JPH068793B2 - Thermal deterioration detection method - Google Patents
Thermal deterioration detection methodInfo
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- JPH068793B2 JPH068793B2 JP579886A JP579886A JPH068793B2 JP H068793 B2 JPH068793 B2 JP H068793B2 JP 579886 A JP579886 A JP 579886A JP 579886 A JP579886 A JP 579886A JP H068793 B2 JPH068793 B2 JP H068793B2
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- deterioration
- time
- melting
- temperature
- degree
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Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、電気機器絶縁に用いられる絶縁材料等の熱劣
化を検出する方法に関する。TECHNICAL FIELD The present invention relates to a method for detecting thermal deterioration of an insulating material or the like used for insulating an electric device.
電気機器の絶縁には、通常、固体絶縁材料、液体絶縁材
料及び気体絶縁材料が単独に又は組合わせて使用されて
いる。For insulation of electric devices, solid insulating materials, liquid insulating materials and gas insulating materials are usually used alone or in combination.
そして、油入変圧器等における液体絶縁やガス絶縁開閉
装置等における気体絶縁の場合にあっては、分解生成ガ
ス分析等の物理化学的手法により絶縁劣化を判定する方
法が提案され、一部実用化されている。しかし、回転機
等における固体絶縁にあっては、電気的試験による方
法、いわゆる「絶縁診断法」が判定方法の中心となって
いる。In the case of liquid insulation in oil-immersed transformers and gas insulation in gas-insulated switchgear, etc., a method for determining insulation deterioration by a physicochemical method such as decomposition gas analysis has been proposed, and it is partially used. Has been converted. However, in solid insulation in rotating machines and the like, a method based on an electrical test, a so-called “insulation diagnosis method”, is the center of determination method.
しかし、現状の電気的試験による直流試験法、交流試験
法、誘電正接試験法、部分放電試験法等の絶縁診断法で
は、被測定機器の定格電圧を越えて試験電圧を印加する
ことはできない。したがって、得られる諸特性の変化は
小さく、しかもその試験結果は試験時の環境条件、特に
湿温の影響を受ける。そのため、絶縁劣化に対する安定
した対応がとれないまま、経験的に劣化状況を推測する
にとどまっている。However, it is not possible to apply a test voltage exceeding the rated voltage of the device under test by the current insulation test methods such as a DC test method, an AC test method, a dielectric loss tangent test method, and a partial discharge test method based on an electrical test. Therefore, changes in the obtained characteristics are small, and the test results are affected by the environmental conditions during the test, particularly the humidity temperature. For this reason, it is empirical to estimate the deterioration state without being able to take stable measures against insulation deterioration.
また、物理科学的方法としては、絶縁材料の動的粘弾性
特性の変化、たとえば動的弾性率と損失弾性率との比で
表されるメカニカル−tanδの変化、或いは赤外線分光
分析の赤外線吸収スペクトルの変化を判定基準とする劣
化度判定法が提唱され、一部実用化されている。Further, as a physics-based method, a change in dynamic viscoelastic property of an insulating material, for example, a change in mechanical-tan δ represented by a ratio of a dynamic elastic modulus and a loss elastic modulus, or an infrared absorption spectrum of infrared spectroscopic analysis A deterioration degree judgment method using the change of is used as a judgment criterion has been proposed and partially put into practical use.
ところが、メカニカル−tanδの変化を判定基準とする
劣化度判定法においては、適用できる試料としてはフィ
ルム材が主体で、更にフィルム材であっても、材料の脆
化が著しい高劣化度領域においては、測定中に試料が破
壊し易く、劣化度の判定ができなくなる。他方、赤外線
分光分析の赤外線吸収スペクトルの変化を判定基準とす
る劣化度判定法においては、黒色の材料や劣化により黒
変した材料等の明度の低い材料では、赤外線吸収率が高
く、劣化度の判定が困難である。However, in the deterioration degree judgment method using the change of mechanical-tan δ as a judgment criterion, a film material is mainly applicable as a sample, and even in the case of a film material, in a high deterioration degree region where material embrittlement is remarkable, , The sample is easily broken during the measurement, and the degree of deterioration cannot be determined. On the other hand, in the deterioration degree judgment method using the change in the infrared absorption spectrum of the infrared spectroscopic analysis as a judgment standard, a material having a low lightness such as a black material or a material which is blackened due to deterioration has a high infrared absorption rate and a deterioration degree of It is difficult to judge.
