Deprecated: The each() function is deprecated. This message will be suppressed on further calls in /home/zhenxiangba/zhenxiangba.com/public_html/phproxy-improved-master/index.php on line 456
JPH0715584B2 - Electrophotographic photoreceptor - Google Patents
[go: Go Back, main page]

JPH0715584B2 - Electrophotographic photoreceptor - Google Patents

Electrophotographic photoreceptor

Info

Publication number
JPH0715584B2
JPH0715584B2 JP25412285A JP25412285A JPH0715584B2 JP H0715584 B2 JPH0715584 B2 JP H0715584B2 JP 25412285 A JP25412285 A JP 25412285A JP 25412285 A JP25412285 A JP 25412285A JP H0715584 B2 JPH0715584 B2 JP H0715584B2
Authority
JP
Japan
Prior art keywords
layer
photosensitive member
electrophotographic photosensitive
charge transfer
photoconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP25412285A
Other languages
Japanese (ja)
Other versions
JPS62113156A (en
Inventor
栄一郎 田中
浩二 秋山
昭雄 滝本
正則 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP25412285A priority Critical patent/JPH0715584B2/en
Publication of JPS62113156A publication Critical patent/JPS62113156A/en
Publication of JPH0715584B2 publication Critical patent/JPH0715584B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/043Photoconductive layers characterised by having two or more layers or characterised by their composite structure
    • G03G5/0433Photoconductive layers characterised by having two or more layers or characterised by their composite structure all layers being inorganic
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
    • G03G5/082Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
    • G03G5/082Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
    • G03G5/08214Silicon-based
    • G03G5/08221Silicon-based comprising one or two silicon based layers
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03GELECTROGRAPHY; ELECTROPHOTOGRAPHY; MAGNETOGRAPHY
    • G03G5/00Recording-members for original recording by exposure, e.g. to light, to heat or to electrons; Manufacture thereof; Selection of materials therefor
    • G03G5/02Charge-receiving layers
    • G03G5/04Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor
    • G03G5/08Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic
    • G03G5/082Photoconductive layers; Charge-generation layers or charge-transporting layers; Additives therefor; Binders therefor characterised by the photoconductive material being inorganic and not being incorporated in a bonding material, e.g. vacuum deposited
    • G03G5/08292Germanium-based

Landscapes

  • Chemical & Material Sciences (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photoreceptors In Electrophotography (AREA)

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、電荷蓄積モードで利用する光(ここでは広義
の光を意味し、可視光線、X線、紫外線、赤外線等を含
む電磁波を言う)に感度を有する光導電体に係り、電子
写真感光体に関する。
Description: TECHNICAL FIELD The present invention relates to light used in a charge storage mode (here, light in a broad sense, which means electromagnetic waves including visible light, X-rays, ultraviolet rays, infrared rays, etc.). The present invention relates to a photoconductor having sensitivity and an electrophotographic photoreceptor.

従来の技術 電荷蓄積モードで利用する光に感度を有し、電子写真用
感光体として利用される光導電体として、高い光感度と
無公害性、高い硬度を有することから、局在化状態密度
を減少せしめる修飾物質として10〜40atm%の水素を含
む非晶質シリコン(以下a-Siと記す)が注目されてい
る。
2. Description of the Related Art As a photoconductor used as a photoconductor for electrophotography, which has sensitivity to light used in a charge storage mode, it has high photosensitivity, no pollution, and high hardness. Amorphous silicon (hereinafter referred to as a-Si) containing 10 to 40 atm% of hydrogen has been attracting attention as a modifier that reduces the amount of hydrogen.

しかしながら、上記のa-Siで構成される電子写真感光体
は暗抵抗値、光応答性、電荷蓄積に伴う帯電電位の低
さ、あるいは耐湿性等の使用環境特性の点などの総合的
な特性向上をまだ必要としている。
However, the electrophotographic photoreceptor composed of a-Si described above has comprehensive characteristics such as dark resistance value, photoresponsiveness, low charge potential due to charge accumulation, and environmental characteristics such as humidity resistance. Still in need of improvement.

例えば、第1の問題としてa-Siを用いた電子写真感光体
は、他の感光体材料である有機光導電体(以下OPCと記
す)あるいはSeに比較して比誘電率が大きく(OPC:〜3,
Se:〜6,a-Si:〜11)、静電容量が大きいため、表面への
帯電処理の際大きな帯電電流を必要とする。このため、
他の電子写真感光体材料に比べ、低い表面電位(OPC,Se
等では600〜800Vであるのに比べて400V前後)で使用し
なければならないのが現状である。またこのことによ
り、例えば通常の電子写真装置として2成分現像剤を用
いる一般の複写機で、特に通常の電荷量をもつトナーを
用いて画像の複写をおこなう場合、高い飽和濃度の画像
を連続して安定に得ることは困難である。
For example, as a first problem, an electrophotographic photoconductor using a-Si has a larger relative dielectric constant (OPC: OPC) than other photoconductor materials such as an organic photoconductor (hereinafter referred to as OPC) or Se. ~ 3,
Se: ~ 6, a-Si: ~ 11), and a large electrostatic capacity requires a large charging current when the surface is charged. For this reason,
Low surface potential (OPC, Se
However, the current situation is that it must be used at around 400V compared to 600-800V. This also makes it possible, for example, in a general copying machine using a two-component developer as an ordinary electrophotographic apparatus, particularly when an image is copied using a toner having a normal charge amount, an image having a high saturation density is continuously formed. It is difficult to get stable.

