JPH071231B2 - Mounted printed circuit board automatic inspection device - Google Patents
Mounted printed circuit board automatic inspection deviceInfo
- Publication number
- JPH071231B2 JPH071231B2 JP950287A JP950287A JPH071231B2 JP H071231 B2 JPH071231 B2 JP H071231B2 JP 950287 A JP950287 A JP 950287A JP 950287 A JP950287 A JP 950287A JP H071231 B2 JPH071231 B2 JP H071231B2
- Authority
- JP
- Japan
- Prior art keywords
- printed circuit
- circuit board
- light
- bridge
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、細く絞られたレーザ光などのビームスポット
を実装済プリント基板上で掃引し、半田付け不良により
実装済プリント基板上に形成されたブリッジの有無の検
出を行うようにした実装済プリント基板自動検査装置に
関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention sweeps a beam spot such as a laser beam that is narrowed down on a mounted printed circuit board, and is formed on the mounted printed circuit board by defective soldering. The present invention relates to a mounted printed circuit board automatic inspection device for detecting the presence or absence of a bridge.
従来、実装済プリント基板における半田付け不良による
ブリッジの検出を行う方法として、プリント基板の部品
穴に合わせて多数のピンを配設したヘッドを用い、この
ヘッドによってピンを被検査プリント基板の半田面に接
触させて各ピン間の導通状態により不良箇所を検出する
接触検査方式がある。しかしながら、この方式において
は、種類の異なるプリント基板毎にヘッドを準備する必
要があり、また、ヘッドのピンの間隔はピンの太さによ
って制限されるのでチップリードの間隔が密なICチップ
などを実装したプリント基板などパターンの緻密なプリ
ント基板に対しては検査が困難であるという問題があっ
た。Conventionally, as a method of detecting a bridge due to poor soldering on a mounted printed circuit board, a head with a large number of pins arranged according to the component holes of the printed circuit board has been used, and the pins are used to solder the printed surface There is a contact inspection method in which a defective portion is detected by contacting with each other and the conduction state between the pins. However, in this method, it is necessary to prepare a head for each different type of printed circuit board, and the pin interval of the head is limited by the thickness of the pin. There is a problem that it is difficult to inspect a printed circuit board having a dense pattern such as a mounted printed circuit board.
上記のような問題を解消するために、レーザ光などのビ
ームを走査して被検査プリント基板上でビームスポット
を掃引して、このビームスポットのスパッタ光(反射
光)等を検知してブリッジなどの検査を行う非接触式の
実装済プリント基板自動検査装置なるものが本出願人に
よって提案され、特開昭61−76940に開示されている。In order to solve the above problems, a beam such as a laser beam is scanned to sweep the beam spot on the printed circuit board to be inspected, and the sputtered light (reflected light) of this beam spot is detected to create a bridge, etc. A non-contact type mounted printed circuit board automatic inspection device for performing the above inspection has been proposed by the present applicant and is disclosed in JP-A-61-76940.
