JPH0695076B2 - Steel plate surface flaw inspection method by neural network - Google Patents
Steel plate surface flaw inspection method by neural networkInfo
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- JPH0695076B2 JPH0695076B2 JP28436189A JP28436189A JPH0695076B2 JP H0695076 B2 JPH0695076 B2 JP H0695076B2 JP 28436189 A JP28436189 A JP 28436189A JP 28436189 A JP28436189 A JP 28436189A JP H0695076 B2 JPH0695076 B2 JP H0695076B2
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Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、反射光波形による、神経回路網を用いた鋼板
の表面疵検査方法に関する。TECHNICAL FIELD The present invention relates to a method for inspecting a surface flaw of a steel sheet using a neural network by a reflected light waveform.
鋼板の表面疵の検査には、反射光による方法が広く用い
られている。レーザ光を鋼板表面に投射し、反射光を光
電変換し、その変換出力(電圧波形)またはその微分出
力を閾値と比較し、閾値以上なら疵とする、は代表的な
方法である。A method using reflected light is widely used for inspecting the surface defects of the steel sheet. A typical method is to project a laser beam onto the surface of a steel sheet, photoelectrically convert the reflected light, compare the converted output (voltage waveform) or its differential output with a threshold value, and if there is a threshold value or more, detect a flaw.
閾値以外のものを用いる方法としては特開昭62−278403
がある。これは鋼板表面にレーザ光を投射し、反射光を
光電変換し、その平均電圧から表面粗度を求める。粗度
が高いと反射光は散乱光となり、光電変換出力は下るか
ら、予め粗度と光電変換出力との関係を求めておくと、
この関係より、光電変換出力で粗度を知ることができ
る。As a method of using something other than the threshold value, there is disclosed in JP-A-62-278403.
There is. In this method, laser light is projected onto the surface of the steel sheet, the reflected light is photoelectrically converted, and the surface roughness is obtained from the average voltage. If the roughness is high, the reflected light becomes scattered light, and the photoelectric conversion output decreases, so if the relationship between the roughness and the photoelectric conversion output is obtained in advance,
From this relationship, the roughness can be known from the photoelectric conversion output.
また特開昭62−235511は被検査体にレーザ光を投射し、
表面状態が異常な所(表面欠陥や凹凸のある所)では反
射光の入射点が正常時よりΔXだけずれるのを利用し
て、該表面状態を検出する。Further, Japanese Patent Laid-Open No. 62-235511 projects a laser beam on an object to be inspected,
The surface state is detected by utilizing the fact that the incident point of the reflected light deviates from the normal state by ΔX in the place where the surface state is abnormal (where there is a surface defect or unevenness).
従来の鋼板表面疵の検査では、反射光の光電変換出力を
閾値で判別して疵あり/なしとするのが一般的であり、
この方法では絶対的な反射光強度による疵判定であるか
ら、鋼種間の反射程度の差異や地合の影響が考慮されな
い。閾値は、これを低く設定すると疵ではないが反射が
やゝ異常な部分を疵と誤検出し(過検出)、またこれを
高く設定すると疵であるのにこれを疵として検出しない
ケース(見逃し)が増加する。従って閾値は適切な値に
設定する必要があるが、鋼種や地合などによって変わる
から、適切な値の選定、調整が困難で、この方式では判
定精度に難がある。また、検出すべき疵種類が変化した
場合、それに速応できないという問題がある。In the conventional inspection of steel plate surface flaws, it is general to judge the photoelectric conversion output of the reflected light with a threshold value to determine whether there is a flaw,
In this method, since the flaw is judged by the absolute reflected light intensity, the difference in the degree of reflection between steel types and the influence of formation are not considered. If the threshold value is set low, it is not a flaw but the part where the reflection is a little abnormal is erroneously detected as a flaw (over detection). ) Increases. Therefore, it is necessary to set the threshold value to an appropriate value, but it is difficult to select and adjust the appropriate value because it changes depending on the steel type, formation, etc., and this method has difficulty in determining accuracy. In addition, there is a problem in that if the type of flaw to be detected changes, it cannot respond quickly.
