JPH0696477B2 - High frequency power supply output stabilization device and automatic single crystal growth device using this device - Google Patents
High frequency power supply output stabilization device and automatic single crystal growth device using this deviceInfo
- Publication number
- JPH0696477B2 JPH0696477B2 JP1223747A JP22374789A JPH0696477B2 JP H0696477 B2 JPH0696477 B2 JP H0696477B2 JP 1223747 A JP1223747 A JP 1223747A JP 22374789 A JP22374789 A JP 22374789A JP H0696477 B2 JPH0696477 B2 JP H0696477B2
- Authority
- JP
- Japan
- Prior art keywords
- high frequency
- single crystal
- power supply
- voltage
- growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000013078 crystal Substances 0.000 title claims description 48
- 230000006641 stabilisation Effects 0.000 title claims description 3
- 238000011105 stabilization Methods 0.000 title claims description 3
- 238000010438 heat treatment Methods 0.000 claims description 38
- 238000000034 method Methods 0.000 claims description 24
- 230000000087 stabilizing effect Effects 0.000 claims description 18
- 239000000155 melt Substances 0.000 description 18
- 230000010355 oscillation Effects 0.000 description 12
- 239000003381 stabilizer Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 5
- 230000008018 melting Effects 0.000 description 5
- 238000002844 melting Methods 0.000 description 5
- 230000006698 induction Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 125000002066 L-histidyl group Chemical group [H]N1C([H])=NC(C([H])([H])[C@](C(=O)[*])([H])N([H])[H])=C1[H] 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 238000002109 crystal growth method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Solid Thermionic Cathode (AREA)
- General Induction Heating (AREA)
Description
【発明の詳細な説明】 (産業上の利用分野) 本発明は高周波源源の出力安定化装置に係り、より詳細
には、電源電圧が変動しても発振管のフィラメント電
圧、陽極電圧を安定化できる装置に関し、更にはこの装
置を、単結晶の育成法の1つであるフローティング・ゾ
ーン法(以下、「FZ法」という)に適用した単結晶自動
育成装置に関する。Description: TECHNICAL FIELD The present invention relates to an output stabilizing device for a high-frequency source, and more specifically, stabilizes the filament voltage and the anode voltage of an oscillation tube even when the power supply voltage fluctuates. The present invention also relates to an apparatus capable of growing a single crystal, and further relates to an apparatus for automatically growing a single crystal in which the apparatus is applied to a floating zone method (hereinafter referred to as “FZ method”) which is one of the methods for growing a single crystal.
(従来の技術) 高周波誘導加熱によるFZ法は、ルツボを使用せず、試料
自信が発熱体となるため、高融点物質の単結晶育成に最
適な方法である。(Prior Art) The FZ method using high-frequency induction heating is an optimal method for growing a single crystal of a high melting point substance because it does not use a crucible and the sample itself becomes a heating element.
現在、熱電子放射材であるLaB6(融点2600℃)単結晶が
この方法により育成され、広く実用に供せられている。
また、電界電子放射材として注目されているTiC(融点3
100℃)単結晶もこの方法により育成されている。最近
では、過酷な使用条件に耐える材料への要求と共に、ま
すます、高周波加熱FZ法による単結晶の育成法が重要と
なってきている。Currently, a LaB 6 (melting point 2600 ° C) single crystal, which is a thermionic emission material, is grown by this method and is widely put to practical use.
In addition, TiC (melting point 3
(100 ° C) single crystal is also grown by this method. Recently, along with the demand for materials that can withstand the harsh conditions of use, the growing method of single crystals by the high frequency heating FZ method is becoming more and more important.
(発明が解決しようとする課題) ところで、高周波電源は、一般に、形状の変化しない被
加熱物を加熱するのに用いられるため、ワークコイルと
試料間の誘導加熱効率が変化せず、高周波電流を制御す
る方式の出力安定化装置が用いられてきた。例えば、第
1図に示すように、高周波発振機(発振管)1の高周波
電流をアナログ検出器で検出し、フィードバックする方
式である。(Problems to be solved by the invention) By the way, since a high-frequency power source is generally used to heat an object whose shape does not change, the induction heating efficiency between the work coil and the sample does not change, and a high-frequency current is generated. Controlled output stabilizers have been used. For example, as shown in FIG. 1, a high frequency current of the high frequency oscillator (oscillation tube) 1 is detected by an analog detector and fed back.
