JPH0692980B2 - Vibration measuring device - Google Patents
Vibration measuring deviceInfo
- Publication number
- JPH0692980B2 JPH0692980B2 JP1072831A JP7283189A JPH0692980B2 JP H0692980 B2 JPH0692980 B2 JP H0692980B2 JP 1072831 A JP1072831 A JP 1072831A JP 7283189 A JP7283189 A JP 7283189A JP H0692980 B2 JPH0692980 B2 JP H0692980B2
- Authority
- JP
- Japan
- Prior art keywords
- photoelectric conversion
- light
- condenser lens
- vibration
- displacement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は振動測定装置に関し、特に物理量の変化、例え
ば振動を光学的検出手段によつて検出し得るようにした
ものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a vibration measuring device, and more particularly, to a change in physical quantity, for example, vibration, which can be detected by an optical detecting means.
本発明は、振動測定装置において、測定すべき物理量に
応じて集光レンズを保持する可動体を光源光に対して直
交する方向に変位させるように配設すると共に、当該変
位に応じて光電変換素子上に生ずる光スポツトの変位に
基づいて物理量を測定するようにしたことにより、実用
上簡易な構成によつて一段と高性能の振動測定装置を実
現できる。According to the present invention, in a vibration measuring device, a movable body holding a condenser lens is arranged so as to be displaced in a direction orthogonal to a light source light according to a physical quantity to be measured, and photoelectric conversion is performed according to the displacement. Since the physical quantity is measured based on the displacement of the optical spot generated on the element, a vibration measuring device with higher performance can be realized with a practically simple structure.
従来振動測定装置として振子の変位を光学的に検出する
ようにした構成のものが提案されている。Conventionally, as a vibration measuring device, a device having a structure in which a displacement of a pendulum is optically detected has been proposed.
例えば第18図に示すように、光源光LA1を棒状振子1に
照射し、その影像2を一対の受光素子3A及び3B上に跨が
るように投影するようになされ、かくして棒状振子1が
矢印aで示すように光源光LA1と直交する方向に変位し
たとき、それに応じて一対の受光素子3A及び3Bから当該
棒状振子1の変位量に応じて変化する光検出出力を得る
ことができる(特開昭60-205370号公報)。For example, as shown in FIG. 18, the light source light LA1 is applied to the rod-shaped pendulum 1 and its image 2 is projected so as to straddle the pair of light-receiving elements 3A and 3B, and thus the rod-shaped pendulum 1 is indicated by an arrow. When it is displaced in the direction orthogonal to the light source light LA1 as indicated by a, it is possible to obtain a light detection output that changes in accordance with the displacement amount of the rod-shaped pendulum 1 from the pair of light receiving elements 3A and 3B (special feature). (Kaisho 60-205370 publication).
また第19図に示すように、中空パイプ11の途中に直径方
向に貫通孔12を穿設することによりヒンジ部13を形成
し、固定部14に固定された端部11Aに中空パイプ11の中
心軸方向に光源光LA2を射出する光源15を設けた構成の
ものが提案されている(特開昭62-233770号公報)。Further, as shown in FIG. 19, a hinge portion 13 is formed by piercing a through hole 12 in the diameter direction in the middle of the hollow pipe 11, and the center of the hollow pipe 11 is formed at an end 11A fixed to a fixing portion 14. A structure having a light source 15 for emitting the light source light LA2 in the axial direction is proposed (Japanese Patent Laid-Open No. 62-233770).
かくして中空パイプ11のヒンジ部13より先端側の遊端部
11Bが矢印bの方向に振動し得るようになされ、光源光L
A2が遊端部11Bの同軸上に設けられた集光レンズ15を通
つて一対の受光素子16A及び16B上に集光させる。Thus, the free end of the hollow pipe 11 closer to the tip than the hinge 13 is
11B is adapted to vibrate in the direction of arrow b, and the light source L
A2 passes through a condenser lens 15 provided coaxially with the free end portion 11B to focus it on a pair of light receiving elements 16A and 16B.
第19図の構成において、遊端部11Bがヒンジ部13を中心
として矢印bの方向に振動すると、受光素子16A及び16B
に対する照射光束LA3の位置が当該振動に応じて変化す
ることにより受光素子16A及び16Bの光電変換出力が変化
し、かくして遊端部11Bの振動を検出することができ
る。In the configuration of FIG. 19, when the free end portion 11B vibrates in the direction of the arrow b around the hinge portion 13, the light receiving elements 16A and 16B.
By changing the position of the irradiation light beam LA3 with respect to A, the photoelectric conversion outputs of the light receiving elements 16A and 16B change, and thus the vibration of the free end portion 11B can be detected.
ところが第18図の従来の構成によると、受光素子3A及び
3B上に投影する影の像の大きさを実用上必要なだけ小さ
くすることができないために、検出感度を高くできない
問題がある。However, according to the conventional configuration of FIG. 18, the light receiving element 3A and
Since the size of the shadow image projected on 3B cannot be made as small as practically necessary, there is a problem that the detection sensitivity cannot be increased.
因に棒状振子1の変位に対して一対の受光素子3A及び3B
に生ずる照射面積の変化は受光素子3A及び3B上に形成さ
れる影像2の大きさが小さくなればこれに応じて鋭くな
ることにより検出感度を向上させることができると考え
られるが、実際上第18図の構成によれば影像2の大きさ
は棒状振子1の大きさに依存しているために任意に小さ
くすることはできない。Due to the displacement of the rod-shaped pendulum 1, a pair of light receiving elements 3A and 3B
It is considered that the change in the irradiation area caused by the fact that the size of the image 2 formed on the light receiving elements 3A and 3B becomes sharper in response to the change in the size of the image 2 and the detection sensitivity can be improved. According to the configuration shown in FIG. 18, the size of the image 2 depends on the size of the rod-shaped pendulum 1, and therefore cannot be arbitrarily reduced.
これに対して第19図の従来の構成によれば、受光素子16
A及び16Bに照射される照射光束LA3を集光レンズ15によ
つて実用上十分に集束させることができ、その分検出感
度を向上させることができる。On the other hand, according to the conventional configuration of FIG.
The irradiation light beam LA3 irradiated to A and 16B can be sufficiently focused in practical use by the condenser lens 15, and the detection sensitivity can be improved accordingly.
しかしこの構成によると、集光レンズ15が設けられてい
る遊端部11Bが振動に応じてヒンジ部13を中心として回
動するために、第20図に示すように集光レンズ15の光軸
L0が光源15と一致しない位置に回転する欠点がある。However, according to this configuration, since the free end 11B provided with the condenser lens 15 rotates about the hinge portion 13 in response to the vibration, the optical axis of the condenser lens 15 as shown in FIG.
There is a drawback that L 0 rotates to a position that does not match the light source 15.
因に集光レンズ15の焦点位置に光源15及び受光素子16
A、16Bが配設されている場合、光軸L0が回転して集光レ
ンズ15が光軸L0から直交する方向にδx0だけ変位したと
き、受光素子16A及び16Bの受光面における光軸L0の変位
量は2δx0になる。しかし集光レンズ15が光軸L0を傾け
るように回転したとき焦点位置に生ずる照射光束LA3の
光スポツトは光軸L0が傾いた分光軸L0からの内側に距離
δx1だけ戻るように変位し、結局照射光束LA3の光スポ
ツトは光源15を通る光軸L0からδx2だけ移動することに
なる。The light source 15 and the light receiving element 16 are located at the focal position of the condenser lens 15.
When A and 16B are provided, when the optical axis L 0 rotates and the condenser lens 15 is displaced by δx 0 in the direction orthogonal to the optical axis L 0 , the light on the light receiving surfaces of the light receiving elements 16A and 16B The displacement amount of the axis L 0 becomes 2δx 0 . But light Supotsuto the irradiation light beam LA3 generated at the focal point when the condensing lens 15 is rotated so as to tilt the optical axis L 0 is to return to the inside from the spectral axis L 0 with inclined optical axis L 0 distance .delta.x 1 After being displaced, the optical spot of the irradiation light beam LA3 is eventually moved by Δx 2 from the optical axis L 0 passing through the light source 15.
このように集光レンズ15の光軸L0が傾くことにより照射
光束LA3に生ずる変位量が距離δx1の分だけ少なくな
り、この分検出感度が劣化する問題がある。As described above, since the optical axis L 0 of the condenser lens 15 is tilted, the displacement amount generated in the irradiation light beam LA3 is reduced by the distance Δx 1 , and the detection sensitivity is deteriorated accordingly.
本発明は以上の点を考慮してなされたもので、集光レン
ズの変位に基づいて振動量に対応する電気的な検出出力
を得るにつき、一段と検出感度が高く、しかも全体とし
ての構成をできるだけ簡易かつ小型化し得るようにした
振動測定装置を提案しようとするものである。The present invention has been made in consideration of the above points, and in obtaining an electrical detection output corresponding to the amount of vibration based on the displacement of the condenser lens, the detection sensitivity is much higher, and the overall configuration can be minimized. It is intended to propose a vibration measuring device that is simple and can be miniaturized.
