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JPH07113776B2 - Resist developing device - Google Patents
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JPH07113776B2 - Resist developing device - Google Patents

Resist developing device

Info

Publication number
JPH07113776B2
JPH07113776B2 JP61107873A JP10787386A JPH07113776B2 JP H07113776 B2 JPH07113776 B2 JP H07113776B2 JP 61107873 A JP61107873 A JP 61107873A JP 10787386 A JP10787386 A JP 10787386A JP H07113776 B2 JPH07113776 B2 JP H07113776B2
Authority
JP
Japan
Prior art keywords
developing
tank
cover body
opening
developing tank
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61107873A
Other languages
Japanese (ja)
Other versions
JPS62264054A (en
Inventor
恒男 藤井
俊孝 武居
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Daikin Industries Ltd
Original Assignee
Daikin Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daikin Industries Ltd filed Critical Daikin Industries Ltd
Priority to JP61107873A priority Critical patent/JPH07113776B2/en
Publication of JPS62264054A publication Critical patent/JPS62264054A/en
Publication of JPH07113776B2 publication Critical patent/JPH07113776B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/3021Imagewise removal using liquid means from a wafer supported on a rotating chuck

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はレジスト現像装置、詳しくは半導体ウエハ、半
導体マスク、光ディスク等の被現像体に装着されたレジ
スト層の現像を行なうレジスト現像装置に関する。
Description: TECHNICAL FIELD The present invention relates to a resist developing apparatus, and more particularly to a resist developing apparatus for developing a resist layer mounted on an object to be developed such as a semiconductor wafer, a semiconductor mask and an optical disk.

(従来の技術) 従来、この種のレジスト現像装置としては、例えば特開
昭57-166032号公報に記載され、また第2図に示すよう
に、現像槽(D)内に収容した半導体ウエハ(W)にノ
ズル等の放出手段(N)から現像処理に供される薬液を
放出することにより、前記ウエハ(W)におけるレジス
ト層の現像を行なうようにしている。
(Prior Art) Conventionally, a resist developing apparatus of this type is described in, for example, Japanese Unexamined Patent Publication No. 57-166032, and as shown in FIG. 2, a semiconductor wafer housed in a developing tank (D) ( The resist solution on the wafer (W) is developed by discharging the chemical solution used for the developing process from the discharging means (N) such as a nozzle to W).

尚、一般に前記薬液は、レジスト層を溶解する所謂現像
液の他に、該現像液の放出に先立ち前記ウエハ(W)の
経時変化によるレジスト感度のバラつきを除去するため
の前処理液、及び前記現像液の放出後に前記ウエハ
(W)を洗浄する後処理液等から成り、これら薬液は、
有機溶剤または無機溶剤などが広く用いられている。
In addition to the so-called developing solution that dissolves the resist layer, generally, the chemical solution is a pretreatment solution for removing the variation in resist sensitivity due to the aging of the wafer (W) prior to the release of the developing solution, and After the developing solution is released, the wafer (W) is cleaned by a post-treatment solution or the like.
Organic solvents or inorganic solvents are widely used.

(発明が解決しようとする問題点) ところで、前記現像槽(D)は、当然のことゝして、前
記ウエハ(W)の出入口をもち、該ウエハ(W)を出入
れ可能に構成しているのである。
(Problems to be Solved by the Invention) By the way, the developing tank (D) is naturally provided with an inlet / outlet port for the wafer (W) so that the wafer (W) can be inserted and removed. Is there.

しかして、前記出入口はシート面を有する扉により閉鎖
し、現像槽(D)の内部を外部に対しシールしているの
であるが、このシールは完全なものでないし、しかも、
前記放出手段(N)からの前記薬液の放出時、前記現像
槽(D)の内部圧力が上昇して外部との間に圧力差が生
ずるため前記扉から前記薬液のガス状の有機溶剤又は無
機アルカリ溶剤がリークし、前記現像槽(D)を設置す
るクリーンルームを汚染することになる問題があった。
Then, the entrance and exit is closed by a door having a sheet surface to seal the inside of the developing tank (D) to the outside, but this seal is not perfect, and
When the chemical solution is discharged from the discharging means (N), the internal pressure of the developing tank (D) rises and a pressure difference is generated between the developing tank (D) and the outside. There is a problem that the alkaline solvent leaks and contaminates the clean room in which the developing tank (D) is installed.

