JPH0682113B2 - Simple check jig for analyzer for measuring ion activity - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention uses a slide-type ion activity measuring instrument to sample aqueous liquids such as alcoholic beverages, drinks, tap water, especially biological fluids (blood, urine, saliva, etc.). ) Is related to a jig for inspecting the function of an analyzer for quantitatively analyzing the activity (or concentration) of a specific ion in () by potentiometry.

(Prior Art) A slide type ion activity measuring instrument capable of spotting a liquid sample and measuring the ion activity of a specific ion contained therein is disclosed in JP-B-58-4981. -156848 and JP-A-58-211648.

This slide-type ion activity measuring instrument (hereinafter, also referred to as “slide”) includes at least one pair of ion-selective electrodes composed of ion-selective electrodes that generate an electric potential corresponding to the ion activity of a specific ion. A reference liquid having a known ion activity of a specific ion and a sample solution having an unknown ion activity of the specific ion, which has a porous bridge arranged so as to connect between both electrodes of the ion selective electrode pair. Is applied to one and the other electrode of the ion selective electrode pair respectively, and when the interface of both liquids is brought into contact (liquid junction) by the action of the porous bridge to establish electrical conduction, Since a potential difference occurs corresponding to the difference in the ion activity of the ions existing between the reference liquid and the sample liquid, a calibration curve obtained in advance by measuring this potential difference (the principle is the Nernst equation Ion activity of the specific ion in the sample solution based on a due) is adapted to determined.

In order to measure the ionic activity using such a slide-type ionic activity measuring instrument, it is preferable to use an analyzer having the functions of spotting and supplying the reference liquid and the sample liquid and measuring the potential difference. . Such analyzers are described, for example, in US Pat. No. 4,257,862 and Japanese Patent Application No. 59-12794. This type of conventional analyzer
After spotting the reference liquid and the sample liquid, the slide type ion activity measuring instrument is sent to the potential difference measuring section, where the potential measuring probe is brought into contact with both electrodes of the electrode pair to measure the potential difference between the electrodes. It is structured like this.

By the way, when manufacturing and using the analyzer having the above-mentioned configuration, it is necessary to inspect whether or not the analyzer is in a normally operating state. That is, for example, the manufacturer needs to perform a shipping inspection and the like, while the service person and the user need to appropriately perform the above inspection for maintenance management and confirmation of measured values.

(Problems to be Solved by the Invention) The above-described inspection can be electrically performed using a tester or the like, as in the case of other various measuring devices.

However, it is troublesome to use a tester or the like for this inspection. Furthermore, there are often situations where service personnel or users have to carry this tester with them, and in such a case, the inspection becomes even more troublesome.

Therefore, it is an object of the present invention to provide a simple check jig capable of easily confirming whether or not the analyzer is in a normally operating state.

(Means for Solving Problems) A simple check jig of the first analyzer for ion activity measurement of the present invention comprises a support having substantially the same outer dimensions as those of the slide type ion activity measuring instrument described above. And a conductor that is attached to the support and short-circuits the probes of the analyzer when they come into contact with each other.

In addition, the second simple check jig of the present invention is arranged at a position in contact with the probe instead of the above-mentioned conductor.
A chip having a pair of good electrical conductors and an electrical resistance that is arranged so as to connect these pair of good conductors and has an electrical resistance that is substantially equal to the electrical resistance between the electrodes when the sample solution and the reference solution are conducted by a porous bridge. A resistor is attached to the support.

(Operation) The support having the above-mentioned external dimensions can be set in the potentiometer of the analyzer in place of the slide. When the first check jig of the present invention is used, if the probe is moved in the above-described state in the same manner as in the case of measuring the potential difference and brought into contact with the conductor of the jig to short-circuit the probes, the analyzer can be operated normally. In the state, the inter-electrode potential becomes zero. On the other hand, at this time, in the electric circuit of the analyzer, contact failure, disconnection,
Further, if there is a failure in the relay or the amplifier, the above-mentioned electrode same potential does not become zero, so this abnormal state can be discovered.

