JPH068782B2 - Cryogenic material testing equipment - Google Patents
Cryogenic material testing equipmentInfo
- Publication number
- JPH068782B2 JPH068782B2 JP17504085A JP17504085A JPH068782B2 JP H068782 B2 JPH068782 B2 JP H068782B2 JP 17504085 A JP17504085 A JP 17504085A JP 17504085 A JP17504085 A JP 17504085A JP H068782 B2 JPH068782 B2 JP H068782B2
- Authority
- JP
- Japan
- Prior art keywords
- upper lid
- material testing
- radiation plate
- cryogenic material
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は液体ヘリウム、水素等の寒剤を用いる極低温域
で引張り試験,疲労試験,破壊靱性試験等を行なう材料
試験装置に関するものである。Description: TECHNICAL FIELD The present invention relates to a material testing device for performing a tensile test, a fatigue test, a fracture toughness test and the like in a cryogenic range using a cryogen such as liquid helium and hydrogen.
(従来の技術) 近年、超電導技術等の発展により極低温下で用いられる
材料の研究が盛んになされて来ており、それに伴って極
低温下での材料性能を測定する試験装置が求められて来
ている。このため各種極低温用材料試験装置が提案され
ており、例えば実開昭59−82839号公報には極低
温引張試験装置が提案されている。この試験装置では液
状寒剤の収容室への熱侵入を低減すべく、収容室上部に
引張り棒等を取り囲んで断熱板を層状に配置した構造と
している。(Prior Art) In recent years, due to the development of superconducting technology and the like, research on materials used at cryogenic temperatures has been actively conducted, and accordingly, a test device for measuring material performance at cryogenic temperatures has been demanded. It is coming. For this reason, various cryogenic material testing devices have been proposed. For example, Japanese Utility Model Laid-Open No. 59-82839 proposes a cryogenic tensile testing device. In this test device, in order to reduce heat infiltration of the liquid cryogen into the storage chamber, a heat insulating plate is arranged in layers in the upper part of the storage chamber so as to surround a pull rod and the like.
(発明が解決しようとする問題点) ところで、極低温容器においては、容器への熱侵入をい
かに防止又は低減するかが大きな問題であり、特に材料
試験装置の場合には、前記のような引張り棒、あるいは
支柱等の材料試験に必要な強度部材からの熱侵入をいか
に抑えるかが重要課題である。すなわち前記のような引
張り試験装置の場合は、大きな荷重を支える引張り棒が
太くなり、そのため外部からの熱侵入が非常に多くな
り、寒剤の蒸発が増加するとの問題が生ずる。測定時間
が長くなる場合、あるいは大型の装置の場合には蒸発が
多いとそのままでは使用不可能となるので、引張り棒を
長くして熱侵入を小さくするか、または専用の液化冷凍
機を必要とする。前者の場合は装置が長くなり、後者の
場合は装置が高価で大規模になる。このような問題の解
決のため前述のように断熱板が用いられているが、これ
らの対策だけでは熱侵入の抑制は不十分であった。そこ
で本発明は寒剤の蒸発を極力抑制して試験をする上での
制約を少なくすることのできる装置を提供することを目
的としてなされた。(Problems to be Solved by the Invention) By the way, in a cryogenic container, how to prevent or reduce the heat invasion into the container is a big problem. An important issue is how to suppress heat invasion from the strength members necessary for material testing such as rods or columns. That is, in the case of the tensile tester as described above, the pull rod supporting a large load becomes thick, so that heat intrusion from the outside becomes very large and evaporation of the cryogen increases. If the measurement time is long, or if it is a large-scale device, it will not be possible to use it as it is if there is a large amount of evaporation.Therefore, it is necessary to lengthen the pull rod to reduce heat intrusion, or to use a special liquefaction refrigerator. To do. In the former case, the device is long, and in the latter case, the device is expensive and large-scale. Although a heat insulating plate is used as described above to solve such a problem, suppression of heat intrusion is insufficient only by these measures. Therefore, the present invention has been made for the purpose of providing an apparatus capable of suppressing evaporation of a freezing agent as much as possible and reducing restrictions in a test.
(問題を解決するための手段) そのため本発明では液状寒剤を収容し試験片を所定温度
に維持する収容室を有する装置本体と、該装置本体を密
閉する上蓋と、該上蓋に装着され前記収容室に収容され
た支柱と、前記上蓋に摺動自在であって前記収容室に挿
入された操作棒を有する極低温用材料試験装置におい
て、輻射板を前記支柱および操作棒との間に蒸発ガスが
通る隙間をもたせて前記収容室内に配置し、そのまわり
を前記上蓋まで延長して輻射板カバーで覆い、前記上蓋
の該輻射板カバーの内側に蒸発ガスの出口を取り付ける
ことによって目的を達成した。(Means for Solving the Problem) Therefore, in the present invention, an apparatus main body having an accommodation chamber for accommodating a liquid cryogen and maintaining a test piece at a predetermined temperature, an upper lid for sealing the apparatus main body, and the accommodation attached to the upper lid In a cryogenic material testing device having a column housed in a chamber and an operating rod slidable on the upper lid and inserted in the chamber, a radiation plate is provided between the column and the operating rod for evaporating gas. The object is achieved by arranging it in the accommodating chamber with a space through which it passes, extending around it to the upper lid and covering it with a radiation plate cover, and attaching an outlet for evaporative gas to the inside of the radiation plate cover of the upper lid. .