更に、静電容量の大きい感光体は光感度特性においても
問題があり、例えば比誘電率の小さい感光体に比べ表面
の電荷量が多いため、表面電荷を光キャリアによって打
ち消して表面電位を下げるのにより多くの光子(photo
n)を必要とし、実用上不利な点が多い。
Further, a photoconductor having a large electrostatic capacity also has a problem in photosensitivity characteristics. For example, since the surface charge amount is larger than that of a photoconductor having a small relative permittivity, surface charges are canceled by photocarriers to lower the surface potential. More photons (photo
n) is required, and there are many practical disadvantages.

第2の問題として、光導電体の高抵抗化し表面電位を向
上させるために、a-Si中に酸素、炭素、窒素等を添加し
て使用する場合、使用時に残留電位が多く残る。また繰
り返し使用時においては、疲労の蓄積によるゴースト現
象を発生し、あるいは、光応答性が悪化する等の問題が
あった。
Second, when oxygen, carbon, nitrogen or the like is added to a-Si in order to increase the resistance of the photoconductor and improve the surface potential, a large residual potential remains during use. Further, upon repeated use, there is a problem that a ghost phenomenon occurs due to accumulated fatigue, or photoresponsiveness deteriorates.

更に、第3の問題として、感光体の構成によっては高温
高湿時において画像の「ボケ」が生じる等の問題も無視
できない。
Further, as a third problem, depending on the structure of the photoconductor, a problem such as "blurring" of the image at high temperature and high humidity cannot be ignored.

発明が解決しようとする問題点 第1の静電容量を減少せしめる手段として、特開昭54-1
43645号公報には有機半導体材料を用いた機能分離型の
感光部材が、また特開昭56-24355号公報には無機半導体
材料を用いた機能分離型感光体が開示されている。
Problems to be Solved by the Invention As means for reducing the first capacitance, Japanese Patent Laid-Open No. 54-1
43645 discloses a function-separated type photosensitive member using an organic semiconductor material, and JP-A-56-24355 discloses a function-separated type photosensitive member using an inorganic semiconductor material.

前者の有機半導体材料を用いた場合、a-Siの持つ高い硬
度の特徴を生かした長寿命感光体として機能しなくなる
ため、決して有効な手段とは言えない。
When the former organic semiconductor material is used, it cannot be said to be an effective means because it does not function as a long-life photoreceptor due to the high hardness characteristic of a-Si.

また、後者では多結晶化しやすいカルコゲン材料、ある
いは比誘電率の大きい材料(SiCでは〜10)等のため
に、比抵抗の大きい材料を使用することによる帯電電圧
の向上が期待されるものの、前記第2の問題であった残
留電位の増加等の問題が解決されず、a-Siの特徴である
長寿命、高感度で、しかも低残留電位のままで、高い帯
電電位のあるいは早い光応答性を有した感光体を得るこ
とはできないと言う問題があった。
In the latter case, the chalcogen material which is likely to be polycrystallized or the material having a large relative dielectric constant (~ 10 for SiC) is expected to improve the charging voltage by using a material having a large specific resistance. The problems such as the increase in residual potential, which was the second problem, are not solved, and the characteristics of a-Si are long life, high sensitivity, low residual potential, high charge potential and fast photoresponsiveness. There is a problem that it is not possible to obtain a photoconductor having

本発明はこのような問題点を解決するもので、静電容量
を減少せしめ、光応答性の優れた電子写真感光体を提供
することを目的とするものである。
The present invention solves such problems, and an object thereof is to provide an electrophotographic photosensitive member having a reduced electrostatic capacity and an excellent photoresponsiveness.

問題点を解決するための手段 上記問題点を解決するために、本発明は、光励起によっ
て移動可能なキャリアを発生する光導電層と、上記キャ
リアが効率よく注入されて効果的に輸送される電荷移動
層とが積層された構造を有し、上記電荷移動層が窒化ス
ズを主成分とする構成にしたものである。
Means for Solving the Problems In order to solve the above problems, the present invention provides a photoconductive layer that generates movable carriers by photoexcitation, and a charge that is efficiently injected by effectively injecting the carriers. The charge transfer layer has a structure in which a transfer layer is laminated, and the charge transfer layer contains tin nitride as a main component.