Even when the second check jig according to the present invention is used, the abnormality of the analyzer can be found in the same manner as described above. However, in this case, unlike the case where the first check jig is used, a grounding failure of the analyzer electric circuit or the main body can also be found. That is, when there is this grounding failure, the electric circuit of the analyzer is affected by various noises and the potential fluctuates unstablely to the + (plus) side or the- (minus) side. Therefore, such "potentiality" of the potential
By checking the presence or absence of the above, it is possible to find the above-mentioned ground failure. On the other hand, when the first check jig is used, even if there is the above-described grounding failure, it is not affected by noise, so that the grounding failure cannot be found as described above.

(Example) Hereinafter, the present invention will be described in detail based on an example shown in the drawings.

First, an analyzer to which the simple check jig of the present invention is applied and a slide type ion activity measuring instrument used for the analyzer will be described.

FIG. 1 shows an example of the analyzer, and FIGS. 2, 3 and 4 show the essential parts thereof. As shown in FIG. 1, the outer surface of the analyzer 10 is covered with a cover 11, and a slide-type ion activity measuring instrument (slide) 20 is set on the cover 11 and the reference liquid and the sample liquid are placed therein. An opening 12 for spotting and a discharge port 13 for discharging the slide 20 for which the potential difference has been measured are provided. The analyzer 10 is also provided with a start button 14, an ion activity display section 15, an ion activity recording section 16 and the like.

The mechanism shown in FIGS. 2, 3 and 4 is arranged below the portion where the opening 12 is provided, and is fixed to a flat instrument mounting table 30 and both ends of the instrument mounting table 30. The pair of side plates 31, 31 and the side plates 31, 31 are arranged in parallel with the instrument mounting table 30.
And six rods 32, 32, 33, 33, 34, 34 connecting the two. A liquid spotting part 30A is provided in the central portion of the device mounting table 30. The potential difference measuring part 3 is sandwiched by the liquid spotting part 30A.
0B and a device discharging section 30C are provided. The device mounting table 30 is arranged in the cover 11 such that the liquid spotting section 30A is located directly below the opening 12. Further, in the potential difference measuring unit 30B, a through hole 35 is provided in the instrument mounting table 30, and a vertically movable heating plate 36 is incorporated in the through hole 35. A slide retainer plate 37 is provided at a position facing the heating plate 36 with a predetermined distance from the surface of the instrument mounting table 30. On the other hand, in the device discharging section 30C, the device mounting table 30 is provided with a slide discharging hole 38. The slide discharge hole 38 is formed larger than the slide 20 described above, and is connected to the discharge port 13 of the cover 11 through the inclined passage 39 and the opening 40 of the side plate 31.

A slide set hole (through hole) 41 is provided on the device mounting table 30.
An instrument holder 42 having is arranged. Both ends of the instrument holder 42 are slidably fitted to the pair of rods 32, 32. Therefore, the instrument holder 42 is mounted on the instrument table 30 in the directions of arrows A and B (that is, liquid spotting). Part 30A,
It is movable so that the potential difference measuring unit 30B and the instrument discharging unit 30C can be sequentially moved. The slide retainer plate 37
Is arranged at a distance greater than the thickness of the instrument holder 42 from the surface of the instrument mounting table 30 so that the instrument holder 42 can be moved to above the heating plate 36. On the other hand, below the device mounting table 30, a holder moving table 43 is arranged. Both ends of the holder moving table 43 are slidably fitted to the pair of rods 33, 33, and therefore, the holder moving table 43 is provided.
Is also movable in the directions of the arrows A and B. A female screw 44 (see FIG. 4) is attached to the lower portion of the holder moving base 43, and the female screw 44 is screwed into a drive screw (male screw) 45 arranged in parallel with the rod 33. ing.
The drive screw 45 is rotated forward and backward by a motor 46 fixed to the side plate 31 via gears 47 and 48. By rotating the drive screw 45 in this way, the holder moving table 43 is moved. Moves in the directions of arrows A and B. At both ends of the holder moving table 43, connecting members protruding upward, respectively.
49 is provided, and the magnet 50 is fixed to the rear surface of these connecting members 49 (that is, the surface facing the tool discharge part 30C side when the holder moving base 43 is near the liquid spotting part 30A). On the other hand, a connecting member 51 protruding downward is provided at both ends of the instrument holder 42, and a magnet 52 facing the magnet 50 is fixed to the connecting member 51. The magnets 50 and 52 have polarities set so as to attract each other. Therefore, when the drive screw 45 is rotated and the holder moving base 43 moves in the direction of arrow A as described above,
If both magnets 50 and 52 are attracted to each other, the tool holder 42 is indexed by this holder moving base 43 and is indicated by the arrow A.
Move in the direction. On the other hand, when the holder moving base 43 is moved in the arrow B direction, the instrument holder 42 is pushed by the holder moving base 43 and similarly moves in the arrow B direction. A cam member 53 as a probe moving means is provided at the center of the holder moving table 43. The cam member 53 has a cam surface 53a that projects upward and is formed so that the device discharging portion 30C side is high and the potential difference measuring portion 30B side is low.

