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JPH07114471B2 - Solid-state imaging device - Google Patents
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JPH07114471B2 - Solid-state imaging device - Google Patents

Solid-state imaging device

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Publication number
JPH07114471B2
JPH07114471B2 JP59125126A JP12512684A JPH07114471B2 JP H07114471 B2 JPH07114471 B2 JP H07114471B2 JP 59125126 A JP59125126 A JP 59125126A JP 12512684 A JP12512684 A JP 12512684A JP H07114471 B2 JPH07114471 B2 JP H07114471B2
Authority
JP
Japan
Prior art keywords
chip
amplifier
solid
imaging device
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59125126A
Other languages
Japanese (ja)
Other versions
JPS615680A (en
Inventor
俊之 秋山
紀雄 小池
健治 伊藤
武 荻野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59125126A priority Critical patent/JPH07114471B2/en
Publication of JPS615680A publication Critical patent/JPS615680A/en
Publication of JPH07114471B2 publication Critical patent/JPH07114471B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Transforming Light Signals Into Electric Signals (AREA)

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、固体撮像装置に関し、特にCCD(Charge Conp
led Device)やCPD(Charge Priming Device)から映像
信号を読み出す固体撮像装置に関するものである。
Description: FIELD OF THE INVENTION The present invention relates to a solid-state imaging device, and more particularly to a CCD (Charge Comp
The present invention relates to a solid-state imaging device that reads out a video signal from a led device) or a CPD (Charge Priming Device).

〔発明の背景〕[Background of the Invention]

従来のCCD型固体撮像装置の動作原理は、第1図に示す
ように、マトリツクス状に配列された光ダイオード2か
らなる感光部1と、光ダイオード2に蓄積された光信号
をFET5を通して読み出す垂直方向のCCD群11,12,…1Nお
よび水平方向のCCD群3と、CCD群3からの電荷量信号を
増幅して出力する増幅器4で構成されている。なお、φ
H1H2Vo〜φV2は信号転送用のクロツクパルスであ
る。
As shown in FIG. 1, the operation principle of a conventional CCD type solid-state image pickup device is as follows: a photosensitive unit 1 composed of photo diodes 2 arranged in a matrix, and a vertical direction for reading an optical signal accumulated in the photo diode 2 through a FET 5. , 1N in the horizontal direction, a CCD group 3 in the horizontal direction, and an amplifier 4 for amplifying and outputting the charge amount signal from the CCD group 3. Note that φ
H1 , φ H2 , φ Vo to φ V2 are clock pulses for signal transfer.

また、上記の増幅器4とその周辺は、第2図に示すよう
な回路構成および撮像素子チツプに実装された部品であ
る。8はCCD群3の出力信号である電荷量QSを電圧量に
変換するための小さな静電容量(Co)、21は電荷量QS
静電容量8の両端に生じた電圧V0(=QS/C0)を低イン
ピーダンスで出力するソース・フオロアのMOS型FET、22
は静電容量8の電荷量QSを外部に放出し、リセツトする
ためのMOS型FET、7は撮像素子のチツプ、23,23′はチ
ツプ上の端子(ワイヤーボンデイング用のパツド)、6
はパツケージ、24,24′はパツケージのピン端子、25は
外部配線、9は外部配線25の寄生容量、10は信号処理
部、26はプルダウン抵抗である。
The amplifier 4 and its surroundings are components mounted on the circuit configuration and the image pickup device chip as shown in FIG. 8 is a small electrostatic capacitance (Co) for converting the charge amount Q S which is the output signal of the CCD group 3 into a voltage amount, and 21 is the charge amount Q S and the voltage V 0 ( = Q S / C 0 ) low-impedance source-follower MOS-type FET, 22
Is a MOS type FET for releasing and resetting the electric charge Q S of the electrostatic capacitance 8 to the outside, 7 is a chip of the image pickup device, 23 and 23 'are terminals on the chip (pads for wire bonding), 6
Is a package, 24 and 24 'are pin terminals of the package, 25 is an external wiring, 9 is a parasitic capacitance of the external wiring 25, 10 is a signal processing unit, and 26 is a pull-down resistor.

この第1図,第2図において、映像信号を読み出す場合
を、第3図により説明する。
A case where the video signal is read in FIGS. 1 and 2 will be described with reference to FIG.