また、前記現像槽(D)における現像終了後には、前記
ウエハ(W)を乾燥する目的で、窒素ガスを吹込む所謂
窒素ブローを行ない、前記現像槽(D)の内部を窒素で
置換する如く成しているが、有機溶剤ガス等は残存する
ことになり、このため前記ウエハ(W)を取出し、新し
いウエハ(W)をセットする際、前記扉を開くと残存す
る前記有機溶剤ガス等が外部に流出するのであり、この
流出によっても前記現像槽(D)を設置するクリーンル
ームを汚染してしまう問題があった。
After completion of development in the developing tank (D), so-called nitrogen blowing for blowing nitrogen gas is performed to replace the inside of the developing tank (D) with nitrogen for the purpose of drying the wafer (W). However, when the wafer (W) is taken out and a new wafer (W) is set, when the door is opened, the remaining organic solvent gas or the like remains. Since it flows out to the outside, there is a problem that the clean room in which the developing tank (D) is installed is also contaminated by this outflow.

この発明の目的は、上記問題点を解決し、前記薬液によ
って、現像装置が設置されるクリーンルーム等の室内が
汚染されてしまうのを防止できるレジスト現像装置を提
供する点にある。
An object of the present invention is to solve the above problems and to provide a resist developing apparatus capable of preventing the chemical solution from contaminating a room such as a clean room where the developing apparatus is installed.

(問題点を解決するための手段) そこで本発明は、第1図の如く構成したのであり、被現
像体(W)を出入れ可能に構成した現像槽(1)に、前
記被現像体(W)の保持手段を内装すると共に、この保
持手段で保持される被現像体(W)に現像処理に供され
る薬液を放出する放出手段(2)を設けたレジスト現像
装置であって、前記現像槽(1)の内部を開閉手段(2
7)を介して負圧源(5)に接続すると共に、前記現像
槽(1)の外方部を覆い、該現像槽(1)における前記
被現像体(W)の出入れを行なう開口部(20)(例え
ば、密閉形現像槽にあっては出入口、開放形現像槽にあ
ってはその開放部など)と、該開口部(20)を介して出
入れする前記被現像体(W)の搬送空間(8)とを内包
するカバー体(4)を設けて、該カバー体(4)の内部
を逆流阻止手段(28)を介して前記負圧源(5)に接続
したことを特徴とするものである。
(Means for Solving the Problems) Therefore, the present invention is configured as shown in FIG. 1, and the development target (W) is inserted into and removed from the development tank (1). A resist developing device comprising a holding means (W) and a discharging means (2) for discharging a chemical solution to be used in a developing process, the developing object being held by the holding means. Opening and closing means (2
An opening for connecting to the negative pressure source (5) via 7) and for covering the outer portion of the developing tank (1) to allow the development target (W) to be taken in and out of the developing tank (1). (20) (For example, an inlet / outlet in a closed type developing tank, an open portion in an open type developing tank, etc.), and the object to be developed (W) put in / out through the opening (20) The cover body (4) including the transfer space (8) is provided, and the inside of the cover body (4) is connected to the negative pressure source (5) through the backflow prevention means (28). It is what

