIS型
素子の接合特性を利用する整流素子、電界効果トランジ
スタ等の製作に適しており、整流比、ダイオードパラメ
ータ共に良好な状況を具現化できる。他方、徐冷の場
合、特に式(1)においてRが炭素数12以上の直鎖アル
キル基フタロシアニン誘導体を用いた場合は、偏光性を
有するディスコティック液晶となり、Rが炭素数11以
下のアルキル基のときは一部ないし大部分に結晶成長が
認められ(この傾向は炭素数が小さいほど大きい)、い
ずれの場合も表面に微細な凹凸が認められる。従ってこ
の場合、接合特性は必ずしも良好でなく、例えばダイオ
ードパラメータは1.9を超える。The phthalocyanine derivative of the formula (1) has a melting point near about 400 ° C., although it varies slightly depending on the central metal species, and becomes a liquid substance having a stable viscosity in an inert atmosphere such as nitrogen or argon. However, since the decomposition starts at a temperature about 50 ° higher than the melting point, the semiconductor layer can be melt cast on the above-mentioned substrate by operating in an inert atmosphere in the temperature range from the melting point to the decomposition point. In this case, like spin coating, a liquid substance having a melting point or higher may be dropped onto the center of the substrate that rotates at a high speed, but rather, a predetermined amount of powdery solid substance may be placed on the center of the substrate while the rotation is stopped, and The method of gradually increasing the number of revolutions when it is heated to become liquid becomes easier to obtain a constant film thickness. The high-speed rotating substrate-liquid material dropping method is abbreviated as "drop rotation method" below, and the powdery solid material-melting-rotation method is abbreviated as "melt rotation method" below, and this abbreviation is used in Examples. . In both of these methods, the substrate rotation speed in the steady state is preferably about 5000 to 8000 rpm, and which value is set within this range depends on the dropping amount of the liquid substance, the powder solid substance installation amount, and the substrate area. During the rotation of the substrate, it is necessary to set the substrate temperature above the melting point and below the decomposition point. When the liquid semiconductor layer is developed, it is preferable to stop the rotation as gently as possible and quench it. However, as will be described later, the device of the present invention is used as an electrochromic display device when R is a phthalocyanine derivative of a linear alkyl group having 12 or more carbon atoms in the formula (1) is used as a semiconductor layer. The slow cooling is preferable because the discotic liquid crystal has a better alignment state. In the case of rapid cooling, typically, cold CO 2 gas just generated from dry ice is wiped onto the back surface of the substrate. During slow cooling, the substrate temperature is controlled by a heat source from the outside,
The temperature is lowered at about 10 ° C./minute. In the case of rapid cooling, the structure of the semiconductor layer is amorphous, and the surface is extremely smooth except for rough undulations, which is useful for manufacturing rectifying devices, field effect transistors, etc. that utilize the junction characteristics of MSM or MIS type devices. It is suitable and can realize a good situation in terms of rectification ratio and diode parameters. On the other hand, in the case of slow cooling, particularly when a straight chain alkyl group phthalocyanine derivative having R 12 or more carbon atoms in the formula (1) is used, a discotic liquid crystal having a polarizing property is obtained, and R is an alkyl group C 11 or less. In this case, crystal growth was observed in a part or most of the area (this tendency is greater as the carbon number is smaller), and in any case, fine irregularities are observed on the surface. Therefore, in this case, the junction characteristics are not always good, and the diode parameter exceeds 1.9, for example.
なお、滴下回転法、溶融回転法のいずれも、半導体層の
膜厚は数千〜1μm程度である。In both the dropping rotation method and the melting rotation method, the film thickness of the semiconductor layer is about several thousand to 1 μm.
仕事関数の大きい導電性材料基板MAは、薄板状であれ
ば特にその形状に限定は無い。但し、特に垂直浸漬法な
いし水平付着法で100Å以下の半導体層を作成する場
合は、板厚が2mm以下であることが望ましく、1〜0.
5mmが最も好適である。また、基板表面の粗さは、その
上に作成される半導体層の膜厚精度に影響するので、で
きうる限り平滑であることが望ましい。例えば、ITO
では通常のCVD法で平板ガラス表面にネサ層が作成さ
れたもの、ピロリティックグラファイトでは新鮮なベイ
サル(basal)へき解面を有するもの、グラッシーカー
ボンではあらかじめ3〜1μmのアルミナ粉で研磨して
後その表面同士を約2000〜5000rpmで回転させ
ながらすり合せ研磨した表面を持つもの、他の金属種で
はガラスないしその金属の平板面に通常の高周波スパッ
タリングにより平滑金属面としたものが本発明の基板と
して好適である。このうち、ピロリティックグラファイ
トのみに関しては、その上に作成される半導体層の膜厚
が2000Å以上を要し、それ以下では基板表面の凹凸
により半導体層で覆われていない基板の裸表面が認めら
れ、後述する素子化の目的には使用できない。The shape of the conductive material substrate M A having a large work function is not particularly limited as long as it is a thin plate. However, particularly when a semiconductor layer having a thickness of 100 Å or less is formed by the vertical dipping method or the horizontal deposition method, the plate thickness is preferably 2 mm or less, and 1 to 0.
5 mm is most suitable. Further, since the roughness of the substrate surface affects the film thickness accuracy of the semiconductor layer formed thereon, it is desirable that the roughness be as smooth as possible. For example, ITO
Then, a nesa layer was formed on the surface of a flat glass by a normal CVD method, a pyrolytic graphite had a fresh basal cleavage surface, and a glassy carbon was previously polished with 3 to 1 μm of alumina powder. The substrate of the present invention is one having a surface polished by laminating the surfaces while rotating each other at about 2000 to 5000 rpm, and for other metal species, glass or a flat plate surface of the metal which is a smooth metal surface by ordinary high frequency sputtering. Is suitable as Of these, only for pyrolytic graphite, the film thickness of the semiconductor layer formed on it is 2000 Å or more, and if it is less than that, the bare surface of the substrate which is not covered by the semiconductor layer is recognized due to the unevenness of the substrate surface. However, it cannot be used for the purpose of forming an element described later.
以上のようにして得られるMA/Sの上に、仕事関数の
小さい導電性材料MBを被覆すれば、MSM型の素子と
なる。これらの被覆方法は、リチウム、ベリリウム、ナ
トリウム、マグネシウム、アルミニウム、カリウム、カ
ルシウムに関しては熱蒸着で行うことができ、他は高周
波スパッタリングによる。If M A / S obtained as described above is coated with a conductive material M B having a small work function, an MSM type element is obtained. These coating methods can be carried out by thermal vapor deposition for lithium, beryllium, sodium, magnesium, aluminum, potassium, calcium, and the other is by high frequency sputtering.