作用 窒化スズは、窒素の組成比によってその光学的禁止帯幅
が〜3.0eV以下と大きく変化するものであり、シリコ
ン、ゲルマニュームを添加して1.5〜4.5eVまで変化させ
てもn型伝導を示す。また、その大きな光学的禁止帯幅
の材料でも活性化エネルギーが0.9eV以下と小さく、電
子の移動度が大きいため、光導電層から窒化スズ化合物
の伝導帯に効率よく電子が注入されるようにそれぞれの
光学的禁止帯幅を制御すれば、容易に良好な感光部材が
得られる。さらに、窒化スズ化合物の比誘電率は光学的
禁止帯幅が1.5〜3.5eVの材料で5〜9と小さい。
Action Tin nitride has an optical bandgap that greatly changes to ~ 3.0 eV or less depending on the composition ratio of nitrogen, and exhibits n-type conduction even if it is changed to 1.5 to 4.5 eV by adding silicon or germanium. . In addition, even with a material with a large optical band gap, the activation energy is small at 0.9 eV or less, and the electron mobility is high, so that electrons can be efficiently injected from the photoconductive layer into the conduction band of the tin nitride compound. A good photosensitive member can be easily obtained by controlling the respective optical band gaps. Furthermore, the relative permittivity of tin nitride compounds is as small as 5-9 for materials with an optical bandgap of 1.5-3.5 eV.

このような窒化スズを電荷移動層として感光体に使用す
ることによって、a-Si、非晶質シリコンゲルマニウム
(以下a-SiGeと記す)あるいは非晶質ゲルマニウム(以
下a-Geと記す)などの比誘電率の大きな感光層を光導電
層として用いても全体として比誘電率の小さい感光体が
えられ、実用上光感度および表面電位の高い感光体が得
られる。
By using such a tin nitride as a charge transfer layer in a photoreceptor, a-Si, amorphous silicon germanium (hereinafter referred to as a-SiGe), amorphous germanium (hereinafter referred to as a-Ge), etc. Even if a photosensitive layer having a large relative dielectric constant is used as a photoconductive layer, a photosensitive member having a small relative dielectric constant can be obtained as a whole, and a photosensitive member having a high photosensitivity and a high surface potential can be obtained in practical use.

電荷移動層としては、1〜80μm、好ましくは10〜50μ
m、光導電層としては0.5〜50μm好ましくは1〜5μ
m形成し用いることが望ましい。
As the charge transfer layer, 1 to 80 μm, preferably 10 to 50 μm
m, the photoconductive layer is 0.5 to 50 μm, preferably 1 to 5 μm
It is desirable to form and use m.

実施例 以下本発明の一実施例を図面に基づいて説明する。本発
明で使用される電荷移動層としての非晶質窒化スズ膜
(以下a-Sn1-xNx、但し0<x<1と記し、水素あるい
はハロゲン原子を含む膜を言う)の作成には、SnCl4
テトラメチルスズ〔(CH3)4Sn〕、テトラエチルスズ〔(C
2H5)4Sn〕、加熱溶融されたSnF2等のSn原子の原料ガス
あるいはこれらのガスをH2,Ar,He等のガスで希釈したガ
スおよびN2,NH3,H2NNH2,HN3,HN4N3,F3N,F4N2等の
N原子の原料ガスを用いたプラズマCVD法や、SnまたはS
nF2,SnI4,SnI2,SnCl2,SnP,Sn3P,SnSをターゲットと
してのAr,H2,N2,NH3中での反応性スパッタ法や反応性
蒸着法が使用される。
Embodiment An embodiment of the present invention will be described below with reference to the drawings. For forming an amorphous tin nitride film (hereinafter referred to as a-Sn 1-x N x , where 0 <x <1 means a film containing hydrogen or halogen atoms) as a charge transfer layer used in the present invention. Is SnCl 4 ,
Tetramethyl tin [(CH 3) 4 Sn], tetraethyl tin [(C
2 H 5 ) 4 Sn], a source gas of Sn atoms such as SnF 2 that has been heated and melted, or a gas obtained by diluting these gases with a gas such as H 2 , Ar, or He, and N 2 , NH 3 , H 2 NNH 2 , HN 3 , HN 4 N 3 , F 3 N, F 4 N 2 and other plasma CVD methods using N atom source gases, Sn or S
nF 2, SnI 4, SnI 2 , SnCl 2, SnP, Sn 3 P, Ar of SnS as the target, H 2, N 2, NH 3 reactive sputtering or reactive evaporation method in is employed.