(作用および実施例) 以下、本発明の詳細を実施例を用いて説明する。第1図
および第2図において、1は内部に液体ヘリウム13を収
容したクライオスタットであり、その上部に上蓋2が取
り付けられ、上蓋2には液体ヘリウムの液注入口16が
設けられている。クライオスタット1の内部には材料試
験用の各部材が収容および挿入されている。すなわち、
まず上蓋2の下面には複数本の支柱4が取り付けられて
おり、その支柱4の下端には底板5が取り付けられてい
る。また上蓋2の中心を通って摺動する引張り棒3がク
ライオスタット1内に挿入され、その下端には吊金具1
1が取り付けられていて、支柱4には蒸発ガスが通るだ
けの穴が設けられている軸受け9が取り付けられ引張り
棒3を支えている。底板5の上面には試験片取り付け手
段10があり、支柱4の上部には支柱4および引張り棒
3との間にそれぞれすき間をもたせて複数の輻射板6が
層状に配列されており、各々の輻射板6の間には発泡材
7が入れられていて、輻射板6のまわりを上蓋2の下面
まで延長して輻射板カバー8で覆い、上蓋2の輻射板カ
バー8の内側に蒸発ガス出口15が取り付けられてい
る。またクライオスタット1の側壁の内部には、冷却用
の液体窒素14が入っている。第1図の状態において極
低温引張り試験を行なった場合、外部特に引張り棒3と
支柱4を通じて熱が侵入し液体ヘリウム13が蒸発して
いく。この蒸発ガスのうちクライオスタット1の内壁と
輻射板カバー8の間に侵入するものは輻射板カバー8が
上蓋2まで延長しているため試験装置の外部へ出ること
はできない。したがって蒸発ガスは外部へ出る場合、軸
受け9に設けられた穴あるいは引張り棒3と軸受け9の
すき間から輻射板カバー8の内側に侵入し、さらに輻射
板6と引張り棒3あるいは支柱4のすき間を通って、引
張り棒3あるいは支柱4と熱交換をしながら上昇して輻
射板カバー8の内側部分にある上蓋2の下面に達し、ガ
ス出口15から装置外部へ出ていく。その際、上昇ガス
の温度は低いのでその顕熱を利用することにより液体ヘ
リウムの蒸発を抑えることができる。この装置(クライ
オスタット1内径280mm,深さ770mm)を用いて液体ヘリ
ウム13を貯液して試験片12の亀裂進展測度の測定
試験を行ない、液体ヘリウムの蒸発量を測定した。ただ
し、試験片12が完全に浸るには5以上の液体ヘリウ
ムが必要であった。本実施例における効果を証明するた
め、従来の引張り試験装置として上記引張り試験装置か
ら輻射板カバー8を取り除いたものを用いて上記と同様
の比較試験を行ない、液体ヘリウムの蒸発量を測定し
た。上記の測定結果を表1に示す。表1からわかるよう
に本発明による試験装置を用いた場合、従来のものと比
べて単位あたりの液体ヘリウムの蒸発量が40%まで減
少した。(Operations and Examples) Hereinafter, the details of the present invention will be described using examples. In FIGS. 1 and 2, reference numeral 1 is a cryostat in which liquid helium 13 is housed, an upper lid 2 is attached to the upper portion thereof, and a liquid helium liquid injection port 16 is provided in the upper lid 2. Each member for material test is housed and inserted in the cryostat 1. That is,
First, a plurality of columns 4 are attached to the lower surface of the upper lid 2, and a bottom plate 5 is attached to the lower ends of the columns 4. Further, a pull rod 3 which slides through the center of the upper lid 2 is inserted into the cryostat 1, and the lower end of the pull rod 3 has the hanging metal fitting 1
1, a bearing 9 having a hole through which evaporative gas can pass is attached to the column 4, and supports the pull rod 3. A test piece attachment means 10 is provided on the upper surface of the bottom plate 5, and a plurality of radiation plates 6 are arranged in layers on the upper part of the support column 4 with gaps between the support column 4 and the pull rod 3, respectively. A foam material 7 is inserted between the radiating plates 6 and extends around the radiating plate 6 to the lower surface of the upper lid 2 and is covered with a radiating plate cover 8. The evaporative gas outlet is provided inside the radiating plate cover 8 of the upper lid 2. 15 is attached. Liquid nitrogen 14 for cooling is contained inside the side wall of the cryostat 1. When a cryogenic tensile test is performed in the state shown in FIG. 1, heat invades from the outside, especially through the pull rod 3 and the support 4, and the liquid helium 13 evaporates. Of the vaporized gas, the gas that enters between the inner wall of the cryostat 1 and the radiation plate cover 8 cannot extend to the outside of the test apparatus because the radiation plate cover 8 extends to the upper lid 2. Therefore, when the evaporative gas goes out to the outside, it enters the inside of the radiation plate cover 8 through the hole provided in the bearing 9 or the gap between the pull rod 3 and the bearing 9, and further the gap between the radiation plate 6 and the pull rod 3 or the column 4. Passing through, it rises while exchanging heat with the pull rod 3 or the column 4, reaches the lower surface of the upper lid 2 inside the radiation plate cover 8, and goes out of the apparatus through the gas outlet 15. At that time, since the temperature of the rising gas is low, the evaporation of liquid helium can be suppressed by utilizing the sensible heat. Using this device (cryostat 1 inner diameter 280 mm, depth 770 mm), liquid helium 13 was stored and a crack growth rate measurement test of the test piece 12 was carried out to measure the evaporation amount of liquid helium. However, liquid helium of 5 or more was required for the test piece 12 to be completely immersed. In order to prove the effect in this embodiment, the same comparative test as above was carried out using a conventional tensile tester with the radiation plate cover 8 removed from the above tensile tester, and the evaporation amount of liquid helium was measured. The above measurement results are shown in Table 1. As can be seen from Table 1, when the test apparatus according to the present invention was used, the evaporation amount of liquid helium per unit was reduced to 40% as compared with the conventional one.