MA/Sの上にMBを被覆する際、炭素数16〜22の
直鎖飽和脂肪酸のカドミウム塩ないし水銀塩ないしアル
カリ土類金属塩の単分子層をSとMBの間に形成させれ
ばMIS型素子となる。この直鎖脂肪酸金属塩単層膜の
展開方法は、前述した垂直浸漬法ないし水平付着法で行
われる。但し、既述の直鎖脂肪酸の1.0〜0.5mg/
mlのクロロホルム溶液を水面に滴下し、その時水相に
0.1〜0.8ミリモル/の塩化カドミウム、塩化水
銀、アルカリ土類金属塩化物を存在させることにより、
結果的に該脂肪酸の金属塩の単膜層を形成させる。これ
ら単層膜形成時の表面圧は15〜25dyn/cm程度である
が、20〜22dyn/cmが最も好適である。When M B is coated on M A / S, a monolayer of a straight chain saturated fatty acid having 16 to 22 carbon atoms such as a cadmium salt, a mercury salt or an alkaline earth metal salt is formed between S and M B. If it becomes a MIS type element. The straight-chain fatty acid metal salt monolayer film is developed by the above-mentioned vertical dipping method or horizontal adhesion method. However, 1.0-0.5 mg / of the above-mentioned linear fatty acid
ml of chloroform solution was added dropwise to the water surface, and then 0.1 to 0.8 mmol / cadmium chloride, mercuric chloride and alkaline earth metal chloride were present in the aqueous phase,
As a result, a monolayer of the metal salt of the fatty acid is formed. The surface pressure at the time of forming these single layer films is about 15 to 25 dyn / cm, but 20 to 22 dyn / cm is most preferable.
本発明のMSMまたはMIS型素子は、整流特性、ダイ
オード特性に秀れ、特に式(1)において、Rが炭素数5
以下のアルキル基のフタロシアニン誘導体を半導体層と
して用いた場合は、数百mA/cm2の大電流を通じても
破壊されない。従って、ダイオード等の整流素子、電界
効果トランジスタ等に利用できる。また、式(1)のフタ
ロシアニン誘導体より成る半導体層が可視部〜近赤外部
に巾広い吸収帯を有することから太陽電池としても利用
できる。さらに、式(1)において、Rが炭素数12以上
の直鎖状アルキル基の場合は半導体層薄膜形成時にディ
スコティック液晶となり、電圧印加で分子配向状態が変
化して色調が変わるのでエレクトロクロミックディスプ
レイとして利用できる。The MSM or MIS type element of the present invention is excellent in rectifying characteristics and diode characteristics, and particularly in the formula (1), R is 5 carbon atoms.
When the following phthalocyanine derivative having an alkyl group is used as a semiconductor layer, it is not destroyed even by a large current of several hundred mA / cm 2 . Therefore, it can be used as a rectifying element such as a diode, a field effect transistor, or the like. Further, since the semiconductor layer made of the phthalocyanine derivative of the formula (1) has a wide absorption band in the visible region to the near infrared region, it can be used as a solar cell. Further, in the formula (1), when R is a straight-chain alkyl group having 12 or more carbon atoms, it becomes a discotic liquid crystal at the time of forming a semiconductor layer thin film, and the molecular orientation state is changed by applying a voltage, and the color tone is changed. Available as
次に参考例および実施例により本発明をさらに詳細に説
明する。Next, the present invention will be described in more detail by reference examples and examples.
参考例1 4−ニトロ−1,2−フタロニトリル(以下NPNと
略)50g(0.29モル)、n−プロピルアルコール
21g(0.35モル)を100mlの脱水DMFに溶
解し、CaCl2乾燥管付き還流管、窒素導入管を備え
た300ml4つ口フラスコに入れ、撹拌しながら窒素
雰囲気下に1,8−ジアザビシクロ〔5,4,0〕ウン
デセン−(7)を43.07ml(0.29モル)加え、
65℃にて6時間反応させた。冷却後40℃以下にて減
圧濃縮し、適量のクロロホルムを加えて600mlの水
冷6N−HCl中に投じ、クロロホルム相を分離する。
水相を100ml×3回のクロロホルムで抽出して先の
クロロホルム相と合わせ、無水硫酸ナトリウムで乾燥、
濾過、活性炭脱色処理し、溶媒を減圧濃縮する。冷却後
析出する黄色結晶(未反応のNPN)を取り除き、母液
をさらに濃縮して再結晶し、白色結晶53.0g(9
3.4%)を得た。分析の結果、目的の4−n−プロポ
キシ−1,2−フタロニトリルであることがわかった。Reference Example 1 4-nitro-1,2-phthalonitrile (hereinafter abbreviated as NPN) 50 g (0.29 mol) and n-propyl alcohol 21 g (0.35 mol) were dissolved in 100 ml of dehydrated DMF and dried with CaCl 2. It was placed in a 300 ml four-necked flask equipped with a reflux tube with a tube and a nitrogen introduction tube, and 43,07 ml (0.29 ml) of 1,8-diazabicyclo [5,4,0] undecene- (7) was placed in a nitrogen atmosphere while stirring. Mol),
The reaction was carried out at 65 ° C for 6 hours. After cooling, the mixture is concentrated under reduced pressure at 40 ° C. or lower, an appropriate amount of chloroform is added, and the mixture is poured into 600 ml of water-cooled 6N-HCl to separate the chloroform phase.
The aqueous phase was extracted with 100 ml × 3 times of chloroform, combined with the above chloroform phase, and dried over anhydrous sodium sulfate,
After filtering and decolorizing the activated carbon, the solvent is concentrated under reduced pressure. After cooling, the yellow crystals (unreacted NPN) that precipitated were removed, and the mother liquor was further concentrated and recrystallized to give 53.0 g (9
3.4%) was obtained. As a result of the analysis, it was found to be the target 4-n-propoxy-1,2-phthalonitrile.
NMR(CDCl3、δppm):Ha 7.1、7.2
(1H)、Hb 7.2(1H)、Hc 7.65、
7.7(1H)、Hd 4.3(2H)、He 2.2
(2H)、Hf 1.3(3H) IR(KBr錠剤、cm-1):νφ−H 3100、30
50、3000、 2980、2950、2850、νC≡N2550 このもの全量を既述と同様の装置に入れ、脱水メタノー
ル200ml中、ナトリウムメトキシド2gを加え、乾
燥アンモニアガスを激しく通じながら常温で2時間、沸
点還流下に1時間反応させた。冷却後生じる白色沈澱を
濾集し、真空乾燥して5−プロポキシジイミノイソイン
ドリン54.2g(98.5%)を得た。 NMR (CDCl 3 , δppm): Ha 7.1, 7.2
(1H), Hb 7.2 (1H), Hc 7.65,
7.7 (1H), Hd 4.3 (2H), He 2.2
(2H), Hf 1.3 (3H) IR (KBr tablet, cm −1 ): ν φ-H 3100, 30
50, 3000, 2980,2950,2850, ν C≡N 2550 put this thing whole amount above the same device, in dry methanol 200 ml, sodium methoxide 2g addition, 2 hours at room temperature while passing vigorous dry ammonia gas, boiling point reflux The reaction was allowed to proceed for 1 hour. The white precipitate formed after cooling was collected by filtration and vacuum dried to obtain 54.2 g (98.5%) of 5-propoxydiiminoisoindoline.
5−プロポキシジイミノイソインドリン IR(KBr錠剤、cm-1):νNH3400、νφ−H3
100、3045、3000、 2980、2955、2850、δNH1640の出現及
びνCN2250は消失 このものは強吸湿性であり、確認はIRよりνC≡Nの
消失、νNH及びδNHの出現により行った。5-propoxydiiminoisoindoline IR (KBr tablet, cm −1 ): ν NH 3400, ν φ-H 3
100, 3045, 3000, 2980,2955,2850, appearance and [nu CN 2250 of [delta] NH 1640 is lost is this compound strongly hygroscopic, confirmed the disappearance of [nu C≡N than IR, it was carried out by the appearance of [nu NH and [delta] NH.