また、光導電層としてのa-Siは、SiH4,Si2H6,Si3H8
SiF4,SiHF3,SiH2F2,SiH3F,SiCl4,SiHCl3,SiH2C
l2,SiH3Cl等のSi原子の原料ガスあるいはこれらのガス
をH2,Ar,He等のガスで希釈したガスを用いたプラズマCV
D法、またはSiをターゲットとしてのAr,H2の中での反応
性スパッタ法や反応性蒸着法で形成できる。また、a-Ge
は、GeH4,Ge2H6,Ge3H8,GeF4,GeHF3,GeH2F2,GeH
3F,GeCl4,GeHCl3,GeH2Cl2,GeH3Cl,GeF2,GeCl2
のGe原子の原料ガスあるいはこれらのガスをH2,Ar,He等
で希釈したガスを用いたプラズマCVD法、またはGeをタ
ーゲットとしてのAr,H2の中での反応性スパッタ法や反
応性蒸着法で形成され、a-SiGeも同様に、上記Ge原子の
原料ガスとSi原子の原料ガスの混合ガス、あるいはこの
混合ガスをH2,Ar,He等のガスで希釈したガスをもちいた
プラズマCVD法や、SiとGeの混合されたターゲットある
いはSiとGeの2枚のターゲットを用いた反応性スパッタ
法や反応性蒸着法で形成される。
In addition, a-Si as a photoconductive layer includes SiH 4 , Si 2 H 6 , Si 3 H 8 ,
SiF 4 , SiHF 3 , SiH 2 F 2 , SiH 3 F, SiCl 4 , SiHCl 3 , SiH 2 C
Plasma CV using source gases of Si atoms such as l 2 and SiH 3 Cl or gases obtained by diluting these gases with gases such as H 2 , Ar and He
It can be formed by a D method or a reactive sputtering method or a reactive vapor deposition method in Ar, H 2 with Si as a target. Also, a-Ge
Is GeH 4 , Ge 2 H 6 , Ge 3 H 8 , GeF 4 , GeHF 3 , GeH 2 F 2 , GeH
3 F, GeCl 4, GeHCl 3 , GeH 2 Cl 2, GeH 3 Cl, plasma raw material gas or these gases Ge atoms such as GeF 2, GeCl 2 with H 2, Ar, gas diluted with He or the like It is formed by the CVD method, or the reactive sputtering method or the reactive vapor deposition method in Ar, H 2 using Ge as the target, and a-SiGe is similarly formed of the source gas of the Ge atom and the source gas of the Si atom. Plasma CVD method using a mixed gas, or a gas obtained by diluting this mixed gas with a gas such as H 2 , Ar, or He, or reaction using a mixed target of Si and Ge or two targets of Si and Ge It is formed by a reactive sputtering method or a reactive vapor deposition method.

また、a−Sn1-xNzにSi、Ge等を添加する場合も同じ
く、上記Sn原子の原料ガスとSiまたはGe原子の原料ガ
ス、あるいはこの混合ガスをH2,Ar,He等のガスで希釈し
たガスをSn原子の原料ガスに加えて用いたプラズマCVD
法や、Si,Geを混合したターゲットあるいは複数のター
ゲットを用いた反応性スパッタ法や反応性蒸着法によっ
て形成される。
Similarly, when adding Si, Ge, or the like to a-Sn 1-x N z , the source gas of Sn atoms and the source gas of Si or Ge atoms, or the mixed gas thereof is used as H 2 , Ar, He, or the like. Plasma CVD using gas diluted with gas as source gas of Sn atoms
Or a reactive sputtering method or a reactive vapor deposition method using a target mixed with Si or Ge or a plurality of targets.

次に、実施例1では反応性スパッタ法を用いた例につい
て、実施例2,3および実施例4ではプラズマCVD法を用い
た例について説明する。
Next, an example using the reactive sputtering method will be described in Example 1, and an example using the plasma CVD method will be described in Examples 2 and 3 and Example 4.

実施例1 第1図に示した本発明の感光体の断面図を参照にして説
明する。鏡面研磨したアルミニウム(Al)基板11をマグ
ネトロンスパッタ装置内に配置し、2×10-6Torr以下に
排気後、基板温度を250℃に上昇させた。Snをターゲッ
トとして、Arを1〜3mTorr、N2を2〜6mTorrで装置内に
導入し、周波数13.56MHzの高周波電力300〜500Wによ
り、電荷移動層であるa−Sn1-xNx層12を15μm形成し
た。続いてArを1〜10mTorr、H2を0.3〜4mTorrで導入
し、多結晶をターゲットとして、放電電力200〜800Wに
て光導電層であるa-Si層13を1μm形成した。
Example 1 An explanation will be given with reference to the sectional view of the photoconductor of the present invention shown in FIG. The mirror-polished aluminum (Al) substrate 11 was placed in a magnetron sputtering apparatus, and after evacuation to 2 × 10 −6 Torr or less, the substrate temperature was raised to 250 ° C. Using Sn as a target, Ar was introduced into the device at 1 to 3 mTorr and N 2 at 2 to 6 mTorr, and a-Sn 1-x N x layer 12 as a charge transfer layer was formed by high frequency power 300 to 500 W with a frequency of 13.56 MHz. With a thickness of 15 μm. Then, Ar was introduced at 1 to 10 mTorr and H 2 was introduced at 0.3 to 4 mTorr, and an a-Si layer 13 as a photoconductive layer was formed to a thickness of 1 μm at a discharge power of 200 to 800 W with a polycrystal as a target.