(作用) 開閉手段(27)を開けて現像槽(1)の内部を負圧源
(5)に接続することにより、窒素ブローの排気に適す
るものとできる。又、被現像体(W)の出入れ時等に、
現像槽(1)の外部に漏れる有機溶剤等をカバー体
(4)の内部に閉じ込めて前記負圧源(5)に排気で
き、しかも、このとき、開閉手段(27)の開動作に伴い
現像槽(1)の内部から負圧源(5)に排気されている
ガスがカバー体(4)側に逆流するのを逆流阻止手段
(28)によって阻止でき、カバー体(4)から負圧源
(5)への排気を良好に確保できる。こうして、現像槽
(1)の内部から負圧源(5)への排気と、現像槽
(1)の外部を覆うカバー体(4)から負圧源(5)へ
の排気とを両立させることができ、クリーンルームの汚
染を確実に防止できるのである。
(Function) By opening the opening / closing means (27) and connecting the inside of the developing tank (1) to the negative pressure source (5), it can be made suitable for exhausting nitrogen blow. In addition, when the development target (W) is taken in and out,
Organic solvent and the like leaking to the outside of the developing tank (1) can be confined inside the cover body (4) and exhausted to the negative pressure source (5), and at the same time, the developing operation is accompanied by the opening operation of the opening / closing means (27). It is possible to prevent the gas exhausted from the inside of the tank (1) to the negative pressure source (5) from flowing backward to the cover body (4) side by the backflow blocking means (28), and the negative pressure source from the cover body (4). Exhaust to (5) can be secured well. In this way, both exhaust from the inside of the developing tank (1) to the negative pressure source (5) and exhaust from the cover body (4) covering the outside of the developing tank (1) to the negative pressure source (5) are made compatible. Therefore, the contamination of the clean room can be reliably prevented.

(実施例) 第1図に示すものは、枠組したフレーム(100)の上面
に現像槽(1)を支持すると共に、後記するウエハカセ
ット(200)を載置する架台(201)を設置したものであ
って、前記現像槽(1)は、二重壁構造のドーム状ケー
シング(11)、底壁(12)及び天井板(13)を備え、内
部に半導体ウエハ等の被現像体(W)(以下単にウエハ
という)の現像処理を行なう現像室(10)を形成する一
方、前記ケーシング(11)の側方に前記ウエハ(W)の
出入れを行なう開口部となる出入口(20)及び該出入口
(20)を開閉する扉(21)を設けている。
(Embodiment) The one shown in FIG. 1 is one in which a developing tank (1) is supported on the upper surface of a frame (100) which is framed, and a frame (201) for mounting a wafer cassette (200) described later is installed. The developing tank (1) includes a dome-shaped casing (11) having a double-wall structure, a bottom wall (12) and a ceiling plate (13), and a developing object (W) such as a semiconductor wafer is provided inside. A developing chamber (10) for developing the wafer (hereinafter simply referred to as a wafer) is formed, and an inlet / outlet port (20) serving as an opening portion for loading / unloading the wafer (W) to the side of the casing (11), and A door (21) for opening and closing the entrance (20) is provided.

また、前記底壁(12)には、支持筒(15)を立設し、そ
の上端に、前記ウエハ(W)の保持手段を構成するチャ
ック(16)を、回転軸(17)を介して回転自由に取付
け、前記チャック(16)をモータ(M)によりベルト
(101)を介して回転させる如くしている。
Further, a support cylinder (15) is erected on the bottom wall (12), and a chuck (16) constituting a holding means for the wafer (W) is provided on the upper end of the support cylinder (15) via a rotary shaft (17). The chuck (16) is rotatably mounted and is rotated by a motor (M) via a belt (101).

更に、前記天井板(13)には、前記チャック(16)に保
持されて回転する前記ウエハ(W)に、現像液等の現像
処理に供される薬液を放出する例えばスプレーノズル等
の放出手段(2)を配置し、この放出手段(2)を、一
部コイル状と成して、前記ケーシング(11)に内蔵する
送液管(6)を介して加圧タンクを構成する薬液容器
(3)に接続し、前記放出手段(2)から前記ウエハ
(W)に薬液を例えば図中点線矢印の如く噴射により放
出する如くしている。前記薬液としては、前処理液、現
像液、後処理液等があるが、これら薬液ごとに個別に放
出手段(2)等を設けてもよいし、前記送液管(6)に
切換弁等を設けて放出手段(2)を兼用させてもよい。
尚、前記送液管(6)には、前記薬液の出停制御弁(6
1)及び前記薬液中の微小なゴミを除去するストレーナ
(62)を介装している。
Further, on the ceiling plate (13), a discharging means such as a spray nozzle for discharging a chemical solution used for a developing process such as a developing solution to the wafer (W) held by the chuck (16) and rotating. (2) is arranged, and the discharge means (2) is partially coiled, and a chemical liquid container (a chemical tank for constituting a pressurization tank via a liquid supply pipe (6) built in the casing (11) ( 3), and the chemical liquid is discharged from the discharging means (2) to the wafer (W) by jetting, for example, as indicated by a dotted arrow in the figure. Examples of the chemical liquid include a pretreatment liquid, a developing liquid, a post-treatment liquid, and the like, and a discharge means (2) or the like may be provided for each of these chemical liquids, or a switching valve or the like in the liquid supply pipe (6). May be provided so that the discharging means (2) is also used.
In addition, the liquid delivery pipe (6) is provided with a control valve (6
1) and a strainer (62) for removing minute dust in the chemical solution.