しかし、FZ法の場合は、育成中に融帯の形状が時間と共
に変化し、ワークコイルと試料間の誘導加熱効率が変化
するため、高周波電流を制御する従来の出力安定化装置
をFZ法に用いることができなかった。そのため、FZ法の
場合には、高周波電源を手動状態で、すなわち、出力安
定化装置なしで使用されていた。その結果、電源の出力
安定度が悪く、日常しばしば起こる電源電圧(200V、3
相)の変動に対し、その都度、手動により加熱電力を修
正する必要が生じ、単結晶が大きな温度変動を受けなが
ら育成され、品質を著しく低下させていた。However, in the case of the FZ method, the shape of the melt zone changes with time during growth, and the induction heating efficiency between the work coil and the sample changes, so the conventional output stabilizer that controls the high-frequency current is changed to the FZ method. It could not be used. Therefore, in the case of the FZ method, the high frequency power supply was used in the manual state, that is, without the output stabilizing device. As a result, the output stability of the power supply is poor, and the power supply voltage (200 V, 3
It was necessary to manually correct the heating power for each fluctuation of the phase), and the single crystal was grown while undergoing a large temperature fluctuation, and the quality was remarkably deteriorated.
このような問題は、被加熱物が上述の融帯である場合の
みに限られず、形状が加熱と共に変化する他の被加熱物
を加熱する場合にも、同様であった。Such a problem is not limited to the case where the object to be heated is the above-mentioned melt zone, and is the same when heating another object to be heated whose shape changes with heating.
一方、高周波加熱FZ法により単結晶を育成する場合、育
成中に融帯の形状が変化するため、融帯形状を制御しな
ければ、高品質の単結晶を得ることが困難である。On the other hand, when a single crystal is grown by the high frequency heating FZ method, the shape of the melt zone changes during the growth, and therefore it is difficult to obtain a high quality single crystal unless the shape of the melt zone is controlled.
しかし、従来のFZ方による単結晶育成法では、融帯形状
をうまく検出できる装置がなかったため、実験者が直接
目で融帯形状を観察しながら、加熱電力を適正値になる
ように手動で制御し、単結晶を育成せざると得なかっ
た。そのため、手動で温度を制御するのでは緩やかな温
度制御が難しく、育成される単結晶の品質を低下させて
いた。However, in the conventional single crystal growth method by the FZ method, there was no device that was able to detect the zone shape well, so the experimenter observed the zone shape directly with his / her eyes and manually set the heating power to an appropriate value. It had to be controlled and to grow a single crystal. Therefore, it is difficult to control the temperature gently by manually controlling the temperature, and the quality of the grown single crystal is deteriorated.
本発明は、上記従来技術の問題点を解決するためになさ
れたものであって、電源電圧の変動にも拘らず、高周波
電源の出力変動を可及的に小さくすることができる出力
安定化装置を提供することを目的とするものであり、ま
た特に高周波誘導加熱によるFZ法に適用した場合、単結
晶の自動育成を可能にする装置を提供することを目的と
するものである。The present invention has been made in order to solve the above-mentioned problems of the prior art, and is an output stabilizing device capable of minimizing the output fluctuation of the high frequency power supply despite the fluctuation of the power supply voltage. It is an object of the present invention to provide an apparatus capable of automatically growing a single crystal when applied to the FZ method by high frequency induction heating.
(課題を解決するための手段) 本発明者らは、前記目的を達成すべく鋭意研究を重ねた
結果、まず、電源電圧(200V、3相)の変動に伴う高周
波電源の出力を変動させる原因として、発振管のフィラ
メント電圧と陽極電圧の変動によることを究明した。そ
こで、その対策について検討したところ、フィラメント
電圧を一定化させるために定電圧電源を設置し、また陽
極電圧を検出して一定になるようにコンピュータで制御
する方式を見い出した。その結果、高周波電源の出力安
定度を従来よりも1桁上げることができた。本発明者ら
は、この知見に基づいて陽極電圧を制御する新しいタイ
プの出力安定化装置の開発に成功したものである。(Means for Solving the Problem) As a result of intensive studies to achieve the above-mentioned object, the inventors of the present invention firstly found the cause of the fluctuation of the output of the high frequency power supply due to the fluctuation of the power supply voltage (200V, three phases). As a result, it was clarified that it depends on the fluctuations of the filament voltage and the anode voltage of the oscillation tube. Therefore, as a result of studying the countermeasures, a method has been found in which a constant voltage power source is installed to make the filament voltage constant and a computer control is performed so that the anode voltage is detected and made constant. As a result, the output stability of the high frequency power supply could be increased by one digit compared to the conventional one. The present inventors have succeeded in developing a new type of output stabilizer that controls the anode voltage based on this finding.