第7図は上記のような非接触式の実装済プリント基板自
動検査装置において検査が行われる実装済プリント基板
のチップ部品の半田接合部の一例を示す図であり、同図
(A)に示したようにプリント基板Pに実装されたチッ
プ部品T1とチップ部品T2のそれぞれのリードL1,L2との
間にブリッジが形成されているとレーザビームBのスパ
ッタ光Sが検知されてブリッジの検出を行うことができ
るが、例えば同図(B)に示したように、チップ部品T2
のリードL2が曲げられて半田接合されている場合、ブリ
ッジが形成されていないにもかかわらずこのリードL2に
よってレーザビームBのスパッタ光が生じ、このスパッ
タ光が検知されてブリッジの誤検出をする場合がある。FIG. 7 is a diagram showing an example of a solder joint portion of a chip component of a mounted printed circuit board, which is inspected by the non-contact type mounted printed circuit board automatic inspection apparatus as described above, and is shown in FIG. As described above, when a bridge is formed between the leads L 1 and L 2 of the chip component T 1 and the chip component T 2 mounted on the printed circuit board P, the sputtered light S of the laser beam B is detected. as can be detected in the bridge, for example, it is shown in FIG. (B), the chip component T 2
When the lead L 2 of is bent and soldered, the sputter light of the laser beam B is generated by the lead L 2 even though the bridge is not formed, and the sputter light is detected and the bridge is erroneously detected. May be
本発明は、上記した問題点を解決してブリッジの検出を
行うために、細く絞られたビームを被検査プリント基板
上に照射し、この反射光がビームの照射方向と反対方向
に反射する該反射光を検知してプリント基板のブリッジ
検査を行う実装済プリント基板自動検査装置において、
前記ビームを前記被検査プリント基板に向かって垂直に
通過させる開口が形成され、かつ、被検査プリント基板
のビーム照射面を覆うと共に、照射されるビームを囲う
受光面を有する受光部と、前記ビームを前記電子部品が
半田付けされる部品実装部(穴)を結ぶ線分と交差する
方向に複数回掃引する手段と、前記掃引された回数のビ
ームの反射光を前記受光部で全て受光した場合にブリッ
ジ有りと判定する処理装置とを具備したものである。In order to solve the above-mentioned problems and to detect a bridge, the present invention irradiates a printed circuit board to be inspected with a narrowly focused beam, and the reflected light is reflected in a direction opposite to the beam irradiation direction. In the mounted printed circuit board automatic inspection device that detects the reflected light and performs the bridge inspection of the printed circuit board,
A light receiving portion having an opening for passing the beam vertically toward the printed circuit board to be inspected, covering a beam irradiation surface of the printed circuit board to be inspected, and having a light receiving surface surrounding the beam to be irradiated; A means for sweeping a plurality of times in a direction intersecting a line segment connecting a component mounting portion (hole) to which the electronic component is soldered, and a case where all the reflected light of the number of times of the sweep is received by the light receiving portion And a processing device for determining that there is a bridge.
第1図(A)に示したように第1の掃引位置X1でビーム
スポットを掃引してリードL2によってスパッタ光が生じ
て検知されると、第2の掃引位置L2でビームスポットが
掃引され、この第2の掃引位置X2でリードL2によってス
パッタ光が生じて検知されると、第3の掃引位置X3でビ
ームスポットが掃引される。When sputtered light is detected caused by a lead L 2 by sweeping the beam spot in the first sweep position X 1 as shown in FIG. 1 (A), the beam spot at the second sweep position L 2 is is swept, the sputtering beam is detected caused by the lead L 2 in the second sweep position X 2, the beam spot is swept by a third sweep position X 3.
この第3の掃引位置X3はリードL1と交叉しないのでスパ
ッタ光が生じず、スパッタ光が検知されないのでブリッ
ジが形成されていないと判定される。Since the third sweep position X 3 does not intersect the lead L 1 , sputter light is not generated and sputter light is not detected, it is determined that the bridge is not formed.
また同図(B)に示したように、上記同様に順次ビーム
スポットが各掃引位置Xで掃引され、全ての掃引位置X
でスパッタ光が検知されるとブリッジが形成されている
と判定され、ブリッジの検出が行われる。Further, as shown in FIG. 7B, the beam spots are sequentially swept at the respective sweep positions X in the same manner as described above, and all the sweep positions X
When the sputtered light is detected in, it is determined that a bridge is formed, and the bridge is detected.
第3図は本発明を適用した実装済プリント基板自動検査
装置の全体を示す正面図であり、11はケーシング、12は
このケーシング内に配設された被検査物であるプリント
基板Pが載置されてX軸方向とY軸方向とに自由に移動
されるX−Yステージである。13は上記X−Yステージ
12の上方に配置され、後述説明するようなプリント基板
のビーム照射部分を覆うような形状の受光面を有する受
光部であり、受光面に配設された多数の受光素子によっ
てスパッタ光が検出される。14は上記X−Yステージ12
の下方に設置された受光器であり、プリント基板上の基
準点を設定するときなどに上記受光部13を通過するレー
ザ光をプリント基板に設けられた基準孔を介して受光す
るものである。15はケーシング11の上面に設けられた操
作スイッチ群であり、16は装置の動作状態を示す表示
灯、17は検査結果をプリントアウトするプリンタであ
る。FIG. 3 is a front view showing the entire mounted printed circuit board automatic inspection apparatus to which the present invention is applied. 11 is a casing, and 12 is a printed circuit board P which is an object to be inspected and is placed in the casing. It is an XY stage that is moved and freely moved in the X-axis direction and the Y-axis direction. 13 is the XY stage above
12 is a light-receiving unit having a light-receiving surface shaped to cover the beam-irradiated portion of the printed circuit board, which will be described later, and sputter light is detected by a large number of light-receiving elements arranged on the light-receiving surface. It 14 is the above XY stage 12
Is a light receiver installed below the laser light source and receives the laser light passing through the light receiving unit 13 through a reference hole provided in the printed board when setting a reference point on the printed board. Reference numeral 15 is a group of operation switches provided on the upper surface of the casing 11, 16 is an indicator light indicating the operation state of the apparatus, and 17 is a printer for printing out the inspection result.