有機溶剤を用いた前記薬液の一例としては、イソブチル
アルコールとエタノールとを約50対50の割合で混合した
ものがあり、無機アルカリ溶剤を用いた薬液の一例とし
ては、5%程度のアンモニア水がある。
An example of the chemical solution using an organic solvent is a mixture of isobutyl alcohol and ethanol at a ratio of about 50:50, and an example of the chemical solution using an inorganic alkaline solvent is about 5% ammonia water. is there.

一方、前記架台(201)は、前記出入口(20)の対向位
置における前記フレーム(100)の上部に設置するので
あって、この架台(201)には複数枚のウエハ(W)を
収納するウエハカセット(200)を載置するのであり、
該カセット(200)からウエハ(W)を1枚づつ取出
し、搬送アーム(9)により、前記出入口(20)を介装
して前記現像槽(1)に出入れする如くしている。尚、
前記搬送アーム(9)は、前記扉(21)の開閉操作と連
動して自動的に駆動されるものである。
On the other hand, the gantry (201) is installed on the upper part of the frame (100) at a position opposite to the entrance (20), and the gantry (201) accommodates a plurality of wafers (W). The cassette (200) is placed,
The wafers (W) are taken out from the cassette (200) one by one, and are transferred into and out of the developing tank (1) by the transfer arm (9) via the entrance (20). still,
The transfer arm (9) is automatically driven in conjunction with the opening / closing operation of the door (21).

又、前記ウエハ(W)に放出された後の薬液は、前記底
壁(12)から下方に延びる排液管(120)より排液タン
ク(図示せず)に排泄されるのであり、また前記薬液放
出完了後(一般には後処理液放出後で現像終了時)に
は、前記天井板(13)に配置する窒素ブロー用ノズル
(25)から前記ウエハ(W)に窒素を吹付けて該ウエハ
(W)を乾燥させるのである。
Further, the chemical liquid after being discharged to the wafer (W) is discharged to a drain tank (not shown) through a drain pipe (120) extending downward from the bottom wall (12), and After the completion of the chemical discharge (generally, after the post-treatment liquid is discharged and the development is completed), nitrogen is blown onto the wafer (W) from the nitrogen blow nozzle (25) arranged on the ceiling plate (13). The (W) is dried.

又、前記現像槽(1)には、前記現像室(10)に開口す
る配管(26)を接続しており、この配管(26)の途中に
開閉手段を構成する開閉弁(27)を介装すると共に、前
記配管(26)を真空ポンプ等の負圧源(5)に接続して
おり、前記窒素ブローに際しては前記開閉弁(27)を開
き、前記現像室(10)を、前記負圧源(5)に開放する
如くしている。
A pipe (26) opening to the developing chamber (10) is connected to the developing tank (1), and an opening / closing valve (27) forming an opening / closing means is provided in the middle of the pipe (26). In addition, the pipe (26) is connected to a negative pressure source (5) such as a vacuum pump, the opening / closing valve (27) is opened when the nitrogen is blown, and the developing chamber (10) is connected to the negative pressure source. The pressure source (5) is opened.

