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JPH07104937B2 - Visual inspection method for mounted parts - Google Patents
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JPH07104937B2 - Visual inspection method for mounted parts - Google Patents

Visual inspection method for mounted parts

Info

Publication number
JPH07104937B2
JPH07104937B2 JP61188275A JP18827586A JPH07104937B2 JP H07104937 B2 JPH07104937 B2 JP H07104937B2 JP 61188275 A JP61188275 A JP 61188275A JP 18827586 A JP18827586 A JP 18827586A JP H07104937 B2 JPH07104937 B2 JP H07104937B2
Authority
JP
Japan
Prior art keywords
component
defective product
candidate
appearance inspection
parts
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61188275A
Other languages
Japanese (ja)
Other versions
JPS6344282A (en
Inventor
一成 吉村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP61188275A priority Critical patent/JPH07104937B2/en
Publication of JPS6344282A publication Critical patent/JPS6344282A/en
Publication of JPH07104937B2 publication Critical patent/JPH07104937B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Image Processing (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【発明の詳細な説明】 (技術分野) 本発明は、印刷配線基板上に実装された部品の外観を検
査するための実装部品の外観検査方法に関するものであ
り、例えば、チップ部品が実装された印刷配線基板にお
ける部品の実装状態や半田付け状態等を自動的に検査す
るために用いられるものである。
Description: TECHNICAL FIELD The present invention relates to a mounting component appearance inspection method for inspecting the appearance of a component mounted on a printed wiring board, for example, a chip component is mounted. It is used to automatically inspect the mounting state and soldering state of components on a printed wiring board.

(背景技術) 従来、印刷配線基板上に実装された部品の外観を検査す
るためには、第6図(a)に示すように、印刷配線基板
(7)上の部品(8)に半田付け部分(9)を光らせる
ような照明を行い、テレビカメラ等により部品実装面を
撮像して得た画像信号を二値化し、第6図(b)に示す
ように、半田付け部分等の画像(9′)を検出し、第6
図(c)に示すように、縦ずれ検査領域(10)や横ずれ
検査領域(11)を設定し、各領域(10),(11)内での
測定を行うことによって部品(8)のずれを測定し、ま
た、欠品検査領域(12)を設定し、該領域(12)内での
色の測定を行い、部品(8)と基板(7)との色の差に
より欠品の有無を検査していた。このように、テレビカ
メラ等により部品実装面を撮像して得た画像信号を二値
化し、実装部品の外観を検査する装置は、例えば、特開
昭58-139278号公報などにも開示されている。
(Background Art) Conventionally, in order to inspect the appearance of a component mounted on a printed wiring board, as shown in FIG. 6 (a), soldering is performed on the component (8) on the printed wiring board (7). Illumination for illuminating the portion (9) is performed, and the image signal obtained by imaging the component mounting surface with a television camera or the like is binarized, and as shown in FIG. 9 ') is detected and the sixth
As shown in FIG. 6 (c), the vertical deviation inspection area (10) and the lateral deviation inspection area (11) are set, and measurement is performed in each area (10) and (11) to shift the component (8). Is also measured, and the out-of-stock inspection area (12) is set, and the color in the area (12) is measured, and the presence or absence of the out-of-stock article is determined by the color difference between the component (8) and the board (7). Was inspecting. As described above, an apparatus for binarizing an image signal obtained by picking up an image of a component mounting surface with a television camera or the like and inspecting the appearance of the mounted component is disclosed in, for example, Japanese Patent Laid-Open No. 58-139278. There is.

しかしながら、半田付けの状態は多種多様であり、例え
ば、第7図(a)に示すように半田不足部分(9A)と半
田過剰部分(9B)とがある場合には、同図(b)に示す
ように、半田付け部分の画像(9A′),(9B′)を正確
に二値化することができず、部品(8)のずれ測定に誤
差を生じるという問題があった。また、第8図(a)に
示すように、実装部品(8)に文字(13)やトリミング
(14)がある場合には、同図(b)に示すような画像が
得られ、半田付け部分の画像(9′)と半田付け部分以
外の画像(13′),(14′)とが紛らわしく、測定困難
な場合が生じる。さらに、基板(7)に白色のシルクが
印刷してあったり、セラミック基板のように白の基板色
が露出している場合や、実装部品(8)の色が基板
(7)の色と類似している場合にも測定が困難であっ
た。
However, there are various kinds of soldering states. For example, if there is a solder deficient portion (9A) and a solder excess portion (9B) as shown in FIG. As shown in the figure, the images (9A ') and (9B') of the soldered portion cannot be accurately binarized, and there is a problem that an error occurs in the displacement measurement of the component (8). Further, as shown in FIG. 8 (a), when the mounting component (8) has characters (13) and trimming (14), an image as shown in FIG. 8 (b) is obtained and soldering is performed. The image (9 ') of the portion and the images (13') and (14 ') other than the soldered portion are confusing, which sometimes makes measurement difficult. Further, when the white silk is printed on the board (7) or the white board color is exposed like a ceramic board, the color of the mounting component (8) is similar to the color of the board (7). It was difficult to measure even while doing.