本発明はかゝる点を改善し、反射光の光電変換出力か
ら、疵を包括する2つの狭い範囲A,A′および該範囲A,
A′を包括する広い範囲Bの変換出力から特徴量を求
め、これより、特に神経回路網を用いて、疵判定して、
閾値の選択に悩まされることなく、過検出や見逃しを回
避することができる疵検査方法を提供することを目的と
するものである。The present invention has improved these points, and from the photoelectric conversion output of reflected light, two narrow ranges A, A ′ and the range A, which cover defects,
The feature amount is obtained from the converted output of the wide range B including A ′, and from this, the neural network is used for the defect determination,
An object of the present invention is to provide a flaw inspection method capable of avoiding overdetection and overlooking without being bothered by selection of a threshold value.
本発明では鋼板表面をレーザ光で走査し、その反射光を
光電変換し、更にA/D変換し、鋼板の疵部分に相当する
小範囲AおよびA′とその複数個を包含する大範囲(鋼
板幅またはその複数分の1の範囲)における該変換出力
から、反射光波形を代表する複数個の特徴量を算出す
る。In the present invention, the surface of a steel sheet is scanned with a laser beam, the reflected light is photoelectrically converted, and further A / D converted, and a small range A and A'corresponding to a flaw portion of the steel sheet and a large range including a plurality of them ( A plurality of characteristic quantities representing the reflected light waveform are calculated from the conversion output in the steel plate width or a range of a plurality of the steel plates.
この複数個の特徴量を、入力層のノード数は該複数個と
同数、出力ノード層は疵有り/無しに対応させて1つと
し、そして予め学習させた神経回路網に加え、該回路網
より疵有/無出力を生じさせる。The number of nodes in the input layer is the same as that of the plurality of features, and the number of output nodes is one corresponding to the presence / absence of flaws. The neural network is pre-learned. It causes more defects / no output.
特徴量としては2次平均、3次平均、微分レンジなどが
あるが、次式で表わされる正規化2次平均 と正規化微分レンジxDRS,x′DRSが適当である。There are quadratic average, cubic average, differential range, etc. as the feature amount, but the normalized quadratic average represented by the following formula And the normalized differential range x DRS , x'DRS is suitable.
xDRS=xDR/σxDR x′DRS=x′DR/σxDR 〔作用〕 この鋼板表面疵検査では、2つの小範囲A,A′および大
範囲Bにおける変換出力からの特徴量算出、得られた特
徴量の神経回路網への印加で疵有/無出力が得られ、従
来法のように閾値はどこに設定するかの問題はない。ま
た誤検出と過検出を共に僅小にすることが可能で、従来
法のように閾値を高く設定すれば誤検出が多発し、閾値
を低く設定すれば過検出が多発するという問題が悩まさ
れることがない。 x DRS = x DR / σ xDR x 'DRS = x' DR / σ xDR [Function] In this steel sheet surface flaw inspection, two small ranges A, feature amount calculating from the conversion output of A 'and a large range B, obtained The presence / absence of flaws can be obtained by applying the specified feature amount to the neural network, and there is no problem of setting the threshold value as in the conventional method. It is also possible to make both false detection and over detection small, and there is a problem that false detection occurs frequently when the threshold value is set high as in the conventional method, and over detection occurs when the threshold value is set low. Never.
本発明の実施例を第1図に示す。10は検査対象である鋼
板、11はレーザ発振器、12はレーザ光、13はそのレシー
バである。例えば鋼板10が矢印方向F1で示す鋼板長手方
向に移動し、レーザ光が矢印F2で示す鋼板幅方向に往復
移動することにより、鋼板10の全表面が走査される。レ
シーバ13は光ファイバとその両端の受光素子(フォトマ
ル)からなり、鋼板に投射されたレーザ光の反射光が光
ファイバに入射し、その光電変換出力を両端の受光素子
が出力する。この型のレシーバは反射光の入射位置従っ
て鋼板上の走査位置情報も与える。An embodiment of the present invention is shown in FIG. 10 is a steel plate to be inspected, 11 is a laser oscillator, 12 is laser light, and 13 is its receiver. For example, the steel plate 10 moves in the steel plate longitudinal direction indicated by the arrow direction F 1 and the laser beam reciprocates in the steel plate width direction indicated by the arrow F 2 , whereby the entire surface of the steel plate 10 is scanned. The receiver 13 comprises an optical fiber and light receiving elements (photomulsions) at both ends thereof, the reflected light of the laser light projected on the steel plate enters the optical fiber, and the photoelectric conversion output thereof is output by the light receiving elements at both ends. This type of receiver also provides scanning position information on the steel plate according to the incident position of reflected light.