このもの5.2g(25.6ミリモル)を脱水2−ジメ
チルアミノエタノール20mlに溶解、乾燥窒素雰囲気
下に6時間沸点還流する。冷却後、メタノール約600
ml中に投じ、生じる緑色沈澱を濾集し、式(1)におい
てR=n−プロピル、Me=H2のフタロシアニン誘導
体2.3g(48.2%)を得た。5.2 g (25.6 mmol) of this product was dissolved in 20 ml of dehydrated 2-dimethylaminoethanol and refluxed at the boiling point for 6 hours in a dry nitrogen atmosphere. After cooling, methanol about 600
The resulting green precipitate was collected by filtration to obtain 2.3 g (48.2%) of a phthalocyanine derivative of the formula (1) in which R = n-propyl and Me = H 2 .
FDマススペクトル:M/e=747(分子量746.
87) 元素分析(wt%、カッコ内計算値): C 71.22(70.76)、H 5.75(5.6
7)N 14.96(15.00) 可視吸収スペクトル(CHCl3nm、カッコ内log
ε):704.5(5.06)、668(5.0
0)、642(4.66)、607(4.44)578
sh、558sh、390(4.53) 参考例2 n−プロピルアルコールの替りにn−エイコサノール1
04.5g(0.35モル)、ジアザビシクロ〔5、
4、0〕ウンデセン−(7)の替りに4−メチルピリジン
27g(0.29モル)を用いた他は、参考例1と同様
にして白色ろう状結晶110.4g(89.7%)の目
的の4−エイコサノキシ−1,2−フタロニトリルを得
た。FD mass spectrum: M / e = 747 (molecular weight 746.
87) Elemental analysis (wt%, calculated value in parentheses): C 71.22 (70.76), H 5.75 (5.6)
7) N 14.96 (15.00) visible absorption spectrum (CHCl 3 nm, log in parentheses)
ε): 704.5 (5.06), 668 (5.0
0), 642 (4.66), 607 (4.44) 578
sh , 558 sh , 390 (4.53) Reference Example 2 n-Eicosanol 1 instead of n-propyl alcohol
04.5 g (0.35 mol), diazabicyclo [5,
4,0] Undecene- (7) was replaced with 27 g (0.29 mol) of 4-methylpyridine, and 110.4 g (89.7%) of white waxy crystals were prepared in the same manner as in Reference Example 1. The target 4-eicosanoxy-1,2-phthalonitrile was obtained.
NMR(CDCl3、δppm):Ha 7.1、7.2
(1H)、Hb 7.2(1H)、Hc 7.65、
7.7(1H)、α−CH24.25(2H)、β−C
H22.2(2H)、γ−CH21.85(2H)、他
のCH21.6(巾広、32H)CH31.3(3H) IR(KBr錠剤、cm-1):CH2伸縮振動帯(280
0〜3000)、CH2変角振動帯(1450付近)な
どの吸収帯強度が極めて大きい他は、4−プロポキシ−
1,2−フタロニトリルを酷似している。 NMR (CDCl 3 , δppm): Ha 7.1, 7.2
(1H), Hb 7.2 (1H), Hc 7.65,
7.7 (1H), α-CH 2 4.25 (2H), β-C
H 2 2.2 (2H), γ-CH 2 1.85 (2H), other CH 2 1.6 (wide, 32H) CH 3 1.3 (3H) IR (KBr tablets, cm -1 ). : CH 2 stretching vibration band (280
0 to 3000), CH 2 bending vibration band (around 1450), and the like.
It is very similar to 1,2-phthalonitrile.
このもの全量を参考例1と同様にNH3ガスと反応さ
せ、相当する5−エイコサノキシジイミノイソインドリ
ン109.1g(95%)を得た。このものは吸湿性が
強いため、IR(KBr錠剤法)分析により、νNH34
00、δNH1640cm-1の出現、及びνC≡N2250cm
-1の消失より構造を確認した。なお、既述のCH2伸縮
ないし変角振動帯の強度が極めて大きい他は、5−プロ
ポキシジイミノイソインドリンのIRと酷似する。The whole amount of this was reacted with NH 3 gas in the same manner as in Reference Example 1 to obtain 109.1 g (95%) of the corresponding 5-eicosanoxidiminoisoindoline. Since this product has a strong hygroscopic property, it was found by IR (KBr tablet method) analysis that ν NH 34
00, appearance of δ NH 1640 cm -1 , and ν C ≡ N 2250 cm
The structure was confirmed by the disappearance of -1 . It should be noted that it is very similar to the IR of 5-propoxydiiminoisoindoline except that the strength of the CH 2 expansion or contraction vibration band described above is extremely large.
このもの4.4g(10ミリモル)を実施例1と同様に
脱水2−ジメチルアミノエタノール中で反応させ、実施
例1と同様に処理し、式(1)においてR=n−エイコサ
ニル、Me=H2のフタロシアニン誘導体1.8g(4
2.3%)を得た。4.4 g (10 mmol) of this product was reacted in dehydrated 2-dimethylaminoethanol in the same manner as in Example 1 and treated in the same manner as in Example 1 to obtain R = n-eicosanyl in the formula (1) and Me = H. 1.8 g of phthalocyanine derivative of 2 (4
2.3%) was obtained.
FD−マススペクトル:M/e=1702(分子量17
00、715) 元素分析(wt%、カッコ内計算値): C 79.12(79.10)、H 10.71(1
0.67)、N 6.62(6.59) 可視吸収スペクトル(CHCl3nm、カッコ内log
ε):705(5.06)、668(5.00)、6
42(4.66)、607(4.45)、578sh、3
91(4.54) 参考例3 塩化第1銅4g(約40ミリモル)の共存下に参考例1
の最終段に記載の環化反応を同様の仕込み及び装置で行
った。冷却後、溶媒を減圧留去し、固体をクロロホルム
で抽出、0.01Nの塩酸水50ml×3回洗浄し、無
水硫酸ナトリウムで乾燥後減圧濃縮する。クロロホルム
/メタノール(40/1)混合溶媒で作製したφ10×
30cmのシリカゲルカラム(100〜200メッシュ)
にて同溶媒を用いて展開、Rf=0.45の青緑色バン
ドを集め、減圧濃縮後、グラスフィルター(G4)で濾
過しながら1の撹拌をしているメタノール中に滴下
し、生ずる青緑色沈澱を集めた。分析の結果、目的の式
(1)においてR=n−プロピル、Me=銅(II)のフタ
ロシアニン誘導体であった。収率は4.6g(88.9
%、但しジイミノイソインドリン体基準)であった。FD-mass spectrum: M / e = 1702 (molecular weight 17
00, 715) Elemental analysis (wt%, calculated value in parentheses): C 79.12 (79.10), H 10.71 (1
0.67), N 6.62 (6.59) visible absorption spectrum (CHCl 3 nm, log in parentheses)
ε): 705 (5.06), 668 (5.00), 6
42 (4.66), 607 (4.45), 578 sh , 3
91 (4.54) Reference Example 3 Reference Example 1 in the presence of 4 g (about 40 mmol) of cuprous chloride.