かかる問題点を解決するため本発明においては、測定す
べき振動量に応動して第1の方向Xに変位するようにな
され、この第1の方向Xと直交する第2の方向Yに光軸
を有する集光レンズ2Bを保持する可動体2と、第1及び
第2の方向X及びYと直交する第3の方向Zに延長する
ように配設され、可動体2を第1の方向Xに変位できる
ように弾性的に支持する支持体4と、集光レンズ2Bの光
軸L01上に当該集光レンズ2Bと対向するように配設され
た光源5と、一対の光電変換素子6A、6Bを有し、光源5
から射出される光源光LA11を集光レンズ2Bによつて集束
することによつて得られる照射光束LA12を一対の光電変
換素子6A及び6Bに受光し、照射光束LA12が可動体2の変
位に応じて照射位置を変位させたとき一対の光電変換素
子6A、6Bから当該変位量に相当する光検出信号を送出す
る光電変換部6と、この光電変換部6から送出される光
検出信号の偏差に基づいて振動量測定出力を送出する振
動量検出回路部7と、光検出信号の偏差に基づいて可動
体2に対して電磁力でなる変位抑制力を発生する変位サ
ーボ手段43とを具え、一対の光電変換素子6A、6Bの受光
面間の間隔Lに対して、照射光束LA12の直径Dを、ほぼ L=0.8D の関係を満足する値に選定するようにする。In order to solve such a problem, in the present invention, the optical axis is displaced in the first direction X in response to the amount of vibration to be measured, and the optical axis is in the second direction Y orthogonal to the first direction X. And a movable body 2 that holds a condenser lens 2B having a movable body 2 and a movable body 2 that extends in a third direction Z orthogonal to the first and second directions X and Y. Support 4 that is elastically supported so that it can be displaced, a light source 5 disposed on the optical axis L 01 of the condenser lens 2B so as to face the condenser lens 2B, and a pair of photoelectric conversion elements 6A. , 6B, light source 5
The irradiation light beam LA12 obtained by converging the light source light LA11 emitted from the light source by the condensing lens 2B is received by the pair of photoelectric conversion elements 6A and 6B, and the irradiation light beam LA12 changes according to the displacement of the movable body 2. When the irradiation position is displaced by a pair of photoelectric conversion elements 6A and 6B, the photoelectric conversion unit 6 sends out a photodetection signal corresponding to the displacement amount, and the deviation of the photodetection signal sent from the photoelectric conversion unit 6 A vibration amount detection circuit unit 7 which outputs a vibration amount measurement output based on the vibration amount, and a displacement servo means 43 which generates a displacement suppressing force which is an electromagnetic force with respect to the movable body 2 based on the deviation of the light detection signal. With respect to the distance L between the light receiving surfaces of the photoelectric conversion elements 6A and 6B, the diameter D of the irradiation light beam LA12 is selected to a value that satisfies the relationship of L = 0.8D.
可動体2には第3の方向Zの方向に配設された支持体4
によつて第1の方向Xの方向に測定すべき振動量に応動
して変位するようになされ、当該可動体2の変位によつ
て光源5から射出される光源光LA11に基づいて一対の光
電変換素子6A、6B上に集光レンズ2Bによつて集束された
照射光束LA12の照射位置が第1の方向Xに沿うように変
位する。The movable body 2 has a support 4 arranged in the third direction Z.
According to the amount of vibration to be measured in the first direction X, the movable body 2 is displaced to generate a pair of photoelectric light based on the light source light LA11 emitted from the light source 5. The irradiation position of the irradiation light beam LA12 focused by the condenser lens 2B on the conversion elements 6A and 6B is displaced along the first direction X.
その結果一対の光電変換素子6A、6Bから高い精度の光検
出信号を得ることができ、その偏差に基づいて振動量検
出回路において振動測定出力を形成することができる。As a result, a highly accurate photodetection signal can be obtained from the pair of photoelectric conversion elements 6A and 6B, and a vibration measurement output can be formed in the vibration amount detection circuit based on the deviation.
このように構成することにより、全体として簡易な構成
で高性能の物理量測定装置を構成することができる。With such a configuration, it is possible to configure a high-performance physical quantity measuring device with a simple configuration as a whole.
以下図面について、本発明の一実施例を詳述する。An embodiment of the present invention will be described in detail with reference to the drawings.
〔1〕原理的構成 第1図は振動測定装置の光学的検出部1の原理的構成を
示すもので、可動体2がXYZ直交座標系によつて表され
る空間内を原点位置において矢印cで示すようにX軸方
向に振動できるように配設されている。[1] Principle Configuration FIG. 1 shows the principle configuration of the optical detection unit 1 of the vibration measuring device, in which the movable body 2 is located in the space represented by the XYZ orthogonal coordinate system at the origin position and is indicated by an arrow c. It is arranged so that it can vibrate in the X-axis direction.
可動体2は集光レンズ2Bを保持した鏡筒2Aを板ばねでな
る支持体4を介して固定部3から吊り下げられるように
支持されている。集光レンズ2Bは光軸L01がY軸方向に
一致するように配設され、支持体4は集光レンズ2Bの光
軸L01の方向を変更させずに可動体2をX軸に沿う方向
に変位させることができるようにZ軸方向に配設されて
いる。The movable body 2 is supported so that a lens barrel 2A holding a condenser lens 2B can be suspended from a fixed portion 3 via a support body 4 made of a leaf spring. The condenser lens 2B is arranged so that the optical axis L 01 coincides with the Y-axis direction, and the support 4 moves the movable body 2 along the X-axis without changing the direction of the optical axis L 01 of the condenser lens 2B. It is arranged in the Z-axis direction so that it can be displaced in any direction.
集光レンズ2Bの焦点位置には当該集光レンズ2Bを挟むよ
うに、半導体レーザでなる光源5及び一対の光電変換素
子としてフオトダイオード6A及び6Bを有する光電変換部
6が配設され、フオトダイオード6A及び6Bの光電変換出
力が光検出信号SDETとして振動量検出回路部7に送出さ
れ、その偏差に基づいて振動量測定出力SOUTを送出す
る。At the focal position of the condenser lens 2B, a light source 5 made of a semiconductor laser and a photoelectric conversion unit 6 having photodiodes 6A and 6B as a pair of photoelectric conversion elements are arranged so as to sandwich the condenser lens 2B. The photoelectric conversion outputs of 6A and 6B are sent to the vibration amount detection circuit unit 7 as a light detection signal S DET , and the vibration amount measurement output S OUT is sent based on the deviation.
ここで、光源5を構成する半導体レーザはLED発光領域
で発光駆動され(レーザ発振領域で駆動せずに)、これ
により微小点光源を形成するようになされている。Here, the semiconductor laser constituting the light source 5 is driven to emit light in the LED light emitting region (without being driven in the laser oscillation region), thereby forming a minute point light source.
フオトダイオード6A及び6BはX軸に沿う方向に互いに隣
接するように配設され、光源5から射出された光源光LA
11が集光レンズ2Bによつてフオトダイオード6A及び6Bの
境界位置に照射光束LA12として集束され、かくして光源
5の光像でなる光スポツトSPTが集光レンズ2B、従つて
可動体2のX軸方向への変位量に応じた変位量だけX軸
に沿う方向に変位するようになされている。The photodiodes 6A and 6B are arranged so as to be adjacent to each other in the direction along the X axis, and the light source light LA emitted from the light source 5 is emitted.
11 is focused by the condenser lens 2B as an irradiation light beam LA12 at the boundary position between the photodiodes 6A and 6B, and the optical spot SPT formed by the light image of the light source 5 is thus the condenser lens 2B, and hence the X axis of the movable body 2. It is configured to be displaced in the direction along the X axis by the displacement amount corresponding to the displacement amount in the direction.
かくして集光レンズ2Bが第2図において実線で示すよう
に、照射光束LA12によつてフオトダイオード6A及び6Bの
境界位置P1に光スポツトSPTを形成している状態から、
破線で示すようにX軸方向にδx0だけ変位したとき、集
光レンズ2Bから射出される照射光束LA12は境界位置P1に
あつた焦点が集光レンズ2Bの変位量δx0に相当する距離
δxだけX軸方向に変位した偏位位置P2に移動する。Thus, from the state in which the condenser lens 2B forms the optical spot SPT at the boundary position P 1 of the photodiodes 6A and 6B by the irradiation light beam LA12 as shown by the solid line in FIG.
When it is displaced by δx 0 in the X-axis direction as shown by the broken line, the irradiation light beam LA12 emitted from the condenser lens 2B has a focal point at the boundary position P 1 corresponding to the displacement amount δx 0 of the condenser lens 2B. It moves to the displacement position P 2 displaced by δx in the X-axis direction.
