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JPH0682768B2 - Heat dissipation control device - Google Patents
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JPH0682768B2 - Heat dissipation control device - Google Patents

Heat dissipation control device

Info

Publication number
JPH0682768B2
JPH0682768B2 JP60058268A JP5826885A JPH0682768B2 JP H0682768 B2 JPH0682768 B2 JP H0682768B2 JP 60058268 A JP60058268 A JP 60058268A JP 5826885 A JP5826885 A JP 5826885A JP H0682768 B2 JPH0682768 B2 JP H0682768B2
Authority
JP
Japan
Prior art keywords
refrigerant
heat dissipation
flow passage
substrate
groove
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60058268A
Other languages
Japanese (ja)
Other versions
JPS61218148A (en
Inventor
富也 佐々木
芳郎 宮崎
勝 石塚
義孝 福岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP60058268A priority Critical patent/JPH0682768B2/en
Publication of JPS61218148A publication Critical patent/JPS61218148A/en
Publication of JPH0682768B2 publication Critical patent/JPH0682768B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W40/00Arrangements for thermal protection or thermal control
    • H10W40/40Arrangements for thermal protection or thermal control involving heat exchange by flowing fluids
    • H10W40/47Arrangements for thermal protection or thermal control involving heat exchange by flowing fluids by flowing liquids, e.g. forced water cooling

Landscapes

  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Description

【発明の詳細な説明】 (発明の技術分野) 本発明は、例えばIC等半導体素子を基板に取付けた半導
体装置の放熱性を高める放熱制御装置に関する。
TECHNICAL FIELD OF THE INVENTION The present invention relates to a heat dissipation control device that enhances heat dissipation of a semiconductor device in which a semiconductor element such as an IC is mounted on a substrate.

(発明の技術的背景とその問題点) 従来、この種の放熱制御装置としては、例えば、JATEC
社発行「Research and Development of Heat Pipe Tech
nology」第328頁乃至第335頁掲載のT.P.Cotter著「PRIN
CIPLES AND PROSPECTS FOR MICRO HEAT PIPES」に記載
された、いわゆるマイクロヒートパイプがある。すなわ
ち、このものは、シリコン基板に酸化膜を施し、酸化膜
にエッチング加工して断面三角形あるいは四角形等の溝
部を形成し、この溝部を放熱板としての耐熱ガラスによ
り酸化膜をシールして冷媒流通路に形成すると共に冷媒
を封入した。従って、半導体素子が局部的に加熱して
も、溝部が密封されて形成された冷媒流通路内の冷媒が
加熱部で蒸発すると共に、低温部で凝縮した冷媒が冷媒
流通路の角部を介した毛細管現象で加熱部へ流れ込み、
シリコン基板全体として均一温度となるように放熱制御
が行なわれる。ところで、冷媒の冷媒流通路への封入は
溝部が耐熱ガラスによりシールされるため、溝部シール
後の冷媒流通路内に封入することが困難であり、耐熱ガ
ラスでシールすると同時に溝部内に冷媒も封入しなけれ
ばならない。ところが、冷媒は常温では蒸気圧が高いた
め、この方法で溝部内に封入しようとすると、非常に低
温で蒸気圧のない状態で行なわなければならないが、こ
のような方法は非常に困難であるばかりでなく、シール
性が悪くなり、信頼性が低いという問題がある。
(Technical background of the invention and its problems) Conventionally, as this type of heat dissipation control device, for example, JATEC
Published by `` Research and Development of Heat Pipe Tech
nology ", pages 328 to 335, published by TPCotter," PRIN
There is a so-called micro heat pipe described in "CIPLES AND PROSPECTS FOR MICRO HEAT PIPES". That is, in this product, an oxide film is applied to a silicon substrate, and the oxide film is etched to form a groove with a triangular or quadrangular cross section, and the groove is sealed with heat-resistant glass as a heat dissipation plate to distribute the refrigerant. It was formed in the channel and the refrigerant was enclosed. Therefore, even if the semiconductor element is locally heated, the refrigerant in the refrigerant flow passage formed by sealing the groove is evaporated in the heating portion, and the refrigerant condensed in the low temperature portion passes through the corner portion of the refrigerant flow passage. It flows into the heating part due to the capillary phenomenon,
The heat radiation is controlled so that the silicon substrate as a whole has a uniform temperature. By the way, when the refrigerant is sealed in the refrigerant flow passage, it is difficult to seal it in the refrigerant flow passage after sealing the groove because the groove is sealed with heat-resistant glass.At the same time as sealing with the heat-resistant glass, the refrigerant is also sealed in the groove. Must. However, since the refrigerant has a high vapor pressure at room temperature, if it is attempted to seal it in the groove by this method, it must be carried out at a very low temperature without vapor pressure, but such a method is very difficult. In addition, there is a problem that the sealing property becomes poor and the reliability is low.