この実装済プリント基板自動検査装置では、検査に先立
って被検査プリント基板上の基準位置、検査位置あるい
はプリント基板の種類などを識別する基板名などの検査
用データが予め記憶装置などに登録され、検査を行うと
きには、被検査プリント基板をX−Yステージ12に設置
して基板名などを図示しない端末装置から入力すると、
予め記憶された検査個所の位置情報および被測定物(リ
ード、半田等)からの反射光がビームの照射方向と反対
方向に反射する個所か、照射方向と同じ方向に反射する
個所か(実質的にはプリント基板とのなす角度が略45度
より小さい個所か大きい個所)などの位置情報などの検
査用データに基づいて自動的に検査が行われ、検査が終
了すると検出したブリッジの個所あるいは個数などの検
査結果がプリンタ17からプリントアウトされると共に、
図示しないマーカにより被検査プリント基板のブリッジ
個所付近にマークがつけられる。In this mounted printed circuit board automatic inspection device, inspection data such as the reference position on the inspected printed circuit board, the inspection position or the board name for identifying the type of the printed circuit board is registered in advance in the storage device or the like before the inspection. When performing the inspection, if the printed circuit board to be inspected is installed on the XY stage 12 and the board name and the like are input from a terminal device (not shown),
Pre-stored position information of the inspection point and whether the reflected light from the DUT (lead, solder, etc.) is reflected in the direction opposite to the beam irradiation direction or in the same direction as the irradiation direction (substantially Is automatically inspected based on the inspection data such as position information such as the location where the angle with the printed circuit board is smaller than 45 degrees or the location where the angle is larger than 45 degrees). The inspection results such as are printed out from the printer 17,
A mark (not shown) is provided near the bridge portion of the printed circuit board to be inspected.
第4図は上記第3図に示した装置の光学系を示す斜視図
であり、21はレーザ光を放射するHe−Neレーザ銃、22は
ビームスポットを充分に絞るために上記He−Neレーザ銃
21が放射するレーザ光を一旦5mm程度に平行ビームに拡
張するためのエキスパンダである。23は前記X−Yステ
ージ12のY軸方向にビームスポットが掃引されるように
レーザビームを走査するY軸回転ミラー23aと、同様に
X軸方向にビームスポットが掃引されるようにレーザビ
ームを走査するX軸回転ミラー23bとを備えたガルバノ
メータであり、このガルバノメータ23によって各回転ミ
ラーの可動範囲に基づく立体角内でレーザビームが走査
される。24は上記ガルバノメータ23によって操作された
レーザビームを第1のミラー25および第2のミラー26を
介してプリント基板P上に集光する集光レンズである。FIG. 4 is a perspective view showing the optical system of the apparatus shown in FIG. 3, 21 is a He-Ne laser gun for emitting a laser beam, and 22 is the He-Ne laser for sufficiently narrowing the beam spot. gun
This is an expander for expanding the laser beam emitted by 21 into a parallel beam once to about 5 mm. Reference numeral 23 denotes a Y-axis rotating mirror 23a that scans the laser beam so that the beam spot is swept in the Y-axis direction of the XY stage 12, and similarly the laser beam is swept so that the beam spot is swept in the X-axis direction. This is a galvanometer having an X-axis rotating mirror 23b for scanning, and the galvanometer 23 scans the laser beam within a solid angle based on the movable range of each rotating mirror. A condenser lens 24 condenses the laser beam operated by the galvanometer 23 on the printed circuit board P via the first mirror 25 and the second mirror 26.