この時のa−Sn1-xNx層12の比誘電率は8〜9で、電荷
発生層である。a-Si層13は10〜11であった。また、第1
図の構造の光導電体を電子写真感光体として、負帯電に
てその感光体特性を評価すると、全体の膜厚が16μmで
あるにも拘らず飽和帯電電位900V、残留電位15V以下と
電位受容度が非常に大きく、かつ残留電位の小さい電子
写真感光体が得られた。
At this time, the a-Sn 1-x N x layer 12 has a relative dielectric constant of 8 to 9 and is a charge generation layer. The a-Si layer 13 was 10-11. Also, the first
When the photoconductor having the structure shown in the figure is used as an electrophotographic photoreceptor and the photoreceptor characteristics are evaluated by negative charging, the saturation charge potential is 900V and the residual potential is 15V or less, even though the total film thickness is 16 μm. An electrophotographic photosensitive member having a very high degree and a small residual potential was obtained.

しかし、このような光導電層が表面に形成された感光体
は、帯電の繰り返しに比例して帯電電位が減少する傾向
にある。これは、自由表面にある光導電層のa-Siはオゾ
ン等の影響により表面酸化が急速に進み酸化層中の捕獲
準位が表面の電荷の注入を促進するためと考えられる。
However, a photoreceptor having such a photoconductive layer formed on the surface tends to have a reduced charging potential in proportion to repeated charging. This is considered to be because the surface oxidation of a-Si in the photoconductive layer on the free surface is rapidly accelerated by the influence of ozone and the like, and the trap level in the oxide layer promotes the injection of electric charges on the surface.

このため、第2図のように光導電層13の自由表面に新た
な表面被覆層14として、Si1-xNx,Si1-xCx,Ge1-xCx,A
l2O3,Al1-xNx,(0<x1)、a−C:H(非晶質カーボ
ン)等の被覆層を0.05〜1μm形成することによって帯
電電位の変化を小さくし、また高温高湿時の画像の「ボ
ケ」の発生を防ぐことができた。
Therefore, as shown in FIG. 2, a new surface coating layer 14 is formed on the free surface of the photoconductive layer 13 as Si 1-x N x , Si 1-x C x , Ge 1-x C x , A
By forming a coating layer of l 2 O 3 , Al 1-x N x , (0 <x1), aC: H (amorphous carbon) or the like in a thickness of 0.05 to 1 μm, the change in charging potential is reduced, and It was possible to prevent the occurrence of "blur" in the image when the temperature and humidity were high.

実施例2 本実施例における感光体の断面図を第3図に示す。鏡面
研磨した90φ×310mmのAlドラム基板21を電極間距離55m
mの容量結合方式プラズマCVD装置内に1本配置し、反応
容器内を5×10-6Torr以下に排気後、Al基板21を150〜2
50℃に加熱する。SnF2を0.1〜1sccm,GeF4,を1〜5scc
m、NH3を190〜220sccm導入し、反応容器内の圧力を0.2
〜1.0Torrに調整後、高周波電力300〜800Wでa-(Sn1-yGe
y)1-xNx(0≦y,x<1)層22を15〜30μm形成し、更に
GeF4を0.5〜10sccm、SiH4を100〜200sccm、水素希釈し
た10ppm濃度のB2H6を5〜50sccm導入し、0.2〜2.0Torr
に制御し、放電電力150〜500WでB添加したフッ素含有
の非晶質シリコンゲルマニウム(以下a-SiGe:H:Fと記
す)層23を1〜3μm形成し、続いてSiH4を5〜10scc
m、NH3を100〜200sccm導入し、圧力0.2〜1.0Torr、放電
電力150〜600Wで、表面被覆層としてSi1-xNx層24を0.1
〜0.2μm形成し電子写真感光体を得た。
Example 2 FIG. 3 is a sectional view of the photoconductor in this example. Mirror-polished 90mm x 310mm Al drum substrate 21 with 55m distance between electrodes
One of them is placed in a capacitively coupled plasma CVD apparatus of m, and the inside of the reaction chamber is evacuated to 5 × 10 −6 Torr or less, and then the Al substrate 21 is set to 150 to 2
Heat to 50 ° C. SnF 2 0.1 to 1 sccm, GeF 4 1 to 5 scc
m, the NH 3 is introduced 190~220Sccm, the pressure in the reaction vessel 0.2
After adjusting to ~ 1.0 Torr, a- (Sn 1-y Ge
y ) 1-x N x (0 ≦ y, x <1) layer 22 is formed with a thickness of 15 to 30 μm, and
Introduce 0.5 to 10 sccm of GeF 4 , 100 to 200 sccm of SiH 4, and 5 to 50 sccm of B 2 H 6 of 10 ppm concentration diluted with hydrogen, 0.2 to 2.0 Torr
The amorphous silicon-germanium (hereinafter referred to as a-SiGe: H: F) layer 23 containing fluorine and having B added at a discharge power of 150 to 500 W is formed to a thickness of 1 to 3 μm, and SiH 4 is added to a thickness of 5 to 10 scc.
m, the NH 3 is introduced 100~200Sccm, pressure 0.2~1.0Torr, the discharge power 150~600W, the Si 1-x N x layer 24 as a surface coating layer 0.1
.About.0.2 .mu.m was formed to obtain an electrophotographic photoreceptor.