しかして以上の如く構成するレジスト現像装置におい
て、前記現像槽(1)の外方部を覆い、該現像槽(1)
の出入口(20)と、該出入口(20)を介して出入れする
前記被現像体(W)の搬送空間(8)とを内包するカバ
ー体(4)を設け、該カバー体(4)の内部を負圧源
(5)に接続したのである。
Thus, in the resist developing apparatus configured as described above, the outer portion of the developing tank (1) is covered and the developing tank (1) is covered.
A cover body (4) is provided which includes a doorway (20) and a transfer space (8) for the development target (W) which is moved in and out through the doorway (20). The inside was connected to the negative pressure source (5).

第1図に示した実施例では、前記カバー体(4)を箱形
に形成し、これを、前記フレーム(100)の上面に設置
して、該フレーム(100)の上面に支持される前記現像
槽(1)及び前記架台(201)及びウエハカセット(20
0)のすべてを覆うようにしたものである。
In the embodiment shown in FIG. 1, the cover body (4) is formed in a box shape, and the cover body (4) is installed on the upper surface of the frame (100) and is supported on the upper surface of the frame (100). Developing tank (1), frame (201), and wafer cassette (20)
It covers all of 0).

また、前記カバー体(4)の側方には、前記カセット
(200)の交換用扉(40)を取付けている。
A replacement door (40) for the cassette (200) is attached to the side of the cover body (4).

尚、前記搬送空間(8)は、前記出入口(20)と、前記
搬送アーム(9)及びウエハカセット(200)との間に
形成され、前記ウエハ(W)を前記現像槽(1)の内と
外とで出入れを行なうために必要な最小限度の空間であ
る。
The transfer space (8) is formed between the doorway (20) and the transfer arm (9) and the wafer cassette (200), and the wafer (W) is stored in the developing tank (1). It is the minimum space required to move in and out.

一方、前記カバー体(4)の内部は、ガス抜配管(45)
を介して前記した窒素ブローの排気用に設けた真空ポン
プ等の負圧源(5)に接続するのである。
On the other hand, the inside of the cover body (4) has a gas vent pipe (45).
It is connected via a negative pressure source (5) such as a vacuum pump provided for exhausting the nitrogen blow described above.

かくして、前記カバー体(4)の内部の圧力は、現像装
置が置かれるクリーンルーム等の室内圧力よりも低くで
きることゝなるのであり、前記出入口(20)から前記カ
バー体(4)の内部にリークしたガス状の前記有機溶剤
などは、もはや前記クリーンルームの室内にリークする
ことはないのである。そして、前記リークしたガス状の
有機溶剤などは、前記負圧源(5)へ排気されるのであ
る。
Thus, the pressure inside the cover body (4) can be made lower than the pressure inside the clean room or the like in which the developing device is placed, and the leak from the entrance (20) into the cover body (4). The gaseous organic solvent and the like no longer leak into the clean room. Then, the leaked gaseous organic solvent and the like are exhausted to the negative pressure source (5).

この場合、前記カバー体(4)に小孔を開けたり、図示
の如く上部にエアフィルタ(400)を設けて、前記クリ
ーンルーム等の室内から、前記カバー体(4)の内部、
更に、前記負圧源(5)への通風経路を形成することに
より、前記カバー体(4)の内部の喚気能力を向上させ
ることができる。
In this case, a small hole is opened in the cover body (4), or an air filter (400) is provided on the upper portion as shown in the drawing so that the inside of the cover body (4) is
Furthermore, by forming a ventilation path to the negative pressure source (5), it is possible to improve the ventilation ability inside the cover body (4).