なお、図に示したようにこの装置においては、上記ガル
バノメータ23によって走査されたレーザビームからその
一部をビームスプリッタ27で分離し、このビームスプリ
ッタ27を透過したビームBを上記のようにプリント基板
P上に照射するとともに、ビームスプリッタ27によって
反射されたビームを第2の集光レンズ28によって光点位
置検出素子29の受光面上に集光させ、この光点位置検出
素子29によって検出されるビームスポットの位置情報に
基づいてプリント基板Pに照射されるビームBのスポッ
ト位置をサーボ制御するようにしてある。As shown in the figure, in this apparatus, a part of the laser beam scanned by the galvanometer 23 is separated by a beam splitter 27, and the beam B transmitted through the beam splitter 27 is printed on the printed circuit board as described above. The beam reflected by the beam splitter 27 is focused on the light receiving surface of the light spot position detecting element 29 by the second condensing lens 28 while being irradiated onto P, and is detected by this light spot position detecting element 29. The spot position of the beam B irradiated on the printed circuit board P is servo-controlled based on the position information of the beam spot.
第2図は上記実装済プリント基板自動検査装置のブロッ
ク説明図であり、処理装置1には図示しない記憶装置が
設けられており、この記憶装置に予め記憶されている検
査用データに基づいてX−Yステージ12が駆動されてプ
リント基板P上のブリッジ検査個所がレーザビームBの
照射範囲内に移動されると、ガルバノメータ23が制御さ
れて後述するように実装部品穴の間の3個所の掃引位置
でレーザビームBのビームスポットが掃引され、このビ
ームスポットのスパッタ光を受光部13によって検知して
ブリッジの検査がおこなわれる。FIG. 2 is a block diagram of the printed circuit board automatic inspection device described above. The processing device 1 is provided with a storage device (not shown), and X is determined based on the inspection data stored in advance in this storage device. -When the Y stage 12 is driven and the bridge inspection point on the printed circuit board P is moved within the irradiation range of the laser beam B, the galvanometer 23 is controlled to sweep three points between the mounting component holes as described later. The beam spot of the laser beam B is swept at the position, and the sputtered light of this beam spot is detected by the light receiving unit 13 to inspect the bridge.
第6図は本発明によるブリッジ検出の一例を示す図であ
り、部品穴が一定のピッチで並ぶ定ピッチプリント基板
でのブリッジ検査を行う場合を示してある。FIG. 6 is a diagram showing an example of bridge detection according to the present invention, and shows a case where a bridge inspection is performed on a constant pitch printed circuit board in which component holes are arranged at a constant pitch.
このプリント基板の検査を行う場合は、前記検査用デー
タに基づき、第6図(A)に破線で示したように一定数
の部品穴Hを被覆する範囲内にレーザビームが照射され
るようにガルバノメータ23が駆動され、ブリッジ検出を
行う検査個所では、同図(B)に示したように、部品穴
H1とH2とを結ぶ線分の垂直二等分線上の掃引位置X1とそ
の両側の掃引位置X2およびX3の予め設定された3個所の
掃引位置で図に矢印で示したように第1の掃引位置X1、
第2の掃引位置X2、第3の掃引位置X3の順にビームスポ
ットを掃引して検査が行われる。When this printed circuit board is inspected, the laser beam is irradiated within a range that covers a certain number of component holes H, as indicated by the broken line in FIG. 6A, based on the inspection data. At the inspection point where the galvanometer 23 is driven and the bridge is detected, as shown in FIG.
Sweep position X 1 on the vertical bisector of the line segment connecting H 1 and H 2 and sweep positions X 2 and X 3 on both sides of the line are preset three sweep positions as shown by arrows in the figure. At the first sweep position X 1 ,
The inspection is performed by sweeping the beam spot in the order of the second sweep position X 2 and the third sweep position X 3 .