レシーバ13の出力は微分回路21で微分されたのち、A/D
変換器22でA/D変換される。第2図(a)はレシーバ出
力を示し、(b)はその微分出力である。Bは鋼板の板
幅を示し、レシーバ出力は板端で立上り/立下り、また
疵位置で凹陥部を作る。A/D変換器22は(b)の微分波
形を極めて短い周期(20〜100nS)でサンプリングして
(c)の如きアナログ量を得、これを本例では8ビット
のデジタル値に変換する。The output of the receiver 13 is differentiated by the differentiation circuit 21 and then A / D
A / D conversion is performed by the converter 22. FIG. 2A shows the receiver output, and FIG. 2B is the differential output thereof. B indicates the plate width of the steel plate, and the receiver output rises / falls at the plate edge and makes a recess at the flaw position. The A / D converter 22 samples the differential waveform of (b) at an extremely short cycle (20 to 100 nS) to obtain an analog amount as shown in (c), and converts it into an 8-bit digital value in this example.
このようにして採取したデータから特徴量を計算する。
特徴量としては2次平均と微分レンジを用いこれを疵を
包括する小範囲Aと、該小範囲Aと隣り合う同じ大きさ
の小範囲A′と、該小範囲AおよびA′を包括する広範
囲Bにつき算出する。第2図(a)では範囲Bは全板幅
とするが、これは板幅の1/2,1/3などでもよい。1/2,1/3
……にする場合は第1図の装置を2組、3組……設け
て、鋼板表面を2分割、3分割、……して検査(並行同
時検査)するとよい。範囲A,A′は、予想される大きさ
の疵を十分包含する微小範囲(例えば5mm幅)とし、範
囲Bには複数個の範囲Aが含まれる。範囲A,A′は隣り
合うものであるが、該範囲A,A′のとり方は図2(d)
の如く前回の範囲A′の1つ前の範囲を次回の範囲
A′、前回の範囲A′を次回の範囲Aとする方法と、図
2(d)の如く前回の範囲A′の2つの前を次回の範
囲A′、前回の範囲A′の1つ前を次回の範囲Aとする
方法がある。範囲A,A′,Bの2次平均2,′2,2all
は次式で表わされる。The feature amount is calculated from the data thus collected.
A secondary range and a differential range are used as the feature amount, and a small range A that covers a defect, a small range A ′ of the same size adjacent to the small range A, and the small ranges A and A ′ are included. Calculate for wide range B. In FIG. 2 (a), the range B is the entire plate width, but it may be 1/2, 1/3, etc. of the plate width. 1 / 2,1 / 3
In order to do so, it is advisable to provide two sets, three sets of the apparatus shown in FIG. 1, and divide the steel plate surface into two parts, three parts, and inspect (parallel simultaneous inspection). The ranges A and A ′ are minute ranges (for example, 5 mm width) that sufficiently include a flaw of an expected size, and the range B includes a plurality of ranges A. The ranges A and A'are adjacent to each other, but how to take the ranges A and A'is shown in FIG. 2 (d).
As shown in FIG. 2 (d), there is a method of setting the range immediately preceding the previous range A'to the next range A'and the previous range A'to the next range A. There is a method in which the previous range is the next range A ′ and the previous range A ′ is the next range A ′. Secondary average of range A, A ', B 2 ,' 2 , 2all
Is expressed by the following equation.