The cyclization reaction described in the final stage of was carried out with the same charging and equipment. After cooling, the solvent was distilled off under reduced pressure, the solid was extracted with chloroform, washed with 50 ml of 0.01N hydrochloric acid three times, dried over anhydrous sodium sulfate, and concentrated under reduced pressure. Φ10 × made with chloroform / methanol (40/1) mixed solvent
30 cm silica gel column (100-200 mesh)
Developed with the same solvent, collected the blue-green band of Rf = 0.45, concentrated under reduced pressure, dropped into methanol with stirring 1 while filtering with a glass filter (G4), and the resulting blue-green color The precipitate was collected. Analysis result, target formula
In (1), R = n-propyl, Me = copper (II) phthalocyanine derivative. The yield was 4.6 g (88.9).
%, But based on the diiminoisoindoline form).
FD−マススペクトル:M/e=809(Mw=80
8.4) 元素分析(wt%、カッコ内は計算値、但し銅は原子吸
光分析による):C 64.92(65.37)、H
5.04(4.99)、N 13.91(13.8
6)、Cu 7.90(7.86) 可視吸収スペクトル(CHCl3nm、カッコ内log
ε):682(5.03)、616(4.63)、5
67sh、381(4.41) 参考例4 塩化マグネシウム1.9g(約20ミリモル)を共存さ
せた他は、参考例2の後段に記載したのと同様に環化反
応を行い、その後参考例3と同様にカラム処理を行って
Rf=0.62の青緑色バンドを集め、参考例3と同様
に再沈処理を施して青緑色粉末状の式(1)においてR=
n−エイコサニル、Me=マグネシウム(II)のフタロ
シアニン誘導体4.2g(97.5%)を得た。FD-mass spectrum: M / e = 809 (Mw = 80
8.4) Elemental analysis (wt%, calculated values in parentheses, but for copper by atomic absorption spectrometry): C 64.92 (65.37), H
5.04 (4.99), N 13.91 (13.8)
6), Cu 7.90 (7.86) visible absorption spectrum (CHCl 3 nm, log in parentheses)
ε): 682 (5.03), 616 (4.63), 5
67 sh , 381 (4.41) Reference Example 4 A cyclization reaction was carried out in the same manner as described in the latter part of Reference Example 2 except that 1.9 g (about 20 mmol) of magnesium chloride was allowed to coexist, and then Reference Example. Column treatment was performed in the same manner as in Example 3 to collect blue-green bands with Rf = 0.62, and reprecipitation treatment was performed in the same manner as in Reference Example 3 to obtain R =
4.2 g (97.5%) of a phthalocyanine derivative of n-eicosanyl and Me = magnesium (II) was obtained.
FD−マススペクトル:M/e=1725(Mw=17
23.01) 元素分析(wt%、カッコ内は計算値、但しマグネシウ
ムは原子吸光分析による):C 78.11(78.0
7)、H 10.42(10.30)、N 6.53
(6.50)、Mg 14.07(14.10) 可視吸収スペクトル(CHCl3nm、カッコ内はlo
g ε):702(5.07)、670(4.98)、
640(4.60)、385(4.45) 以上、参考例1及び2で示した方法のいずれかにより式
(2)で示される4−アルコキシ−1,2−フタロニトリ
ル及び式(3)で示される5−アルコキシジイミノイソイ
ンドリンが合成され、参考例1及び2または3及び4に
示した方法で相当するフタロシアニン誘導体ないし金属
フタロシアニン誘導体が合成される。それらを第1表、
第2表にまとめた。FD-mass spectrum: M / e = 1725 (Mw = 17
23.01) Elemental analysis (wt%, values in parentheses are calculated values, but magnesium is by atomic absorption spectrometry): C 78.11 (78.0)
7), H 10.42 (10.30), N 6.53
(6.50), Mg 14.07 (14.10) Visible absorption spectrum (CHCl 3 nm, lo in parentheses)
g ε): 702 (5.07), 670 (4.98),
640 (4.60), 385 (4.45) As described above, by any one of the methods shown in Reference Examples 1 and 2,
The 4-alkoxy-1,2-phthalonitrile represented by (2) and the 5-alkoxydiiminoisoindoline represented by the formula (3) were synthesized and corresponded by the method shown in Reference Examples 1 and 2 or 3 and 4. A phthalocyanine derivative or a metal phthalocyanine derivative is synthesized. Table 1 of them,
It is summarized in Table 2.
実施例1 式(1)においてR=n−プロピル、Me=H2のフタロ
シアニン誘導体はクロロホルムに可溶である。0.5mg
/mlの溶液とし、通常のCVD法で作成された市販の
ITOネサガラス(10Ω/sq.,100cm2の薄円板)
を2000rpmにて回転し、その中心に30℃にて50
0μlを滴下、5分間回転させて溶媒を蒸散させた。
触針式表面粗さ計により、中心部の約50cm2の範囲は
平均膜厚約220Åの欠陥の無い薄膜が形成されたこと
がわかったので、この部分に3.5×5.0mmのスリッ
トを多数有するマスクをかけ、10-5Torrにてアルミニ
ウムを約150Åの膜厚になるよう真空蒸着した。IT
O部及び3.5×5.0mmのアルミニウム蒸着部に各々
接点を設け、MSM型の素子とした。通常の関数発生器
−ポテンショ・ガルバノスタットの組合せを用い、IT
O側を動作電極端子、アルミニウム側を対電極端子と
し、1mV/秒の掃引速度で−10〜+10Vの範囲で
ランプ波を印加し、電流値を観測して電圧−電流曲線を
作成した。その結果、このフタロシアニン誘導体のS薄
層はp−型の性質を持っており、開放電圧(VOCと略)
0.75V、閉路電流(ISCと略)1.3nA/cm2、
1Vでの整流比1.45・103、ダイオードパラメー
タ1.6の優秀な特性を示すことがわかった。また、上
記の電気測定を白色光下に行ったところ、VOC0.77
V、ISC850nA/cm2、フィルフアクター(ffと
略)0.32、光電変換効率(ηと略)2.5・10-2
%のフォトダイオードとなりうることが示された。 Example 1 In the formula (1), the phthalocyanine derivative having R = n-propyl and Me = H 2 is soluble in chloroform. 0.5 mg
/ ML solution, and commercially available ITO Nesa glass (10Ω / sq., 100cm 2 thin disk) prepared by the ordinary CVD method.
Is rotated at 2000 rpm and centered at 50 at 30 ° C.
The solvent was evaporated by adding 0 μl dropwise and rotating for 5 minutes.
A stylus-type surface roughness tester revealed that a defect-free thin film with an average film thickness of about 220 Å was formed in the central area of about 50 cm 2 , so a 3.5 × 5.0 mm slit was formed in this area. A mask having a large number of layers was applied, and aluminum was vacuum-deposited at 10 −5 Torr to a film thickness of about 150 Å. IT
A contact point was provided on each of the O portion and the 3.5 × 5.0 mm aluminum vapor deposition portion to form an MSM type element. IT using a normal function generator-potentiometer galvanostat combination
The O-side was used as the working electrode terminal and the aluminum side was used as the counter electrode terminal, and a ramp wave was applied at a sweep rate of 1 mV / sec in the range of -10 to +10 V, and the current value was observed to create a voltage-current curve. As a result, the S thin layer of this phthalocyanine derivative has a p-type property and has an open circuit voltage (abbreviated as V OC ).