第5図は前記処理装置1の制御に基づいて行われるブリ
ッジ検査時の動作フローチャートであり、処理装置1の
制御によって前記ガルバノメータ23が駆動されて上記の
ように各掃引位置でビームスポットの掃引が行われる間
に、受光部13の出力信号が上記処理装置1で監視されて
おり、スパッタ光が検出されない掃引位置が一個所でも
有った場合はブリッジが形成されていないと判定して即
座に次のブリッジ検出位置で検査を開始し、全ての掃引
位置でスパッタ光が検知された場合はブリッジが形成さ
れていると判定し、次のブリッジ検査個所でのブリッジ
検出が行われる。FIG. 5 is an operation flow chart at the time of the bridge inspection performed under the control of the processing device 1. The galvanometer 23 is driven by the control of the processing device 1 to sweep the beam spot at each sweep position as described above. While the process is being performed, the output signal of the light receiving unit 13 is monitored by the processing apparatus 1, and if there is even one sweep position where sputtered light is not detected, it is immediately determined that a bridge is not formed. Inspection is started at the next bridge detection position, and if sputter light is detected at all sweep positions, it is determined that a bridge is formed, and bridge detection is performed at the next bridge inspection location.
このようにしてガルバノメータ23の駆動範囲の1検査ブ
ロックでの検査が終了すると、前記X−Yステージが駆
動されて次の検査ブロックで同様に検査が行われる。When the inspection in one inspection block in the driving range of the galvanometer 23 is completed in this way, the XY stage is driven and the same inspection is performed in the next inspection block.
一般にブリッジ個所あるいはリードが曲がっている個所
は少ない。したがって、上記のようにスパッタ光が検知
された時点で次の検査個所でのブリッジ検査を行うよう
にすると、ほとんどの検査個所は一回の掃引でブリッジ
無と判定されて次の検査個所の検査に移るので検査時間
への影響がほとんどない。Generally, there are few bridges or bent leads. Therefore, if the bridge inspection is performed at the next inspection point at the time when the sputtered light is detected as described above, most of the inspection points are judged to have no bridge in one sweep, and the next inspection point is inspected. There is almost no effect on the inspection time because it moves to.
なお、第6図(C)に示したように、プリント基板の部
品穴Hのピッチが例えば2.54mmで、この部品穴の導線簿
D間が1.54mmであるとすると、上記3つの掃引位置の間
隔を0.5mmに設定して検査を行うようにすれば、導電簿
にビームスポットが照射されることがないので誤検出を
回避することができる。As shown in FIG. 6 (C), assuming that the pitch of the component holes H of the printed circuit board is 2.54 mm and the distance between the lead wires D of the component holes is 1.54 mm, the above three sweep positions If the interval is set to 0.5 mm and the inspection is performed, the conductive spot is not irradiated with the beam spot, so that erroneous detection can be avoided.
また、このような掃引位置の間隔の設定は、前記検査用
データに記憶するようにすることができることはいうま
でもない。Needless to say, such setting of the interval between the sweep positions can be stored in the inspection data.
さらに、前記した実施例においては、部品穴を結ぶ線分
と交差する方向にビームを掃引する場合について説明し
たが、部品実装部であるパターン間を結ぶ線分と交差す
る方向にビームを掃引してもよいことは勿論である。Further, in the above-described embodiment, the case where the beam is swept in the direction intersecting the line segment connecting the component holes has been described, but the beam is swept in the direction intersecting the line segment connecting the patterns which are the component mounting portions. Of course, it is okay.
本発明は上記したように、垂直方向からプリント基板に
対して反射光が上方に向かって反射される被測定物(リ
ード、半田等)に向かってビームが照射されると共に、
該ビームは部品実装部(穴)を結ぶ線分と交差する方向
に掃引するようにし、かつ、前記掃引された回数の反射
光を全て受光部で検出したときにブリッジであると判断
するようにしたので、ブリッジ検査の検査性能を向上す
ることができる等の効果を有するものである。As described above, the present invention irradiates a beam toward a DUT (lead, solder, etc.) in which reflected light is reflected upward from a vertical direction with respect to a printed circuit board, and
The beam is swept in a direction intersecting with a line segment connecting the component mounting parts (holes), and it is determined to be a bridge when all the reflected light of the swept number is detected by the light receiving part. As a result, the inspection performance of the bridge inspection can be improved.