ところでこのときの変位量P2〜P1=δxは集光レンズ2
B、従つて可動体2の位置に依存し、第3図に示すよう
に幾何光学の原理に従つて次式 によつて求めることができる。(1)式においてaは光
源5から集光レンズ2Bまでの距離、bは集光レンズ2Bか
らフオトダイオード6A及び6Bの表面までの距離である。By the way, the displacement amounts P 2 to P 1 = δx at this time are
B. Therefore, depending on the position of the movable body 2, as shown in FIG. Can be obtained by In the equation (1), a is the distance from the light source 5 to the condenser lens 2B, and b is the distance from the condenser lens 2B to the surfaces of the photodiodes 6A and 6B.
ここで光源5及びフオトダイオード6A及び6Bは集光レン
ズ2Bの焦点位置に配設され、従つて、距離a及びbは a=b ……(2) のように互いに等しい値になり、この条件の下ではフオ
トダイオード6A及び6B上の変位量δxは δx=2δx0 ……(3) となる。Here, the light source 5 and the photodiodes 6A and 6B are arranged at the focal position of the condenser lens 2B, and accordingly, the distances a and b are equal to each other as a = b (2) Under, the displacement amount δx on the photodiodes 6A and 6B is δx = 2δx 0 (3).
従つて第1図の構成によれば、第20図について上述した
ように、検出感度が劣化するような問題を生じさせるお
それなく、高い検出感度で変位量の検出をなし得る。Therefore, according to the configuration of FIG. 1, as described above with reference to FIG. 20, it is possible to detect the displacement amount with high detection sensitivity without the possibility of causing a problem that the detection sensitivity deteriorates.
〔2〕変位量検出特性の直線性の改善 ところで実装される一対のフオトダイオード6A及び6B間
の境界位置には第4図に示すように、光電変換動作をし
ない間隔L(10〜100〔μm〕程度)の非光電変換領域
8が介在していると共に、 実際上光源5が有限の大きさをもちかつ集光レンズ2Bが
収差等の光学的特性をもつているためフオトダイオード
6A及び6B上に結像される光スポツトSPTが所定のスポツ
ト径Dをもち、この光スポツトSPTのスポツト径Dと非
光電変換領域8の間隔Lとの間の相対的な大小関係によ
つてフオトダイオード6A及び6Bから得られる光電変換出
力が決まることになる。[2] Improvement of linearity of displacement amount detection characteristics At the boundary position between a pair of photodiodes 6A and 6B mounted by the way, as shown in FIG. 4, an interval L (10 to 100 [μm ], The non-photoelectric conversion region 8 is interposed, the light source 5 actually has a finite size, and the condenser lens 2B has optical characteristics such as aberration.
The light spot SPT imaged on 6A and 6B has a predetermined spot diameter D, and the relative size relation between the spot diameter D of this light spot SPT and the interval L of the non-photoelectric conversion region 8 is used. The photoelectric conversion output obtained from the photo diodes 6A and 6B is determined.
すなわち光スポツトSPTが第4図に示すように、非光電
変換領域8の中心位置に中心をもつような基準位置にあ
る状態から集光レンズ2Bが変位したことにより第5図に
示すように距離δxだけフオトダイオード6A側に移動し
たとき、フオトダイオード6A及び6Bが受ける照射光束LA
12の光量の変化は、光スポツトSPTがフオトダイオード6
A及び6B上に重なつている面積の増減率に比例する。That is, as shown in FIG. 4, the optical spot SPT is displaced from the state in which the condenser lens 2B is located at the reference position having the center at the center position of the non-photoelectric conversion region 8 and the distance as shown in FIG. Irradiation luminous flux LA received by the photodiodes 6A and 6B when moved to the photodiode 6A side by δx
The change of the light intensity of 12 is the light spot SPT photo diode 6
Proportional to the rate of increase or decrease of the overlapping area on A and 6B.
すなわち第6図に示すように、光スポツトSPTが実線図
示の位置から変位量δxだけX軸に沿う方向にフオトダ
イオード6B側へ変位したとき、フオトダイオード6Bで受
ける光量変化率dEB/d(δx)は になる。また他方のフオトダイオード6Aにおいて生ずる
光量変化率dEA/d(δx)は のように求めることができる。That is, as shown in FIG. 6, when the light spot SPT is displaced toward the photodiode 6B side in the direction along the X-axis from the position shown by the solid line in the direction along the X axis, the light amount change rate dE B / d ( δx) is become. In addition, the light quantity change rate dE A / d (δx) generated in the other photodiode 6A is Can be asked for.
そこで(4)式及び(5)式によつて表される光量変化
率dE/d(δx)を第7図(A)に示すように変位量δx
を横軸にとつて曲線図として表せば、基準位置(すなわ
ちδx=0の位置)から光スポツトSPTがフオトダイオ
ード6B(又は6A)方向に変位したときフオトダイオード
6B及び6Aに生ずる光電変換出力の相対的変化を読み取る
ことができる。Therefore, the light amount change rate dE / d (δx) expressed by the equations (4) and (5) is calculated as shown in FIG.
If is plotted as a curve along the horizontal axis, the photo diode SPT is displaced from the reference position (ie, the position of δx = 0) in the direction of the photo diode 6B (or 6A).
It is possible to read the relative change in photoelectric conversion output generated in 6B and 6A.
第7図(A)においてフオトダイオード6Bの光量変化率
dEB/d(δx)は、光スポツトSPTの中心点CTの変位量δ
xが の範囲にあるとき、光スポツトSPTは非光電変換領域8
を照射する状態にあるので、(4)式で表されるように
半円を描くような変化を呈する。In FIG. 7 (A), the light amount change rate of the photodiode 6B
dE B / d (δx) is the displacement amount δ of the center point CT of the optical spot SPT
x is , The optical spot SPT is in the non-photoelectric conversion area 8
Since it is in the state of irradiating with, it exhibits a change like drawing a semicircle as represented by the equation (4).
これに対して変位量δxが の大きさになると、光スポツトSPTはフオトダイオード6
Bを照射できなくなるような位置にまでフオトダイオー
ド6Aの方向に位置ずれしたことを意味しており、このと
き光量変化率dEB/d(δx)は になる。On the other hand, the displacement amount δx is When the size of the optical spot SPT becomes 6
It means that the position is shifted in the direction of the photodiode 6A to a position where B cannot be irradiated, and at this time, the light quantity change rate dE B / d (δx) is become.
また光スポツトSPTの中心点CTが になるまで変位した場合には、光スポツトSPTが非光電
変換領域8を離れてフオトダイオード6B上を変位して行
く状態になり、このとき光量変化率dEB/(δx)は のように0になる。In addition, the center point CT of the optical spot SPT When the light spot SPT has been displaced until, the light spot SPT leaves the non-photoelectric conversion region 8 and is displaced on the photodiode 6B. At this time, the light quantity change rate dE B / (δx) is It becomes 0 like.
同様にしてフオトダイオード6Aに対する光量変化率dEA/
d(δx)を検討すれば、変位量δxが の範囲にあるときには、光スポツトSPTが非光電変換領
域8上を照射している状態にあるので、光量変化率dEA/
d(δx)は(5)式で表されるように半円を描くよう
に変化する。Similarly, the rate of change in the amount of light with respect to the photodiode 6A dE A /
Considering d (δx), the displacement amount δx is In the range of, since the light spot SPT is illuminating the non-photoelectric conversion area 8, the light quantity change rate dE A /
d (δx) changes so as to draw a semicircle as expressed by the equation (5).
また変位量δxが になると、光スポツトSPTが非光電変換領域8を照射し
ない位置までフオトダイオード6Aの方向に変位した状態
になり、このとき光量変化率dEA/d(δx)は になる。The displacement amount δx is Then, the optical spot SPT is displaced in the direction of the photodiode 6A to a position where the non-photoelectric conversion area 8 is not illuminated, and at this time, the light quantity change rate dE A / d (δx) is become.
また光スポツトSPTの変位量δxがフオトダイオード6B
の方向に の領域まで変位すると、光スポツトSPTはフオトダイオ
ード6Aを照射できない位置にまで変位した状態になり、
このとき光量変化率dEA/d(δx)は になる。Also, the displacement amount δx of the optical spot SPT is determined by the photo diode 6B.
In the direction of When it is displaced to the area of, the optical spot SPT is displaced to a position where the photodiode 6A cannot be irradiated,
At this time, the light quantity change rate dE A / d (δx) is become.