本発明は、このような欠点を取り除くために案出された
ものであり、電気機器等の保全における修理,更新等の
処置を、予め試料に基づいて求めた熱劣化度合に関する
データに対して信頼度高く行うことができるように、熱
劣化の程度を広範囲にわたって検出することを目的とす
る。The present invention has been devised in order to eliminate such drawbacks, and makes it possible to perform reliable measures such as repairs and renewals in maintenance of electrical equipment with respect to data on the degree of thermal deterioration previously obtained based on a sample. The purpose is to detect the extent of thermal degradation over a wide range so that it can be performed with high accuracy.
本発明は、その目的を達成すべく、被測定物質と同一材
料の試料を種々の温度で劣化させ、その試料の劣化温度
及び劣化時間の変化に対する融解熱曲線の融解ピークの
変化に基づき、被測定物質の熱劣化度をアレニウスの反
応速度式から求まる温度と時間の関数として求め、実働
機器から採取した被測定物質の示差走査熱量測定による
融解熱曲線の融解ピークとの対比により、実働機器の熱
劣化度を検出することを特徴とする。In order to achieve the object, the present invention deteriorates a sample of the same material as the substance to be measured at various temperatures, and based on the change of the melting peak of the melting heat curve with respect to the deterioration temperature and deterioration time of the sample, The degree of thermal degradation of the substance to be measured is obtained as a function of temperature and time obtained from the Arrhenius reaction rate equation, and by comparing it with the melting peak of the melting heat curve by differential scanning calorimetry of the substance to be measured collected from the device, It is characterized in that the degree of thermal deterioration is detected.
一般に、熱劣化による電気機器の絶縁材料の化学構造的
な変化は、化学反応速度論に従う。他方、一定濃度での
溶液の粘度は、化学構造によって一義的に決まる。すな
わち、結晶性ポリマーの熱劣化による結晶構造の変化が
反応速度論に従うとすると、結晶構造量Xの変化は、次
式(1)で表される。Generally, a chemical structural change of an insulating material of an electric device due to heat deterioration follows a chemical reaction kinetics. On the other hand, the viscosity of a solution at a constant concentration is uniquely determined by its chemical structure. That is, assuming that the change in the crystal structure due to the thermal deterioration of the crystalline polymer follows the reaction kinetics, the change in the crystal structure amount X is represented by the following formula (1).
dx/dt=A・exp(−ΔE/RT)・g(x)………(1) 但し、t:劣化時間, A:頻度因子 ΔE:活性化エネルギー R:ガス定数 T:劣化の絶対温度 g(x):劣化機構を表す関数 材料の劣化が時間0からtまで進み、結晶構造量がx0
からxtまで変化したとして式(1)を積分すると、次式
(2)となる。dx / dt = A * exp (-[Delta] E / RT) * g (x) ... (1) where t: deterioration time, A: frequency factor [Delta] E: activation energy R: gas constant T: absolute temperature of deterioration g (x): function indicating deterioration mechanism Deterioration of material progresses from time 0 to t, and crystal structure amount is x 0
Integrating equation (1) as varied from x t from the following equation
It becomes (2).
ここで、右辺の積分は時間の次元となっているので、換
算時間θと呼ばれている。すなわち、換算時間θは、次
式(3)で表される。 Here, since the integration on the right side has a dimension of time, it is called a conversion time θ. That is, the conversion time θ is expressed by the following equation (3).
従って(2)式は、次式(4)に変換される。 Therefore, the equation (2) is converted into the following equation (4).
劣化機構を示す関数g(x)と頻度因子Aが一定の劣化領
域では、種々の温度条件で劣化が生じても換算時間θが
等しければ、結晶構造量の変化も等しくなる。すなわ
ち、両者の関係は、次式(5)で表される。 In the deterioration region where the function g (x) indicating the deterioration mechanism and the frequency factor A are constant, even if the deterioration occurs under various temperature conditions, if the conversion times θ are equal, the changes in the crystal structure amount are also equal. That is, the relationship between the two is expressed by the following equation (5).
θ=f(x)……………(5) 更に、示差走査熱量測定による融解熱曲線における融解
エネルギーQが結晶構造量により一義的に決まるものと
すると、融解エネルギーQは次式(6)で表される。θ = f (x) (5) Further, assuming that the melting energy Q in the melting heat curve by differential scanning calorimetry is uniquely determined by the crystal structure amount, the melting energy Q is It is represented by.
