JPH0695398B2 - Optical disk defect position recording device - Google Patents
Optical disk defect position recording deviceInfo
- Publication number
- JPH0695398B2 JPH0695398B2 JP61300789A JP30078986A JPH0695398B2 JP H0695398 B2 JPH0695398 B2 JP H0695398B2 JP 61300789 A JP61300789 A JP 61300789A JP 30078986 A JP30078986 A JP 30078986A JP H0695398 B2 JPH0695398 B2 JP H0695398B2
- Authority
- JP
- Japan
- Prior art keywords
- defect
- optical disc
- recording
- optical
- optical disk
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000007547 defect Effects 0.000 title claims description 51
- 230000003287 optical effect Effects 0.000 title claims description 39
- 230000002950 deficient Effects 0.000 description 17
- 238000010586 diagram Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 3
- 238000001000 micrograph Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Optical Recording Or Reproduction (AREA)
- Manufacturing Optical Record Carriers (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は、光ディスクの欠陥位置を光ディスク上に記録
する装置に関するものである。TECHNICAL FIELD The present invention relates to an apparatus for recording a defect position of an optical disc on the optical disc.
(従来の技術) 光ディスクの重要な性能の一つである欠陥発生率は、可
能な限り低いことが望まれる。従って、欠陥発生率を低
下するために欠陥発生原因を知る必要が有り、欠陥部分
を顕微鏡(光学顕微鏡や電子顕微鏡等)を用いて観察す
る事が重要な手段の一つになる。(Prior Art) It is desired that the defect occurrence rate, which is one of the important performances of optical disks, be as low as possible. Therefore, in order to reduce the defect occurrence rate, it is necessary to know the cause of the defect occurrence, and observing the defective portion with a microscope (optical microscope, electron microscope, etc.) is one of the important means.
光ディスクの欠陥部分の判定には、再生光学系を用いて
再生信号処理し、エラー発生の有無により行う。従来
は、このときの欠陥発生位置を次のように観測してい
る。トラックアドレス情報やセクターアドレス情報がす
でに光ディスク上に記録されている場合には、各々のア
ドレス情報を欠陥観測時に読み取る。また、光ディスク
上にアドレス情報がない場合には、再生光学系の再生半
径位置読み取り機構及び光ディスク回転軸上に回転角読
み取り機構を取り付け、欠陥観測時に再生半径及びディ
スク回転角を読み取る。以上のように欠陥発生位置を読
み取ったディスクの欠陥部分を顕微鏡を用いて観測する
場合には、欠陥観測時に読み取った前述のディスク半径
位置及び回転角位置付近を観測して欠陥部分を捜す。The defective portion of the optical disc is determined by processing a reproduced signal using a reproducing optical system and determining whether or not an error has occurred. Conventionally, the defect occurrence position at this time is observed as follows. When the track address information and the sector address information are already recorded on the optical disc, each address information is read at the time of observing a defect. If there is no address information on the optical disk, a read radius position reading mechanism of the read optical system and a rotation angle reading mechanism on the optical disk rotation axis are attached to read the read radius and the disk rotation angle when a defect is observed. When observing the defective portion of the disk whose defect generation position has been read as described above using a microscope, the defective portion is searched by observing the vicinity of the above-mentioned disk radial position and rotation angle position read at the time of defect observation.
(発明が解決しようとする問題点) 以上のような方法で欠陥を検索して欠陥観察をすると、
観察対称の欠陥の大きさが1μm程度の場合には次のよ
うな問題がある。欠陥観測時に読み取ったディスク半径
位置及び回転角位置付近を顕微鏡観察して欠陥部分を検
索しても、顕微鏡倍率を上げた場合には観察視野が狭く
なるため欠陥部分の検索が困難になり、顕微鏡倍率を下
げた場合には欠陥そのものが見えなくなる。このためな
かなか欠陥部分の検索が出来ない。また欠陥部分と予想
される位置を見つけても、再生光学系で欠陥と判定した
部分かどうかの判断が出来ない。(Problems to be Solved by the Invention) When a defect is searched and a defect is observed by the above method,
When the size of the observable symmetry defect is about 1 μm, there are the following problems. Even if the defect area is searched by observing the disk radial position and the rotation angle position read at the time of defect observation, if the microscope magnification is increased, the observation field becomes narrower, making it difficult to find the defect area. When the magnification is reduced, the defect itself becomes invisible. For this reason, it is difficult to search for the defective portion. Further, even if a position which is expected to be a defective portion is found, it is impossible to judge whether or not the portion is judged to be defective by the reproducing optical system.