Next, the structure around the heating plate 36 will be described with reference to FIGS. It should be noted that FIGS. 5 and 6 respectively show sectional shapes of the portions along the lines VV and VI-VI shown in FIG. A pair of probe holder holding rods 6 are provided on the lower surface of the instrument mounting table 30 in the potential difference measuring unit 30B.
0,60 is fixed. These holding rods 60, 60 are arranged so as to sandwich the heating plate 36 therebetween, and a probe holder 61 is fitted on the holding rods 60, 60 so as to be vertically slidable. The probe holder 61 is received from below by washers 62, 62 attached to the lower ends of the holding rods 60, 60. A pair of heating plate holding rods 63, 63 are vertically slidably inserted in the probe holder 61, and the heating plate 36 is fixed to the upper ends of the holding rods 63, 63. A spring 64 is compressed around the holding rod 63 between the heating plate 36 and the probe holder 61.
Both are urged by 64 in a direction in which they are separated from each other.
The probe holder 61 thus biased is received by washers 65, 65 attached to the lower ends of the heating plate holding rods 63, 63. The length of the retaining rods 60,60 and 63,63 is
With the lower surface of the probe holder 61 received by the washers 65, 65 and the washers 62, 62 in this manner, the heating plate 3
The upper surface of 6 is set so as to be aligned with the surface of the device mounting table 30. Also, the lower ends of a pair of guide rods 66, 66 are fixed to the probe holder 61. These guide rods 66, 66 are arranged so as to sandwich the heating plate 36, and the upper ends of the guide rods 66, 66 can project upward from through holes 30d provided in the instrument mounting table 30. A spring 67 is compressed around the guide rod 66 between the instrument mounting table 30 and the probe holder 61. Therefore, when the probe holder 61 is pushed from the lower side to the upper side, the probe holder 61 moves along the rods 60, 60.
When the heating plate 36 is elastically moved upward together with 6, and the heating plate 36 is pressed from above at this time, the probe holder 61 elastically moves relative to the heating plate 36.

Further, as an example, three pairs of potential difference measuring probes 68a, 68b, 69a, 69b, 70a, 70b are provided on the probe holder 61 so as to project upward.

Each of the probes 68a, 68b, 69a, 69b and 70a, 70b can project upward through a notch or a through hole provided in the heating plate 36. That is, in the state where the heating plate 36 and the probe holder 61 are separated by the action of the spring 64 to the maximum extent (the state shown in FIG. 4), each probe 68a is
The tips of ~ 70b are located inside the heating plate 36, but when the probe holder 61 moves relative to the heating plate 36 as described above, the tips project upward from the surface of the heating plate 36.
A roller 71 is attached to the lower part of the probe holder 61 at a position facing the cam member 53 of the holder moving table 43. A through hole 72 is provided in the instrument mounting table 30 between the liquid spotting section 30A and the potential difference measuring section 30B, and a bar code sensor 73 is attached below the through hole 72.

