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JPH0682085B2 - Polygon scanner jitter measurement device - Google Patents
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JPH0682085B2 - Polygon scanner jitter measurement device - Google Patents

Polygon scanner jitter measurement device

Info

Publication number
JPH0682085B2
JPH0682085B2 JP1363490A JP1363490A JPH0682085B2 JP H0682085 B2 JPH0682085 B2 JP H0682085B2 JP 1363490 A JP1363490 A JP 1363490A JP 1363490 A JP1363490 A JP 1363490A JP H0682085 B2 JPH0682085 B2 JP H0682085B2
Authority
JP
Japan
Prior art keywords
polygon scanner
light beam
lens
prism mirror
sensors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1363490A
Other languages
Japanese (ja)
Other versions
JPH03220439A (en
Inventor
理絵 若島
克 田代
宏 中吉
巖 杉崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidec Copal Electronics Corp
Original Assignee
Copal Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Copal Electronics Co Ltd filed Critical Copal Electronics Co Ltd
Priority to JP1363490A priority Critical patent/JPH0682085B2/en
Publication of JPH03220439A publication Critical patent/JPH03220439A/en
Publication of JPH0682085B2 publication Critical patent/JPH0682085B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Mechanical Optical Scanning Systems (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明の光ビームを用いてポリゴンスキャナのジッタを
測定するポリゴンスキャナジッタ測定装置に関するもの
である。
The present invention relates to a polygon scanner jitter measuring apparatus for measuring the jitter of a polygon scanner using the light beam of the present invention.

(従来の技術) 第2図に従来の技術の一例を示す。(Conventional Technology) FIG. 2 shows an example of conventional technology.

光源1から出射した、ほぼ平行な光ビームL1がポリゴン
スキャナ3によって反射した光ビームL2がfθレンズ4
を通過してある時間内にはプリズムミラー5aによって分
割され、センサ6a,6bに入射し、他のある時間内にはプ
リズムミラー5bによって分割され、センサー6c,6dに入
射する。
The substantially parallel light beam L1 emitted from the light source 1 is reflected by the polygon scanner 3 and the light beam L2 is reflected by the fθ lens 4
The light is split by the prism mirror 5a within a certain time after passing through and is incident on the sensors 6a and 6b, and is split by the prism mirror 5b and is incident on the sensors 6c and 6d within another time.

センサ6a,6bにおいて出力する光ビームのパワーが等し
くなる瞬間からセンサ6c,6dにおいて出力する光ビーム
のパワーが等しくなる瞬間までの時間間隔を測定してジ
ッタを検出している。
Jitter is detected by measuring the time interval from the moment when the powers of the light beams output from the sensors 6a and 6b are equal to the moment when the powers of the light beams output from the sensors 6c and 6d are equal.

(発明が解決しようとする課題) 前記従来のポリゴンスキャナジッタ測定装置では光ビー
ムが空気中を通過する光路長が長い部分で空気のゆらぎ
によって光ビームのパワーが変動し、測定値にノイズと
なって現われる。この空気のゆらぎによるノイズが大き
いために、それ以上の精度でジッタ測定を行うことがで
きなかった。
(Problems to be Solved by the Invention) In the conventional polygon scanner jitter measuring apparatus, the power of the light beam fluctuates due to air fluctuations in a portion where the light beam passes through the air and the optical path length is long, which causes noise in the measurement value. Appears. Since the noise due to the fluctuation of the air is large, the jitter cannot be measured with higher accuracy.