0.75 V, closed circuit current (abbreviated as I SC ) 1.3 nA / cm 2 ,
It was found that the rectification ratio at 1 V was 1.45 · 10 3 , and the diode characteristics were excellent at 1.6. Further, when the above electrical measurement was performed under white light, V OC 0.77
V, I SC 850 nA / cm 2 , film factor (abbreviated as ff) 0.32, photoelectric conversion efficiency (abbreviated as η) 2.5 · 10 -2
It was shown that it could be a% photodiode.
実施例2 式(1)においてR=n−ブチル、Me=銅(II)のフタ
ロシアニン誘導体はクロロホルム、THFなどに易溶であ
る。その100mg/mlのクロロホルム溶液3mlを1
00cm2の、ガラス基板上に白金を通常の高周波スパッ
タリングで約0.5μmの厚さに薄膜形成させた基板上
に展開し、20℃にてエアーバッグ中乾燥窒素を流しな
がら溶媒を約3日間かけて蒸散させた。このとき、エア
ーバッグ中に別のクロロホルム容器を置き、そのクロロ
ホルムの量と窒素流量により最初の半日間は同温度の飽
和クロロホルム蒸気圧の1/2に設定し、以下2時間おき
に蒸気圧を2/3ずつに落とし、約1日半経過後乾燥窒素
(流量10ml/分)雰囲気下とした。この後、真空乾
燥を1日間施し、実施例1と同様に膜厚測定を行って、
膜中央部の約60cm2に平均膜厚0.3μmの欠陥の無
い薄膜が形成されたことを確認し、実施例1と同様の方
法でベリリウム(3.5×5mm、厚さ170Å)を蒸着
し、電気測定、光電気測定を行った。その結果、暗特性
としてVOC0.77V、ISC0.8nA/cm2、1Vで
の整流比1.72・103、ダイオードパラメータ1.
45、明特性としてVOC0.74V、ISC975nA/
cm2、ff0.36、η4.3・10-2%を得た。Example 2 In the formula (1), the phthalocyanine derivative of R = n-butyl and Me = copper (II) is easily soluble in chloroform, THF and the like. 1 ml of 3 ml of 100 mg / ml chloroform solution
Platinum is deposited on a glass substrate of 00 cm 2 with a thickness of about 0.5 μm by ordinary high frequency sputtering on a substrate, and the solvent is kept for about 3 days while flowing dry nitrogen in an air bag at 20 ° C. I let it evaporate. At this time, place another chloroform container in the air bag, set it to 1/2 of the saturated chloroform vapor pressure at the same temperature for the first half day depending on the amount of chloroform and the nitrogen flow rate, and then set the vapor pressure every 2 hours. It was dropped into 2/3 each, and after about one and a half days, it was placed in an atmosphere of dry nitrogen (flow rate 10 ml / min). After that, vacuum drying is performed for 1 day, film thickness measurement is performed in the same manner as in Example 1,
It was confirmed that a defect-free thin film having an average film thickness of 0.3 μm was formed at about 60 cm 2 in the central part of the film, and beryllium (3.5 × 5 mm, thickness 170Å) was vapor-deposited by the same method as in Example 1. Then, electrical measurement and photoelectric measurement were performed. As a result, V OC 0.77 V, I SC 0.8 nA / cm 2 , rectification ratio 1.7 V 10 3 at 1 V, diode parameter 1.
45, V OC 0.74V and I SC 975nA / as light characteristics
cm 2 , ff 0.36, η 4.3 · 10 -2 % were obtained.
実施例3 式(1)においてR=n−ヘキシル、Me=ニッケル(I
I)のフタロシアニン誘導体は、393℃に融点、44
6℃に分解点をもつことが示差掃査熱量計及び熱重量分
析よりわかった。この物質の粉末1.0gを実施例1と
同じ表面積100cm2のITOネサガラス上になるべく
均一になるように置き、乾燥アルゴン下に400±5℃
に熱し、溶融させた。約5分同温度に加熱した後、IT
O板の裏側よりドライアイスより発生させた冷CO2ガ
スを約500ml/分の速度でふき付け、約5分間で2
0℃に急冷した。実施例1と同様に膜厚測定を行って、
膜中央部の約80cm2に平均膜厚0.8μmの欠陥の無
い薄膜が形成されたことを確認し、実施例1と同様の方
法でマグネシウムを蒸着して約150Åの層を形成さ
せ、実施例1と同様に、但し乾燥アルゴン雰囲気下で電
気測定、光電気測定を行った。その結果、暗特性として
VOC0.92V、ISC0.6nA/cm2、1Vでの整流
比1.93・103、ダイオードパラメータ1.55、
明特性としてVOC0.88V、ISC722nA/cm2、
ff0.33、η3.1・10-2%を得た。Example 3 In the formula (1), R = n-hexyl, Me = nickel (I
The phthalocyanine derivative of I) has a melting point of 393 ° C. and 44
It was found by differential scanning calorimeter and thermogravimetric analysis that it had a decomposition point at 6 ° C. 1.0 g of a powder of this substance was placed on an ITO Nesa glass having the same surface area of 100 cm 2 as in Example 1 so as to be as uniform as possible, and 400 ± 5 ° C under dry argon.
Heated to melt. After heating to the same temperature for about 5 minutes, IT
The cold CO 2 gas generated from the dry ice was wiped from the back side of the O plate at a rate of about 500 ml / min, and 2 times in about 5 minutes.
Quenched to 0 ° C. The film thickness was measured in the same manner as in Example 1,
It was confirmed that a defect-free thin film having an average film thickness of 0.8 μm was formed in about 80 cm 2 in the central part of the film, and magnesium was deposited in the same manner as in Example 1 to form a layer of about 150 Å. As in Example 1, but electrical and photoelectric measurements were performed in a dry argon atmosphere. As a result, V OC 0.92V, I SC 0.6nA / cm 2 , rectification ratio at 1V of 1.93 · 10 3 as dark characteristics, diode parameter of 1.55,
V OC 0.88V, I SC 722nA / cm 2 as bright characteristics,
ff of 0.33 and η of 3.1 · 10 −2 % were obtained.
実施例4〜6 実施例1〜3で得たMA/S二層構造物にMBを蒸着す
る前に、ラングミュア・ブロジェット法によりアラキン
酸カドミウム塩の単分子膜を形成させた。塩化カドミウ
ム0.5ミリモル/の2回蒸留水溶液の2500cm2
の表面に、アラキン酸の1mg/mlのクロロホルム溶液
500μを落とししきり板により押しつめて表面圧が
20dyn/cm2となるようにした。MA/Sの二層板を水
面上に垂直に設置し、0.5mm/分の速度で全体の80
%が没するまで浸漬し、気/水界面の単分子層を減圧吸
引により取り去って後、引き上げた。この後は実施例1
〜3と同様にMBを蒸着し、電気測定、光電気測定を行
った。第3表にまとめて示したように、この実施例で得
られたMIS型素子は、相当する実施例1〜3のMSM
型素子に比べ、一般にVOC、整流比、ダイオードパラメ
ータ、ffの改善が認められることがわかる。Before depositing the M B to M A / S two-layer structure obtained in Example 4-6 Example 1-3, to form a monomolecular film of arachidic acid cadmium salt by Langmuir-Blodgett method. 2500 cm 2 of double-distilled aqueous solution containing 0.5 mmol of cadmium chloride
500 μl of a 1 mg / ml solution of arachidic acid in chloroform was dropped on the surface of and the surface pressure was adjusted to 20 dyn / cm 2 by pressing it with a cutting plate. A two-layer plate of M A / S is installed vertically on the water surface, and the whole 80 at the speed of 0.5 mm / min.