また、これをFZ法による単結晶の育成に適用する場合、
育成中の融帯形状が融帯を加熱している高周波電流によ
り判断できることを見い出し、その結果、高周波電流の
変化を検出して加熱電力或いは育成炉上下軸の移動速度
を制御することにより、単結晶を自動的に育成できるこ
とを実証したものである。Moreover, when applying this to the growth of a single crystal by the FZ method,
It was found that the shape of the zone during growth can be judged by the high-frequency current heating the zone, and as a result, by detecting the change in the high-frequency current and controlling the heating power or the moving speed of the growth furnace vertical axis, This proves that crystals can be grown automatically.
すなわち、本発明は、高周波電源の出力を安定化する方
式において、発振管のフィラメント電圧電源として定電
圧電源を用いると共に、陽極電圧を検出してフィードバ
ック制御する陽極電圧制御装置を設け、フィラメント電
圧及び陽極電圧を安定化することを特徴とする高周波電
源出力安定化装置を要旨とするものである。That is, the present invention uses a constant voltage power supply as a filament voltage power supply of an oscillation tube in a method of stabilizing the output of a high frequency power supply, and also provides an anode voltage control device for detecting and feedback-controlling the anode voltage, The gist of the present invention is a high-frequency power supply output stabilizing device characterized by stabilizing an anode voltage.
また、本発明は、かゝる高周波電源出力安定化装置を用
いて単結晶を自動育成する装置において、育成中の高周
波電流の変化に基づいて加熱電力或いは育成炉上下軸の
移動速度を制御する制御部を設けたことを特徴とする単
結晶自動育成装置を要旨とするものである。Further, the present invention is an apparatus for automatically growing a single crystal using such a high frequency power source output stabilizing apparatus, which controls heating power or the moving speed of the vertical axis of the growth furnace based on the change of the high frequency current during the growth. The gist of the present invention is an automatic single crystal growth apparatus characterized by being provided with a control unit.
以下に本発明を更に詳細に説明する。The present invention will be described in more detail below.
(作用) 第1図は本発明による出力安定化装置を備えた高周波発
振機の出力制御装置をFZ法に適用した場合を示してい
る。(Operation) FIG. 1 shows a case where the output control device of the high frequency oscillator provided with the output stabilizing device according to the present invention is applied to the FZ method.
図中、1は高周波発振機(発振管)、2は電源(200V、
3相)、3は高周波電流検出器(デジタルボルトメータ
ー)、4は陽極電圧検出器(デジタルボルトメータ
ー)、5は検出値を設定値と比較する演算部並びに制御
部を有するCPU、6はフィラメント安定化電源、7は単
結晶育成炉を示している。In the figure, 1 is a high frequency oscillator (oscillation tube), 2 is a power source (200V,
(3 phases), 3 is a high frequency current detector (digital voltmeter), 4 is an anode voltage detector (digital voltmeter), 5 is a CPU having an arithmetic unit and a control unit for comparing the detected value with a set value, and 6 is a filament. A stabilizing power source, 7 is a single crystal growth furnace.
前述の如く、高周波電源は一般に形状が変化しない被加
熱物を加熱するのに用いられていたため、高周波電流を
制御する方式が採用されており、高周波電流をアナログ
検出器にて検出して発振管にフィードバック制御し、出
力の安定化が図られていた。As mentioned above, the high frequency power source is generally used to heat the object to be heated whose shape does not change, so the method of controlling the high frequency current is adopted. Feedback control was performed to stabilize the output.