(課題を解決するための手段) 本発明は前記課題を解決するためになされたもので、実
施例に対応する第1図で説明すると、本発明は、光源1
から出射した、ほぼ平行な光ビームL1がポリゴンスキャ
ナ3によって反射した光ビームL2がfθレンズ4を通過
してプリズムミラー5aによって分割され、センサ6a,6b
に等しいパワーが検出される時間と、光ビームL1がポリ
ゴンスキャナ3によって反射した光ビームL3がfθレン
ズ4を通過してプリズムミラー5bによって分割され、セ
ンサ6c,6dに等しいパワーが検出される時間との間隔を
測定して成るポリゴンスキャナジッタ測定装置におい
て、光源1からポリゴンスキャナ3との間の光軸、及び
fθレンズ4からプリズムミラー5aとの間の光軸、更に
fθレンズ4からプリズムミラー5bとの間の光軸が貫通
するように防風用のプラスチック製あるいは金属製のパ
イプ2a,2b,2cをそれぞれ配設したものである。
(Means for Solving the Problems) The present invention has been made to solve the above problems. The present invention will be described with reference to FIG. 1 corresponding to an embodiment.
The substantially parallel light beam L1 emitted from the laser beam is reflected by the polygon scanner 3 and the light beam L2 passes through the fθ lens 4 and is split by the prism mirror 5a.
And the time when the light beam L1 reflected by the polygon scanner 3 passes through the fθ lens 4 and is split by the prism mirror 5b, and the power equal to the sensors 6c and 6d is detected. In the polygon scanner jitter measuring apparatus configured to measure the distance between the light source 1 and the polygon scanner 3, the optical axis between the fθ lens 4 and the prism mirror 5a, and the fθ lens 4 through the prism mirror. Wind-proof plastic or metal pipes 2a, 2b, 2c are arranged so that the optical axis between the pipes 5b and 5b penetrates.

(作用) 本発明によれば測定装置の光路に光ビームが通過するよ
うにプラスチック製あるいは金属製のパイプを設けてい
るためにパイプの外の空気と光ビームが通過する空気と
が遮断され、空気のゆらぎによる測定値のノイズが低減
される。
(Operation) According to the present invention, since the pipe made of plastic or metal is provided so that the light beam passes through the optical path of the measuring device, the air outside the pipe and the air through which the light beam passes are blocked, Noise in measured values due to air fluctuations is reduced.

(実施例) 第1図は本発明による一実施例を示す構成図で、1は光
源、2a,2b,2cはプラスチック製あるいは金属製のパイ
プ、3はポリゴンスキャナ、4はfθレンズ、5a,5bは
プリズムミラー、6a,6b,6c,6dはセンサを示している。
(Embodiment) FIG. 1 is a block diagram showing an embodiment according to the present invention, in which 1 is a light source, 2a, 2b and 2c are plastic or metal pipes, 3 is a polygon scanner, 4 is an fθ lens, and 5a, 5b is a prism mirror, and 6a, 6b, 6c, 6d are sensors.

光源1から発生した光ビームはパイプ2aを通過した後、
ポリゴンスキャナ3によって反射される。その反射光は
fθレンズ4を通過した後、パイプ2bを通ってプリズム
ミラー5aによって分割されてセンサ6a,6bの両方に所要
の時間入射し、パイプ2cを通ってプリズムミラー5bによ
って分割されてセンサ6c,6dの両方に所要の時間入射す
る。センサ6a,6bで測定されるパワーが等しくなる瞬間
からセンサ6c,6dで測定されるパワーが等しくなる瞬間
までの時間を測定し、ジッタを計算する。パイプ2a,2b,
2cを設けたことによって空気のゆらぎによる測定値のノ
イズが低減される。
The light beam generated from the light source 1 passes through the pipe 2a,
It is reflected by the polygon scanner 3. After passing through the fθ lens 4, the reflected light is split by the prism mirror 5a through the pipe 2b and is incident on both the sensors 6a and 6b for a required time, and is split by the prism mirror 5b through the pipe 2c and the sensor. It is incident on both 6c and 6d for the required time. The jitter is calculated by measuring the time from the moment when the powers measured by the sensors 6a and 6b become equal to the moment when the powers measured by the sensors 6c and 6d become equal. Pipes 2a, 2b,
By providing 2c, the noise of the measured value due to the fluctuation of air is reduced.

なお、パイプ2a,2b,2cの内部形状が長手方向で見て波状
のものを用いればポリゴンスキャナ3によって走査され
た光ビームのパイプ2a,2b,2c内における乱反射を防止す
ることができる。
If the internal shapes of the pipes 2a, 2b, 2c are wavy when viewed in the longitudinal direction, it is possible to prevent irregular reflection of the light beam scanned by the polygon scanner 3 in the pipes 2a, 2b, 2c.

