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JPH0718762B2 - Absorption spectroscopy analyzer using tunable laser - Google Patents
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JPH0718762B2 - Absorption spectroscopy analyzer using tunable laser - Google Patents

Absorption spectroscopy analyzer using tunable laser

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Publication number
JPH0718762B2
JPH0718762B2 JP59059748A JP5974884A JPH0718762B2 JP H0718762 B2 JPH0718762 B2 JP H0718762B2 JP 59059748 A JP59059748 A JP 59059748A JP 5974884 A JP5974884 A JP 5974884A JP H0718762 B2 JPH0718762 B2 JP H0718762B2
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JP
Japan
Prior art keywords
spectrum
modulation
signal
laser
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59059748A
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Japanese (ja)
Other versions
JPS60202329A (en
Inventor
博也 佐野
隆治 古賀
Original Assignee
新技術事業団
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Priority to JP59059748A priority Critical patent/JPH0718762B2/en
Publication of JPS60202329A publication Critical patent/JPS60202329A/en
Publication of JPH0718762B2 publication Critical patent/JPH0718762B2/en
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Expired - Lifetime legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Description

【発明の詳細な説明】 〔従来の技術分野〕 本発明は、ガス分析装置等において波長可変半導体レー
ザを用いて吸収スペクトル計測を行う際に、寄生スペク
トルの影響を除去する光路雑音抑圧変調を行う吸収分光
分析装置に関する。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention performs optical path noise suppression modulation that removes the influence of a parasitic spectrum when measuring an absorption spectrum using a wavelength tunable semiconductor laser in a gas analyzer or the like. An absorption spectroscopy analyzer.

〔技術の背景〕 吸収スペクトルを測定して物質の成分濃度を求めるガス
分析装置等の分光分析装置では、一定のスペクトル領域
を掃引するための可変波長光源が必要とされる。
[Background of the Technology] A spectroscopic analyzer such as a gas analyzer that measures an absorption spectrum to determine a component concentration of a substance requires a variable wavelength light source for sweeping a certain spectral region.

ところで鉛塩化合物半導体レーザ、GaAlAsレーザ、GaAl
AsPレーザ等は、印加電流を変化させると、程度の差こ
そあれ発振波長が変化し、そして発振出力は多くの種類
のレーザの中でもきわだって単色性がよく、その半値幅
は常温気体のドップラー幅よりも狭い程である。
By the way, lead salt compound semiconductor lasers, GaAlAs lasers, GaAl
With AsP lasers, the oscillation wavelength changes to some extent when the applied current is changed, and the oscillation output is remarkably monochromatic among many types of lasers, and its half-value width is the Doppler width of a normal temperature gas. It is narrower than.

そこでこれらの半導体レーザを上記の可変波長光源とし
て用いた場合、気体の吸収スペクトルを極めて高い分解
能で測定することが可能となる。しかし、半導体レーザ
を可変波長光源として用いた分光分析装置では、第1図
に示すように、半導体レーザ1が光学素子3ないし5か
ら一部戻ってくる極くわずかの光と結合し、しかもその
強さは波長によって異なる。
Therefore, when these semiconductor lasers are used as the variable wavelength light source, the absorption spectrum of gas can be measured with extremely high resolution. However, in the spectroscopic analyzer using the semiconductor laser as the variable wavelength light source, as shown in FIG. 1, the semiconductor laser 1 is combined with a very small amount of light that partially returns from the optical elements 3 to 5, and The intensity depends on the wavelength.

そのため、レーザ波長を掃引すると、真の吸収スペクト
ルのうえに、同時に出力されている異なる波長の光に基
づいて生じる周期波形状の寄生スペクトルが重畳し、特
に弱い吸収線の大きさを測定しようとするときこれが重
大な障害となり、ほとんど検出不可能となる。この周期
波形状の寄生スペクトルの振幅と透過レーザパワーとの
間の大きさの比は、10-2乃至10-7あるいはそれ以下の場
合もあるが、周期以外のパラメータについては予測が難
しく、また統計処理により抑圧するのも困難である。
Therefore, when the laser wavelength is swept, a parasitic spectrum of a periodic wave shape generated based on light of different wavelengths output at the same time is superimposed on the true absorption spectrum, and it is attempted to measure the size of a particularly weak absorption line. When this happens, it becomes a serious obstacle that is almost undetectable. The ratio of magnitude between the amplitude of the parasitic spectrum of this periodic wave shape and the transmitted laser power may be 10 -2 to 10 -7 or less, but it is difficult to predict parameters other than the period, and It is also difficult to suppress by statistical processing.