この感光体は負帯電によって使用され、その分感光度は
400〜850nmの広範囲に渡って高感度であり、a-Si層に比
較してa-SiGe:H:F層23を電荷発生層とすることにより、
赤外線領域の波長にまで光感度の向上が見られ、この感
光部材を800nmの半導体レーザーを光源とするレーザー
ビームプリンタに実装し、鮮明な印字を確認した。この
場合のa-(Sn1-yGey)1-xNx層22は、光学的禁止帯幅を狭
くしており、比誘電率が8〜9で、正孔のブロッキング
層としてのみでなくレーザー光の吸収層としても機能す
るためAl基板21からの反射による解像度の低下を防止し
ている。また、比誘電率の比較的大きなa-(Sn1-yGey)
1-xNxは室温での暗比抵抗が小さい傾向が見られる。こ
の場合、a-(Sn1-yGey)1-xNx層22にBあるいは炭素を添
加することにより高めることができる。例えば、8の比
誘電率をもつa-(Sn1-yGey)1-xNxは〜109Ω・cmと小さい
が、10〜0.01atm%のCまたはBあるいは両者を添加す
ることにより〜1013Ω・cmに高抵抗化できる。このこと
により、更に、階調再現が可能となり、中間調の再現に
優れた印字ができた。
This photoconductor is used by negative charging, and its photosensitivity
It has high sensitivity over a wide range of 400 to 850 nm, and by using the a-SiGe: H: F layer 23 as a charge generation layer as compared with the a-Si layer,
The photosensitivity was improved even in the infrared region, and this photosensitive member was mounted on a laser beam printer using a semiconductor laser of 800 nm as a light source, and clear printing was confirmed. In this case, the a- (Sn 1-y Ge y ) 1-x N x layer 22 has a narrow optical band gap, has a relative dielectric constant of 8 to 9, and can be used only as a hole blocking layer. Instead, it also functions as an absorption layer for laser light, thereby preventing a reduction in resolution due to reflection from the Al substrate 21. In addition, a- (Sn 1-y Ge y ) with a relatively large dielectric constant
1-x N x is a tendency dark resistivity is small at room temperature. In this case, it can be increased by adding B or carbon to the a- (Sn 1-y Ge y ) 1-x N x layer 22. For example, a- (Sn 1-y Ge y ) 1-x N x with a relative permittivity of 8 is small at ~ 10 9 Ω · cm, but 10 to 0.01 atm% C or B or both should be added. The resistance can be increased to ~ 10 13 Ω · cm. As a result, the gradation can be reproduced further, and the printing excellent in the reproduction of the halftone can be achieved.

実施例3 実施例2と同じくa-(Sn1-yGey)1-xNx(0<y,x<1)層
22をプラズマCVD法によって形成した。この時、Sn原子
の原料ガスとしてテトラメチルスズ[(CH3)4Sn]を用
いて行い15〜30μmの膜を得た。これらの膜はすでに炭
素を含有するため室温時の暗比抵抗は1012〜1013Ω・cm
と高い膜が得られ、中間調の再現に優れた印字が可能で
あった。ここで、テトラエチルスズ[(C2H5)4Sn]をSn
原子の原料ガスとして用いても同じ結果が得られた。ま
た、a-(Sn1-yGey)1-xNx(0<y,x<1)層22には水素、
フッ素が含まれ、1〜50atm%で繰り返し使用にも安定
な電子写真感光体が得られた。
Example 3 a- (Sn 1-y Ge y ) 1-x N x (0 <y, x <1) layer as in Example 2
22 was formed by the plasma CVD method. At this time, tetramethyltin [(CH 3 ) 4 Sn] was used as a source gas of Sn atoms to obtain a film having a thickness of 15 to 30 μm. Since these films already contain carbon, the dark resistivity at room temperature is 10 12 to 10 13 Ωcm.
And a high film was obtained, and printing excellent in halftone reproduction was possible. Here, tetraethyltin [(C 2 H 5 ) 4 Sn] is replaced with Sn.
The same result was obtained when used as the atomic source gas. In addition, hydrogen is contained in the a- (Sn 1-y Ge y ) 1-x N x (0 <y, x <1) layer 22,
An electrophotographic photosensitive member containing fluorine and stable at 1 to 50 atm% even after repeated use was obtained.