(発明の効果) 以上、詳細に説明したように本発明によれば、測定装置
内の光路長の長い部分にプラスチック製あるいは金属製
のパイプを設けたことによって空気のゆらぎによるノイ
ズが低減できるという効果を得られ、これによってポリ
ゴンスキャナジッタのより高精度の測定が可能になると
いう利点を有する。
(Effect of the Invention) As described in detail above, according to the present invention, it is possible to reduce noise due to air fluctuations by providing a pipe made of plastic or metal in a portion having a long optical path length in the measuring device. This has the advantage that an effect is obtained, which allows a more accurate measurement of polygon scanner jitter.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明による一実施例を示す構成図、第2図は
従来例を示す構成図である。 1……光源 2a,2b,2c……プラスチック製あるいは金属製パイプ 3……ポリゴンスキャナ 4……fθレンズ 5a,5b……プリズムミラー 6a,6b,6c,6d……センサ L1,L2,L3……光ビーム
FIG. 1 is a block diagram showing an embodiment according to the present invention, and FIG. 2 is a block diagram showing a conventional example. 1 …… Light source 2a, 2b, 2c …… Plastic or metal pipe 3 …… Polygon scanner 4 …… fθ lens 5a, 5b …… Prism mirror 6a, 6b, 6c, 6d …… Sensor L1, L2, L3… … Light beam

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】光源1から出射した、ほぼ平行な光ビーム
L1がポリゴンスキャナ3によって反射した光ビームL2が
fθレンズ4を通過してプリズムミラー5aによって分割
され、センサ6a,6bに等しいパワーが検出される時刻
と、光ビームL1がポリゴンスキャナ3によって反射した
光ビームL3がfθレンズ4を通過してプリズムミラー5b
によって分割され、センサ6c,6dに等しいパワーが検出
される時刻との間隔を測定して成るポリゴンスキャナジ
ッタ測定装置において、光源1からポリゴンスキャナ3
との間の光軸、及びfθレンズ4からプリズムミラー5a
との間の光軸、更にfθレンズ4からプリズムミラー5b
との間の光軸が貫通するように防風用のパイプ2a,2b,2c
をそれぞれ配設したことを特徴とするポリゴンスキャナ
ジッタ測定装置。
1. A substantially parallel light beam emitted from a light source 1.
The light beam L2 reflected by the polygon scanner 3 passes through the fθ lens 4, is split by the prism mirror 5a, and the time when the power equal to that of the sensors 6a and 6b is detected and the light beam L1 is reflected by the polygon scanner 3 Light beam L3 passes through fθ lens 4 and prism mirror 5b
In the polygon scanner jitter measuring apparatus, which is formed by measuring the interval between the time when the power equal to that of the sensors 6c and 6d is detected by the
Between the optical axis and the fθ lens 4 to prism mirror 5a
Optical axis between and, fθ lens 4 to prism mirror 5b
Windproof pipes 2a, 2b, 2c so that the optical axis between
A polygon scanner jitter measuring device characterized in that each of them is provided.
JP1363490A 1990-01-25 1990-01-25 Polygon scanner jitter measurement device Expired - Lifetime JPH0682085B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1363490A JPH0682085B2 (en) 1990-01-25 1990-01-25 Polygon scanner jitter measurement device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1363490A JPH0682085B2 (en) 1990-01-25 1990-01-25 Polygon scanner jitter measurement device

Publications (2)

Publication Number Publication Date
JPH03220439A JPH03220439A (en) 1991-09-27
JPH0682085B2 true JPH0682085B2 (en) 1994-10-19

Family

ID=11838668

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1363490A Expired - Lifetime JPH0682085B2 (en) 1990-01-25 1990-01-25 Polygon scanner jitter measurement device

Country Status (1)

Country Link
JP (1) JPH0682085B2 (en)

Also Published As

Publication number Publication date
JPH03220439A (en) 1991-09-27

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