しかし、被加熱物が単結晶育成の融帯のように形状が加
熱と共に変化する場合には、そのような方式は適用でき
ず、電源2の変動の都度、手動により陽極電圧が調整さ
れていたのである。However, in the case where the shape of the object to be heated changes with heating like a single crystal growth zone, such a method cannot be applied, and the anode voltage is manually adjusted every time the power supply 2 changes. Of.
これに対し、本発明では、高周波発振機(発振管)1の
出力の安定度がフィラメント電圧と陽極電圧の変動によ
ることに鑑みて、フィラメント電源として定電圧電源を
用い、かつ、陽極電圧を検出機4にて検出してフィード
バック制御する方式としたものである。CPU5では、検出
器4にて検出した陽極電圧値を設定値と比較し、その結
果をD/Aコンバータを介して高周波発振機(発振管)1
にフィードバックし、陽極電圧が制御される。なお、検
出機としてはデジタル式のものが好ましく、制御精度が
向上できる。On the other hand, in the present invention, in view of the fact that the stability of the output of the high frequency oscillator (oscillation tube) 1 depends on the fluctuations of the filament voltage and the anode voltage, a constant voltage power source is used as the filament power source and the anode voltage is detected. This is a system in which the machine 4 detects and performs feedback control. In the CPU5, the anode voltage value detected by the detector 4 is compared with the set value, and the result is passed through the D / A converter to the high frequency oscillator (oscillation tube) 1
Feedback to the anode voltage is controlled. It should be noted that the detector is preferably a digital type, which can improve control accuracy.
また、本発明は、断面が変化する鋼線等々の被加熱物を
連続的に熱処理する場合などにも適用可能である。The present invention can also be applied to the case where a heated object such as a steel wire whose cross section changes is continuously heat-treated.
なお、電源2に安定化電源を使用することも考えられる
が、そのような装置は容量が大きく非常に高価であり、
また高周波発振機を形状が変化しない被加熱物の加熱用
電源として利用したい場合には、従来からある高周波電
流を制御する出力安定化装置でよく、そのような高価な
安定化電源は不要であり、いずれにしても経済的でな
い。また、高周波電流をデジタルボルトメーター3にて
制御する高周波電流制御装置は本発明の高周波電源出力
安定化装置では必須ではない。It is possible to use a stabilized power source as the power source 2, but such a device has a large capacity and is very expensive.
If you want to use the high-frequency oscillator as a power source for heating an object whose shape does not change, you can use a conventional output stabilizer that controls high-frequency current, and you do not need such an expensive power source. In any case, it is not economical. Further, the high frequency current control device for controlling the high frequency current with the digital voltmeter 3 is not essential in the high frequency power supply output stabilizing device of the present invention.
次に、この高周波電源出力安定化装置を単結晶自動育成
装置に適用した場合の具体的構成について第4図を用い
て説明する。Next, a specific configuration when this high frequency power source output stabilizing device is applied to a single crystal automatic growing device will be described with reference to FIG.
第4図において、1〜7は第1図の場合と同一であり、
更に8は上軸、8′は下軸、9、9′はホルダー、10は
焼結棒、10′は融帯、11は育成した単結晶、12は高周波
コイル、13は上軸駆動部、13′は下軸駆動部、14は演算
部、15は制御部である。In FIG. 4, 1 to 7 are the same as those in FIG.
Further, 8 is an upper shaft, 8'is a lower shaft, 9 and 9'is a holder, 10 is a sintered rod, 10 'is a melt zone, 11 is a grown single crystal, 12 is a high frequency coil, 13 is an upper shaft drive part, 13 'is a lower shaft drive unit, 14 is a calculation unit, and 15 is a control unit.
本発明の単結晶自動育成装置は、従来法において融帯形
状を観察しながら手動で加熱電力を制御するのに対し、
融帯形状の変化に応じて高周波電流が変化することを利
用して、加熱電力を自動的に制御する装置である。The single crystal automatic growth apparatus of the present invention, while manually controlling the heating power while observing the zone shape in the conventional method,
It is a device that automatically controls heating power by utilizing the fact that the high-frequency current changes in accordance with the change in the shape of the zone.