そこで、例えば、特開昭60-15780号公報に開示されてい
るように、距離画像信号を利用して対象物体を認識する
ことも考えられるが、印刷配線基板上に部品が過多に又
は過少に実装されていたり、本来、実装すべき部品以外
の部品が実装されたりする異物混載があると、距離画像
信号を利用していても異物が検出されることになる。そ
の場合、異物は実装位置や実装方向が良品と一致するは
ずがなく、仮に一致しても印刷配線基板が全体として不
良品となることに変わりは無いから、良品と比較する作
業自体が無駄になり、徒らに検査時間を長引かせるだけ
である。
Therefore, for example, as disclosed in Japanese Patent Application Laid-Open No. 60-15780, it may be possible to recognize a target object by using a range image signal, but there are too many or too few parts on the printed wiring board. If a foreign object is mixedly mounted, or a component other than the component to be originally mounted is mounted, the foreign substance is detected even if the distance image signal is used. In that case, the mounting position and mounting direction of foreign matter should not be the same as that of a good product, and even if they are the same, the printed wiring board will still be a defective product as a whole. It just makes the people prolong their inspection time.

(発明の目的) 本発明は上述のような点に鑑みてなされたものであり、
その目的とするところは、印刷配線基板上に部品が過多
に又は過少に実装されていたり、本来、実装すべき部品
以外の部品が実装されたりする異物混載があれば、実装
部品の実装位置や実装方向を良品と比較する本来の外観
検査作業から除外することにより、検査作業を簡略化で
きるようにした実装部品の外観検査方法を提供すること
にある。
(Object of the Invention) The present invention has been made in view of the above points,
The purpose is that if there are too many or too few components mounted on the printed wiring board, or if there is foreign matter mixed mounting such as components other than the components that should be originally mounted, the mounting position of the mounted components or An object of the present invention is to provide a visual inspection method for a mounted component, which is capable of simplifying the inspection work by excluding the mounting direction from the original visual inspection work for comparing with a non-defective product.

(発明の開示) 本発明にあっては、印刷配線基板上に実装された複数個
の部品の距離画像を距離画像検出部で検出した後、この
検出した距離画像を分離認識部でラベル付けし、ラベル
付けした各ランド毎に良品と対応する候補が存在するか
どうかを判定し、候補が存在しなければ異物混載とする
一次判定をした後、候補が存在すれば実装部品の外観検
査となる良品とのラベル対応付けを行う二次判定を行う
ことを特徴とするものである。
DISCLOSURE OF THE INVENTION In the present invention, the distance image of a plurality of components mounted on the printed wiring board is detected by the distance image detecting unit, and then the detected distance image is labeled by the separation recognition unit. , It is judged whether or not there is a candidate corresponding to a non-defective product for each labeled land, and if there is no candidate, the primary judgment is made that foreign substances are mixed, and if there is a candidate, it is an appearance inspection of the mounted parts. It is characterized in that a secondary determination is made to perform label correspondence with non-defective products.

第1図は本発明の方法を実施するための装置の構成を示
している。図中、(1)は印刷配線基板(7)上に実装
された複数個の部品の距離画像を検出するための距離画
像検出部である。(2)は前記検出部(1)によって検
出された距離画像を部品のみが抽出されるような閾値レ
ベルで二値化する二値化処理部である。(3)は前記二
値化処理部(2)にて得られた二値化画像から部品の分
離認識を行う分離認識部である。(4)は分離認識され
た部品の特徴量を算出する部品特徴量算出部である。
(5)は予め良品について算出した特徴量を保持する良
品特徴量記憶部である。そして、(6)は部品特徴量算
出部(4)と良品特徴量記憶部(5)との各特徴量を比
較して良否判定を行う比較判定部である。
FIG. 1 shows the construction of an apparatus for carrying out the method of the present invention. In the figure, (1) is a distance image detection unit for detecting distance images of a plurality of components mounted on the printed wiring board (7). (2) is a binarization processing unit that binarizes the distance image detected by the detection unit (1) at a threshold level such that only parts are extracted. (3) is a separation recognition unit that performs separation recognition of components from the binarized image obtained by the binarization processing unit (2). (4) is a component feature amount calculation unit that calculates the feature amount of the separately recognized components.
(5) is a non-defective item feature amount storage unit that holds the feature amount calculated in advance for non-defective items. Further, (6) is a comparison / determination unit that compares the respective feature amounts of the component feature amount calculation unit (4) and the non-defective item feature amount storage unit (5) to perform pass / fail determination.