こゝでyiは位置xiにおけるA/D変換値、xs,xeは
範囲Bの始、終端のi値、i0,i0+aは範囲Aの始、終
端のi値、E1,E2は範囲A,B内のyの個数の逆数である。
範囲A,A′,Bの微分レンジxDR,x′DR,xDRallは、 xDR=ABS(maxyi1−minyi1) ……(4) i0<i1<i0+a x′DR=ABS(maxyi1′−minyi1′) ……(5) i0+a<i1′<i0+2a xDRall=ABS(maxyi2−minyi2) ……(6) xs<i2<xe 範囲Bの微分レンジを計算し、過去のデータから標準偏
差σxDRを次式により計算し、新たに微分レンジを得る
毎にこれを更新する。 Here, y i is the A / D converted value at the position x i , x s , x e are the i values at the beginning and end of the range B, and i 0 , i 0 + a are the i values at the beginning and end of the range A, E 1 and E 2 are the reciprocals of the number of y in the ranges A and B.
Range A, A ', differential range x DR of B, x' DR, x DRall is, x DR = ABS (max y i1 - min y i1) ...... (4) i 0 <i 1 <i 0 + a x ' DR = ABS (max y i1 ' - min y i1') ...... (5) i 0 + a <i 1 '<i 0 + 2a x DRall = ABS (max y i2 - min y i2) ...... (6) x s <I 2 <x e The differential range of the range B is calculated, the standard deviation σ xDR is calculated from the past data by the following formula, and this is updated each time a new differential range is obtained.
σxDRの計算方法としては、他の特徴量の計算と同期し
て毎回計算を行なう他、サンプルデータから得られた値
を用いて計算しオンラインユースでは定数とする等があ
る。次は正規化を行なう。次の(7)式、(8)式、
(9)式、(10)式に示すように、(1)式(2)式を
それぞれ(3)式で割って範囲A,A′の2次平均の正規
化値2S,′2Sとし、範囲A,範囲A′の2次平均の正
規化値2S、′2Sとし(4)式、(5)式で示される
範囲A、範囲A′の微分レンジを範囲Bの標準偏差σ
xDRで割って範囲A、範囲A′の微分レンジの正規化値
xDRS、x′DRSとする。2S =2/2all ……(7) ′2S=′2/2all ……(8) xDRS=xDR/σxDR ……(9) x′DRS=x′DR/σxDR ……(10) この正規化した特徴量2S,′2S,XDRS,x′DRSを用い
て疵判定を行なう。微分レンジxDR(x′DR)と2次平
均2(′2)を第2図(e)に示すように縦軸、横
軸にとって疵有り〇、疵無し×の領域を求めると図示の
如くなり、両者は分れるがその境界は非直線である。第
2図(f)に示すように45゜線で分離すれば回帰分析可
能であるが、第2図(e)では回帰分析は困難である。
そこでニューラルネットワークを用い、この回帰分析を
可能とし、疵有り〇、疵無し×の各領域に分類する。し
かし各領域の境界は明確ではないため、境界付近では正
確に分離できない。これに対し、近隣の2つの小範囲A,
A′の相関をも考慮に入れることにより、疵なし部の地
合と疵有り部との差異を強調することによってより正確
な疵有/無の出力を得る。 As a calculation method of σ xDR , there is a method in which calculation is performed every time in synchronization with calculation of other feature amounts, and calculation is performed using a value obtained from sample data and is a constant for online use. Next, normalize. The following formula (7), formula (8),
As shown in the equations (9) and (10), the equations (1) and (2) are respectively divided by the equation (3) to obtain the quadratic average normalized values 2S and ′ 2S of the ranges A and A ′. Assuming that the quadratic average normalized values 2S and ′ 2S of the range A and the range A ′, the differential range of the range A and the range A ′ shown in the formulas (4) and (5) is the standard deviation σ of the range B.
Divide by xDR to obtain normalized values x DRS and x ′ DRS of the differential range of the range A and the range A ′. 2S = 2 / 2all ...... (7 ) '2S =' 2 / 2all ...... (8) x DRS = x DR / σ xDR ...... (9) x 'DRS = x' DR / σ xDR ...... (10) Defects are determined using the normalized feature quantities 2S , ′ 2S , X DRS , and x ′ DRS . As shown in FIG. 2 (e), the differential range x DR (x ' DR ) and the quadratic average 2 (' 2 ) are plotted on the ordinate and the abscissa to find the areas with flaws ◯ and flaws x, as shown in the figure. , The two are known, but the boundary is non-linear. As shown in FIG. 2 (f), it is possible to perform a regression analysis if separated by the 45 ° line, but in FIG. 2 (e), a regression analysis is difficult.