光ダイオード2のそれぞれに1フレーム期間で蓄積され
た電荷は、クロツクパルスφV0〜φV2により、垂直帰線
期間の間でCCD群11,12…1Nへ移された後、水平帰線期間
の間で1ラインずつ転送させながら、CCD群3へ移され
る。CCD群3に移された電荷は、第3図に示すようにク
ロツクパルスφH2により、順次静電容量8に転送され、
リセツト信号φが加えられて、出力電圧V0(=QS/
C0)となる。
The charges accumulated in each of the photodiodes 2 in one frame period are transferred to the CCD groups 11, 12 ... 1N during the vertical blanking period by the clock pulses φ V0 to φ V2 , and then during the horizontal blanking period. Are transferred to CCD group 3 while transferring line by line. The charges transferred to the CCD group 3 are sequentially transferred to the electrostatic capacitance 8 by the clock pulse φ H2 as shown in FIG.
When the reset signal φ R is added, the output voltage V 0 (= Q S /
C 0 ).

φH2のl番目のクロツクパルスで静電容量8に移動した
電荷QS (l)は、静電容量8の両端に電圧V0 (l)を発生した
後、リセツト信号φによつて、外部に放出される。な
お上記のVo(l)はFET21,端子23′を通して、ピン端子2
4′から出力する。φH2の次(l+1番目)のクロツク
パルスで静電容量8に移された電荷QS (l+1)も同様に、V
0 (l+1)を出力する。このようにクロツクパルスφH2によ
り転送される電荷は、その電荷に比例した電圧のホール
ドパルス列となつて、外部配線25を通して、信号処理部
10に送られる。さらに、信号処理部10内にローパスフイ
ルタによつて、変調成分が取り出され、映像信号とな
る。
The charge Q S (l) transferred to the electrostatic capacitance 8 by the l-th clock pulse of φ H2 generates a voltage V 0 (l) at both ends of the electrostatic capacitance 8 and then is reset by the reset signal φ R. Is released to. In addition, Vo (l) above is connected to the pin terminal 2 through FET21, terminal 23 '.
Output from 4 '. The charge Q S (l + 1) transferred to the electrostatic capacitance 8 by the next (l + 1) th clock pulse after φ H2 is also V
Outputs 0 (l + 1) . The charges transferred by the clock pulse φ H2 in this way become a hold pulse train of a voltage proportional to the charges, and are passed through the external wiring 25 to the signal processing unit.
Sent to 10. Further, the modulation component is taken out by the low-pass filter in the signal processing unit 10 and becomes a video signal.

上記の動作において、増幅器4の静電容量8が小容量で
ある程、大きな電圧(V0=QS/C0)が得られることか
ら、静電容量8の主成分を構成するFET21のゲート面積
をできるだけ小さくする。しかし、小面積にするとソー
スフオロアの出力インピーダンス(R)が数十kΩ以上
と大きくなるため、寄生容量9(C)とで構成するRC回
路により、信号周波数帯域の劣化という問題が発生す
る。この問題の解決には、寄生容量9による影響を減ら
せばよいので従来は、第4図に示すように、固定撮像素
子を収めるパツケージ6のピン端24′に、トランジスタ
(または、J−FET)31単体で構成したエミツタフオロ
ア(または、ソースフオロア)を接近させて付加するこ
とにより、低出力インピーダンスとし、寄生容量9の影
響を減少している。また、撮像素子や単体トランジスタ
のピンやソケツト等に生ずる寄生容量32の影響をなくす
ため、撮像素子のチツプ7内にMOS形FET33によるソース
フオロアを2段内蔵して低出力インピーダンスにする方
法が用いられている(例えば、SONY新製品速報ICX016AK
「CCDイメージセンサ」参照)。
In the above operation, the smaller the electrostatic capacitance 8 of the amplifier 4 is, the larger voltage (V 0 = Q S / C 0 ) is obtained. Therefore, the gate of the FET 21 that constitutes the main component of the electrostatic capacitance 8 is obtained. Make the area as small as possible. However, when the area is made small, the output impedance (R) of the source follower becomes as large as several tens of kΩ or more, so that the RC circuit configured with the parasitic capacitance 9 (C) causes a problem of deterioration of the signal frequency band. In order to solve this problem, it is sufficient to reduce the influence of the parasitic capacitance 9. Therefore, conventionally, as shown in FIG. 4, a transistor (or J-FET) is provided at the pin end 24 'of the package 6 for housing the fixed image pickup device. By adding an emitter follower (or source follower) composed of a single unit 31 in close proximity, a low output impedance is achieved and the effect of the parasitic capacitance 9 is reduced. Further, in order to eliminate the influence of the parasitic capacitance 32 generated in the pin or socket of the image pickup device or the single transistor, a method of incorporating two stages of source followers by the MOS type FET 33 in the chip 7 of the image pickup device to obtain a low output impedance is used. (For example, SONY new product bulletin ICX016AK
Refer to "CCD image sensor").