When measuring the ion activity, the instrument holder 42 is in a state of being connected to the holder moving table 43 as described later, and the motor 46 is drive-controlled by a known position detection sensor or drive control circuit, The instrument holder 42 is arranged on the liquid spotting section 30A. As described above, in this state, the instrument holder 42 is located directly below the opening 12 of the cover 11, so that the slide 20 is inserted into the instrument holder 42 through the opening 12.
Set in the slide set hole 41 of.

This slide 20 is, for example, as disclosed in
Known items shown in No. 8 or Japanese Patent Application No. 60-148564
Japanese Patent Application No. 60-180358 and Japanese Utility Model Application No. 60-204699, which will be briefly described with reference to FIG. The slide 20 includes three types of ion selective electrode pairs 101 (consisting of ion selective electrodes 111 and 112 which have the same type of ion selective layer on the surface and are electrically separated from each other), 102 (also 1
12 and 122), 103 (also 113 and 123), a water-impermeable member layer 200 having an adhesive layer on both sides,
A pair of porous liquid distribution members 310 and 320 made of cotton and a regenerated cellulose fibrous continuous void-containing nonwoven fabric are housed between an upper frame body 400 and a lower frame body 500 made of plastic.

The upper frame 400 is provided with a pair of liquid supply holes 410, 420 and a recess 450 extending across the liquid supply holes, and a porous bridge 600 made of polyethylene terephthalate fiber spinning or the like is accommodated in the recess 450. , Fixed. Recess 450
Has a depth such that the bridge 600 does not extend above the upper surface of the upper frame 400.

In the water impermeable member layer 200 disposed below the upper frame 400 with the ion selection electrode pairs 101, 102, 103 interposed, through holes (liquid descending passages) 210, 220 aligned with the liquid supply holes 410, 420, and the ion selection electrode 1
Through holes (liquid ascending passages) 211, 212, 213, 22 aligned with part of the ion selective layer regions of 11, 112, 113, 121, 122, 123, respectively.
1,222,223 are provided. Under the water impermeable member layer 200, a porous liquid distribution member 310 is arranged so as to be aligned with the through holes 210, 211, 212, 213, and a porous liquid distribution member 320 is arranged so as to be aligned with the through holes 220, 221, 222, 223. Lower frame 5
At 00, recesses (liquid horizontal passages) 510 and 520 having a shape capable of accommodating the porous liquid distribution members 310 and 320 are formed. The upper frame 400, the water impermeable member layer 200, and the lower frame 500 each have a pair of through holes (air vent holes) 43.
0,440; 230,240; 530,540 are provided to form an air vent hole penetrating the entire slide 20. The ion-selective electrode pairs 101, 102, 103 are arranged with the ion-selective layer facing downward, and the terminal portions of these electrode pairs have a water-impermeable member layer 200.
The pair of notches 250, 260 provided in the lower frame body 500 and the pair of notches 550, 560 provided in the lower frame 500 are exposed to the lower surface of the slide.

In such a slide 20, for example, an ion selective electrode
Cl for pair 101, 102, 103 respectively , K , Na Ion selection for
Have layers and their ionic activities are known
The reference liquid is spotted on the liquid supply hole 410 so that the ion activity of these
If an unknown sample liquid is spotted on the liquid supply hole 420, the reference liquid
Enters the porous liquid distribution member 310 through the liquid descending passage 210.
Ion-selective electrode 1 through transparent liquid rising passages 211, 212, 213
Reach each of the 11,112,113 ion selective layers, while the sample solution
Penetration into the porous liquid distribution member 320 through the liquid descending passage 220
The ion selective electrode 12 passes through the liquid rising passages 221, 222, 223.
Reach 1,122,123 ion selective layers.