すなわち、育成中、融帯10′が細くなれば、コイル12と
融帯10′の間のインピーダンスが小さくなり、高周波電
流が増加する。一方、逆に融帯10′が太くなれば、高周
波電流が小さくなる。したがって、高周波電流を検出器
3で検出し、またその時の陽極電圧を検出器4で検出
し、CPU5の演算部14にて融帯形状を判断し、制御部15に
て加熱電力を制御する。That is, if the melt zone 10 'becomes thinner during the growth, the impedance between the coil 12 and the melt zone 10' becomes smaller and the high frequency current increases. On the other hand, conversely, if the melt zone 10 'becomes thicker, the high frequency current becomes smaller. Therefore, the high frequency current is detected by the detector 3, the anode voltage at that time is detected by the detector 4, the arithmetic unit 14 of the CPU 5 determines the shape of the melted band, and the control unit 15 controls the heating power.
実際に単結晶を自動育成する場合、どれだけ融帯形状が
変化すれば、どれだけ加熱電力を制御するのが適切であ
るかは、単結晶の材質に依存しているため、手動状態で
の単結晶の予備実験の結果に基づき、単結晶の材質毎に
予め決めておき、それをプログラムの中に反映させてお
く。When actually growing a single crystal, how much the zone shape changes and how much heating power should be controlled appropriately depend on the material of the single crystal. Based on the result of the preliminary experiment of the single crystal, it is determined in advance for each material of the single crystal and reflected in the program.
このように融帯形状に基づき加熱電力のみを制御する方
式は、焼結棒10の密度が高い場合(一般に密度70%以
上)に好適である。しかし、焼結棒10の密度が低い場合
は、育成中、融帯10′の一部が焼結棒10の中に染み込
み、突然融帯が細くなったり、或いは染み込んだ部分が
融帯に溶込む際、融帯が太くなったりして、融帯形状が
適正加熱電力からのヅレ以外の要因により変化してしま
う。このような場合に安定して単結晶を育成するには、
加熱電力の制御だけでなく、上軸下軸の移動速度を設定
値より変化させる必要がある。融帯が設定形状よりも太
くなった場合に不安定になるのか或いは細くなった場合
に不安定になるのかは、育成する単結晶の材質に依存し
ているため、不安定になる場合にのみ上軸下軸の移動速
度を設定値から変化させ、元の融帯形状に戻すのであ
る。いずれにしても、焼結棒10が融帯10′にスムーズに
溶け込まない場合に、上下軸の移動速度を変化させ、通
常は上軸のみ移動速度を変化させる。なお、この上軸下
軸の移動速度制御は、2回目以降の融帯移動に有効であ
る。これは、融帯10′に送り込まれる原料棒(焼結棒)
の太さが一様でないことがあるためである。In this way, the method of controlling only the heating power based on the shape of the fusion zone is suitable when the sintered rod 10 has a high density (generally, the density is 70% or more). However, when the density of the sintered rod 10 is low, a part of the melt zone 10 'soaks into the sintered rod 10 during the growth, the melt zone suddenly becomes thin, or the soaked portion melts into the melt zone. When it is inserted, the zone becomes thick, and the shape of the zone changes due to factors other than deviation from the appropriate heating power. In such cases, to grow a single crystal stably,
In addition to controlling heating power, it is necessary to change the moving speed of the upper shaft and the lower shaft from the set value. Whether the melt zone becomes unstable when it becomes thicker than the set shape or becomes unstable when it becomes thin depends on the material of the single crystal to be grown. The moving speed of the upper shaft and the lower shaft is changed from the set value to restore the original shape of the zone. In any case, when the sintered rod 10 does not melt smoothly into the melt zone 10 ', the moving speed of the vertical shaft is changed, and normally only the upper shaft is changed. The control of the moving speed of the upper shaft and the lower shaft is effective for the second and subsequent zone movements. This is a raw material rod (sintering rod) fed into the melt zone 10 '.
This is because the thickness of may not be uniform.
自動育成を安定に行うためには、CPU5は、適正加熱電力
への電力制御能力を有するほか、設定陽極電圧に陽極電
圧を保持する出力安定化能力を備えている必要がある。
すなわち、検出器4にて陽極電圧を検出して設定値と比
較し、その結果を高周波発振機(発振管)1にフィード
バック制御する出力安定化制御である。また更には、発
振管1のフィラメント電源6として定電圧電源を用いて
フィラメント電圧を一定化すれば、より効果的である。In order to stably perform automatic growth, the CPU 5 needs to have an electric power control ability for an appropriate heating electric power and an output stabilizing ability for holding the anode voltage at the set anode voltage.
