JPH07100862B2 - Barrel type vapor phase growth equipment - Google Patents
Barrel type vapor phase growth equipmentInfo
- Publication number
- JPH07100862B2 JPH07100862B2 JP17194587A JP17194587A JPH07100862B2 JP H07100862 B2 JPH07100862 B2 JP H07100862B2 JP 17194587 A JP17194587 A JP 17194587A JP 17194587 A JP17194587 A JP 17194587A JP H07100862 B2 JPH07100862 B2 JP H07100862B2
- Authority
- JP
- Japan
- Prior art keywords
- flow channel
- reaction tube
- gas
- vapor phase
- phase growth
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
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- Crystals, And After-Treatments Of Crystals (AREA)
- Chemical Vapour Deposition (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は基板上に薄膜を形成するバレル型気相成長装置
に関する。TECHNICAL FIELD The present invention relates to a barrel-type vapor phase growth apparatus for forming a thin film on a substrate.
従来より多数の基板を一度に処理する装置としてバレル
型気相成長装置が用いられている。第4図は従来装置の
一例で、頂部にガス導入管1が、下方側部にガス排出管
2,2が連設され、かつ外周にRFコイル3を巻きつけたキ
ャップ状反応管4の内部に上下動及び回転可能な軸部材
5の上端に支持させた保持台6を設け、更にこの上にフ
ローチャンネル7を載置したものである。Conventionally, a barrel type vapor phase growth apparatus has been used as an apparatus for processing a large number of substrates at once. FIG. 4 shows an example of a conventional device, in which a gas introduction pipe 1 is provided at the top and a gas discharge pipe is provided at the lower side.
A holding base 6 supported on the upper end of a vertically movable and rotatable shaft member 5 is provided inside the cap-shaped reaction tube 4 in which the RF coil 3 is wound around the outer circumference of which the RF coil 3 is wound. The flow channel 7 is mounted on the.
保持台6は基板の保持と加熱に用いるもので、カーボン
製の多角錐台状体の側面に基板取付溝6aを設けたもので
ある。また、フローチャンネル7は上方から導入される
気相成長ガスの整流と予備加熱に用いるもので滑らかな
表面を有する弾頭状カバーである。The holding table 6 is used for holding and heating the substrate, and has a substrate mounting groove 6a provided on the side surface of a polygonal pyramid-shaped body made of carbon. The flow channel 7 is used for rectifying and preheating the vapor growth gas introduced from above, and is a warhead-like cover having a smooth surface.
前記従来装置は基板取付溝6aに基板を取り付けた後、RF
コイル3で保持台6と誘導加熱して前記基板を所定の温
度に保持すると共に、ガス導入管1から気相成長ガスを
導入して基板上に薄膜を形成するものである。即ち、反
応管4内に導入された気相成長ガスはフローチャンネル
7で整流されて円滑に下方に流れ、保持台6からの熱伝
導により高温となっているフローチャンネル7の下端近
傍の加熱部で予備加熱されて熱分解反応を開始し、反応
生成物が基板上に堆積して薄膜が形成される。In the conventional device, after mounting the board in the board mounting groove 6a, RF
The coil 3 is induction-heated with the holding table 6 to hold the substrate at a predetermined temperature, and the vapor growth gas is introduced from the gas introduction pipe 1 to form a thin film on the substrate. That is, the vapor growth gas introduced into the reaction tube 4 is rectified by the flow channel 7 and smoothly flows downward, and the heating portion near the lower end of the flow channel 7 is heated to a high temperature by heat conduction from the holding table 6. Is preheated to start the thermal decomposition reaction, and the reaction product is deposited on the substrate to form a thin film.
しかし、前記従来装置では基板上に多重薄膜を形成する
場合急峻な界面が得られない。これは、例えばAガス,B
ガスの2種類の気相成長ガスを交互に反応管内に導入す
るとこれらAガス,Bガスが反応管内で一部混合してしま
うからである。そこで従来は前記AガスとBガスの間に
パージガスを流すとにより、前記ガスの混合を防止して
いるがこのため処理時間が長くなり生産性が低下する不
都合があった。However, in the conventional device described above, a steep interface cannot be obtained when forming multiple thin films on a substrate. This is, for example, A gas, B
This is because if two kinds of vapor phase growth gases of gas are alternately introduced into the reaction tube, these A gas and B gas will be partially mixed in the reaction tube. Therefore, conventionally, the purge gas is caused to flow between the A gas and the B gas to prevent the mixing of the gases, but this causes a problem that the processing time becomes long and the productivity is lowered.