実施例4 実施例2と同じくプラズマCVD法により膜の形成を行っ
た。基板加熱は150〜250℃に制御し、第4図示すように
Alドラム基板31上にSiH4を100〜200sccm、水素希釈をし
た400ppm濃度のBF3を100〜200sccm、ガス圧力0.2〜1.0T
orr、放電電力100〜400WでB添加したP型a-Si層32を0.
2〜1μm形成した。続いてSiH4を100〜200sccm、水素
希釈をした400ppmのBF3を1〜10sccm、ガス圧力0.2〜1.
0Torr、放電電力100〜400WでB添加のi型a-Si層33を1
〜2μm形成した。更に、SnF2を1〜0.5sccm、SiH4
1〜2sccm、N2を150〜200sccm、ガス圧力0.2〜1.0Tor
r、放電電力300〜600Wでa-(Sn1-ySiy)1-xNx(0<x,y<
1)層34を10〜20μm形成し、電子写真感光体を形成し
た。a-Si:Hの比誘電率は〜11であるのに対し、a-(Sn1-y
Siy)1-xNx層34は5〜7と小さく、光学的禁止帯幅も2.3
〜3.0evと大きく光吸収によるロスも少ない。
Example 4 As in Example 2, a film was formed by the plasma CVD method. Substrate heating is controlled at 150-250 ℃, as shown in Fig. 4.
100 to 200 sccm of SiH 4 on Al drum substrate 31, 100 to 200 sccm of 400 ppm concentration of BF 3 diluted with hydrogen, gas pressure of 0.2 to 1.0 T
orr, discharge power of 100 to 400 W, and P-type a-Si layer 32 with B added to 0.
2-1 μm was formed. Subsequently, SiH 4 is 100 to 200 sccm, 400 ppm BF 3 diluted with hydrogen is 1 to 10 sccm, and gas pressure is 0.2 to 1.
0 Torr, discharge power 100-400W, and B-doped i-type a-Si layer 33 1
˜2 μm formed. Furthermore, SnF 2 is 1 to 0.5 sccm, SiH 4 is 1 to 2 sccm, N 2 is 150 to 200 sccm, and gas pressure is 0.2 to 1.0 Torr.
r, discharge power 300 to 600 W, a- (Sn 1-y Si y ) 1-x N x (0 <x, y <
1) A layer 34 having a thickness of 10 to 20 μm was formed to form an electrophotographic photoreceptor. The relative permittivity of a-Si: H is ~ 11, while a- (Sn 1-y
Si y ) 1-x N x layer 34 is as small as 5 to 7 and has an optical band gap of 2.3.
It is a big ~ 3.0ev with little loss due to light absorption.

また実施例2と同様に炭素を0.1〜10atm添加したa-(Sn
1-ySiy)1-xNx層を用いれば、更に室温での暗比抵抗が増
加し中間調の再現に優れた特徴のある電子写真感光体が
得られた。この感光体は、正帯電にて飽和帯電電位1000
〜1600Vとすぐれ、市販の複写機に実装してテストを加
えたところ、良好な画像が得られ、20万以上の耐刷性が
確認された。また、a-(Sn1-ySiy)1-xNx(0<x,y<1)
層には窒素と同時に水素、あるいはフッ素が含有されて
いることは明らかであり、1〜50atm%の範囲で長寿命
の電子写真感光体が得られた。
Further, as in Example 2, a- (Sn containing 0.1 to 10 atm of carbon added)
By using the 1-y Si y ) 1-x N x layer, an electrophotographic photoreceptor having a characteristic that the dark resistivity at room temperature was further increased and the halftone reproduction was excellent was obtained. This photoreceptor has a saturated charge potential of 1000 when positively charged.
When it was mounted on a commercial copying machine and tested, a good image was obtained and a printing durability of 200,000 or more was confirmed. In addition, a- (Sn 1-y Si y ) 1-x N x (0 <x, y <1)
It is clear that the layer contains hydrogen or fluorine at the same time as nitrogen, and an electrophotographic photoreceptor having a long life in the range of 1 to 50 atm% was obtained.

発明の効果 以上述べてきたように、本発明による光導電体は、電荷
移動層としてa-(Sn1-xNx(0<x<1)、a-(Sn1-ySiy)
1-xNx(0<x,y<1)、a-(Sn1-yGey)1-xNx(0<y,x<
1)等を主成分とする層を用いることにより、電荷蓄積
モードで使用する電子写真感光体の静電容量を減少せし
め、光応答の優れた高電圧動作の可能な優れた感光部材
を提供することができる。
EFFECTS OF THE INVENTION As described above, the photoconductor according to the present invention has a- (Sn 1-x N x (0 <x <1), a- (Sn 1-y Si y ) as the charge transfer layer.
1-x N x (0 <x, y <1), a- (Sn 1-y Ge y ) 1-x N x (0 <y, x <
By using a layer containing 1) or the like as a main component, the electrostatic capacity of the electrophotographic photosensitive member used in the charge storage mode is reduced, and an excellent photosensitive member capable of high voltage operation with excellent optical response is provided. be able to.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例における感光体の断面図、第
2図は第1図における感光体に更に表面被覆層を形成し
た他の実施例の断面図、第3図はレーザービームプリン
タに好適な実施例の感光体の断面図、第4図は正帯電に
好適な他の実施例の感光体の断面図である。 11……アルミニウム基板、12……a-Sn1-xNx層、13……a
-Si層、14……表面被覆層、21……Al基板、22……a-(Sn
1-yGey)1-xNx層、23……a-SiGe:H:F層、24……Si1-xNx
層、31……Al基板、32……P型a-Si層、33……i型a-Si
層、34……a-(Sn1-ySiy)1-xNx
1 is a sectional view of a photosensitive member according to an embodiment of the present invention, FIG. 2 is a sectional view of another embodiment in which a surface coating layer is further formed on the photosensitive member of FIG. 1, and FIG. 3 is a laser beam printer. FIG. 4 is a cross-sectional view of a photoconductor of a preferred embodiment, and FIG. 4 is a cross-sectional view of a photoconductor of another embodiment suitable for positive charging. 11 …… Aluminum substrate, 12 …… a-Sn 1-x N x layer, 13 …… a
-Si layer, 14 …… Surface coating layer, 21 …… Al substrate, 22 …… a- (Sn
1-y Ge y ) 1-x N x layer, 23 …… a-SiGe: H: F layer, 24 …… Si 1-x N x layer
Layer, 31 ... Al substrate, 32 ... P-type a-Si layer, 33 ... i-type a-Si
Layer, 34 …… a- (Sn 1-y Si y ) 1-x N x layer