第7図(A)の結果から、変位量δxが の領域ARABにあるときには光スポツトSPTがフオトダイ
オード6A及び6Bの両方を照射している状態にあり、従つ
て光電変換素子6全体として見たときの光量変化率dE/d
(δx)の総合特性は第7図(B)に示すように、フオ
トダイオード6A及び6Bの光量変化率dEA/d(δx)及びd
EB/d(δx)の和として表すことかできる。From the result of FIG. 7 (A), the displacement amount δx is When it is in the area AR AB , the light spot SPT is illuminating both the photodiodes 6A and 6B, and therefore the light quantity change rate dE / d when viewed as the photoelectric conversion element 6 as a whole.
As shown in FIG. 7 (B), the total characteristic of (δx) is the light quantity change rate dE A / d (δx) and d of the photodiodes 6A and 6B.
It can be expressed as the sum of E B / d (δx).
これに対して変位量δxが の領域ARA及びARBに生ずる光量変化率dE/d(δx)はそ
れぞれフオトダイオード6A及び6Bだけに生ずる光量変化
率dEA/d(δx)及びdEB/d(δx)によつて表すことが
できる。On the other hand, the displacement amount δx is The light quantity change rates dE / d (δx) occurring in the areas A RA and AR B of are represented by the light quantity change rates dE A / d (δx) and dE B / d (δx) occurring only in the photodiodes 6A and 6B, respectively. be able to.
第7図(B)の関係から、フオトダイオード6A及び6Bに
おける検出特性としてできるだけ良好な直線性を実現す
るためには、第7図(B)に示す光量変化率の総合特性
〔dE/d(δx)〕SUM=dEA/d(δx)+dEB/d(δx)
が、変位量δxの実効的変位範囲において、実用上ほぼ
一定値を維持できるようにすることが望ましく、このよ
うな条件を満足させるためには非光電変換領域8の間隔
Lに対して光スポツトSPTの直径Dを必要に応じて最適
な値に選定すれば良い。From the relationship of FIG. 7 (B), in order to realize the linearity as good as the detection characteristics of the photodiodes 6A and 6B, the comprehensive characteristic of the light quantity change rate [dE / d ( δx)] SUM = dE A / d (δx) + dE B / d (δx)
However, it is desirable to maintain a practically constant value in the effective displacement range of the displacement amount δx. In order to satisfy such a condition, the optical spot with respect to the interval L between the non-photoelectric conversion regions 8 is required. The diameter D of the SPT may be selected as an optimum value as necessary.
因に非光電変換領域8の間隔L及び光スポツトSPTの直
径Dとの関係を L<D ……(19) に選定した条件の下に、第8図(A)に示すように直径
Dを間隔Lに近づけて行けば、第8図(B)に示すよう
にフオトダイオード6A及び6Bの光量変化率dEA/d(δ
x)及びdEB/d(δx)が重なり合う領域ARABが狭くな
り、その結果第8図(C)に示すように総合光量変化率
〔dE/d(δx)〕SUMにおいて領域ARABに相当する部分
の値が小さくなつて行くような傾向がある。Under the condition that the relation between the distance L between the non-photoelectric conversion regions 8 and the diameter D of the optical spot SPT is selected as L <D (19), the diameter D is changed as shown in FIG. 8 (A). If the distance L is approached, as shown in FIG. 8 (B), the light amount change rate dE A / d (δ of the photodiodes 6A and 6B is obtained.
x) and dE B / d (δx) overlap area AR AB becomes narrower, and as a result, as shown in FIG. 8 (C), it corresponds to area AR AB in the total light intensity change rate [dE / d (δx)] SUM . There is a tendency that the value of the part to do becomes smaller.
これに加えて第9図(A)に示すように直径Dを間隔L
とほぼ等しい値にまで小さくすると、光量変化率dE/d
(δx)は第9図(B)に示すようにフオトダイオード
6A及び6Bの光量変化率dEA/d(δx)及びdEB/d(δx)
が重なり合う領域ARABが消えて領域ARA及びARB直接隣接
するような光学的特性の状態が得られ、このときの総合
光量変化率〔dE/d(δx)〕SUMは第9図(C)に示す
ように光量変化率dE/d(δx)(第9図(B))と同じ
特性を呈する。In addition to this, as shown in FIG.
When the value is reduced to a value approximately equal to, the light intensity change rate dE / d
(Δx) is a photodiode as shown in FIG. 9 (B).
6A and 6B light intensity change rate dE A / d (δx) and dE B / d (δx)
A region where the overlapping areas AR AB disappear and the areas AR A and AR B are directly adjacent to each other is obtained, and the total light amount change rate [dE / d (δx)] SUM at this time is shown in FIG. ), The same characteristics as the light quantity change rate dE / d (δx) (FIG. 9 (B)) are exhibited.
さらに光スポツトSPTの直径Dを小さくして第10図
(A)に示すように直径Dを間隔Lより小さい値に選定
すると、光量変化率dE/d(δx)の特性は第10図(B)
に示すようにフオトダイオード6A及び6Bの光量変化率dE
A/d(δx)及びdEB/d(δx)の領域ARA及びARB間に光
量変化率dE/d(δx)が0の領域、すなわち不感帯領域
AR0が発生し、これが第10図(C)に示すように総合光
量変化率〔dE/d(δx)〕SUMに不感帯領域を生じさせ
る結果になる。When the diameter D of the light spot SPT is further reduced and the diameter D is selected to be smaller than the interval L as shown in FIG. 10 (A), the characteristic of the light quantity change rate dE / d (δx) is shown in FIG. 10 (B). )
As shown in, the light quantity change rate dE of the photodiodes 6A and 6B
A / d (δx) and dE B / d (δx) of the area AR A and AR B light amount change rate dE / d (δx) is zero between the regions, namely the dead zone
AR 0 is generated, which results in a dead zone in the total light intensity change rate [dE / d (δx)] SUM as shown in FIG. 10 (C).
第8図〜第10図の検討から、フオトダイオード6A及び6B
の光量変化率を実用上できるだけ平坦にするためには、
(19)式について上述したように直径Dを間隔Lより大
きい値に選定しかつ変位量δxがδx=0のとき光量変
化率dE/d(δx)を所定の値、すなわちフオトダイオー
ド6A及び6Bの光量変化率dEA/d(δx)及びdEB/d(δ
x)のほぼ60%程度の値にすれば実用上直線性が良い測
定結果が得られると考えられ、実験によりこれを確認し
得た。From the examination of FIGS. 8 to 10, the photodiodes 6A and 6B are shown.
In order to make the rate of change in
As described above with respect to the equation (19), when the diameter D is selected to be larger than the interval L and the displacement amount δx is δx = 0, the light amount change rate dE / d (δx) is a predetermined value, that is, the photodiodes 6A and 6B. Change rate of light dE A / d (δx) and dE B / d (δ
It is considered that a linearly good measurement result can be obtained practically when the value is set to about 60% of x), and this can be confirmed by an experiment.
因に変位量δxにおける光量変化率は(4)式及び
(5)式においてδx=0とおくと になるから、これに60%の条件を当てはめることにより
次式 の関係が成り立つ。If the light amount change rate at the displacement amount δx is set as δx = 0 in the equations (4) and (5), Therefore, by applying the condition of 60% to this, The relationship is established.
そこで(21)式を間隔Lについて解けば、 L=0.8D ……(22) のように、直径Dの0.8倍に間隔Lを選定すれば、第11
図(A)に示すように、フオトダイオード6A及び6Bの光
量変化率dEA/d(δx)及びdEB/d(δx)が重なり合わ
ない領域ARA及びARB間に不感帯領域AR0を発生させるこ
となく重複した領域ARABを形成し、第11図(B)に示す
ように当該重複領域ARABにおける総合光量変化率〔dE/d
(δx)〕SUMの値を他の領域ARA及びARBの値とほぼ同
程度の値を呈するような結果を得ることかでき、かくし
て変位量δxの有効領域において直線性が良好な検出光
学系を実現できる。Then, solving equation (21) for the interval L, L = 0.8D ... (22) If the interval L is selected to be 0.8 times the diameter D,
As shown in the figure (A), a dead zone area AR 0 is provided between areas AR A and AR B where the light quantity change rates dE A / d (δx) and dE B / d (δx) of the photodiodes 6A and 6B do not overlap. The overlapping area AR AB is formed without being generated, and the total light amount change rate [dE / d in the overlapping area AR AB is shown in FIG. 11 (B).
(Δx)] It is possible to obtain a result in which the value of SUM is approximately the same as the values of the other regions AR A and AR B , and thus, the detection optical with good linearity in the effective region of the displacement amount δx. A system can be realized.
なお実際上製造されている光電変換素子として、フオト
ダイオード6A及び6Bの間隔LがL=10〜100〔μm〕程
度のものが得られるので、光スポツトSPTの直径Dを13
〜130〔μm〕程度に照射光束LA12を集束できるような
光源5及び集光レンズ2Bを設けるようにする。As the photoelectric conversion element actually manufactured, the distance L between the photodiodes 6A and 6B is about L = 10 to 100 [μm], so that the diameter D of the optical spot SPT is 13
The light source 5 and the condenser lens 2B capable of focusing the irradiation light beam LA12 to about 130 [μm] are provided.