In addition, both liquids are liquid-judged near the center of the bridge 600 and electrically connected.
Continuity occurs. As a result, the ion selective electrodes 111 and 121
Between 112 and 122, between 113 and 123
Cl between the reference solution and the sample solution , K , Na Each ion of
Since a potential difference corresponding to the difference in activity occurs, the notch 550,
Insert a potential measurement probe from below the 560
Make contact with the terminal part of the selection electrode and
If the generated potential difference is measured, the sample is
The above-mentioned respective ion activities in the liquid can be measured.

The slide 20 is set in the slide set hole 41 with the upper frame 400 facing upward. Then, the reference liquid and the sample liquid are spotted in the liquid spotting holes 410 and 420, respectively, by using, for example, a double pipette. When the start button 14 (see FIG. 1) is pressed after this spotting is completed, the motor 46 is driven and the holder moving base 43 is moved in the direction of the arrow A. Then, the holder moving table 43 is indexed, and the instrument holder 42 also moves to the potential difference measuring unit 30B side, and the stopper 9
The slide 20 that has been set in contact with the heating plate 36
Stop at a predetermined position facing. The motor 46 continues to be driven thereafter to further move the holder moving base 43 by a predetermined distance. At this time, since the instrument holder 42 cannot move, the magnets 50 and 52 are separated from each other, and the holder moving table 4 is moved.
3 alone moves as above. When the holder moving base 43 moves in this manner, the cam surface 53a of the cam member 53 comes into contact with the roller 71 of the probe holder 61, and the probe holder 61 moves as the holder moving base 43 moves.
Is pushed upwards. Then, the heating plate 36 is pushed up as described above, and the heating plate 36 press-fixes the slide 20 held by the instrument holder 42 to the holding plate 37. At this time, as the probe holder 61 rises, the guide rods 66, 66 project onto the instrument mounting table 30 and enter the guide holes 91, 91 of the instrument holder 42 to move the instrument holder 42 (that is, slide 20). Position it in place. When the slide 20 is pressed against the pressing plate 37 as described above, the heating plate 36 is prevented from further rising thereafter.
Is further pushed for a predetermined length, whereby the probes 68a, 68b, 69a, 69b and 70a, 70b project upward from the surface of the heating plate 36. The thus-protruded probes 68a, 68b are inserted from below the notches 550, 560 of the slide 20 and contact the ion selective electrodes 111, 121, respectively. Similarly, probe 69a, 6
9b Notches 550 and 560 are inserted from below to contact the ion selective electrodes 112 and 122, respectively, and probe 70a and 70b notches
Ion-selective electrodes 1 inserted from below 550 and 560, respectively
Contact 13,123.

In this state, the motor 46 is stopped and then the heating plate 36
The slide 20 is heated to a predetermined temperature. After that time
After that, connect to the probes 69a-70b.
Ion selection by a known potential difference measurement circuit (not shown)
The potential difference between the electrode pairs 101, 102, 103 is measured respectively.
As mentioned earlier, by measuring these potential differences,
, Cl , K , Na Is measured. This way
The measured ion activity is displayed on the display unit 15.
Or recorded on the recording paper 17 in the recording unit 16.
(See FIG. 1). In addition, it was subjected to the potential difference measurement
The bar code on the slide 20 is detected by the bar code sensor 73.
The ion activity of the slide 20 can be identified by reading
Displayed or recorded with the code.