本発明の目的は、上記のような問題点を解決し、光ディ
スクの欠陥位置を効率的に検索する為の光ディスク欠陥
位置記録装置を提供することにある。It is an object of the present invention to provide an optical disk defect position recording apparatus for solving the above problems and efficiently searching for the defect position of an optical disk.
(問題点を解決するための手段) 本発明の要旨とするところは、光ディスクの記録再生機
能を有する装置において、光ディスクの欠陥を検出する
第1の手段と、欠陥検出時から光ディスクに記録を行う
第2の手段と、第2の手段で記録を行っている期間に欠
陥の検出を行わないための第3の手段を具備することを
特徴とする光ディスク欠陥位置記録装置である。(Means for Solving Problems) The gist of the present invention is that in an apparatus having a recording / reproducing function for an optical disc, first means for detecting a defect in the optical disc and recording on the optical disc from the time of detecting the defect. An optical disk defect position recording apparatus comprising: a second means; and a third means for not detecting a defect during the recording by the second means.
(作用) 以下図面を参照して、本発明を詳細に説明する。(Operation) The present invention will be described in detail below with reference to the drawings.
また以下の説明では、光ディスクの欠陥検出時から光デ
ィスクに記録を行う事をマーキングと称し、マーキング
した光ディスク上の領域のことをマーキング領域と称す
る。Further, in the following description, recording on the optical disc from the time when a defect of the optical disc is detected is referred to as marking, and the marked region on the optical disc is referred to as marking region.
第1図に、本発明による装置構成を示す。FIG. 1 shows a device configuration according to the present invention.
光ディスク4から再生された信号は、欠陥検出回路2で
欠陥を検出する。欠陥が検出されると、欠陥検出回路2
は、一定時間記録を行う欠陥位置記録回路3と、欠陥位
置記録回路3で記録を行っている期間に欠陥の検出を行
わないためのゲート回路1を動作させる。以上の動作に
より、マーキングが行われる。この様なマーキングを行
うことにより、欠陥の大きさが1μm程度の場合におい
てもマーキング領域を大きくしておけば、欠陥観測時に
欠陥位置の検索が即座に行える。In the signal reproduced from the optical disc 4, the defect detection circuit 2 detects a defect. When a defect is detected, the defect detection circuit 2
Causes the defect position recording circuit 3 that performs recording for a certain period of time and the gate circuit 1 that does not detect a defect during the period when recording is performed by the defect position recording circuit 3. The marking is performed by the above operation. By performing such marking, even if the size of the defect is about 1 μm, if the marking region is made large, the defect position can be immediately searched when observing the defect.
以上の機能を除いた装置構成は、一般的な光ディスク記
録再生装置と同様に、光ディスク4はディスクスピンド
ル5にセットされて回転され、光ヘッド6は記録再生用
レーザ集光ビームを光ディスク4上に集光するために、
光ヘッド駆動系7により制御される。With the device configuration excluding the above-described functions, the optical disc 4 is set on the disc spindle 5 and rotated, and the optical head 6 directs the recording / reproducing laser focused beam onto the optical disc 4, similar to a general optical disc recording / reproducing device. To focus
It is controlled by the optical head drive system 7.
第2図は、欠陥部分8とマーキング領域9の配置の模式
図を示す。この様に、欠陥部分8のすぐ近傍にマーキン
グ領域9があるので容易に欠陥を見つけることができ、
欠陥観察の効率を向上させる事が出来る。FIG. 2 shows a schematic view of the arrangement of the defective portion 8 and the marking area 9. In this way, since the marking area 9 is in the immediate vicinity of the defective portion 8, the defect can be easily found,
The efficiency of defect observation can be improved.
(実施例1) 本発明の欠陥位置検索装置を用いて記録ビットの抜けの
欠陥部分を検索した顕微鏡写真の模式図を第3図、第4
図に示す。第3図は倍率100倍の光学顕微鏡で観察した
マーキング領域の模式図で、マーキング領域の先端に欠
陥部分があるが、この倍率では欠陥部分は見えない。第
4図は、第3図のマーキング領域の先端部分を拡大し倍
率2000倍にした時の模式図である。この倍率では、欠陥
部分が観察できるようになる。(Embodiment 1) FIGS. 3 and 4 are schematic diagrams of micrographs in which a defective portion where a recording bit is missing is searched using the defect position searching device of the present invention.