第2図は距離検出部(1)による距離画像検出の様子を
示している。第2図においては、三角測量による光学式
の距離検出部(1)を用いて、第3図(a)に示すよう
な部品(8)の実装された基板(7)における各点の高
さを測定している。そして、基板(7)又は距離検出部
(1)をX-Yステージ等を用いてX方向及びY方向に走
査し、部品実装された基板(7)の距離画像を構成す
る。この距離画像から部品(8)の形状のみが白く(又
は黒く)出るように画像信号を二値化して、第3図
(b)に示すような二値化画像を得る。この二値化画像
を用いて、各部品画像(8′)の分離認識を行い、ラベ
リングする。第3図(c)にラベリングされた状態の一
例を示す。そして、ラベル付けされた各ランド(連結性
を持つ白又は黒の固まり)毎に、第4図に示すように、
重心、面積、外接四角形、慣性主軸方向等の特徴量を演
算する。そして、予め算出しておいた良品基板の特徴量
と比較を行う。
FIG. 2 shows how the distance image is detected by the distance detector (1). In FIG. 2, the height of each point on the board (7) on which the component (8) as shown in FIG. 3 (a) is mounted by using the optical distance detection unit (1) by triangulation. Is being measured. Then, the board (7) or the distance detection unit (1) is scanned in the X direction and the Y direction using an XY stage or the like to form a distance image of the board (7) on which components are mounted. The image signal is binarized so that only the shape of the component (8) appears white (or black) from this distance image, and a binarized image as shown in FIG. 3 (b) is obtained. Using this binarized image, each component image (8 ') is separately recognized and labeled. An example of the labeled state is shown in FIG. Then, for each labeled land (white or black mass having connectivity), as shown in FIG.
A feature amount such as a center of gravity, an area, a circumscribed quadrangle, and a principal axis of inertia is calculated. Then, the characteristic amount of the non-defective substrate calculated in advance is compared.

具体的な検査の流れを第5図(a)〜(c)のフローチ
ャートに沿って説明する。まず、第5図(a)に示すよ
うに、部品を実装された基板の距離画像を入力し、入力
された画像信号を二値化して、二値化画像における各ラ
ンドをラベリングして分離認識し、面積フィルタリング
を行った後、各ランドの特徴量演算を行う。特徴量演算
が終了すると、ラベリングしたランドの重心と良品の重
心との距離を全て求める。検査ランド(n)と良品ラン
ド(m)との重心距離Rnmは次式で求められる。
A specific flow of inspection will be described with reference to the flowcharts of FIGS. First, as shown in FIG. 5 (a), a distance image of a board on which components are mounted is input, the input image signal is binarized, and each land in the binarized image is labeled and separately recognized. Then, after performing area filtering, the feature amount calculation of each land is performed. When the feature amount calculation is completed, all distances between the center of gravity of the labeled land and the center of gravity of the non-defective product are obtained. The center-of-gravity distance Rnm between the inspection land (n) and the non-defective land (m) is calculated by the following equation.

ただし、(Xng,Yng)は検査ランド(n)の重心座標、
(Xmg,Ymg)は良品ランド(m)の重心座標である。
However, (Xng, Yng) is the barycentric coordinate of the inspection land (n),
(Xmg, Ymg) are the barycentric coordinates of the non-defective land (m).

次に、第5図(b)に示すように、重心距離Rnmが所定
の規格内に入っていれば、良品に対応する候補として記
憶し、候補が1つも存在しなければ欠品と判定する。良
品ランド(m)に対応する検査ランド(n)が1つであ
れば、良品とのラベル対応づけを行い、複数個存在する
場合には、次式の評価関数αnmを計算する。
Next, as shown in FIG. 5 (b), if the center-of-gravity distance Rnm is within a predetermined standard, it is stored as a candidate corresponding to a non-defective product, and if there is no candidate, it is determined to be out of stock. . If there is one inspection land (n) corresponding to the non-defective product land (m), the label is associated with the non-defective product, and if there are multiple inspection lands (n), the evaluation function αnm of the following equation is calculated.