When the potential difference measurement described above is completed, the motor 46 is driven in the opposite direction to the case described above. As a result, the holder moving table 43 is moved in the arrow B direction. Then, the cam member 53 gradually separates from the roller 71 of the probe holder 61, and the probe holder 61 descends. Then each probe
69a to 70b are separated from the slide 20, guide rods 66 and 66 are pulled out downward from the guide holes 91 and 91 of the instrument holder 42, and then the heating plate 36 is also lowered to a position where its surface is aligned with the surface of the instrument mounting table 30. . The motor 46 is further driven as it is, and the holder moving base 43 continues to move, so that the connecting member 49 of the holder moving base 43 is connected via the magnets 50 and 52.
Then, the instrument holder 42 is also moved in the direction of arrow B. Therefore, the slide 20 on which the potential difference has been measured is moved from the potential difference measuring section 30B to the liquid spotting section 3 by the instrument holder 42.
It is sent to the 0A side. The motor 46 is driven until the instrument holder 42 is on the instrument discharge portion 30C. Instrument holder 42
When the slide 20 comes to the device discharging portion 30C, the slide 20 held by the device holder 42 is dropped into the slide discharging hole 38. The slide 20 is discharged from the discharge port 13 through the passage 39. Next, the motor 46 is rotated in the reverse direction and the instrument holder 42 is sent to the liquid spotting section 30A, where it is stopped to prepare for the next spotting.

Next, the simple check jig according to the present invention will be described.
FIG. 8 is an exploded view of the first embodiment of the first simple check jig of the present invention. As shown in the figure, the simple check jig 1 is composed of an upper mount 2 and a lower mount 3 as supports, and a metal plate 4 fixed between the mounts 2 and 3. The upper mount 2 and the lower mount 3 have substantially the same outer dimensions as the upper frame body 400 and the lower frame body 500 of the slide 20, and are made of, for example, plastic. The upper frame 400 and the lower frame 500 themselves may be used as the mounts 2 and 3, respectively. On the other hand, the metal plate 4 is formed of, for example, a stainless plate or the like that is hard to rust and has high durability.
It has almost the same vertical and horizontal dimensions. Further, the lower mount 3 is provided with six through holes 3a, 3b, 3c, 3d, 3e and 3f. These through holes 3a, 3b, 3c, 3d, 3e and 3f are the through holes 211, 212, 2 of the water impermeable member layer 200 of the slide 20, respectively.
It is provided at a position corresponding to 13,221,222 and 223.

The simple check jig 1 having the above-described structure is used to slide when inspecting whether the analyzer 10 is in a normal operation state.
Instead of 20, the slide set hole 41 is set.
In this case, since the mounts 2 and 3 have the outer dimensions as described above, the simple check jig 1 is tightly housed in the slide set hole 41. At this time, the simple check jig 1 is set with the upper mount 2 facing upward.

Then, as in the case of measuring the ion activity, the start button 14 is pressed to move the holder moving table 43, and the probe holder 61
Raise. Thereby, the probes 68a, 68b, 69a, 69b and 70a, 70b project upward, the probes 68a, 68b pass through the through holes 3a, 3b of the lower mount 3, and the probes 69a, 69b similarly pass through the through holes 3b, 3e. And the probes 70a, 70b are through holes
It passes through 3c and 3f and comes into contact with the metal plate 4, respectively. Therefore, the probes 68a and 68b, the probes 69a and 69b, and the probes 70a and 70b are short-circuited, respectively.

If all the electric circuits of the analyzer 10 are in a normal state, the potential difference between the probes becomes 0 (zero) when the probes are short-circuited as described above, and this value is displayed on the display unit 15
Is displayed in. This display allows the inspector to check the analyzer
It can be confirmed that 10 can operate normally.

On the other hand, in the electric circuit of the analyzer 10, if there is a contact failure, disconnection, failure of relays or amplifiers as described above, even if the probes are short-circuited as described above, the potential difference between the probes is 0 (zero). ) Does not occur, the inspector can confirm from the display of the display unit 15 showing this potential that the above-mentioned abnormality has occurred.

Next, with reference to FIG. 9, a second embodiment of the first simple check jig of the present invention will be described. In FIG. 9, the same elements as those shown in FIG. 8 are designated by the same reference numerals, and the description thereof will be omitted. In the simple check jig 5 of the second embodiment, instead of the large metal plate 4 of the first embodiment, three independent metal plates 6, 7,
8 are arranged. These metal plates 6, 7 and 8 are
The slide 20 is attached at a position corresponding to the ion selective electrode pair 101, 102, 103. The simple check jig 5 having the above structure is also used for the inspection of the analyzer 10 in the same manner as the simple check jig 1 of the first embodiment. The normality and abnormality of the analyzer 10 can be confirmed in the same manner as in the case of using the simple check jig 1 of the first embodiment. In this simple check jig 1, the probes 68a and 68b, the probes 69a and 69b, and the probe Since the metal plates 6, 7 and 8 for short-circuiting between 70a and 70b are electrically insulated from each other independently, the probes for electrical difference measurement (68a, 68b, 69a,
69b, 70a, 70b) and incorrect wiring between relays, and contact failure / disconnection of these 3 circuits can be confirmed for each system.