寄生スペクトルの発生原因となるものは種々あるが、第
1図に示されるように、吸収分光分析装置ではレーザの
出力をできるだけ有効利用するため、レンズ系3,4を用
いて光電変換器5上にレーザ光を集光させており、この
レーザとレンズ4の集光器との間に構成されるキャビテ
ィにより発生するものが最も振幅が大きくて深刻であ
る。すなわち、たとえばキャビティの長さL=1mとする
と、寄生スペクトルの周期は、波数にして0.005cm-1
なり、温度300Kにおけるメタンガスのドップラー幅0.00
2cm-1と区別がつけ難いという問題が生じる。
There are various causes of the generation of the parasitic spectrum, but as shown in FIG. 1, in the absorption spectroscopic analyzer, in order to make the most effective use of the laser output, the lens systems 3 and 4 are used for the photoelectric converter 5 The laser light is focused on the laser beam, and what is generated by the cavity formed between the laser and the condenser of the lens 4 has the largest amplitude and is serious. That is, for example, if the length L of the cavity is 1 m, the period of the parasitic spectrum is 0.005 cm -1 in wave number, and the Doppler width of methane gas at a temperature of 300 K is 0.00
There is a problem that it is difficult to distinguish it from 2 cm -1 .

ところで、一般に分光分析で扱われるような液体、固
体、常圧あるいは高圧気体の吸収線幅は0.1cm-1程度よ
りも広いから、上記した寄生スペクトルを抑圧できる可
能性がある。
By the way, since the absorption line width of liquid, solid, atmospheric pressure or high-pressure gas which is generally treated by spectroscopic analysis is wider than about 0.1 cm -1 , it is possible to suppress the above parasitic spectrum.

このような問題は、レーザのような可干渉光源を用いる
場合に特有のものであって、通常の白色光源を用いる分
光分析装置ではほとんど生じないものである。
Such a problem is peculiar when a coherent light source such as a laser is used, and hardly occurs in a spectroscopic analyzer using a normal white light source.

次に、さらに導関数分光法を用いたときの上述した周期
的寄生スペクトルの影響について説明する。第2図はそ
の説明図である。半導体レーザ6の駆動電流I(t)
は、周波数fの発振器7により変調器8で変調されたも
ので、 I(t)=Io+Ia・η(t) ……(1) で表される。ここでIoは直流成分、Iaは電流変調幅、η
(t)は変調波形で、一般的には正弦波あるいは余弦波
の周期関数が用いられている。したがって半導体レーザ
6から出力される光は変調を受け、その周波数ν(t)
は、次式および第3図に示すように、 ν(t)=νo+Δ・η(t) ……(2) で表される。ここでν0は基準周波数、Δは周波数変調
幅である。
Next, the influence of the above-mentioned periodic parasitic spectrum when the derivative spectroscopy is further used will be described. FIG. 2 is an explanatory diagram thereof. Driving current I (t) of the semiconductor laser 6
Is modulated by the modulator 8 by the oscillator 7 having the frequency f, and is represented by I (t) = I o + I a η (t) (1) Where I o is the DC component, I a is the current modulation width, and η
(T) is a modulation waveform, and a periodic function of a sine wave or a cosine wave is generally used. Therefore, the light output from the semiconductor laser 6 is modulated and its frequency ν (t)
Is expressed by ν (t) = ν o + Δ · η (t) (2) as shown in the following equation and FIG. Here, ν 0 is a reference frequency and Δ is a frequency modulation width.

変調されたレーザ光は、キャビティ9の測定対象気体を
通過し、光電変換器10によって検出され、電気信号に変
換される。
The modulated laser light passes through the gas to be measured in the cavity 9, is detected by the photoelectric converter 10, and is converted into an electric signal.

位相同期検波器11は、光電変換器10から出力された信号
のうちfのn次高調波成分を位相同期検出するものであ
り、図示の例は、発振器7から取り出した2fの信号で2
次高調波成分を同期検波している。このとき得られる2
次高調波成分に基づくスペクトルは、元のスペクトル、
すなわち零次スペクトル中の変化部分、たとえば気体の
吸収スペクトルのように鋭く尖ったスペクトル形状を強
調して表したものとなる。これは近似的に零次スペクト
ルの微分、すなわち導関数を利用するものであるため、
導関数分光法と呼ばれる。
The phase-locking detector 11 detects the n-th harmonic component of f out of the signal output from the photoelectric converter 10 in a phase-locked manner. In the illustrated example, the 2f signal extracted from the oscillator 7 is 2f.
The second harmonic component is synchronously detected. 2 obtained at this time
The spectrum based on the second harmonic component is the original spectrum,
That is, it represents a changed portion in the zero-order spectrum, for example, a sharply pointed spectrum shape such as an absorption spectrum of gas is emphasized. Since this uses the derivative of the zero-order spectrum approximately, that is, the derivative,
Called derivative spectroscopy.