That is, it is output stabilization control in which the anode voltage is detected by the detector 4, compared with a set value, and the result is feedback-controlled to the high-frequency oscillator (oscillation tube) 1. Furthermore, it is more effective if the filament voltage is made constant by using a constant voltage power source as the filament power source 6 of the oscillation tube 1.
(実施例) 次に本発明の一実施例を示す。(Example) Next, an example of the present invention will be described.
実施例1 高周波電源の出力安定性を調べるために、以下の実験を
行った。Example 1 The following experiment was conducted in order to investigate the output stability of a high frequency power supply.
第1図に示した高周波発振機を接続した高圧型単結晶育
成炉(FZ炉)に100mmφ×200mm寸法のMo棒をセットし、
5気圧のHe雰囲気中で加熱を行い、電源電圧(200V、3
相)の変動による高周波電源の安定性を調べた。加熱条
件は、陽極電圧5KV、高周波電流180Aであった。Set a 100 mmφ × 200 mm Mo rod in the high-pressure single crystal growth furnace (FZ furnace) connected to the high-frequency oscillator shown in FIG.
Heating is performed in a He atmosphere at 5 atm, and the power supply voltage (200 V, 3
The stability of the high frequency power source due to fluctuations in phase) was investigated. The heating conditions were an anode voltage of 5 KV and a high frequency current of 180 A.
第2図に、本発明に係る出力安定化装置を設置しない場
合、すなわち、従来法による結果を示す。電源電圧8V
(4%)の変動に対し、発振管のフィラメント電圧は4
%、陽極電圧は5V(0.1%)変化した。その結果、高周
波電流が0.5A(0.3%)変動した。このような変動で
は、単結晶育成時に手動で加熱電力を調節する必要が生
じる。FIG. 2 shows the result when the output stabilizer according to the present invention is not installed, that is, the result of the conventional method. Power supply voltage 8V
(4%), the filament voltage of the oscillation tube is 4
%, The anode voltage changed by 5 V (0.1%). As a result, the high frequency current fluctuated by 0.5A (0.3%). With such a variation, it is necessary to manually adjust the heating power when growing the single crystal.
一方、第3図に本発明に係る出力安定化装置を設置した
場合の結果を示す。発振管のフィラメント電圧は、定電
圧電源(2KVA)を用いることにより、変動を0.1%以下
に抑制できた。また、陽極電圧は、デジタルボルトメー
タにより検出し、コンピュータ制御することにより、変
動を±0.5V以下(<0.01%)に抑制できた。その結果、
高周波電流の変動を±0.05A以下(<0.03%)に抑える
ことができた。On the other hand, FIG. 3 shows the result when the output stabilizer according to the present invention is installed. The fluctuation of the filament voltage of the oscillation tube could be suppressed to less than 0.1% by using the constant voltage power supply (2KVA). In addition, the anode voltage was detected by a digital voltmeter and controlled by a computer, and the fluctuation could be suppressed to ± 0.5 V or less (<0.01%). as a result,
It was possible to suppress the fluctuation of high-frequency current to ± 0.05 A or less (<0.03%).
実施例2 本例は、本発明に係る高周波電源出力安定化装置をLaB6
単結晶の育成装置に適用した例である。Example 2 In this example, the high frequency power supply output stabilizing device according to the present invention is LaB 6
This is an example applied to a single crystal growing apparatus.
LaB6粉末を焼結し、直径約1cm、長さ20cmの焼結棒を作
製した。これをFZ炉の上軸下軸にBNホルダーを介して固
定した。FZ炉に8気圧のHeを充填した後、高周波加熱に
より初期融帯を形成した。融帯移動は、焼結棒と育成さ
れる単結晶を下方に1cm/hrの速度で移動することにより
行った。約0.5cm融帯を移動した後、自動育成を開始し
た。LaB 6 powder was sintered to prepare a sintered rod having a diameter of about 1 cm and a length of 20 cm. This was fixed to the upper and lower shafts of the FZ furnace via a BN holder. After filling the FZ furnace with He at 8 atm, an initial zone was formed by high frequency heating. The zone transfer was performed by moving the sintered rod and the grown single crystal downward at a speed of 1 cm / hr. After moving the about 0.5 cm zone, automatic growth was started.