Therefore, using a neural network, this regression analysis is made possible and is classified into each area of ◯ with flaws and × without flaws. However, since the boundaries of each region are not clear, they cannot be separated accurately near the boundaries. On the other hand, two small areas in the neighborhood A,
By taking the correlation of A ′ into consideration, the more accurate output of the flaw / no flaw is obtained by emphasizing the difference between the texture of the flawless portion and the flawed portion.
このニューラルネットワークは第2図(g)に示すよう
に2段構成となっている。すなわち、小範囲Aの特徴量
に対応した入力層、中間層、出力層を持った3層構造を
なす小ネットワークIと、これと同じ構成で小範囲A′
に対応した小ネットワークIIの2つからなる1段目と、
これらの出力層を合わせたものを入力層とし、中間層、
出力層を持った2段目を持つものである。ここで小ネッ
トワークIおよびIIのノード数はともに、入力層が2、
中間層が3、出力層が1であり、これにバイアス層(学
習促進用)が1つ加わる構成である。一方、2段目のネ
ットワークは、例えば第2図(g)に示すように中間
層が1つのもの、あるいは例えば第2図(g)に示す
ように中間層が複数個のものがある。各ノードの入、出
力の関係はシグモイド関数a(1+e−x)−1であ
り、バイアス層の出力は1、学習規則は一般化デルタル
ールである。疵あり1、疵なし0で、1000回程度学習さ
せる。最終出力層の出力がある値、たとえば0.5以上で
疵あり、それ以下で疵なしとする。This neural network has a two-stage configuration as shown in FIG. That is, a small network I having a three-layer structure having an input layer, an intermediate layer, and an output layer corresponding to the feature amount of the small range A, and a small range A ′ having the same configuration as this.
The first stage consisting of two small networks II corresponding to
The input layer is a combination of these output layers, the middle layer,
It has a second stage with an output layer. Here, the number of nodes of the small networks I and II is 2 in the input layer,
There are three intermediate layers and one output layer, and one bias layer (for learning promotion) is added to this. On the other hand, in the second-stage network, for example, one intermediate layer is provided as shown in FIG. 2 (g), or a plurality of intermediate layers is provided as shown in FIG. 2 (g). The relationship between the input and output of each node is the sigmoid function a (1 + e −x ) −1 , the output of the bias layer is 1, and the learning rule is the generalized delta rule. There are 1 defect and 0 defect, and learn about 1000 times. If the output of the final output layer is a certain value, for example 0.5 or more, there is a flaw, and if it is less than that, there is no flaw.
正規化特徴量の算出には適所にメモリを置く必要があ
る。メモリ設置位置は第5図に示すように、A/D変換器2
2の出側と微分レンジ計算部24,26の出側などである。範
囲Bは1ライン分(1/2,1/4ライン分などもよいが、こ
ゝでは1ライン分とする)、範囲Aおよび範囲A′はそ
の1ラインの微小部分であるから、メモリM1に複数ライ
ン分の格納容量をもたせ、計算部23,24でその1ライン
について を計算したら計算部25,26で当該ラインの各範囲Aにつ
き2,xDRを、各範囲A′につき′2,x′DRを計算し、
正規化処理部27で前記(7)(8)(9)(10)式によ
り、正規化した2次平均 微分レンジxDRS,x′DRSを計算し、ニューラルネットワ
ーク30へ入力する、のが一つの方法である。It is necessary to put a memory in a proper place to calculate the normalized feature amount. As shown in Fig. 5, the memory installation position is A / D converter 2
The output side of 2 and the output side of the differential range calculation units 24 and 26. The range B is for one line (1/2, 1/4 lines, etc., but in this case, it is for one line), and the ranges A and A'are minute portions of the one line, so the memory M 1 has a storage capacity for multiple lines, and the calculation units 23 and 24 The a 2, x DR per the calculation portions 25 and 26 When calculated on the range A of the line, 'per' each range A calculates the 2, x 'DR,
The quadratic average normalized by the normalization processing unit 27 according to the equations (7), (8), (9) and (10). One method is to calculate the differential range x DRS , x ′ DRS and input it to the neural network 30.