このような導関数分光法を用いた場合には、前述した周
期的寄生スペクトルが存在すると、これも強調されてし
まうため、分光測定が一層困難化することになる。
When such a derivative spectroscopy method is used, the presence of the above-mentioned periodic parasitic spectrum is also emphasized, which makes spectroscopic measurement more difficult.

〔発明の目的および特徴〕[Object and Features of the Invention]

本発明の目的は、波長可変半導体レーザと導関数分光法
を用いた分光分析において、光路雑音として生じる吸収
線の幅よりも短いスペクトル周期をもつ周期形状寄生ス
ペクトルを抑圧する手段を提供することにあり,そのた
め本発明の波長可変レーザを用いた吸収分光分析装置
は,比較的大きい振幅と長い周期とで変化する第1の波
形の信号に,比較的ちいさな振幅と短い周期で変化ある
いはランダムに変化する第2の波形の信号を重畳した変
調信号を用いてレーザ光の波長変調を行う変調手段を備
え,光路雑音を抑圧することを特徴とするものである。
An object of the present invention is to provide a means for suppressing a periodic shape parasitic spectrum having a spectrum period shorter than the width of an absorption line generated as optical path noise in a spectroscopic analysis using a wavelength tunable semiconductor laser and a derivative spectroscopy. Therefore, in the absorption spectroscopy analyzer using the wavelength tunable laser of the present invention, the signal of the first waveform that changes with a relatively large amplitude and a long period changes to a signal with a relatively small amplitude and a short period or changes randomly. It is characterized in that it is provided with a modulation means for performing wavelength modulation of the laser light by using a modulation signal in which a signal of the second waveform is superposed, and suppresses optical path noise.

〔発明の原理〕[Principle of Invention]

波長可変半導体レーザの発振周波数は、従来のようにた
とえば正弦波形で変調された場合、第3図に示したよう
に、正弦波は、その頂点(νo+Δ、νo−Δ)近傍がゆ
るやかに変化し、その部分での周波数の振幅密度分布は
きわめて大きい。本発明は、この変調波形に振幅密度分
布の大きい区間が含まれている場合に、吸収スペクトル
線幅よりもピッチの短い周期形状寄生スペクトルに対す
る応答性が高まることに着目してなされたものである。
When the oscillation frequency of the wavelength tunable semiconductor laser is conventionally modulated by, for example, a sine wave, as shown in FIG. 3, the sine wave has a gradual wave near its apex (ν o + Δ, ν o −Δ). , And the amplitude density distribution of the frequency in that part is extremely large. The present invention was made by paying attention to the fact that, when the modulation waveform includes a section having a large amplitude density distribution, the responsivity to the periodic shape parasitic spectrum having a pitch shorter than the absorption spectral line width is enhanced. .

本発明はそれにより、半導体レーザの変調波形からゆる
やかな変化部分を除くようにする。
The present invention thereby eliminates the gradual changes in the modulation waveform of the semiconductor laser.

さらに詳しく説明すると、一般に、吸収スペクトルρ
(ν)を分光器を用いて測定するとき得られたスペクト
は, とあらわされる。ここにg(η)は装置関数と呼ばれ,
分光器の分光特性をあらわす。(3)式をさらにフーリ
ェ変換すると, (d)=S(d)G(d) ……(4) となる。dは1/νに等しく,,S,Gはそれぞれ のフーリェ変換である。ここでピッチの短い周期性妨害
スペクトルは、dの大きい線スペクトルとしてあらわさ
れる。
More specifically, in general, the absorption spectrum ρ
The spectrum obtained when (ν) is measured using a spectroscope Is Is represented. Where g (η) is called the device function,
Represents the spectral characteristics of the spectroscope. If the equation (3) is further transformed by Fourier transform, then (d) = S (d) G (d) (4). d is equal to 1 / ν, and S and G are respectively Is a Fourier transform of. Here, the periodic interference spectrum having a short pitch is represented as a line spectrum having a large d.