% Until it was submerged, the monomolecular layer at the air / water interface was removed by vacuum suction, and then pulled up. After this, Example 1
To 3 and was deposited similarly M B, electrical measurement, light electrical measurements were carried out. As summarized in Table 3, the MIS-type devices obtained in this example are the MSMs of the corresponding examples 1-3.
It can be seen that improvements in V OC , rectification ratio, diode parameters, and ff are generally recognized as compared with the mold element.
実施例7〜14 2.5×5cm、厚さ1mmのスライドグラスに通常の高周
波スパッタリングにより、約10μm厚のヒ素、パラジ
ウム、テルル、レニウム、イリジウム、金、ロジウム、
ルテニウムの薄膜を各々形成させた。参考例15に述べ
たR=n−ブチル、Me=H2のフタロシアニンの約
1.0mg/mlのクロロホルム溶液を500μ、気/
水界面に滴下し、実施例4で述べたと同様に溶媒蒸散後
表面圧を20dyn/cmに制御し、上記各基板を100往復
垂直浸漬させてS薄膜を形成させた。この後、実施例1
と同様にアルミニウム薄層を形成させてMSM型素子と
した。その特性を第4表にまとめて示した。 Examples 7 to 14 Arsenic, palladium, tellurium, rhenium, iridium, gold, rhodium having a thickness of about 10 μm were formed on a 2.5 × 5 cm slide glass having a thickness of 1 mm by ordinary high frequency sputtering.
A thin film of ruthenium was formed on each. About 1.0 mg / ml of a chloroform solution of phthalocyanine of R = n-butyl and Me = H 2 described in Reference Example 15 was added in an amount of 500 μm.
After dropping onto the water interface and evaporating the solvent in the same manner as described in Example 4, the surface pressure was controlled to 20 dyn / cm, and each of the above substrates was vertically dipped 100 times to form an S thin film. After this, Example 1
A thin aluminum layer was formed in the same manner as above to obtain an MSM type element. The characteristics are summarized in Table 4.
実施例15〜34 2.5×5cm、全体厚1mm、10Ω/sq.のITOネサガラ
スを20枚用意し、参考例16のR=n−ブチル、Me
=銅(II)のフタロシアニン誘導体に関し実施例7と同
様に、但し水平付着法により50回累積させた。このう
ちの4枚に関しては実施例1と同様に各々リチウム、ナ
トリウム、カリウム、カルシウムを熱蒸着した。残りの
16枚のうち、8枚については、一般の高周波スパッタ
リングにより、各々スカンジウム、チタン、マンガン、
ジルコニウム、ガリウム、イットリウム、ニオブ、カド
ミウムを薄膜形成させてMSM型素子とした。最後の8
枚については、実施例4で述べたと同様にして、但し、
水平付着法によりアラキン酸カドミウム塩単層膜を形成
させた後、インジウム、アンチモン、ネオジム、サマリ
ウム、ユーロピウム、ルテチウム、タリウム、鉛を各々
高周波スパッタリングで薄膜形成させてMIS型素子と
した。それらの特性を第5表にまとめて示した。Examples 15-34 Prepare 20 sheets of ITO Nesa glass having 2.5 × 5 cm, total thickness of 1 mm, and 10 Ω / sq., And R = n-butyl of Reference Example 16, Me.
= As for the phthalocyanine derivative of copper (II), the same procedure as in Example 7 was performed, but 50 times were accumulated by the horizontal deposition method. Four of them were thermally vapor-deposited with lithium, sodium, potassium and calcium in the same manner as in Example 1. Of the remaining 16 sheets, 8 sheets were each subjected to scandium, titanium, manganese, and
Zirconium, gallium, yttrium, niobium, and cadmium were formed into thin films to obtain MSM type devices. The last 8
The number of sheets is the same as described in Example 4, except that
After a cadmium arachiate monolayer film was formed by the horizontal deposition method, indium, antimony, neodymium, samarium, europium, lutetium, thallium, and lead were each formed into a thin film by high-frequency sputtering to obtain a MIS type device. Their characteristics are summarized in Table 5.
実施例35〜47 実施例15と同様に13枚のITOネサガラスを用意
し、各々0.5mg/mlの参考例17〜29のフタロシ
アニン誘導体のクロロホルム溶液700μより第6表に
示す表面圧で形成された単分子膜を垂直浸漬法で第6表
に示す回数累積し、その後は実施例1と同様にアルミニ
ウムを熱蒸着してMSM型素子とした。それらの特性は
第6表にまとめて示した。Examples 35 to 47 Thirteen ITO ITO glass was prepared in the same manner as in Example 15, and each of them was formed from 0.5 mg / ml of the chloroform solution of the phthalocyanine derivative of Reference Examples 17 to 29 in 700 μm at the surface pressure shown in Table 6. The obtained monomolecular film was accumulated by the vertical dipping method for the number of times shown in Table 6, and thereafter aluminum was thermally evaporated in the same manner as in Example 1 to obtain an MSM type device. Their properties are summarized in Table 6.
実施例48 参考例30のR=n−テトラデシル、Me=H2のフタ
ロシアニン誘導体は402℃に融点、456℃に分解点
を持つことが実施例3と同様の測定によってわかった。
この物質の粉末1.0gに関し実施例3と同様に、但し
急冷せず放置により徐冷(約2℃/分)し、室温に戻し
た。この膜は中央部約80cm2の平均膜厚が0.83μ
mであり、偏向顕微鏡により液晶構造を取っていること
がわかった。また肉眼観察による色調は淡緑色である。
この膜上に実施例1と同様にアルミニウムを蒸着し、ア
ルミニウム側を負、ITO側を正として3Vの直流電圧
をかけたところ、黒緑色を呈し、電圧解除により色調が
元の淡緑色に戻った。電圧印加による色調変化の応答速
度は約0.1秒、電圧解除による色調復帰は約0.2秒
でくり返された。 Example 48 It was found by the same measurement as in Example 3 that the phthalocyanine derivative having R = n-tetradecyl and Me = H 2 of Reference Example 30 had a melting point at 402 ° C and a decomposition point at 456 ° C.
1.0 g of powder of this substance was slowly cooled (about 2 ° C./min) by leaving it as in Example 3 except that it was not rapidly cooled, and returned to room temperature. This film has an average film thickness of 0.83μ in the central area of about 80 cm 2.
It was found that it had a liquid crystal structure by a polarization microscope. The color tone by visual observation is pale green.
When aluminum was vapor-deposited on this film in the same manner as in Example 1 and a DC voltage of 3 V was applied with the aluminum side being negative and the ITO side being positive, black green was exhibited, and the color tone returned to the original light green by voltage release. It was The response speed of color tone change by voltage application was repeated in about 0.1 seconds, and the color tone recovery by voltage release was repeated in about 0.2 seconds.