また、前記従来装置では、前記予備加熱により薄膜形成
を良好にしているが、該予備加熱によりフローチャンネ
ル7の下端近傍にも堆積物8が付着し、次第にその量が
増加するに伴って基板面上に剥離,落下して薄膜の品質
を低下させる。そこで、適宜フローチャンネル7を取り
外して清掃する必要があるが、前記の如くフローチャン
ネル7は整流作用を果たすために表面に突起物を設けら
れないので着脱しにくく保守が容易でないという不都合
もあった。Further, in the conventional apparatus, the thin film formation is improved by the preheating, but the preheating causes the deposit 8 to adhere to the vicinity of the lower end of the flow channel 7, and the amount of the deposit 8 gradually increases and the surface of the substrate is gradually increased. It peels off and falls on the surface, degrading the quality of the thin film. Therefore, it is necessary to remove and clean the flow channel 7 as appropriate, but as described above, since the flow channel 7 does not have a protrusion on the surface in order to perform the rectifying action, it is difficult to attach and detach, and maintenance is not easy. .
本発明者は前記不都合に鑑み種々考究した結果、前記従
来装置では反応管4内にガスを導入したときに該反応管
4内の上方に澱み部9ができ、かつ該澱み部9と接して
ガスが流れるため前記ガスの混合が生じることを知見し
た。As a result of various studies made by the inventor in view of the above-mentioned inconvenience, in the conventional apparatus, when a gas is introduced into the reaction tube 4, a stagnation portion 9 is formed above the reaction tube 4 and is in contact with the stagnation portion 9. It has been found that the gas flows because the gas flows.
本発明は前記知見に基づいて、急峻な界面を有する多重
薄膜が形成できるバレル型気相成長装置を提供すること
を目的とするものである。An object of the present invention is to provide a barrel type vapor phase growth apparatus capable of forming multiple thin films having steep interfaces based on the above findings.
そこで、本発明は上記目的を達成するため、ガス導入管
とガス排出管とを有するキャップ状反応管の内部に、保
持台とその上に載置するフローチャンネルとを設けてな
るバレル型気相成長装置において、前記フローチャンネ
ルを円筒状に形成すると共に、保持台を反応管内の所定
位置にセットしたときにおける前記円筒状のフローチャ
ンネルの上端近傍に対応する位置の反応管側面に少なく
とも2個所のガス導入管を前記フローチャンネルの中心
軸に向けて設けたことを特徴とする。Therefore, in order to achieve the above object, the present invention provides a barrel-type vapor phase in which a holding base and a flow channel mounted on the holding base are provided inside a cap-shaped reaction pipe having a gas introduction pipe and a gas discharge pipe. In the growth apparatus, the flow channel is formed in a cylindrical shape, and at least two places are provided on the side surface of the reaction tube at a position corresponding to the vicinity of the upper end of the cylindrical flow channel when the holding table is set at a predetermined position in the reaction tube. It is characterized in that the gas introduction pipe is provided toward the central axis of the flow channel.
以下、第1図乃至第3図を用いて本発明の実施例を説明
するが、図中前記第4図と同一構成部分には同一記号を
付してある。An embodiment of the present invention will be described below with reference to FIGS. 1 to 3, and the same components as those in FIG. 4 are designated by the same symbols.
第1図は保持台とフローチャンネルを外面で示す本発明
装置の断面図、第2図は第1図のII−II線断面図であ
る。FIG. 1 is a sectional view of the device of the present invention showing the holding base and the flow channel on the outer surface, and FIG. 2 is a sectional view taken along line II-II of FIG.
本発明装置が前記第4図の従来装置と異なるのはフロー
チャンネルの形状とガス導入管の配置にある。即ち、本
発明装置のフローチャンネル10は適宜長さの円筒状で、
上端に鍔部10aを有する。11は該フローチャンネル10上
端の任意の位置に設けた着脱用の逆U字状突起である。The device of the present invention is different from the conventional device of FIG. 4 in the shape of the flow channel and the arrangement of the gas introduction pipes. That is, the flow channel 10 of the device of the present invention has a cylindrical shape with an appropriate length,
The upper end has a collar portion 10a. Reference numeral 11 is an inverted U-shaped projection for attachment / detachment provided at an arbitrary position on the upper end of the flow channel 10.