(発明の目的) 本発明は上記問題に鑑て創案されたものであって、溝部
を密封して冷媒流通路に形成後に、冷媒封入を可能と
し、製造が容易であり、しかも、シール性の信頼性を高
めることができる放熱制御装置を提供しようとするもの
である。
(Object of the Invention) The present invention was devised in view of the above problems, and after the groove portion is sealed to form the refrigerant flow passage, the refrigerant can be enclosed, the manufacturing is easy, and the sealing property is high. An object of the present invention is to provide a heat dissipation control device that can improve reliability.

(発明の概要) 本発明は、発熱体と熱的に接触する基板と、この基板の
前記発熱体とは反対側の面に密着された放熱板と、前記
基板と放熱板との密着面の少なくとも一方に形成した溝
部と他方との密着面により形成される空間部とを備え、
前記空間部の断面形状が角部を有するとともに、前記空
間部を冷媒流通路として構成したことを特徴としてい
る。
(Summary of the Invention) The present invention relates to a substrate that is in thermal contact with a heating element, a heat dissipation plate that is in close contact with the surface of the substrate opposite to the heating element, and a contact surface between the substrate and the heat dissipation plate. At least a groove portion formed on one side and a space portion formed by a contact surface with the other,
The cross-sectional shape of the space has corners, and the space is configured as a refrigerant flow passage.

(発明の実施例) 本発明の一実施例を図面に基づいて説明する。基板1
は、半導体装置の半導体素子であるICチップAを搭載す
るもので、セラミック材により形成されており、ICチッ
プA搭載面の反対面(裏面)には銅板からなる放熱用の
金属板2が密着固定されている。また、基板1の金属板
2が密着されている裏面には微細な溝部4が平行に数本
刻設されており、溝部4は金属板2による密封により断
面視四角形の冷媒流通路3に形成されている。密封され
た冷媒流通路3には冷媒5が封入されており、常温では
毛細管現象により、冷媒流通路3の角部3aに凝集してい
る。
(Embodiment of the Invention) An embodiment of the present invention will be described with reference to the drawings. Board 1
Is for mounting an IC chip A, which is a semiconductor element of a semiconductor device, is made of a ceramic material, and a metal plate 2 for heat dissipation made of a copper plate is closely adhered to the opposite surface (back surface) of the IC chip A mounting surface. It is fixed. In addition, several fine groove portions 4 are formed in parallel on the back surface of the substrate 1 to which the metal plate 2 is adhered, and the groove portions 4 are formed in the refrigerant flow passage 3 having a quadrangular cross section by sealing with the metal plate 2. Has been done. The refrigerant 5 is enclosed in the sealed refrigerant flow passage 3, and is condensed at the corner 3a of the refrigerant flow passage 3 due to a capillary phenomenon at normal temperature.

次に製造方法について説明する。Next, the manufacturing method will be described.