実施例49〜51 参考例31〜33のフタロシアニン誘導体を、実施例7
と同様にして表面圧20dyn/cm2でそれぞれ30層ずつ
3枚のITOネサガラス上に累積膜を形成させた。それ
ぞれのフタロシアニン層の膜厚が550、570、65
0Åであることを確認した後、実施例1と同様にアルミ
ニウムを蒸着し実施例48と同様に偏向顕微鏡観察を行
って液晶構造を確認した後、同様に電圧印加解除をくり
返し、色調変化を観察した。これらはいずれも淡緑色か
ら電圧印加により淡黒緑色となり、電圧解除で元の色調
に復帰し、いずれも応答速度は電圧印加時0.03秒以
下、電圧解除時0.08秒以下であった。Examples 49 to 51 The phthalocyanine derivatives of Reference Examples 31 to 33 were prepared as in Example 7.
In the same manner as above, a cumulative film was formed on three ITO Nesa glass sheets, each having 30 layers at a surface pressure of 20 dyn / cm 2 . The film thickness of each phthalocyanine layer is 550, 570, 65.
After confirming 0 Å, aluminum was vapor-deposited in the same manner as in Example 1, and a polarization microscope observation was performed in the same manner as in Example 48 to confirm the liquid crystal structure. Then, voltage application cancellation was repeated in the same manner, and a change in color tone was observed. did. All of them changed from light green to light black green by voltage application, and returned to the original color tone when voltage was released. In all cases, the response speed was 0.03 seconds or less when voltage was applied and 0.08 seconds or less when voltage was released. .
実施例52、53 参考例1のフタロシアニン誘導体を実施例7と同様に、
但しMAにセレン(実施例52)及びゲルマニウム(実
施例53)を、MBにアルミニウムを用いてMSM型素
子とし、第7表に示す特性を得た。Examples 52 and 53 The phthalocyanine derivative of Reference Example 1 was prepared in the same manner as in Example 7,
However selenium (Examples 52) and germanium (Example 53) in M A, the MSM element using aluminum M B, to give the properties shown in Table 7.
実施例54 表面積100cm2の円盤状グラッシーカーボン2枚を用
意し、フエルト上に0.3μmのアルミナ粉と水を適量
置き、円盤を1000rpmで回転させながら押し付けて
3分間研磨した。水洗後、蒸留水を満したビーカー中、
バス型の超音波洗浄器にて、水を5回とりかえながら1
0分間ずつ超音波洗浄を行った。乾燥後、両円盤の研磨
面を対向するように設置し、各々1000rpmで逆方向
に回転しながら10分間押しつけ、平滑面を得た。円盤
を回転装置に設置し、中央に参考例32のフタロシアニ
ン誘導体粉末を0.8g置いた。このフタロシアニン誘
導体は423℃に融点を、474℃に分解点を有するの
で、乾燥アルゴン雰囲気中円盤の温度を430℃に保
ち、試料の溶融を確認した後円盤を回転させ、1分後に
3000rpmとし、同温度、同回転数に15秒保った
後、約5分を要して回転を止め、20℃/分の速度でゆ
っくり降温した。この後は実施例49と同様に液晶構造
を確認した後対向電極としてアルミニウムを蒸着した。
フタロシアニン誘導体の層厚は0.7μmであり、電圧
印加により濃緑色から濃黒緑色に約0.5秒で変化し、
電圧解除により約1.5秒で元の色調に戻った。 Example 54 Two pieces of disk-shaped glassy carbon having a surface area of 100 cm 2 were prepared, and an appropriate amount of 0.3 μm alumina powder and water were placed on a felt, and the disk was pressed while rotating at 1000 rpm for polishing for 3 minutes. After washing with water, in a beaker filled with distilled water,
Use a bath-type ultrasonic cleaner while changing the water 5 times.
Ultrasonic cleaning was performed every 0 minutes. After drying, the polishing surfaces of both disks were placed so as to face each other, and pressed for 10 minutes while rotating in opposite directions at 1000 rpm to obtain a smooth surface. The disk was placed on a rotating device, and 0.8 g of the phthalocyanine derivative powder of Reference Example 32 was placed in the center. Since this phthalocyanine derivative has a melting point at 423 ° C. and a decomposition point at 474 ° C., the temperature of the disc was kept at 430 ° C. in a dry argon atmosphere, and after confirming the melting of the sample, the disc was rotated to 3000 rpm after 1 minute, After maintaining the same temperature and the same number of revolutions for 15 seconds, the rotation was stopped for about 5 minutes, and the temperature was slowly lowered at a rate of 20 ° C./min. After this, after confirming the liquid crystal structure in the same manner as in Example 49, aluminum was vapor-deposited as a counter electrode.
The layer thickness of the phthalocyanine derivative is 0.7 μm, and changes from dark green to dark black green in about 0.5 seconds by applying a voltage,
After releasing the voltage, the original color tone was restored in about 1.5 seconds.
実施例55 新鮮なへき解面を持つ表面積10cm2のピロリティック
グラファイトベイサル(basal)面を約3000rpmに回転
し、乾燥アルゴン雰囲気下に430℃に保った。あらか
じめ450℃に加温、溶融させてある参考例32のフタ
ロシアニン誘導体0.1gを回転面の中心に滴下し、1
5秒後に回転の動力を断って約5分を要して止め、20
℃/分の速度でゆっくり降温した。この後は実施例52
と全く同様に行い、層厚が0.72μmであった他は全
く同じ結果を得た。Example 55 A pyrrolitic graphite basal surface having a surface area of 10 cm 2 having a freshly cleaved surface was rotated at about 3000 rpm and kept at 430 ° C. under a dry argon atmosphere. 0.1 g of the phthalocyanine derivative of Reference Example 32, which had been heated and melted at 450 ° C. in advance, was added dropwise to the center of the rotating surface, and 1
Turn off the power of rotation after 5 seconds and stop it after about 5 minutes.
The temperature was slowly lowered at a rate of ° C / min. This is followed by Example 52.
The same result was obtained except that the layer thickness was 0.72 μm.
添付図面は、本発明に使用されるフタロシアニン誘導体
の気/水界面での存在状態を模式的に示した図面であ
る。The accompanying drawings are drawings schematically showing the existing state of the phthalocyanine derivative used in the present invention at the air / water interface.
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 29/91 31/04 H01L 29/91 G 7376−4M 31/04 D ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 5 Identification code Office reference number FI Technical display location H01L 29/91 31/04 H01L 29/91 G 7376-4M 31/04 D
Claims (9)
および仕事関数の小さい導電性材料層をこの順に積層し
てなるMSM型素子、または、仕事関数の大きい導電性
材料層、半導体層、絶縁層および仕事関数の小さい導電
性材料層をこの順に積層してなるMIS型素子におい
て、上記半導体層として下記の式(1)で表されるフタロ
シアニン誘導体薄膜を使用したことを特徴とするMSM
またはMIS型素子。 但し、Rは炭素数3以上25以下の直鎖ないし枝分れ炭
化水素基、MeはH2またはマグネシウムまたは遷移金
属イオンを示し、−OR基の置換位置は上式のイソイン
ドリン基において5−位または6−位である。1. An MSM element formed by laminating a conductive material layer having a large work function, a semiconductor layer and a conductive material layer having a small work function in this order, or a conductive material layer having a large work function, a semiconductor layer, MSM characterized by using a phthalocyanine derivative thin film represented by the following formula (1) as the semiconductor layer in a MIS-type device in which an insulating layer and a conductive material layer having a small work function are laminated in this order.