Q=h(x)……………(6) すなわち、換算時間θと融解エネルギーQとの間には、
次式(7)の関係が成り立つ。Q = h (x) ………… (6) That is, between the conversion time θ and the melting energy Q,
The following equation (7) holds.
θ=f{h-1(Q)}……………(7) したがって、熱劣化の換算時間θは、式(7)に示すよう
に融解エネルギーQの変化から求めることができる。θ = f {h −1 (Q)} ... (7) Therefore, the conversion time θ of thermal deterioration can be obtained from the change of the melting energy Q as shown in the equation (7).
以下、電気絶縁材料として多用されているポリエチレン
テレフタレートを試料として用いた実施例により、本発
明の特徴を具体的に説明する。Hereinafter, the features of the present invention will be specifically described with reference to examples in which polyethylene terephthalate, which is widely used as an electric insulating material, is used as a sample.
槽内温度が160℃,180℃,200℃の熱風循環式恒温槽内で
劣化させた被測定物質と同一材料の試料の示差走査熱量
測定による融解熱曲線の一例を第1図に示す。ポリエチ
レンテレフタレートは、異なる融解温度の結晶の分布に
対応した温度幅T1〜T2をもって融解している。そし
て、劣化によりメイン融解ピークのやや低温度側に新た
な融解ピークが現れ、そのピークは劣化の進行と共に深
くなっている。Fig. 1 shows an example of a melting heat curve by differential scanning calorimetry of a sample of the same material as the substance to be measured which has been deteriorated in a hot air circulation type constant temperature bath whose temperature inside the bath is 160 ° C, 180 ° C and 200 ° C. Polyethylene terephthalate melts with a temperature width T 1 to T 2 corresponding to the distribution of crystals with different melting temperatures. Then, due to the deterioration, a new melting peak appears on the slightly lower temperature side of the main melting peak, and the peak becomes deeper as the deterioration progresses.
第2図は、この各劣化温度160℃,180℃,200℃における
劣化時間と劣化により新たに生成した融解ピークの深さ
との関係を示している。ピークの深さは、劣化時間の対
数に比例して直線的に深くなっていることがわかる。FIG. 2 shows the relationship between the deterioration time at each of the deterioration temperatures of 160 ° C., 180 ° C., and 200 ° C. and the depth of the melting peak newly generated by the deterioration. It can be seen that the peak depth linearly increases in proportion to the logarithm of the deterioration time.
次に、第2図の劣化温度をパラメータとした、劣化によ
り新たに生成した融解ピークの増加直線から、劣化の換
算時間θを用いたマスターカープを作成する。まず、第
2図の回帰直線から求めた融解ピークの深さが0.5mJ/m
g・sec,1mJ/mg・secになるまでの劣化温度と劣化時間
との関係を、第3図に示すアレニウスの式に基づく座標
点プロットで表す。この第3図に示された関係線図の勾
配ΔE/Rから活性化エネルギーΔEを求め、該活性化
エネルギーΔEを式(3)に代入する。このようにして、
換算時間θを算出する。そして、第4図に示すように、
横軸に換算時間θ及び劣化度をとり、縦軸に新たに生成
する融解ピークの深さをとり、試料の熱劣化によって新
たに生成する融解ピークの深さに関するマスターカーブ
Aを得た。Next, a master carp using the deterioration conversion time θ is created from the increasing line of the melting peak newly generated by the deterioration using the deterioration temperature of FIG. 2 as a parameter. First, the melting peak depth obtained from the regression line in Fig. 2 is 0.5 mJ / m.
The relationship between the deterioration temperature and the deterioration time up to g · sec, 1 mJ / mg · sec is represented by a coordinate point plot based on the Arrhenius equation shown in FIG. The activation energy ΔE is obtained from the gradient ΔE / R of the relationship diagram shown in FIG. 3, and the activation energy ΔE is substituted into the equation (3). In this way
The conversion time θ is calculated. Then, as shown in FIG.
The horizontal axis represents the converted time θ and the degree of deterioration, and the vertical axis represents the depth of the newly generated melting peak, to obtain a master curve A relating to the depth of the melting peak newly generated by the thermal deterioration of the sample.
第4図から明らかなように、例示した各劣化温度160℃,
180℃,200℃において新たに生成する融解ピークの深さ
は、それぞれ同一線上に乗っている。すなわち、新たに
生成する融解ピークの深さと劣化の換算時間θとの間に
は、非常に強い相関関係があることが判る。As is apparent from FIG. 4, the deterioration temperatures of 160 ° C.