まず、セラミック材により形成されている基板1の裏面
にエッチング加工、機械加工もしくはレーザビーム加工
により微細な溝部4を平行して複数本設ける。次に、こ
の溝部4のある裏面に金属板2を拡散溶接により、小さ
な加圧力で軽く接触させながら、高温で長時間加熱して
接合する。基板1と金属板2とが接合されると、基板1
の裏面側は完全にシールされることになり、溝部4が密
封されて冷媒流通路3が形成される。しかる後、機械加
工により金属板2に冷媒流通路3に通ずるパイプ(図示
省略)を接続する。パイプは金属板2との接続位置では
細管で、途中から太管に形成され、太管に形成された部
分にパルブが取付けられており、このバルブを介して冷
媒圧入装置(図示省略)に連通接続されている。パイプ
を金属板2に接続した後、冷媒圧入装置を作動させ、加
圧下で冷媒5をパイプを介して冷媒流通路3に封入す
る。この際、冷媒5は毛細管現象により冷媒流通路3の
角部3aに凝集する。冷媒5の冷媒流通路3への封入が終
了した後に、加圧状態を保持したままで、パイプを細管
の部分で絞って閉栓し、閉栓したまま、パイプを閉栓位
置よりもバルブ寄りの位置で切断除去すると共に切断部
を溶接すると、基板1、金属板2、冷媒流通路3、冷媒
5からなるマイクロヒートパイプが構成される。このよ
うに、基板1の裏面は金属板2が密着しており、溝部4
が密封されて冷媒流通路3に形成された後に、この冷媒
流通路3に冷媒5封入用のパイプを接続することができ
るので、従来のガラスでシールすると同時に溝部内に冷
媒封入しなければならないものに比べ、シール及び冷媒
封入を非常に容易に行うことができ、しかもシール性が
良好になり信頼性を高めることができる。
First, a plurality of fine groove portions 4 are provided in parallel on the back surface of the substrate 1 formed of a ceramic material by etching, machining, or laser beam processing. Next, the metal plate 2 is joined to the rear surface having the groove portion 4 by diffusion welding while heating it at a high temperature for a long time while lightly contacting it with a small pressing force. When the substrate 1 and the metal plate 2 are joined together, the substrate 1
The back surface side of is completely sealed, and the groove portion 4 is sealed to form the refrigerant flow passage 3. Thereafter, a pipe (not shown) communicating with the coolant flow passage 3 is connected to the metal plate 2 by machining. The pipe is a thin pipe at the connection position with the metal plate 2, is formed into a thick pipe from the middle, and a valve is attached to the portion formed in the thick pipe, and communicates with a refrigerant injection device (not shown) via this valve. It is connected. After connecting the pipe to the metal plate 2, the refrigerant press-fitting device is operated to enclose the refrigerant 5 in the refrigerant flow passage 3 through the pipe under pressure. At this time, the refrigerant 5 aggregates at the corners 3a of the refrigerant flow passage 3 due to the capillary phenomenon. After the refrigerant 5 is completely sealed in the refrigerant flow passage 3, the pipe is squeezed in the narrow tube portion while keeping the pressurized state, and the pipe is closed at the position closer to the valve than the closed position. By cutting and removing and welding the cut portion, a micro heat pipe including the substrate 1, the metal plate 2, the refrigerant flow passage 3, and the refrigerant 5 is formed. In this way, the metal plate 2 is in close contact with the back surface of the substrate 1 and the groove 4
Since the pipe for sealing the cooling medium 5 can be connected to the cooling medium flow passage 3 after it is sealed and formed in the cooling medium flow passage 3, it is necessary to seal with the conventional glass and at the same time seal the cooling medium in the groove portion. Sealing and refrigerant encapsulation can be performed very easily as compared with the above, and the sealing property is improved and reliability can be improved.