Shown in the figure. FIG. 3 is a schematic view of the marking area observed with an optical microscope at a magnification of 100 times. Although there is a defective portion at the tip of the marking area, the defective portion cannot be seen at this magnification. FIG. 4 is a schematic diagram when the tip portion of the marking area in FIG. 3 is enlarged and the magnification is 2000 times. At this magnification, the defective portion can be observed.
(実施例2) 本発明の欠陥位置検索装置を用いてエキストラ欠陥部分
を検索した顕微鏡写真の模式図を第5図に示す。第5図
は、第4図と同様にマーキング領域の先端を拡大した
(倍率1000倍)模式図である。この倍率では、欠陥部分
が観察できるようになる。(Example 2) FIG. 5 shows a schematic diagram of a micrograph of an extra defect portion retrieved by using the defect position retrieval apparatus of the present invention. FIG. 5 is a schematic diagram in which the tip of the marking area is enlarged (magnification: 1000 times) as in FIG. At this magnification, the defective portion can be observed.
(発明の効果) 以上詳細に説明したように、本発明による光デイスク欠
陥位置記検索置を用いることにより、低倍率で欠陥を検
索でき、光ディスクの欠陥観察のスピードアップが計ら
れ、欠陥観察の効率を向上させる事ができる。(Effects of the Invention) As described in detail above, by using the optical disk defect locator search device according to the present invention, it is possible to search for defects at a low magnification, speed up defect observation of an optical disc, and perform defect observation. The efficiency can be improved.
第1図は光ディスク欠陥位置記録装置の構成を示す線
図、第2図は欠陥部分とマーキング領域の配置を示す線
図、第3,4,5図は欠陥部分とマーキング領域の顕微鏡写
真を模式的に示した線図である。 図中、1はゲート回路、2は欠陥検出回路、3は欠陥位
置記録回路、4は光ディスク、5はディスクスピンド
ル、6は光ヘッド、7は光ヘッド駆動系、8は欠陥部
分、9はマーキング領域である。FIG. 1 is a diagram showing the structure of an optical disc defect position recording apparatus, FIG. 2 is a diagram showing the arrangement of defective portions and marking areas, and FIGS. 3, 4 and 5 are schematic micrographs of defective portions and marking areas. FIG. In the figure, 1 is a gate circuit, 2 is a defect detection circuit, 3 is a defect position recording circuit, 4 is an optical disk, 5 is a disk spindle, 6 is an optical head, 7 is an optical head drive system, 8 is a defective portion, and 9 is marking. Area.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭63−152038(JP,A) 特開 昭63−152039(JP,A) 特開 昭63−152041(JP,A) 特開 昭63−117245(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP 63-152038 (JP, A) JP 63-152039 (JP, A) JP 63-152041 (JP, A) JP 63- 117245 (JP, A)
Claims (1)
あって、光ディスクの欠陥を検出する第1の手段と、欠
陥検出時から光ディスクに記録を行う第2の手段と、第
2の手段で記録を行っている期間に欠陥の検出を行わな
いための第3の手段を具備することを特徴とする光ディ
スク欠陥位置記録装置。1. An apparatus having a recording / reproducing function for an optical disc, comprising: first means for detecting a defect in the optical disc; second means for recording on the optical disc after the defect is detected; and recording by the second means. An optical disk defect position recording apparatus comprising a third means for not detecting a defect during a period during which the optical disc defect position is recorded.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61300789A JPH0695398B2 (en) | 1986-12-16 | 1986-12-16 | Optical disk defect position recording device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61300789A JPH0695398B2 (en) | 1986-12-16 | 1986-12-16 | Optical disk defect position recording device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63152040A JPS63152040A (en) | 1988-06-24 |
| JPH0695398B2 true JPH0695398B2 (en) | 1994-11-24 |
Family
ID=17889112
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61300789A Expired - Lifetime JPH0695398B2 (en) | 1986-12-16 | 1986-12-16 | Optical disk defect position recording device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0695398B2 (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0245739A (en) * | 1988-08-06 | 1990-02-15 | Mitsubishi Electric Corp | Surface defect inspecting device |
| JP2794836B2 (en) * | 1989-10-12 | 1998-09-10 | ソニー株式会社 | Information recording and / or playback device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07119707B2 (en) * | 1986-11-05 | 1995-12-20 | 日立電子エンジニアリング株式会社 | Optical disc inspection method |
-
1986
- 1986-12-16 JP JP61300789A patent/JPH0695398B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63152040A (en) | 1988-06-24 |
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