変調波形η(t)を変えることによって、g(η)の
形、したがってG(d)の分布は変化するが、g(η)
はη(t)の1周期にわたる振幅密度分布であって、 の近傍ではその絶対値が極端に大きくなり、g(η)は
そこでスパイク状の形を持つ。そのためこれをフーリェ
変換したG(d)は、dの高い領域にまで振幅を有し、
短ピッチの妨害スペクトルに応答することになる。これ
に対し、 の付近の時間領域をできるだけ少なく、すなわちη
(t)の極値付近をできるだけ鋭く尖らせれば、G
(d)のdの高い領域での振幅は減少し、このような妨
害スペクトルに対する感受性は抑圧される。
By changing the modulation waveform η (t), the shape of g (η), and hence the distribution of G (d), changes, but g (η)
Is the amplitude density distribution over one period of η (t), In the vicinity of, the absolute value becomes extremely large, and g (η) has a spike-like shape there. Therefore, the Fourier transform of this G (d) has amplitude even in the high d region,
It will respond to the short pitch jamming spectrum. In contrast, As small as possible in the time domain near
By sharpening the point near the extreme value of (t) as sharply as possible, G
The amplitude in the high d region of (d) is reduced, and sensitivity to such an interference spectrum is suppressed.

例として、第4図に2次高調波分光法(n=2)におい
て、変調波形を正弦波形(a)から三角波(b)さらに
折り返し双曲線正弦(sinh)波形(c)に変えた場合
の、それぞれのg(η)の変化を示す。
As an example, in FIG. 4, when the modulation waveform is changed from the sine waveform (a) to the triangular wave (b) and the folded hyperbolic sine (sinh) waveform (c) in the second harmonic spectroscopy (n = 2), The change of each g (η) is shown.

第4図(a)でη=±1にあった無限大に伸びるスパイ
クは、同図(b)では有限値に収まり、さらに(c)で
はその段差の高さが抑えられていることが判る。本発明
ではさらに(2)式にランプ状信号δ(t)を加える
と、g(η)の形は、このスパイク部分が複数に分裂
し、さらにこれを擬似ランダム信号とすることでスパイ
ク、段差ともに滑らかな形に近づけることができる。す
なわちそのフーリェ変換G(d)はdの高領域で振幅が
抑圧される。
It can be seen that the infinitely extending spike at η = ± 1 in Fig. 4 (a) is within a finite value in Fig. 4 (b), and the height of the step is suppressed in Fig. 4 (c). . In the present invention, when the ramp signal δ (t) is further added to the equation (2), the shape of g (η) is divided into a plurality of spike portions, and further, this is made into a pseudo random signal, so that spikes and steps are generated. Both can approach a smooth shape. That is, the Fourier transform G (d) is suppressed in amplitude in the high region of d.

〔発明の実施例〕Example of Invention

次に,本発明の典型的な実施例のいくつかの変調波形を
示す。
Next, some modulation waveforms of an exemplary embodiment of the present invention are shown.

第5図の(a)は,前記(2)式で表される変調波形上
に,振幅の小さい短い周期のランプ状信号傾斜をもつ信
号を付加信号δ(t)として重畳させたものであり,総
合的な変調波形数ν(t)は, ν(t)=νo+Δ・η(t)A+δ(t) ……(5) で表される。この方法は,たとえばディジタル制御によ
り波長掃引を行うとき,1データ点ごとに中心波長が一定
に留まる,すなわち波長の密度分布が,特定の波長の近
くで鋭い形状にならないようにする場合に利用すると好
都合である。
FIG. 5 (a) is a signal obtained by superimposing a signal having a ramp-like signal inclination with a small amplitude and a short cycle as an additional signal δ (t) on the modulation waveform represented by the equation (2). , The total number of modulation waveforms ν (t) is represented by ν (t) = ν o + Δ · η (t) A + δ (t) (5). This method is used when the wavelength is swept by digital control, for example, when the central wavelength remains constant for each data point, that is, when the wavelength density distribution does not have a sharp shape near a specific wavelength. It is convenient.

第5図の(b)は,第5図(c)の波形に小さい振幅の
擬似的なランダム信号(雑変化信号)を付加信号δ
(t)として重畳させたものであり,良好な結果を得る
ことができる。
FIG. 5 (b) shows a pseudo random signal (coarse change signal) having a small amplitude added to the waveform of FIG. 5 (c).
It is superimposed as (t), and good results can be obtained.

第5図の(a),(b)に示されている方法は重複して
実施することができ,効果は相加的に向上する。
The methods shown in (a) and (b) of FIG. 5 can be carried out redundantly, and the effect is additively improved.