Or a MIS type element. However, R is a linear or branched hydrocarbon group having 3 to 25 carbon atoms, Me is H 2 or magnesium or a transition metal ion, and the substitution position of the —OR group is 5 to the isoindoline group of the above formula. Or 6-position.
30Ω/sq.以下の酸化インジウムスズ、グラファイ
ト、グラッシーカーボン、ヒ素、パラジウム、テルル、
レニウム、イリジウム、白金、金、ロジウム、ルテニウ
ム、セレンおよびゲルマニウムより選ばれることを特徴
とする特許請求の範囲第(1)項に記載のMSMまたはM
IS型素子。2. A conductive material having a high work function has a sheet resistance of 30 Ω / sq. The following indium tin oxide, graphite, glassy carbon, arsenic, palladium, tellurium,
MSM or M according to claim (1), characterized in that it is selected from rhenium, iridium, platinum, gold, rhodium, ruthenium, selenium and germanium.
IS type element.
ム、ベリリウム、ナトリウム、マグネシウム、アルミニ
ウム、カリウム、カルシウム、スカンジウム、チタン、
マンガン、ジルコニウム、ガリウム、イットリウム、ニ
オブ、カドミウム、インジウム、アンチモン、ランタニ
ド類、タリウム、鉛より選ばれることを特徴とする特許
請求の範囲第(1)項に記載のMSMまたはMIS型素
子。3. A conductive material having a low work function is lithium, beryllium, sodium, magnesium, aluminum, potassium, calcium, scandium, titanium,
The MSM or MIS type device according to claim (1), which is selected from manganese, zirconium, gallium, yttrium, niobium, cadmium, indium, antimony, lanthanides, thallium, and lead.
肪酸のカドミウム塩、水銀塩またはアルカリ土類金属塩
から成る特許請求の範囲第(1)項記載のMIS型素子。4. The MIS type device according to claim 1, wherein the insulating layer is composed of a cadmium salt, a mercury salt or an alkaline earth metal salt of a linear saturated fatty acid having 16 to 22 carbon atoms.
上に、下記の式(1)で表されるフタロシアニン誘導体薄
膜から成る半導体層を設け、この半導体層上に、絶縁層
を設けあるいは設けることなく、仕事関数の小さい導電
性材料層を形成することを特徴とするMSMまたはMI
S型素子の製造方法。 但し、Rは炭素数3以上25以下の直鎖ないし枝分れ炭
化水素基、MeはH2またはマグネシウムまたは遷移金
属イオンを示し、−OR基の置換位置は上式のイソイン
ドリン基において5−位または6−位である。5. A semiconductor layer made of a phthalocyanine derivative thin film represented by the following formula (1) is provided on a substrate made of a conductive material having a high work function, and an insulating layer is provided or provided on the semiconductor layer. MSM or MI characterized by forming a conductive material layer having a low work function without
Manufacturing method of S-type element. However, R is a linear or branched hydrocarbon group having 3 to 25 carbon atoms, Me is H 2 or magnesium or a transition metal ion, and the substitution position of the —OR group is 5 to the isoindoline group of the above formula. Or 6-position.
子膜を垂直浸漬法または水平付着法により基板上に移し
取ることにより形成される特許請求の範囲第5項に記載
の方法。6. The method according to claim 5, wherein the semiconductor layer is formed by transferring a monomolecular film of a phthalocyanine derivative onto a substrate by a vertical dipping method or a horizontal deposition method.
性有機溶剤溶液を基板上に塗布し、溶剤を蒸散させるこ
とにより形成される特許請求の範囲第(5)項に記載の方
法。7. The method according to claim 5, wherein the semiconductor layer is formed by applying a volatile organic solvent solution of a phthalocyanine derivative onto a substrate and evaporating the solvent.
上に溶融キャストすることにより形成される特許請求の
範囲第(5)項に記載の方法。8. The method according to claim 5, wherein the semiconductor layer is formed by melt casting a phthalocyanine derivative on a substrate.
垂直浸漬法または水平付着法により基板上に移し取るこ
とにより形成される特許請求の範囲第(5)項に記載の方
法。9. The method according to claim 5, wherein the insulating layer is formed by transferring a monomolecular film of a straight-chain fatty acid metal salt onto a substrate by a vertical dipping method or a horizontal deposition method. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60047295A JPH067589B2 (en) | 1985-03-09 | 1985-03-09 | MSM or MIS type element using phthalocyanine derivative thin film as semiconductor layer and method for manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60047295A JPH067589B2 (en) | 1985-03-09 | 1985-03-09 | MSM or MIS type element using phthalocyanine derivative thin film as semiconductor layer and method for manufacturing the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61206259A JPS61206259A (en) | 1986-09-12 |
| JPH067589B2 true JPH067589B2 (en) | 1994-01-26 |
Family
ID=12771289
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60047295A Expired - Lifetime JPH067589B2 (en) | 1985-03-09 | 1985-03-09 | MSM or MIS type element using phthalocyanine derivative thin film as semiconductor layer and method for manufacturing the same |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH067589B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011115891A3 (en) * | 2010-03-15 | 2011-12-22 | University Of Florida Research Foundation Inc. | Graphite and/or graphene semiconductor devices |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01173758A (en) * | 1987-12-28 | 1989-07-10 | Matsushita Electric Ind Co Ltd | Field-effect transistor and manufacture thereof |
| JPH01189965A (en) * | 1988-01-26 | 1989-07-31 | Matsushita Electric Ind Co Ltd | Field effect transistor |
| EP0340968A3 (en) * | 1988-04-30 | 1992-05-06 | Seiko Epson Corporation | Thin film device and method of manufacturing the same |
| JPH067606B2 (en) * | 1989-01-19 | 1994-01-26 | 工業技術院長 | Switching element |
| US5380842A (en) * | 1991-06-20 | 1995-01-10 | Mitsui Toatsu Chemicals, Incorporated | Phthalocyanine compounds and usage thereof |
| US7598381B2 (en) | 2006-09-11 | 2009-10-06 | The Trustees Of Princeton University | Near-infrared emitting organic compounds and organic devices using the same |
| JP5655301B2 (en) * | 2009-12-22 | 2015-01-21 | 東ソー株式会社 | Organic semiconductor materials |
| US10818853B2 (en) | 2015-06-04 | 2020-10-27 | University Of Southern California | Organic electroluminescent materials and devices |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5242664B2 (en) * | 1973-12-19 | 1977-10-26 |
-
1985
- 1985-03-09 JP JP60047295A patent/JPH067589B2/en not_active Expired - Lifetime
Non-Patent Citations (2)
| Title |
|---|
| 応用物理,Vol.52,no.12,(1983)pp.1051(53)〜1057(59) |
| 高分子論文集,Vol.41,no.9,(Sep.,1984)pp.493〜499 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011115891A3 (en) * | 2010-03-15 | 2011-12-22 | University Of Florida Research Foundation Inc. | Graphite and/or graphene semiconductor devices |
| US8890277B2 (en) | 2010-03-15 | 2014-11-18 | University Of Florida Research Foundation Inc. | Graphite and/or graphene semiconductor devices |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61206259A (en) | 1986-09-12 |
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