メモリM2を用いて、1ラインの各範囲Aおよび各範囲
A′についての計算結果をM2に蓄え、当該ラインについ
ての即ち範囲Bについての計算結果が出たとき処理部27
で正規化処理する、は第2の方法であり、メモリM3を用
いて範囲Bについての計算結果を該メモリM3に格納し、
次のラインの各範囲Aおよび各範囲A′の計算結果とメ
モリM3の内容(1ライン前の範囲Bについての計算結
果)を用いて正規化処理する、は第3の方法である。Using the memory M 2, stored calculation results for 1 each range A and the range A of the line 'to M 2, processing unit 27 when the calculation result for the That range B on the line comes
In processes normalization, is a second method, the calculation results for the range B stored in the memory M 3 using the memory M 3,
The third method is to carry out the normalization processing using the calculation result of each range A and each range A ′ of the next line and the content of the memory M 3 (calculation result of the range B one line before).
上記の第3の方法は、メモリ容量が少なくて済み、1ラ
イン前も今回ラインも2次平均などにそれ程差はないか
ら、有効な方法である。また図2(d)の方法を取る
場合は各範囲A′の正規化処理後の結果をM4に格納して
おけば次回計算における各範囲Aについての計算を省く
ことができ、高速な処理が可能となる。The above-mentioned third method is an effective method because the memory capacity is small and there is not much difference in the secondary average between the previous line and the current line. Further, when the method of FIG. 2D is used, if the result after the normalization processing of each range A ′ is stored in M 4 , the calculation for each range A in the next calculation can be omitted, and the high-speed processing can be performed. Is possible.
第3図、第4図に誤検出率等を示す。第3図は従来法
で、横軸は閾値(2,4,……は0.2V,0.4V,……に相当)、
縦軸は率%である。図示のように閾値を低くすると過検
出(疵でないのに疵とする)率は上り、閾値を高くする
と誤検出(見逃し)率が上り、正答率は適切な閾値で最
高になるが、この最高正答率になる閾値は鋼板の表面性
状等により種々変化する。3 and 4 show the false detection rate and the like. Fig. 3 shows the conventional method, the horizontal axis is the threshold value (2,4, ... corresponds to 0.2V, 0.4V, ...),
The vertical axis is rate%. As shown in the figure, lowering the threshold increases the rate of over-detection (marks are flawed but not flaws), and increasing the threshold increases the rate of false positives (missing). The threshold for the correct answer rate changes variously depending on the surface properties of the steel sheet and the like.
第4図は本発明(相互参照型ニューラルネット法)と従
来法(微分スレッシュレベル法)とを対比して示すグラ
フである。横軸は誤検出率、縦軸は過検出率であり、図
示のように従来法では一方が良くなれば他方は悪くな
る。これに対して本発明法ではグループG1,G2に示すよ
うに両方共、低くすることができる。なおG2はG1より、
ニューラルネットを更によく学習させた場合である。FIG. 4 is a graph showing the present invention (cross-reference neural network method) and the conventional method (differential threshold level method) in comparison. The horizontal axis is the false detection rate, and the vertical axis is the over detection rate. As shown, in the conventional method, when one becomes better, the other becomes worse. On the other hand, in the method of the present invention, both can be lowered as shown in groups G 1 and G 2 . The G 2 is from G 1,
This is the case when the neural network is trained better.