このように構成されたマイクロヒートパイプはICチップ
Aが非常に不均一な温度分布になった場合は、高温部で
冷媒5が蒸発して気体となり、冷媒流通路3の中央部3b
を通って低温部に移動する。低温部に移動した冷媒5は
凝縮して液体となり、角部3aに凝集し、毛細管現象によ
り再び高温部に戻る。このような冷媒5の循環運動と共
に、金属板2の放熱により、ICチップAで発生した熱は
放散されICチップAは全体として均一した温度に制御さ
れるので、ICチップAは良好な状態で作動することがで
きる。
In the micro heat pipe configured as described above, when the IC chip A has a very uneven temperature distribution, the refrigerant 5 evaporates into a gas in the high temperature portion, and the central portion 3b of the refrigerant flow passage 3
To the low temperature section. The refrigerant 5 that has moved to the low temperature portion is condensed into a liquid, aggregates in the corner portion 3a, and returns to the high temperature portion again due to the capillary phenomenon. The heat generated in the IC chip A is dissipated by the heat radiation of the metal plate 2 as well as the circulating motion of the refrigerant 5, and the IC chip A is controlled to a uniform temperature as a whole, so that the IC chip A is in a good state. Can operate.

尚、溝部4は第3図に示すように金属板2側に設けても
よく、また、基板1、金属板2の双方に設けてもよい。
また、第4図に示すように金属板2に放熱効率を高める
フィン6を取付けてもよい。
The groove 4 may be provided on the metal plate 2 side as shown in FIG. 3, or may be provided on both the substrate 1 and the metal plate 2.
Further, as shown in FIG. 4, fins 6 that enhance heat dissipation efficiency may be attached to the metal plate 2.

さらに、本実施例の冷媒流通路3は四角形のものについ
て示したが、これに限定されるものではなく、第5図に
示すような三角形のものの他、五角形、六角形等多角形
のもの、不定形のものでもよく、要は角部を有し、この
角部の毛細管現象によって低温側で液体化された冷媒5
が再び高温側に戻るものならばよい。
Further, although the refrigerant flow passage 3 of the present embodiment is shown as having a quadrangular shape, it is not limited to this, and in addition to a triangular shape as shown in FIG. 5, a polygonal shape such as a pentagon, a hexagon, etc., It may have an irregular shape, and in short, it has a corner, and the refrigerant 5 liquefied on the low temperature side due to the capillary action of this corner
Should return to the high temperature side again.

また、溝部4は平行に数本刻設したものについて示した
が、交差状のもの、あるいは一本のもの、交差状に数本
のもの等適宜設けることができるものである。
Further, although the groove portion 4 has been shown as being provided by engraving several grooves in parallel, it may be provided in an intersecting shape, one groove, or several grooves in an intersecting shape.

(発明の効果) 以上より明らかなように本発明によれば、基板は放熱を
密着しており、シールと共に冷媒を溝部内に封入する必
要がなく、溝部を密封して冷媒流通路に形成した後に、
冷媒流入路内に冷媒を封することができるので、冷媒の
封入が殊更困難な手段を用いることなく非常に容易に行
うことができ、しかもシール性が向上し信頼性を高める
ことができる。
(Effect of the invention) As is apparent from the above, according to the present invention, the substrate closely adheres to heat dissipation, and it is not necessary to seal the refrigerant in the groove together with the seal, and the groove is sealed to form the refrigerant flow passage. later,
Since the refrigerant can be sealed in the refrigerant inflow path, the refrigerant can be sealed very easily without using a particularly difficult means, and the sealing property is improved and the reliability can be enhanced.