As the metal plates 6, 7, 8 other than those formed of stainless steel or the like described above, tin plating or gold plating is applied to the surface of a copper alloy or the like in order to further prevent rust and improve electrical contact. Those subjected to the treatment may be used. this is,
The same applies to the metal plate 4 of the first embodiment described above.

Next, a first embodiment of the second simple check jig of the present invention will be described with reference to FIG. This simple check activity tool 1'has a metal plate 4A arranged at a position facing the through holes 3a, 3b, 3c and a metal plate 4B arranged at a position facing the through holes 3d, 3e, 3f. is doing. As the pair of metal plates 4A and 4B, the above-mentioned one made of stainless steel or the like, or one having a copper alloy surface plated with gold can be appropriately selected and used. And these metal plates 4A and 4B are connected by a thin chip resistor 4C.

As mentioned above, spot the reference solution and sample solution on the slide 20.
Then, when both liquids have a liquid junction near the center of the bridge 600, C
l The electrical resistance between the ion selective electrodes 111 and 121 for
For example, it will be about 100 KΩ. Similarly K Ion selective charge for
Between poles 112 and 122, Na Ion selective electrode 113 and
The electrical resistance between 10 and 123 is about 10 MΩ and 1 MΩ, respectively.
It Therefore, as the chip resistor 4C, the above three resistors are used.
An intermediate value of about 1 MΩ is used.

Even when the second check jig 1'of the present invention is used,
The abnormality of the analyzer 10 can be found in the same manner as in the case of using the first check jig 1 or 5 described above.

Thus, the electric resistance between the metal plates 4A and 4B is between the ion selective electrodes 111 and 121, 112 and 122 during the ion activity measurement.
, The electrical resistance between 113 and 123 is close, so if the electric circuit of the analyzer 10 or the ground of the main body is poor, the electric circuit is affected by various noises,
The display potential of the display section 15 fluctuates in the positive (+) side or the negative (-) side in an unstable manner. Therefore, it is possible to find the grounding failure by confirming the presence or absence of such "vibration" of the display potential.

Next, a second embodiment of the second simple check jig of the present invention will be described with reference to FIG. This simple check tool 5'includes metal plates 6A and 6B facing the through holes 3a and 3d, respectively.
And metal plates 7A, 7B facing the through holes 3b, 3e, respectively, and metal plates 8A, 8B facing the through holes 3c, 3f, respectively. And the metal plates 6A and 6B, 7A and 7B, 8A and 8B,
Contacted by chip resistors 6C, 7C, 8C. The electric resistances of these chip resistors 6C, 7C and 8C are respectively the ion selective electrodes 111 and 121 and 112 at the time of the above-mentioned ion activity measurement.
1 and 122, and 113 and 123, respectively.
It is said to be about 00kΩ, 10MΩ and 1MΩ.

Since the electric resistance values between the metal plates 6A and 6B, 7A and 7B, and 8A and 8B are set as described above, when the analyzer is inspected using this simple check tool 5 '. , The probes 68a and 68b, 69a and 69b, and 70a and 70b.
The influences of various noises on the circuits of the above-mentioned three systems with the detection end being approximately equal to those when measuring the ion activity. Therefore, according to this simple check tool 5 ',
The analyzer inspection can be performed more accurately.