ただし、Anは検査ランド(n)の面積であり、Amは検査
ランド(m)の面積である。また、Rmeanは次式で表さ
れる。
However, An is the area of the inspection land (n), and Am is the area of the inspection land (m). Rmean is expressed by the following equation.

Rmean=Σ(min Rnm′)/K 上式において、Rnm′は規格内の距離であり、Σ(min R
nm′)はその最小値の総和である。また、Kは距離で1:
1に対応づけされた良品の個数である。
Rmean = Σ (min Rnm ′) / K In the above equation, Rnm ′ is the standard distance, and Σ (min Rnm ′)
nm ') is the sum of the minimum values. Also, K is a distance of 1:
It is the number of non-defective products associated with 1.

αnmが規格内であるものに対して、良品とのラベル対応
づけを行い、他のものは異物混載と判定する。この方法
を用いると、検査時の基板の位置決め精度が荒くても判
定を行うことが可能となり、複雑な処理も不要となる。
評価関数のより簡単な式として、次式を用いて計算して
も良い。
Labels with α nm within specifications are associated with non-defective products, and other products are determined to be mixed with foreign matter. When this method is used, it is possible to make a determination even if the positioning accuracy of the substrate at the time of inspection is rough, and complicated processing is unnecessary.
The following formula may be used as a simpler formula for the evaluation function.

αnm′=(Rnm−Rmean)+An/Am 次に、対応づけされたランドに関しては、第5図(c)
に示すように、面積比較を行い、An≫Amの場合には“部
品間違い”又は“ブリッジ”と判定し、An≪Amの場合に
は“部品立ち”又は“部品欠け”と判定し、ほぼ等しい
場合には、外接四角形を調べる。外接四角形が予め設定
された範囲内になければ、“部品ずれ”と判定する。次
に、慣性主軸方向を見て、“部品傾き”の有無を判定す
る。面積、外接四角形、慣性主軸方向等の各条件が良品
と一致するものについては、良品であると判定する。
αnm ′ = (Rnm−Rmean) + An / Am Next, regarding the associated land, FIG. 5 (c)
As shown in, the area comparison is performed, and if An >> Am, it is judged as "part error" or "bridge", and if An << Am, it is judged as "part standing" or "part missing". If so, check the bounding box. If the circumscribed quadrangle is not within the preset range, it is determined as "part shift". Next, by looking in the direction of the principal axis of inertia, it is determined whether or not there is "part inclination". If the conditions such as the area, the circumscribed quadrangle, and the principal axis of inertia are the same as those of the non-defective product, the product is determined to be the non-defective product.

(発明の効果) 以上のように本発明にあっては、印刷配線基板上に実装
された複数個の部品の距離画像を距離画像検出部で検出
し、この検出した距離画像を分離認識部でラベル付け
し、ラベル付けした各ランド毎に良品と対応する候補が
存在するかどうかを判定し、候補が存在しなければ異物
混載とする一次判定をした後、候補が存在すれば実装部
品の外観検査となる良品とのラベル対応付けを行う二次
判定を行うようにしたので、検査時の基板の位置決め精
度が荒くても判定を行うことが可能となり、また、印刷
配線基板上に部品が過多に又は過少に実装されていた
り、本来、実装すべき部品以外の部品が実装されたりす
る異物混載があれば、外観検査作業から除外することに
より、検査作業を簡略化できるという効果がある。
(Effect of the invention) As described above, in the present invention, the distance image detecting unit detects the distance images of a plurality of components mounted on the printed wiring board, and the detected distance images are detected by the separation recognition unit. After labeling, it is judged whether or not there is a candidate corresponding to a non-defective product for each labeled land, and if there is no candidate, the primary judgment is made that foreign substances are mixed, and if there is a candidate, the appearance of the mounted component Since the secondary judgment is performed by associating labels with non-defective products to be inspected, it is possible to make judgment even if the positioning accuracy of the board during inspection is rough, and there are too many parts on the printed wiring board. In addition, if there is foreign matter mixed mounting that is mounted excessively or insufficiently, or if a component other than the component to be originally mounted is mounted, there is an effect that the inspection work can be simplified by excluding it from the visual inspection work.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の基本構成を示すブロック図、第2図は
同上に用いる距離画像検出部を示す斜視図、第3図
(a)乃至(c)は同上の動作説明図、第4図は同上に
用いる実装部品の特徴量を説明するための説明図、第5
図(a)乃至(c)は同上の一実施例の動作を示すフロ
ーチャート、第6図(a)乃至(c)、第7図(a)
(b)及び第8図(a)(b)は従来の検査方法を説明
するための説明図である。 (1)は距離画像検出部、(2)は二値化処理部、
(3)は分離認識部、(4)は部品特徴量算出部、
(5)は良品特徴量記憶部、(6)は比較判定部、
(7)は基板、(8)は部品である。
FIG. 1 is a block diagram showing a basic configuration of the present invention, FIG. 2 is a perspective view showing a distance image detecting section used in the same as above, and FIGS. 3 (a) to 3 (c) are operation explanatory diagrams of the same as above, and FIG. Is an explanatory view for explaining the characteristic amount of the mounted component used in the above, FIG.
FIGS. 6 (a) to 6 (c) are flowcharts showing the operation of the above embodiment, FIGS. 6 (a) to 6 (c), and FIG. 7 (a).
FIGS. 8B and 8A and 8B are explanatory views for explaining a conventional inspection method. (1) is a distance image detection unit, (2) is a binarization processing unit,
(3) is a separation recognition unit, (4) is a component feature amount calculation unit,
(5) is a non-defective item feature amount storage unit, (6) is a comparison determination unit,
(7) is a substrate and (8) is a component.