また、前記した窒素ブローによる排気ガスが前記ガス抜
配管(45)を介してカバー体(4)の内部へ逆流するこ
とも考えられるので、この逆流を阻止するために、前記
ガス抜配管(45)には逆流阻止手段を構成する開閉弁
(28)を介装するのである。また、この開閉弁(28)に
代えて、前記カバー体(4)の内部から前記負圧源
(5)への流れのみを許容する逆止弁を介装してもよ
い。更に、この開閉弁(28)と、前記窒素ブロー排気用
開閉弁(27)とを、1つの三方弁で構成し、該三方弁
を、前記ガス抜配管(45)と前記配管(26)との接続部
に介装してもよい。
Further, it is conceivable that the exhaust gas due to the above-mentioned nitrogen blow flows back into the cover body (4) through the gas vent pipe (45). Therefore, in order to prevent this back flow, the gas vent pipe (45) ) Is provided with an on-off valve (28) which constitutes a backflow prevention means. Further, instead of the opening / closing valve (28), a check valve that allows only the flow from the inside of the cover body (4) to the negative pressure source (5) may be interposed. Further, the on-off valve (28) and the nitrogen blow exhaust on-off valve (27) are constituted by one three-way valve, and the three-way valve includes the gas vent pipe (45) and the pipe (26). You may intervene in the connection part of.

尚、この実施例では、前記ケーシング(11)の二重壁構
造により、前記現像室(10)を取囲む熱交換チャンバー
(14)を形成し、該チャンバー(14)の内部に、前記フ
レーム(100)の下方に収納する恒温水等恒温熱媒発生
装置(7)からの恒温熱媒体を配管(76,77)を介して
循環させ、前記現像室(10)を任意の設定温度に制御で
きるようにしている。
In this embodiment, a double wall structure of the casing (11) forms a heat exchange chamber (14) surrounding the developing chamber (10), and the frame (14) is provided inside the chamber (14). The developing chamber (10) can be controlled to an arbitrary set temperature by circulating a constant temperature heating medium from a constant temperature heating medium generator (7) such as constant temperature water stored under 100) via pipes (76, 77). I am trying.

また、前記薬液の送液管(6)は、前記した如くその一
部をコイル状と成して薬液熱交換器(50)を形成し、該
熱交換器(50)を前記チャンバー(14)の内部に配設す
ることにより、前記薬液も任意の設定温度に制御できる
ようにしている。
Further, as described above, the chemical liquid feed pipe (6) is partially coiled to form a chemical liquid heat exchanger (50), and the heat exchanger (50) is connected to the chamber (14). By disposing the liquid medicine inside, the chemical liquid can be controlled to an arbitrary set temperature.

前記恒温熱媒発生装置(7)は、断熱構造とした恒温槽
(70)にヒータ(71)及び冷凍装置の蒸発器(72)を内
装し、熱媒ポンプ(75)を備えたものである。
The constant temperature heat medium generating device (7) comprises a constant temperature tank (70) having a heat insulating structure, a heater (71) and an evaporator (72) of a refrigerating device, and a heat medium pump (75). .