As described above, the slide 20 is automatically sent to the potential difference measurement unit, and the analyzer 10 formed so as to be discharged from the potential difference measurement unit has been described as an example, but the simple check jig of the present invention is of this type. The invention is not limited to the analyzer, and can be used in an analyzer in which the slide 20 is manually sent to the potential difference measuring unit and discharged from the potential difference measuring unit.

(Effect of the invention) As described in detail above, the simple check jig of the present invention is
A conductor that short-circuits the probes of the analyzer when they are touched, or between these probes,
A good electrical conductor and a chip resistor that conduct electricity through an electrical resistance that is approximately equal to the electrical resistance between the electrodes when the ion activity measuring instrument is used are mounted on a support that can be handled in the same way as the ion activity measuring instrument. ing. Therefore, according to the simple check jig of the present invention, it is possible to inspect with a very simple operation whether or not the ion activity measuring analyzer is in a normally operating state. The inspection work by the user will be easier and more efficient than ever.

[Brief description of drawings]

FIG. 1 is a perspective view showing an example of an analyzer to which the simple check jig of the present invention is applied, and FIGS. 2, 3 and 4 are perspective views, plan views and side cross-sectional views showing main parts of the analyzer, respectively. 5 is a side sectional view of a portion taken along the line VV in FIG. 3, FIG. 6 is a side sectional view of a portion taken along the line VI-VI of FIG. 3, and FIG. 7 is used in the above analyzer. Exploded perspective view showing an example of a slide type ion activity measuring instrument to be used, FIGS. 8 and 9 are exploded perspective views showing a first embodiment and a second embodiment of a first simple check jig of the present invention, respectively. 10 and 11 are exploded perspective views showing the first and second embodiments of the second simple check jig of the present invention, respectively. 1,1 ′, 5,5 ′ …… Simple check jig 2 …… Upper mount 3 …… Lower mount 4,4A, 4B, 6,6A, 6B, 7,7A, 7B, 8,8A, 8B… … Metal plate 4C, 6C, 7C, 8C …… Chip resistance 10 …… Analyzer 20 …… Sliding type ion activity measuring instrument 68a, 68b, 69a, 69b, 70a, 70b …… Potential measurement probe 101,102,103 …… Ion selection Electrode pair 600 ... Porous bridge

Claims (4)

[Claims] 1. At least one pair of ion-selective electrodes that generate an electric potential corresponding to the ion activity of a specific ion, and a porous bridge arranged so as to connect between both electrodes of the pair of ion-selective electrodes. A simple test of the function of the analyzer that measures the ion activity by using the ion activity measuring instrument that has the ion-selection electrode pair and contacting each of the electrodes of the ion selective electrode pair with a potential difference measurement probe to measure the potential difference between the electrodes. An ion, which is a check jig, including a support having substantially the same external dimensions as the ion activity measuring instrument, and a conductor attached to the support and short-circuiting the probes when they come into contact with each other. A simple check jig for an analyzer for activity measurement. 2. A simple check repair of an analyzer for ion activity measurement according to claim 1, wherein the conductor is a metal surface tin-plated or gold-plated. Ingredient 3. At least one pair of ion-selective electrodes for generating an electric potential corresponding to the ion activity of a specific ion, and a porous bridge arranged so as to connect between both electrodes of the pair of ion-selective electrodes. A simple test of the function of the analyzer that measures the ion activity by using the ion activity measuring instrument that has the ion-selection electrode pair and contacting each of the electrodes of the ion selective electrode pair with a potential difference measurement probe to measure the potential difference between the electrodes. A check jig, which has a support having substantially the same external dimensions as the ion activity measuring instrument, a pair of good electrical conductors which are attached to the support, and which are arranged at positions where the probe contacts, and a sample solution. And having an electrical resistance approximately equal to the electrical resistance between the electrodes when conducting by the porous bridge penetrated by the reference liquid, and connecting the pair of good electrical conductors. Simple check jig of ion activity measurement analyzer consisting of up resistor. 4. A simple check repair of an ion activity measuring analyzer according to claim 3, wherein the conductor is a metal surface tin-plated or gold-plated. Ingredient