フロントページの続き (51)Int.Cl.6 識別記号 庁内整理番号 FI 技術表示箇所 H05K 13/08 D 8315−4E Continuation of front page (51) Int.Cl. 6 Identification code Office reference number FI technical display area H05K 13/08 D 8315-4E

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】印刷配線基板上に実装された複数個の部品
の距離画像を距離画像検出部で検出した後、この検出し
た距離画像を分離認識部でラベル付けし、ラベル付けし
た各ランド毎に良品と対応する候補が存在するかどうか
を判定し、候補が存在しなければ異物混載とする一次判
定をした後、候補が存在すれば実装部品の外観検査とな
る良品とのラベル対応付けを行う二次判定を行うことを
特徴とする実装部品の外観検査方法。
1. A distance image detecting unit detects distance images of a plurality of components mounted on a printed wiring board, and the detected distance images are labeled by a separation recognizing unit for each labeled land. It is determined whether there is a candidate corresponding to the non-defective product, and if the candidate does not exist, the primary judgment is made that the foreign matter is mixed, and if there is the candidate, the label is associated with the non-defective product, which is the appearance inspection of the mounted component. A method for inspecting the appearance of mounted parts, which comprises performing a secondary judgment.
【請求項2】距離画像検出部で検出した距離画像を部品
のみが抽出されるような閾値レベルで二値化する二値化
処理をした後、得られた二値化画像から部品の分離認識
を行うことを特徴とする特許請求の範囲第1項記載の実
装部品の外観検査方法。
2. A binarization process of binarizing a range image detected by a range image detection unit at a threshold level such that only parts are extracted, and then separating and recognizing parts from the obtained binarized image. The appearance inspection method for a mounted component according to claim 1, wherein:
【請求項3】分離認識された部品の重心や面積のような
特徴量を算出し、評価関数を用いて良品とラベル対応付
けして各部品の重心、面積、外接四角形、慣性主軸方向
を良品と比較して実装部品の外観検査を行うことを特徴
とする特許請求の範囲第2項記載の実装部品の外観検査
方法。
3. A feature amount such as the center of gravity or area of a separately recognized component is calculated, and a label is associated with a non-defective product by using an evaluation function, and the center of gravity, area, circumscribing quadrangle, and principal axis direction of inertia of each component are determined as non-defective products. The appearance inspection method of the mounted component according to claim 2, wherein the appearance inspection of the mounted component is performed in comparison with.
JP61188275A 1986-08-11 1986-08-11 Visual inspection method for mounted parts Expired - Lifetime JPH07104937B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61188275A JPH07104937B2 (en) 1986-08-11 1986-08-11 Visual inspection method for mounted parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61188275A JPH07104937B2 (en) 1986-08-11 1986-08-11 Visual inspection method for mounted parts

Publications (2)

Publication Number Publication Date
JPS6344282A JPS6344282A (en) 1988-02-25
JPH07104937B2 true JPH07104937B2 (en) 1995-11-13

Family

ID=16220807

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61188275A Expired - Lifetime JPH07104937B2 (en) 1986-08-11 1986-08-11 Visual inspection method for mounted parts

Country Status (1)

Country Link
JP (1) JPH07104937B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2522174B2 (en) * 1993-08-03 1996-08-07 日本電気株式会社 Mounting board inspection equipment

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139278A (en) * 1982-02-10 1983-08-18 Fuji Electric Co Ltd Testing device for plural patterns
JPS6015780A (en) * 1983-07-08 1985-01-26 Hitachi Ltd robot control device

Also Published As

Publication number Publication date
JPS6344282A (en) 1988-02-25

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