LaB6単結晶育成の場合、融帯が落下し易く、小さな高周
波電流の変化で加熱電力を調節する必要があった。すな
わち、高周波電流が0.1A増加した時、陽極電圧を4V下げ
た。また、高周波電流が0.1A減少した時、すなわち融帯
が太くなった時、特に融帯が落下し易いため、陽極電圧
を3.5V下げると同時に、焼結棒の移動速度を下げ、元の
融帯形状に戻した。その結果、加熱電力は融帯移動に伴
い減少した。これは、蒸発による融帯組成の変化のた
め、融帯の融点が融帯移動に伴い低下したためである。In the case of LaB 6 single crystal growth, the melt zone was likely to fall and it was necessary to adjust the heating power with a small change in high frequency current. That is, when the high frequency current increased by 0.1 A, the anode voltage was lowered by 4V. Also, when the high-frequency current decreases by 0.1 A, that is, when the melt zone becomes thick, the melt zone is likely to fall, so the anode voltage is lowered by 3.5 V and at the same time, the moving speed of the sintered rod is lowered to reduce the original melt rate. It returned to the strip shape. As a result, the heating power decreased as the zone moved. This is because the melting zone composition changed due to evaporation, so that the melting point of the zone decreased as the zone moved.
5時間の自動育成終了時の加熱条件は、5.474V−195.2A
であった。このようにして、直径8mm、長さ5.5cmのLaB6
単結晶が得られた。手動で育成された単結晶では、融帯
が落下気味で育成されるため、表面はスムーズでない
が、本例で自動育成された単結晶は、細かい加熱電力制
御が行われるため、表面が非常にスムーズであった。ま
た、その品質も、手動で育成された単結晶と比較してバ
ラツキが小さく、良質のものであった。The heating condition at the end of 5 hours of automatic growth is 5.474V-195.2A.
Met. In this way, LaB 6 with a diameter of 8 mm and a length of 5.5 cm
A single crystal was obtained. In the manually grown single crystal, the surface is not smooth because the melt zone grows with a tendency to fall, but the single crystal automatically grown in this example has a very fine heating power control, so the surface is very It was smooth. Moreover, the quality of the single crystal was smaller than that of the manually grown single crystal, and the quality was good.
(発明の効果) 以上説明したように、本発明によれば、電源電圧の変動
にも拘らず、高周波電源の出力変動を可及的に小さくす
ることができ、安定度を1桁上げることが可能である。
また安定化電源に比べて装置も極めて安価である。した
がって、加熱と共に形状が変化する被加熱物の高周波加
熱に適している。(Effects of the Invention) As described above, according to the present invention, it is possible to reduce the output fluctuation of the high frequency power supply as much as possible, and to increase the stability by one digit, regardless of the fluctuation of the power supply voltage. It is possible.
In addition, the device is much cheaper than the stabilized power supply. Therefore, it is suitable for high frequency heating of an object to be heated whose shape changes with heating.
特に、高周波加熱FZ法に適用した場合、上記効果に加え
て、高周波電流の変化に基づいて加熱電力或いは上下軸
移動速度を制御すれば、上記効果も重畳して、高品質の
単結晶を安定して自動的に育成できる。In particular, when applied to the high frequency heating FZ method, in addition to the above effects, if the heating power or the vertical axis movement speed is controlled based on the change in the high frequency current, the above effects are also superimposed and a high quality single crystal is stabilized. And can be trained automatically.