第1図は本発明の実装済プリント基板自動検査装置の原
理を示す図、 第2図は本発明を適用した実装済プリント基板自動検査
装置のブロック説明図、 第3図は本発明を適用した実装済プリント基板自動検査
装置の全体を示す図、 第4図は本発明を適用した実装済プリント基板自動検査
装置の光学系を示す図である。 第5図は実施例のブリッジ検査時の動作フローチャー
ト、 第6図は本発明にによるブリッジ検出の一例を示す図、 第7図はブリッジの誤検出を説明する図である。 P……被検査プリント基板、H……部品穴、B……ビー
ム、X……掃引位置。FIG. 1 is a diagram showing the principle of the mounted printed circuit board automatic inspection device of the present invention, FIG. 2 is a block explanatory diagram of the mounted printed circuit board automatic inspection device to which the present invention is applied, and FIG. 3 is applied to the present invention. FIG. 4 is a diagram showing the entire mounted printed circuit board automatic inspection device, and FIG. 4 is a diagram showing an optical system of the mounted printed circuit board automatic inspection device to which the present invention is applied. FIG. 5 is an operation flowchart at the time of bridge inspection of the embodiment, FIG. 6 is a diagram showing an example of bridge detection according to the present invention, and FIG. 7 is a diagram explaining erroneous bridge detection. P: printed circuit board to be inspected, H: component hole, B: beam, X: sweep position.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭61−76940(JP,A) 特開 昭60−133968(JP,A) 特開 昭57−196140(JP,A) 特開 昭63−177044(JP,A) ─────────────────────────────────────────────────── ─── Continuation of the front page (56) Reference JP 61-76940 (JP, A) JP 60-133968 (JP, A) JP 57-196140 (JP, A) JP 63- 177044 (JP, A)
Claims (1)
上に照射し、この反射光がビームの照射方向と反対方向
に反射する該反射光を検知してプリント基板のブリッジ
検査を行う実装済プリント基板自動検査装置において、 前記ビームを前記被検査プリント基板に向かって垂直に
通過させる開口が形成され、かつ、被検査プリント基板
のビーム照射面を覆うと共に、照射されるビームを囲う
受光面を有する受光部と、前記ビームを前記電子部品が
半田付けされる部品実装部(穴)を結ぶ線分と交差する
方向に複数回掃引する手段と、前記掃引された回数の反
射光を前記受光部で全て受光した場合にブリッジ有りと
判定する処理装置とを具備したことを特徴とする実装済
プリント基板自動検査装置。1. A printed circuit board bridge inspection is carried out by irradiating a printed circuit board to be inspected with a narrowly focused beam, and detecting the reflected light reflected by the reflected light in a direction opposite to the beam irradiation direction. In the printed circuit board automatic inspection apparatus, an opening is formed through which the beam passes vertically toward the printed circuit board to be inspected, and the beam irradiation surface of the printed circuit board to be inspected is covered and a light receiving surface surrounding the irradiated beam is formed. And a means for sweeping the beam a plurality of times in a direction intersecting a line segment connecting a component mounting portion (hole) to which the electronic component is soldered, and the light receiving portion for the reflected light of the number of sweeps. An automatic inspection apparatus for mounted printed circuit boards, comprising: a processing device that determines that a bridge exists when all light is received.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP950287A JPH071231B2 (en) | 1987-01-19 | 1987-01-19 | Mounted printed circuit board automatic inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP950287A JPH071231B2 (en) | 1987-01-19 | 1987-01-19 | Mounted printed circuit board automatic inspection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63177043A JPS63177043A (en) | 1988-07-21 |
| JPH071231B2 true JPH071231B2 (en) | 1995-01-11 |
Family
ID=11722015
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP950287A Expired - Fee Related JPH071231B2 (en) | 1987-01-19 | 1987-01-19 | Mounted printed circuit board automatic inspection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH071231B2 (en) |
-
1987
- 1987-01-19 JP JP950287A patent/JPH071231B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63177043A (en) | 1988-07-21 |
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