The depths of newly generated melting peaks at 180 ° C and 200 ° C are on the same line. That is, it can be seen that there is a very strong correlation between the depth of the newly generated melting peak and the conversion time θ of deterioration.
たとえば、電気機器絶縁線輪の耐熱寿命が130℃の温度
雰囲気中で20,000時間であるとすると、式(3)から寿命
点の換算時間θaは3×10-19となり、この換算時間θ
aを横軸の劣化度軸上に1.0を目盛って寿命点として示
しておく。次に、試料と同じくポリエチレンテレフタレ
ートからなる絶縁材料を電気機器の絶縁線輪(図示せ
ず)に用い、該電気機器を所要時間稼働した後で、前記
絶縁材料を前記絶縁線輪から微少量採取する。そして、
示差走査熱量測定による融解熱曲線に基づき、劣化によ
り新たに生成したピークの深さCbを求め、第4図の縦
軸上のCbとマスターカーブAとの交叉する点の座標か
ら換算時間θbを得る。この換算時間θbは、温度及び
時間の関数である。したがって、電気機器の運転時間が
判ればその間の平均的な温度(等価温度)を、或いは運
転時の温度が判れば運転時間を、式(3)によって算出す
ることができる。このようにして、熱劣化の度合を算出
することが可能となる。また、換算時間θbを横軸の劣
化度の目盛に対応させると、電気機器絶縁線輪の余寿命
を知ることができる。For example, assuming that the heat-resistant life of the insulated loop of electrical equipment is 20,000 hours in a temperature atmosphere of 130 ° C, the converted time θ a of the life point from Equation (3) becomes 3 × 10 -19 , and this converted time θ
A is shown as a life point by grading 1.0 on the deterioration degree axis on the horizontal axis. Next, the same insulating material made of polyethylene terephthalate as that of the sample is used for an insulating wire ring (not shown) of an electric device, and after the electric device is operated for a required time, a small amount of the insulating material is sampled from the insulating wire ring. To do. And
Based on the heat of fusion curve by differential scanning calorimetry, determined the depth C b of the peak newly generated by the degradation, in terms of time from the C b and the coordinates of the point of intersection between the master curve A on the vertical axis of FIG. 4 Obtain θ b . This conversion time θ b is a function of temperature and time. Therefore, if the operating time of the electric device is known, the average temperature (equivalent temperature) during that time can be calculated, or if the operating temperature is known, the operating time can be calculated by the formula (3). In this way, the degree of thermal deterioration can be calculated. Further, when the converted time θ b is made to correspond to the scale of deterioration degree on the horizontal axis, it is possible to know the remaining life of the electric device insulating coil.
上記実施例では、ポリエチレンテレフタレートについて
述べたが、この他にも、ケーブル絶縁用に多く用いられ
ているポリエチレンなどの結晶性ポリマーに適用でき
る。In the above embodiments, polyethylene terephthalate was described, but in addition to this, it can be applied to a crystalline polymer such as polyethylene that is often used for cable insulation.
また、本発明の熱劣化検出方法は、電気機器絶縁物に限
ることなく、他の分野で使用されている結晶性ポリマー
の熱劣化検出にも応用ができることは言うまでもない。Further, it goes without saying that the heat deterioration detection method of the present invention is not limited to electrical equipment insulators and can be applied to heat deterioration detection of crystalline polymers used in other fields.
以上に説明したように、本発明の熱劣化検出方法におい
ては、微小量試料の示差走査熱量測定による融解熱曲線
の融解ピークの深さの変化から、被測定物質の熱劣化量
を温度と時間の関数として求め、実働機器から採取した
被測定物質の示差走査熱量測定による融解熱曲線の融解
ピークの深さと対比させることにより、実働機器の熱劣
化度合を検出するようにしたものである。したがって、
電気機器等の保全における修理,更新等の処置を、予め
蓄積しておいたデータベースに基づいて、高い信頼性で
行うことができ、また、電気機器の絶縁設計を直接的に
検証し、絶縁設計にフィードバックすることにより電気
機器の信頼性向上を図ることができるという効果を奏す
る。As described above, in the method for detecting thermal deterioration of the present invention, from the change in the depth of the melting peak of the melting heat curve by the differential scanning calorimetry of a minute amount sample, the thermal deterioration amount of the substance to be measured can be measured with respect to temperature and time. The heat deterioration degree of the actual equipment is detected by comparing it with the depth of the melting peak of the melting heat curve by differential scanning calorimetry of the substance to be measured collected from the actual equipment. Therefore,
Measures such as repairs and renewals for the maintenance of electrical equipment can be performed with high reliability based on a database that has been stored in advance, and the insulation design of electrical equipment can be directly verified and insulation design can be performed. The effect of improving the reliability of the electric device can be achieved by feeding back to.