第1図は本発明に係る出力安定化装置を備えた高周波発
振機の出力制御装置並びにこれを単結晶育成炉に適用し
た場合を示す説明図、 第2図は従来の高周波電源の安定性を示す図で、電源電
圧の変動に対する陽極電圧及び高周波電流の変動
度合を示しており、 第3図は本発明に係る出力安定化装置を備えた場合の高
周波電源の安定性を示す図で、電源電圧の変動に対す
る陽極電圧及び高周波電流の変動度合とフィラメン
ト電圧を示しており、 第4図は出力安定化装置を備えた単結晶自動育成装置の
一例を示す説明図である。 1……高周波発振機(発振管)、2……電源(200V、3
相)、3……高周波電流検出器(デジタルボルトメータ
ー)、4……陽極電圧検出器(デジタルボルトメータ
ー)、5……CPU、6……発振管フィラメント安定化電
源、7……単結晶育成炉、8……上軸、8′……下軸、
9、9′……上軸下軸ホルダー、10……焼結棒、10′…
…融帯、11……単結晶、12……高周波コイル、13……上
軸駆動部、13′……下軸駆動部、14……演算部、15……
制御部、……電源電圧、……陽極電圧、……フィ
ラメント電圧、……高周波電流。FIG. 1 is an explanatory view showing an output control device of a high frequency oscillator equipped with an output stabilizing device according to the present invention and a case where the output control device is applied to a single crystal growth furnace, and FIG. 2 shows stability of a conventional high frequency power supply. In the figure, the degree of fluctuation of the anode voltage and the high frequency current with respect to the fluctuation of the power supply voltage is shown. FIG. 3 is a diagram showing the stability of the high frequency power supply when the output stabilizing device according to the present invention is provided. The degree of fluctuation of the anode voltage and the high frequency current with respect to the fluctuation of the voltage and the filament voltage are shown, and FIG. 4 is an explanatory diagram showing an example of an automatic single crystal growth apparatus equipped with an output stabilizer. 1 …… High frequency oscillator (oscillation tube) 2 …… Power supply (200V, 3
Phase), 3 ... High frequency current detector (digital voltmeter), 4 ... Anode voltage detector (digital voltmeter), 5 ... CPU, 6 ... Oscillating tube filament stabilizing power supply, 7 ... Single crystal growth Furnace, 8 ... upper axis, 8 '... lower axis,
9, 9 '... Upper shaft Lower shaft holder, 10 ... Sintered rod, 10' ...
… Blend zone, 11 …… single crystal, 12 …… high frequency coil, 13 …… upper axis drive section, 13 ′ …… lower axis drive section, 14 …… calculation section, 15 ……
Control unit, power supply voltage, anode voltage, filament voltage, high frequency current.
Claims (4)
て、発振管のフィラメント電圧電源として定電圧電源を
用いると共に、陽極電圧を検出してフィードバック制御
する陽極電圧制御装置を設け、フィラメント電圧及び陽
極電圧を安定化することを特徴とする高周波電源出力安
定化装置。1. In a method for stabilizing the output of a high frequency power supply, a constant voltage power supply is used as a filament voltage power supply for an oscillating tube, and an anode voltage control device for detecting and feedback-controlling the anode voltage is provided to provide a filament voltage and an anode. A high frequency power supply output stabilization device characterized by stabilizing voltage.
請求項1に記載の装置。2. An apparatus according to claim 1, wherein a digital detector is used for detecting the anode voltage.
動育成する装置において、育成中の高周波電流の変化に
基づいて加熱電力を制御する制御部を設けたことを特徴
とする単結晶自動育成装置。3. An apparatus for automatically growing a single crystal using the apparatus according to claim 1, wherein a controller for controlling heating power based on a change in high frequency current during the growth is provided. Automatic crystal growth device.
動育成する装置において、育成中の高周波電流の変化に
基づいて加熱電力と育成炉上下軸の移動速度を制御する
制御部を設けたことを特徴とする単結晶自動育成装置。4. An apparatus for automatically growing a single crystal using the apparatus according to claim 1, further comprising a controller for controlling the heating power and the moving speed of the vertical axis of the growth furnace based on the change of the high frequency current during the growth. An automatic single crystal growth apparatus characterized by being provided.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1707589 | 1989-01-26 | ||
| JP1-17075 | 1989-01-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH02275793A JPH02275793A (en) | 1990-11-09 |
| JPH0696477B2 true JPH0696477B2 (en) | 1994-11-30 |
Family
ID=11933862
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1223747A Expired - Lifetime JPH0696477B2 (en) | 1989-01-26 | 1989-08-30 | High frequency power supply output stabilization device and automatic single crystal growth device using this device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0696477B2 (en) |
-
1989
- 1989-08-30 JP JP1223747A patent/JPH0696477B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH02275793A (en) | 1990-11-09 |
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