〔3〕振動測定装置の構成 第12及び第13図は本発明を加速度検出型の振動測定装置
を適用した場合の実施例を示すもので、第1図との対応
部分に同一符号を付して示すように、振動測定装置21は
第4図及び第5図について上述した動作原理に基づいて
ケース22に与えられる振動加速度に基づいて振動を検出
するようになされている。[3] Configuration of Vibration Measuring Device FIGS. 12 and 13 show an embodiment in the case where the acceleration detecting type vibration measuring device is applied to the present invention, and the same reference numerals are given to the portions corresponding to those in FIG. As shown, the vibration measuring device 21 detects the vibration based on the vibration acceleration given to the case 22 based on the operation principle described above with reference to FIGS. 4 and 5.
ケース22には、円板状ベース部の中央部に円柱状突出部
を形成してなる第1の磁気回路部材24が固定され、その
円板状ベース部に円環状リングでなる第2及び第3の磁
気回路部材25及び26を順次前方に積み重ねるように固着
し、磁気回路部材26の上部前面から前方に突出する一対
の取付部材27及び28によつて例えば板ばねでなる支持体
4を下方に垂下させるように片持ち保持している。The case 22 is fixed with a first magnetic circuit member 24 formed by forming a columnar protrusion in the central portion of the disc-shaped base portion, and the second magnetic disc member and the second magnetic circuit member 24 formed of an annular ring are attached to the disc-shaped base portion. The magnetic circuit members 25 and 26 of FIG. 3 are fixed so as to be sequentially stacked on top of each other, and the support member 4 made of, for example, a leaf spring is moved downward by a pair of mounting members 27 and 28 projecting forward from the upper front surface of the magnetic circuit member 26. It is held by a cantilever so that it hangs down.
支持体4の下端部には、円柱状ブロツク構成の可動体2
が取付部材31によつて取り付けられ、かくして可動体2
がケース22の振動に応じて矢印eで示す方向、すなわち
ケース2の中心軸CENTの方向に振動変位し得るようにな
されている。At the lower end of the support body 4, a movable body 2 having a cylindrical block structure is provided.
Is attached by the attachment member 31, and thus the movable body 2
According to the vibration of the case 22, the vibration can be displaced in the direction indicated by the arrow e, that is, in the direction of the central axis CENT of the case 2.
可動体2には中心軸CENTと直交するように断面円形の貫
通孔35が穿設され、貫通孔35の長さ方向のほぼ中央位置
(例えば中心軸CENTと交差する位置)に非球面レンズで
構成された集光レンズ2Bがその光軸L02を貫通孔35の中
心と一致させるように固着されている。A through hole 35 having a circular cross section is formed in the movable body 2 so as to be orthogonal to the central axis CENT, and an aspherical lens is formed at a substantially central position in the longitudinal direction of the through hole 35 (for example, a position intersecting the central axis CENT). The constructed condenser lens 2B is fixed so that its optical axis L 02 coincides with the center of the through hole 35.
第12図に示すように、貫通孔35の左側開口に対向するよ
うに、半導体レーザでなる光源5が取付部材38によつて
磁気回路部材26の正面側表面に取り付けられると共に、
貫通孔35の右側端面に対向するように一対のフオトダイ
オード6A及び6Bを有する光電変換部6が取付部材40によ
つて磁気回路部材26の正面側表面に固定されている。As shown in FIG. 12, the light source 5 made of a semiconductor laser is attached to the front surface of the magnetic circuit member 26 by the attaching member 38 so as to face the left side opening of the through hole 35, and
A photoelectric conversion unit 6 having a pair of photodiodes 6A and 6B is fixed to the front surface of the magnetic circuit member 26 by a mounting member 40 so as to face the right end surface of the through hole 35.
かくして光源5から射出された光源光LA21が集光レンズ
2Bによつて集光されて照射光束LA22として光電変換部6
の光電変換素子を構成するフオトダイオード6A及び6B上
に集束される。Thus, the light source light LA21 emitted from the light source 5 is a condenser lens.
The photoelectric conversion unit 6 is condensed by 2B and emitted as a luminous flux LA22.
It is focused on the photodiodes 6A and 6B constituting the photoelectric conversion element of.
可動体2の後方周面には、環状の電磁コイル42を固着し
てなる取付リング43が後方に延長するように固着され、
かくして電磁コイル42が第1の磁気回路部材24の中央突
出部及び第3の磁気回路部材26間のギヤツプ内に可動体
2の変位に応じて変位できるように設けられ、これによ
り電磁コイル42は励磁電流が流れたとき磁気回路部材2
4、25及び26でなる磁気回路に磁気結合することによ
り、可動体2の変位を抑制するような電磁力を発生する
ようになされている。An attachment ring 43 formed by fixing an annular electromagnetic coil 42 is fixed to the rear peripheral surface of the movable body 2 so as to extend rearward,
Thus, the electromagnetic coil 42 is provided in the gear gap between the central protrusion of the first magnetic circuit member 24 and the third magnetic circuit member 26 so as to be displaceable in accordance with the displacement of the movable body 2. Magnetic circuit member 2 when exciting current flows
By magnetically coupling to the magnetic circuit composed of 4, 25 and 26, an electromagnetic force for suppressing the displacement of the movable body 2 is generated.
この実施例の場合取付部材38及び40の前面にはスペーサ
51及び52を介して配線基板53が取り付けられ、当該配線
基板53に第14図に示す構成の振動量検出回路部7が設け
られている。In this embodiment, spacers are provided on the front surfaces of the mounting members 38 and 40.
The wiring board 53 is attached via 51 and 52, and the wiring board 53 is provided with the vibration amount detection circuit section 7 having the configuration shown in FIG.
振動量検出回路部7は光源5を駆動する光源駆動回路56
からコード57を介して光源5を構成する半導体レーザか
ら光源光LA21を射出させると共に、当該光源光LA21を集
光レンズ2Bによつて集光させることにより得られる照射
光束LA22を振動量検出回路部7の一部を構成するフオト
ダイオード6A及び6Bに、集束させる。The vibration amount detection circuit unit 7 includes a light source drive circuit 56 that drives the light source 5.
From the semiconductor laser constituting the light source 5 via the code 57 from the semiconductor laser, and the irradiation light flux LA22 obtained by condensing the light source light LA21 by the condenser lens 2B is detected by the vibration amount detection circuit section. The light is focused on the photodiodes 6A and 6B that form a part of 7.
ここでフオトダイオード6A及び6Bは例えばカソードを互
いに背中合わせに接続されると共に、フオトダイオード
6A及び6Bのカソード及びアノード間にそれぞれ側路用抵
抗61A及び61Bが接続されている。Here, the photodiodes 6A and 6B are connected, for example, with their cathodes back to back, and
By-pass resistors 61A and 61B are connected between the cathodes and anodes of 6A and 6B, respectively.
かくしてアノードをアースしてなる一方のフオトダイオ
ード6Aから光電変換出力として得られる光検出電流IAが
側路用抵抗61Bを通じて光検出回路59に引き出されると
共に、非アース側の他方のフオトダイオード6Bから得ら
れる。Thus, the photodetection current I A obtained as a photoelectric conversion output from the one photodiode 6A whose anode is grounded is drawn to the photodetection circuit 59 through the bypass resistor 61B, and also from the other non-earthed photodiode 6B. can get.
光検出電流IBが側路用抵抗61Aを通じてアースに引き出
されるようになされ、その結果演算増幅回路62の反転入
力端にフオトダイオード6A及び6Bの光検出電流IA及びIB
の差を表す検出電流IA−IBが光電変換出力として演算増
幅回路62の反転入力端に供給され、この演算増幅回路62
によつて増幅されて偏差検出信号S1として微分回路63に
供給される。The photodetection current I B is drawn to the ground through the bypass resistor 61A, and as a result, the photodetection currents I A and I B of the photodiodes 6A and 6B are connected to the inverting input terminal of the operational amplifier circuit 62.
The detection current I A −I B representing the difference between the operational amplifier circuit 62 and the inverting input terminal of the operational amplifier circuit 62 is supplied as a photoelectric conversion output.
And is supplied to the differentiating circuit 63 as the deviation detection signal S1.
かくして偏差検出信号S1はフオトダイオード6A及び6B上
に照射される照射光束LA22の変位位置、従つてケース22
に与えられる振動に応じて変化し、これが微分回路63に
おいて位相調整を受けた後出力電流IOUTとして電磁コイ
ル42及び出力抵抗64に供給される。Thus, the deviation detection signal S1 is the displacement position of the irradiation light beam LA22 irradiated on the photodiodes 6A and 6B, and hence the case 22.