しかしながら、i)寄生容量32の容量が数pF〜十数pFと
大きく、出力インピーダンスを数KΩ以下にすることは
MOS型FETの性能上難しいため、信号周波数帯域が10MHz
程度と狭くなる。なお、撮像素子の水平方向に現行の40
0画素を並べた場合の周波数帯域は14MHz、将来、800画
素を並べる場合は28MHzの帯域が必要となることから、
これは重要な問題である。ii)MOS形FETには、大きなバ
イアス電流が必要であるため、消費電力が大きくなり、
それに伴つて発熱による暗電流性の白点が発生する。ii
i)パツケージ以外の回路実装部品が増すので、イメー
ジカメラの製作費がアツプし、しかも信頼性を下げる。
iv)素子駆動のパルス信号などから発生する誘導雑音が
寄生容量から信号に漏洩するため、S/N比が低下する、
などの問題がある。
However, i) The capacitance of the parasitic capacitance 32 is as large as several pF to several tens of pF, and it is not possible to reduce the output impedance to several KΩ or less.
Due to the difficulty of the performance of the MOS FET, the signal frequency band is 10 MHz.
It becomes narrower. It should be noted that the current 40
When 0 pixels are lined up, the frequency band is 14 MHz, and when 800 pixels are lined up in the future, 28 MHz band is required.
This is an important issue. ii) MOS type FET requires a large bias current, resulting in high power consumption.
As a result, dark current white spots are generated due to heat generation. ii
i) Since the number of circuit mounting parts other than packages increases, the production cost of the image camera is increased and the reliability is reduced.
iv) Induced noise generated from element driving pulse signals leaks from the parasitic capacitance to the signal, and the S / N ratio decreases.
There are problems such as.

〔発明の目的〕[Object of the Invention]

本発明の目的は、このような従来の問題を解決し、外付
に部品を実装することなく、簡単かつ安価な方法によ
り、低消費電力で広帯域な映像信号を得ることができる
固体撮像装置を提供することにある。
An object of the present invention is to solve such a conventional problem and to provide a solid-state imaging device capable of obtaining a wide-angle video signal with low power consumption by a simple and inexpensive method without mounting any external parts. To provide.

〔発明の概要〕[Outline of Invention]

上記目的を達成するため、本発明の固定撮像装置は、連
続するパルス状の信号電荷を順次増幅器入力端の静電容
量に蓄積し、該静電容量端子間に生ずる信号電圧を増幅
して出力する増幅器と、該増幅器をチツプ状にして実装
したパツケージとを有する固体撮像装置において、上記
パツケージに、単体あるいは複数個のトランジスタある
いはJ−FETから成る集積回路のチツプを、上記増幅器
に近接する位置に実装したことに特徴がある。
In order to achieve the above object, the fixed image pickup device of the present invention sequentially accumulates continuous pulsed signal charges in the electrostatic capacitance of the amplifier input terminal, amplifies the signal voltage generated between the electrostatic capacitance terminals, and outputs the amplified signal voltage. In a solid-state imaging device having an amplifier and a package in which the amplifier is mounted in a chip shape, a chip of an integrated circuit composed of a single transistor or a plurality of transistors or J-FETs is provided in the package at a position close to the amplifier. It is characterized by being implemented in.

〔発明の実施例〕Example of Invention

以下、本発明の実施例を図面により説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第5図は、本発明の一実施例を示す固体撮像装置の構成
図である。
FIG. 5 is a block diagram of a solid-state imaging device showing an embodiment of the present invention.