〔発明の効果〕〔The invention's effect〕

以上のように、本発明によれば,波長可変レーザの変調
波形を僅かに工夫するだけで、吸収スペクトルよりも短
いピッチの寄生スペクトルを抑圧することができ、低コ
ストで吸収分光分析装置の測定精度を大幅に改善するこ
とができる。
As described above, according to the present invention, it is possible to suppress a parasitic spectrum having a pitch shorter than the absorption spectrum by simply devising the modulation waveform of the wavelength tunable laser, and to measure the absorption spectrum analyzer at low cost. The accuracy can be greatly improved.

【図面の簡単な説明】[Brief description of drawings]

第1図は半導体レーザを用いた吸収分光分析装置の概要
図、第2図は導関数分光法の説明図、第3図は半導体レ
ーザ出力光の変調周波数の説明図、第4図は本発明の原
理説明図、第5図は本発明実施例の変調波形の説明図で
ある。 図中、6は半導体レーザ、7は発振器、8は変調器、9
はキャビティ、10は光電変換器、11は位相同期検波器、
νoは基準周波数、Δは周波数変調幅、η(t)は変調
波形、δ(t)は付加信号を表す。
FIG. 1 is a schematic diagram of an absorption spectroscopy analyzer using a semiconductor laser, FIG. 2 is an explanatory diagram of derivative spectroscopy, FIG. 3 is an explanatory diagram of a modulation frequency of semiconductor laser output light, and FIG. 4 is the present invention. FIG. 5 is an explanatory view of the modulation waveform of the embodiment of the present invention. In the figure, 6 is a semiconductor laser, 7 is an oscillator, 8 is a modulator, and 9
Is a cavity, 10 is a photoelectric converter, 11 is a phase-locked detector,
ν o is a reference frequency, Δ is a frequency modulation width, η (t) is a modulation waveform, and δ (t) is an additional signal.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】波長可変レーザを用いた吸収分光分析装置
において比較的大きい振幅と長い周期とで変化する第1
の波形の信号に,比較的ちいさな振幅と短い周期で変化
あるいはランダムに変化する第2の波形の信号を重畳し
た変調信号を用いてレーザ光の波長変調を行う変調手段
を備え,光路雑音を抑圧することを特徴とする波長可変
レーザを用いた吸収分光分析装置。
1. An absorption spectroscopic analyzer using a wavelength tunable laser, which changes with a relatively large amplitude and a long period.
Is provided with a modulation means for performing wavelength modulation of laser light by using a modulation signal obtained by superimposing a second waveform signal that changes with a relatively small amplitude and a short period or randomly changes on the signal of the waveform An absorption spectroscopic analyzer using a wavelength tunable laser.
JP59059748A 1984-03-28 1984-03-28 Absorption spectroscopy analyzer using tunable laser Expired - Lifetime JPH0718762B2 (en)

Priority Applications (1)

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JP59059748A JPH0718762B2 (en) 1984-03-28 1984-03-28 Absorption spectroscopy analyzer using tunable laser

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JPS60202329A JPS60202329A (en) 1985-10-12
JPH0718762B2 true JPH0718762B2 (en) 1995-03-06

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0862241A (en) * 1994-08-01 1996-03-08 Emhart Inc Acceleration response device and method using device thereof

Families Citing this family (5)

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Publication number Priority date Publication date Assignee Title
US5963336A (en) 1995-10-10 1999-10-05 American Air Liquide Inc. Chamber effluent monitoring system and semiconductor processing system comprising absorption spectroscopy measurement system, and methods of use
JP3694291B2 (en) * 2002-11-21 2005-09-14 倉敷紡績株式会社 Blood glucose level non-invasive measurement device
JP2008268064A (en) * 2007-04-23 2008-11-06 Fuji Electric Systems Co Ltd Multi-component laser gas analyzer
CN114199777A (en) * 2021-11-02 2022-03-18 华中科技大学 Photoacoustic spectrum gas concentration detection system modulated by nonlinear scanning wavelength
CN114414048B (en) * 2021-12-23 2023-05-12 电子科技大学 Device and method for improving modulation spectrum measurement precision

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58223041A (en) * 1982-06-18 1983-12-24 Fujitsu Ltd Spectrochemical analysis device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0862241A (en) * 1994-08-01 1996-03-08 Emhart Inc Acceleration response device and method using device thereof

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JPS60202329A (en) 1985-10-12

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