Changes in accordance with the vibration applied to the electromagnetic coil 42 and is supplied to the electromagnetic coil 42 and the output resistor 64 as the output current I OUT after being subjected to the phase adjustment in the differentiating circuit 63.
ここで電磁コイル42は磁気回路部材24、25、26に磁気結
合されていることにより、出力電流IOUTの変化、従つて
可動体2の変位量に相当する電磁力を発生し、かくして
可動体2の変位を抑制するような変位サーボループを形
成する。Here, the electromagnetic coil 42 is magnetically coupled to the magnetic circuit members 24, 25, and 26, so that the electromagnetic current corresponding to the change in the output current I OUT and the displacement amount of the movable body 2 is generated. A displacement servo loop that suppresses the displacement of 2 is formed.
これと共に出力電流IOUTが出力抵抗64を流れることによ
り、その降下電圧が振動検出出力SOUTとして振動量検出
回路7から送出される。At the same time, the output current I OUT flows through the output resistor 64, and the dropped voltage is sent from the vibration amount detection circuit 7 as the vibration detection output S OUT .
以上の構成によれば、可動体2はケース22の振動に応じ
て変位したとき、その変位量が光電変換素子を構成する
フオトダイオード6A及び6Bに対する照射光束LA22の照射
位置の変位として光検出回路59において検出されて電磁
コイル42を含んで構成されるサーボループを介して可動
体2を微少変位に抑制することにより、実用上可動体2
を直線性が良好な可動範囲、すなわち第11図について上
述したように、フオトダイオード6A及び6Bに対する総合
光量変化率〔dE/d(δx)〕SUMの直線性が良好な範囲
(すなわち変位量δx=0近傍の範囲)において可動体
2の変位を高い精度で検出することができる。According to the above configuration, when the movable body 2 is displaced according to the vibration of the case 22, the displacement amount is the displacement of the irradiation position of the irradiation light beam LA22 with respect to the photodiodes 6A and 6B forming the photoelectric conversion element, and the light detection circuit. By suppressing the movable body 2 to a minute displacement through the servo loop which is detected at 59 and includes the electromagnetic coil 42, the movable body 2 is practically used.
Is a movable range with good linearity, that is, as described above with reference to FIG. 11, the total light amount change rate [dE / d (δx)] SUM with respect to the photodiodes 6A and 6B is in a range with good linearity (ie, the displacement amount δx The displacement of the movable body 2 can be detected with high accuracy in the range of = 0).
かくするにつき第14図の構成によれば、フオトダイオー
ド6A及び6Bを背中合わせに接続すると共に、各フオトダ
イオード6A及び6Bに並列に側路用抵抗61A及び61Bを接続
するようにしたことにより、一対のフオトダイオード6A
及び6Bを実用上十分に大きなレベル検出として得ること
ができる。Thus, according to the configuration of FIG. 14, the photodiodes 6A and 6B are connected back-to-back, and the photodiodes 6A and 6B are connected in parallel to the bypass resistors 61A and 61B. Photodiode 6A
And 6B can be obtained as a level detection that is large enough for practical use.
因に照射光束LA22を受ける一対のフオトダイオード6A及
び6Bを同一平面上に形成する場合、背中合わせの接続構
造にすれば、フオトダイオード6A及び6Bの製造工程を一
段と簡易化し得ると共に、フオトダイオード6A及び6Bに
共通に1つの端子を導出するだけですむので、全体とし
ての構成を簡易化し得る。When forming a pair of photodiodes 6A and 6B on the same plane to receive the irradiation light flux LA22, if the back-to-back connection structure, it is possible to further simplify the manufacturing process of the photodiodes 6A and 6B, and the photodiode 6A and. Since only one terminal is required to be commonly used for 6B, the overall configuration can be simplified.
またフオトダイオード6A及び6Bの抵抗値は通常は数〔M
Ω〕程度の高い抵抗値をもつのに対して、側路用抵抗61
A及び61Bを設けたことにより、フオトダイオード6A及び
6Bから送出される光電変換電流を側路用抵抗61A及び61B
を介して効率良く取り出すことができる。The resistance value of the photodiodes 6A and 6B is usually several [M
Ω], the resistance value is 61
By providing A and 61B, the photodiode 6A and
The photoelectric conversion current sent from 6B is used as a bypass resistor 61A and 61B.
Can be taken out efficiently via.
さらに第14図の構成において光源駆動回路56は、レーザ
ダイオードでなる光源5を駆動するにつき、第15図に示
すように、駆動電流IをLED発光領域EMLEDとレーザ発振
領域EMLSRとの境界値ITMより小さい電流に抑制すること
により、レーザダイオードLETとして発光させるように
なされ、これにより実質上光源5の光源光LA21を低出力
の点光源から射出できるようにし得る。Further, in the configuration of FIG. 14, the light source drive circuit 56 drives the light source 5 which is a laser diode, and as shown in FIG. 15, the drive current I is changed to the boundary between the LED emission region EM LED and the laser oscillation region EM LSR. By suppressing the current to be smaller than the value I TM , the laser diode LET is caused to emit light, which makes it possible to substantially emit the light source light LA21 of the light source 5 from the low-power point light source.
その結果フオトダイオード6A及び6B上に照射光束LA12を
照射する際に、照射光束LA12の光スポツトSPTの直径D
を実用上十分に小さい直径にまで絞り込むことができ、
これにより照射光束LA22の光電変換部6上に変位量を一
段と高い精度かつ高率で安定に検出できる。As a result, when irradiating the light beam LA12 on the photodiodes 6A and 6B, the diameter D of the light spot SPT of the light beam LA12 is irradiated.
Can be narrowed down to a diameter small enough for practical use,
As a result, the amount of displacement of the irradiation light beam LA22 on the photoelectric conversion unit 6 can be detected more highly accurately and stably.
因に光源5として半導体レーザを用いた場合、当該半導
体レーザをレーザ発振領域EMLSRで発振駆動すると、光
源光LA11及び照射光束LA12のコヒーレンシがよくなるた
め、例えば光源5及びフオトダイオード6A及び6Bの窓部
のガラス体や、集光レンズ2Bにおいて干渉による光変動
が生ずることを避け得ない。When a semiconductor laser is used as the light source 5, when the semiconductor laser is driven to oscillate in the laser oscillation region EM LSR , the coherency of the light source light LA11 and the irradiation light beam LA12 is improved, and thus the light source 5 and the windows of the photodiodes 6A and 6B are used. It is unavoidable that light fluctuations due to interference occur in the glass body of the portion and the condenser lens 2B.
また光源5を光電流で駆動するため光源5の発熱量が大
きくなるために振動測定装置21全体に熱膨張の影響を生
じさせることを避け得ない。Further, since the light source 5 is driven by the photocurrent, the amount of heat generated by the light source 5 is large, so that it is inevitable that the vibration measuring device 21 as a whole is affected by thermal expansion.
この点について上述のように光源5を低い駆動電流のLE
D発光領域EMLEDで駆動するようにすれば、かかる問題を
有効に回避し得る。Regarding this point, as described above, the light source 5 is driven by LE having a low drive current.
By driving with the D emission region EM LED , such a problem can be effectively avoided.
例えば0.75〔μm〕の波長の射出光束を発振する半導体
レーザを用いた場合、数〔mA〕程度の駆動電流を供給す
れば良く、これにより熱の発生及び光干渉により生ずる
おそれがある雑音を有効に抑制することができる。For example, when a semiconductor laser that oscillates an emitted light beam with a wavelength of 0.75 [μm] is used, it is sufficient to supply a driving current of about several [mA], which effectively produces noise that may occur due to heat generation and optical interference. Can be suppressed.
さらに上述の構成によれば集光レンズ2Bを非球面レンズ
で構成したことにより、照射光束LA12として直径が小さ
い光スポツトを効率よく収束させることができ、その結
果照射光束LA12の変位量の検出精度を一段と高めること
ができる。Further, according to the above configuration, by forming the condenser lens 2B by an aspherical lens, it is possible to efficiently converge an optical spot having a small diameter as the irradiation light beam LA12, and as a result, the detection accuracy of the displacement amount of the irradiation light beam LA12. Can be further increased.
因に非球面レンズに代えて一般的なコンデンサレンズを
用いた場合には形状及び厚さが大型になるため収差が大
きくかつ重量バランスが変化する(感振方向以外の方向
についても感度をもつ)が、上述の実施例によればこの
問題を有効に解決し得る。If a general condenser lens is used instead of an aspherical lens, the shape and thickness will be large, so the aberration will be large and the weight balance will change (it has sensitivity in directions other than the vibration direction). However, the above-described embodiment can effectively solve this problem.