(発明の効果) 以上の説明より知られるように、本発明による極低温用
材料試験装置においては液体ヘリウムの蒸発量を従来の
ものよりもかなり減少させる効果があり、その結果次の
ような効果も生じる。第1に測定可能時間が長くなる。
第2に大型装置の製作において冷凍システムなしで可能
となる範囲が拡大する。第3に引張り棒や支柱を長くす
る必要がなくなるので試験装置の小型化が可能になり、
装置にコストダウンおよび必要な液体ヘリウムの量の減
少が可能になる。 (Effect of the Invention) As is known from the above description, the cryogenic material testing apparatus according to the present invention has an effect of significantly reducing the evaporation amount of liquid helium as compared with the conventional one, and as a result, the following effects are obtained. Also occurs. First, the measurable time becomes long.
Secondly, the range that can be achieved without the refrigeration system in manufacturing a large-scale device is expanded. Thirdly, since it is not necessary to lengthen the pull rods and columns, the test equipment can be downsized,
The cost of the device can be reduced and the amount of liquid helium required can be reduced.
第1図は本発明による極低温用材料試験装置の第2図に
おけるB−B′縦断面図、第2図は第1図におけるA−
A′拡大断面図である。 1:クライオスタット 2:上蓋 3:引張り棒 4:支柱 6:輻射板 8:輻射板カバー 15:蒸発ガス出口FIG. 1 is a vertical cross-sectional view of the cryogenic material testing apparatus according to the present invention taken along the line BB ′ in FIG. 2, and FIG. 2 is taken along the line A- in FIG.
It is an A'expansion sectional view. 1: Cryostat 2: Top cover 3: Pull rod 4: Support rod 6: Radiant plate 8: Radiant plate cover 15: Evaporated gas outlet
Claims (1)
する収容室を有する装置本体と、該装置本体を密閉する
上蓋と、該上蓋に装着され前記収容室に収容された支柱
と、前記上蓋に摺動自在であって前記収容室に挿入され
た操作棒を有する極低温用材料試験装置において、輻射
板を前記支柱および操作棒との間に蒸発ガスが通る隙間
をもたせて前記収容室内に配置し、そのまわりを前記上
蓋まで延長して輻射板カバーで覆い、前記上蓋の該輻射
板カバーの内側に蒸発ガスの出口を取り付けたことを特
徴とする極低温用材料試験装置。1. An apparatus main body having an accommodating chamber for accommodating a liquid cryogen and maintaining a test piece at a predetermined temperature, an upper lid for sealing the apparatus main body, and a column mounted on the upper lid and accommodated in the accommodating chamber. In a cryogenic material testing device having an operation rod that is slidable on the upper lid and inserted into the accommodation chamber, the radiation plate is provided with a gap through which evaporative gas passes between the support column and the operation rod. A cryogenic material testing device, which is arranged in a room, is extended to the upper lid and is covered with a radiation plate cover, and an outlet for vaporized gas is attached to the inside of the radiation plate cover of the upper lid.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17504085A JPH068782B2 (en) | 1985-08-08 | 1985-08-08 | Cryogenic material testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17504085A JPH068782B2 (en) | 1985-08-08 | 1985-08-08 | Cryogenic material testing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6235242A JPS6235242A (en) | 1987-02-16 |
| JPH068782B2 true JPH068782B2 (en) | 1994-02-02 |
Family
ID=15989162
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17504085A Expired - Lifetime JPH068782B2 (en) | 1985-08-08 | 1985-08-08 | Cryogenic material testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH068782B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5065439B2 (en) * | 2009-05-12 | 2012-10-31 | 大陽日酸株式会社 | Low temperature tensile testing machine |
| KR102454208B1 (en) * | 2021-11-24 | 2022-10-14 | 한국화학연구원 | Cryogenic mechanical test apparatus and Material testing machine having the Same |
-
1985
- 1985-08-08 JP JP17504085A patent/JPH068782B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6235242A (en) | 1987-02-16 |
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