次にガス導入管12は、図示の如く保持台6を反応管4内
の所定位置にセットしたときにおける前記円筒状のフロ
ーチャンネル10の上端近傍に対応する位置の反応管4の
側面に設けたもので、取付方向は円筒状のフローチャン
ネル10の中心方向とする。ガス導入管12は少なくとも2
個所設ける必要があるがより多個所に設けても良く、ま
た、設置個所は反応管4の外周に沿って等間隔とすのが
望ましい。Next, the gas introduction tube 12 is provided on the side surface of the reaction tube 4 at a position corresponding to the vicinity of the upper end of the cylindrical flow channel 10 when the holding table 6 is set at a predetermined position in the reaction tube 4 as shown in the figure. The mounting direction is the central direction of the cylindrical flow channel 10. At least two gas inlet tubes 12
It is necessary to provide it at more places, but it may be provided at more places, and it is desirable that the places be provided at equal intervals along the outer circumference of the reaction tube 4.
次に前記の如く構成した本発明装置を用いて基板上に薄
膜を形成する操作を前記同様に行なった。この結果、前
記第4図の従来装置と同等以上に良好な薄膜を形成でき
た。これは、ガス導入管12から噴出した気相成長ガスが
円筒状のフローチャンネル10の胴部を回周して均一に拡
散し、かつ充分な長さの該胴部を流下する過程で整流さ
れ、更に該円筒状のフローチャンネル10の下端近傍の高
温部で予備加熱され好適な薄膜形成状態が得られるから
である。また、多重薄膜の形成ではパージガスを用いな
くても急峻な界面が得られた。これは円筒状のフローチ
ャンネル10上方の自由空間が袋部で、かつガス導入管12
から導入の気相成長ガスの流路と上下に区画されている
ので、該気相成長ガスが前記自由空間と接する割合が前
記従来装置に装置に比べ極めて少ないからである。な
お、本発明装置を気相成長ガスの導入と同時に反応管4
の頂部から水素等をパージガスとして少量導入するよう
構成すれば、前記自由空間がパージガスで充満されるの
でガス導入管12から導入される気相成長ガスへの影響が
更に減少し、より急峻な界面を有する多種薄膜が形成で
きる。また、フローチャンネル10を単に円筒状として鍔
部10aを有さないものとしても良いが、鍔部10aを有する
方が多種薄膜を形成する場合には好ましい。なお、本発
明装置も前記従来装置と同様、予備加熱に伴って円筒状
のフローチャンネル10の下端近傍に堆積物8を生ずるが
これは逆U字状の突起11を利用して取り外し清掃すれば
良い。Next, an operation of forming a thin film on a substrate using the apparatus of the present invention configured as described above was performed in the same manner as above. As a result, it was possible to form a thin film that was as good as or better than the conventional device shown in FIG. This is rectified in the process in which the vapor growth gas ejected from the gas introduction pipe 12 circulates around the body of the cylindrical flow channel 10 and diffuses uniformly, and flows down the body of a sufficient length. Further, it is possible to obtain a suitable thin film formation state by preheating in a high temperature portion near the lower end of the cylindrical flow channel 10. In addition, a steep interface was obtained without using a purge gas in the formation of multiple thin films. This is because the free space above the cylindrical flow channel 10 is the bag, and the gas introduction pipe 12
Since it is divided into the upper and lower sides of the flow path of the vapor growth gas introduced from the above, the ratio of the vapor growth gas in contact with the free space is extremely small in the conventional device as compared with the device. The apparatus of the present invention is used in the reaction tube 4 at the same time when the vapor growth gas is introduced.
If a small amount of hydrogen or the like is introduced as a purge gas from the top of the, the free space is filled with the purge gas, so that the effect on the vapor phase growth gas introduced from the gas introduction pipe 12 is further reduced, and a steeper interface is obtained. It is possible to form various thin films having Further, the flow channel 10 may be simply cylindrical and not have the flange portion 10a, but it is preferable to have the flange portion 10a when forming various thin films. In the apparatus of the present invention, as in the case of the conventional apparatus, a deposit 8 is generated in the vicinity of the lower end of the cylindrical flow channel 10 due to the preheating. This deposit 8 can be removed and cleaned by utilizing the inverted U-shaped projection 11. good.
次に第3図を用いて別の実施例を説明する。第3図は円
筒状のフローチャンネル10と保持台5を外面で示す断面
図である。Next, another embodiment will be described with reference to FIG. FIG. 3 is a sectional view showing the cylindrical flow channel 10 and the holding table 5 on the outer surface.