第5図において、41はトランジスタ(または、J−FE
T)単体のチツプであり、従来の固体撮像装置の構成を
示す第4図と異なる点は、上記のチツプ41を増幅器4の
ソースフオロア出力端子23′の近傍でパツケージ6内に
実装したことである。チツプ41を同一パツケージ6内に
実装する場合には、チツプ41のベース(または、J−FE
Tのときはゲーシ)用端子(パツド)42とソースフオロ
アの出力端子(パツド)23′の間隔を、この間に生ずる
寄生容量を小さくするため、できるだけ近接した位置と
する。また、チツプ41間あるいはチツプ41とパツケージ
端子24′間を接続するワイヤーボンデイングなどの作業
が容易で、各リード線間の接触を防止するために、コレ
クタやエミツタ(または、J−FETのときは、ドレイン
やソース)からのリード線43,43′が交叉しない位置と
する。
In FIG. 5, 41 is a transistor (or J-FE).
T) It is a single chip and is different from FIG. 4 showing the configuration of the conventional solid-state image pickup device in that the above-mentioned chip 41 is mounted in the package 6 in the vicinity of the source follower output terminal 23 ′ of the amplifier 4. . When mounting the chip 41 in the same package 6, the base of the chip 41 (or J-FE
When T, the distance between the gate terminal (pad) 42 and the output terminal (pad) 23 'of the source follower is set as close as possible in order to reduce the parasitic capacitance generated therebetween. Also, work such as wire bonding for connecting between the chips 41 or between the chip 41 and the package terminal 24 'is easy, and in order to prevent contact between the lead wires, in the case of a collector or an emitter (or J-FET, , The drain or source) and the lead wires 43, 43 'do not intersect.

チツプ41を、上記のように実装することによつて、増幅
器4のソースフオロアの負荷容量(トランジスタのベー
スに生ずる寄生容量であり、第4図では寄生容量32)が
無視できるので、ソースフオロアの出力インピーダンス
を数十KΩであつても周波数帯域の広い信号を得ること
ができる。また、単体トランジスタを撮像素子のチツプ
と同一のパツケージに実装したことにより、イメージカ
メラの回路実装部品が減り、安価な製造コストにするこ
とができる。
By mounting the chip 41 as described above, the load capacitance of the source follower of the amplifier 4 (parasitic capacitance generated in the base of the transistor, which is the parasitic capacitance 32 in FIG. 4) can be ignored, so that the output impedance of the source follower is reduced. Even if the value is several tens of KΩ, a signal with a wide frequency band can be obtained. Also, by mounting the single transistor in the same package as the chip of the image pickup device, the number of circuit mounting parts of the image camera is reduced, and the manufacturing cost can be reduced.

さらに、信号の周波数帯域に影響を及ぼす寄生容量が無
視できる程に小さくなつたことから、ソースフオロアの
出力インピーダンスを下げるための大きなバイアス電流
が減らせるので、低消費電力にすることができる。
Furthermore, since the parasitic capacitance that affects the frequency band of the signal is so small that it can be ignored, a large bias current for lowering the output impedance of the source follower can be reduced, so that the power consumption can be reduced.

なお、増幅器4のソースフオロアは、第5図に示すよう
に、1段の場合を一実施例として述べたが、第4図に示
すような2段の場合についても同様の効果を得ることが
できる。
Although the source follower of the amplifier 4 has a single stage as shown in FIG. 5, it has been described as an example, but the same effect can be obtained in the case of two stages as shown in FIG. .

〔発明の効果〕〔The invention's effect〕

以上説明したように、本発明によれば、トランジスタな
どの緩衝用部品を、簡単かつ安価な方法により、撮像素
子のチツプと同一のパツケージ内に実装させるので、低
消費電力で広帯域の映像信号が得られる。
As described above, according to the present invention, a buffer component such as a transistor is mounted in the same package as the chip of the image sensor by a simple and inexpensive method, so that a wideband video signal with low power consumption can be obtained. can get.