特微量としては正規化2次平均2Sと正規化微分レンジ
xDRSを採用する他、3次平均3=E・Σy3 iなども
含めて適当に組合わせたものを特徴量とすることも考え
られる。In addition to adopting the normalized quadratic average 2S and the normalized differential range x DRS as an extraordinary amount, it is also considered to use a proper combination of the tertiary average 3 = E · Σy 3 i etc. To be
本発明では隣り合う2つの範囲において疵信号(範囲A
あるいは範囲A′の信号)と、その周囲の信号(範囲B
の信号)を用いて疵有/無判定を行なう。これが閾値の
不要な過検率、誤検率の優れた疵有/無判定を可能とし
ている。微分レンジは高さ(強度)情報を与え、2次平
均は疵形状情報を与える。1段目のネットワークにおい
てこれらを用いて周囲と相違があるかどうかを識別し、
さらに、隣り合う部分を比較することによって全体的に
分布する相違点に対してもごく近くの相違点を識別する
ことが可能となっている。In the present invention, a defect signal (range A
Alternatively, the signal in the range A'and the signals around it (the range B)
Signal) is used to determine whether or not there is a defect. This enables the presence / absence of a defect with an excellent overdetection rate and false detection rate that do not require a threshold value. The differential range gives height (intensity) information and the quadratic average gives flaw shape information. These are used in the first stage network to identify whether there is a difference from the surroundings,
Furthermore, by comparing adjacent portions, it is possible to identify differences that are very close to the differences that are distributed overall.
本発明では強度が変動した微分波形を、変動を受けてい
ない波形と併せて学習させる事により、入力される微分
波形が強度的に変動を受けても(すなわち、S/Nが悪化
しても)検出率への影響が小さいシステムが得られる。
微分信号の大きさは、ラインでの設置条件、機器の劣化
や対象とする被検定物の種類によっても変化することは
十分に考えられる。従来の微分スレッシュ法では、これ
らの変化に柔軟に対応することは原理上不可能であり、
検出精度が悪化し、設置後、調整(すなわち、微分スレ
ッシレベルの値)の手直し等が生じる危険が大きい。In the present invention, by learning the differential waveform whose strength has changed, together with the waveform that has not been changed, even if the input differential waveform is changed in intensity (that is, even if S / N deteriorates). ) A system with little influence on the detection rate can be obtained.
It is quite conceivable that the magnitude of the differential signal will change depending on the installation conditions on the line, the deterioration of the equipment, and the type of the DUT. In the conventional differential threshold method, it is impossible in principle to flexibly respond to these changes,
The detection accuracy deteriorates, and there is a great risk that adjustment (that is, the value of the differential threshold level) will be corrected after installation.
以上説明したように本発明によれば、閾値設定に煩わさ
れることなく、誤検出と過検出を共に最低に抑えること
ができる鋼板表面疵検査を行なうことができる。As described above, according to the present invention, it is possible to perform a steel sheet surface flaw inspection capable of suppressing both false detection and over-detection to the minimum without being bothered by setting a threshold value.
第1図は本発明の鋼板表面疵検査法の説明図、 第2図は疵検査の各部の説明図、 第3図および第4図は検査結果例を示すグラフ、 第5図はメモリ設置位置の各例を示すブロック図であ
る。 第1図で21は微分回路、22はA/D変換器である。FIG. 1 is an explanatory view of a steel plate surface flaw inspection method of the present invention, FIG. 2 is an explanatory view of each portion of the flaw inspection, FIGS. 3 and 4 are graphs showing inspection result examples, and FIG. 5 is a memory installation position. It is a block diagram showing each example of. In FIG. 1, 21 is a differentiating circuit and 22 is an A / D converter.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 白川 芳幸 千葉県君津市君津1番地 新日本製鐵株式 会社君津製鐵所内 (56)参考文献 特開 平2−298840(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Yoshiyuki Shirakawa 1 Kimitsu, Kimitsu-shi, Chiba Shin Nippon Steel Co., Ltd. Kimitsu Steel Co., Ltd. (56) Reference JP-A-2-298840 (JP, A)
Claims (3)
を光電変換し、更にA/D変換し、鋼板の2つの小範囲
(A)(A′)とその複数個を包含する大範囲(B)に
おおける該変換出力から、反射光波形を代表する複数個
の特徴量を算出し、該特徴量を、予め学習させた神経回
路網に加えて疵有/無出力を生じさせることを特徴とす
る神経回路網による鋼板表面疵検査方法。1. A steel plate surface is scanned with a laser beam, the reflected light is photoelectrically converted, and A / D converted, and two large areas (A) and (A ') of a steel plate and a large area including a plurality of them are converted. From the converted output in the range (B), a plurality of characteristic quantities representative of the reflected light waveform are calculated, and the characteristic quantities are added to the neural network learned in advance to generate a defect / no output. A steel sheet surface flaw inspection method using a neural network characterized by the above.