本実施例では反応管4をガス導入管により上方で上蓋41
と本体42とに分割し、かつ着脱自在に構成すると共に、
該本体42の上方に連接して前記上蓋41を内蔵する前室43
を設けたものである。更に44はパージ管で、一端は上蓋
41の頂部に連設し、他端は前室43の天井部を摺動自在に
貫通してピストンの如き上下動機構45に連設する。46は
パージ管44の上下動に追従できるようにコイル状にした
コイル管である。In this embodiment, the reaction tube 4 is provided with a gas introduction tube so that an upper lid 41 is provided above the reaction tube 4.
It is divided into a main body 42 and a detachable body, and
A front chamber 43 connected to the upper side of the main body 42 and containing the upper lid 41 therein.
Is provided. Furthermore, 44 is a purge pipe, and one end is an upper lid.
It is connected to the top of 41, and the other end is connected to a vertical movement mechanism 45 such as a piston, slidably penetrating the ceiling of the front chamber 43. Reference numeral 46 is a coil tube that is formed into a coil shape so as to follow the vertical movement of the purge tube 44.
前記の如く構成した本装置では基板状に薄膜を形成後、
上蓋41を上動すると共に軸部材5を上動し保持台6を前
室43内に移動して処理済基板と未処理基板を交換する。
これにより反応管4の下方側部に付着する堆積物47の悪
影響を防止することができる。即ち、薄膜形成時には円
筒状のフローチャンネル10の下端近傍に堆積物9が付着
するだけでなく反応管4の下方側部にも堆積物47が付着
し、これはいずれも剥離,落下する。このため、一般的
な気相成長装置では前室を反応管の下方に配置している
ため薄膜形成後に保持台を下げることになり前記堆積物
47の落下による基板の品質低下が生じていた。本実施例
装置は多重薄膜形成に適した構造を有しながらかつ前記
堆積物47の落下による不都合を解決したものである。な
お、本実施例ではパージ管44を用いたが、パージガスを
要しないときは単なる管または棒としても良く、このと
きコイル管46も不要である。With this device configured as described above, after forming a thin film on the substrate,
The upper lid 41 is moved up and the shaft member 5 is moved up to move the holding table 6 into the front chamber 43 to exchange the processed substrate and the unprocessed substrate.
As a result, it is possible to prevent the adverse effects of the deposit 47 adhering to the lower side portion of the reaction tube 4. That is, when the thin film is formed, not only the deposit 9 adheres to the vicinity of the lower end of the cylindrical flow channel 10 but also the deposit 47 adheres to the lower side portion of the reaction tube 4, both of which are separated and dropped. For this reason, in a general vapor phase growth apparatus, since the antechamber is arranged below the reaction tube, the holder is lowered after the thin film is formed.
The quality of the board had deteriorated due to the drop of 47. The apparatus of this embodiment has a structure suitable for forming multiple thin films and solves the inconvenience caused by the fall of the deposit 47. Although the purge pipe 44 is used in the present embodiment, it may be a simple pipe or rod when the purge gas is not required, and the coil pipe 46 is not necessary at this time.
本発明装置は前記の如く、フローチャンネルを円筒状に
すると共に、該円筒状のフローチャンネルの中心に向け
て気相成長ガスが吹き付けられるように反応管の側面に
ガス導入管を設けたので従来と同等の薄膜が形成でき、
特に多重薄膜の形成では、反応管側面から導入される気
相成長ガスが円筒状のフローチャンネルの上方の自由空
間による影響を受けにくいので、パージガスを途中に介
さずに異種の気相成長ガスを順次反応管内に導入しても
急峻な界面を有する多重薄膜が得られるので、パージガ
ス使用量の低減と処理時間の低減が図れ従来より大幅に
生産性を向上することができる。また、本発明装置で
は、円筒状フローチャンネルの頂部は特別な作用を有さ
ないのでここに着脱用の突起を設けることができ、フロ
ーチャンネルの保守を容易にすることができる。In the apparatus of the present invention, as described above, the flow channel is formed into a cylindrical shape, and the gas introduction tube is provided on the side surface of the reaction tube so that the vapor growth gas is blown toward the center of the cylindrical flow channel. Can form a thin film equivalent to
Particularly in the formation of multiple thin films, the vapor growth gas introduced from the side surface of the reaction tube is not easily affected by the free space above the cylindrical flow channel, so that different types of vapor growth gas can be used without a purge gas in the middle. Even if they are successively introduced into the reaction tube, a multiple thin film having a steep interface can be obtained, so that the amount of purge gas used and the processing time can be reduced, and the productivity can be greatly improved as compared with the conventional case. Further, in the device of the present invention, since the top portion of the cylindrical flow channel has no special action, a protrusion for attachment / detachment can be provided here, and the maintenance of the flow channel can be facilitated.