(発明の効果) 以上の如く本発明は、被現像体(W)を出入れ可能に構
成した現像槽(1)に、前記被現像体(W)の保持手段
を内装すると共に、この保持手段で保持される被現像体
(W)に現像処理に供される薬液を放出する放出手段
(2)を設けたレジスト現像装置であって、前記現像槽
(1)の内部を開閉手段(27)を介して負圧源(5)に
接続すると共に、前記現像槽(1)の外方部を覆い、該
現像槽(1)における前記現像体(W)の出入れを行な
う開口部(20)と、該開口部(20)を介して出入れする
前記被現像体(W)の搬送空間(8)とを内包するカバ
ー体(4)を設けて、該カバー体(4)の内部を逆流阻
止手段(28)を介して前記負圧源(5)に接続したこと
を特徴とするものであるから、可燃性を有し、また、悪
臭を放つ有機溶剤または無機アルカリ溶剤などのガス状
流体がリークして現像装置が置かれるクリーンルーム等
の室内が汚染されてしまうのを、確実に防止できるに至
ったのである。
(Effects of the Invention) As described above, according to the present invention, the developing tank (1) configured to allow the development target (W) to be taken in and out is internally provided with the holding means for the development target (W) and the holding means. A resist developing device, in which a developing means (2) for discharging a chemical solution to be used in a developing process is provided on a developed material (W) held by a developing means, wherein an opening / closing means (27) is provided inside the developing tank (1). An opening (20) which is connected to a negative pressure source (5) via an external port and covers the outer part of the developing tank (1) and allows the developing body (W) to be taken in and out of the developing tank (1). And a cover body (4) that encloses the transfer space (8) for the developed material (W) that is put in and taken out through the opening (20), and backflows inside the cover body (4). Since it is connected to the negative pressure source (5) through the blocking means (28), it has flammability and emits a foul odor. The interior of a clean room or the like organic solvent or gaseous fluid such as an inorganic alkali solvent developing device leaks are placed that would be contaminated, it was led to be reliably prevented.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明現像装置の一実施例を示す概略説明図、
第2図は従来例を示す概略説明図である。 (1)……現像槽 (2)……放出手段 (4)……カバー体 (5)……負圧源 (8)……搬送空間 (20)……開口部(出入口) (W)……被現像体 (27)……開閉手段(開閉弁) (28)……逆流阻止手段(開閉弁)
FIG. 1 is a schematic explanatory view showing an embodiment of the developing device of the present invention,
FIG. 2 is a schematic explanatory view showing a conventional example. (1) …… Developing tank (2) …… Discharging means (4) …… Cover body (5) …… Negative pressure source (8) …… Transport space (20) …… Opening part (doorway) (W)… … Developer (27) …… Opening / closing means (opening / closing valve) (28) …… Backflow prevention means (opening / closing valve)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】被現像体(W)を出入れ可能に構成した現
像槽(1)に、前記被現像体(W)の保持手段を内装す
ると共に、この保持手段で保持される被現像体(W)に
現像処理に供される薬液を放出する放出手段(2)を設
けたレジスト現像装置であって、前記現像槽(1)の内
部を開閉手段(27)を介して負圧源(5)に接続すると
共に、前記現像槽(1)の外方部を覆い、該現像槽
(1)における前記被現像体(W)の出入れを行なう開
口部(20)と、該開口部(20)を介して出入れする前記
被現像体(W)の搬送空間(8)とを内包するカバー体
(4)を設けて、該カバー体(4)の内部を逆流阻止手
段(28)を介して前記負圧源(5)に接続したことを特
徴とするレジスト現像装置。
1. A developing tank (1) configured so that a development target (W) can be put in and taken out, and a holding means for holding the development target (W) is built in the development tank (1) and the development target held by the holding means. A resist developing apparatus having (W) a discharging means (2) for discharging a chemical liquid to be used in a developing process, wherein a negative pressure source () is provided inside the developing tank (1) via an opening / closing means (27). 5) and an opening (20) for covering the outer portion of the developing tank (1) to allow the development target (W) to be put in and taken out of the developing tank (1), and the opening (20). A cover body (4) including a transfer space (8) for the development target (W) which is put in and taken out through the inside of the cover body (4) is provided, and a backflow preventing means (28) is provided inside the cover body (4). A resist developing device, wherein the resist developing device is connected to the negative pressure source (5) through the resist developing device.
JP61107873A 1986-05-12 1986-05-12 Resist developing device Expired - Lifetime JPH07113776B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61107873A JPH07113776B2 (en) 1986-05-12 1986-05-12 Resist developing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61107873A JPH07113776B2 (en) 1986-05-12 1986-05-12 Resist developing device

Publications (2)

Publication Number Publication Date
JPS62264054A JPS62264054A (en) 1987-11-17
JPH07113776B2 true JPH07113776B2 (en) 1995-12-06

Family

ID=14470252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61107873A Expired - Lifetime JPH07113776B2 (en) 1986-05-12 1986-05-12 Resist developing device

Country Status (1)

Country Link
JP (1) JPH07113776B2 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59134829A (en) * 1983-01-22 1984-08-02 Nec Corp Device for spraying and developing semiconductor
JPS59121657U (en) * 1983-02-04 1984-08-16 富士通株式会社 developing device
JPS59202630A (en) * 1983-05-02 1984-11-16 Oki Electric Ind Co Ltd Manufacture of semiconductor device

Also Published As

Publication number Publication date
JPS62264054A (en) 1987-11-17

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