〔4〕他の実施例 (1) 第14図の場合には光電変換部6の光電変換素子
として互いに背中合わせに接続された一対のフオトダイ
オード6A及び6Bを用いた場合について述べたが、フオト
ダイオード6A及び6Bのアノード及びカソードを両方共に
外部に導出し得るような構成のものを適用する場合に
は、第16図に示すように、一対のフオトダイオード6A及
び6Bの光電変換電流をそれぞれ前置増幅回路71A及び71B
を構成する演算増幅回路71A1及び71B1に入力し、その出
力を減算回路72を構成する演算増幅回路72Aに供給し、
当該演算増幅回路72Aの出力端に偏差検出信号S1を得る
ように構成しても良い。[4] Other Embodiments (1) The case of using a pair of photodiodes 6A and 6B connected back-to-back as photoelectric conversion elements of the photoelectric conversion section 6 has been described in the case of FIG. When applying a structure in which both the anode and cathode of 6A and 6B can be led to the outside, as shown in FIG. 16, the photoelectric conversion currents of the pair of photodiodes 6A and 6B are respectively placed in front. Amplifier circuits 71A and 71B
Is input to the operational amplifier circuits 71A1 and 71B1 that configure the above, and the output is supplied to the operational amplifier circuit 72A that configures the subtraction circuit 72,
The deviation detection signal S1 may be obtained at the output end of the operational amplifier circuit 72A.
第16図の構成によれば、第14図の場合の構成の簡易化の
効果を得ることはできないが、これに代え引算演算精度
を一段と高めることができる。According to the configuration of FIG. 16, the effect of simplifying the configuration in the case of FIG. 14 cannot be obtained, but in place of this, the precision of subtraction calculation can be further improved.
(2) 第16図について上述したと同様にして、光電変
換部6の光電変換素子を構成するとしてフオトダイオー
ド6A及び6Bからそれぞれアノード及びカソードを導出し
得るような構成のものを用いる場合には、第17図に示す
ように、フオトダイオード6Aのアノード及びカソードに
並列にフオトダイオード6Bのカソード及びアノードを接
続して当該接続端から光電変換電流を得て前置増幅回路
75を構成する演算増幅回路75Aに入力するようにし、演
算増幅回路75Aの出力を偏差検出信号S1として送出する
構成の光検出回路59を用いるようにしても良い。(2) In the same manner as described above with reference to FIG. 16, when the photoelectric conversion element of the photoelectric conversion unit 6 is configured so that the anode and the cathode can be derived from the photodiodes 6A and 6B, respectively, As shown in FIG. 17, the cathode and the anode of the photodiode 6B are connected in parallel to the anode and the cathode of the photodiode 6A to obtain a photoelectric conversion current from the connection end to obtain a preamplification circuit.
It is also possible to use the photodetector circuit 59 configured so as to be input to the operational amplifier circuit 75A that constitutes 75 and to output the output of the operational amplifier circuit 75A as the deviation detection signal S1.
第17図の構成において、フオトダイオード6A及び6Bから
それぞれ得られる光電変換電流は、逆方向の電流として
前置増幅回路75Aに流れ込むことにより、演算増幅回路7
5Aにフオトダイオード6A及び6Bの検出出力の差を表す偏
差信号を入力したと等価な機能を実現し得、その結果偏
差検出信号S1を得るにつき、光検出回路59を簡易な構成
によつて実現し得る。In the configuration of FIG. 17, the photoelectric conversion currents obtained from the photodiodes 6A and 6B respectively flow into the preamplifier circuit 75A as currents in the opposite direction, so that the operational amplifier circuit 7A
A function equivalent to inputting a deviation signal indicating the difference between the detection outputs of the photodiodes 6A and 6B to 5A can be realized, and as a result, the deviation detection signal S1 is obtained, and the light detection circuit 59 is realized by a simple configuration. You can
因にフオトダイオード6A及び6Bはそれぞれ高インピーダ
ンス(数〔MΩ〕程度)を有するのに対して、演算増幅
回路75Aの入力インピーダンスは実用上ほぼ0〔Ω〕と
考えてよいので、フオトダイオード6A及び6Bを演算増幅
回路75Aに直結しても実用上相互に悪影響を及ぼし合う
おそれを有効に回避し得、これにより前置増幅回路75と
の間に何ら入力回路を設けることなくフオトダイオード
を直結できる分、簡易な構成を実現し得る。Incidentally, the photodiodes 6A and 6B each have a high impedance (about several [MΩ]), whereas the input impedance of the operational amplifier circuit 75A can be considered to be practically 0 [Ω]. Even if 6B is directly connected to the operational amplifier circuit 75A, it is possible to effectively avoid the possibility that they will adversely affect each other in practical use, so that the photodiode can be directly connected to the preamplifier circuit 75 without providing any input circuit. Therefore, a simple configuration can be realized.
(3) 上述の実施例においては、集光レンズ2Bとして
非球面レンズを用いるようにしたがこれに代え、ロツト
レンズを適用しても良い。(3) In the above-mentioned embodiments, the aspherical lens is used as the condenser lens 2B, but instead of this, a rod lens may be applied.
ここでロツトレンズは円柱形状を有し、その中心軸を光
軸とし、かつ当該光軸と直交する断面において中心に行
くに従つて屈折率が大きくなつて行く屈折率分布をもた
せるようにした光学的構成を有する。Here, the rod lens has a cylindrical shape, an optical axis of which is the central axis, and an optical index distribution in which the refractive index increases toward the center in a cross section orthogonal to the optical axis. Have a configuration.
このように構成すれば、照射光束LA12として実用上十分
に小さな光スポツト径に収束させるにつき、十分に長い
光軸に沿つて生ずる屈折作用によつて実用上十分に大き
な収束効果を得ることができ、従つてロツトレンズの直
径を十分に小さな値に選定し得る。According to this structure, when the irradiation light beam LA12 is converged to a sufficiently small optical spot diameter for practical use, it is possible to obtain a practically sufficiently large converging effect by the refraction action occurring along the sufficiently long optical axis. Therefore, the diameter of the rod lens can be selected to be a sufficiently small value.
かくして実用上可動体2の振動方向の厚みを十分に薄く
できることにより、この分可動体2の振動特性上、バラ
ンス及び感度特性を一段と改善できる。Thus, the thickness of the movable body 2 in the vibration direction can be made sufficiently thin for practical use, and thus the balance and sensitivity characteristics of the movable body 2 can be further improved.
(4) 第12図及び第13図の構成においては、可動体2
の変位を抑制する変位サーボ手段として、可動体2側に
電磁コイル42を設けるようにしたが、変位サーボ手段と
してはこれに限らず例えば固定部側に電磁力発生手段を
設けるなど、要は可動体2に対してその変位を抑制する
ような抑制力を電磁力によつて得るように構成すればよ
い。(4) In the configuration of FIG. 12 and FIG.
Although the electromagnetic coil 42 is provided on the movable body 2 side as the displacement servo means for suppressing the displacement of the above, the displacement servo means is not limited to this. For example, an electromagnetic force generating means may be provided on the fixed part side. The electromagnetic force may be used to obtain a suppressing force that suppresses the displacement of the body 2.
(5) 第14図に示す構成の場合、一対のフオトダイオ
ード6A及び6Bをカソードを互いに背中合せ接続するよう
にした場合について述べたが、これに代えアノードを互
いに背中合せ接続するように構成しても上述の場合と同
様の効果を得ることができる。(5) In the case of the configuration shown in FIG. 14, the case where the pair of photodiodes 6A and 6B are connected to each other with their cathodes back to back has been described. Alternatively, however, the anodes may be connected to each other back to back. The same effect as the above case can be obtained.
(6) 第17図の構成の場合、一対のフオトダイオード
6A及び6Bを並列に接続するにつき、一方のフオトダイオ
ード6Aのカソードを他方のフオトダイオード6Bのアノー
ドに接続するようにしたが、これとは逆に一方のフオト
ダイオード6Aのアノードを他方のフオトダイオード6Bの
カソードに接続するようにしても上述の場合と同様の効
果を得ることができる。(6) In the case of the configuration of FIG. 17, a pair of photodiodes
When connecting 6A and 6B in parallel, the cathode of one photodiode 6A was connected to the anode of the other photodiode 6B.On the contrary, the anode of one photodiode 6A was connected to the other photodiode 6A. Even if it is connected to the cathode of 6B, the same effect as the above case can be obtained.
上述のように本発明によれば、測定すべき振動量によつ
て変位される可動体が保持する集光レンズを介して、光
電変換素子上に収束した照射光束の光スポツトを変位さ
せるように構成したことにより、実用上全体として簡易
な構成によつて一段と性能よく振動量の測定をなし得る
振動測定装置を容易に実現し得る。As described above, according to the present invention, the light spot of the irradiation light flux converged on the photoelectric conversion element is displaced through the condenser lens held by the movable body which is displaced by the vibration amount to be measured. By virtue of the configuration, it is possible to easily realize a vibration measuring device capable of measuring the vibration amount with higher performance with a simple structure as a whole in practical use.