また、反応管をガス導入管の上方位置で上蓋と本体とに
着脱自在に構成すると共に、該反応管の上方に前室を設
ける構成とすれば、反応管の下方側部に付着する堆積物
による悪影響をも防止することができる。Further, when the reaction tube is configured to be detachably attached to the upper lid and the main body above the gas introduction tube and the front chamber is provided above the reaction tube, deposits attached to the lower side portion of the reaction tube It is possible to prevent an adverse effect due to.
第1図は本発明装置の一実施例を示す断面正面図、第2
図は第1図のII−II線断面図、第3図は本発明装置の他
の実施例を示す断面正面図、第4図は従来装置の一例を
示す断面正面図である。 2…ガス排出管、3…RFコイル、4…反応管、5…軸部
材、6…保持台、10…フローチャンネル、12…ガス導入
管、41…反応管4の上蓋、42…反応管4の本体、43…前
室FIG. 1 is a sectional front view showing an embodiment of the device of the present invention, and FIG.
1 is a sectional view taken along line II-II of FIG. 1, FIG. 3 is a sectional front view showing another embodiment of the device of the present invention, and FIG. 4 is a sectional front view showing an example of a conventional device. 2 ... Gas discharge pipe, 3 ... RF coil, 4 ... Reaction pipe, 5 ... Shaft member, 6 ... Holding base, 10 ... Flow channel, 12 ... Gas introduction pipe, 41 ... Reaction pipe 4 upper lid, 42 ... Reaction pipe 4 Body of the 43 ... front chamber
Claims (2)
プ状反応管の内部に、保持台とその上に載置するフロー
チャンネルとを設けてなるバレル型気相成長装置におい
て、前記フローチャンネルを円筒状に形成すると共に、
保持台を反応管内の所定位置にセットしたときにおける
前記円筒状のフローチャンネルの上端近傍に対応する位
置の反応管側面に少なくとも2個所のガス導入管を前記
フローチャンネルの中心軸に向けて設けたことを特徴と
するバレル型気相成長装置。1. A barrel type vapor phase growth apparatus in which a holding base and a flow channel mounted on the holding base are provided inside a cap-shaped reaction pipe having a gas introduction pipe and a gas discharge pipe. Is formed into a cylindrical shape,
At least two gas introduction pipes were provided on the side surface of the reaction tube at a position corresponding to the vicinity of the upper end of the cylindrical flow channel when the holding table was set at a predetermined position in the reaction tube toward the central axis of the flow channel. A barrel type vapor phase growth apparatus characterized in that
ガス導入管設置位置の上方で上蓋と本体とに着脱可能に
構成され、かつ該反応管の前記本体の上方に連設して上
蓋を内蔵する前室を設けたことを特徴とする特許請求の
範囲第1項記載のバレル型気相成長装置。2. The reaction tube having a side gas introduction tube is configured to be attachable / detachable to / from the upper lid and the body above the gas introduction tube installation position, and the reaction tube is continuously provided above the body of the reaction tube. The barrel type vapor phase growth apparatus according to claim 1, further comprising a front chamber having a built-in upper lid.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17194587A JPH07100862B2 (en) | 1987-07-09 | 1987-07-09 | Barrel type vapor phase growth equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP17194587A JPH07100862B2 (en) | 1987-07-09 | 1987-07-09 | Barrel type vapor phase growth equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6415374A JPS6415374A (en) | 1989-01-19 |
| JPH07100862B2 true JPH07100862B2 (en) | 1995-11-01 |
Family
ID=15932713
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17194587A Expired - Lifetime JPH07100862B2 (en) | 1987-07-09 | 1987-07-09 | Barrel type vapor phase growth equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH07100862B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0643548B2 (en) * | 1990-08-22 | 1994-06-08 | 東洋紡績株式会社 | Viscoelastic resin composition for damping material |
| JP3121260B2 (en) * | 1996-04-08 | 2000-12-25 | 大阪瓦斯株式会社 | Pipeline reinforcement technology |
| JP4250131B2 (en) | 2004-09-16 | 2009-04-08 | カナフレックスコーポレーション株式会社 | Drainage pipe repair method |
-
1987
- 1987-07-09 JP JP17194587A patent/JPH07100862B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6415374A (en) | 1989-01-19 |
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