【図面の簡単な説明】[Brief description of drawings]

第1図は、本発明の一実施例に係る放熱制御装置を示す
概略断面図、第2図は同要部断面図、第3図乃至第5図
はそれぞれ他の実施例を示す断面図である。 A……ICチップ(発熱体)、1……基板 2……金属板(放熱板)、3……冷媒流通路 3a……角部、4……溝部、5……冷媒
FIG. 1 is a schematic cross-sectional view showing a heat dissipation control device according to an embodiment of the present invention, FIG. 2 is a cross-sectional view of the same main portion, and FIGS. 3 to 5 are cross-sectional views showing other embodiments. is there. A: IC chip (heating element), 1 ... Substrate 2 ... Metal plate (heat dissipation plate), 3 ... Refrigerant flow passage 3a ... Corner, 4 ... Groove, 5 ... Refrigerant

───────────────────────────────────────────────────── フロントページの続き (72)発明者 福岡 義孝 東京都府中市東芝町1番地 株式会社東芝 府中工場内 (56)参考文献 特開 昭50−139969(JP,A) 特開 昭60−58648(JP,A) IBM Technical Disc losure Bulletin Vo l.23No.3August 1980 pa ge1057 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Yoshitaka Fukuoka, No. 1, Toshiba-cho, Fuchu-shi, Tokyo Inside the Fuchu factory, Toshiba Corp. (56) References JP-A-50-139969 (JP, A) JP-A-60-58648 (JP, A) IBM Technical Disclosure Bulletin Vol. 23 No. 3 August 1980 page 1057

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】発熱体と熱的に接触する基板と、この基板
の前記発熱体とは反対側の面に密着された放熱板と、前
記基板と放熱板との密着面の少なくとも一方に形成した
溝部と他方との密着面により形成される空間部とを備
え、前記空間部の断面形状が角部を有するとともに、前
記空間部を冷媒流通路として構成したことを特徴とする
放熱制御装置。
1. A substrate which is in thermal contact with a heating element, a heat radiating plate which is in close contact with the surface of the substrate opposite to the heat generating element, and at least one of the contact surface between the substrate and the heat radiating plate. A heat dissipation control device comprising: the groove portion and a space portion formed by a contact surface between the groove portion and the other, and the cross-sectional shape of the space portion has a corner portion, and the space portion is configured as a refrigerant flow passage.
【請求項2】前記空間部を密封構成と、この空間部内に
冷媒を封入したことを特徴とする特許請求の範囲第1項
記載の放熱制御装置。
2. The heat dissipation control device according to claim 1, wherein the space is hermetically sealed, and a refrigerant is enclosed in the space.
JP60058268A 1985-03-25 1985-03-25 Heat dissipation control device Expired - Lifetime JPH0682768B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60058268A JPH0682768B2 (en) 1985-03-25 1985-03-25 Heat dissipation control device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60058268A JPH0682768B2 (en) 1985-03-25 1985-03-25 Heat dissipation control device

Publications (2)

Publication Number Publication Date
JPS61218148A JPS61218148A (en) 1986-09-27
JPH0682768B2 true JPH0682768B2 (en) 1994-10-19

Family

ID=13079423

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60058268A Expired - Lifetime JPH0682768B2 (en) 1985-03-25 1985-03-25 Heat dissipation control device

Country Status (1)

Country Link
JP (1) JPH0682768B2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19514548C1 (en) * 1995-04-20 1996-10-02 Daimler Benz Ag Method of manufacturing a micro cooler
CN102956583B (en) * 2011-08-29 2015-08-19 奇鋐科技股份有限公司 Vapor structure and manufacturing method thereof
JP5939754B2 (en) * 2011-09-06 2016-06-22 奇▲こう▼科技股▲ふん▼有限公司 Structure of plate heat pipe
CN105200403A (en) * 2014-06-26 2015-12-30 江苏格业新材料科技有限公司 Method for improving interface combination through surface silver deposition of foamy copper for heat pipe or vapor chamber
FI127831B (en) * 2015-01-15 2019-03-29 Lappeenrannan Teknillinen Yliopisto Method of manufacturing a semiconductor module
CN115912055B (en) * 2022-12-08 2025-08-08 山东华光光电子股份有限公司 A high-power low-divergence semiconductor laser chip

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
IBMTechnicalDisclosureBulletinVol.23No.3August1980page1057

Also Published As

Publication number Publication date
JPS61218148A (en) 1986-09-27

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