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】光励起によって移動可能なキャリアを発生
する光導電層と、上記キャリアが効率よく注入されて効
果的に輸送される電荷移動層とが支持体上に積層されて
なり、上記電荷移動層が窒化スズを主成分として構成さ
れている電子写真感光体。
1. A photoconductive layer that generates movable carriers by photoexcitation, and a charge transfer layer into which the carriers are efficiently injected and effectively transported are laminated on a support, and the charge transfer is performed. An electrophotographic photosensitive member whose layer is mainly composed of tin nitride.
【請求項2】電荷移動層は、少なくともゲルマニューム
およびシリコンのいずれかを含むことを特徴とする特許
請求の範囲第1項記載の電子写真感光体。
2. The electrophotographic photosensitive member according to claim 1, wherein the charge transfer layer contains at least one of germanium and silicon.
【請求項3】電荷移動層は、少なくとも水素あるいはハ
ロゲン原子のいずれかを含有することを特徴とする特許
請求の範囲第1項記載の電子写真感光体。
3. The electrophotographic photosensitive member according to claim 1, wherein the charge transfer layer contains at least either hydrogen or a halogen atom.
【請求項4】光導電層は、少なくとも水素あるいはハロ
ゲン原子のいずれかを含有し、非晶質シリコン、非晶質
ゲルマニュームあるいは非晶質シリコンゲルマニューム
の内いずれかを主成分とすることを特徴とする特許請求
の範囲第1項記載の電子写真感光体。
4. The photoconductive layer contains at least either hydrogen or a halogen atom, and is mainly composed of any one of amorphous silicon, amorphous germanium, and amorphous silicon germanium. The electrophotographic photosensitive member according to claim 1.
【請求項5】自由表面に表面被覆層を有することを特徴
とする特許請求の範囲第1項記載の電子写真感光体。
5. The electrophotographic photosensitive member according to claim 1, having a surface coating layer on the free surface.
JP25412285A 1985-11-13 1985-11-13 Electrophotographic photoreceptor Expired - Lifetime JPH0715584B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP25412285A JPH0715584B2 (en) 1985-11-13 1985-11-13 Electrophotographic photoreceptor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25412285A JPH0715584B2 (en) 1985-11-13 1985-11-13 Electrophotographic photoreceptor

Publications (2)

Publication Number Publication Date
JPS62113156A JPS62113156A (en) 1987-05-25
JPH0715584B2 true JPH0715584B2 (en) 1995-02-22

Family

ID=17260529

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25412285A Expired - Lifetime JPH0715584B2 (en) 1985-11-13 1985-11-13 Electrophotographic photoreceptor

Country Status (1)

Country Link
JP (1) JPH0715584B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0797226B2 (en) * 1987-07-01 1995-10-18 松下電器産業株式会社 Electrophotographic photoreceptor and manufacturing method thereof

Also Published As

Publication number Publication date
JPS62113156A (en) 1987-05-25

Similar Documents

Publication Publication Date Title
US4443529A (en) Photoconductive member having an amorphous silicon photoconductor and a double-layer barrier layer
US4557987A (en) Photoconductive member having barrier layer and amorphous silicon charge generation and charge transport layers
JPS6410069B2 (en)
US4525442A (en) Photoconductive member containing an amorphous boron layer
US4522905A (en) Amorphous silicon photoconductive member with interface and rectifying layers
US4532198A (en) Photoconductive member
JPH0211143B2 (en)
JPS6410068B2 (en)
JPH0150905B2 (en)
JPH0715584B2 (en) Electrophotographic photoreceptor
US4677044A (en) Multi-layered electrophotographic photosensitive member having amorphous silicon
US4636450A (en) Photoconductive member having amorphous silicon matrix with oxygen and impurity containing regions
JPS6261056A (en) Photoconductor
US4579797A (en) Photoconductive member with amorphous germanium and silicon regions, nitrogen and dopant
JPH0668628B2 (en) Electrophotographic photoreceptor
JPS6410066B2 (en)
JPS6410067B2 (en)
JPH0315739B2 (en)
JP2536732B2 (en) Light receiving member
JPH11305471A (en) Electrophotographic photoreceptor
JPS6410064B2 (en)
JPH0450588B2 (en)
JPS6273275A (en) Photoconductive body
JPH0216512B2 (en)
JPH0211145B2 (en)