次式で表わされる正規化2次平均2S,′2Sと正規化
微分レンジxDRS,x′DRSであることを特徴とする請求項
1記載の神経回路網による鋼板表面疵検査方法。 こゝで2は小範囲AのA/D変換出力の2次平均、′
2は小範囲A′のA/D変換出力の2次平均、 は大範囲BのA/D変換出力の2次平均、xDRは小範囲A
の微分レンジ、x′DRは小範囲A′の微分レンジ、σ
xDRは大範囲Bの微分レンジの標準偏差。2. A feature quantity is a normalized quadratic mean 2S , ′ 2S and a normalized differential range x DRS , x ′ DRS which are represented by the following equations corresponding to two small ranges A, A ′. The steel sheet surface flaw inspection method by the neural network according to claim 1. Here, 2 is the quadratic average of the A / D conversion output in the small range A, ‘
2 is the quadratic average of A / D conversion output in the small range A ', Is the quadratic average of A / D conversion output in the large range B, x DR is the small range A
Differential range, x ′ DR is the small range A ′ differential range, σ
xDR is the standard deviation of the large range B derivative range.
ーザ発振器と、 鋼板表面で反射したレーザ光を受光するレシーバと、 該レシーバの出力を微分し、その微分出力をA/D変換す
る回路と、 該A/D変換出力より、各小範囲(A)および(A′)に
ついて2次平均と微分レンジを計算する手段と、 該A/D変換出力より、前記小範囲の複数個を包含する大
範囲(B)について2次平均、微分レンジ、および標準
偏差を計算する手段と、 これらの2次平均より正規化2次平均を、また小範囲
(A)および(A′)の微分レンジと大範囲(B)の標
準偏差から正規化微分レンジを算出する正規化処理手段
と、 該正規化2次平均および微分レンジを加えられて疵有/
無出力を生じる神経回路網とを備えることを特徴とす
る、神経回路網による鋼板表面疵検査装置。3. A laser oscillator for generating a laser beam for scanning the surface of a steel sheet, a receiver for receiving the laser beam reflected by the surface of the steel sheet, and a circuit for differentiating the output of the receiver and A / D converting the differential output. A means for calculating a secondary average and a differential range for each of the small ranges (A) and (A ') from the A / D converted output; and a plurality of the small ranges included in the A / D converted output. Means for calculating the secondary mean, the differential range, and the standard deviation for the large range (B), the normalized secondary average from these secondary averages, and the differential range for the small ranges (A) and (A '). And normalization processing means for calculating the normalized differential range from the standard deviation of the large range (B), and the normalized secondary average and differential range are added
A steel sheet surface flaw inspection apparatus using a neural network, comprising: a neural network that produces no output.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28436189A JPH0695076B2 (en) | 1989-10-31 | 1989-10-31 | Steel plate surface flaw inspection method by neural network |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP28436189A JPH0695076B2 (en) | 1989-10-31 | 1989-10-31 | Steel plate surface flaw inspection method by neural network |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03144350A JPH03144350A (en) | 1991-06-19 |
| JPH0695076B2 true JPH0695076B2 (en) | 1994-11-24 |
Family
ID=17677596
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP28436189A Expired - Lifetime JPH0695076B2 (en) | 1989-10-31 | 1989-10-31 | Steel plate surface flaw inspection method by neural network |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0695076B2 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3209297B2 (en) * | 1993-04-23 | 2001-09-17 | 新日本製鐵株式会社 | Surface flaw detection device |
-
1989
- 1989-10-31 JP JP28436189A patent/JPH0695076B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03144350A (en) | 1991-06-19 |
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