第1図は劣化させた試料の示差走査熱量測定による融解
熱曲線の一例を示し、第2図は融解ピークの深さと劣化
時間との関係を示し、第3図は劣化温度と劣化時間との
関係をアレニウスの式に基づく座標点プロットで表した
ものであり、第4図は融解ピークの深さと換算時間及び
劣化度との関係を示す図である。FIG. 1 shows an example of the melting heat curve of a deteriorated sample by differential scanning calorimetry, FIG. 2 shows the relationship between the melting peak depth and deterioration time, and FIG. 3 shows the deterioration temperature and deterioration time. The relationship is represented by a coordinate point plot based on the Arrhenius equation, and FIG. 4 is a view showing the relationship between the depth of the melting peak and the conversion time and deterioration degree.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭54−113398(JP,A) 特開 昭54−32388(JP,A) 特開 昭61−117441(JP,A) 神原編、「高分子材料試験法▲I▼−高 分子実験学講座7−」,初版,昭和33年1 月5日発行,共立出版,P.307〜P309 ─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-54-113398 (JP, A) JP-A-54-32388 (JP, A) JP-A-61-117441 (JP, A) Kanbara, ed. Molecular Materials Testing Method ▲ I ▼ -High Molecular Experiments Course 7- ", first edition, published January 5, 1958, Kyoritsu Publishing, P. 307 ~ P309
Claims (1)
で劣化させ、その試料の劣化温度及び劣化時間の変化に
対する融解熱曲線の融解ピークの変化に基づき、被測定
物質の熱劣化度をアレニウスの反応速度式から求まる温
度と時間の関数として求め、実働機器から採取した被測
定物質の示差走査熱量測定による融解熱曲線の融解ピー
クとの対比により、実働機器の熱劣化度を検出すること
を特徴とする熱劣化検出方法。1. A sample of the same material as the substance to be measured is deteriorated at various temperatures, and the degree of thermal deterioration of the substance to be measured is based on the change of the melting peak of the melting heat curve with respect to the change of the deterioration temperature and deterioration time of the sample. Is calculated as a function of temperature and time obtained from the Arrhenius reaction rate equation, and the degree of thermal deterioration of the actual equipment is detected by comparing it with the melting peak of the melting heat curve by differential scanning calorimetry of the measured substance collected from the actual equipment. A thermal deterioration detection method characterized by the above.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP579886A JPH068793B2 (en) | 1986-01-14 | 1986-01-14 | Thermal deterioration detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP579886A JPH068793B2 (en) | 1986-01-14 | 1986-01-14 | Thermal deterioration detection method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62163954A JPS62163954A (en) | 1987-07-20 |
| JPH068793B2 true JPH068793B2 (en) | 1994-02-02 |
Family
ID=11621098
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP579886A Expired - Fee Related JPH068793B2 (en) | 1986-01-14 | 1986-01-14 | Thermal deterioration detection method |
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| Country | Link |
|---|---|
| JP (1) | JPH068793B2 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4952521B2 (en) * | 2007-11-08 | 2012-06-13 | 富士通株式会社 | Measuring method of secondary battery separator |
| JP5737042B2 (en) * | 2011-07-27 | 2015-06-17 | 住友電装株式会社 | Thermal history evaluation method for molded products |
| JP6292839B2 (en) * | 2013-11-22 | 2018-03-14 | 千代田化工建設株式会社 | Resin evaluation method |
| WO2016145519A1 (en) * | 2015-03-18 | 2016-09-22 | Day Ryan | Thermal feature analysis of electrochemical devices |
| CN109001253B (en) * | 2018-07-19 | 2021-04-06 | 张海波 | Heat conductivity coefficient detection equipment for building energy-saving heat-insulating material by using protective hot plate method |
-
1986
- 1986-01-14 JP JP579886A patent/JPH068793B2/en not_active Expired - Fee Related
Non-Patent Citations (1)
| Title |
|---|
| 神原編、「高分子材料試験法▲I▼−高分子実験学講座7−」,初版,昭和33年1月5日発行,共立出版,P.307〜P309 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS62163954A (en) | 1987-07-20 |
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