第1図は本発明による振動測定装置の光学的検出部の原
理的構成を示す略線的斜視図、第2図及び第3図はその
光学的検出動作の説明に供する光学的光路を示す略線
図、第4図ないし第11図は光電変換部上に収束される照
射光束とフオトダイオードとの間の最適条件の説明に供
する略線図及び特性曲線図、第12図は本発明の振動測定
装置の実施例を示す横断面図、第13図は第12図のXIII−
XIII線上にとつて示す縦断面図、第14図は振動量検出回
路部を示すブロツク図、第15図は光源の発光条件の説明
に供する特性曲線図、第16図及び第17図は光検出回路の
他の実施例を示す接続図、第18図ないし第20図は従来の
構成を示す斜視図、断面図、光路略線図である。 1……光学的検出部、2……可動体、2A……鏡筒、2B…
…集光レンズ、5……光源、6……光電変換部、6A、6B
……フオトダイオード、7……振動量検出回路部、21…
…振動測定装置、22……ケース、24〜26……磁気回路
部、42……電磁コイル、56……光源駆動回路、59……光
検出回路、。FIG. 1 is a schematic perspective view showing a principle structure of an optical detecting portion of a vibration measuring device according to the present invention, and FIGS. 2 and 3 are schematic optical paths for explaining the optical detecting operation. 4 to 11 are schematic diagrams and characteristic curve diagrams for explaining the optimum conditions between the irradiation light flux converged on the photoelectric conversion portion and the photodiode, and FIG. 12 is the vibration of the present invention. A cross-sectional view showing an embodiment of the measuring device, FIG. 13 is XIII- of FIG.
FIG. 14 is a block diagram showing the vibration amount detection circuit section, FIG. 15 is a characteristic curve diagram used for explaining the light emission conditions of the light source, and FIGS. 16 and 17 are light detection lines. FIG. 18 is a connection diagram showing another embodiment of the circuit, and FIG. 18 to FIG. 20 are a perspective view, a cross-sectional view, and an optical path schematic diagram showing a conventional configuration. 1 ... Optical detector, 2 ... Movable body, 2A ... Lens barrel, 2B ...
… Condenser lens, 5 …… Light source, 6 …… Photoelectric converter, 6A, 6B
…… Photodiode, 7 …… Vibration amount detection circuit, 21…
… Vibration measuring device, 22 …… Case, 24-26 …… Magnetic circuit part, 42 …… Electromagnetic coil, 56 …… Light source drive circuit, 59 …… Light detection circuit ,.
Claims (5)
変位するようになされ、上記第1の方向と直交する第2
の方向に光軸を有する集光レンズを保持する可動体と、 上記第1及び第2の方向と直交する第3の方向に延長す
るように配設され、上記可動体を上記第1の方向に変位
できるように弾性的に支持する支持体と、 上記集光レンズの光軸上に当該集光レンズと対向するよ
うに配設された光源と、 一対の光電変換素子を有し、上記光源から射出される光
源光を上記集光レンズによつて集束することによつて得
られる照射光束を上記一対の光電変換素子に受光し、上
記照射光束が上記可動体の変位に応じて照射位置を変位
させたとき上記一対の光電変換素子から当該変位量に相
当する光検出信号を送出する光電変換部と、 上記光電変換部から送出される光検出信号の偏差に基づ
いて振動量測定出力を送出する振動量検出回路部と 上記光検出信号の偏差に基づいて上記可動体に対して電
磁力でなる変位抑制力を発生する変位サーボ手段と を具え、 上記一対の光電変換素子の受光面間の間隔Lに対して、
上記照射光束の直径Dを、ほぼ L=0.8D の関係を満足する値に選定することを特徴とする振動測
定装置。1. A second device which is adapted to be displaced in a first direction in response to a vibration amount to be measured and which is orthogonal to the first direction.
And a movable body that holds a condenser lens having an optical axis in the first direction, and a movable body that is disposed so as to extend in a third direction orthogonal to the first and second directions. A support body that elastically supports the condenser lens so that it can be displaced, a light source disposed on the optical axis of the condenser lens so as to face the condenser lens, and a pair of photoelectric conversion elements. The irradiation light flux obtained by focusing the light source light emitted from the condenser lens by the condenser lens is received by the pair of photoelectric conversion elements, and the irradiation light flux changes the irradiation position according to the displacement of the movable body. When the displacement is made, the pair of photoelectric conversion elements transmits a photodetection signal corresponding to the displacement amount, and a vibration amount measurement output is transmitted based on the deviation of the photodetection signal transmitted from the photoelectric conversion unit. Of the vibration amount detection circuit and the light detection signal Comprising a displacement servo means for generating a displacement restraining force consisting of an electromagnetic force to the movable body based on the difference, with respect to the spacing L between the light-receiving surface of the pair of photoelectric conversion elements,
A vibration measuring device, characterized in that the diameter D of the irradiation luminous flux is selected to a value that satisfies a relationship of approximately L = 0.8D.
ることを特徴とする特許請求の範囲第1項に記載の振動
測定装置。2. The vibration measuring device according to claim 1, wherein the condenser lens is an aspherical lens.
つ当該円柱状形状の中心軸と直交する断面において中心
に行くに従つて屈折率分布をもつロツドレンズで構成さ
れていることを特徴とする特許請求の範囲第1項に記載
の振動測定装置。3. The condensing lens is a rod lens having a cylindrical shape and having a refractive index distribution toward the center in a cross section orthogonal to the central axis of the cylindrical shape. The vibration measuring device according to claim 1, which is characterized.
ド又はアノードを互いに背中合せに接続してなるフオト
ダイオードで構成され、上記振動量検出回路部は、上記
第1及び第2の光電変換素子にそれぞれ並列に第1及び
第2の側路用抵抗を接続することにより上記第1及び第
2の側路用抵抗を通じて上記第1及び第2の光電変換素
子から得られる光電変換出力の差出力を得、上記差出力
を演算増幅回路を介して偏差検出信号として送出するこ
とを特徴とする特許請求の範囲第1項、第2項又は第3
項に記載の振動測定装置。4. The first and second photoelectric conversion elements are composed of photodiodes in which cathodes or anodes are connected back-to-back with each other, and the vibration amount detection circuit section includes the first and second photoelectric conversion elements. A difference in photoelectric conversion output obtained from the first and second photoelectric conversion elements through the first and second bypass resistors by connecting the first and second bypass resistors in parallel to the device, respectively. An output is obtained, and the difference output is sent as a deviation detection signal through an operational amplifier circuit. Claims 1, 2, or 3
The vibration measuring device according to the item.
れフオトダイオードで構成され、上記振動量検出回路部
は、上記第1の光電変換素子のアノード及びカソードを
上記第2の光電変換素子のカソード及びアノードに互い
に並列に接続することにより当該接続点を通じて上記第
1及び第2の光電変換素子から得られる光電変換出力の
差出力を得、上記差出力を演算増幅回路を介して偏差検
出信号として送出することを特徴とする特許請求の範囲
第1項、第2項、又は第3項に記載の振動測定装置。5. The first and second photoelectric conversion elements are each formed of a photodiode, and the vibration amount detection circuit section uses the anode and cathode of the first photoelectric conversion element as the second photoelectric conversion element. Of the photoelectric conversion outputs obtained from the first and second photoelectric conversion elements through the connection point by connecting the cathode and the anode of the parallel connection to each other, and the difference output is detected through the operational amplifier circuit. The vibration measuring device according to claim 1, 2, or 3, which is transmitted as a signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1072831A JPH0692980B2 (en) | 1989-03-24 | 1989-03-24 | Vibration measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1072831A JPH0692980B2 (en) | 1989-03-24 | 1989-03-24 | Vibration measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02249974A JPH02249974A (en) | 1990-10-05 |
| JPH0692980B2 true JPH0692980B2 (en) | 1994-11-16 |
Family
ID=13500756
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1072831A Expired - Lifetime JPH0692980B2 (en) | 1989-03-24 | 1989-03-24 | Vibration measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0692980B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05215764A (en) * | 1992-01-31 | 1993-08-24 | Canon Inc | Optical accelerometer and optical angular accelerometer |
| WO2020158677A1 (en) * | 2019-01-31 | 2020-08-06 | 株式会社メトロール | Position detection device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0664084B2 (en) * | 1985-04-16 | 1994-08-22 | シュルンベルジェ オーバーシーズ エス.エイ. | Light shock absorber |
| JPS6247969U (en) * | 1985-09-11 | 1987-03-24 | ||
| JPS63167276A (en) * | 1986-12-27 | 1988-07-11 | Jeco Co Ltd | Servo type accelerometer |
-
1989
- 1989-03-24 JP JP1072831A patent/JPH0692980B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02249974A (en) | 1990-10-05 |
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