【図面の簡単な説明】[Brief description of drawings]

第1図はCCD型固体撮像装置の動作原理を説明する図、
第2図は増幅器とその周辺の回路図、第3図は第2図の
動作タイム・チヤート、第4図は従来の固定撮像装置の
構成図、第5図は本発明の一実施例を示す固定撮像装置
の構成図である。 1……感光部、2……光ダイオード、3,11,12……IN:CC
D群、4……増幅器、5,21,22,23……FET、6……パツケ
ージ、7……撮像素子のチツプ、8……静電容量、9,32
……寄生容量、10……信号処理部、23,23′,42……端子
(パツド)、24,24′……ピン端子、25……外部配線、2
6……プルダウン抵抗、41……トランジスタチツプ、43,
43′……リード線。
FIG. 1 is a diagram for explaining the operation principle of the CCD type solid-state imaging device,
FIG. 2 is a circuit diagram of an amplifier and its periphery, FIG. 3 is an operation time chart of FIG. 2, FIG. 4 is a block diagram of a conventional fixed image pickup device, and FIG. 5 is an embodiment of the present invention. It is a block diagram of a fixed imaging device. 1 ... Photosensitive area, 2 ... Photodiode, 3,11,12 ... IN: CC
D group, 4 ... Amplifier, 5,21,22,23 ... FET, 6 ... Package, 7 ... Chip of image sensor, 8 ... Capacitance, 9,32
...... Parasitic capacitance, 10 ...... Signal processing part, 23,23 ', 42 ...... Terminal (pad), 24,24' ...... Pin terminal, 25 ...... External wiring, 2
6 …… pull-down resistor, 41 …… transistor chip, 43,
43 ′ …… Lead wire.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 荻野 武 茨城県勝田市大字稲田1410番地 株式会社 日立製作所東海工場内 (56)参考文献 特開 昭56−116373(JP,A) 特開 昭58−220574(JP,A) ─────────────────────────────────────────────────── ─── Continuation of front page (72) Inventor Takeshi Ogino 1410 Inada, Katsuta City, Ibaraki Prefecture, Tokai Plant, Hitachi, Ltd. (56) References JP-A-56-116373 (JP, A) JP-A-58- 220574 (JP, A)

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】連続するパルス状の信号電荷を順次蓄積す
るための静電容量と、該静電容量端子間に生ずる信号電
圧を順次増幅して出力するための増幅器とをチップ状に
して実装したパッケージを有する固体撮像装置におい
て、上記パッケージ内に実装されたチップ状に実装され
た上記増幅器の近接する位置に、単体のトランジスタま
たはJ−FETを実装したチップを上記パッケージ上で実
装し、上記増幅器の複数の出力端子と上記単体のトラン
ジスタまたはJ−FETを実装したチップの複数の入力端
子とを接続するためのリード線が互いに交叉しないよう
に接続されていることを特徴とする固体撮像装置。
1. An electrostatic capacitance for sequentially accumulating continuous pulsed signal charges and an amplifier for sequentially amplifying and outputting a signal voltage generated between the electrostatic capacitance terminals are mounted in a chip form. In a solid-state imaging device having a package, a single transistor or a chip having a J-FET mounted thereon is mounted on the package at a position close to the amplifier mounted on the chip mounted in the package. A solid-state imaging device, wherein lead wires for connecting a plurality of output terminals of an amplifier and a plurality of input terminals of a chip on which the single transistor or J-FET is mounted are connected so as not to cross each other. .
JP59125126A 1984-06-20 1984-06-20 Solid-state imaging device Expired - Lifetime JPH07114471B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59125126A JPH07114471B2 (en) 1984-06-20 1984-06-20 Solid-state imaging device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59125126A JPH07114471B2 (en) 1984-06-20 1984-06-20 Solid-state imaging device

Publications (2)

Publication Number Publication Date
JPS615680A JPS615680A (en) 1986-01-11
JPH07114471B2 true JPH07114471B2 (en) 1995-12-06

Family

ID=14902488

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59125126A Expired - Lifetime JPH07114471B2 (en) 1984-06-20 1984-06-20 Solid-state imaging device

Country Status (1)

Country Link
JP (1) JPH07114471B2 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56116373A (en) * 1980-02-18 1981-09-12 Fujitsu Ltd Signal charge detection circuit for line sensor
JPS58220574A (en) * 1982-06-17 1983-12-22 Olympus Optical Co Ltd solid-state imaging device

Also Published As

Publication number Publication date
JPS615680A (en) 1986-01-11

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